@article{bb162200,
AUTHOR = "da Fontoura Costa, L. and Meriaudeau, F.",
TITLE = "Special Issue on Applied Visual Inspection",
JOURNAL = JASP,
VOLUME = "2002",
YEAR = "2002",
NUMBER = "7",
MONTH = "July",
PAGES = "647-648",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT157681"}
@article{bb162201,
AUTHOR = "Shirvaikar, M.V.",
TITLE = "Trends in automated visual inspection",
JOURNAL = RealTimeIP,
VOLUME = "1",
YEAR = "2006",
NUMBER = "1",
MONTH = "October",
PAGES = "41-43",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT157682"}
@inproceedings{bb162202,
AUTHOR = "Sannen, D. and van Brussel, H. and Nuttin, M.",
TITLE = "Learning Visual Quality Inspection from Multiple Humans Using Ensembles
of Classifiers",
BOOKTITLE = CVS08,
YEAR = "2008",
PAGES = "xx-yy",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT157683"}
@inproceedings{bb162203,
AUTHOR = "Hata, S.",
TITLE = "Practical Visual Inspection Techniques:
Optics, Micro-electronics and Advanced Software Technology",
BOOKTITLE = ICPR00,
YEAR = "2000",
PAGES = "Vol IV: 114-117",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT157684"}
@inproceedings{bb162204,
AUTHOR = "Flinchbaugh, B.E.",
TITLE = "Industry Needs for Computer Vision and Pattern Recognition: Panel",
BOOKTITLE = CVPR96,
YEAR = "1996",
PAGES = "Panel",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT157685"}
@inproceedings{bb162205,
AUTHOR = "Petkovic, D.",
TITLE = "Human Assisted Computer Vision and Artificial Intelligence -- Why Not?",
BOOKTITLE = CVPR96,
YEAR = "1996",
PAGES = "Invited Talk",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT157686"}
@inproceedings{bb162206,
AUTHOR = "Noble, J.A. and Mundy, J.L.",
TITLE = "Constraint Processing Applied to Industrial Inspection and
Continuous Product Improvement",
BOOKTITLE = DARPA93,
YEAR = "1993",
PAGES = "801-809",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT157687"}
@inproceedings{bb162207,
AUTHOR = "Shapiro, L.G. and Haralick, R.M. and Pong, T.C.",
TITLE = "The Visual Components of an Automated Inspection Task",
BOOKTITLE = CAIA84,
YEAR = "1984",
PAGES = "207-210",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT157688"}
@article{bb162208,
AUTHOR = "Watkins, L.S.",
TITLE = "Inspection of IC Photomasks with Intensity Spatial Filters",
JOURNAL = PIEEE,
VOLUME = "57",
YEAR = "1969",
PAGES = "1634-1639",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157691"}
@article{bb162209,
AUTHOR = "Axelrod, N.N.",
TITLE = "Intensity Spatial Filtering Applied to Defect Detection in
Integrated Circuit Photomasks",
JOURNAL = PIEEE,
VOLUME = "60",
YEAR = "1972",
PAGES = "447-448",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157692"}
@inproceedings{bb162210,
AUTHOR = "Bourdelais, R.J. and Colangelo, D. and McFadyen, R.J. and Elliott, J.F.",
TITLE = "Instrument for Automatically Inspecting Integrated Circuit Masks for
Pinholes and Spots",
BOOKTITLE = US_Patent,
YEAR = "1974",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157693"}
@article{bb162211,
AUTHOR = "Horn, B.K.P.",
TITLE = "A Problem in Computer Vision:
Orienting Silicon Integrated Circuit Chips for Lead Bonding",
JOURNAL = CGIP,
VOLUME = "4",
YEAR = "1975",
NUMBER = "3",
MONTH = "September",
PAGES = "294-303",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157694"}
@inproceedings{bb162212,
AUTHOR = "Horn, B.K.P.",
TITLE = "Orienting Silicon Integrated Circuit Chips for Lead Bonding",
BOOKTITLE = "MIT AI Memo",
YEAR = "1975",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157695"}
@article{bb162213,
AUTHOR = "Harlow, C.A. and Henderson, S.E. and Rayfield, D.A. and Johnson, R.J. and Dwyer, S.J.",
TITLE = "Automated Inspection of Electronic Assemblies",
JOURNAL = Computer,
VOLUME = "8",
YEAR = "1975",
NUMBER = "4",
MONTH = "April",
PAGES = "36-45",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157696"}
@inproceedings{bb162214,
AUTHOR = "Olsen, O.A.",
TITLE = "Visual Method of Locating Faults in Printed Circuit Boards",
BOOKTITLE = US_Patent,
YEAR = "1976",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157697"}
@inproceedings{bb162215,
AUTHOR = "Baxter, D.W. and Shipway, R.E.",
TITLE = "Defect Inspection of Objects Such as Electronic Circuits",
BOOKTITLE = US_Patent,
YEAR = "1977",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157698"}
@article{bb162216,
AUTHOR = "McVey, E.S. and van Tol, A.",
TITLE = "An experimental printed circuit board drilling system automated by
pattern recognition",
JOURNAL = PR,
VOLUME = "11",
YEAR = "1979",
NUMBER = "4",
PAGES = "271-276",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157699"}
@article{bb162217,
AUTHOR = "Hsieh, Y.Y. and Fu, K.S.",
TITLE = "An Automatic Visual Inspection System for Integrated Circuit Chips",
JOURNAL = CGIP,
VOLUME = "14",
YEAR = "1980",
NUMBER = "4",
MONTH = "December",
PAGES = "293-343",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157700"}
@article{bb162218,
AUTHOR = "Jarvis, J.F.",
TITLE = "A Method for Automating the Visual Inspection of
Printed Wiring Boards",
JOURNAL = PAMI,
VOLUME = "2",
YEAR = "1980",
NUMBER = "1",
MONTH = "January",
PAGES = "77-83",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157701"}
@article{bb162219,
AUTHOR = "Goto, N. and Kondo, T.",
TITLE = "An Automatic Inspection System for Printed Wiring Board Masks",
JOURNAL = PR,
VOLUME = "12",
YEAR = "1980",
NUMBER = "6",
PAGES = "443-455",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157702"}
@article{bb162220,
AUTHOR = "Pau, L.F.",
TITLE = "Integrated Testing and Algorithms for Visual
Inspection of Integrated Circuits",
JOURNAL = PAMI,
VOLUME = "5",
YEAR = "1983",
NUMBER = "6",
MONTH = "November",
PAGES = "602-608",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157703"}
@inproceedings{bb162221,
AUTHOR = "Pau, L.F.",
TITLE = "Semiconductio IC's: Integrated Testing and Algorithms for Visual
Inspection",
BOOKTITLE = ICPR80,
YEAR = "1980",
PAGES = "238-240",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157704"}
@article{bb162222,
AUTHOR = "Baird, M.L.",
TITLE = "SIGHT-I: A Computer Vision System for Automated IC Chip Manufacture",
JOURNAL = SMC,
VOLUME = "8",
YEAR = "1978",
NUMBER = "2",
MONTH = "February",
PAGES = "133-139",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157705"}
@inproceedings{bb162223,
AUTHOR = "Baird, M.L.",
TITLE = "An Application ov Computer Vision to Automatic IC Chip Manufacture",
BOOKTITLE = ICPR76,
YEAR = "1976",
PAGES = "3-7",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157706"}
@article{bb162224,
AUTHOR = "West, M.A. and de Foster, S. and Baldwin, E.C. and Zeigler, R.A.",
TITLE = "Computer Controlled Optical Testing of High-Density
Printed-Circuit Boards",
JOURNAL = IBMRD,
VOLUME = "27",
YEAR = "1983",
NUMBER = "1",
PAGES = "50-58",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157707"}
@inproceedings{bb162225,
AUTHOR = "Crabb, R.M. and de Foster, S.M. and Rittenhouse, N.E. and West, M.A. and Ziegler, R.A.",
TITLE = "System for measuring and detecting printed circuit wiring defects",
BOOKTITLE = US_Patent,
YEAR = "1987",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157708"}
@article{bb162226,
AUTHOR = "Wahl, F. and So, S. and Wong, K.",
TITLE = "A Hybrid Optical-Digital Image Processing Method for Surface Inspection",
JOURNAL = IBMRD,
VOLUME = "27",
YEAR = "1983",
NUMBER = "4",
MONTH = "July",
PAGES = "376-385",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157709"}
@article{bb162227,
AUTHOR = "Rubat du Merac, C. and Jutier, P. and Laurent, J. and Courtois, B.",
TITLE = "A New Domain for Image Analysis:
VLSI Circuit Testing, with ROMULAD,
Specialized in Parallel Image Processing",
JOURNAL = PRL,
VOLUME = "1",
YEAR = "1983",
PAGES = "347-357",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157710"}
@article{bb162228,
AUTHOR = "Zeller, H. and Doemens, G.",
TITLE = "Applications of Pattern Recognition in Semiconductor and
Printer Board Production",
JOURNAL = SP,
VOLUME = "5",
YEAR = "1983",
PAGES = "399-412",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157711"}
@article{bb162229,
AUTHOR = "Wilder, J.",
TITLE = "Machine Vision for Inspection of Keyboards",
JOURNAL = SP,
VOLUME = "5",
YEAR = "1983",
PAGES = "413-421",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157712"}
@article{bb162230,
AUTHOR = "West, G.A.W.",
TITLE = "A System for the Automatic Visual Inspection of
Bare-Printed Circuit Boards",
JOURNAL = SMC,
VOLUME = "14",
YEAR = "1984",
PAGES = "767-773",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157713"}
@inproceedings{bb162231,
AUTHOR = "Nakashima, M. and Koezuka, T. and Inagaki, T.",
TITLE = "Recognition method and apparatus",
BOOKTITLE = US_Patent,
YEAR = "1984",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157714"}
@article{bb162232,
AUTHOR = "Mandeville, J.R.",
TITLE = "Novel Method for Analysis of Printed Circuit Images",
JOURNAL = IBMRD,
VOLUME = "29",
YEAR = "1985",
NUMBER = "1",
MONTH = "January",
PAGES = "73-86",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157715"}
@article{bb162233,
AUTHOR = "Bixler, J.P. and Sanford, J.P.",
TITLE = "A Technique for Encoding Lines and Regions in Engineering Drawings",
JOURNAL = PR,
VOLUME = "18",
YEAR = "1985",
NUMBER = "5",
PAGES = "367-377",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157716"}
@article{bb162234,
AUTHOR = "Yoda, H. and Ohuchi, Y. and Taniguchi, Y. and Ejiri, M.",
TITLE = "An Automatic Wafer Inspection System Using Pipelined Image
Processing Techniques",
JOURNAL = PAMI,
VOLUME = "10",
YEAR = "1988",
NUMBER = "1",
MONTH = "January",
PAGES = "4-16",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157717"}
@article{bb162235,
AUTHOR = "Hara, Y. and Doi, H. and Karasaki, K. and Iida, T.",
TITLE = "A System for PCB Automated Inspection Using Fluorescent Light",
JOURNAL = PAMI,
VOLUME = "10",
YEAR = "1988",
NUMBER = "1",
MONTH = "January",
PAGES = "69-78",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157718"}
@article{bb162236,
AUTHOR = "Shu, D.B. and Li, C.C. and Mancuso, J.F. and Sun, Y.N.",
TITLE = "A Line Extraction Method for Automated SEM Inspection of VLSI
Resist",
JOURNAL = PAMI,
VOLUME = "10",
YEAR = "1988",
NUMBER = "1",
MONTH = "January",
PAGES = "117-120",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157719"}
@article{bb162237,
AUTHOR = "Ando, M. and Inagaki, T.",
TITLE = "Automatic Optical Inspection of Plated Through-Holes for
Ultrahigh Density Printed Wiring Boards",
JOURNAL = MVA,
VOLUME = "1",
YEAR = "1988",
PAGES = "175-181",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157720"}
@article{bb162238,
AUTHOR = "Dom, B.E. and Brecher, V.H. and Bonner, R. and Batchelder, J.S. and Jaffe, R.S.",
TITLE = "The P300: A System for Automatic Pattern Wafer Inspection",
JOURNAL = MVA,
VOLUME = "1",
YEAR = "1988",
PAGES = "205-221",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157721"}
@article{bb162239,
AUTHOR = "Hara, Y. and Akiyama, N. and Karasaki, K.",
TITLE = "Automatic Inspection System for Printed Circuit Boards",
JOURNAL = PAMI,
VOLUME = "5",
YEAR = "1983",
NUMBER = "6",
MONTH = "November",
PAGES = "623-630",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157722"}
@inproceedings{bb162240,
AUTHOR = "Hara, Y. and Okamoto, K. and Hamada, T. and Akiyama, N. and Nakagawa, K. and Torisawa, S. and Nakashima, S.",
TITLE = "Automatic Visual Inspection of LSI Photomasks",
BOOKTITLE = ICPR80,
YEAR = "1980",
PAGES = "273-279",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157723"}
@article{bb162241,
AUTHOR = "Sanz, J.L.C. and Petkovic, D.",
TITLE = "Machine Vision Algorithms for Automated Inspection of
Thin-Film Disk Heads",
JOURNAL = PAMI,
VOLUME = "10",
YEAR = "1988",
NUMBER = "6",
MONTH = "November",
PAGES = "830-848",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157724"}
@article{bb162242,
AUTHOR = "Sanz, J.L.C. and Dinstein, I. and Petkovic, D.",
TITLE = "Computing Multi-Colored Polygonal Masks in Pipeline Architectures and Its
Application to Automated Visual Inspection",
JOURNAL = CACM,
VOLUME = "30",
YEAR = "1987",
NUMBER = "4",
MONTH = "April",
PAGES = "318-329",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157725"}
@article{bb162243,
AUTHOR = "Petkovic, D. and Hinkle, E.B.",
TITLE = "A Rule-Based System for Verifying Engineering Specifications in
Industrial Visual Inspection Applications",
JOURNAL = PAMI,
VOLUME = "9",
YEAR = "1987",
NUMBER = "2",
MONTH = "March",
PAGES = "306-311",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157726"}
@inproceedings{bb162244,
AUTHOR = "Dom, B. and Steele, D. and Petkovic, D. and Kuhlmann, L.",
TITLE = "Algorithms for automatic disk head/slider inspection",
BOOKTITLE = ICPR94,
YEAR = "1994",
PAGES = "A:295-300",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157727"}
@inproceedings{bb162245,
AUTHOR = "Petkovic, D. and Sanz, J.L.C. and Mohiuddin, K.M.A. and Hinkle, E.B. and Flickner, M.D. and Cox, C. and Wong, K.",
TITLE = "An Experimental System for Disk Head Inspection",
BOOKTITLE = ICPR86,
YEAR = "1986",
PAGES = "9-13",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157728"}
@article{bb162246,
AUTHOR = "Sprague, A.P. and Donahue, M.J. and Rokhlin, S.I.",
TITLE = "A Method for Automatic Inspection of Printed Circuit Boards",
JOURNAL = CVGIP,
VOLUME = "54",
YEAR = "1991",
NUMBER = "3",
MONTH = "November",
PAGES = "401-415",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157729"}
@article{bb162247,
AUTHOR = "Wojcik, Z.M.",
TITLE = "An Approach to the Recognition of
Contours and Line-Shaped Objects",
JOURNAL = CVGIP,
VOLUME = "25",
YEAR = "1984",
NUMBER = "2",
MONTH = "February",
PAGES = "184-204",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157730"}
@article{bb162248,
AUTHOR = "Ellison, T.P. and Taylor, C.J.",
TITLE = "Calculating the surface topography of integrated circuit wafers from
SEM images",
JOURNAL = IVC,
VOLUME = "9",
YEAR = "1991",
NUMBER = "1",
MONTH = "February",
PAGES = "3-9",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157731"}
@inproceedings{bb162249,
AUTHOR = "Taylor, C.J. and Ellison, T.P.",
TITLE = "Calculating the surface topography of integrated circuit wafers from
SEM images",
BOOKTITLE = BMVC90,
YEAR = "1990",
PAGES = "xx-yy",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157731"}
@inproceedings{bb162250,
AUTHOR = "Yu, K.K. and Berglund, C.N.",
TITLE = "Automated system for extracting design and layout information
from an integrated circuit",
BOOKTITLE = US_Patent,
YEAR = "1992",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157732"}
@inproceedings{bb162251,
AUTHOR = "Lebeau, C.J.",
TITLE = "Method for automatic semiconductor wafer inspection",
BOOKTITLE = US_Patent,
YEAR = "1992",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157733"}
@inproceedings{bb162252,
AUTHOR = "Bushroe, M.W.",
TITLE = "Solder joint locator",
BOOKTITLE = US_Patent,
YEAR = "1992",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157734"}
@article{bb162253,
AUTHOR = "Dom, B.E. and Brecher, V.",
TITLE = "Recent Advances in the Automatic Inspection of
Integrated-Circuits for Pattern Defects",
JOURNAL = MVA,
VOLUME = "8",
YEAR = "1995",
NUMBER = "1",
PAGES = "5-19",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157735"}
@article{bb162254,
AUTHOR = "Khalaj, B.H. and Aghajan, H.K. and Kailath, T.",
TITLE = "Patterned Wafer Inspection By High-Resolution Spectral Estimation
Techniques",
JOURNAL = MVA,
VOLUME = "7",
YEAR = "1994",
NUMBER = "3",
PAGES = "178-185",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157736"}
@article{bb162255,
AUTHOR = "Teoh, E.K. and Mital, D.P.",
TITLE = "A Transputer-Based Automated Visual Inspection System for
Electronic Devices and PCBs",
JOURNAL = OptLas,
VOLUME = "22",
YEAR = "1995",
NUMBER = "3",
PAGES = "161-180",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157737"}
@article{bb162256,
AUTHOR = "Moganti, M. and Ercal, F. and Dagli, C.H. and Tsunekawa, S.",
TITLE = "Automatic PCB Inspection Algorithms: A Survey",
JOURNAL = CVIU,
VOLUME = "63",
YEAR = "1996",
NUMBER = "2",
MONTH = "March",
PAGES = "287-313",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157738"}
@article{bb162257,
AUTHOR = "Rao, A.R.",
TITLE = "Future-Directions in Industrial Machine Vision:
A Case-Study of Semiconductor Manufacturing Applications",
JOURNAL = IVC,
VOLUME = "14",
YEAR = "1996",
NUMBER = "1",
MONTH = "February",
PAGES = "3-19",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157739"}
@article{bb162258,
AUTHOR = "Yuan, M.C. and Li, J.G.",
TITLE = "A Production System for LSI Chip Anatomizing",
JOURNAL = PRL,
VOLUME = "5",
YEAR = "1987",
PAGES = "227-232",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157740"}
@article{bb162259,
AUTHOR = "Blanz, W.E. and Sanz, J.L.C. and Hinkle, E.B.",
TITLE = "Image Analysis Methods for Solder-Ball Inspection in
Integrated Circuit Manufacturing",
JOURNAL = RA,
VOLUME = "4",
YEAR = "1988",
PAGES = "129-139",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157741"}
@article{bb162260,
AUTHOR = "Chou, P.B. and Rao, A.R. and Sturzenbecker, M.C. and Wu, F.Y. and Brecher, V.H.",
TITLE = "Automatic Defect Classification for Semiconductor Manufacturing",
JOURNAL = MVA,
VOLUME = "9",
YEAR = "1997",
NUMBER = "4",
PAGES = "201-214",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157742"}
@article{bb162261,
AUTHOR = "An, J.N. and Cho, Y.B. and Gweon, D.G.",
TITLE = "A New Method for Image Separation of Overlapped Images from a Two-Layered
Printed Circuit Board (PCB)",
JOURNAL = IVC,
VOLUME = "15",
YEAR = "1997",
NUMBER = "11",
MONTH = "November",
PAGES = "861-866",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157743"}
@article{bb162262,
AUTHOR = "Kim, S.W. and Lee, S.Y. and Yoon, D.S.",
TITLE = "Rapid Pattern Inspection of Shadow Masks by
Machine Vision Integrated with Fourier Optics",
JOURNAL = OptEng,
VOLUME = "36",
YEAR = "1997",
NUMBER = "12",
MONTH = "December",
PAGES = "3309-3311",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157744"}
@article{bb162263,
AUTHOR = "Zhou, H. and Kassim, A.A. and Ranganath, S.",
TITLE = "A Fast Algorithm for Detecting Die Extrusion Defects in IC Packages",
JOURNAL = MVA,
VOLUME = "11",
YEAR = "1998",
NUMBER = "1",
PAGES = "37-41",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157745"}
@article{bb162264,
AUTHOR = "Kassim, A.A. and Zhou, H. and Ranganath, S.",
TITLE = "Automatic IC orientation checks",
JOURNAL = MVA,
VOLUME = "12",
YEAR = "2000",
NUMBER = "3",
PAGES = "107-112",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157746"}
@inproceedings{bb162265,
AUTHOR = "Nichani, S. and Scola, J.",
TITLE = "Semiconductor device image inspection utilizing image subtraction and
threshold imaging",
BOOKTITLE = US_Patent,
YEAR = "1999",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157747"}
@inproceedings{bb162266,
AUTHOR = "Ichikawa, I.",
TITLE = "Laser beam inspection apparatus",
BOOKTITLE = US_Patent,
YEAR = "2003",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157748"}
@article{bb162267,
AUTHOR = "Chung, H.K. and Park, R.H.",
TITLE = "2-Stage High-Precision Visual Inspection of Surface Mount Devices",
JOURNAL = JEI,
VOLUME = "6",
YEAR = "1997",
NUMBER = "4",
MONTH = "October",
PAGES = "517-524",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157749"}
@article{bb162268,
AUTHOR = "Moganti, M. and Ercal, F.",
TITLE = "A Subpattern Level Inspection System for Printed Circuit Boards",
JOURNAL = CVIU,
VOLUME = "70",
YEAR = "1998",
NUMBER = "1",
MONTH = "April",
PAGES = "51-62",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157750"}
@article{bb162269,
AUTHOR = "Moganti, M. and Ercal, F.",
TITLE = "Segmentation of Printed Circuit Board Images into Basic Patterns",
JOURNAL = CVIU,
VOLUME = "70",
YEAR = "1998",
NUMBER = "1",
MONTH = "April",
PAGES = "74-86",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157751"}
@article{bb162270,
AUTHOR = "Fadzil, A. and Weng, C.J.",
TITLE = "LED Cosmetic Flaw Inspection System",
JOURNAL = PAA,
VOLUME = "1",
YEAR = "1998",
NUMBER = "1",
PAGES = "62-70",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157752"}
@article{bb162271,
AUTHOR = "Rodriguez, A.A. and Mandeville, J.R.",
TITLE = "Image registration for automated inspection of printed circuit patterns
using CAD reference data",
JOURNAL = MVA,
VOLUME = "6",
YEAR = "1993",
NUMBER = "4",
PAGES = "233-242",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157753"}
@article{bb162272,
AUTHOR = "Rajeswari, M. and Rodd, M.G.",
TITLE = "Real-time Analysis of an IC Wire-bonding Inspection System",
JOURNAL = RealTimeImg,
VOLUME = "5",
YEAR = "1999",
NUMBER = "6",
MONTH = "December",
PAGES = "409-421",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157754"}
@inproceedings{bb162273,
AUTHOR = "Beaty, E.M. and Mork, D.P.",
TITLE = "Three dimensional inspection system",
BOOKTITLE = US_Patent,
YEAR = "2000",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157755"}
@article{bb162274,
AUTHOR = "Xie, P. and Guan, S.U.",
TITLE = "A golden-template self-generating method for patterned wafer inspection",
JOURNAL = MVA,
VOLUME = "12",
YEAR = "2000",
NUMBER = "3",
PAGES = "149-156",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157756"}
@article{bb162275,
AUTHOR = "Guan, S.U. and Xie, P. and Li, H.",
TITLE = "A golden-block-based self-refining scheme for repetitive patterned
wafer inspections",
JOURNAL = MVA,
VOLUME = "13",
YEAR = "2003",
NUMBER = "5-6",
PAGES = "314-321",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157757"}
@inproceedings{bb162276,
AUTHOR = "Guan, S.U. and Xie, P.",
TITLE = "A golden block self-generating scheme for continuous patterned wafer
inspections",
BOOKTITLE = CIAP99,
YEAR = "1999",
PAGES = "436-441",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157758"}
@article{bb162277,
AUTHOR = "Zoroofi, R.A. and Taketani, H. and Tamura, S. and Sato, Y. and Sekiya, K.",
TITLE = "Automated inspection of IC wafer contamination",
JOURNAL = PR,
VOLUME = "34",
YEAR = "2001",
NUMBER = "6",
MONTH = "June",
PAGES = "1307-1317",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157759"}
@article{bb162278,
AUTHOR = "van Dop, E.R. and Regtien, P.P.L.",
TITLE = "Multi-sensor recognition of electronic components",
JOURNAL = MVA,
VOLUME = "12",
YEAR = "2001",
NUMBER = "5",
PAGES = "213-222",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157760"}
@article{bb162279,
AUTHOR = "Ye, Q.Z. and Ong, S.H. and Han, X.",
TITLE = "A stereo vision system for the inspection of IC bonding wires",
JOURNAL = IJIST,
VOLUME = "11",
YEAR = "2001",
NUMBER = "4",
PAGES = "254-262",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157761"}
@article{bb162280,
AUTHOR = "Brehelin, L. and Gascuel, O. and Caraux, G.",
TITLE = "Hidden Markov Models with Patterns to Learn Boolean Vector Sequences
and Application to the Built-In Self-Test for Integrated Circuits",
JOURNAL = PAMI,
VOLUME = "23",
YEAR = "2001",
NUMBER = "9",
MONTH = "September",
PAGES = "997-1008",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157762"}
@article{bb162281,
AUTHOR = "Qu, G.Y. and Wood, S.L. and Teh, C.",
TITLE = "Wafer Defect Detection Using Directional Morphological Gradient
Techniques",
JOURNAL = JASP,
VOLUME = "2002",
YEAR = "2002",
NUMBER = "7",
MONTH = "July",
PAGES = "686-703",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157763"}
@article{bb162282,
AUTHOR = "Tobin, K.W. and Karnowski, T.P. and Arrowood, L.F. and Ferrell, R.K. and Goddard, J.S. and Lakhani, F.",
TITLE = "Content-Based Image Retrieval for Semiconductor Process
Characterization",
JOURNAL = JASP,
VOLUME = "2002",
YEAR = "2002",
NUMBER = "7",
MONTH = "July",
PAGES = "704-713",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157764"}
@article{bb162283,
AUTHOR = "Tsai, D.M. and Chou, C.C.",
TITLE = "A fast focus measure for video display inspection",
JOURNAL = MVA,
VOLUME = "14",
YEAR = "2003",
NUMBER = "3",
MONTH = "July",
PAGES = "192-196",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157765"}
@article{bb162284,
AUTHOR = "Roh, Y.J. and Park, W.S. and Cho, H.S.",
TITLE = "Correcting image distortion in the X-ray digital tomosynthesis system
for PCB solder joint inspection",
JOURNAL = IVC,
VOLUME = "21",
YEAR = "2003",
NUMBER = "12",
MONTH = "November",
PAGES = "1063-1075",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157766"}
@article{bb162285,
AUTHOR = "Baidyk, T. and Kussul, E. and Makeyev, O. and Caballero, A. and Ruiz, L. and Carrera, G. and Velasco, G.",
TITLE = "Flat image recognition in the process of microdevice assembly",
JOURNAL = PRL,
VOLUME = "25",
YEAR = "2004",
NUMBER = "1",
MONTH = "January",
PAGES = "107-118",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157767"}
@article{bb162286,
AUTHOR = "Toledo, G.K. and Kussul, E. and Baidyk, T.",
TITLE = "Neural classifier for micro work piece recognition",
JOURNAL = IVC,
VOLUME = "24",
YEAR = "2006",
NUMBER = "8",
MONTH = "August",
PAGES = "827-836",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157768"}
@article{bb162287,
AUTHOR = "Toledo, G.K. and Kussul, E. and Baidyk, T.",
TITLE = "Work piece recognition based on the permutation neural classifier
technique",
JOURNAL = MVA,
VOLUME = "22",
YEAR = "2011",
NUMBER = "3",
MONTH = "May",
PAGES = "495-504",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157769"}
@article{bb162288,
AUTHOR = "Fang, T. and Jafari, M.A. and Danforth, S.C. and Safari, A.",
TITLE = "Signature analysis and defect detection in layered manufacturing of
ceramic sensors and actuators",
JOURNAL = MVA,
VOLUME = "15",
YEAR = "2003",
NUMBER = "2",
MONTH = "December",
PAGES = "63-75",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157770"}
@article{bb162289,
AUTHOR = "Zervakis, M.E. and Goumas, S.K. and Rovithakis, G.A.",
TITLE = "A Bayesian Framework for Multilead SMD Post-Placement Quality
Inspection",
JOURNAL = SMC-B,
VOLUME = "34",
YEAR = "2004",
NUMBER = "1",
MONTH = "February",
PAGES = "440-453",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157771"}
@inproceedings{bb162290,
AUTHOR = "Goumas, S.K. and Rovithakis, G.A. and Zervakis, M.E.",
TITLE = "A Bayesian image analysis framework for post-placement quality
inspection of components",
BOOKTITLE = ICIP02,
YEAR = "2002",
PAGES = "II: 549-552",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157772"}
@article{bb162291,
AUTHOR = "Kubota, T. and Talekar, P. and Ma, X.Y. and Sudarshan, T.S.",
TITLE = "A nondestructive automated defect detection system for silicon carbide
wafers",
JOURNAL = MVA,
VOLUME = "16",
YEAR = "2005",
NUMBER = "3",
MONTH = "May",
PAGES = "170-176",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157773"}
@article{bb162292,
AUTHOR = "di Palma, F. and de Nicolao, G. and Miraglia, G. and Pasquinetti, E. and Piccinini, F.",
TITLE = "Unsupervised spatial pattern classification of electrical-wafer-sorting
maps in semiconductor manufacturing",
JOURNAL = PRL,
VOLUME = "26",
YEAR = "2005",
NUMBER = "12",
MONTH = "September",
PAGES = "1857-1865",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157774"}
@article{bb162293,
AUTHOR = "Shankar, N.G. and Zhong, Z.W.",
TITLE = "Improved segmentation of semiconductor defects using area sieves",
JOURNAL = MVA,
VOLUME = "17",
YEAR = "2006",
NUMBER = "1",
MONTH = "April",
PAGES = "1-7",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157775"}
@article{bb162294,
AUTHOR = "Lin, H.D.",
TITLE = "Tiny surface defect inspection of electronic passive components using
discrete cosine transform decomposition and cumulative sum techniques",
JOURNAL = IVC,
VOLUME = "26",
YEAR = "2008",
NUMBER = "5",
MONTH = "May",
PAGES = "603-621",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157776"}
@article{bb162295,
AUTHOR = "Watanabe, T. and Kusano, A. and Fujiwara, T. and Koshimizu, H.",
TITLE = "3D Precise Inspection of Terminal Lead for Electronic Devices by Single
Camera Stereo Vision",
JOURNAL = IEICE,
VOLUME = "E91-D",
YEAR = "2008",
NUMBER = "7",
MONTH = "July",
PAGES = "1885-1892",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157777"}
@inproceedings{bb162296,
AUTHOR = "Kusano, A. and Watanabe, T. and Funahashi, T. and Koshimizu, H.",
TITLE = "Defect detection of terminal lead by single stereo vision",
BOOKTITLE = FCV13,
YEAR = "2013",
PAGES = "237-241",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157778"}
@article{bb162297,
AUTHOR = "Last, M. and Kandel, A.",
TITLE = "Perception-based Analysis Of Engineering Experiments In The
Semiconductor Industry",
JOURNAL = IJIG,
VOLUME = "2",
YEAR = "2002",
NUMBER = "1",
MONTH = "January",
PAGES = "107-126",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157779"}
@article{bb162298,
AUTHOR = "Ng, A.N.Y. and Lam, E.Y. and Chung, R. and Fung, K.S.M. and Leung, W.H.",
TITLE = "Reference-free Machine Vision Inspection Of Semiconductor Die Images",
JOURNAL = IJIG,
VOLUME = "9",
YEAR = "2009",
NUMBER = "1",
MONTH = "January",
PAGES = "133-152",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157780"}
@article{bb162299,
AUTHOR = "Chen, C.S. and Yeh, C.W. and Yin, P.Y.",
TITLE = "A novel Fourier descriptor based image alignment algorithm for
automatic optical inspection",
JOURNAL = JVCIR,
VOLUME = "20",
YEAR = "2009",
NUMBER = "3",
MONTH = "April",
PAGES = "178-189",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157781"}
Last update:Oct 1, 2019 at 15:23:24