@article{bb162300,
AUTHOR = "Chang, C.Y. and Li, C.H. and Lin, S.Y. and Jeng, M.",
TITLE = "Application of Two Hopfield Neural Networks for Automatic Four-Element
LED Inspection",
JOURNAL = SMC-C,
VOLUME = "39",
YEAR = "2009",
NUMBER = "3",
MONTH = "May",
PAGES = "352-365",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157782"}
@article{bb162301,
AUTHOR = "Tsai, D.M. and Chang, C.C. and Chao, S.M.",
TITLE = "Micro-crack inspection in heterogeneously textured solar wafers using
anisotropic diffusion",
JOURNAL = IVC,
VOLUME = "28",
YEAR = "2010",
NUMBER = "3",
MONTH = "March",
PAGES = "491-501",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157783"}
@article{bb162302,
AUTHOR = "Zontak, M. and Cohen, I.",
TITLE = "Defect detection in patterned wafers using anisotropic kernels",
JOURNAL = MVA,
VOLUME = "21",
YEAR = "2010",
NUMBER = "2",
MONTH = "February",
PAGES = "xx-yy",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157784"}
@article{bb162303,
AUTHOR = "Sun, T.H. and Tseng, C.C. and Chen, M.S.",
TITLE = "Electric contacts inspection using machine vision",
JOURNAL = IVC,
VOLUME = "28",
YEAR = "2010",
NUMBER = "6",
MONTH = "June",
PAGES = "890-901",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157785"}
@article{bb162304,
AUTHOR = "Fan, S.K.S. and Chuang, Y.C.A.",
TITLE = "Automatic detection of Mura defect in TFT-LCD based on regression
diagnostics",
JOURNAL = PRL,
VOLUME = "31",
YEAR = "2010",
NUMBER = "15",
MONTH = "November",
PAGES = "2397-2404",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157786"}
@article{bb162305,
AUTHOR = "Zhang, J. and Kim, Y. and Yang, S.H. and Milster, T.D.",
TITLE = "Illumination artifacts in hyper-NA vector imaging",
JOURNAL = JOSA-A,
VOLUME = "27",
YEAR = "2010",
NUMBER = "10",
MONTH = "October",
PAGES = "2272-2284",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157787"}
@article{bb162306,
AUTHOR = "He, X.F. and Fang, F.",
TITLE = "Flat-Panel Color Filter Inspection",
JOURNAL = VisSys,
VOLUME = "16",
YEAR = "2011",
NUMBER = "5",
MONTH = "May",
PAGES = "xx-yy",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157788"}
@article{bb162307,
AUTHOR = "Benedek, C.",
TITLE = "Detection of soldering defects in Printed Circuit Boards with
Hierarchical Marked Point Processes",
JOURNAL = PRL,
VOLUME = "32",
YEAR = "2011",
NUMBER = "13",
MONTH = "October",
PAGES = "1535-1543",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157789"}
@article{bb162308,
AUTHOR = "Peng, Y. and Zhang, J. and Wang, Y. and Yu, Z.P.",
TITLE = "Gradient-Based Source and Mask Optimization in Optical Lithography",
JOURNAL = IP,
VOLUME = "20",
YEAR = "2011",
NUMBER = "10",
MONTH = "October",
PAGES = "2856-2864",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157790"}
@article{bb162309,
AUTHOR = "Long, T. and Wang, H. and Long, B.",
TITLE = "Test generation algorithm for analog systems based on support vector
machine",
JOURNAL = SIViP,
VOLUME = "5",
YEAR = "2011",
NUMBER = "4",
MONTH = "November",
PAGES = "527-533",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157791"}
@article{bb162310,
AUTHOR = "Ibrahim, A. and Tominaga, S. and Horiuchi, T.",
TITLE = "Invariant representation for spectral reflectance images and its
application",
JOURNAL = JIVP,
VOLUME = "2011",
YEAR = "2011",
NUMBER = "1 2011",
PAGES = "xx-yy",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157792"}
@inproceedings{bb162311,
AUTHOR = "Ibrahim, A. and Tominaga, S. and Horiuchi, T.",
TITLE = "Spectral Invariant Representation for Spectral Reflectance Image",
BOOKTITLE = ICPR10,
YEAR = "2010",
PAGES = "2776-2779",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157793"}
@inproceedings{bb162312,
AUTHOR = "Ibrahim, A. and Tominaga, S. and Horiuchi, T.",
TITLE = "Material Classification for Printed Circuit Boards by Spectral Imaging
System",
BOOKTITLE = CCIW09,
YEAR = "2009",
PAGES = "216-225",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157794"}
@inproceedings{bb162313,
AUTHOR = "Horiuchi, T. and Ibrahim, A. and Kadoi, H. and Tominaga, S.",
TITLE = "An Effective Method for Illumination-Invariant Representation of Color
Images",
BOOKTITLE = Color12,
YEAR = "2012",
PAGES = "II: 401-410",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157795"}
@inproceedings{bb162314,
AUTHOR = "Ibrahim, A. and Horiuchi, T. and Tominaga, S.",
TITLE = "Illumination-invariant representation for natural color images and its
application",
BOOKTITLE = Southwest12,
YEAR = "2012",
PAGES = "157-160",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157796"}
@inproceedings{bb162315,
AUTHOR = "Tominaga, S. and Okamoto, S.",
TITLE = "Reflectance-based material classification for printed circuit boards",
BOOKTITLE = CIAP03,
YEAR = "2003",
PAGES = "238-243",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157797"}
@inproceedings{bb162316,
AUTHOR = "Horiuchi, T. and Suzuki, Y. and Tominaga, S.",
TITLE = "Material Classification for Printed Circuit Boards by Kernel Fisher
Discriminant Analysis",
BOOKTITLE = CCIW11,
YEAR = "2011",
PAGES = "152-164",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157798"}
@article{bb162317,
AUTHOR = "Choy, S.K. and Jia, N.N. and Tong, C.S. and Tang, M.L. and Lam, E.Y.",
TITLE = "A Robust Computational Algorithm for Inverse Photomask Synthesis in
Optical Projection Lithography",
JOURNAL = SIIMS,
VOLUME = "5",
YEAR = "2012",
NUMBER = "1 2012",
PAGES = "625-651",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157799"}
@inproceedings{bb162318,
AUTHOR = "Jia, N.N. and Lam, E.Y.",
TITLE = "Stochastic gradient descent for robust inverse photomask synthesis in
optical lithography",
BOOKTITLE = ICIP10,
YEAR = "2010",
PAGES = "4173-4176",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157800"}
@article{bb162319,
AUTHOR = "Yu, J.C. and Yu, P. and Chao, H.Y.",
TITLE = "Library-Based Illumination Synthesis for Critical CMOS Patterning",
JOURNAL = IP,
VOLUME = "22",
YEAR = "2013",
NUMBER = "7",
PAGES = "2811-2821",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157801"}
@article{bb162320,
AUTHOR = "Xu, S. and Cheng, Z. and Gao, Y. and Pan, Q.",
TITLE = "Visual wafer dies counting using geometrical characteristics",
JOURNAL = IET-IPR,
VOLUME = "8",
YEAR = "2014",
NUMBER = "5",
MONTH = "May",
PAGES = "280-288",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157802"}
@article{bb162321,
AUTHOR = "Duan, G.F. and Wang, H.C. and Liu, Z.Y. and Tan, J.R. and Chen, Y.W.",
TITLE = "Automatic optical phase identification of micro-drill bits based on
improved ASM and bag of shape segment in PCB production",
JOURNAL = MVA,
VOLUME = "25",
YEAR = "2014",
NUMBER = "6",
PAGES = "1411-1422",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157803"}
@article{bb162322,
AUTHOR = "Leibovici, M.C.R. and Gaylord, T.K.",
TITLE = "Custom-modified three-dimensional periodic microstructures by
pattern-integrated interference lithography",
JOURNAL = JOSA-A,
VOLUME = "31",
YEAR = "2014",
NUMBER = "7",
MONTH = "July",
PAGES = "1515-1519",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157804"}
@article{bb162323,
AUTHOR = "Estellers, V. and Thiran, J.P. and Gabrani, M.",
TITLE = "Surface Reconstruction From Microscopic Images in Optical Lithography",
JOURNAL = IP,
VOLUME = "23",
YEAR = "2014",
NUMBER = "8",
MONTH = "August",
PAGES = "3560-3573",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157805"}
@article{bb162324,
AUTHOR = "Bernal, F. and Acebron, J.A. and Anjam, I.",
TITLE = "A Stochastic Algorithm Based on Fast Marching for Automatic
Capacitance Extraction in Non-Manhattan Geometries",
JOURNAL = SIIMS,
VOLUME = "7",
YEAR = "2014",
NUMBER = "4",
PAGES = "2657-2674",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157806"}
@article{bb162325,
AUTHOR = "Lakhssassi, A. and Palenychka, R. and Savaria, Y. and Sayde, M. and Zaremba, M.",
TITLE = "Monitoring Thermal Stress in Wafer-Scale Integrated Circuits by the
Attentive Vision Method Using an Infrared Camera",
JOURNAL = CirSysVideo,
VOLUME = "26",
YEAR = "2016",
NUMBER = "2",
MONTH = "February",
PAGES = "412-424",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157807"}
@article{bb162326,
AUTHOR = "Chebolu, A. and Nagahanumaiah",
TITLE = "Contact angle measurement techniques on micro-patterned surfaces:
A comparative analysis",
JOURNAL = IJCVR,
VOLUME = "7",
YEAR = "2017",
NUMBER = "1/2",
PAGES = "148-159",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157808"}
@article{bb162327,
AUTHOR = "Sindagi, V.A. and Srivastava, S.",
TITLE = "Domain Adaptation for Automatic OLED Panel Defect Detection Using
Adaptive Support Vector Data Description",
JOURNAL = IJCV,
VOLUME = "122",
YEAR = "2017",
NUMBER = "2",
MONTH = "April",
PAGES = "193-211",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157809"}
@article{bb162328,
AUTHOR = "Qiao, K. and Zeng, L. and Chen, J. and Hai, J. and Yan, B.",
TITLE = "Wire segmentation for printed circuit board using deep convolutional
neural network and graph cut model",
JOURNAL = IET-IPR,
VOLUME = "12",
YEAR = "2018",
NUMBER = "5",
MONTH = "May",
PAGES = "793-800",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157810"}
@article{bb162329,
AUTHOR = "Boscaro, A. and Jacquir, S. and Chef, S. and Sanchez, K. and Perdu, P. and Binczak, S.",
TITLE = "Automatic localization of signal sources in photon emission images for
integrated circuit analysis",
JOURNAL = SIViP,
VOLUME = "12",
YEAR = "2018",
NUMBER = "4",
MONTH = "May",
PAGES = "775-782",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157811"}
@article{bb162330,
AUTHOR = "Kaur, B. and Kaur, G. and Kaur, A.",
TITLE = "Detection of defective printed circuit boards using image processing",
JOURNAL = IJCVR,
VOLUME = "8",
YEAR = "2018",
NUMBER = "4",
PAGES = "418-434",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157812"}
@article{bb162331,
AUTHOR = "Ashikin, F. and Hashizume, M. and Yotsuyanagi, H. and Lu, S.K. and Roth, Z.",
TITLE = "A Design for Testability of Open Defects at Interconnects in 3D Stacked
ICs",
JOURNAL = IEICE,
VOLUME = "E101-D",
YEAR = "2018",
NUMBER = "8",
MONTH = "August",
PAGES = "2053-2063",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157813"}
@article{bb162332,
AUTHOR = "Cheng, D. and Shi, Y.Q. and Gwee, B.H. and Toh, K.A. and Lin, T.",
TITLE = "A Hierarchical Multiclassifier System for Automated Analysis of
Delayered IC Images",
JOURNAL = IEEE_Int_Sys,
VOLUME = "34",
YEAR = "2019",
NUMBER = "2",
MONTH = "March",
PAGES = "36-43",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157814"}
@inproceedings{bb162333,
AUTHOR = "di Bella, R. and Carrera, D. and Rossi, B. and Fragneto, P. and Boracchi, G.",
TITLE = "Wafer Defect Map Classification Using Sparse Convolutional Networks",
BOOKTITLE = CIAP19,
YEAR = "2019",
PAGES = "II:125-136",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157815"}
@inproceedings{bb162334,
AUTHOR = "Kuo, C. and Ashmore, J. and Huggins, D. and Kira, Z.",
TITLE = "Data-Efficient Graph Embedding Learning for PCB Component Detection",
BOOKTITLE = WACV19,
YEAR = "2019",
PAGES = "551-560",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157816"}
@inproceedings{bb162335,
AUTHOR = "Alagic, D. and Bluder, O. and Pilz, J.",
TITLE = "Quantification and Prediction of Damage in SAM Images of Semiconductor
Devices",
BOOKTITLE = ICIAR18,
YEAR = "2018",
PAGES = "490-496",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157817"}
@inproceedings{bb162336,
AUTHOR = "Schrunner, S. and Bluder, O. and Zernig, A. and Kaestner, A. and Kern, R.",
TITLE = "Markov random fields for pattern extraction in analog wafer test data",
BOOKTITLE = IPTA17,
YEAR = "2017",
PAGES = "1-6",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157818"}
@inproceedings{bb162337,
AUTHOR = "Park, Y. and Kang, K. and Kim, S.",
TITLE = "A Visual Inspection Method Based on Periodic Feature for Wheel Mark
Defect on Wafer Backside",
BOOKTITLE = CAIP17,
YEAR = "2017",
PAGES = "I: 219-227",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157819"}
@inproceedings{bb162338,
AUTHOR = "Wang, W. and Lei, X. and Ding, S.T. and He, X.F. and Li, H.R.",
TITLE = "Optimal layout algorithm for reusing solar cell fragments",
BOOKTITLE = ICIVC17,
YEAR = "2017",
PAGES = "277-280",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157820"}
@inproceedings{bb162339,
AUTHOR = "Pramerdorfer, C. and Kampel, M.",
TITLE = "A dataset for computer-vision-based PCB analysis",
BOOKTITLE = MVA15,
YEAR = "2015",
PAGES = "378-381",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157821"}
@inproceedings{bb162340,
AUTHOR = "Sindagi, V.A. and Srivastava, S.",
TITLE = "OLED panel defect detection using local inlier-outlier ratios and
modified LBP",
BOOKTITLE = MVA15,
YEAR = "2015",
PAGES = "214-217",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157822"}
@inproceedings{bb162341,
AUTHOR = "Fuksis, R. and Pudzs, M. and Kravtsov, A. and Kravtsov, A.",
TITLE = "Measuring the Radius of Meniscus Ring During the Growth of Silicon Rods",
BOOKTITLE = SCIA15,
YEAR = "2015",
PAGES = "462-471",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157823"}
@inproceedings{bb162342,
AUTHOR = "Matlin, E. and Troy, N. and Stoker, D.",
TITLE = "Imaging activity in integrated circuits",
BOOKTITLE = ICIP14,
YEAR = "2014",
PAGES = "5821-5825",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157824"}
@inproceedings{bb162343,
AUTHOR = "Xie, F. and Dau, A.H. and Uitdenbogerd, A.L. and Song, A.",
TITLE = "Evolving PCB visual inspection programs using genetic programming",
BOOKTITLE = IVCNZ13,
YEAR = "2013",
PAGES = "406-411",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157825"}
@inproceedings{bb162344,
AUTHOR = "Schwarzbauer, T. and Welk, M. and Mayrhofer, C. and Schubert, R.",
TITLE = "Automated Quality Inspection of Microfluidic Chips Using Morphologic
Techniques",
BOOKTITLE = ISMM13,
YEAR = "2013",
PAGES = "508-519",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157826"}
@inproceedings{bb162345,
AUTHOR = "Kimura, Y. and Takauji, H. and Kaneko, S. and Domae, Y. and Okuda, H.",
TITLE = "Shape recognition of flexible cables by Outer Edge FCM clustering",
BOOKTITLE = FCV11,
YEAR = "2011",
PAGES = "1-5",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157827"}
@inproceedings{bb162346,
AUTHOR = "Takagi, Y. and Asano, T. and Liu, W. and Yao, J.",
TITLE = "Color uniformity evaluation of electronic displays based on visual
sensitivity",
BOOKTITLE = FCV11,
YEAR = "2011",
PAGES = "1-5",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157828"}
@inproceedings{bb162347,
AUTHOR = "Buddhachan, V. and KaewTrakulPong, P.",
TITLE = "Machine Vision for Excess Gluing Inspection in Spindle Motor Assembly",
BOOKTITLE = MVA09,
YEAR = "2009",
PAGES = "304-",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157829"}
@inproceedings{bb162348,
AUTHOR = "Ibrahim, A. and Tominaga, S. and Horiuchi, T.",
TITLE = "Unsupervised Material Classification of Printed Circuit Boards Using
Dimension-Reduced Spectral Information",
BOOKTITLE = MVA09,
YEAR = "2009",
PAGES = "435-",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157830"}
@inproceedings{bb162349,
AUTHOR = "Kryszczuk, K. and Hurley, P. and Sayah, R.",
TITLE = "Direct Printability Prediction in VLSI Using Features from Orthogonal
Transforms",
BOOKTITLE = ICPR10,
YEAR = "2010",
PAGES = "2764-2767",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157831"}
@inproceedings{bb162350,
AUTHOR = "Lichtenauer, M.S. and Avelar, S. and Toporek, G.",
TITLE = "Segmentation of Images of Lead Free Solder",
BOOKTITLE = ICISP10,
YEAR = "2010",
PAGES = "165-172",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157832"}
@inproceedings{bb162351,
AUTHOR = "Duan, G.F. and Chen, Y.W.",
TITLE = "Improved Active Shape Model for automatic optical phase identification
of microdrill bits in Printed Circuit Board production",
BOOKTITLE = ICIP09,
YEAR = "2009",
PAGES = "425-428",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157833"}
@inproceedings{bb162352,
AUTHOR = "Li, T.Z. and Wen, F. and Lu, H.W. and Ma, L.X.",
TITLE = "Study on the Treatment Technology and Application of Charge Coupled
Device",
BOOKTITLE = CISP09,
YEAR = "2009",
PAGES = "1-5",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157834"}
@inproceedings{bb162353,
AUTHOR = "Pieters, R. and Jonker, P.P. and Nijmeijer, H.",
TITLE = "Real-Time Center Detection of an OLED Structure",
BOOKTITLE = ACIVS09,
YEAR = "2009",
PAGES = "400-409",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157835"}
@inproceedings{bb162354,
AUTHOR = "Liu, X. and Yang, L.X.",
TITLE = "Study on virtual simulation of chip during manufacturing",
BOOKTITLE = IASP09,
YEAR = "2009",
PAGES = "346-350",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157836"}
@inproceedings{bb162355,
AUTHOR = "Nedzved, A. and Ablameyko, S. and Belotserkovsky, A. and Maziewski, A. and Dobrogowski, W.",
TITLE = "The structure analysis of ultra thin magnetic film images",
BOOKTITLE = ICPR08,
YEAR = "2008",
PAGES = "1-4",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157837"}
@inproceedings{bb162356,
AUTHOR = "Huttunen, H. and Ruusuvuori, P. and Manninen, T. and Rutanen, K. and Ronkka, R. and Visa, A.",
TITLE = "Object detection for dynamic adaptation of interconnections in inkjet
printed electronics",
BOOKTITLE = ICIP08,
YEAR = "2008",
PAGES = "2364-2367",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157838"}
@inproceedings{bb162357,
AUTHOR = "Leta, F.R. and Feliciano, F.F.",
TITLE = "Computational system to detect defects in mounted and bare PCB Based on
connectivity and image correlation",
BOOKTITLE = WSSIP08,
YEAR = "2008",
PAGES = "331-334",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157839"}
@inproceedings{bb162358,
AUTHOR = "Shortis, M.R. and Johnston, G.H.G. and Pottler, K. and Lupfert, E.",
TITLE = "Photogrammetric Analysis of Solar Collectors",
BOOKTITLE = ISPRS08,
YEAR = "2008",
PAGES = "B5: 81 ff",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157840"}
@inproceedings{bb162359,
AUTHOR = "Wang, D.Z. and Wu, C.H. and Ip, A. and Chan, C.Y. and Wang, D.W.",
TITLE = "Fast Multi-template Matching Using a Particle Swarm Optimization
Algorithm for PCB Inspection",
BOOKTITLE = EvoIASP08,
YEAR = "2008",
PAGES = "xx-yy",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157841"}
@inproceedings{bb162360,
AUTHOR = "Lin, H.D. and Chiu, S.W.",
TITLE = "Computer-Aided Vision System for MURA-Type Defect Inspection in Liquid
Crystal Displays",
BOOKTITLE = PSIVT06,
YEAR = "2006",
PAGES = "442-452",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157842"}
@inproceedings{bb162361,
AUTHOR = "Oda, M. and Nishio, Y. and Ushida, A.",
TITLE = "Spatial-temporal Analysis Method of Plane Circuits Based on Two-Layer
Cellular Neural Networks",
BOOKTITLE = IWICPAS06,
YEAR = "2006",
PAGES = "195-204",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157843"}
@inproceedings{bb162362,
AUTHOR = "Bourgeat, P. and Meriaudeau, F.",
TITLE = "Classifier Vote and Gabor Filter Banks for Wafer Segmentation",
BOOKTITLE = ICIP05,
YEAR = "2005",
PAGES = "I: 369-372",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157844"}
@inproceedings{bb162363,
AUTHOR = "Ho, W.K. and Tay, A. and Zhou, Y. and Yang, K. and Hu, N.",
TITLE = "Detection of wafer warpages during thermal processing in
microlithography",
BOOKTITLE = ICARCV04,
YEAR = "2004",
PAGES = "I: 485-490",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157845"}
@inproceedings{bb162364,
AUTHOR = "El Doker, T.A. and King, J. and Scott, D.R.",
TITLE = "Initial results on the development of a new wafer inspection paradigm",
BOOKTITLE = Southwest04,
YEAR = "2004",
PAGES = "124-127",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157846"}
@inproceedings{bb162365,
AUTHOR = "Choi, K.S. and Pyun, J.Y. and Kim, N.H. and Choi, B.D. and Ko, S.J.",
TITLE = "Real-Time Inspection System for Printed Circuit Boards",
BOOKTITLE = DAGM03,
YEAR = "2003",
PAGES = "458-465",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157847"}
@inproceedings{bb162366,
AUTHOR = "Hiroi, T. and Shishido, C. and Watanabe, M.",
TITLE = "Pattern alignment method based on consistency among local registration
candidates for LSI wafer pattern inspection",
BOOKTITLE = WACV02,
YEAR = "2002",
PAGES = "257-263",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157848"}
@inproceedings{bb162367,
AUTHOR = "Shimoda, A. and Iwata, H. and Shibata, Y. and Ikeda, H.",
TITLE = "Thin Film Magnetic Head Wafer Inspection Technique Using
Geometrical Feature Based Image Comparison",
BOOKTITLE = MVA98,
YEAR = "1998",
PAGES = "xx-yy",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157849"}
@inproceedings{bb162368,
AUTHOR = "Chang, M.C. and Chen, H.Y. and Fuh, C.S.",
TITLE = "Fast Search Algorithms for IC Printed Mark Quality Inspection",
BOOKTITLE = MVA98,
YEAR = "1998",
PAGES = "xx-yy",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157850"}
@inproceedings{bb162369,
AUTHOR = "Marino, P. and Dominguez, M.A.",
TITLE = "Feature Extraction for Electronic Equipment Manufacturing",
BOOKTITLE = MVA98,
YEAR = "1998",
PAGES = "xx-yy",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157851"}
@inproceedings{bb162370,
AUTHOR = "Gleason, S.S. and Tobin, K.W.",
TITLE = "Directional dilation for the connection of piece-wise objects:
A semiconductor manufacturing case study",
BOOKTITLE = ICIP96,
YEAR = "1996",
PAGES = "III: 9-12",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157852"}
@inproceedings{bb162371,
AUTHOR = "Lu, Y. and Tisler, A.",
TITLE = "Machine Vision Inspection of VF Display Boards",
BOOKTITLE = ICPR96,
YEAR = "1996",
PAGES = "III: 839-843",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157853"}
@inproceedings{bb162372,
AUTHOR = "Doi, H. and Suzuki, Y. and Hara, Y. and Iida, T. and Fujishita, Y. and Karasaki, K.",
TITLE = "Real-Time X-Ray Inspection of 3D Defects in Circuit Board Patterns",
BOOKTITLE = ICCV95,
YEAR = "1995",
PAGES = "575-582",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157854"}
@inproceedings{bb162373,
AUTHOR = "Duin, R.P.W. and Hoek, E.T.G.",
TITLE = "SMD position measurement by a Kohonen network compared with image
processing",
BOOKTITLE = CAIP95,
YEAR = "1995",
PAGES = "606-611",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157855"}
@inproceedings{bb162374,
AUTHOR = "Darboux, M. and Dinten, J.M.",
TITLE = "Development of an automated bond verification system for advanced
electronic packages",
BOOKTITLE = CIAP95,
YEAR = "1995",
PAGES = "737-742",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157856"}
@inproceedings{bb162375,
AUTHOR = "Cook, B.D. and Lee, S.Y.",
TITLE = "Fast exposure simulation for large circuit patterns in electron beam
lithography",
BOOKTITLE = ICIP95,
YEAR = "1995",
PAGES = "I: 442-445",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157857"}
@inproceedings{bb162376,
AUTHOR = "Hiroi, T. and Maeda, S. and Kubota, H. and Watanabe, K. and Nakagawa, Y.",
TITLE = "Precise visual inspection for LSI wafer patterns using subpixel image
alignment",
BOOKTITLE = WACV94,
YEAR = "1994",
PAGES = "26-34",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157858"}
@inproceedings{bb162377,
AUTHOR = "Thibadeau, R.H.",
TITLE = "Printed Circuit Board inspection",
BOOKTITLE = CMU-RI-TR,
YEAR = "1981",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157859"}
@inproceedings{bb162378,
AUTHOR = "Thibadeau, R.H. and Friedman, M. and Seto, J.",
TITLE = "Automatic Inspection for Printed Wiring",
BOOKTITLE = CMU-RI-TR,
YEAR = "1982",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157860"}
@inproceedings{bb162379,
AUTHOR = "Ninomiya, T. and Yoshimura, K. and Nomoto, M. and Nakagawa, Y.",
TITLE = "Automatic Printed Circuit Pattern Inspection Using Connectivity
Preserving Image Reduction and Connectivity Comparison",
BOOKTITLE = ICPR92,
YEAR = "1992",
PAGES = "I:53-56",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157861"}
@inproceedings{bb162380,
AUTHOR = "Chehdi, K. and Corazza, M.",
TITLE = "Automatic System of Quality Control of Hybrid Circuits by
Image Analysis",
BOOKTITLE = ICPR92,
YEAR = "1992",
PAGES = "I:433-436",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157862"}
@inproceedings{bb162381,
AUTHOR = "Khotanzad, A. and Banerjee, H. and Srinath, M.",
TITLE = "A vision system for inspection of ball bonds in integrated circuits",
BOOKTITLE = WACV92,
YEAR = "1992",
PAGES = "290-297",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157863"}
@inproceedings{bb162382,
AUTHOR = "Khalaj, B.H. and Aghajan, H.K. and Kailath, T.",
TITLE = "Automated direct patterned wafer inspection",
BOOKTITLE = WACV92,
YEAR = "1992",
PAGES = "266-273",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157864"}
@inproceedings{bb162383,
AUTHOR = "Dainis, G.A. and Ward, M.O.",
TITLE = "Rule-Based Inspection of Leadframes",
BOOKTITLE = CVPR88,
YEAR = "1988",
PAGES = "580-585",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT157865"}
@article{bb162384,
AUTHOR = "Clocksin, W.F. and Bromley, J.S.E. and Davey, P.G. and Vidler, A.R. and Morgan, C.G.",
TITLE = "An Implementation of Model-Based Visual Feedback for
Robot Arc Welding of Thin Sheet Steel",
JOURNAL = IJRR,
VOLUME = "4",
YEAR = "1985",
NUMBER = "1",
PAGES = "13-26",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT157866"}
@article{bb162385,
AUTHOR = "Bartlett, S.L. and Besl, P.J. and Cole, C.L. and Jain, R.C. and Mukherjee, D. and Skifstad, K.D.",
TITLE = "Automatic Solder Joint Inspection",
JOURNAL = PAMI,
VOLUME = "10",
YEAR = "1988",
NUMBER = "1",
MONTH = "January",
PAGES = "31-43",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT157867"}
@inproceedings{bb162386,
AUTHOR = "Besl, P.J. and Delp, E.J. and Jain, R.C.",
TITLE = "Automatic Visual Solder Joint Inspection",
BOOKTITLE = RA,
VOLUME = "1",
YEAR = "1985",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT157868"}
@article{bb162387,
AUTHOR = "Agapakis, J.E. and Katz, J.M. and Friedman, J.M. and Epstein, G.N.",
TITLE = "Vision-Aided Robotic Welding: An Approach and a Flexible Implementation",
JOURNAL = IJRR,
VOLUME = "9",
YEAR = "1990",
NUMBER = "5",
PAGES = "17-34",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT157869"}
@article{bb162388,
AUTHOR = "Kim, J.H. and Cho, H.S.",
TITLE = "Neural-Network-Based Inspection of Solder Joints Using a
Circular Illumination",
JOURNAL = IVC,
VOLUME = "13",
YEAR = "1995",
NUMBER = "6",
MONTH = "August",
PAGES = "479-490",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT157870"}
@article{bb162389,
AUTHOR = "Ruiz del Solar, J. and Koppen, M.",
TITLE = "Sewage Pipe Image Segmentation Using a Neural-Based Architecture",
JOURNAL = PRL,
VOLUME = "17",
YEAR = "1996",
NUMBER = "4",
MONTH = "April",
PAGES = "363-368",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT157871"}
@article{bb162390,
AUTHOR = "Presern, S. and Gyergyek, L.",
TITLE = "An Intelligent Tactile Sensor:
An On-Line Hierarchical Object and Seam Analyzer",
JOURNAL = PAMI,
VOLUME = "5",
YEAR = "1983",
NUMBER = "2",
MONTH = "March",
PAGES = "217-220",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT157872"}
@article{bb162391,
AUTHOR = "Ryu, Y.K. and Cho, H.S.",
TITLE = "New Optical Measuring System for Solder Joint Inspection",
JOURNAL = OptLas,
VOLUME = "26",
YEAR = "1997",
NUMBER = "6",
PAGES = "487-514",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT157873"}
@article{bb162392,
AUTHOR = "Kim, J.H. and Cho, H.S. and Kim, S.",
TITLE = "Pattern-Classification of Solder Joint Images Using a
Correlation Neural-Network",
JOURNAL = EngAAI,
VOLUME = "9",
YEAR = "1996",
NUMBER = "6",
MONTH = "December",
PAGES = "655-669",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT157874"}
@article{bb162393,
AUTHOR = "Tarng, Y.S. and Yeh, S.S. and Juang, S.C.",
TITLE = "Fuzzy Pattern-Recognition of Tungsten Inert-Gas Weld Quality",
JOURNAL = IJAMT,
VOLUME = "13",
YEAR = "1997",
NUMBER = "6",
PAGES = "387-392",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT157875"}
@article{bb162394,
AUTHOR = "Yu, J.Y. and Na, S.J.",
TITLE = "A Study on Vision Sensors for Seam Tracking of Height-Varying Weldment:
Part 1: Mathematical-Model",
JOURNAL = "Mechatronics",
VOLUME = "7",
YEAR = "1997",
NUMBER = "7",
MONTH = "October",
PAGES = "599-612",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT157876"}
@article{bb162395,
AUTHOR = "Cooper, D. and Pridmore, T.P. and Taylor, N.",
TITLE = "Towards the Recovery of Extrinsic Camera Parameters from
Video Records of Sewer Surveys",
JOURNAL = MVA,
VOLUME = "11",
YEAR = "1998",
NUMBER = "2",
MONTH = "October",
PAGES = "53-63",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT157877"}
@article{bb162396,
AUTHOR = "Zingaretti, P. and Zanoli, S.M.",
TITLE = "Robust Real Time Detection of an Underwater Pipeline",
JOURNAL = EngAAI,
VOLUME = "11",
YEAR = "1998",
NUMBER = "2",
MONTH = "April",
PAGES = "257-268",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT157878"}
@article{bb162397,
AUTHOR = "Xu, K. and Luxmoore, A.R. and Davies, T.",
TITLE = "Sewer Pipe Deformation Assessment by Image-Analysis of Video Surveys",
JOURNAL = PR,
VOLUME = "31",
YEAR = "1998",
NUMBER = "2",
MONTH = "February",
PAGES = "169-180",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT157879"}
@article{bb162398,
AUTHOR = "Kim, T.H. and Cho, T.H. and Moon, Y.S. and Park, S.H.",
TITLE = "Visual inspection system for the classification of solder joints",
JOURNAL = PR,
VOLUME = "32",
YEAR = "1999",
NUMBER = "4",
MONTH = "April",
PAGES = "565-575",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT157880"}
@article{bb162399,
AUTHOR = "Boyer, K.L. and Ozguner, T.",
TITLE = "Robust online detection of pipeline corrosion from range data",
JOURNAL = MVA,
VOLUME = "12",
YEAR = "2001",
NUMBER = "6",
PAGES = "291-304",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT157881"}
Last update:Oct 1, 2019 at 15:23:24