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automatic optical inspection",
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        TITLE = "Application of Two Hopfield Neural Networks for Automatic Four-Element
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@article{bb167102,
        AUTHOR = "Tsai, D.M. and Chang, C.C. and Chao, S.M.",
        TITLE = "Micro-crack inspection in heterogeneously textured solar wafers using
anisotropic diffusion",
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@article{bb167103,
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        TITLE = "Defect detection in patterned wafers using anisotropic kernels",
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@article{bb167104,
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        TITLE = "Electric contacts inspection using machine vision",
        JOURNAL = IVC,
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@article{bb167105,
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        TITLE = "Automatic detection of Mura defect in TFT-LCD based on regression
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@article{bb167106,
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        TITLE = "Illumination artifacts in hyper-NA vector imaging",
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@article{bb167107,
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        TITLE = "Flat-Panel Color Filter Inspection",
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@article{bb167108,
        AUTHOR = "Benedek, C.",
        TITLE = "Detection of soldering defects in Printed Circuit Boards with
Hierarchical Marked Point Processes",
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@article{bb167109,
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@article{bb167110,
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@article{bb167111,
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@inproceedings{bb167113,
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@inproceedings{bb167117,
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@article{bb167120,
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@article{bb167121,
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@article{bb167122,
        AUTHOR = "Duan, G.F. and Wang, H.C. and Liu, Z.Y. and Tan, J.R. and Chen, Y.W.",
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@article{bb167123,
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@article{bb167124,
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@article{bb167125,
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@article{bb167126,
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@article{bb167127,
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A comparative analysis",
        JOURNAL = IJCVR,
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@article{bb167128,
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        TITLE = "Domain Adaptation for Automatic OLED Panel Defect Detection Using
Adaptive Support Vector Data Description",
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neural network and graph cut model",
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@article{bb167130,
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@article{bb167131,
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@article{bb167132,
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@inproceedings{bb167136,
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candidates for LSI wafer pattern inspection",
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@article{bb167196,
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@article{bb167198,
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@article{bb167199,
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