@article{bb174700,
        AUTHOR = "Shirvaikar, M.V.",
        TITLE = "Trends in automated visual inspection",
        JOURNAL = RealTimeIP,
        VOLUME = "1",
        YEAR = "2006",
        NUMBER = "1",
        MONTH = "October",
        PAGES = "41-43",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT170047"}

@inproceedings{bb174701,
        AUTHOR = "Sannen, D. and van Brussel, H. and Nuttin, M.",
        TITLE = "Learning Visual Quality Inspection from Multiple Humans Using Ensembles
of Classifiers",
        BOOKTITLE = CVS08,
        YEAR = "2008",
        PAGES = "xx-yy",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT170048"}

@inproceedings{bb174702,
        AUTHOR = "Hata, S.",
        TITLE = "Practical Visual Inspection Techniques: 
Optics, Micro-electronics and Advanced Software Technology",
        BOOKTITLE = ICPR00,
        YEAR = "2000",
        PAGES = "Vol IV: 114-117",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT170049"}

@inproceedings{bb174703,
        AUTHOR = "Flinchbaugh, B.E.",
        TITLE = "Industry Needs for Computer Vision and Pattern Recognition: Panel",
        BOOKTITLE = CVPR96,
        YEAR = "1996",
        PAGES = "Panel",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT170050"}

@inproceedings{bb174704,
        AUTHOR = "Petkovic, D.",
        TITLE = "Human Assisted Computer Vision and Artificial Intelligence -- Why Not?",
        BOOKTITLE = CVPR96,
        YEAR = "1996",
        PAGES = "Invited Talk",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT170051"}

@inproceedings{bb174705,
        AUTHOR = "Noble, J.A. and Mundy, J.L.",
        TITLE = "Constraint Processing Applied to Industrial Inspection and
Continuous Product Improvement",
        BOOKTITLE = DARPA93,
        YEAR = "1993",
        PAGES = "801-809",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT170052"}

@inproceedings{bb174706,
        AUTHOR = "Shapiro, L.G. and Haralick, R.M. and Pong, T.C.",
        TITLE = "The Visual Components of an Automated Inspection Task",
        BOOKTITLE = CAIA84,
        YEAR = "1984",
        PAGES = "207-210",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT170053"}

@article{bb174707,
        AUTHOR = "Watkins, L.S.",
        TITLE = "Inspection of IC Photomasks with Intensity Spatial Filters",
        JOURNAL = PIEEE,
        VOLUME = "57",
        YEAR = "1969",
        PAGES = "1634-1639",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170056"}

@article{bb174708,
        AUTHOR = "Axelrod, N.N.",
        TITLE = "Intensity Spatial Filtering Applied to Defect Detection in 
Integrated Circuit Photomasks",
        JOURNAL = PIEEE,
        VOLUME = "60",
        YEAR = "1972",
        PAGES = "447-448",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170057"}

@inproceedings{bb174709,
        AUTHOR = "Bourdelais, R.J. and Colangelo, D. and McFadyen, R.J. and Elliott, J.F.",
        TITLE = "Instrument for Automatically Inspecting Integrated Circuit Masks for
Pinholes and Spots",
        BOOKTITLE = US_Patent,
        YEAR = "1974",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170058"}

@article{bb174710,
        AUTHOR = "Horn, B.K.P.",
        TITLE = "A Problem in Computer Vision: 
Orienting Silicon Integrated Circuit Chips for Lead Bonding",
        JOURNAL = CGIP,
        VOLUME = "4",
        YEAR = "1975",
        NUMBER = "3",
        MONTH = "September",
        PAGES = "294-303",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170059"}

@inproceedings{bb174711,
        AUTHOR = "Horn, B.K.P.",
        TITLE = "Orienting Silicon Integrated Circuit Chips for Lead Bonding",
        BOOKTITLE = "MIT AI Memo",
        YEAR = "1975",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170060"}

@article{bb174712,
        AUTHOR = "Harlow, C.A. and Henderson, S.E. and Rayfield, D.A. and Johnson, R.J. and Dwyer, S.J.",
        TITLE = "Automated Inspection of Electronic Assemblies",
        JOURNAL = Computer,
        VOLUME = "8",
        YEAR = "1975",
        NUMBER = "4",
        MONTH = "April",
        PAGES = "36-45",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170061"}

@inproceedings{bb174713,
        AUTHOR = "Olsen, O.A.",
        TITLE = "Visual Method of Locating Faults in Printed Circuit Boards",
        BOOKTITLE = US_Patent,
        YEAR = "1976",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170062"}

@inproceedings{bb174714,
        AUTHOR = "Baxter, D.W. and Shipway, R.E.",
        TITLE = "Defect Inspection of Objects Such as Electronic Circuits",
        BOOKTITLE = US_Patent,
        YEAR = "1977",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170063"}

@article{bb174715,
        AUTHOR = "McVey, E.S. and van Tol, A.",
        TITLE = "An experimental printed circuit board drilling system automated by
pattern recognition",
        JOURNAL = PR,
        VOLUME = "11",
        YEAR = "1979",
        NUMBER = "4",
        PAGES = "271-276",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170064"}

@article{bb174716,
        AUTHOR = "Hsieh, Y.Y. and Fu, K.S.",
        TITLE = "An Automatic Visual Inspection System for Integrated Circuit Chips",
        JOURNAL = CGIP,
        VOLUME = "14",
        YEAR = "1980",
        NUMBER = "4",
        MONTH = "December",
        PAGES = "293-343",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170065"}

@article{bb174717,
        AUTHOR = "Jarvis, J.F.",
        TITLE = "A Method for Automating the Visual Inspection of
Printed Wiring Boards",
        JOURNAL = PAMI,
        VOLUME = "2",
        YEAR = "1980",
        NUMBER = "1",
        MONTH = "January",
        PAGES = "77-83",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170066"}

@article{bb174718,
        AUTHOR = "Goto, N. and Kondo, T.",
        TITLE = "An Automatic Inspection System for Printed Wiring Board Masks",
        JOURNAL = PR,
        VOLUME = "12",
        YEAR = "1980",
        NUMBER = "6",
        PAGES = "443-455",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170067"}

@article{bb174719,
        AUTHOR = "Pau, L.F.",
        TITLE = "Integrated Testing and Algorithms for Visual
Inspection of Integrated Circuits",
        JOURNAL = PAMI,
        VOLUME = "5",
        YEAR = "1983",
        NUMBER = "6",
        MONTH = "November",
        PAGES = "602-608",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170068"}

@inproceedings{bb174720,
        AUTHOR = "Pau, L.F.",
        TITLE = "Semiconductio IC's: Integrated Testing and Algorithms for Visual
Inspection",
        BOOKTITLE = ICPR80,
        YEAR = "1980",
        PAGES = "238-240",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170069"}

@article{bb174721,
        AUTHOR = "Baird, M.L.",
        TITLE = "SIGHT-I: A Computer Vision System for Automated IC Chip Manufacture",
        JOURNAL = SMC,
        VOLUME = "8",
        YEAR = "1978",
        NUMBER = "2",
        MONTH = "February",
        PAGES = "133-139",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170070"}

@inproceedings{bb174722,
        AUTHOR = "Baird, M.L.",
        TITLE = "An Application ov Computer Vision to Automatic IC Chip Manufacture",
        BOOKTITLE = ICPR76,
        YEAR = "1976",
        PAGES = "3-7",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170071"}

@article{bb174723,
        AUTHOR = "West, M.A. and de Foster, S. and Baldwin, E.C. and Zeigler, R.A.",
        TITLE = "Computer Controlled Optical Testing of High-Density
Printed-Circuit Boards",
        JOURNAL = IBMRD,
        VOLUME = "27",
        YEAR = "1983",
        NUMBER = "1",
        PAGES = "50-58",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170072"}

@inproceedings{bb174724,
        AUTHOR = "Crabb, R.M. and de Foster, S.M. and Rittenhouse, N.E. and West, M.A. and Ziegler, R.A.",
        TITLE = "System for measuring and detecting printed circuit wiring defects",
        BOOKTITLE = US_Patent,
        YEAR = "1987",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170073"}

@article{bb174725,
        AUTHOR = "Wahl, F. and So, S. and Wong, K.",
        TITLE = "A Hybrid Optical-Digital Image Processing Method for Surface Inspection",
        JOURNAL = IBMRD,
        VOLUME = "27",
        YEAR = "1983",
        NUMBER = "4",
        MONTH = "July",
        PAGES = "376-385",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170074"}

@article{bb174726,
        AUTHOR = "Rubat du Merac, C. and Jutier, P. and Laurent, J. and Courtois, B.",
        TITLE = "A New Domain for Image Analysis:
VLSI Circuit Testing, with ROMULAD, 
Specialized in Parallel Image Processing",
        JOURNAL = PRL,
        VOLUME = "1",
        YEAR = "1983",
        PAGES = "347-357",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170075"}

@article{bb174727,
        AUTHOR = "Zeller, H. and Doemens, G.",
        TITLE = "Applications of Pattern Recognition in Semiconductor and
Printer Board Production",
        JOURNAL = SP,
        VOLUME = "5",
        YEAR = "1983",
        PAGES = "399-412",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170076"}

@article{bb174728,
        AUTHOR = "Wilder, J.",
        TITLE = "Machine Vision for Inspection of Keyboards",
        JOURNAL = SP,
        VOLUME = "5",
        YEAR = "1983",
        PAGES = "413-421",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170077"}

@article{bb174729,
        AUTHOR = "West, G.A.W.",
        TITLE = "A System for the Automatic Visual Inspection of 
Bare-Printed Circuit Boards",
        JOURNAL = SMC,
        VOLUME = "14",
        YEAR = "1984",
        PAGES = "767-773",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170078"}

@inproceedings{bb174730,
        AUTHOR = "Nakashima, M. and Koezuka, T. and Inagaki, T.",
        TITLE = "Recognition method and apparatus",
        BOOKTITLE = US_Patent,
        YEAR = "1984",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170079"}

@article{bb174731,
        AUTHOR = "Mandeville, J.R.",
        TITLE = "Novel Method for Analysis of Printed Circuit Images",
        JOURNAL = IBMRD,
        VOLUME = "29",
        YEAR = "1985",
        NUMBER = "1",
        MONTH = "January",
        PAGES = "73-86",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170080"}

@article{bb174732,
        AUTHOR = "Bixler, J.P. and Sanford, J.P.",
        TITLE = "A Technique for Encoding Lines and Regions in Engineering Drawings",
        JOURNAL = PR,
        VOLUME = "18",
        YEAR = "1985",
        NUMBER = "5",
        PAGES = "367-377",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170081"}

@article{bb174733,
        AUTHOR = "Yoda, H. and Ohuchi, Y. and Taniguchi, Y. and Ejiri, M.",
        TITLE = "An Automatic Wafer Inspection System Using Pipelined Image
Processing Techniques",
        JOURNAL = PAMI,
        VOLUME = "10",
        YEAR = "1988",
        NUMBER = "1",
        MONTH = "January",
        PAGES = "4-16",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170082"}

@article{bb174734,
        AUTHOR = "Hara, Y. and Doi, H. and Karasaki, K. and Iida, T.",
        TITLE = "A System for PCB Automated Inspection Using Fluorescent Light",
        JOURNAL = PAMI,
        VOLUME = "10",
        YEAR = "1988",
        NUMBER = "1",
        MONTH = "January",
        PAGES = "69-78",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170083"}

@article{bb174735,
        AUTHOR = "Shu, D.B. and Li, C.C. and Mancuso, J.F. and Sun, Y.N.",
        TITLE = "A Line Extraction Method for Automated SEM Inspection of VLSI
Resist",
        JOURNAL = PAMI,
        VOLUME = "10",
        YEAR = "1988",
        NUMBER = "1",
        MONTH = "January",
        PAGES = "117-120",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170084"}

@article{bb174736,
        AUTHOR = "Ando, M. and Inagaki, T.",
        TITLE = "Automatic Optical Inspection of Plated Through-Holes for
Ultrahigh Density Printed Wiring Boards",
        JOURNAL = MVA,
        VOLUME = "1",
        YEAR = "1988",
        PAGES = "175-181",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170085"}

@article{bb174737,
        AUTHOR = "Dom, B.E. and Brecher, V.H. and Bonner, R. and Batchelder, J.S. and Jaffe, R.S.",
        TITLE = "The P300: A System for Automatic Pattern Wafer Inspection",
        JOURNAL = MVA,
        VOLUME = "1",
        YEAR = "1988",
        PAGES = "205-221",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170086"}

@article{bb174738,
        AUTHOR = "Hara, Y. and Akiyama, N. and Karasaki, K.",
        TITLE = "Automatic Inspection System for Printed Circuit Boards",
        JOURNAL = PAMI,
        VOLUME = "5",
        YEAR = "1983",
        NUMBER = "6",
        MONTH = "November",
        PAGES = "623-630",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170087"}

@inproceedings{bb174739,
        AUTHOR = "Hara, Y. and Okamoto, K. and Hamada, T. and Akiyama, N. and Nakagawa, K. and Torisawa, S. and Nakashima, S.",
        TITLE = "Automatic Visual Inspection of LSI Photomasks",
        BOOKTITLE = ICPR80,
        YEAR = "1980",
        PAGES = "273-279",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170088"}

@article{bb174740,
        AUTHOR = "Sanz, J.L.C. and Petkovic, D.",
        TITLE = "Machine Vision Algorithms for Automated Inspection of
Thin-Film Disk Heads",
        JOURNAL = PAMI,
        VOLUME = "10",
        YEAR = "1988",
        NUMBER = "6",
        MONTH = "November",
        PAGES = "830-848",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170089"}

@article{bb174741,
        AUTHOR = "Sanz, J.L.C. and Dinstein, I. and Petkovic, D.",
        TITLE = "Computing Multi-Colored Polygonal Masks in Pipeline Architectures and Its
Application to Automated Visual Inspection",
        JOURNAL = CACM,
        VOLUME = "30",
        YEAR = "1987",
        NUMBER = "4",
        MONTH = "April",
        PAGES = "318-329",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170090"}

@article{bb174742,
        AUTHOR = "Petkovic, D. and Hinkle, E.B.",
        TITLE = "A Rule-Based System for Verifying Engineering Specifications in
Industrial Visual Inspection Applications",
        JOURNAL = PAMI,
        VOLUME = "9",
        YEAR = "1987",
        NUMBER = "2",
        MONTH = "March",
        PAGES = "306-311",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170091"}

@inproceedings{bb174743,
        AUTHOR = "Dom, B. and Steele, D. and Petkovic, D. and Kuhlmann, L.",
        TITLE = "Algorithms for automatic disk head/slider inspection",
        BOOKTITLE = ICPR94,
        YEAR = "1994",
        PAGES = "A:295-300",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170092"}

@inproceedings{bb174744,
        AUTHOR = "Petkovic, D. and Sanz, J.L.C. and Mohiuddin, K.M.A. and Hinkle, E.B. and Flickner, M.D. and Cox, C. and Wong, K.",
        TITLE = "An Experimental System for Disk Head Inspection",
        BOOKTITLE = ICPR86,
        YEAR = "1986",
        PAGES = "9-13",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170093"}

@article{bb174745,
        AUTHOR = "Sprague, A.P. and Donahue, M.J. and Rokhlin, S.I.",
        TITLE = "A Method for Automatic Inspection of Printed Circuit Boards",
        JOURNAL = CVGIP,
        VOLUME = "54",
        YEAR = "1991",
        NUMBER = "3",
        MONTH = "November",
        PAGES = "401-415",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170094"}

@article{bb174746,
        AUTHOR = "Wojcik, Z.M.",
        TITLE = "An Approach to the Recognition of
Contours and Line-Shaped Objects",
        JOURNAL = CVGIP,
        VOLUME = "25",
        YEAR = "1984",
        NUMBER = "2",
        MONTH = "February",
        PAGES = "184-204",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170095"}

@article{bb174747,
        AUTHOR = "Ellison, T.P. and Taylor, C.J.",
        TITLE = "Calculating the surface topography of integrated circuit wafers from
SEM images",
        JOURNAL = IVC,
        VOLUME = "9",
        YEAR = "1991",
        NUMBER = "1",
        MONTH = "February",
        PAGES = "3-9",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170096"}

@inproceedings{bb174748,
        AUTHOR = "Taylor, C.J. and Ellison, T.P.",
        TITLE = "Calculating the surface topography of integrated circuit wafers from
SEM images",
        BOOKTITLE = BMVC90,
        YEAR = "1990",
        PAGES = "xx-yy",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170096"}

@inproceedings{bb174749,
        AUTHOR = "Yu, K.K. and Berglund, C.N.",
        TITLE = "Automated system for extracting design and layout information
from an integrated circuit",
        BOOKTITLE = US_Patent,
        YEAR = "1992",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170097"}

@inproceedings{bb174750,
        AUTHOR = "Lebeau, C.J.",
        TITLE = "Method for automatic semiconductor wafer inspection",
        BOOKTITLE = US_Patent,
        YEAR = "1992",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170098"}

@inproceedings{bb174751,
        AUTHOR = "Bushroe, M.W.",
        TITLE = "Solder joint locator",
        BOOKTITLE = US_Patent,
        YEAR = "1992",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170099"}

@article{bb174752,
        AUTHOR = "Dom, B.E. and Brecher, V.",
        TITLE = "Recent Advances in the Automatic Inspection of
Integrated-Circuits for Pattern Defects",
        JOURNAL = MVA,
        VOLUME = "8",
        YEAR = "1995",
        NUMBER = "1",
        PAGES = "5-19",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170100"}

@article{bb174753,
        AUTHOR = "Khalaj, B.H. and Aghajan, H.K. and Kailath, T.",
        TITLE = "Patterned Wafer Inspection By High-Resolution Spectral Estimation
Techniques",
        JOURNAL = MVA,
        VOLUME = "7",
        YEAR = "1994",
        NUMBER = "3",
        PAGES = "178-185",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170101"}

@article{bb174754,
        AUTHOR = "Teoh, E.K. and Mital, D.P.",
        TITLE = "A Transputer-Based Automated Visual Inspection System for
Electronic Devices and PCBs",
        JOURNAL = OptLas,
        VOLUME = "22",
        YEAR = "1995",
        NUMBER = "3",
        PAGES = "161-180",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170102"}

@article{bb174755,
        AUTHOR = "Moganti, M. and Ercal, F. and Dagli, C.H. and Tsunekawa, S.",
        TITLE = "Automatic PCB Inspection Algorithms: A Survey",
        JOURNAL = CVIU,
        VOLUME = "63",
        YEAR = "1996",
        NUMBER = "2",
        MONTH = "March",
        PAGES = "287-313",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170103"}

@article{bb174756,
        AUTHOR = "Rao, A.R.",
        TITLE = "Future-Directions in Industrial Machine Vision:
A Case-Study of Semiconductor Manufacturing Applications",
        JOURNAL = IVC,
        VOLUME = "14",
        YEAR = "1996",
        NUMBER = "1",
        MONTH = "February",
        PAGES = "3-19",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170104"}

@article{bb174757,
        AUTHOR = "Yuan, M.C. and Li, J.G.",
        TITLE = "A Production System for LSI Chip Anatomizing",
        JOURNAL = PRL,
        VOLUME = "5",
        YEAR = "1987",
        PAGES = "227-232",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170105"}

@article{bb174758,
        AUTHOR = "Blanz, W.E. and Sanz, J.L.C. and Hinkle, E.B.",
        TITLE = "Image Analysis Methods for Solder-Ball Inspection in
Integrated Circuit Manufacturing",
        JOURNAL = RA,
        VOLUME = "4",
        YEAR = "1988",
        PAGES = "129-139",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170106"}

@article{bb174759,
        AUTHOR = "Chou, P.B. and Rao, A.R. and Sturzenbecker, M.C. and Wu, F.Y. and Brecher, V.H.",
        TITLE = "Automatic Defect Classification for Semiconductor Manufacturing",
        JOURNAL = MVA,
        VOLUME = "9",
        YEAR = "1997",
        NUMBER = "4",
        PAGES = "201-214",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170107"}

@article{bb174760,
        AUTHOR = "An, J.N. and Cho, Y.B. and Gweon, D.G.",
        TITLE = "A New Method for Image Separation of Overlapped Images from a Two-Layered
Printed Circuit Board (PCB)",
        JOURNAL = IVC,
        VOLUME = "15",
        YEAR = "1997",
        NUMBER = "11",
        MONTH = "November",
        PAGES = "861-866",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170108"}

@article{bb174761,
        AUTHOR = "Kim, S.W. and Lee, S.Y. and Yoon, D.S.",
        TITLE = "Rapid Pattern Inspection of Shadow Masks by
Machine Vision Integrated with Fourier Optics",
        JOURNAL = OptEng,
        VOLUME = "36",
        YEAR = "1997",
        NUMBER = "12",
        MONTH = "December",
        PAGES = "3309-3311",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170109"}

@article{bb174762,
        AUTHOR = "Zhou, H. and Kassim, A.A. and Ranganath, S.",
        TITLE = "A Fast Algorithm for Detecting Die Extrusion Defects in IC Packages",
        JOURNAL = MVA,
        VOLUME = "11",
        YEAR = "1998",
        NUMBER = "1",
        PAGES = "37-41",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170110"}

@article{bb174763,
        AUTHOR = "Kassim, A.A. and Zhou, H. and Ranganath, S.",
        TITLE = "Automatic IC orientation checks",
        JOURNAL = MVA,
        VOLUME = "12",
        YEAR = "2000",
        NUMBER = "3",
        PAGES = "107-112",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170111"}

@inproceedings{bb174764,
        AUTHOR = "Nichani, S. and Scola, J.",
        TITLE = "Semiconductor device image inspection utilizing image subtraction and
threshold imaging",
        BOOKTITLE = US_Patent,
        YEAR = "1999",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170112"}

@inproceedings{bb174765,
        AUTHOR = "Ichikawa, I.",
        TITLE = "Laser beam inspection apparatus",
        BOOKTITLE = US_Patent,
        YEAR = "2003",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170113"}

@article{bb174766,
        AUTHOR = "Chung, H.K. and Park, R.H.",
        TITLE = "2-Stage High-Precision Visual Inspection of Surface Mount Devices",
        JOURNAL = JEI,
        VOLUME = "6",
        YEAR = "1997",
        NUMBER = "4",
        MONTH = "October",
        PAGES = "517-524",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170114"}

@article{bb174767,
        AUTHOR = "Moganti, M. and Ercal, F.",
        TITLE = "A Subpattern Level Inspection System for Printed Circuit Boards",
        JOURNAL = CVIU,
        VOLUME = "70",
        YEAR = "1998",
        NUMBER = "1",
        MONTH = "April",
        PAGES = "51-62",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170115"}

@article{bb174768,
        AUTHOR = "Moganti, M. and Ercal, F.",
        TITLE = "Segmentation of Printed Circuit Board Images into Basic Patterns",
        JOURNAL = CVIU,
        VOLUME = "70",
        YEAR = "1998",
        NUMBER = "1",
        MONTH = "April",
        PAGES = "74-86",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170116"}

@article{bb174769,
        AUTHOR = "Fadzil, A. and Weng, C.J.",
        TITLE = "LED Cosmetic Flaw Inspection System",
        JOURNAL = PAA,
        VOLUME = "1",
        YEAR = "1998",
        NUMBER = "1",
        PAGES = "62-70",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170117"}

@article{bb174770,
        AUTHOR = "Rodriguez, A.A. and Mandeville, J.R.",
        TITLE = "Image registration for automated inspection of printed circuit patterns
using CAD reference data",
        JOURNAL = MVA,
        VOLUME = "6",
        YEAR = "1993",
        NUMBER = "4",
        PAGES = "233-242",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170118"}

@article{bb174771,
        AUTHOR = "Rajeswari, M. and Rodd, M.G.",
        TITLE = "Real-time Analysis of an IC Wire-bonding Inspection System",
        JOURNAL = RealTimeImg,
        VOLUME = "5",
        YEAR = "1999",
        NUMBER = "6",
        MONTH = "December",
        PAGES = "409-421",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170119"}

@inproceedings{bb174772,
        AUTHOR = "Beaty, E.M. and Mork, D.P.",
        TITLE = "Three dimensional inspection system",
        BOOKTITLE = US_Patent,
        YEAR = "2000",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170120"}

@article{bb174773,
        AUTHOR = "Xie, P. and Guan, S.U.",
        TITLE = "A golden-template self-generating method for patterned wafer inspection",
        JOURNAL = MVA,
        VOLUME = "12",
        YEAR = "2000",
        NUMBER = "3",
        PAGES = "149-156",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170121"}

@article{bb174774,
        AUTHOR = "Guan, S.U. and Xie, P. and Li, H.",
        TITLE = "A golden-block-based self-refining scheme for repetitive patterned
wafer inspections",
        JOURNAL = MVA,
        VOLUME = "13",
        YEAR = "2003",
        NUMBER = "5-6",
        PAGES = "314-321",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170122"}

@inproceedings{bb174775,
        AUTHOR = "Guan, S.U. and Xie, P.",
        TITLE = "A golden block self-generating scheme for continuous patterned wafer
inspections",
        BOOKTITLE = CIAP99,
        YEAR = "1999",
        PAGES = "436-441",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170123"}

@article{bb174776,
        AUTHOR = "Zoroofi, R.A. and Taketani, H. and Tamura, S. and Sato, Y. and Sekiya, K.",
        TITLE = "Automated inspection of IC wafer contamination",
        JOURNAL = PR,
        VOLUME = "34",
        YEAR = "2001",
        NUMBER = "6",
        MONTH = "June",
        PAGES = "1307-1317",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170124"}

@article{bb174777,
        AUTHOR = "van Dop, E.R. and Regtien, P.P.L.",
        TITLE = "Multi-sensor recognition of electronic components",
        JOURNAL = MVA,
        VOLUME = "12",
        YEAR = "2001",
        NUMBER = "5",
        PAGES = "213-222",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170125"}

@article{bb174778,
        AUTHOR = "Ye, Q.Z. and Ong, S.H. and Han, X.",
        TITLE = "A stereo vision system for the inspection of IC bonding wires",
        JOURNAL = IJIST,
        VOLUME = "11",
        YEAR = "2001",
        NUMBER = "4",
        PAGES = "254-262",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170126"}

@article{bb174779,
        AUTHOR = "Brehelin, L. and Gascuel, O. and Caraux, G.",
        TITLE = "Hidden Markov Models with Patterns to Learn Boolean Vector Sequences
and Application to the Built-In Self-Test for Integrated Circuits",
        JOURNAL = PAMI,
        VOLUME = "23",
        YEAR = "2001",
        NUMBER = "9",
        MONTH = "September",
        PAGES = "997-1008",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170127"}

@article{bb174780,
        AUTHOR = "Qu, G.Y. and Wood, S.L. and Teh, C.",
        TITLE = "Wafer Defect Detection Using Directional Morphological Gradient
Techniques",
        JOURNAL = JASP,
        VOLUME = "2002",
        YEAR = "2002",
        NUMBER = "7",
        MONTH = "July",
        PAGES = "686-703",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170128"}

@article{bb174781,
        AUTHOR = "Tobin, K.W. and Karnowski, T.P. and Arrowood, L.F. and Ferrell, R.K. and Goddard, J.S. and Lakhani, F.",
        TITLE = "Content-Based Image Retrieval for Semiconductor Process
Characterization",
        JOURNAL = JASP,
        VOLUME = "2002",
        YEAR = "2002",
        NUMBER = "7",
        MONTH = "July",
        PAGES = "704-713",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170129"}

@article{bb174782,
        AUTHOR = "Tsai, D.M. and Chou, C.C.",
        TITLE = "A fast focus measure for video display inspection",
        JOURNAL = MVA,
        VOLUME = "14",
        YEAR = "2003",
        NUMBER = "3",
        MONTH = "July",
        PAGES = "192-196",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170130"}

@article{bb174783,
        AUTHOR = "Roh, Y.J. and Park, W.S. and Cho, H.S.",
        TITLE = "Correcting image distortion in the X-ray digital tomosynthesis system
for PCB solder joint inspection",
        JOURNAL = IVC,
        VOLUME = "21",
        YEAR = "2003",
        NUMBER = "12",
        MONTH = "November",
        PAGES = "1063-1075",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170131"}

@article{bb174784,
        AUTHOR = "Baidyk, T. and Kussul, E. and Makeyev, O. and Caballero, A. and Ruiz, L. and Carrera, G. and Velasco, G.",
        TITLE = "Flat image recognition in the process of microdevice assembly",
        JOURNAL = PRL,
        VOLUME = "25",
        YEAR = "2004",
        NUMBER = "1",
        MONTH = "January",
        PAGES = "107-118",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170132"}

@article{bb174785,
        AUTHOR = "Toledo, G.K. and Kussul, E. and Baidyk, T.",
        TITLE = "Neural classifier for micro work piece recognition",
        JOURNAL = IVC,
        VOLUME = "24",
        YEAR = "2006",
        NUMBER = "8",
        MONTH = "August",
        PAGES = "827-836",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170133"}

@article{bb174786,
        AUTHOR = "Toledo, G.K. and Kussul, E. and Baidyk, T.",
        TITLE = "Work piece recognition based on the permutation neural classifier
technique",
        JOURNAL = MVA,
        VOLUME = "22",
        YEAR = "2011",
        NUMBER = "3",
        MONTH = "May",
        PAGES = "495-504",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170134"}

@article{bb174787,
        AUTHOR = "Fang, T. and Jafari, M.A. and Danforth, S.C. and Safari, A.",
        TITLE = "Signature analysis and defect detection in layered manufacturing of
ceramic sensors and actuators",
        JOURNAL = MVA,
        VOLUME = "15",
        YEAR = "2003",
        NUMBER = "2",
        MONTH = "December",
        PAGES = "63-75",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170135"}

@article{bb174788,
        AUTHOR = "Zervakis, M.E. and Goumas, S.K. and Rovithakis, G.A.",
        TITLE = "A Bayesian Framework for Multilead SMD Post-Placement Quality
Inspection",
        JOURNAL = SMC-B,
        VOLUME = "34",
        YEAR = "2004",
        NUMBER = "1",
        MONTH = "February",
        PAGES = "440-453",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170136"}

@inproceedings{bb174789,
        AUTHOR = "Goumas, S.K. and Rovithakis, G.A. and Zervakis, M.E.",
        TITLE = "A Bayesian image analysis framework for post-placement quality
inspection of components",
        BOOKTITLE = ICIP02,
        YEAR = "2002",
        PAGES = "II: 549-552",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170137"}

@article{bb174790,
        AUTHOR = "Kubota, T. and Talekar, P. and Ma, X.Y. and Sudarshan, T.S.",
        TITLE = "A nondestructive automated defect detection system for silicon carbide
wafers",
        JOURNAL = MVA,
        VOLUME = "16",
        YEAR = "2005",
        NUMBER = "3",
        MONTH = "May",
        PAGES = "170-176",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170138"}

@article{bb174791,
        AUTHOR = "di Palma, F. and de Nicolao, G. and Miraglia, G. and Pasquinetti, E. and Piccinini, F.",
        TITLE = "Unsupervised spatial pattern classification of electrical-wafer-sorting
maps in semiconductor manufacturing",
        JOURNAL = PRL,
        VOLUME = "26",
        YEAR = "2005",
        NUMBER = "12",
        MONTH = "September",
        PAGES = "1857-1865",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170139"}

@article{bb174792,
        AUTHOR = "Shankar, N.G. and Zhong, Z.W.",
        TITLE = "Improved segmentation of semiconductor defects using area sieves",
        JOURNAL = MVA,
        VOLUME = "17",
        YEAR = "2006",
        NUMBER = "1",
        MONTH = "April",
        PAGES = "1-7",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170140"}

@article{bb174793,
        AUTHOR = "Lin, H.D.",
        TITLE = "Tiny surface defect inspection of electronic passive components using
discrete cosine transform decomposition and cumulative sum techniques",
        JOURNAL = IVC,
        VOLUME = "26",
        YEAR = "2008",
        NUMBER = "5",
        MONTH = "May",
        PAGES = "603-621",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170141"}

@article{bb174794,
        AUTHOR = "Watanabe, T. and Kusano, A. and Fujiwara, T. and Koshimizu, H.",
        TITLE = "3D Precise Inspection of Terminal Lead for Electronic Devices by Single
Camera Stereo Vision",
        JOURNAL = IEICE,
        VOLUME = "E91-D",
        YEAR = "2008",
        NUMBER = "7",
        MONTH = "July",
        PAGES = "1885-1892",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170142"}

@inproceedings{bb174795,
        AUTHOR = "Kusano, A. and Watanabe, T. and Funahashi, T. and Koshimizu, H.",
        TITLE = "Defect detection of terminal lead by single stereo vision",
        BOOKTITLE = FCV13,
        YEAR = "2013",
        PAGES = "237-241",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170143"}

@article{bb174796,
        AUTHOR = "Last, M. and Kandel, A.",
        TITLE = "Perception-based Analysis Of Engineering Experiments In The
Semiconductor Industry",
        JOURNAL = IJIG,
        VOLUME = "2",
        YEAR = "2002",
        NUMBER = "1",
        MONTH = "January",
        PAGES = "107-126",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170144"}

@article{bb174797,
        AUTHOR = "Ng, A.N.Y. and Lam, E.Y. and Chung, R. and Fung, K.S.M. and Leung, W.H.",
        TITLE = "Reference-free Machine Vision Inspection Of Semiconductor Die Images",
        JOURNAL = IJIG,
        VOLUME = "9",
        YEAR = "2009",
        NUMBER = "1",
        MONTH = "January",
        PAGES = "133-152",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170145"}

@article{bb174798,
        AUTHOR = "Chen, C.S. and Yeh, C.W. and Yin, P.Y.",
        TITLE = "A novel Fourier descriptor based image alignment algorithm for
automatic optical inspection",
        JOURNAL = JVCIR,
        VOLUME = "20",
        YEAR = "2009",
        NUMBER = "3",
        MONTH = "April",
        PAGES = "178-189",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170146"}

@article{bb174799,
        AUTHOR = "Chang, C.Y. and Li, C.H. and Lin, S.Y. and Jeng, M.",
        TITLE = "Application of Two Hopfield Neural Networks for Automatic Four-Element
LED Inspection",
        JOURNAL = SMC-C,
        VOLUME = "39",
        YEAR = "2009",
        NUMBER = "3",
        MONTH = "May",
        PAGES = "352-365",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT170147"}

Last update:Oct 19, 2020 at 15:02:28