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@article{bb175465,
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        TITLE = "Estimation and monitoring of product aesthetics:
Application to manufacturing of 'engineered stone' countertops",
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@article{bb175466,
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        TITLE = "A mura detection method",
        JOURNAL = PR,
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        YEAR = "2006",
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@article{bb175467,
        AUTHOR = "Tsai, D.M. and Lin, P.C. and Lu, C.J.",
        TITLE = "An independent component analysis-based filter design for defect
detection in low-contrast surface images",
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        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT170823"}

@article{bb175468,
        AUTHOR = "Lu, C.J. and Tsai, D.M.",
        TITLE = "Independent component analysis-based defect detection in patterned
liquid crystal display surfaces",
        JOURNAL = IVC,
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        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT170824"}

@article{bb175469,
        AUTHOR = "Tsai, D.M. and Lai, S.C.",
        TITLE = "Defect detection in periodically patterned surfaces using independent
component analysis",
        JOURNAL = PR,
        VOLUME = "41",
        YEAR = "2008",
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        PAGES = "2812-2832",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT170825"}

@article{bb175470,
        AUTHOR = "Tsai, D.M. and Chuang, S.T.",
        TITLE = "1D-based defect detection in patterned TFT-LCD panels using
characteristic fractal dimension and correlations",
        JOURNAL = MVA,
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        MONTH = "October",
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        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT170826"}

@article{bb175471,
        AUTHOR = "Ng, H.F.",
        TITLE = "Automatic thresholding for defect detection",
        JOURNAL = PRL,
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        YEAR = "2006",
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        PAGES = "1644-1649",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT170827"}

@article{bb175472,
        AUTHOR = "Tsap, L.V. and Duchaineau, M. and Goldgof, D.B. and Shin, M.C.",
        TITLE = "Data-driven feature modeling, recognition and analysis in a discovery
of supersonic cracks in multimillion-atom simulations",
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        PAGES = "2400-2407",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT170828"}

@article{bb175473,
        AUTHOR = "Caleb Solly, P. and Smith, J.E.",
        TITLE = "Adaptive surface inspection via interactive evolution",
        JOURNAL = IVC,
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        YEAR = "2007",
        NUMBER = "7",
        MONTH = "July",
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        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT170829"}

@article{bb175474,
        AUTHOR = "Groby, J.P. and Lesselier, D.",
        TITLE = "Localization and characterization of simple defects in finite-sized
photonic crystals",
        JOURNAL = JOSA-A,
        VOLUME = "25",
        YEAR = "2008",
        NUMBER = "1",
        MONTH = "January",
        PAGES = "146-152",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT170830"}

@article{bb175475,
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        TITLE = "Visual measurement of pile movements for the foundation work using a
high-speed line-scan camera",
        JOURNAL = PR,
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        YEAR = "2008",
        NUMBER = "6",
        MONTH = "June",
        PAGES = "2025-2033",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT170831"}

@article{bb175476,
        AUTHOR = "Choi, K.N. and Park, N.K. and Yoo, S.I.",
        TITLE = "Image Restoration for Quantifying TFT-LCD Defect Levels",
        JOURNAL = IEICE,
        VOLUME = "E91-D",
        YEAR = "2008",
        NUMBER = "2",
        MONTH = "February",
        PAGES = "322-329",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT170832"}

@article{bb175477,
        AUTHOR = "Liew, C.K. and Veidt, M.",
        TITLE = "Pattern recognition of guided waves for damage evaluation in bars",
        JOURNAL = PRL,
        VOLUME = "30",
        YEAR = "2009",
        NUMBER = "3",
        MONTH = "February",
        PAGES = "321-330",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT170833"}

@article{bb175478,
        AUTHOR = "Gnanaprakasam, P. and Parker, J.M. and Ganapathiraman, S. and Hou, Z.",
        TITLE = "Efficient 3D characterization of raised topological defects in smooth
specular coatings",
        JOURNAL = IVC,
        VOLUME = "27",
        YEAR = "2009",
        NUMBER = "4",
        MONTH = "March",
        PAGES = "319-330",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT170834"}

@article{bb175479,
        AUTHOR = "Kim, H.I. and Lee, S.H. and Cho, N.I.",
        TITLE = "Automatic Defect Classification Using Frequency and Spatial Features in
a Boosting Scheme",
        JOURNAL = SPLetters,
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        YEAR = "2009",
        NUMBER = "5",
        MONTH = "May",
        PAGES = "374-377",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT170835"}

@article{bb175480,
        AUTHOR = "Hampel, U. and Maas, H.G.",
        TITLE = "Cascaded image analysis for dynamic crack detection in material testing",
        JOURNAL = PandRS,
        VOLUME = "64",
        YEAR = "2009",
        NUMBER = "4",
        MONTH = "July",
        PAGES = "345-350",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT170836"}

@article{bb175481,
        AUTHOR = "Tsneg, Y.H. and Tsai, D.M.",
        TITLE = "Defect detection of uneven brightness in low-contrast images using
basis image representation",
        JOURNAL = PR,
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        NUMBER = "3",
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        PAGES = "1129-1141",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT170837"}

@article{bb175482,
        AUTHOR = "Tsai, D.M. and Tsai, H.Y.",
        TITLE = "Low-contrast surface inspection of mura defects in liquid crystal
displays using optical flow-based motion analysis",
        JOURNAL = MVA,
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        MONTH = "July",
        PAGES = "629-649",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT170838"}

@article{bb175483,
        AUTHOR = "Burgess, G. and Shortis, M.R. and Scott, P.",
        TITLE = "Photographic assessment of retroreflective film properties",
        JOURNAL = PandRS,
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        PAGES = "743-750",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT170839"}

@article{bb175484,
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        JOURNAL = MVA,
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        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT170840"}

@article{bb175485,
        AUTHOR = "Satorres Martinez, S. and Gomez Ortega, J. and Gamez Garcia, J. and Sanchez Garcia, A.",
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parts with non-plane surfaces",
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        MONTH = "January",
        PAGES = "1-13",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT170841"}

@article{bb175486,
        AUTHOR = "Gunkel, C. and Stepper, A. and Muller, A.C. and Muller, C.H.",
        TITLE = "Micro crack detection with Dijkstra's shortest path algorithm",
        JOURNAL = MVA,
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        NUMBER = "3",
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        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT170842"}

@article{bb175487,
        AUTHOR = "Tolba, A.S.",
        TITLE = "A novel multiscale-multidirectional autocorrelation approach for defect
detection in homogeneous flat surfaces",
        JOURNAL = MVA,
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@article{bb175488,
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Framework",
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        PAGES = "3757-3769",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT170844"}

@inproceedings{bb175489,
        AUTHOR = "Wang, X.S. and Mirmehdi, M.",
        TITLE = "Archive Film Restoration Based on Spatiotemporal Random Walks",
        BOOKTITLE = ECCV10,
        YEAR = "2010",
        PAGES = "V: 478-491",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT170845"}

@inproceedings{bb175490,
        AUTHOR = "Wang, X.S. and Mirmehdi, M.",
        TITLE = "HMM based Archive Film Defect Detection with Spatial and Temporal
Constraints",
        BOOKTITLE = BMVC09,
        YEAR = "2009",
        PAGES = "xx-yy",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT170846"}

@article{bb175491,
        AUTHOR = "Tsai, D.M. and Chen, M.C. and Li, W.C. and Chiu, W.Y.",
        TITLE = "A fast regularity measure for surface defect detection",
        JOURNAL = MVA,
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        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT170847"}

@article{bb175492,
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        TITLE = "An innovative methodology for detection and quantification of cracks
through incorporation of depth perception",
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        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT170848"}

@article{bb175493,
        AUTHOR = "Tsai, Z.D. and Perng, M.H.",
        TITLE = "Defect detection in periodic patterns using a multi-band-pass filter",
        JOURNAL = MVA,
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        NUMBER = "3",
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@article{bb175494,
        AUTHOR = "Li, G.H. and Shi, J.F. and Luo, H.S. and Tang, M.G.",
        TITLE = "A computational model of vision attention for inspection of surface
quality in production line",
        JOURNAL = MVA,
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        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT170850"}

@article{bb175495,
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        TITLE = "Automatic Defect Classification of TFT-LCD Panels with Shape,
Histogram and Color Features",
        JOURNAL = IJIG,
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        NUMBER = "03",
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        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT170851"}

@article{bb175496,
        AUTHOR = "Anwar, S. and Abdullah, M.",
        TITLE = "Micro-crack detection of multicrystalline solar cells featuring an
improved anisotropic diffusion filter and image segmentation
technique",
        JOURNAL = JIVP,
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        YEAR = "2014",
        NUMBER = "1",
        PAGES = "15",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT170852"}

@article{bb175497,
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        TITLE = "Semi-Automatic Cracks Correction Based on Seam Processing, Stochastic
Analysis and Learning Process",
        JOURNAL = IJIG,
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        YEAR = "2013",
        NUMBER = "04",
        PAGES = "1350020",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT170853"}

@article{bb175498,
        AUTHOR = "Zhao, G.T. and Wang, T.Q. and Ye, J.Y.",
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        VOLUME = "26",
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        NUMBER = "5",
        MONTH = "July",
        PAGES = "675-688",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT170854"}

@article{bb175499,
        AUTHOR = "Hung, M.H. and Hsieh, C.H.",
        TITLE = "A novel algorithm for defect inspection of touch panels",
        JOURNAL = IVC,
        VOLUME = "41",
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        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT170855"}

Last update:Aug 12, 2020 at 16:22:40