@inproceedings{bb222300, AUTHOR = "Taylor, C.J. and Ellison, T.P.", TITLE = "Calculating the surface topography of integrated circuit wafers from SEM images", BOOKTITLE = BMVC90, YEAR = "1990", PAGES = "xx-yy", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217304"} @inproceedings{bb222301, AUTHOR = "Yu, K.K. and Berglund, C.N.", TITLE = "Automated system for extracting design and layout information from an integrated circuit", BOOKTITLE = US_Patent, YEAR = "1992", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217305"} @inproceedings{bb222302, AUTHOR = "Lebeau, C.J.", TITLE = "Method for automatic semiconductor wafer inspection", BOOKTITLE = US_Patent, YEAR = "1992", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217306"} @inproceedings{bb222303, AUTHOR = "Bushroe, M.W.", TITLE = "Solder joint locator", BOOKTITLE = US_Patent, YEAR = "1992", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217307"} @article{bb222304, AUTHOR = "Dom, B.E. and Brecher, V.", TITLE = "Recent Advances in the Automatic Inspection of Integrated-Circuits for Pattern Defects", JOURNAL = MVA, VOLUME = "8", YEAR = "1995", NUMBER = "1", PAGES = "5-19", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217308"} @article{bb222305, AUTHOR = "Khalaj, B.H. and Aghajan, H.K. and Kailath, T.", TITLE = "Patterned Wafer Inspection By High-Resolution Spectral Estimation Techniques", JOURNAL = MVA, VOLUME = "7", YEAR = "1994", NUMBER = "3", PAGES = "178-185", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217309"} @article{bb222306, AUTHOR = "Teoh, E.K. and Mital, D.P.", TITLE = "A Transputer-Based Automated Visual Inspection System for Electronic Devices and PCBs", JOURNAL = OptLas, VOLUME = "22", YEAR = "1995", NUMBER = "3", PAGES = "161-180", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217310"} @article{bb222307, AUTHOR = "Moganti, M. and Ercal, F. and Dagli, C.H. and Tsunekawa, S.", TITLE = "Automatic PCB Inspection Algorithms: A Survey", JOURNAL = CVIU, VOLUME = "63", YEAR = "1996", NUMBER = "2", MONTH = "March", PAGES = "287-313", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217311"} @article{bb222308, AUTHOR = "Rao, A.R.", TITLE = "Future-Directions in Industrial Machine Vision: A Case-Study of Semiconductor Manufacturing Applications", JOURNAL = IVC, VOLUME = "14", YEAR = "1996", NUMBER = "1", MONTH = "February", PAGES = "3-19", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217312"} @article{bb222309, AUTHOR = "Yuan, M.C. and Li, J.G.", TITLE = "A Production System for LSI Chip Anatomizing", JOURNAL = PRL, VOLUME = "5", YEAR = "1987", PAGES = "227-232", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217313"} @article{bb222310, AUTHOR = "Blanz, W.E. and Sanz, J.L.C. and Hinkle, E.B.", TITLE = "Image Analysis Methods for Solder-Ball Inspection in Integrated Circuit Manufacturing", JOURNAL = RA, VOLUME = "4", YEAR = "1988", PAGES = "129-139", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217314"} @article{bb222311, AUTHOR = "Chou, P.B. and Rao, A.R. and Sturzenbecker, M.C. and Wu, F.Y. and Brecher, V.H.", TITLE = "Automatic Defect Classification for Semiconductor Manufacturing", JOURNAL = MVA, VOLUME = "9", YEAR = "1997", NUMBER = "4", PAGES = "201-214", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217315"} @article{bb222312, AUTHOR = "An, J.N. and Cho, Y.B. and Gweon, D.G.", TITLE = "A New Method for Image Separation of Overlapped Images from a Two-Layered Printed Circuit Board (PCB)", JOURNAL = IVC, VOLUME = "15", YEAR = "1997", NUMBER = "11", MONTH = "November", PAGES = "861-866", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217316"} @article{bb222313, AUTHOR = "Kim, S.W. and Lee, S.Y. and Yoon, D.S.", TITLE = "Rapid Pattern Inspection of Shadow Masks by Machine Vision Integrated with Fourier Optics", JOURNAL = OptEng, VOLUME = "36", YEAR = "1997", NUMBER = "12", MONTH = "December", PAGES = "3309-3311", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217317"} @article{bb222314, AUTHOR = "Zhou, H. and Kassim, A.A. and Ranganath, S.", TITLE = "A Fast Algorithm for Detecting Die Extrusion Defects in IC Packages", JOURNAL = MVA, VOLUME = "11", YEAR = "1998", NUMBER = "1", PAGES = "37-41", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217318"} @article{bb222315, AUTHOR = "Kassim, A.A. and Zhou, H. and Ranganath, S.", TITLE = "Automatic IC orientation checks", JOURNAL = MVA, VOLUME = "12", YEAR = "2000", NUMBER = "3", PAGES = "107-112", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217319"} @inproceedings{bb222316, AUTHOR = "Nichani, S. and Scola, J.", TITLE = "Semiconductor device image inspection utilizing image subtraction and threshold imaging", BOOKTITLE = US_Patent, YEAR = "1999", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217320"} @inproceedings{bb222317, AUTHOR = "Ichikawa, I.", TITLE = "Laser beam inspection apparatus", BOOKTITLE = US_Patent, YEAR = "2003", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217321"} @article{bb222318, AUTHOR = "Chung, H.K. and Park, R.H.", TITLE = "2-Stage High-Precision Visual Inspection of Surface Mount Devices", JOURNAL = JEI, VOLUME = "6", YEAR = "1997", NUMBER = "4", MONTH = "October", PAGES = "517-524", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217322"} @article{bb222319, AUTHOR = "Moganti, M. and Ercal, F.", TITLE = "A Subpattern Level Inspection System for Printed Circuit Boards", JOURNAL = CVIU, VOLUME = "70", YEAR = "1998", NUMBER = "1", MONTH = "April", PAGES = "51-62", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217323"} @article{bb222320, AUTHOR = "Moganti, M. and Ercal, F.", TITLE = "Segmentation of Printed Circuit Board Images into Basic Patterns", JOURNAL = CVIU, VOLUME = "70", YEAR = "1998", NUMBER = "1", MONTH = "April", PAGES = "74-86", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217324"} @article{bb222321, AUTHOR = "Fadzil, A. and Weng, C.J.", TITLE = "LED Cosmetic Flaw Inspection System", JOURNAL = PAA, VOLUME = "1", YEAR = "1998", NUMBER = "1", PAGES = "62-70", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217325"} @article{bb222322, AUTHOR = "Rodriguez, A.A. and Mandeville, J.R.", TITLE = "Image registration for automated inspection of printed circuit patterns using CAD reference data", JOURNAL = MVA, VOLUME = "6", YEAR = "1993", NUMBER = "4", PAGES = "233-242", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217326"} @article{bb222323, AUTHOR = "Rajeswari, M. and Rodd, M.G.", TITLE = "Real-time Analysis of an IC Wire-bonding Inspection System", JOURNAL = RealTimeImg, VOLUME = "5", YEAR = "1999", NUMBER = "6", MONTH = "December", PAGES = "409-421", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217327"} @inproceedings{bb222324, AUTHOR = "Beaty, E.M. and Mork, D.P.", TITLE = "Three dimensional inspection system", BOOKTITLE = US_Patent, YEAR = "2000", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217328"} @article{bb222325, AUTHOR = "Xie, P. and Guan, S.U.", TITLE = "A golden-template self-generating method for patterned wafer inspection", JOURNAL = MVA, VOLUME = "12", YEAR = "2000", NUMBER = "3", PAGES = "149-156", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217329"} @article{bb222326, AUTHOR = "Guan, S.U. and Xie, P. and Li, H.", TITLE = "A golden-block-based self-refining scheme for repetitive patterned wafer inspections", JOURNAL = MVA, VOLUME = "13", YEAR = "2003", NUMBER = "5-6", PAGES = "314-321", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217330"} @inproceedings{bb222327, AUTHOR = "Guan, S.U. and Xie, P.", TITLE = "A golden block self-generating scheme for continuous patterned wafer inspections", BOOKTITLE = CIAP99, YEAR = "1999", PAGES = "436-441", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217331"} @article{bb222328, AUTHOR = "Zoroofi, R.A. and Taketani, H. and Tamura, S. and Sato, Y. and Sekiya, K.", TITLE = "Automated inspection of IC wafer contamination", JOURNAL = PR, VOLUME = "34", YEAR = "2001", NUMBER = "6", MONTH = "June", PAGES = "1307-1317", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217332"} @article{bb222329, AUTHOR = "van Dop, E.R. and Regtien, P.P.L.", TITLE = "Multi-sensor recognition of electronic components", JOURNAL = MVA, VOLUME = "12", YEAR = "2001", NUMBER = "5", PAGES = "213-222", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217333"} @article{bb222330, AUTHOR = "Ye, Q.Z. and Ong, S.H. and Han, X.", TITLE = "A stereo vision system for the inspection of IC bonding wires", JOURNAL = IJIST, VOLUME = "11", YEAR = "2001", NUMBER = "4", PAGES = "254-262", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217334"} @article{bb222331, AUTHOR = "Brehelin, L. and Gascuel, O. and Caraux, G.", TITLE = "Hidden Markov Models with Patterns to Learn Boolean Vector Sequences and Application to the Built-In Self-Test for Integrated Circuits", JOURNAL = PAMI, VOLUME = "23", YEAR = "2001", NUMBER = "9", MONTH = "September", PAGES = "997-1008", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217335"} @article{bb222332, AUTHOR = "Qu, G.Y. and Wood, S.L. and Teh, C.", TITLE = "Wafer Defect Detection Using Directional Morphological Gradient Techniques", JOURNAL = JASP, VOLUME = "2002", YEAR = "2002", NUMBER = "7", MONTH = "July", PAGES = "686-703", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217336"} @article{bb222333, AUTHOR = "Tobin, K.W. and Karnowski, T.P. and Arrowood, L.F. and Ferrell, R.K. and Goddard, J.S. and Lakhani, F.", TITLE = "Content-Based Image Retrieval for Semiconductor Process Characterization", JOURNAL = JASP, VOLUME = "2002", YEAR = "2002", NUMBER = "7", MONTH = "July", PAGES = "704-713", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217337"} @article{bb222334, AUTHOR = "Tsai, D.M. and Chou, C.C.", TITLE = "A fast focus measure for video display inspection", JOURNAL = MVA, VOLUME = "14", YEAR = "2003", NUMBER = "3", MONTH = "July", PAGES = "192-196", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217338"} @article{bb222335, AUTHOR = "Roh, Y.J. and Park, W.S. and Cho, H.S.", TITLE = "Correcting image distortion in the X-ray digital tomosynthesis system for PCB solder joint inspection", JOURNAL = IVC, VOLUME = "21", YEAR = "2003", NUMBER = "12", MONTH = "November", PAGES = "1063-1075", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217339"} @article{bb222336, AUTHOR = "Baidyk, T. and Kussul, E. and Makeyev, O. and Caballero, A. and Ruiz, L. and Carrera, G. and Velasco, G.", TITLE = "Flat image recognition in the process of microdevice assembly", JOURNAL = PRL, VOLUME = "25", YEAR = "2004", NUMBER = "1", MONTH = "January", PAGES = "107-118", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217340"} @article{bb222337, AUTHOR = "Toledo, G.K. and Kussul, E. and Baidyk, T.", TITLE = "Neural classifier for micro work piece recognition", JOURNAL = IVC, VOLUME = "24", YEAR = "2006", NUMBER = "8", MONTH = "August", PAGES = "827-836", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217341"} @article{bb222338, AUTHOR = "Toledo, G.K. and Kussul, E. and Baidyk, T.", TITLE = "Work piece recognition based on the permutation neural classifier technique", JOURNAL = MVA, VOLUME = "22", YEAR = "2011", NUMBER = "3", MONTH = "May", PAGES = "495-504", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217342"} @article{bb222339, AUTHOR = "Fang, T. and Jafari, M.A. and Danforth, S.C. and Safari, A.", TITLE = "Signature analysis and defect detection in layered manufacturing of ceramic sensors and actuators", JOURNAL = MVA, VOLUME = "15", YEAR = "2003", NUMBER = "2", MONTH = "December", PAGES = "63-75", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217343"} @article{bb222340, AUTHOR = "Zervakis, M.E. and Goumas, S.K. and Rovithakis, G.A.", TITLE = "A Bayesian Framework for Multilead SMD Post-Placement Quality Inspection", JOURNAL = SMC-B, VOLUME = "34", YEAR = "2004", NUMBER = "1", MONTH = "February", PAGES = "440-453", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217344"} @inproceedings{bb222341, AUTHOR = "Goumas, S.K. and Rovithakis, G.A. and Zervakis, M.E.", TITLE = "A Bayesian image analysis framework for post-placement quality inspection of components", BOOKTITLE = ICIP02, YEAR = "2002", PAGES = "II: 549-552", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217345"} @article{bb222342, AUTHOR = "Kubota, T. and Talekar, P. and Ma, X.Y. and Sudarshan, T.S.", TITLE = "A nondestructive automated defect detection system for silicon carbide wafers", JOURNAL = MVA, VOLUME = "16", YEAR = "2005", NUMBER = "3", MONTH = "May", PAGES = "170-176", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217346"} @article{bb222343, AUTHOR = "di Palma, F. and de Nicolao, G. and Miraglia, G. and Pasquinetti, E. and Piccinini, F.", TITLE = "Unsupervised spatial pattern classification of electrical-wafer-sorting maps in semiconductor manufacturing", JOURNAL = PRL, VOLUME = "26", YEAR = "2005", NUMBER = "12", MONTH = "September", PAGES = "1857-1865", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217347"} @article{bb222344, AUTHOR = "Shankar, N.G. and Zhong, Z.W.", TITLE = "Improved segmentation of semiconductor defects using area sieves", JOURNAL = MVA, VOLUME = "17", YEAR = "2006", NUMBER = "1", MONTH = "April", PAGES = "1-7", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217348"} @article{bb222345, AUTHOR = "Lin, H.D.", TITLE = "Tiny surface defect inspection of electronic passive components using discrete cosine transform decomposition and cumulative sum techniques", JOURNAL = IVC, VOLUME = "26", YEAR = "2008", NUMBER = "5", MONTH = "May", PAGES = "603-621", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217349"} @article{bb222346, AUTHOR = "Watanabe, T. and Kusano, A. and Fujiwara, T. and Koshimizu, H.", TITLE = "3D Precise Inspection of Terminal Lead for Electronic Devices by Single Camera Stereo Vision", JOURNAL = IEICE, VOLUME = "E91-D", YEAR = "2008", NUMBER = "7", MONTH = "July", PAGES = "1885-1892", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217350"} @inproceedings{bb222347, AUTHOR = "Kusano, A. and Watanabe, T. and Funahashi, T. and Koshimizu, H.", TITLE = "Defect detection of terminal lead by single stereo vision", BOOKTITLE = FCV13, YEAR = "2013", PAGES = "237-241", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217351"} @article{bb222348, AUTHOR = "Last, M. and Kandel, A.", TITLE = "Perception-based Analysis Of Engineering Experiments In The Semiconductor Industry", JOURNAL = IJIG, VOLUME = "2", YEAR = "2002", NUMBER = "1", MONTH = "January", PAGES = "107-126", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217352"} @article{bb222349, AUTHOR = "Ng, A.N.Y. and Lam, E.Y. and Chung, R. and Fung, K.S.M. and Leung, W.H.", TITLE = "Reference-free Machine Vision Inspection Of Semiconductor Die Images", JOURNAL = IJIG, VOLUME = "9", YEAR = "2009", NUMBER = "1", MONTH = "January", PAGES = "133-152", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217353"} @article{bb222350, AUTHOR = "Chen, C.S. and Yeh, C.W. and Yin, P.Y.", TITLE = "A novel Fourier descriptor based image alignment algorithm for automatic optical inspection", JOURNAL = JVCIR, VOLUME = "20", YEAR = "2009", NUMBER = "3", MONTH = "April", PAGES = "178-189", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217354"} @article{bb222351, AUTHOR = "Chang, C.Y. and Li, C.H. and Lin, S.Y. and Jeng, M.", TITLE = "Application of Two Hopfield Neural Networks for Automatic Four-Element LED Inspection", JOURNAL = SMC-C, VOLUME = "39", YEAR = "2009", NUMBER = "3", MONTH = "May", PAGES = "352-365", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217355"} @article{bb222352, AUTHOR = "Tsai, D.M. and Chang, C.C. and Chao, S.M.", TITLE = "Micro-crack inspection in heterogeneously textured solar wafers using anisotropic diffusion", JOURNAL = IVC, VOLUME = "28", YEAR = "2010", NUMBER = "3", MONTH = "March", PAGES = "491-501", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217356"} @article{bb222353, AUTHOR = "Zontak, M. and Cohen, I.", TITLE = "Defect detection in patterned wafers using anisotropic kernels", JOURNAL = MVA, VOLUME = "21", YEAR = "2010", NUMBER = "2", MONTH = "February", PAGES = "xx-yy", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217357"} @article{bb222354, AUTHOR = "Sun, T.H. and Tseng, C.C. and Chen, M.S.", TITLE = "Electric contacts inspection using machine vision", JOURNAL = IVC, VOLUME = "28", YEAR = "2010", NUMBER = "6", MONTH = "June", PAGES = "890-901", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217358"} @article{bb222355, AUTHOR = "Fan, S.K.S. and Chuang, Y.C.A.", TITLE = "Automatic detection of Mura defect in TFT-LCD based on regression diagnostics", JOURNAL = PRL, VOLUME = "31", YEAR = "2010", NUMBER = "15", MONTH = "November", PAGES = "2397-2404", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217359"} @article{bb222356, AUTHOR = "Zhang, J. and Kim, Y. and Yang, S.H. and Milster, T.D.", TITLE = "Illumination artifacts in hyper-NA vector imaging", JOURNAL = JOSA-A, VOLUME = "27", YEAR = "2010", NUMBER = "10", MONTH = "October", PAGES = "2272-2284", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217360"} @article{bb222357, AUTHOR = "He, X.F. and Fang, F.", TITLE = "Flat-Panel Color Filter Inspection", JOURNAL = VisSys, VOLUME = "16", YEAR = "2011", NUMBER = "5", MONTH = "May", PAGES = "xx-yy", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217361"} @article{bb222358, AUTHOR = "Benedek, C.", TITLE = "Detection of soldering defects in Printed Circuit Boards with Hierarchical Marked Point Processes", JOURNAL = PRL, VOLUME = "32", YEAR = "2011", NUMBER = "13", MONTH = "October", PAGES = "1535-1543", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217362"} @article{bb222359, AUTHOR = "Peng, Y. and Zhang, J.Y. and Wang, Y. and Yu, Z.P.", TITLE = "Gradient-Based Source and Mask Optimization in Optical Lithography", JOURNAL = IP, VOLUME = "20", YEAR = "2011", NUMBER = "10", MONTH = "October", PAGES = "2856-2864", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217363"} @article{bb222360, AUTHOR = "Long, T. and Wang, H. and Long, B.", TITLE = "Test generation algorithm for analog systems based on support vector machine", JOURNAL = SIViP, VOLUME = "5", YEAR = "2011", NUMBER = "4", MONTH = "November", PAGES = "527-533", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217364"} @article{bb222361, AUTHOR = "Ibrahim, A. and Tominaga, S. and Horiuchi, T.", TITLE = "Invariant representation for spectral reflectance images and its application", JOURNAL = JIVP, VOLUME = "2011", YEAR = "2011", NUMBER = "1 2011", PAGES = "xx-yy", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217365"} @inproceedings{bb222362, AUTHOR = "Ibrahim, A. and Tominaga, S. and Horiuchi, T.", TITLE = "Spectral Invariant Representation for Spectral Reflectance Image", BOOKTITLE = ICPR10, YEAR = "2010", PAGES = "2776-2779", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217366"} @inproceedings{bb222363, AUTHOR = "Ibrahim, A. and Tominaga, S. and Horiuchi, T.", TITLE = "Material Classification for Printed Circuit Boards by Spectral Imaging System", BOOKTITLE = CCIW09, YEAR = "2009", PAGES = "216-225", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217367"} @inproceedings{bb222364, AUTHOR = "Horiuchi, T. and Ibrahim, A. and Kadoi, H. and Tominaga, S.", TITLE = "An Effective Method for Illumination-Invariant Representation of Color Images", BOOKTITLE = Color12, YEAR = "2012", PAGES = "II: 401-410", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217368"} @inproceedings{bb222365, AUTHOR = "Ibrahim, A. and Horiuchi, T. and Tominaga, S.", TITLE = "Illumination-invariant representation for natural color images and its application", BOOKTITLE = Southwest12, YEAR = "2012", PAGES = "157-160", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217369"} @inproceedings{bb222366, AUTHOR = "Tominaga, S. and Okamoto, S.", TITLE = "Reflectance-based material classification for printed circuit boards", BOOKTITLE = CIAP03, YEAR = "2003", PAGES = "238-243", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217370"} @inproceedings{bb222367, AUTHOR = "Horiuchi, T. and Suzuki, Y. and Tominaga, S.", TITLE = "Material Classification for Printed Circuit Boards by Kernel Fisher Discriminant Analysis", BOOKTITLE = CCIW11, YEAR = "2011", PAGES = "152-164", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217371"} @article{bb222368, AUTHOR = "Choy, S.K. and Jia, N.N. and Tong, C.S. and Tang, M.L. and Lam, E.Y.", TITLE = "A Robust Computational Algorithm for Inverse Photomask Synthesis in Optical Projection Lithography", JOURNAL = SIIMS, VOLUME = "5", YEAR = "2012", NUMBER = "1 2012", PAGES = "625-651", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217372"} @inproceedings{bb222369, AUTHOR = "Jia, N.N. and Lam, E.Y.", TITLE = "Stochastic gradient descent for robust inverse photomask synthesis in optical lithography", BOOKTITLE = ICIP10, YEAR = "2010", PAGES = "4173-4176", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217373"} @article{bb222370, AUTHOR = "Yu, J.C. and Yu, P. and Chao, H.Y.", TITLE = "Library-Based Illumination Synthesis for Critical CMOS Patterning", JOURNAL = IP, VOLUME = "22", YEAR = "2013", NUMBER = "7", PAGES = "2811-2821", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217374"} @article{bb222371, AUTHOR = "Xu, S. and Cheng, Z. and Gao, Y. and Pan, Q.", TITLE = "Visual wafer dies counting using geometrical characteristics", JOURNAL = IET-IPR, VOLUME = "8", YEAR = "2014", NUMBER = "5", MONTH = "May", PAGES = "280-288", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217375"} @article{bb222372, AUTHOR = "Duan, G.F. and Wang, H.C. and Liu, Z.Y. and Tan, J.R. and Chen, Y.W.", TITLE = "Automatic optical phase identification of micro-drill bits based on improved ASM and bag of shape segment in PCB production", JOURNAL = MVA, VOLUME = "25", YEAR = "2014", NUMBER = "6", PAGES = "1411-1422", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217376"} @article{bb222373, AUTHOR = "Leibovici, M.C.R. and Gaylord, T.K.", TITLE = "Custom-modified three-dimensional periodic microstructures by pattern-integrated interference lithography", JOURNAL = JOSA-A, VOLUME = "31", YEAR = "2014", NUMBER = "7", MONTH = "July", PAGES = "1515-1519", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217377"} @article{bb222374, AUTHOR = "Estellers, V. and Thiran, J.P. and Gabrani, M.", TITLE = "Surface Reconstruction From Microscopic Images in Optical Lithography", JOURNAL = IP, VOLUME = "23", YEAR = "2014", NUMBER = "8", MONTH = "August", PAGES = "3560-3573", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217378"} @article{bb222375, AUTHOR = "Bernal, F. and Acebron, J.A. and Anjam, I.", TITLE = "A Stochastic Algorithm Based on Fast Marching for Automatic Capacitance Extraction in Non-Manhattan Geometries", JOURNAL = SIIMS, VOLUME = "7", YEAR = "2014", NUMBER = "4", PAGES = "2657-2674", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217379"} @article{bb222376, AUTHOR = "Lakhssassi, A. and Palenychka, R. and Savaria, Y. and Sayde, M. and Zaremba, M.", TITLE = "Monitoring Thermal Stress in Wafer-Scale Integrated Circuits by the Attentive Vision Method Using an Infrared Camera", JOURNAL = CirSysVideo, VOLUME = "26", YEAR = "2016", NUMBER = "2", MONTH = "February", PAGES = "412-424", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217380"} @article{bb222377, AUTHOR = "Chebolu, A. and Nagahanumaiah", TITLE = "Contact angle measurement techniques on micro-patterned surfaces: A comparative analysis", JOURNAL = IJCVR, VOLUME = "7", YEAR = "2017", NUMBER = "1/2", PAGES = "148-159", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217381"} @article{bb222378, AUTHOR = "Sindagi, V.A. and Srivastava, S.", TITLE = "Domain Adaptation for Automatic OLED Panel Defect Detection Using Adaptive Support Vector Data Description", JOURNAL = IJCV, VOLUME = "122", YEAR = "2017", NUMBER = "2", MONTH = "April", PAGES = "193-211", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217382"} @article{bb222379, AUTHOR = "Qiao, K. and Zeng, L. and Chen, J. and Hai, J.J. and Yan, B.", TITLE = "Wire segmentation for printed circuit board using deep convolutional neural network and graph cut model", JOURNAL = IET-IPR, VOLUME = "12", YEAR = "2018", NUMBER = "5", MONTH = "May", PAGES = "793-800", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217383"} @article{bb222380, AUTHOR = "Boscaro, A. and Jacquir, S. and Chef, S. and Sanchez, K. and Perdu, P. and Binczak, S.", TITLE = "Automatic localization of signal sources in photon emission images for integrated circuit analysis", JOURNAL = SIViP, VOLUME = "12", YEAR = "2018", NUMBER = "4", MONTH = "May", PAGES = "775-782", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217384"} @article{bb222381, AUTHOR = "Kaur, B. and Kaur, G. and Kaur, A.", TITLE = "Detection of defective printed circuit boards using image processing", JOURNAL = IJCVR, VOLUME = "8", YEAR = "2018", NUMBER = "4", PAGES = "418-434", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217385"} @article{bb222382, AUTHOR = "Ashikin, F. and Hashizume, M. and Yotsuyanagi, H. and Lu, S.K. and Roth, Z.", TITLE = "A Design for Testability of Open Defects at Interconnects in 3D Stacked ICs", JOURNAL = IEICE, VOLUME = "E101-D", YEAR = "2018", NUMBER = "8", MONTH = "August", PAGES = "2053-2063", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217386"} @article{bb222383, AUTHOR = "Cheng, D. and Shi, Y.Q. and Gwee, B.H. and Toh, K.A. and Lin, T.", TITLE = "A Hierarchical Multiclassifier System for Automated Analysis of Delayered IC Images", JOURNAL = IEEE_Int_Sys, VOLUME = "34", YEAR = "2019", NUMBER = "2", MONTH = "March", PAGES = "36-43", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217387"} @article{bb222384, AUTHOR = "Han, H. and Gao, C.Q. and Zhao, Y. and Liao, S.S. and Tang, L. and Li, X.D.", TITLE = "Polycrystalline silicon wafer defect segmentation based on deep convolutional neural networks", JOURNAL = PRL, VOLUME = "130", YEAR = "2020", PAGES = "234-241", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217388"} @article{bb222385, AUTHOR = "Shen, J.Q. and Liu, N.Z. and Sun, H.", TITLE = "Defect detection of printed circuit board based on lightweight deep convolution network", JOURNAL = IET-IPR, VOLUME = "14", YEAR = "2020", NUMBER = "15", MONTH = "December", PAGES = "3932-3940", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217389"} @article{bb222386, AUTHOR = "Mitic, V. and Serpa, C. and Ilic, I. and Mohr, M. and Fecht, H.J.", TITLE = "Fractal Nature of Advanced Ni-Based Superalloys Solidified on Board the International Space Station", JOURNAL = RS, VOLUME = "13", YEAR = "2021", NUMBER = "9", PAGES = "xx-yy", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217390"} @article{bb222387, AUTHOR = "Frittoli, L. and Carrera, D. and Rossi, B. and Fragneto, P. and Boracchi, G.", TITLE = "Deep open-set recognition for silicon wafer production monitoring", JOURNAL = PR, VOLUME = "124", YEAR = "2022", PAGES = "108488", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217391"} @article{bb222388, AUTHOR = "Pan, J.W. and Zeng, D.Y. and Tan, Q. and Wu, Z.Z. and Ren, Z.G.", TITLE = "EU-Net: A novel semantic segmentation architecture for surface defect detection of mobile phone screens", JOURNAL = IET-IPR, VOLUME = "16", YEAR = "2022", NUMBER = "10", PAGES = "2568-2576", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217392"} @article{bb222389, AUTHOR = "Lin, G. and Kong, L.F. and Liu, T. and Qiu, L. and Chen, X.", TITLE = "An antagonistic training algorithm for TFT-LCD module mura defect detection", JOURNAL = SP:IC, VOLUME = "107", YEAR = "2022", PAGES = "116791", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217393"} @article{bb222390, AUTHOR = "Liu, Q. and Wang, M. and Wang, H.X. and Hanajima, N.", TITLE = "MPGI-Terminal defect detection based on M-FRCNN", JOURNAL = IET-IPR, VOLUME = "17", YEAR = "2023", NUMBER = "2", PAGES = "428-438", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217394"} @article{bb222391, AUTHOR = "Kim, B.J. and Choi, H. and Jang, H. and Lee, D.G. and Jeong, W. and Kim, S.W.", TITLE = "Dead pixel test using effective receptive field", JOURNAL = PRL, VOLUME = "167", YEAR = "2023", PAGES = "149-156", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217395"} @article{bb222392, AUTHOR = "Wang, Y.T. and Wang, J.G. and Cao, Y.S. and Li, S.X. and Kwan, O.", TITLE = "Integrated Inspection on PCB Manufacturing in Cyber-Physical-Social Systems", JOURNAL = SMCS, VOLUME = "53", YEAR = "2023", NUMBER = "4", MONTH = "April", PAGES = "2098-2106", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217396"} @article{bb222393, AUTHOR = "Zhao, J. and Zhu, B. and Peng, M. and Li, L.L.", TITLE = "Mobile phone screen surface scratch detection based on optimized YOLOv5 model (OYm)", JOURNAL = IET-IPR, VOLUME = "17", YEAR = "2023", NUMBER = "5", PAGES = "1364-1374", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217397"} @article{bb222394, AUTHOR = "Boubaker, S. and Kamel, S. and Ghazouani, N. and Mellit, A.", TITLE = "Assessment of Machine and Deep Learning Approaches for Fault Diagnosis in Photovoltaic Systems Using Infrared Thermography", JOURNAL = RS, VOLUME = "15", YEAR = "2023", NUMBER = "6", PAGES = "1686", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217398"} @article{bb222395, AUTHOR = "He, F. and Tan, J. and Wang, W. and Liu, S. and Zhu, Y. and Liu, Z.J.", TITLE = "EFFNet: Element-wise feature fusion network for defect detection of display panels", JOURNAL = SP:IC, VOLUME = "119", YEAR = "2023", PAGES = "117043", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217399"} @article{bb222396, AUTHOR = "Song, B.J. and Qiao, K. and Yang, J. and Shi, S. and Chen, J. and Yan, B.", TITLE = "An active learning method based on result quality evaluation for printed circuit board computed tomography image segmentation", JOURNAL = IET-IPR, VOLUME = "17", YEAR = "2023", NUMBER = "13", PAGES = "3688-3701", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217400"} @article{bb222397, AUTHOR = "Ng, C.C. and Lin, C.T. and Tan, Z.Q. and Wang, X.Y. and Kew, J.L. and Chan, C.S. and Zach, C.", TITLE = "When IC meets text: Towards a rich annotated integrated circuit text dataset", JOURNAL = PR, VOLUME = "147", YEAR = "2024", PAGES = "110124", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217401"} @article{bb222398, AUTHOR = "Tan, Z.T. and Mu, Y.D.", TITLE = "Hierarchical reinforcement learning for chip-macro placement in integrated circuit", JOURNAL = PRL, VOLUME = "179", YEAR = "2024", PAGES = "108-114", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217402"} @inproceedings{bb222399, AUTHOR = "Gatta, G.G. and Carrera, D. and Rossi, B. and Fragneto, P. and Boracchi, G.", TITLE = "Image Retrieval in Semiconductor Manufacturing", BOOKTITLE = CIAP23, YEAR = "2023", PAGES = "I:1-13", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217403"}