@inproceedings{bb258800,
AUTHOR = "Nguyen, V.D. and Noble, J.A. and Mundy, J.L. and Janning, J. and Ross, J.",
TITLE = "Exhaustive Detection of Manufacturing Flaws as Abnormalities",
BOOKTITLE = CVPR98,
YEAR = "1998",
PAGES = "945-952",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT253615"}
@inproceedings{bb258801,
AUTHOR = "Nagata, N. and Dobashi, T. and Manabe, Y. and Usami, T. and Inokuchi, S.",
TITLE = "Modelling and Visualization for Pearl Quality Evaluation Simulator",
BOOKTITLE = SCIA97,
YEAR = "1997",
PAGES = "xx-yy",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT253616"}
@inproceedings{bb258802,
AUTHOR = "Wiklund, J. and Granlund, G.H.",
TITLE = "Autonomous Inspection System for Nuclear Power Plants",
BOOKTITLE = SSAB97,
YEAR = "1997",
PAGES = "Autonomous Systems",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT253617"}
@inproceedings{bb258803,
AUTHOR = "Nagata, N. and Dobashi, T. and Manabe, Y. and Usami, T. and Inokuchi, S.",
TITLE = "Image analysis and synthesis using physics-based-modeling for pearl
quality evaluation system",
BOOKTITLE = CIAP97,
YEAR = "1997",
PAGES = "II: 697-704",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT253618"}
@inproceedings{bb258804,
AUTHOR = "Boddeke, F. and Schenkeveld, E. and van Geest, L. and Young, I.",
TITLE = "Fluorescence Lifetime Determination for Application in Microscopy",
BOOKTITLE = ICPR96,
YEAR = "1996",
PAGES = "III: 854-858",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT253619"}
@inproceedings{bb258805,
AUTHOR = "Aas, K. and Eikvil, L. and Milvang, O.",
TITLE = "Automatic Can Separation",
BOOKTITLE = ICPR96,
YEAR = "1996",
PAGES = "III: 954-958",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT253620"}
@inproceedings{bb258806,
AUTHOR = "Sablatnig, R.",
TITLE = "Flexible Automatic Visual Inspection Based on the Separation of
Detection And Analysis",
BOOKTITLE = ICPR96,
YEAR = "1996",
PAGES = "III: 944-948",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT253621"}
@inproceedings{bb258807,
AUTHOR = "Pascoletti, A. and Trucco, E.",
TITLE = "On Uncalibrated Motion-Based Inspection for Conveyor-Belt Systems",
BOOKTITLE = BMVC96,
YEAR = "1996",
PAGES = "Poster Session 2",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT253622"}
@article{bb258808,
AUTHOR = "Boukouvalas, C. and Kittler, J.V. and Marik, R. and Petrou, M.",
TITLE = "Automatic Grading of Textured Ceramic Tiles",
JOURNAL = SPIE,
VOLUME = "2425",
YEAR = "1995",
MONTH = "February",
PAGES = "248-256",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT253623"}
@inproceedings{bb258809,
AUTHOR = "Anzalone, A. and Machi, A.",
TITLE = "Real-Time Visual Inspection of Moulded Plastics Drippers",
BOOKTITLE = CAMP95,
YEAR = "1995",
PAGES = "xx",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT253624"}
@inproceedings{bb258810,
AUTHOR = "Bartels, K.A. and Fisher, J.L.",
TITLE = "Multifrequency eddy current image processing techniques for
nondestructive evaluation",
BOOKTITLE = ICIP95,
YEAR = "1995",
PAGES = "I: 486-489",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT253625"}
@inproceedings{bb258811,
AUTHOR = "Brzakovic, D. and Vujovic, N.",
TITLE = "Development environment for designing and testing inspection systems",
BOOKTITLE = ICPR94,
YEAR = "1994",
PAGES = "C:366-369",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT253626"}
@inproceedings{bb258812,
AUTHOR = "Hartley, R.I. and Noble, J.A. and Grande, J. and Liu, J.",
TITLE = "Quantitative measurement of manufactured diamond shape",
BOOKTITLE = ECCV94,
YEAR = "1994",
PAGES = "A:433-440",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT253627"}
@inproceedings{bb258813,
AUTHOR = "Jenkins, M.R.M. and Jepson, A.",
TITLE = "Detecting Floor Anomalies",
BOOKTITLE = BMVC94,
YEAR = "1994",
PAGES = "xx-yy",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT253628"}
@inproceedings{bb258814,
AUTHOR = "Koeinig, A. and Bulmahn, O. and Glesner, M.",
TITLE = "Systematic Methods for Multivariate Data Visualization and Numerical
Assessment of Class Separability and Overlap in Automated Visual
Industrial Quality Control",
BOOKTITLE = BMVC94,
YEAR = "1994",
PAGES = "xx-yy",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT253629"}
@inproceedings{bb258815,
AUTHOR = "Sobh, T.M. and Dekhil, M. and Jaynes, C. and Henderson, T.C.",
TITLE = "A Perception Framework for Inspection and Reverse Engineering",
BOOKTITLE = CVPR93,
YEAR = "1993",
PAGES = "609-610",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT253630"}
@inproceedings{bb258816,
AUTHOR = "Mundy, J.L. and Noble, J.A.",
TITLE = "Toward Template-Based Tolerancing from a Bayesian Viewpoint",
BOOKTITLE = CVPR93,
YEAR = "1993",
PAGES = "246-252",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT253631"}
@inproceedings{bb258817,
AUTHOR = "Noble, J.A. and Nguyen, V.D. and Marinos, C. and Tran, A.T. and Farley, J. and Hedengren, K.H. and Mundy, J.L.",
TITLE = "Template Guided Visual Inspection",
BOOKTITLE = ECCV92,
YEAR = "1992",
PAGES = "893-901",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT253632"}
@inproceedings{bb258818,
AUTHOR = "Mundy, J.L. and Noble, J.A. and Marinos, C. and Nguyen, V.D. and Heller, A.J. and Farley, J. and Tran, A.T.",
TITLE = "An Object-Oriented Approach to Template Guided Inspection",
BOOKTITLE = CVPR92,
YEAR = "1992",
PAGES = "386-392",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT253633"}
@inproceedings{bb258819,
AUTHOR = "Palenichka, R.M. and Mysak, R.T.",
TITLE = "Model-based adaptive preprocessing of images in automatic visual
inspection",
BOOKTITLE = CAIP93,
YEAR = "1993",
PAGES = "732-737",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT253634"}
@inproceedings{bb258820,
AUTHOR = "Boccignone, G. and Esposito, L. and Marcelli, A.",
TITLE = "An experimental vision tool for real time quality control",
BOOKTITLE = CAIP93,
YEAR = "1993",
PAGES = "706-710",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT253635"}
@inproceedings{bb258821,
AUTHOR = "Modayur, B.R. and Shapiro, L.G.",
TITLE = "Automated Inspection Of Machine Parts",
BOOKTITLE = ICPR92,
YEAR = "1992",
PAGES = "I:57-60",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT253636"}
@inproceedings{bb258822,
AUTHOR = "Nayar, S.K.",
TITLE = "Shape recovery methods for visual inspection",
BOOKTITLE = WACV92,
YEAR = "1992",
PAGES = "136-145",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT253637"}
@inproceedings{bb258823,
AUTHOR = "Ip, H.H.S.",
TITLE = "Visual Evidence Accumulation in Radiograph Inspection",
BOOKTITLE = BMVC91,
YEAR = "1991",
PAGES = "xx-yy",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT253638"}
@inproceedings{bb258824,
AUTHOR = "Avnaim, F. and Boissonnat, J.D.",
TITLE = "A geometric approach to inspection",
BOOKTITLE = ICPR88,
YEAR = "1988",
PAGES = "II: 891-893",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT253639"}
@inproceedings{bb258825,
AUTHOR = "Firschein, O. and Fischler, M.A.",
TITLE = "Perceptual Problems in Analyzing Industrial Radiographs",
BOOKTITLE = IJCAI81,
YEAR = "1981",
PAGES = "740-745",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT253640"}
@inproceedings{bb258826,
AUTHOR = "Barnard, S.T.",
TITLE = "Automated Inspection Using Gray-Scale Statistics",
BOOKTITLE = AAAI-80,
YEAR = "1980",
PAGES = "49-52",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT253641"}
@inproceedings{bb258827,
AUTHOR = "Barnard, S.T.",
TITLE = "Automated Inspection Using Gray-Scale Statistics",
BOOKTITLE = ICPR80,
YEAR = "1980",
PAGES = "269-272",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT253641"}
@inproceedings{bb258828,
AUTHOR = "Peterson, C.",
TITLE = "Automated Visual Inspection",
BOOKTITLE = ICPR74,
YEAR = "1974",
PAGES = "",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT253642"}
@article{bb258829,
AUTHOR = "Chin, R.T.",
TITLE = "Automated Visual Inspection
Techniques and Applications: A Bibliography",
JOURNAL = PR,
VOLUME = "15",
YEAR = "1982",
NUMBER = "4",
PAGES = "343-357",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT253643"}
@article{bb258830,
AUTHOR = "Chin, R.T.",
TITLE = "Automated Visual Inspection: 1981 to 1987",
JOURNAL = CVGIP,
VOLUME = "41",
YEAR = "1988",
NUMBER = "3",
MONTH = "March",
PAGES = "346-381",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT253644"}
@article{bb258831,
AUTHOR = "Chin, R.T. and Harlow, C.A.",
TITLE = "Automated Visual Inspection: A Survey",
JOURNAL = PAMI,
VOLUME = "4",
YEAR = "1982",
NUMBER = "6",
MONTH = "November",
PAGES = "557-573",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT253645"}
@inproceedings{bb258832,
AUTHOR = "Chin, R.T.",
TITLE = "Algorithms and Techniques for Automated Visual Inspection",
BOOKTITLE = HPRIP86,
YEAR = "1986",
PAGES = "587-612",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT253646"}
@article{bb258833,
AUTHOR = "Jarvis, J.F.",
TITLE = "Visual Inspection Automation",
JOURNAL = Computer,
VOLUME = "13",
YEAR = "1980",
NUMBER = "5",
MONTH = "May",
PAGES = "32-38",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT253647"}
@inproceedings{bb258834,
AUTHOR = "Fu, K.S.",
TITLE = "Pictorial Pattern Recognition for Industrial Inspection",
BOOKTITLE = PDA83,
YEAR = "1983",
PAGES = "335-349",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT253648"}
@article{bb258835,
AUTHOR = "Porter, G.B. and Mundy, J.L.",
TITLE = "Visual Inspection System Design",
JOURNAL = Computer,
VOLUME = "13",
YEAR = "1980",
NUMBER = "5",
MONTH = "May",
PAGES = "40-48",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT253649"}
@article{bb258836,
AUTHOR = "Meyers, W.",
TITLE = "Industry Begins to Use Visual Pattern Recognition",
JOURNAL = Computer,
VOLUME = "13",
YEAR = "1980",
NUMBER = "5",
MONTH = "May",
PAGES = "21-31",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT253650"}
@article{bb258837,
AUTHOR = "Agin, G.J.",
TITLE = "Computer Vision Systems for Industrial Inspection and Assembly",
JOURNAL = Computer,
VOLUME = "13",
YEAR = "1980",
NUMBER = "5",
MONTH = "May",
PAGES = "11-20",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT253651"}
@article{bb258838,
AUTHOR = "Yachida, M. and Tsuji, S.",
TITLE = "Industrial Computer Vision in Japan",
JOURNAL = Computer,
VOLUME = "13",
YEAR = "1980",
NUMBER = "5",
MONTH = "May",
PAGES = "50-63",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT253652"}
@article{bb258839,
AUTHOR = "Newman, T.S. and Jain, A.K.",
TITLE = "A Survey of Automated Visual Inspection",
JOURNAL = CVIU,
VOLUME = "61",
YEAR = "1995",
NUMBER = "2",
MONTH = "March",
PAGES = "231-262",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT253653"}
@book{bb258840,
AUTHOR = "Marshall, A.D. and Martin, R.R.",
TITLE = "Computer Vision, Models and Inspection",
PUBLISHER = "World Scientific",
YEAR = "1992",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT253654"}
@book{bb258841,
AUTHOR = "Pau, L.F.",
TITLE = "Computer Vision in Electronics Applications",
PUBLISHER = "Plenum",
YEAR = "1990",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT253655"}
@book{bb258842,
AUTHOR = "Pau, L.F.",
TITLE = "Computer Vision in Electronics Applications",
PUBLISHER = "Book",
YEAR = "1990",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT253655"}
@article{bb258843,
AUTHOR = "Asundi, A.",
TITLE = "Special Issue on Computer-Aided Measurement and Inspection",
JOURNAL = OptLas,
VOLUME = "22",
YEAR = "1995",
NUMBER = "3",
PAGES = "159-160",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT253656"}
@article{bb258844,
AUTHOR = "Chen, Y.H.",
TITLE = "Computer Vision for General-Purpose Visual Inspection:
A Fuzzy-Logic Approach",
JOURNAL = OptLas,
VOLUME = "22",
YEAR = "1995",
NUMBER = "3",
PAGES = "181-192",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT253657"}
@article{bb258845,
AUTHOR = "Sobh, T.M. and Owen, J. and Jaynes, C. and Dekhil, M. and Henderson, T.C.",
TITLE = "Industrial Inspection and Reverse Engineering",
JOURNAL = CVIU,
VOLUME = "61",
YEAR = "1995",
NUMBER = "3",
MONTH = "May",
PAGES = "468-474",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT253658"}
@article{bb258846,
AUTHOR = "Chen, F.L. and Su, C.T.",
TITLE = "Vision-Based Automated Inspection System in
Computer-Integrated Manufacturing",
JOURNAL = IJAMT,
VOLUME = "11",
YEAR = "1996",
NUMBER = "3",
PAGES = "206-213",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT253659"}
@article{bb258847,
AUTHOR = "Davies, E.R. and Ip, H.H.S.",
TITLE = "Guest Editorial: Special Issue on Real-Time Visual Monitoring and
Inspection",
JOURNAL = RealTimeImg,
VOLUME = "4",
YEAR = "1998",
NUMBER = "5",
MONTH = "October",
PAGES = "313-315",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT253660"}
@inproceedings{bb258848,
AUTHOR = "Davies, E.R.",
TITLE = "Principles Emerging from the Design of Visual Search Algorithms for
Practical Inspection Tasks",
BOOKTITLE = IMVIP08,
YEAR = "2008",
PAGES = "3-20",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT253661"}
@article{bb258849,
AUTHOR = "Sablatnig, R.",
TITLE = "Increasing flexibility for automatic visual inspection: the general
analysis graph",
JOURNAL = MVA,
VOLUME = "12",
YEAR = "2000",
NUMBER = "4",
PAGES = "158-169",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT253662"}
@article{bb258850,
AUTHOR = "da Fontoura Costa, L. and Meriaudeau, F.",
TITLE = "Special Issue on Applied Visual Inspection",
JOURNAL = JASP,
VOLUME = "2002",
YEAR = "2002",
NUMBER = "7",
MONTH = "July",
PAGES = "647-648",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT253663"}
@article{bb258851,
AUTHOR = "Shirvaikar, M.V.",
TITLE = "Trends in automated visual inspection",
JOURNAL = RealTimeIP,
VOLUME = "1",
YEAR = "2006",
NUMBER = "1",
MONTH = "October",
PAGES = "41-43",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT253664"}
@inproceedings{bb258852,
AUTHOR = "Sannen, D. and van Brussel, H. and Nuttin, M.",
TITLE = "Learning Visual Quality Inspection from Multiple Humans Using Ensembles
of Classifiers",
BOOKTITLE = CVS08,
YEAR = "2008",
PAGES = "xx-yy",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT253665"}
@inproceedings{bb258853,
AUTHOR = "Hata, S.",
TITLE = "Practical Visual Inspection Techniques:
Optics, Micro-electronics and Advanced Software Technology",
BOOKTITLE = ICPR00,
YEAR = "2000",
PAGES = "Vol IV: 114-117",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT253666"}
@inproceedings{bb258854,
AUTHOR = "Flinchbaugh, B.E.",
TITLE = "Industry Needs for Computer Vision and Pattern Recognition: Panel",
BOOKTITLE = CVPR96,
YEAR = "1996",
PAGES = "Panel",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT253667"}
@inproceedings{bb258855,
AUTHOR = "Petkovic, D.",
TITLE = "Human Assisted Computer Vision and Artificial Intelligence -- Why Not?",
BOOKTITLE = CVPR96,
YEAR = "1996",
PAGES = "Invited Talk",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT253668"}
@inproceedings{bb258856,
AUTHOR = "Noble, J.A. and Mundy, J.L.",
TITLE = "Constraint Processing Applied to Industrial Inspection and
Continuous Product Improvement",
BOOKTITLE = DARPA93,
YEAR = "1993",
PAGES = "801-809",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT253669"}
@inproceedings{bb258857,
AUTHOR = "Shapiro, L.G. and Haralick, R.M. and Pong, T.C.",
TITLE = "The Visual Components of an Automated Inspection Task",
BOOKTITLE = CAIA84,
YEAR = "1984",
PAGES = "207-210",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT253670"}
@article{bb258858,
AUTHOR = "Watkins, L.S.",
TITLE = "Inspection of IC Photomasks with Intensity Spatial Filters",
JOURNAL = PIEEE,
VOLUME = "57",
YEAR = "1969",
PAGES = "1634-1639",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253673"}
@article{bb258859,
AUTHOR = "Axelrod, N.N.",
TITLE = "Intensity Spatial Filtering Applied to Defect Detection in
Integrated Circuit Photomasks",
JOURNAL = PIEEE,
VOLUME = "60",
YEAR = "1972",
PAGES = "447-448",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253674"}
@inproceedings{bb258860,
AUTHOR = "Bourdelais, R.J. and Colangelo, D. and McFadyen, R.J. and Elliott, J.F.",
TITLE = "Instrument for Automatically Inspecting Integrated Circuit Masks for
Pinholes and Spots",
BOOKTITLE = US_Patent,
YEAR = "1974",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253675"}
@article{bb258861,
AUTHOR = "Horn, B.K.P.",
TITLE = "A Problem in Computer Vision:
Orienting Silicon Integrated Circuit Chips for Lead Bonding",
JOURNAL = CGIP,
VOLUME = "4",
YEAR = "1975",
NUMBER = "3",
MONTH = "September",
PAGES = "294-303",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253676"}
@inproceedings{bb258862,
AUTHOR = "Horn, B.K.P.",
TITLE = "Orienting Silicon Integrated Circuit Chips for Lead Bonding",
BOOKTITLE = "MIT AI Memo",
YEAR = "1975",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253677"}
@article{bb258863,
AUTHOR = "Harlow, C.A. and Henderson, S.E. and Rayfield, D.A. and Johnson, R.J. and Dwyer, S.J.",
TITLE = "Automated Inspection of Electronic Assemblies",
JOURNAL = Computer,
VOLUME = "8",
YEAR = "1975",
NUMBER = "4",
MONTH = "April",
PAGES = "36-45",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253678"}
@inproceedings{bb258864,
AUTHOR = "Olsen, O.A.",
TITLE = "Visual Method of Locating Faults in Printed Circuit Boards",
BOOKTITLE = US_Patent,
YEAR = "1976",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253679"}
@inproceedings{bb258865,
AUTHOR = "Baxter, D.W. and Shipway, R.E.",
TITLE = "Defect Inspection of Objects Such as Electronic Circuits",
BOOKTITLE = US_Patent,
YEAR = "1977",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253680"}
@article{bb258866,
AUTHOR = "McVey, E.S. and van Tol, A.",
TITLE = "An experimental printed circuit board drilling system automated by
pattern recognition",
JOURNAL = PR,
VOLUME = "11",
YEAR = "1979",
NUMBER = "4",
PAGES = "271-276",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253681"}
@article{bb258867,
AUTHOR = "Hsieh, Y.Y. and Fu, K.S.",
TITLE = "An Automatic Visual Inspection System for Integrated Circuit Chips",
JOURNAL = CGIP,
VOLUME = "14",
YEAR = "1980",
NUMBER = "4",
MONTH = "December",
PAGES = "293-343",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253682"}
@article{bb258868,
AUTHOR = "Jarvis, J.F.",
TITLE = "A Method for Automating the Visual Inspection of
Printed Wiring Boards",
JOURNAL = PAMI,
VOLUME = "2",
YEAR = "1980",
NUMBER = "1",
MONTH = "January",
PAGES = "77-83",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253683"}
@article{bb258869,
AUTHOR = "Goto, N. and Kondo, T.",
TITLE = "An Automatic Inspection System for Printed Wiring Board Masks",
JOURNAL = PR,
VOLUME = "12",
YEAR = "1980",
NUMBER = "6",
PAGES = "443-455",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253684"}
@article{bb258870,
AUTHOR = "Pau, L.F.",
TITLE = "Integrated Testing and Algorithms for Visual
Inspection of Integrated Circuits",
JOURNAL = PAMI,
VOLUME = "5",
YEAR = "1983",
NUMBER = "6",
MONTH = "November",
PAGES = "602-608",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253685"}
@inproceedings{bb258871,
AUTHOR = "Pau, L.F.",
TITLE = "Semiconductio IC's: Integrated Testing and Algorithms for Visual
Inspection",
BOOKTITLE = ICPR80,
YEAR = "1980",
PAGES = "238-240",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253686"}
@article{bb258872,
AUTHOR = "Baird, M.L.",
TITLE = "SIGHT-I: A Computer Vision System for Automated IC Chip Manufacture",
JOURNAL = SMC,
VOLUME = "8",
YEAR = "1978",
NUMBER = "2",
MONTH = "February",
PAGES = "133-139",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253687"}
@inproceedings{bb258873,
AUTHOR = "Baird, M.L.",
TITLE = "An Application ov Computer Vision to Automatic IC Chip Manufacture",
BOOKTITLE = ICPR76,
YEAR = "1976",
PAGES = "3-7",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253688"}
@article{bb258874,
AUTHOR = "West, M.A. and de Foster, S. and Baldwin, E.C. and Zeigler, R.A.",
TITLE = "Computer Controlled Optical Testing of High-Density
Printed-Circuit Boards",
JOURNAL = IBMRD,
VOLUME = "27",
YEAR = "1983",
NUMBER = "1",
PAGES = "50-58",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253689"}
@inproceedings{bb258875,
AUTHOR = "Crabb, R.M. and de Foster, S.M. and Rittenhouse, N.E. and West, M.A. and Ziegler, R.A.",
TITLE = "System for measuring and detecting printed circuit wiring defects",
BOOKTITLE = US_Patent,
YEAR = "1987",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253690"}
@article{bb258876,
AUTHOR = "Wahl, F. and So, S. and Wong, K.",
TITLE = "A Hybrid Optical-Digital Image Processing Method for Surface Inspection",
JOURNAL = IBMRD,
VOLUME = "27",
YEAR = "1983",
NUMBER = "4",
MONTH = "July",
PAGES = "376-385",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253691"}
@article{bb258877,
AUTHOR = "Rubat du Merac, C. and Jutier, P. and Laurent, J. and Courtois, B.",
TITLE = "A New Domain for Image Analysis:
VLSI Circuit Testing, with ROMULAD,
Specialized in Parallel Image Processing",
JOURNAL = PRL,
VOLUME = "1",
YEAR = "1983",
PAGES = "347-357",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253692"}
@article{bb258878,
AUTHOR = "Zeller, H. and Doemens, G.",
TITLE = "Applications of Pattern Recognition in Semiconductor and
Printer Board Production",
JOURNAL = SP,
VOLUME = "5",
YEAR = "1983",
PAGES = "399-412",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253693"}
@article{bb258879,
AUTHOR = "Wilder, J.",
TITLE = "Machine Vision for Inspection of Keyboards",
JOURNAL = SP,
VOLUME = "5",
YEAR = "1983",
PAGES = "413-421",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253694"}
@article{bb258880,
AUTHOR = "West, G.A.W.",
TITLE = "A System for the Automatic Visual Inspection of
Bare-Printed Circuit Boards",
JOURNAL = SMC,
VOLUME = "14",
YEAR = "1984",
PAGES = "767-773",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253695"}
@inproceedings{bb258881,
AUTHOR = "Nakashima, M. and Koezuka, T. and Inagaki, T.",
TITLE = "Recognition method and apparatus",
BOOKTITLE = US_Patent,
YEAR = "1984",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253696"}
@article{bb258882,
AUTHOR = "Mandeville, J.R.",
TITLE = "Novel Method for Analysis of Printed Circuit Images",
JOURNAL = IBMRD,
VOLUME = "29",
YEAR = "1985",
NUMBER = "1",
MONTH = "January",
PAGES = "73-86",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253697"}
@article{bb258883,
AUTHOR = "Bixler, J.P. and Sanford, J.P.",
TITLE = "A Technique for Encoding Lines and Regions in Engineering Drawings",
JOURNAL = PR,
VOLUME = "18",
YEAR = "1985",
NUMBER = "5",
PAGES = "367-377",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253698"}
@article{bb258884,
AUTHOR = "Yoda, H. and Ohuchi, Y. and Taniguchi, Y. and Ejiri, M.",
TITLE = "An Automatic Wafer Inspection System Using Pipelined Image
Processing Techniques",
JOURNAL = PAMI,
VOLUME = "10",
YEAR = "1988",
NUMBER = "1",
MONTH = "January",
PAGES = "4-16",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253699"}
@article{bb258885,
AUTHOR = "Hara, Y. and Doi, H. and Karasaki, K. and Iida, T.",
TITLE = "A System for PCB Automated Inspection Using Fluorescent Light",
JOURNAL = PAMI,
VOLUME = "10",
YEAR = "1988",
NUMBER = "1",
MONTH = "January",
PAGES = "69-78",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253700"}
@article{bb258886,
AUTHOR = "Shu, D.B. and Li, C.C. and Mancuso, J.F. and Sun, Y.N.",
TITLE = "A Line Extraction Method for Automated SEM Inspection of VLSI
Resist",
JOURNAL = PAMI,
VOLUME = "10",
YEAR = "1988",
NUMBER = "1",
MONTH = "January",
PAGES = "117-120",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253701"}
@article{bb258887,
AUTHOR = "Ando, M. and Inagaki, T.",
TITLE = "Automatic Optical Inspection of Plated Through-Holes for
Ultrahigh Density Printed Wiring Boards",
JOURNAL = MVA,
VOLUME = "1",
YEAR = "1988",
PAGES = "175-181",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253702"}
@article{bb258888,
AUTHOR = "Dom, B.E. and Brecher, V.H. and Bonner, R. and Batchelder, J.S. and Jaffe, R.S.",
TITLE = "The P300: A System for Automatic Pattern Wafer Inspection",
JOURNAL = MVA,
VOLUME = "1",
YEAR = "1988",
PAGES = "205-221",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253703"}
@article{bb258889,
AUTHOR = "Hara, Y. and Akiyama, N. and Karasaki, K.",
TITLE = "Automatic Inspection System for Printed Circuit Boards",
JOURNAL = PAMI,
VOLUME = "5",
YEAR = "1983",
NUMBER = "6",
MONTH = "November",
PAGES = "623-630",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253704"}
@inproceedings{bb258890,
AUTHOR = "Hara, Y. and Okamoto, K. and Hamada, T. and Akiyama, N. and Nakagawa, K. and Torisawa, S. and Nakashima, S.",
TITLE = "Automatic Visual Inspection of LSI Photomasks",
BOOKTITLE = ICPR80,
YEAR = "1980",
PAGES = "273-279",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253705"}
@article{bb258891,
AUTHOR = "Sanz, J.L.C. and Petkovic, D.",
TITLE = "Machine Vision Algorithms for Automated Inspection of
Thin-Film Disk Heads",
JOURNAL = PAMI,
VOLUME = "10",
YEAR = "1988",
NUMBER = "6",
MONTH = "November",
PAGES = "830-848",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253706"}
@article{bb258892,
AUTHOR = "Sanz, J.L.C. and Dinstein, I. and Petkovic, D.",
TITLE = "Computing Multi-Colored Polygonal Masks in Pipeline Architectures and Its
Application to Automated Visual Inspection",
JOURNAL = CACM,
VOLUME = "30",
YEAR = "1987",
NUMBER = "4",
MONTH = "April",
PAGES = "318-329",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253707"}
@article{bb258893,
AUTHOR = "Petkovic, D. and Hinkle, E.B.",
TITLE = "A Rule-Based System for Verifying Engineering Specifications in
Industrial Visual Inspection Applications",
JOURNAL = PAMI,
VOLUME = "9",
YEAR = "1987",
NUMBER = "2",
MONTH = "March",
PAGES = "306-311",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253708"}
@inproceedings{bb258894,
AUTHOR = "Dom, B. and Steele, D. and Petkovic, D. and Kuhlmann, L.",
TITLE = "Algorithms for automatic disk head/slider inspection",
BOOKTITLE = ICPR94,
YEAR = "1994",
PAGES = "A:295-300",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253709"}
@inproceedings{bb258895,
AUTHOR = "Petkovic, D. and Sanz, J.L.C. and Mohiuddin, K.M.A. and Hinkle, E.B. and Flickner, M.D. and Cox, C. and Wong, K.",
TITLE = "An Experimental System for Disk Head Inspection",
BOOKTITLE = ICPR86,
YEAR = "1986",
PAGES = "9-13",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253710"}
@article{bb258896,
AUTHOR = "Sprague, A.P. and Donahue, M.J. and Rokhlin, S.I.",
TITLE = "A Method for Automatic Inspection of Printed Circuit Boards",
JOURNAL = CVGIP,
VOLUME = "54",
YEAR = "1991",
NUMBER = "3",
MONTH = "November",
PAGES = "401-415",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253711"}
@article{bb258897,
AUTHOR = "Wojcik, Z.M.",
TITLE = "An Approach to the Recognition of
Contours and Line-Shaped Objects",
JOURNAL = CVGIP,
VOLUME = "25",
YEAR = "1984",
NUMBER = "2",
MONTH = "February",
PAGES = "184-204",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253712"}
@article{bb258898,
AUTHOR = "Ellison, T.P. and Taylor, C.J.",
TITLE = "Calculating the surface topography of integrated circuit wafers from
SEM images",
JOURNAL = IVC,
VOLUME = "9",
YEAR = "1991",
NUMBER = "1",
MONTH = "February",
PAGES = "3-9",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253713"}
@inproceedings{bb258899,
AUTHOR = "Taylor, C.J. and Ellison, T.P.",
TITLE = "Calculating the surface topography of integrated circuit wafers from
SEM images",
BOOKTITLE = BMVC90,
YEAR = "1990",
PAGES = "xx-yy",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253713"}
Last update:Oct 8, 2026 at 11:03:09