@inproceedings{bb258900,
        AUTHOR = "Yu, K.K. and Berglund, C.N.",
        TITLE = "Automated system for extracting design and layout information
from an integrated circuit",
        BOOKTITLE = US_Patent,
        YEAR = "1992",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253714"}

@inproceedings{bb258901,
        AUTHOR = "Lebeau, C.J.",
        TITLE = "Method for automatic semiconductor wafer inspection",
        BOOKTITLE = US_Patent,
        YEAR = "1992",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253715"}

@inproceedings{bb258902,
        AUTHOR = "Bushroe, M.W.",
        TITLE = "Solder joint locator",
        BOOKTITLE = US_Patent,
        YEAR = "1992",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253716"}

@article{bb258903,
        AUTHOR = "Dom, B.E. and Brecher, V.",
        TITLE = "Recent Advances in the Automatic Inspection of
Integrated-Circuits for Pattern Defects",
        JOURNAL = MVA,
        VOLUME = "8",
        YEAR = "1995",
        NUMBER = "1",
        PAGES = "5-19",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253717"}

@article{bb258904,
        AUTHOR = "Khalaj, B.H. and Aghajan, H.K. and Kailath, T.",
        TITLE = "Patterned Wafer Inspection By High-Resolution Spectral Estimation
Techniques",
        JOURNAL = MVA,
        VOLUME = "7",
        YEAR = "1994",
        NUMBER = "3",
        PAGES = "178-185",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253718"}

@article{bb258905,
        AUTHOR = "Teoh, E.K. and Mital, D.P.",
        TITLE = "A Transputer-Based Automated Visual Inspection System for
Electronic Devices and PCBs",
        JOURNAL = OptLas,
        VOLUME = "22",
        YEAR = "1995",
        NUMBER = "3",
        PAGES = "161-180",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253719"}

@article{bb258906,
        AUTHOR = "Moganti, M. and Ercal, F. and Dagli, C.H. and Tsunekawa, S.",
        TITLE = "Automatic PCB Inspection Algorithms: A Survey",
        JOURNAL = CVIU,
        VOLUME = "63",
        YEAR = "1996",
        NUMBER = "2",
        MONTH = "March",
        PAGES = "287-313",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253720"}

@article{bb258907,
        AUTHOR = "Rao, A.R.",
        TITLE = "Future-Directions in Industrial Machine Vision:
A Case-Study of Semiconductor Manufacturing Applications",
        JOURNAL = IVC,
        VOLUME = "14",
        YEAR = "1996",
        NUMBER = "1",
        MONTH = "February",
        PAGES = "3-19",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253721"}

@article{bb258908,
        AUTHOR = "Yuan, M.C. and Li, J.G.",
        TITLE = "A Production System for LSI Chip Anatomizing",
        JOURNAL = PRL,
        VOLUME = "5",
        YEAR = "1987",
        PAGES = "227-232",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253722"}

@article{bb258909,
        AUTHOR = "Blanz, W.E. and Sanz, J.L.C. and Hinkle, E.B.",
        TITLE = "Image Analysis Methods for Solder-Ball Inspection in
Integrated Circuit Manufacturing",
        JOURNAL = RA,
        VOLUME = "4",
        YEAR = "1988",
        PAGES = "129-139",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253723"}

@article{bb258910,
        AUTHOR = "Chou, P.B. and Rao, A.R. and Sturzenbecker, M.C. and Wu, F.Y. and Brecher, V.H.",
        TITLE = "Automatic Defect Classification for Semiconductor Manufacturing",
        JOURNAL = MVA,
        VOLUME = "9",
        YEAR = "1997",
        NUMBER = "4",
        PAGES = "201-214",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253724"}

@article{bb258911,
        AUTHOR = "An, J.N. and Cho, Y.B. and Gweon, D.G.",
        TITLE = "A New Method for Image Separation of Overlapped Images from a Two-Layered
Printed Circuit Board (PCB)",
        JOURNAL = IVC,
        VOLUME = "15",
        YEAR = "1997",
        NUMBER = "11",
        MONTH = "November",
        PAGES = "861-866",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253725"}

@article{bb258912,
        AUTHOR = "Kim, S.W. and Lee, S.Y. and Yoon, D.S.",
        TITLE = "Rapid Pattern Inspection of Shadow Masks by
Machine Vision Integrated with Fourier Optics",
        JOURNAL = OptEng,
        VOLUME = "36",
        YEAR = "1997",
        NUMBER = "12",
        MONTH = "December",
        PAGES = "3309-3311",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253726"}

@article{bb258913,
        AUTHOR = "Zhou, H. and Kassim, A.A. and Ranganath, S.",
        TITLE = "A Fast Algorithm for Detecting Die Extrusion Defects in IC Packages",
        JOURNAL = MVA,
        VOLUME = "11",
        YEAR = "1998",
        NUMBER = "1",
        PAGES = "37-41",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253727"}

@article{bb258914,
        AUTHOR = "Kassim, A.A. and Zhou, H. and Ranganath, S.",
        TITLE = "Automatic IC orientation checks",
        JOURNAL = MVA,
        VOLUME = "12",
        YEAR = "2000",
        NUMBER = "3",
        PAGES = "107-112",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253728"}

@inproceedings{bb258915,
        AUTHOR = "Nichani, S. and Scola, J.",
        TITLE = "Semiconductor device image inspection utilizing image subtraction and
threshold imaging",
        BOOKTITLE = US_Patent,
        YEAR = "1999",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253729"}

@inproceedings{bb258916,
        AUTHOR = "Ichikawa, I.",
        TITLE = "Laser beam inspection apparatus",
        BOOKTITLE = US_Patent,
        YEAR = "2003",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253730"}

@article{bb258917,
        AUTHOR = "Chung, H.K. and Park, R.H.",
        TITLE = "2-Stage High-Precision Visual Inspection of Surface Mount Devices",
        JOURNAL = JEI,
        VOLUME = "6",
        YEAR = "1997",
        NUMBER = "4",
        MONTH = "October",
        PAGES = "517-524",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253731"}

@article{bb258918,
        AUTHOR = "Moganti, M. and Ercal, F.",
        TITLE = "A Subpattern Level Inspection System for Printed Circuit Boards",
        JOURNAL = CVIU,
        VOLUME = "70",
        YEAR = "1998",
        NUMBER = "1",
        MONTH = "April",
        PAGES = "51-62",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253732"}

@article{bb258919,
        AUTHOR = "Moganti, M. and Ercal, F.",
        TITLE = "Segmentation of Printed Circuit Board Images into Basic Patterns",
        JOURNAL = CVIU,
        VOLUME = "70",
        YEAR = "1998",
        NUMBER = "1",
        MONTH = "April",
        PAGES = "74-86",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253733"}

@article{bb258920,
        AUTHOR = "Fadzil, A. and Weng, C.J.",
        TITLE = "LED Cosmetic Flaw Inspection System",
        JOURNAL = PAA,
        VOLUME = "1",
        YEAR = "1998",
        NUMBER = "1",
        PAGES = "62-70",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253734"}

@article{bb258921,
        AUTHOR = "Rodriguez, A.A. and Mandeville, J.R.",
        TITLE = "Image registration for automated inspection of printed circuit patterns
using CAD reference data",
        JOURNAL = MVA,
        VOLUME = "6",
        YEAR = "1993",
        NUMBER = "4",
        PAGES = "233-242",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253735"}

@article{bb258922,
        AUTHOR = "Rajeswari, M. and Rodd, M.G.",
        TITLE = "Real-time Analysis of an IC Wire-bonding Inspection System",
        JOURNAL = RealTimeImg,
        VOLUME = "5",
        YEAR = "1999",
        NUMBER = "6",
        MONTH = "December",
        PAGES = "409-421",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253736"}

@inproceedings{bb258923,
        AUTHOR = "Beaty, E.M. and Mork, D.P.",
        TITLE = "Three dimensional inspection system",
        BOOKTITLE = US_Patent,
        YEAR = "2000",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253737"}

@article{bb258924,
        AUTHOR = "Xie, P. and Guan, S.U.",
        TITLE = "A golden-template self-generating method for patterned wafer inspection",
        JOURNAL = MVA,
        VOLUME = "12",
        YEAR = "2000",
        NUMBER = "3",
        PAGES = "149-156",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253738"}

@article{bb258925,
        AUTHOR = "Guan, S.U. and Xie, P. and Li, H.",
        TITLE = "A golden-block-based self-refining scheme for repetitive patterned
wafer inspections",
        JOURNAL = MVA,
        VOLUME = "13",
        YEAR = "2003",
        NUMBER = "5-6",
        PAGES = "314-321",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253739"}

@inproceedings{bb258926,
        AUTHOR = "Guan, S.U. and Xie, P.",
        TITLE = "A golden block self-generating scheme for continuous patterned wafer
inspections",
        BOOKTITLE = CIAP99,
        YEAR = "1999",
        PAGES = "436-441",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253740"}

@article{bb258927,
        AUTHOR = "Zoroofi, R.A. and Taketani, H. and Tamura, S. and Sato, Y. and Sekiya, K.",
        TITLE = "Automated inspection of IC wafer contamination",
        JOURNAL = PR,
        VOLUME = "34",
        YEAR = "2001",
        NUMBER = "6",
        MONTH = "June",
        PAGES = "1307-1317",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253741"}

@article{bb258928,
        AUTHOR = "van Dop, E.R. and Regtien, P.P.L.",
        TITLE = "Multi-sensor recognition of electronic components",
        JOURNAL = MVA,
        VOLUME = "12",
        YEAR = "2001",
        NUMBER = "5",
        PAGES = "213-222",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253742"}

@article{bb258929,
        AUTHOR = "Ye, Q.Z. and Ong, S.H. and Han, X.",
        TITLE = "A stereo vision system for the inspection of IC bonding wires",
        JOURNAL = IJIST,
        VOLUME = "11",
        YEAR = "2001",
        NUMBER = "4",
        PAGES = "254-262",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253743"}

@article{bb258930,
        AUTHOR = "Brehelin, L. and Gascuel, O. and Caraux, G.",
        TITLE = "Hidden Markov Models with Patterns to Learn Boolean Vector Sequences
and Application to the Built-In Self-Test for Integrated Circuits",
        JOURNAL = PAMI,
        VOLUME = "23",
        YEAR = "2001",
        NUMBER = "9",
        MONTH = "September",
        PAGES = "997-1008",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253744"}

@article{bb258931,
        AUTHOR = "Qu, G.Y. and Wood, S.L. and Teh, C.",
        TITLE = "Wafer Defect Detection Using Directional Morphological Gradient
Techniques",
        JOURNAL = JASP,
        VOLUME = "2002",
        YEAR = "2002",
        NUMBER = "7",
        MONTH = "July",
        PAGES = "686-703",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253745"}

@article{bb258932,
        AUTHOR = "Tobin, K.W. and Karnowski, T.P. and Arrowood, L.F. and Ferrell, R.K. and Goddard, J.S. and Lakhani, F.",
        TITLE = "Content-Based Image Retrieval for Semiconductor Process
Characterization",
        JOURNAL = JASP,
        VOLUME = "2002",
        YEAR = "2002",
        NUMBER = "7",
        MONTH = "July",
        PAGES = "704-713",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253746"}

@article{bb258933,
        AUTHOR = "Tsai, D.M. and Chou, C.C.",
        TITLE = "A fast focus measure for video display inspection",
        JOURNAL = MVA,
        VOLUME = "14",
        YEAR = "2003",
        NUMBER = "3",
        MONTH = "July",
        PAGES = "192-196",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253747"}

@article{bb258934,
        AUTHOR = "Roh, Y.J. and Park, W.S. and Cho, H.S.",
        TITLE = "Correcting image distortion in the X-ray digital tomosynthesis system
for PCB solder joint inspection",
        JOURNAL = IVC,
        VOLUME = "21",
        YEAR = "2003",
        NUMBER = "12",
        MONTH = "November",
        PAGES = "1063-1075",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253748"}

@article{bb258935,
        AUTHOR = "Baidyk, T. and Kussul, E. and Makeyev, O. and Caballero, A. and Ruiz, L. and Carrera, G. and Velasco, G.",
        TITLE = "Flat image recognition in the process of microdevice assembly",
        JOURNAL = PRL,
        VOLUME = "25",
        YEAR = "2004",
        NUMBER = "1",
        MONTH = "January",
        PAGES = "107-118",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253749"}

@article{bb258936,
        AUTHOR = "Toledo, G.K. and Kussul, E. and Baidyk, T.",
        TITLE = "Neural classifier for micro work piece recognition",
        JOURNAL = IVC,
        VOLUME = "24",
        YEAR = "2006",
        NUMBER = "8",
        MONTH = "August",
        PAGES = "827-836",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253750"}

@article{bb258937,
        AUTHOR = "Toledo, G.K. and Kussul, E. and Baidyk, T.",
        TITLE = "Work piece recognition based on the permutation neural classifier
technique",
        JOURNAL = MVA,
        VOLUME = "22",
        YEAR = "2011",
        NUMBER = "3",
        MONTH = "May",
        PAGES = "495-504",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253751"}

@article{bb258938,
        AUTHOR = "Fang, T. and Jafari, M.A. and Danforth, S.C. and Safari, A.",
        TITLE = "Signature analysis and defect detection in layered manufacturing of
ceramic sensors and actuators",
        JOURNAL = MVA,
        VOLUME = "15",
        YEAR = "2003",
        NUMBER = "2",
        MONTH = "December",
        PAGES = "63-75",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253752"}

@article{bb258939,
        AUTHOR = "Zervakis, M.E. and Goumas, S.K. and Rovithakis, G.A.",
        TITLE = "A Bayesian Framework for Multilead SMD Post-Placement Quality
Inspection",
        JOURNAL = SMC-B,
        VOLUME = "34",
        YEAR = "2004",
        NUMBER = "1",
        MONTH = "February",
        PAGES = "440-453",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253753"}

@inproceedings{bb258940,
        AUTHOR = "Goumas, S.K. and Rovithakis, G.A. and Zervakis, M.E.",
        TITLE = "A Bayesian image analysis framework for post-placement quality
inspection of components",
        BOOKTITLE = ICIP02,
        YEAR = "2002",
        PAGES = "II: 549-552",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253754"}

@article{bb258941,
        AUTHOR = "Kubota, T. and Talekar, P. and Ma, X.Y. and Sudarshan, T.S.",
        TITLE = "A nondestructive automated defect detection system for silicon carbide
wafers",
        JOURNAL = MVA,
        VOLUME = "16",
        YEAR = "2005",
        NUMBER = "3",
        MONTH = "May",
        PAGES = "170-176",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253755"}

@article{bb258942,
        AUTHOR = "di Palma, F. and de Nicolao, G. and Miraglia, G. and Pasquinetti, E. and Piccinini, F.",
        TITLE = "Unsupervised spatial pattern classification of electrical-wafer-sorting
maps in semiconductor manufacturing",
        JOURNAL = PRL,
        VOLUME = "26",
        YEAR = "2005",
        NUMBER = "12",
        MONTH = "September",
        PAGES = "1857-1865",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253756"}

@article{bb258943,
        AUTHOR = "Shankar, N.G. and Zhong, Z.W.",
        TITLE = "Improved segmentation of semiconductor defects using area sieves",
        JOURNAL = MVA,
        VOLUME = "17",
        YEAR = "2006",
        NUMBER = "1",
        MONTH = "April",
        PAGES = "1-7",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253757"}

@article{bb258944,
        AUTHOR = "Lin, H.D.",
        TITLE = "Tiny surface defect inspection of electronic passive components using
discrete cosine transform decomposition and cumulative sum techniques",
        JOURNAL = IVC,
        VOLUME = "26",
        YEAR = "2008",
        NUMBER = "5",
        MONTH = "May",
        PAGES = "603-621",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253758"}

@article{bb258945,
        AUTHOR = "Watanabe, T. and Kusano, A. and Fujiwara, T. and Koshimizu, H.",
        TITLE = "3D Precise Inspection of Terminal Lead for Electronic Devices by Single
Camera Stereo Vision",
        JOURNAL = IEICE,
        VOLUME = "E91-D",
        YEAR = "2008",
        NUMBER = "7",
        MONTH = "July",
        PAGES = "1885-1892",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253759"}

@inproceedings{bb258946,
        AUTHOR = "Kusano, A. and Watanabe, T. and Funahashi, T. and Koshimizu, H.",
        TITLE = "Defect detection of terminal lead by single stereo vision",
        BOOKTITLE = FCV13,
        YEAR = "2013",
        PAGES = "237-241",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253760"}

@article{bb258947,
        AUTHOR = "Last, M. and Kandel, A.",
        TITLE = "Perception-based Analysis Of Engineering Experiments In The
Semiconductor Industry",
        JOURNAL = IJIG,
        VOLUME = "2",
        YEAR = "2002",
        NUMBER = "1",
        MONTH = "January",
        PAGES = "107-126",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253761"}

@article{bb258948,
        AUTHOR = "Ng, A.N.Y. and Lam, E.Y. and Chung, R. and Fung, K.S.M. and Leung, W.H.",
        TITLE = "Reference-free Machine Vision Inspection Of Semiconductor Die Images",
        JOURNAL = IJIG,
        VOLUME = "9",
        YEAR = "2009",
        NUMBER = "1",
        MONTH = "January",
        PAGES = "133-152",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253762"}

@article{bb258949,
        AUTHOR = "Chen, C.S. and Yeh, C.W. and Yin, P.Y.",
        TITLE = "A novel Fourier descriptor based image alignment algorithm for
automatic optical inspection",
        JOURNAL = JVCIR,
        VOLUME = "20",
        YEAR = "2009",
        NUMBER = "3",
        MONTH = "April",
        PAGES = "178-189",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253763"}

@article{bb258950,
        AUTHOR = "Chang, C.Y. and Li, C.H. and Lin, S.Y. and Jeng, M.",
        TITLE = "Application of Two Hopfield Neural Networks for Automatic Four-Element
LED Inspection",
        JOURNAL = SMC-C,
        VOLUME = "39",
        YEAR = "2009",
        NUMBER = "3",
        MONTH = "May",
        PAGES = "352-365",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253764"}

@article{bb258951,
        AUTHOR = "Tsai, D.M. and Chang, C.C. and Chao, S.M.",
        TITLE = "Micro-crack inspection in heterogeneously textured solar wafers using
anisotropic diffusion",
        JOURNAL = IVC,
        VOLUME = "28",
        YEAR = "2010",
        NUMBER = "3",
        MONTH = "March",
        PAGES = "491-501",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253765"}

@article{bb258952,
        AUTHOR = "Zontak, M. and Cohen, I.",
        TITLE = "Defect detection in patterned wafers using anisotropic kernels",
        JOURNAL = MVA,
        VOLUME = "21",
        YEAR = "2010",
        NUMBER = "2",
        MONTH = "February",
        PAGES = "xx-yy",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253766"}

@article{bb258953,
        AUTHOR = "Sun, T.H. and Tseng, C.C. and Chen, M.S.",
        TITLE = "Electric contacts inspection using machine vision",
        JOURNAL = IVC,
        VOLUME = "28",
        YEAR = "2010",
        NUMBER = "6",
        MONTH = "June",
        PAGES = "890-901",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253767"}

@article{bb258954,
        AUTHOR = "Fan, S.K.S. and Chuang, Y.C.A.",
        TITLE = "Automatic detection of Mura defect in TFT-LCD based on regression
diagnostics",
        JOURNAL = PRL,
        VOLUME = "31",
        YEAR = "2010",
        NUMBER = "15",
        MONTH = "November",
        PAGES = "2397-2404",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253768"}

@article{bb258955,
        AUTHOR = "Zhang, J. and Kim, Y. and Yang, S.H. and Milster, T.D.",
        TITLE = "Illumination artifacts in hyper-NA vector imaging",
        JOURNAL = JOSA-A,
        VOLUME = "27",
        YEAR = "2010",
        NUMBER = "10",
        MONTH = "October",
        PAGES = "2272-2284",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253769"}

@article{bb258956,
        AUTHOR = "He, X.F. and Fang, F.",
        TITLE = "Flat-Panel Color Filter Inspection",
        JOURNAL = VisSys,
        VOLUME = "16",
        YEAR = "2011",
        NUMBER = "5",
        MONTH = "May",
        PAGES = "xx-yy",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253770"}

@article{bb258957,
        AUTHOR = "Benedek, C.",
        TITLE = "Detection of soldering defects in Printed Circuit Boards with
Hierarchical Marked Point Processes",
        JOURNAL = PRL,
        VOLUME = "32",
        YEAR = "2011",
        NUMBER = "13",
        MONTH = "October",
        PAGES = "1535-1543",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253771"}

@article{bb258958,
        AUTHOR = "Peng, Y. and Zhang, J.Y. and Wang, Y. and Yu, Z.P.",
        TITLE = "Gradient-Based Source and Mask Optimization in Optical Lithography",
        JOURNAL = IP,
        VOLUME = "20",
        YEAR = "2011",
        NUMBER = "10",
        MONTH = "October",
        PAGES = "2856-2864",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253772"}

@article{bb258959,
        AUTHOR = "Long, T. and Wang, H. and Long, B.",
        TITLE = "Test generation algorithm for analog systems based on support vector
machine",
        JOURNAL = SIViP,
        VOLUME = "5",
        YEAR = "2011",
        NUMBER = "4",
        MONTH = "November",
        PAGES = "527-533",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253773"}

@article{bb258960,
        AUTHOR = "Ibrahim, A. and Tominaga, S. and Horiuchi, T.",
        TITLE = "Invariant representation for spectral reflectance images and its
application",
        JOURNAL = JIVP,
        VOLUME = "2011",
        YEAR = "2011",
        NUMBER = "1 2011",
        PAGES = "xx-yy",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253774"}

@inproceedings{bb258961,
        AUTHOR = "Ibrahim, A. and Tominaga, S. and Horiuchi, T.",
        TITLE = "Spectral Invariant Representation for Spectral Reflectance Image",
        BOOKTITLE = ICPR10,
        YEAR = "2010",
        PAGES = "2776-2779",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253775"}

@inproceedings{bb258962,
        AUTHOR = "Ibrahim, A. and Tominaga, S. and Horiuchi, T.",
        TITLE = "Material Classification for Printed Circuit Boards by Spectral Imaging
System",
        BOOKTITLE = CCIW09,
        YEAR = "2009",
        PAGES = "216-225",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253776"}

@inproceedings{bb258963,
        AUTHOR = "Horiuchi, T. and Ibrahim, A. and Kadoi, H. and Tominaga, S.",
        TITLE = "An Effective Method for Illumination-Invariant Representation of Color
Images",
        BOOKTITLE = Color12,
        YEAR = "2012",
        PAGES = "II: 401-410",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253777"}

@inproceedings{bb258964,
        AUTHOR = "Ibrahim, A. and Horiuchi, T. and Tominaga, S.",
        TITLE = "Illumination-invariant representation for natural color images and its
application",
        BOOKTITLE = Southwest12,
        YEAR = "2012",
        PAGES = "157-160",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253778"}

@inproceedings{bb258965,
        AUTHOR = "Tominaga, S. and Okamoto, S.",
        TITLE = "Reflectance-based material classification for printed circuit boards",
        BOOKTITLE = CIAP03,
        YEAR = "2003",
        PAGES = "238-243",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253779"}

@inproceedings{bb258966,
        AUTHOR = "Horiuchi, T. and Suzuki, Y. and Tominaga, S.",
        TITLE = "Material Classification for Printed Circuit Boards by Kernel Fisher
Discriminant Analysis",
        BOOKTITLE = CCIW11,
        YEAR = "2011",
        PAGES = "152-164",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253780"}

@article{bb258967,
        AUTHOR = "Choy, S.K. and Jia, N.N. and Tong, C.S. and Tang, M.L. and Lam, E.Y.",
        TITLE = "A Robust Computational Algorithm for Inverse Photomask Synthesis in
Optical Projection Lithography",
        JOURNAL = SIIMS,
        VOLUME = "5",
        YEAR = "2012",
        NUMBER = "1 2012",
        PAGES = "625-651",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253781"}

@inproceedings{bb258968,
        AUTHOR = "Jia, N.N. and Lam, E.Y.",
        TITLE = "Stochastic gradient descent for robust inverse photomask synthesis in
optical lithography",
        BOOKTITLE = ICIP10,
        YEAR = "2010",
        PAGES = "4173-4176",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253782"}

@article{bb258969,
        AUTHOR = "Yu, J.C. and Yu, P. and Chao, H.Y.",
        TITLE = "Library-Based Illumination Synthesis for Critical CMOS Patterning",
        JOURNAL = IP,
        VOLUME = "22",
        YEAR = "2013",
        NUMBER = "7",
        PAGES = "2811-2821",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253783"}

@article{bb258970,
        AUTHOR = "Xu, S. and Cheng, Z. and Gao, Y. and Pan, Q.",
        TITLE = "Visual wafer dies counting using geometrical characteristics",
        JOURNAL = IET-IPR,
        VOLUME = "8",
        YEAR = "2014",
        NUMBER = "5",
        MONTH = "May",
        PAGES = "280-288",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253784"}

@article{bb258971,
        AUTHOR = "Duan, G.F. and Wang, H.C. and Liu, Z.Y. and Tan, J.R. and Chen, Y.W.",
        TITLE = "Automatic optical phase identification of micro-drill bits based on
improved ASM and bag of shape segment in PCB production",
        JOURNAL = MVA,
        VOLUME = "25",
        YEAR = "2014",
        NUMBER = "6",
        PAGES = "1411-1422",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253785"}

@article{bb258972,
        AUTHOR = "Leibovici, M.C.R. and Gaylord, T.K.",
        TITLE = "Custom-modified three-dimensional periodic microstructures by
pattern-integrated interference lithography",
        JOURNAL = JOSA-A,
        VOLUME = "31",
        YEAR = "2014",
        NUMBER = "7",
        MONTH = "July",
        PAGES = "1515-1519",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253786"}

@article{bb258973,
        AUTHOR = "Estellers, V. and Thiran, J.P. and Gabrani, M.",
        TITLE = "Surface Reconstruction From Microscopic Images in Optical Lithography",
        JOURNAL = IP,
        VOLUME = "23",
        YEAR = "2014",
        NUMBER = "8",
        MONTH = "August",
        PAGES = "3560-3573",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253787"}

@article{bb258974,
        AUTHOR = "Bernal, F. and Acebron, J.A. and Anjam, I.",
        TITLE = "A Stochastic Algorithm Based on Fast Marching for Automatic
Capacitance Extraction in Non-Manhattan Geometries",
        JOURNAL = SIIMS,
        VOLUME = "7",
        YEAR = "2014",
        NUMBER = "4",
        PAGES = "2657-2674",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253788"}

@article{bb258975,
        AUTHOR = "Lakhssassi, A. and Palenychka, R. and Savaria, Y. and Sayde, M. and Zaremba, M.",
        TITLE = "Monitoring Thermal Stress in Wafer-Scale Integrated Circuits by the
Attentive Vision Method Using an Infrared Camera",
        JOURNAL = CirSysVideo,
        VOLUME = "26",
        YEAR = "2016",
        NUMBER = "2",
        MONTH = "February",
        PAGES = "412-424",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253789"}

@article{bb258976,
        AUTHOR = "Chebolu, A. and Nagahanumaiah",
        TITLE = "Contact angle measurement techniques on micro-patterned surfaces:
A comparative analysis",
        JOURNAL = IJCVR,
        VOLUME = "7",
        YEAR = "2017",
        NUMBER = "1/2",
        PAGES = "148-159",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253790"}

@article{bb258977,
        AUTHOR = "Sindagi, V.A. and Srivastava, S.",
        TITLE = "Domain Adaptation for Automatic OLED Panel Defect Detection Using
Adaptive Support Vector Data Description",
        JOURNAL = IJCV,
        VOLUME = "122",
        YEAR = "2017",
        NUMBER = "2",
        MONTH = "April",
        PAGES = "193-211",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253791"}

@article{bb258978,
        AUTHOR = "Qiao, K. and Zeng, L. and Chen, J. and Hai, J.J. and Yan, B.",
        TITLE = "Wire segmentation for printed circuit board using deep convolutional
neural network and graph cut model",
        JOURNAL = IET-IPR,
        VOLUME = "12",
        YEAR = "2018",
        NUMBER = "5",
        MONTH = "May",
        PAGES = "793-800",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253792"}

@article{bb258979,
        AUTHOR = "Boscaro, A. and Jacquir, S. and Chef, S. and Sanchez, K. and Perdu, P. and Binczak, S.",
        TITLE = "Automatic localization of signal sources in photon emission images for
integrated circuit analysis",
        JOURNAL = SIViP,
        VOLUME = "12",
        YEAR = "2018",
        NUMBER = "4",
        MONTH = "May",
        PAGES = "775-782",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253793"}

@article{bb258980,
        AUTHOR = "Kaur, B. and Kaur, G. and Kaur, A.",
        TITLE = "Detection of defective printed circuit boards using image processing",
        JOURNAL = IJCVR,
        VOLUME = "8",
        YEAR = "2018",
        NUMBER = "4",
        PAGES = "418-434",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253794"}

@article{bb258981,
        AUTHOR = "Ashikin, F. and Hashizume, M. and Yotsuyanagi, H. and Lu, S.K. and Roth, Z.",
        TITLE = "A Design for Testability of Open Defects at Interconnects in 3D Stacked
ICs",
        JOURNAL = IEICE,
        VOLUME = "E101-D",
        YEAR = "2018",
        NUMBER = "8",
        MONTH = "August",
        PAGES = "2053-2063",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253795"}

@article{bb258982,
        AUTHOR = "Cheng, D. and Shi, Y.Q. and Gwee, B.H. and Toh, K.A. and Lin, T.",
        TITLE = "A Hierarchical Multiclassifier System for Automated Analysis of
Delayered IC Images",
        JOURNAL = IEEE_Int_Sys,
        VOLUME = "34",
        YEAR = "2019",
        NUMBER = "2",
        MONTH = "March",
        PAGES = "36-43",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253796"}

@article{bb258983,
        AUTHOR = "Han, H. and Gao, C.Q. and Zhao, Y. and Liao, S.S. and Tang, L. and Li, X.D.",
        TITLE = "Polycrystalline silicon wafer defect segmentation based on deep
convolutional neural networks",
        JOURNAL = PRL,
        VOLUME = "130",
        YEAR = "2020",
        PAGES = "234-241",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253797"}

@article{bb258984,
        AUTHOR = "Shen, J.Q. and Liu, N.Z. and Sun, H.",
        TITLE = "Defect detection of printed circuit board based on lightweight deep
convolution network",
        JOURNAL = IET-IPR,
        VOLUME = "14",
        YEAR = "2020",
        NUMBER = "15",
        MONTH = "December",
        PAGES = "3932-3940",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253798"}

@article{bb258985,
        AUTHOR = "Mitic, V. and Serpa, C. and Ilic, I. and Mohr, M. and Fecht, H.J.",
        TITLE = "Fractal Nature of Advanced Ni-Based Superalloys Solidified on Board
the International Space Station",
        JOURNAL = RS,
        VOLUME = "13",
        YEAR = "2021",
        NUMBER = "9",
        PAGES = "xx-yy",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253799"}

@article{bb258986,
        AUTHOR = "Frittoli, L. and Carrera, D. and Rossi, B. and Fragneto, P. and Boracchi, G.",
        TITLE = "Deep open-set recognition for silicon wafer production monitoring",
        JOURNAL = PR,
        VOLUME = "124",
        YEAR = "2022",
        PAGES = "108488",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253800"}

@article{bb258987,
        AUTHOR = "Pan, J.W. and Zeng, D.Y. and Tan, Q. and Wu, Z.Z. and Ren, Z.G.",
        TITLE = "EU-Net: A novel semantic segmentation architecture for surface defect
detection of mobile phone screens",
        JOURNAL = IET-IPR,
        VOLUME = "16",
        YEAR = "2022",
        NUMBER = "10",
        PAGES = "2568-2576",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253801"}

@article{bb258988,
        AUTHOR = "Lin, G. and Kong, L.F. and Liu, T.J. and Qiu, L. and Chen, X.Y.",
        TITLE = "An antagonistic training algorithm for TFT-LCD module mura defect
detection",
        JOURNAL = SP:IC,
        VOLUME = "107",
        YEAR = "2022",
        PAGES = "116791",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253802"}

@article{bb258989,
        AUTHOR = "Liu, Q.P. and Wang, M.K. and Wang, H.X. and Hanajima, N.",
        TITLE = "MPGI-Terminal defect detection based on M-FRCNN",
        JOURNAL = IET-IPR,
        VOLUME = "17",
        YEAR = "2023",
        NUMBER = "2",
        PAGES = "428-438",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253803"}

@article{bb258990,
        AUTHOR = "Kim, B.J. and Choi, H. and Jang, H. and Lee, D.G. and Jeong, W. and Kim, S.W.",
        TITLE = "Dead pixel test using effective receptive field",
        JOURNAL = PRL,
        VOLUME = "167",
        YEAR = "2023",
        PAGES = "149-156",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253804"}

@article{bb258991,
        AUTHOR = "Wang, Y.T. and Wang, J.G. and Cao, Y.S. and Li, S.X. and Kwan, O.",
        TITLE = "Integrated Inspection on PCB Manufacturing in Cyber-Physical-Social
Systems",
        JOURNAL = SMCS,
        VOLUME = "53",
        YEAR = "2023",
        NUMBER = "4",
        MONTH = "April",
        PAGES = "2098-2106",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253805"}

@article{bb258992,
        AUTHOR = "Zhao, J. and Zhu, B.L. and Peng, M. and Li, L.L.",
        TITLE = "Mobile phone screen surface scratch detection based on optimized
YOLOv5 model (OYm)",
        JOURNAL = IET-IPR,
        VOLUME = "17",
        YEAR = "2023",
        NUMBER = "5",
        PAGES = "1364-1374",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253806"}

@article{bb258993,
        AUTHOR = "Boubaker, S. and Kamel, S. and Ghazouani, N. and Mellit, A.",
        TITLE = "Assessment of Machine and Deep Learning Approaches for Fault
Diagnosis in Photovoltaic Systems Using Infrared Thermography",
        JOURNAL = RS,
        VOLUME = "15",
        YEAR = "2023",
        NUMBER = "6",
        PAGES = "1686",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253807"}

@article{bb258994,
        AUTHOR = "He, F. and Tan, J. and Wang, W.B. and Liu, S. and Zhu, Y. and Liu, Z.J.",
        TITLE = "EFFNet: Element-wise feature fusion network for defect detection of
display panels",
        JOURNAL = SP:IC,
        VOLUME = "119",
        YEAR = "2023",
        PAGES = "117043",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253808"}

@article{bb258995,
        AUTHOR = "Song, B.J. and Qiao, K. and Yang, J. and Shi, S. and Chen, J. and Yan, B.",
        TITLE = "An active learning method based on result quality evaluation for
printed circuit board computed tomography image segmentation",
        JOURNAL = IET-IPR,
        VOLUME = "17",
        YEAR = "2023",
        NUMBER = "13",
        PAGES = "3688-3701",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253809"}

@article{bb258996,
        AUTHOR = "Ng, C.C. and Lin, C.T. and Tan, Z.Q. and Wang, X.Y. and Kew, J.L. and Chan, C.S. and Zach, C.",
        TITLE = "When IC meets text: Towards a rich annotated integrated circuit text
dataset",
        JOURNAL = PR,
        VOLUME = "147",
        YEAR = "2024",
        PAGES = "110124",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253810"}

@article{bb258997,
        AUTHOR = "Tan, Z.T. and Mu, Y.D.",
        TITLE = "Hierarchical reinforcement learning for chip-macro placement in
integrated circuit",
        JOURNAL = PRL,
        VOLUME = "179",
        YEAR = "2024",
        PAGES = "108-114",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253811"}

@article{bb258998,
        AUTHOR = "Wang, X. and Zhang, H.Y. and Liu, Q. and Gong, W. and Bai, S. and You, H.",
        TITLE = "You-Only-Look-Once Multiple-Strategy Printed Circuit Board Defect
Detection Model",
        JOURNAL = MultMedMag,
        VOLUME = "31",
        YEAR = "2024",
        NUMBER = "1",
        MONTH = "January",
        PAGES = "76-87",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253812"}

@article{bb258999,
        AUTHOR = "Deng, S.X. and Deng, L. and Meng, X.Z. and Sun, T. and Chen, B. and Chen, Z.X. and Hu, H. and Xie, Y. and Yin, H.X. and Yu, S.J.",
        TITLE = "EHIR: Energy-based Hierarchical Iterative Image Registration for
Accurate PCB Defect Detection",
        JOURNAL = PRL,
        VOLUME = "185",
        YEAR = "2024",
        PAGES = "38-44",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253813"}