@article{bb259000,
AUTHOR = "Shen, J. and Lyu, S. and Lu, Y.",
TITLE = "LithoPW: Leveraging Visual Memory Encoding and Defect-Aware
Optimization for Precise Determination of the Lithography Process
Windows",
JOURNAL = CirSysVideo,
VOLUME = "34",
YEAR = "2024",
NUMBER = "10",
MONTH = "October",
PAGES = "9298-9310",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253814"}
@article{bb259001,
AUTHOR = "Sugisaka, J.I. and Yasui, T. and Hirayama, K.",
TITLE = "Design of an optical linear discriminant filter for classification of
subwavelength concave and convex defects on dielectric substrates",
JOURNAL = JOSA-A,
VOLUME = "39",
YEAR = "2022",
NUMBER = "3",
MONTH = "March",
PAGES = "342-351",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253815"}
@article{bb259002,
AUTHOR = "Sharma, M. and Saripalli, S.R. and Gupta, A.K. and Palta, P. and Pandey, D.",
TITLE = "Image Processing-Based Method of Evaluation of Stress from Grain
Structures of Through Silicon Via (TSV)",
JOURNAL = IJIG,
VOLUME = "25",
YEAR = "2025",
NUMBER = "2",
MONTH = "March",
PAGES = "2550008",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253816"}
@article{bb259003,
AUTHOR = "Kim, J.H. and Kwon, G.R.",
TITLE = "Efficient Classification of Photovoltaic Module Defects in Infrared
Images",
JOURNAL = SPLetters,
VOLUME = "32",
YEAR = "2025",
PAGES = "2389-2393",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253817"}
@article{bb259004,
AUTHOR = "Shi, P. and Li, X.Q. and Feng, Z.M. and Shang, X.W.",
TITLE = "Mobile phone screen defect detection based on improved YOLOv8n
network",
JOURNAL = PRL,
VOLUME = "196",
YEAR = "2025",
PAGES = "72-78",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253818"}
@article{bb259005,
AUTHOR = "Tang, M.J. and Tu, J. and Zhou, P. and Wong, K.K.L.",
TITLE = "An asymmetric teacher-student network based industrial vision model
for abnormal grain detection of semiconductor cooling devices",
JOURNAL = PRL,
VOLUME = "197",
YEAR = "2025",
PAGES = "288-296",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253819"}
@article{bb259006,
AUTHOR = "Cheng, H. and Yu, C.Z. and Zhang, Y. and Yuan, Z.W. and Zhang, C.G.",
TITLE = "EAL-ICNet: Enhanced Attention Lightweight Network with Multi-Scale
Transformer Modules for IC Image Segmentation",
JOURNAL = SPLetters,
VOLUME = "33",
YEAR = "2026",
PAGES = "1926-1930",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253820"}
@article{bb259007,
AUTHOR = "Zhong, Z.Y. and Wang, H.X. and Zhou, C.S. and Kang, H. and Zhao, J.N. and Hu, Y.M.",
TITLE = "Structure-preserving surface defect detection for flexible integrated
circuit substrates",
JOURNAL = IVC,
VOLUME = "171",
YEAR = "2026",
PAGES = "106007",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253821"}
@article{bb259008,
AUTHOR = "Yu, R. and Zhao, Z.M. and Zhen, S.",
TITLE = "Auxiliary Information Flow for 3D Industrial Defect Detection on IC
Ceramic Package Substrate Surfaces: Dataset and Benchmark",
JOURNAL = CirSysVideo,
VOLUME = "36",
YEAR = "2026",
NUMBER = "6",
MONTH = "June",
PAGES = "7444-7456",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253822"}
@article{bb259009,
AUTHOR = "Guo, B.Y. and Wang, Y.T. and Yu, R.",
TITLE = "EDNet: Zero-shot classification for ceramic package substrates
surface defect with embedding diffusion network",
JOURNAL = PR,
VOLUME = "179",
YEAR = "2026",
PAGES = "113811",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253823"}
@article{bb259010,
AUTHOR = "He, T.F. and Mao, Z.Y. and Zhong, Y.C.",
TITLE = "An Improved YOLOv8n Method for Small Thermal Defect Detection of
Photovoltaic Modules in UAV Infrared Inspection",
JOURNAL = RS,
VOLUME = "18",
YEAR = "2026",
NUMBER = "12",
PAGES = "1986",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253824"}
@article{bb259011,
AUTHOR = "Wang, Y.T. and Hu, Z. and Peng, X. and Sun, C.H. and Jia, Z.W.",
TITLE = "Infrared-Visible Multi-Sensor Fusion for UAV Photovoltaic Defect
Detection Under Real-World Weak Misalignment",
JOURNAL = RS,
VOLUME = "18",
YEAR = "2026",
NUMBER = "15",
PAGES = "2607",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253825"}
@article{bb259012,
AUTHOR = "Ke, J.J. and He, L. and Zhang, J. and Wang, H.M. and Ji, Y.Q. and Chen, H. and Li, J. and Zhao, S.C. and Ding, G. and Gao, X.B.",
TITLE = "DINO-PCB: Two-stage vision foundation model pretraining and
distillation for real-time circuit-board defect detection",
JOURNAL = PR,
VOLUME = "180",
YEAR = "2026",
PAGES = "114338",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253826"}
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AUTHOR = "Hoang, T.H. and Hoang, Q.V. and Pham, N.T. and Le, T.H.",
TITLE = "DVKL-Net: An efficient framework for lightweight printed circuit
board defect detection under unfavorable lighting conditions",
JOURNAL = JVCIR,
VOLUME = "120",
YEAR = "2026",
PAGES = "104910",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253827"}
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AUTHOR = "Li, D.Y. and Su, B. and Zhang, H. and Li, Y. and Chen, H.Y.",
TITLE = "Photovoltaic Defect Image Generator With Boundary Alignment Smoothing
Constraint for Domain Shift Mitigation",
JOURNAL = MultMed,
VOLUME = "28",
YEAR = "2026",
PAGES = "8481-8493",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253828"}
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AUTHOR = "Oh, S. and Jang, Y.J. and Kim, J.",
TITLE = "Robust Estimation of Bump Height for Wafer-Level Packaging Using
Optical Triangulation",
BOOKTITLE = ICIP25,
YEAR = "2025",
PAGES = "2516-2521",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT253829"}
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TITLE = "The Surface Defect Detection of Chip Images Based on the Improved
FCOS with SENet",
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PAGES = "280-285",
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AUTHOR = "Hasegawa, J. and Izumi, T.",
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YEAR = "2024",
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AUTHOR = "Zeng, Q. and Zhao, C. and He, P.F. and Gao, H.C.",
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Circuit Board",
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AUTHOR = "Ren, H.A. and Tian, M.K. and Zhang, G.W. and Zhou, W.",
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BOOKTITLE = ICIP24,
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connectivity and image correlation",
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