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        TITLE = "A New Region-Based Minimal Path Selection Algorithm for Crack
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        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254522"}

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        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254523"}

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        TITLE = "Multi-scale attention and dilation network for small defect detection",
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        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254524"}

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        AUTHOR = "Mao, W.S. and Li, L.S. and Tao, Y.F. and Zhou, W.Y.",
        TITLE = "Surface Defect Image Classification of Lithium Battery Pole Piece Based
on Deep Learning",
        JOURNAL = IEICE,
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        YEAR = "2023",
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        MONTH = "September",
        PAGES = "1546-1555",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254525"}

@article{bb259705,
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        TITLE = "Cross-project defect prediction based on G-LSTM model",
        JOURNAL = PRL,
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@article{bb259706,
        AUTHOR = "Inoue, Y. and Nagayoshi, H.",
        TITLE = "Weakly-Supervised Crack Detection",
        JOURNAL = ITS,
        VOLUME = "24",
        YEAR = "2023",
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        PAGES = "12050-12061",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254527"}

@article{bb259707,
        AUTHOR = "Chen, F.Q. and Deng, M. and Gao, H. and Yang, X.Y. and Zhang, D.",
        TITLE = "NHD-YOLO: Improved YOLOv8 using optimized neck and head for product
surface defect detection with data augmentation",
        JOURNAL = IET-IPR,
        VOLUME = "18",
        YEAR = "2024",
        NUMBER = "7",
        PAGES = "1915-1926",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254528"}

@article{bb259708,
        AUTHOR = "Chen, H. and Qiu, J.L. and Gao, D.P. and Qian, L.M. and Li, X.J.",
        TITLE = "Research on surface defect detection model of steel strip based on
MFFA-YOLOv5",
        JOURNAL = IET-IPR,
        VOLUME = "18",
        YEAR = "2024",
        NUMBER = "8",
        PAGES = "2105-2113",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254529"}

@article{bb259709,
        AUTHOR = "Zhang, P.C. and Zheng, P.X. and Guo, X. and Chen, E.Q.",
        TITLE = "Few-shot defect classification via feature aggregation based on graph
neural network",
        JOURNAL = JVCIR,
        VOLUME = "101",
        YEAR = "2024",
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        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254530"}

@article{bb259710,
        AUTHOR = "Li, H. and Chang, X. and Hao, J.",
        TITLE = "Hydraulic Fracturing Shear/Tensile/Compressive Crack Investigation
Using Microseismic Data",
        JOURNAL = RS,
        VOLUME = "16",
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        NUMBER = "11",
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        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254531"}

@article{bb259711,
        AUTHOR = "Zhao, L.Y. and Wu, Y.Q. and Yuan, Y. and Tong, K.",
        TITLE = "MACN: A cascade defect detection for complex background based on
mixture attention mechanism",
        JOURNAL = IET-IPR,
        VOLUME = "18",
        YEAR = "2024",
        NUMBER = "9",
        PAGES = "2434-2448",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254532"}

@article{bb259712,
        AUTHOR = "Hu, Z.Q. and Chu, H. and Zhang, Y.Z. and Shan, D.X. and Shen, Y.",
        TITLE = "Self-supervised assisted multi-task learning network for one-shot
defect segmentation with fake defect generation",
        JOURNAL = PRL,
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        AUTHOR = "Dong, P. and Wang, Y.S. and Yu, Q. and Feng, W.H. and Zong, G.H.",
        TITLE = "AMC-YOLO: Improved YOLOv8-based defect detection for cigarette packs",
        JOURNAL = IET-IPR,
        VOLUME = "18",
        YEAR = "2024",
        NUMBER = "14",
        PAGES = "4873-4886",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254534"}

@article{bb259714,
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        AUTHOR = "Zhang, G.W. and Lu, Y. and Jiang, X.H. and Yan, F. and Xu, M.L.",
        TITLE = "Industrial product quality assessment using deep learning with defect
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        JOURNAL = PRL,
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        AUTHOR = "Liang, X. and Sun, J.S. and Wang, X.W. and Li, J. and Zhang, L.P. and Guo, J.B.",
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multimodal imaging system and a deep encoder-decoder network",
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        NUMBER = "6",
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        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254537"}

@article{bb259717,
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        TITLE = "An explainable super-resolution visual method for micro-crack image
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        YEAR = "2025",
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        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254538"}

@inproceedings{bb259718,
        AUTHOR = "Meng, Y. and Wu, H.T. and Niu, B.Q.",
        TITLE = "Research on intelligent recognition method of tunnel lining cracks
based on small objective recognition algorithm",
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@article{bb259719,
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        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254540"}

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@article{bb259724,
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@article{bb259727,
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@article{bb259728,
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        NUMBER = "1",
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@article{bb259732,
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@inproceedings{bb259744,
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@inproceedings{bb259745,
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@inproceedings{bb259746,
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@inproceedings{bb259747,
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@inproceedings{bb259748,
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@inproceedings{bb259749,
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@inproceedings{bb259750,
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@inproceedings{bb259751,
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@inproceedings{bb259752,
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@inproceedings{bb259753,
        AUTHOR = "Cogranne, R.",
        TITLE = "Detectability of Defects in the Presence of Linear Nuisance
Parameters and Images Signal-Dependent Noise",
        BOOKTITLE = ICIP24,
        YEAR = "2024",
        PAGES = "1357-1363",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254574"}

@inproceedings{bb259754,
        AUTHOR = "Benz, C. and Rodehorst, V.",
        TITLE = "MVCrackViT: Robust Multi-View Crack Detection For Point Cloud
Segmentation Using View Attention",
        BOOKTITLE = ICIP24,
        YEAR = "2024",
        PAGES = "3443-3449",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254575"}

@inproceedings{bb259755,
        AUTHOR = "Banerjee, P. and Saxena, P. and Kalimullah, N.M.M. and Shelke, A. and Habib, A.",
        TITLE = "Damage Detection and Localization by Learning Deep Features of
Elastic Waves in Piezoelectric Ceramic Using Point Contact Method",
        BOOKTITLE = Materials24,
        YEAR = "2024",
        PAGES = "63-70",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254576"}

@inproceedings{bb259756,
        AUTHOR = "Benz, C. and Rodehorst, V.",
        TITLE = "Omni-Crack30k: A Benchmark for Crack Segmentation and the Reasonable
Effectiveness of Transfer Learning",
        BOOKTITLE = VAND24,
        YEAR = "2024",
        PAGES = "3876-3886",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254577"}

@inproceedings{bb259757,
        AUTHOR = "Chen, Z.Z. and Lai, Z. and Chen, J. and Li, J.Q.",
        TITLE = "Mind marginal non-crack regions: Clustering-inspired representation
learning for crack segmentation",
        BOOKTITLE = CVPR24,
        YEAR = "2024",
        PAGES = "12698-12708",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254578"}

@inproceedings{bb259758,
        AUTHOR = "Chen, Z.Z. and Zhang, J. and Lai, Z.N. and Zhu, G.M. and Liu, Z. and Chen, J. and Li, J.Q.",
        TITLE = "The Devil is in the Crack Orientation: A New Perspective for Crack
Detection",
        BOOKTITLE = ICCV23,
        YEAR = "2023",
        PAGES = "6630-6640",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254579"}

@inproceedings{bb259759,
        AUTHOR = "Tao, H.Q. and Liu, B.X. and Cui, J.Q. and Zhang, H.",
        TITLE = "A Convolutional-Transformer Network for Crack Segmentation with
Boundary Awareness",
        BOOKTITLE = ICIP23,
        YEAR = "2023",
        PAGES = "86-90",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254580"}

@inproceedings{bb259760,
        AUTHOR = "Lei, J.R. and Hu, X.B. and Wang, Y. and Liu, D.",
        TITLE = "PyramidFlow: High-Resolution Defect Contrastive Localization Using
Pyramid Normalizing Flow",
        BOOKTITLE = CVPR23,
        YEAR = "2023",
        PAGES = "14143-14152",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254581"}

@inproceedings{bb259761,
        AUTHOR = "Lee, X.Y. and Vidyaratne, L. and Alam, M. and Farahat, A. and Ghosh, D. and Diaz, T.G. and Gupta, C.",
        TITLE = "XDNet: A Few-Shot Meta-Learning Approach for Cross-Domain Visual
Inspection",
        BOOKTITLE = VISION23,
        YEAR = "2023",
        PAGES = "4375-4384",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254582"}

@inproceedings{bb259762,
        AUTHOR = "Liu, W.Z. and Liu, C. and Liu, Q. and Yu, D.",
        TITLE = "Assigned MURA Defect Generation Based on Diffusion Model",
        BOOKTITLE = VISION23,
        YEAR = "2023",
        PAGES = "4395-4402",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254583"}

@inproceedings{bb259763,
        AUTHOR = "Xu, L. and Zou, H. and Okatani, T.",
        TITLE = "How Do Label Errors Affect Thin Crack Detection by DNNs",
        BOOKTITLE = VISION23,
        YEAR = "2023",
        PAGES = "4414-4423",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254584"}

@inproceedings{bb259764,
        AUTHOR = "Kulkarni, S. and Singh, S. and Balakrishnan, D. and Sharma, S. and Devunuri, S. and Korlapati, S.C.R.",
        TITLE = "Crackseg9k: A Collection and Benchmark for Crack Segmentation Datasets
and Frameworks",
        BOOKTITLE = CVCivil22,
        YEAR = "2022",
        PAGES = "179-195",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254585"}

@inproceedings{bb259765,
        AUTHOR = "Zhang, X. and Huang, H.F.",
        TITLE = "LightAUNet: A Lightweight Fusing Attention Based UNet for Crack
Detection",
        BOOKTITLE = ICIVC22,
        YEAR = "2022",
        PAGES = "178-182",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254586"}

@inproceedings{bb259766,
        AUTHOR = "Orti, J. and Moreno Noguer, F. and Puig, V.",
        TITLE = "Guided-Crop Image Augmentation for Small Defect Classification",
        BOOKTITLE = "ICPR22",
        YEAR = "2022",
        PAGES = "104-110",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254587"}

@inproceedings{bb259767,
        AUTHOR = "Fang, F. and Xu, Q.L. and Lim, J.H.",
        TITLE = "Hierarchical Defect Detection Based On Reinforcement Learning",
        BOOKTITLE = ICIP22,
        YEAR = "2022",
        PAGES = "791-795",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254588"}

@inproceedings{bb259768,
        AUTHOR = "Wang, B. and Zhou, H. and Luo, W.R. and Li, C.Y. and Li, Z.B. and Tian, Z.Q.",
        TITLE = "psi-Net is an Efficient Tiny Defect Detector",
        BOOKTITLE = ICIP22,
        YEAR = "2022",
        PAGES = "796-800",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254589"}

@inproceedings{bb259769,
        AUTHOR = "Chen, Z.Z. and Zhang, J. and Lai, Z. and Chen, J. and Liu, Z. and Li, J.Q.",
        TITLE = "Geometry-Aware Guided Loss for Deep Crack Recognition",
        BOOKTITLE = CVPR22,
        YEAR = "2022",
        PAGES = "4693-4702",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254590"}

@inproceedings{bb259770,
        AUTHOR = "Liu, H.J. and Miao, X.Y. and Mertz, C. and Xu, C.Z. and Kong, H.",
        TITLE = "CrackFormer: Transformer Network for Fine-Grained Crack Detection",
        BOOKTITLE = ICCV21,
        YEAR = "2021",
        PAGES = "3763-3772",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254591"}

@inproceedings{bb259771,
        AUTHOR = "Rudolph, M. and Wehrbein, T. and Rosenhahn, B. and Wandt, B.",
        TITLE = "Fully Convolutional Cross-Scale-Flows for Image-based Defect
Detection",
        BOOKTITLE = WACV22,
        YEAR = "2022",
        PAGES = "1829-1838",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254592"}

@inproceedings{bb259772,
        AUTHOR = "Park, J.H. and Chen, Y.C. and Li, Y.J. and Kitani, K.",
        TITLE = "Crack Detection and Refinement Via Deep Reinforcement Learning",
        BOOKTITLE = ICIP21,
        YEAR = "2021",
        PAGES = "529-533",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254593"}

@inproceedings{bb259773,
        AUTHOR = "Padalkar, M.G. and Beltran Gonzalez, C. and del Bue, A.",
        TITLE = "Multi-Illumination Fusion With Crack Enhancement Using
Cycle-Consistent Losses",
        BOOKTITLE = ICIP21,
        YEAR = "2021",
        PAGES = "2898-2902",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254594"}

@inproceedings{bb259774,
        AUTHOR = "Sindel, A. and Maier, A. and Christlein, V.",
        TITLE = "Craquelurenet: Matching the Crack Structure In Historical Paintings
for Multi-Modal Image Registration",
        BOOKTITLE = ICIP21,
        YEAR = "2021",
        PAGES = "994-998",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254595"}

@inproceedings{bb259775,
        AUTHOR = "Guan, Z.H. and Guo, Z.D. and Lyu, J. and Yuan, Z.",
        TITLE = "Defect Inspection using Gravitation Loss and Soft Labels",
        BOOKTITLE = ICIP21,
        YEAR = "2021",
        PAGES = "1184-1188",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254596"}

@inproceedings{bb259776,
        AUTHOR = "Lin, D.Y. and Li, Y.Q. and Prasad, S. and Nwe, T.L. and Dong, S. and Oo, Z.M.",
        TITLE = "Cam-Guided U-Net With Adversarial Regularization for Defect
Segmentation",
        BOOKTITLE = ICIP21,
        YEAR = "2021",
        PAGES = "1054-1058",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254597"}

@inproceedings{bb259777,
        AUTHOR = "Kobayashi, H. and Miyoshi, R. and Hashimoto, M.",
        TITLE = "Normal Image Generation-Based Defect Detection by Generative
Adversarial Network with Chaotic Random Images",
        BOOKTITLE = ISVC21,
        YEAR = "2021",
        PAGES = "I:353-365",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254598"}

@inproceedings{bb259778,
        AUTHOR = "Benz, C. and Rodehorst, V.",
        TITLE = "Model-based Crack Width Estimation using Rectangle Transform",
        BOOKTITLE = MVA21,
        YEAR = "2021",
        PAGES = "1-5",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254599"}

@inproceedings{bb259779,
        AUTHOR = "Kondo, Y. and Ukita, N.",
        TITLE = "Crack Segmentation for Low-Resolution Images using Joint Learning
with Super- Resolution",
        BOOKTITLE = MVA21,
        YEAR = "2021",
        PAGES = "1-6",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254600"}

@inproceedings{bb259780,
        AUTHOR = "Zhang, G.J. and Cui, K.W. and Hung, T.Y. and Lu, S.J.",
        TITLE = "Defect-GAN: High-Fidelity Defect Synthesis for Automated Defect
Inspection",
        BOOKTITLE = WACV21,
        YEAR = "2021",
        PAGES = "2523-2533",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254601"}

@inproceedings{bb259781,
        AUTHOR = "Padalkar, M.G. and Beltran Gonzalez, C. and Bustreo, M. and del Bue, A. and Murino, V.",
        TITLE = "A Versatile Crack Inspection Portable System based on Classifier
Ensemble and Controlled Illumination",
        BOOKTITLE = ICPR21,
        YEAR = "2021",
        PAGES = "4009-4016",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254602"}

@inproceedings{bb259782,
        AUTHOR = "Guo, T.Y. and Zhang, L.L. and Ding, R.W. and Yang, G.",
        TITLE = "EDD-Net: An Efficient Defect Detection Network",
        BOOKTITLE = ICPR21,
        YEAR = "2021",
        PAGES = "8899-8905",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254603"}

@inproceedings{bb259783,
        AUTHOR = "Bozic, J. and Tabernik, D. and Skocaj, D.",
        TITLE = "End-to-end training of a two-stage neural network for defect
detection",
        BOOKTITLE = ICPR21,
        YEAR = "2021",
        PAGES = "5619-5626",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254604"}

@inproceedings{bb259784,
        AUTHOR = "Nava, R. and Fehr, D. and Petry, F. and Tamisier, T.",
        TITLE = "Tire Surface Segmentation in Infrared Imaging with Convolutional Neural
Networks",
        BOOKTITLE = IMTA20,
        YEAR = "2020",
        PAGES = "51-62",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254605"}

@inproceedings{bb259785,
        AUTHOR = "Luan, C. and Cui, R. and Sun, L. and Lin, Z.",
        TITLE = "A Siamese Network Utilizing Image Structural Differences For
Cross-Category Defect Detection",
        BOOKTITLE = ICIP20,
        YEAR = "2020",
        PAGES = "778-782",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254606"}

@inproceedings{bb259786,
        AUTHOR = "Lin, D. and Li, Y. and Prasad, S. and Nwe, T.L. and Dong, S. and Oo, Z.M.",
        TITLE = "CAM-UNET: Class Activation MAP Guided UNET with Feedback Refinement
for Defect Segmentation",
        BOOKTITLE = ICIP20,
        YEAR = "2020",
        PAGES = "2131-2135",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254607"}

@inproceedings{bb259787,
        AUTHOR = "Boyadjian, Q. and Vanderesse, N. and Toews, M. and Bocher, P.",
        TITLE = "Detecting Defects in Materials Using Deep Convolutional Neural Networks",
        BOOKTITLE = ICIAR20,
        YEAR = "2020",
        PAGES = "I:293-306",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254608"}

@inproceedings{bb259788,
        AUTHOR = "Xie, Y. and Zhu, F. and Fu, Y.",
        TITLE = "Main-Secondary Network for Defect Segmentation of Textured Surface
Images",
        BOOKTITLE = WACV20,
        YEAR = "2020",
        PAGES = "3520-3529",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254609"}

@inproceedings{bb259789,
        AUTHOR = "Sidorov, O. and Hardeberg, J.Y.",
        TITLE = "Craquelure as a Graph: Application of Image Processing and Graph
Neural Networks to the Description of Fracture Patterns",
        BOOKTITLE = eHeritage19,
        YEAR = "2019",
        PAGES = "1429-1436",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254610"}

@inproceedings{bb259790,
        AUTHOR = "Ting, Y.C. and Lin, D.T. and Chen, C.F. and Tsai, B.C.",
        TITLE = "Automatic Optical Inspection for Millimeter Scale Probe Surface
Stripping Defects Using Convolutional Neural Network",
        BOOKTITLE = ACIVS20,
        YEAR = "2020",
        PAGES = "360-369",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254611"}

@inproceedings{bb259791,
        AUTHOR = "Fang, F. and Li, L. and Rice, M. and Lim, J.",
        TITLE = "Towards Real-Time Crack Detection Using a Deep Neural Network With a
Bayesian Fusion Algorithm",
        BOOKTITLE = ICIP19,
        YEAR = "2019",
        PAGES = "2976-2980",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254612"}

@inproceedings{bb259792,
        AUTHOR = "Mayr, M. and Hoffmann, M. and Maier, A. and Christlein, V.",
        TITLE = "Weakly Supervised Segmentation of Cracks on Solar Cells Using
Normalized Lp Norm",
        BOOKTITLE = ICIP19,
        YEAR = "2019",
        PAGES = "1885-1889",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254613"}

@inproceedings{bb259793,
        AUTHOR = "Jang, C. and Yun, S. and Hwang, H. and Shin, H. and Kim, S. and Park, Y.",
        TITLE = "A Defect Inspection Method for Machine Vision Using Defect Probability
Image with Deep Convolutional Neural Network",
        BOOKTITLE = ACCV18,
        YEAR = "2018",
        PAGES = "I:142-154",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254614"}

@inproceedings{bb259794,
        AUTHOR = "Kobayashi, T.",
        TITLE = "Spiral-Net with F1-Based Optimization for Image-Based Crack Detection",
        BOOKTITLE = ACCV18,
        YEAR = "2018",
        PAGES = "I:88-104",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254615"}

@inproceedings{bb259795,
        AUTHOR = "Dong, X.H. and Taylor, C.J. and Cootes, T.F.",
        TITLE = "Small Defect Detection Using Convolutional Neural Network Features and
Random Forests",
        BOOKTITLE = CEFR-LCV18,
        YEAR = "2018",
        PAGES = "IV:398-412",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254616"}

@inproceedings{bb259796,
        AUTHOR = "Costa Jover, A. and Coll Pla, S. and Queral Llaberia, J. and Moreno Garcia, D. and Gas Llatge, A.",
        TITLE = "Terrestrial Laser Scanner and Fast Characterization of Superficial
Lesions in Architectural Diagnosis",
        BOOKTITLE = "3DARCH19",
        YEAR = "2019",
        PAGES = "283-287",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254617"}

@inproceedings{bb259797,
        AUTHOR = "Inoue, Y. and Nagayoshi, H.",
        TITLE = "Deployment Conscious Automatic Surface Crack Detection",
        BOOKTITLE = WACV19,
        YEAR = "2019",
        PAGES = "686-694",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254618"}

@inproceedings{bb259798,
        AUTHOR = "Yan, Y. and Xiang, S. and Asano, H. and Kaneko, S.",
        TITLE = "Accumulated Aggregation Shifting Based on Feature Enhancement for
Defect Detection on 3D Textured Low-Contrast Surfaces",
        BOOKTITLE = ICPR18,
        YEAR = "2018",
        PAGES = "2965-2970",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254619"}

@inproceedings{bb259799,
        AUTHOR = "Ranzi, G. and Vallati, O. and Cashen, I.",
        TITLE = "A Methodology for the Inspection and Monitoring of the Roof Tiles and
Concrete Components of the Sydney Opera House",
        BOOKTITLE = EuroMed18,
        YEAR = "2018",
        PAGES = "I:689-699",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT254620"}