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@inproceedings{bb74367,
AUTHOR = "Guan, S.U. and Xie, P.",
TITLE = "A golden block self-generating scheme for continuous patterned wafer
inspections",
BOOKTITLE = CIAP99,
YEAR = "1999",
PAGES = "436-441",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT71026"}
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TITLE = "Automated inspection of IC wafer contamination",
JOURNAL = PR,
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AUTHOR = "van Dop, E.R. and Regtien, P.P.L.",
TITLE = "Multi-sensor recognition of electronic components",
JOURNAL = MVA,
VOLUME = "12",
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NUMBER = "5",
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AUTHOR = "Ye, Q.Z. and Ong, S.H. and Han, X.",
TITLE = "A stereo vision system for the inspection of IC bonding wires",
JOURNAL = IJIST,
VOLUME = "11",
YEAR = "2001",
NUMBER = "4",
PAGES = "254-262",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT71029"}
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AUTHOR = "Brehelin, L. and Gascuel, O. and Caraux, G.",
TITLE = "Hidden Markov Models with Patterns to Learn Boolean Vector Sequences
and Application to the Built-In Self-Test for Integrated Circuits",
JOURNAL = PAMI,
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NUMBER = "9",
MONTH = "September",
PAGES = "997-1008",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT71030"}
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AUTHOR = "Qu, G. and Wood, S.L. and Teh, C.",
TITLE = "Wafer Defect Detection Using Directional Morphological Gradient
Techniques",
JOURNAL = JASP,
VOLUME = "2002",
YEAR = "2002",
NUMBER = "7",
MONTH = "July",
PAGES = "686-703",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT71031"}
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AUTHOR = "Tobin, K.W. and Karnowski, T.P. and Arrowood, L.F. and Ferrell, R.K. and Goddard, J.S. and Lakhani, F.",
TITLE = "Content-Based Image Retrieval for Semiconductor Process
Characterization",
JOURNAL = JASP,
VOLUME = "2002",
YEAR = "2002",
NUMBER = "7",
MONTH = "July",
PAGES = "704-713",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT71032"}
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AUTHOR = "Tsai, D.M. and Chou, C.C.",
TITLE = "A fast focus measure for video display inspection",
JOURNAL = MVA,
VOLUME = "14",
YEAR = "2003",
NUMBER = "3",
MONTH = "July",
PAGES = "192-196",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT71033"}
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AUTHOR = "Roh, Y.J. and Park, W.S. and Cho, H.S.",
TITLE = "Correcting image distortion in the X-ray digital tomosynthesis system
for PCB solder joint inspection",
JOURNAL = IVC,
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YEAR = "2003",
NUMBER = "12",
MONTH = "November",
PAGES = "1063-1075",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT71034"}
@article{bb74376,
AUTHOR = "Baidyk, T. and Kussul, E. and Makeyev, O. and Caballero, A. and Ruiz, L. and Carrera, G. and Velasco, G.",
TITLE = "Flat image recognition in the process of microdevice assembly",
JOURNAL = PRL,
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YEAR = "2004",
NUMBER = "1",
MONTH = "January",
PAGES = "107-118",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT71035"}
@article{bb74377,
AUTHOR = "Toledo, G.K. and Kussul, E. and Baidyk, T.",
TITLE = "Neural classifier for micro work piece recognition",
JOURNAL = IVC,
VOLUME = "24",
YEAR = "2006",
NUMBER = "8",
MONTH = "August",
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BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT71036"}
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AUTHOR = "Fang, T. and Jafari, M.A. and Danforth, S.C. and Safari, A.",
TITLE = "Signature analysis and defect detection in layered manufacturing of
ceramic sensors and actuators",
JOURNAL = MVA,
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NUMBER = "2",
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PAGES = "63-75",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT71037"}
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AUTHOR = "Zervakis, M.E. and Goumas, S.K. and Rovithakis, G.A.",
TITLE = "A Bayesian Framework for Multilead SMD Post-Placement Quality
Inspection",
JOURNAL = SMC-B,
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YEAR = "2004",
NUMBER = "1",
MONTH = "February",
PAGES = "440-453",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT71038"}
@inproceedings{bb74380,
AUTHOR = "Goumas, S.K. and Rovithakis, G.A. and Zervakis, M.E.",
TITLE = "A Bayesian image analysis framework for post-placement quality
inspection of components",
BOOKTITLE = ICIP02,
YEAR = "2002",
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BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT71039"}
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AUTHOR = "Kubota, T. and Talekar, P. and Ma, X.Y. and Sudarshan, T.S.",
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wafers",
JOURNAL = MVA,
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PAGES = "170-176",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT71040"}
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TITLE = "Unsupervised spatial pattern classification of electrical-wafer-sorting
maps in semiconductor manufacturing",
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AUTHOR = "Shankar, N.G. and Zhong, Z.W.",
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JOURNAL = MVA,
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BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT71042"}
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discrete cosine transform decomposition and cumulative sum techniques",
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AUTHOR = "Watanabe, T. and Kusano, A. and Fujiwara, T. and Koshimizu, H.",
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Camera Stereo Vision",
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connectivity and image correlation",
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Last update:Jan 1, 2009 at 17:09:16