@article{bb209400,
AUTHOR = "Wilder, J.",
TITLE = "Machine Vision for Inspection of Keyboards",
JOURNAL = SP,
VOLUME = "5",
YEAR = "1983",
PAGES = "413-421",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204500"}
@article{bb209401,
AUTHOR = "West, G.A.W.",
TITLE = "A System for the Automatic Visual Inspection of
Bare-Printed Circuit Boards",
JOURNAL = SMC,
VOLUME = "14",
YEAR = "1984",
PAGES = "767-773",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204501"}
@inproceedings{bb209402,
AUTHOR = "Nakashima, M. and Koezuka, T. and Inagaki, T.",
TITLE = "Recognition method and apparatus",
BOOKTITLE = US_Patent,
YEAR = "1984",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204502"}
@article{bb209403,
AUTHOR = "Mandeville, J.R.",
TITLE = "Novel Method for Analysis of Printed Circuit Images",
JOURNAL = IBMRD,
VOLUME = "29",
YEAR = "1985",
NUMBER = "1",
MONTH = "January",
PAGES = "73-86",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204503"}
@article{bb209404,
AUTHOR = "Bixler, J.P. and Sanford, J.P.",
TITLE = "A Technique for Encoding Lines and Regions in Engineering Drawings",
JOURNAL = PR,
VOLUME = "18",
YEAR = "1985",
NUMBER = "5",
PAGES = "367-377",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204504"}
@article{bb209405,
AUTHOR = "Yoda, H. and Ohuchi, Y. and Taniguchi, Y. and Ejiri, M.",
TITLE = "An Automatic Wafer Inspection System Using Pipelined Image
Processing Techniques",
JOURNAL = PAMI,
VOLUME = "10",
YEAR = "1988",
NUMBER = "1",
MONTH = "January",
PAGES = "4-16",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204505"}
@article{bb209406,
AUTHOR = "Hara, Y. and Doi, H. and Karasaki, K. and Iida, T.",
TITLE = "A System for PCB Automated Inspection Using Fluorescent Light",
JOURNAL = PAMI,
VOLUME = "10",
YEAR = "1988",
NUMBER = "1",
MONTH = "January",
PAGES = "69-78",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204506"}
@article{bb209407,
AUTHOR = "Shu, D.B. and Li, C.C. and Mancuso, J.F. and Sun, Y.N.",
TITLE = "A Line Extraction Method for Automated SEM Inspection of VLSI
Resist",
JOURNAL = PAMI,
VOLUME = "10",
YEAR = "1988",
NUMBER = "1",
MONTH = "January",
PAGES = "117-120",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204507"}
@article{bb209408,
AUTHOR = "Ando, M. and Inagaki, T.",
TITLE = "Automatic Optical Inspection of Plated Through-Holes for
Ultrahigh Density Printed Wiring Boards",
JOURNAL = MVA,
VOLUME = "1",
YEAR = "1988",
PAGES = "175-181",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204508"}
@article{bb209409,
AUTHOR = "Dom, B.E. and Brecher, V.H. and Bonner, R. and Batchelder, J.S. and Jaffe, R.S.",
TITLE = "The P300: A System for Automatic Pattern Wafer Inspection",
JOURNAL = MVA,
VOLUME = "1",
YEAR = "1988",
PAGES = "205-221",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204509"}
@article{bb209410,
AUTHOR = "Hara, Y. and Akiyama, N. and Karasaki, K.",
TITLE = "Automatic Inspection System for Printed Circuit Boards",
JOURNAL = PAMI,
VOLUME = "5",
YEAR = "1983",
NUMBER = "6",
MONTH = "November",
PAGES = "623-630",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204510"}
@inproceedings{bb209411,
AUTHOR = "Hara, Y. and Okamoto, K. and Hamada, T. and Akiyama, N. and Nakagawa, K. and Torisawa, S. and Nakashima, S.",
TITLE = "Automatic Visual Inspection of LSI Photomasks",
BOOKTITLE = ICPR80,
YEAR = "1980",
PAGES = "273-279",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204511"}
@article{bb209412,
AUTHOR = "Sanz, J.L.C. and Petkovic, D.",
TITLE = "Machine Vision Algorithms for Automated Inspection of
Thin-Film Disk Heads",
JOURNAL = PAMI,
VOLUME = "10",
YEAR = "1988",
NUMBER = "6",
MONTH = "November",
PAGES = "830-848",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204512"}
@article{bb209413,
AUTHOR = "Sanz, J.L.C. and Dinstein, I. and Petkovic, D.",
TITLE = "Computing Multi-Colored Polygonal Masks in Pipeline Architectures and Its
Application to Automated Visual Inspection",
JOURNAL = CACM,
VOLUME = "30",
YEAR = "1987",
NUMBER = "4",
MONTH = "April",
PAGES = "318-329",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204513"}
@article{bb209414,
AUTHOR = "Petkovic, D. and Hinkle, E.B.",
TITLE = "A Rule-Based System for Verifying Engineering Specifications in
Industrial Visual Inspection Applications",
JOURNAL = PAMI,
VOLUME = "9",
YEAR = "1987",
NUMBER = "2",
MONTH = "March",
PAGES = "306-311",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204514"}
@inproceedings{bb209415,
AUTHOR = "Dom, B. and Steele, D. and Petkovic, D. and Kuhlmann, L.",
TITLE = "Algorithms for automatic disk head/slider inspection",
BOOKTITLE = ICPR94,
YEAR = "1994",
PAGES = "A:295-300",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204515"}
@inproceedings{bb209416,
AUTHOR = "Petkovic, D. and Sanz, J.L.C. and Mohiuddin, K.M.A. and Hinkle, E.B. and Flickner, M.D. and Cox, C. and Wong, K.",
TITLE = "An Experimental System for Disk Head Inspection",
BOOKTITLE = ICPR86,
YEAR = "1986",
PAGES = "9-13",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204516"}
@article{bb209417,
AUTHOR = "Sprague, A.P. and Donahue, M.J. and Rokhlin, S.I.",
TITLE = "A Method for Automatic Inspection of Printed Circuit Boards",
JOURNAL = CVGIP,
VOLUME = "54",
YEAR = "1991",
NUMBER = "3",
MONTH = "November",
PAGES = "401-415",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204517"}
@article{bb209418,
AUTHOR = "Wojcik, Z.M.",
TITLE = "An Approach to the Recognition of
Contours and Line-Shaped Objects",
JOURNAL = CVGIP,
VOLUME = "25",
YEAR = "1984",
NUMBER = "2",
MONTH = "February",
PAGES = "184-204",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204518"}
@article{bb209419,
AUTHOR = "Ellison, T.P. and Taylor, C.J.",
TITLE = "Calculating the surface topography of integrated circuit wafers from
SEM images",
JOURNAL = IVC,
VOLUME = "9",
YEAR = "1991",
NUMBER = "1",
MONTH = "February",
PAGES = "3-9",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204519"}
@inproceedings{bb209420,
AUTHOR = "Taylor, C.J. and Ellison, T.P.",
TITLE = "Calculating the surface topography of integrated circuit wafers from
SEM images",
BOOKTITLE = BMVC90,
YEAR = "1990",
PAGES = "xx-yy",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204519"}
@inproceedings{bb209421,
AUTHOR = "Yu, K.K. and Berglund, C.N.",
TITLE = "Automated system for extracting design and layout information
from an integrated circuit",
BOOKTITLE = US_Patent,
YEAR = "1992",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204520"}
@inproceedings{bb209422,
AUTHOR = "Lebeau, C.J.",
TITLE = "Method for automatic semiconductor wafer inspection",
BOOKTITLE = US_Patent,
YEAR = "1992",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204521"}
@inproceedings{bb209423,
AUTHOR = "Bushroe, M.W.",
TITLE = "Solder joint locator",
BOOKTITLE = US_Patent,
YEAR = "1992",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204522"}
@article{bb209424,
AUTHOR = "Dom, B.E. and Brecher, V.",
TITLE = "Recent Advances in the Automatic Inspection of
Integrated-Circuits for Pattern Defects",
JOURNAL = MVA,
VOLUME = "8",
YEAR = "1995",
NUMBER = "1",
PAGES = "5-19",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204523"}
@article{bb209425,
AUTHOR = "Khalaj, B.H. and Aghajan, H.K. and Kailath, T.",
TITLE = "Patterned Wafer Inspection By High-Resolution Spectral Estimation
Techniques",
JOURNAL = MVA,
VOLUME = "7",
YEAR = "1994",
NUMBER = "3",
PAGES = "178-185",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204524"}
@article{bb209426,
AUTHOR = "Teoh, E.K. and Mital, D.P.",
TITLE = "A Transputer-Based Automated Visual Inspection System for
Electronic Devices and PCBs",
JOURNAL = OptLas,
VOLUME = "22",
YEAR = "1995",
NUMBER = "3",
PAGES = "161-180",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204525"}
@article{bb209427,
AUTHOR = "Moganti, M. and Ercal, F. and Dagli, C.H. and Tsunekawa, S.",
TITLE = "Automatic PCB Inspection Algorithms: A Survey",
JOURNAL = CVIU,
VOLUME = "63",
YEAR = "1996",
NUMBER = "2",
MONTH = "March",
PAGES = "287-313",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204526"}
@article{bb209428,
AUTHOR = "Rao, A.R.",
TITLE = "Future-Directions in Industrial Machine Vision:
A Case-Study of Semiconductor Manufacturing Applications",
JOURNAL = IVC,
VOLUME = "14",
YEAR = "1996",
NUMBER = "1",
MONTH = "February",
PAGES = "3-19",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204527"}
@article{bb209429,
AUTHOR = "Yuan, M.C. and Li, J.G.",
TITLE = "A Production System for LSI Chip Anatomizing",
JOURNAL = PRL,
VOLUME = "5",
YEAR = "1987",
PAGES = "227-232",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204528"}
@article{bb209430,
AUTHOR = "Blanz, W.E. and Sanz, J.L.C. and Hinkle, E.B.",
TITLE = "Image Analysis Methods for Solder-Ball Inspection in
Integrated Circuit Manufacturing",
JOURNAL = RA,
VOLUME = "4",
YEAR = "1988",
PAGES = "129-139",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204529"}
@article{bb209431,
AUTHOR = "Chou, P.B. and Rao, A.R. and Sturzenbecker, M.C. and Wu, F.Y. and Brecher, V.H.",
TITLE = "Automatic Defect Classification for Semiconductor Manufacturing",
JOURNAL = MVA,
VOLUME = "9",
YEAR = "1997",
NUMBER = "4",
PAGES = "201-214",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204530"}
@article{bb209432,
AUTHOR = "An, J.N. and Cho, Y.B. and Gweon, D.G.",
TITLE = "A New Method for Image Separation of Overlapped Images from a Two-Layered
Printed Circuit Board (PCB)",
JOURNAL = IVC,
VOLUME = "15",
YEAR = "1997",
NUMBER = "11",
MONTH = "November",
PAGES = "861-866",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204531"}
@article{bb209433,
AUTHOR = "Kim, S.W. and Lee, S.Y. and Yoon, D.S.",
TITLE = "Rapid Pattern Inspection of Shadow Masks by
Machine Vision Integrated with Fourier Optics",
JOURNAL = OptEng,
VOLUME = "36",
YEAR = "1997",
NUMBER = "12",
MONTH = "December",
PAGES = "3309-3311",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204532"}
@article{bb209434,
AUTHOR = "Zhou, H. and Kassim, A.A. and Ranganath, S.",
TITLE = "A Fast Algorithm for Detecting Die Extrusion Defects in IC Packages",
JOURNAL = MVA,
VOLUME = "11",
YEAR = "1998",
NUMBER = "1",
PAGES = "37-41",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204533"}
@article{bb209435,
AUTHOR = "Kassim, A.A. and Zhou, H. and Ranganath, S.",
TITLE = "Automatic IC orientation checks",
JOURNAL = MVA,
VOLUME = "12",
YEAR = "2000",
NUMBER = "3",
PAGES = "107-112",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204534"}
@inproceedings{bb209436,
AUTHOR = "Nichani, S. and Scola, J.",
TITLE = "Semiconductor device image inspection utilizing image subtraction and
threshold imaging",
BOOKTITLE = US_Patent,
YEAR = "1999",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204535"}
@inproceedings{bb209437,
AUTHOR = "Ichikawa, I.",
TITLE = "Laser beam inspection apparatus",
BOOKTITLE = US_Patent,
YEAR = "2003",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204536"}
@article{bb209438,
AUTHOR = "Chung, H.K. and Park, R.H.",
TITLE = "2-Stage High-Precision Visual Inspection of Surface Mount Devices",
JOURNAL = JEI,
VOLUME = "6",
YEAR = "1997",
NUMBER = "4",
MONTH = "October",
PAGES = "517-524",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204537"}
@article{bb209439,
AUTHOR = "Moganti, M. and Ercal, F.",
TITLE = "A Subpattern Level Inspection System for Printed Circuit Boards",
JOURNAL = CVIU,
VOLUME = "70",
YEAR = "1998",
NUMBER = "1",
MONTH = "April",
PAGES = "51-62",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204538"}
@article{bb209440,
AUTHOR = "Moganti, M. and Ercal, F.",
TITLE = "Segmentation of Printed Circuit Board Images into Basic Patterns",
JOURNAL = CVIU,
VOLUME = "70",
YEAR = "1998",
NUMBER = "1",
MONTH = "April",
PAGES = "74-86",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204539"}
@article{bb209441,
AUTHOR = "Fadzil, A. and Weng, C.J.",
TITLE = "LED Cosmetic Flaw Inspection System",
JOURNAL = PAA,
VOLUME = "1",
YEAR = "1998",
NUMBER = "1",
PAGES = "62-70",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204540"}
@article{bb209442,
AUTHOR = "Rodriguez, A.A. and Mandeville, J.R.",
TITLE = "Image registration for automated inspection of printed circuit patterns
using CAD reference data",
JOURNAL = MVA,
VOLUME = "6",
YEAR = "1993",
NUMBER = "4",
PAGES = "233-242",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204541"}
@article{bb209443,
AUTHOR = "Rajeswari, M. and Rodd, M.G.",
TITLE = "Real-time Analysis of an IC Wire-bonding Inspection System",
JOURNAL = RealTimeImg,
VOLUME = "5",
YEAR = "1999",
NUMBER = "6",
MONTH = "December",
PAGES = "409-421",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204542"}
@inproceedings{bb209444,
AUTHOR = "Beaty, E.M. and Mork, D.P.",
TITLE = "Three dimensional inspection system",
BOOKTITLE = US_Patent,
YEAR = "2000",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204543"}
@article{bb209445,
AUTHOR = "Xie, P. and Guan, S.U.",
TITLE = "A golden-template self-generating method for patterned wafer inspection",
JOURNAL = MVA,
VOLUME = "12",
YEAR = "2000",
NUMBER = "3",
PAGES = "149-156",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204544"}
@article{bb209446,
AUTHOR = "Guan, S.U. and Xie, P. and Li, H.",
TITLE = "A golden-block-based self-refining scheme for repetitive patterned
wafer inspections",
JOURNAL = MVA,
VOLUME = "13",
YEAR = "2003",
NUMBER = "5-6",
PAGES = "314-321",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204545"}
@inproceedings{bb209447,
AUTHOR = "Guan, S.U. and Xie, P.",
TITLE = "A golden block self-generating scheme for continuous patterned wafer
inspections",
BOOKTITLE = CIAP99,
YEAR = "1999",
PAGES = "436-441",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204546"}
@article{bb209448,
AUTHOR = "Zoroofi, R.A. and Taketani, H. and Tamura, S. and Sato, Y. and Sekiya, K.",
TITLE = "Automated inspection of IC wafer contamination",
JOURNAL = PR,
VOLUME = "34",
YEAR = "2001",
NUMBER = "6",
MONTH = "June",
PAGES = "1307-1317",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204547"}
@article{bb209449,
AUTHOR = "van Dop, E.R. and Regtien, P.P.L.",
TITLE = "Multi-sensor recognition of electronic components",
JOURNAL = MVA,
VOLUME = "12",
YEAR = "2001",
NUMBER = "5",
PAGES = "213-222",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204548"}
@article{bb209450,
AUTHOR = "Ye, Q.Z. and Ong, S.H. and Han, X.",
TITLE = "A stereo vision system for the inspection of IC bonding wires",
JOURNAL = IJIST,
VOLUME = "11",
YEAR = "2001",
NUMBER = "4",
PAGES = "254-262",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204549"}
@article{bb209451,
AUTHOR = "Brehelin, L. and Gascuel, O. and Caraux, G.",
TITLE = "Hidden Markov Models with Patterns to Learn Boolean Vector Sequences
and Application to the Built-In Self-Test for Integrated Circuits",
JOURNAL = PAMI,
VOLUME = "23",
YEAR = "2001",
NUMBER = "9",
MONTH = "September",
PAGES = "997-1008",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204550"}
@article{bb209452,
AUTHOR = "Qu, G.Y. and Wood, S.L. and Teh, C.",
TITLE = "Wafer Defect Detection Using Directional Morphological Gradient
Techniques",
JOURNAL = JASP,
VOLUME = "2002",
YEAR = "2002",
NUMBER = "7",
MONTH = "July",
PAGES = "686-703",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204551"}
@article{bb209453,
AUTHOR = "Tobin, K.W. and Karnowski, T.P. and Arrowood, L.F. and Ferrell, R.K. and Goddard, J.S. and Lakhani, F.",
TITLE = "Content-Based Image Retrieval for Semiconductor Process
Characterization",
JOURNAL = JASP,
VOLUME = "2002",
YEAR = "2002",
NUMBER = "7",
MONTH = "July",
PAGES = "704-713",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204552"}
@article{bb209454,
AUTHOR = "Tsai, D.M. and Chou, C.C.",
TITLE = "A fast focus measure for video display inspection",
JOURNAL = MVA,
VOLUME = "14",
YEAR = "2003",
NUMBER = "3",
MONTH = "July",
PAGES = "192-196",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204553"}
@article{bb209455,
AUTHOR = "Roh, Y.J. and Park, W.S. and Cho, H.S.",
TITLE = "Correcting image distortion in the X-ray digital tomosynthesis system
for PCB solder joint inspection",
JOURNAL = IVC,
VOLUME = "21",
YEAR = "2003",
NUMBER = "12",
MONTH = "November",
PAGES = "1063-1075",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204554"}
@article{bb209456,
AUTHOR = "Baidyk, T. and Kussul, E. and Makeyev, O. and Caballero, A. and Ruiz, L. and Carrera, G. and Velasco, G.",
TITLE = "Flat image recognition in the process of microdevice assembly",
JOURNAL = PRL,
VOLUME = "25",
YEAR = "2004",
NUMBER = "1",
MONTH = "January",
PAGES = "107-118",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204555"}
@article{bb209457,
AUTHOR = "Toledo, G.K. and Kussul, E. and Baidyk, T.",
TITLE = "Neural classifier for micro work piece recognition",
JOURNAL = IVC,
VOLUME = "24",
YEAR = "2006",
NUMBER = "8",
MONTH = "August",
PAGES = "827-836",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204556"}
@article{bb209458,
AUTHOR = "Toledo, G.K. and Kussul, E. and Baidyk, T.",
TITLE = "Work piece recognition based on the permutation neural classifier
technique",
JOURNAL = MVA,
VOLUME = "22",
YEAR = "2011",
NUMBER = "3",
MONTH = "May",
PAGES = "495-504",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204557"}
@article{bb209459,
AUTHOR = "Fang, T. and Jafari, M.A. and Danforth, S.C. and Safari, A.",
TITLE = "Signature analysis and defect detection in layered manufacturing of
ceramic sensors and actuators",
JOURNAL = MVA,
VOLUME = "15",
YEAR = "2003",
NUMBER = "2",
MONTH = "December",
PAGES = "63-75",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204558"}
@article{bb209460,
AUTHOR = "Zervakis, M.E. and Goumas, S.K. and Rovithakis, G.A.",
TITLE = "A Bayesian Framework for Multilead SMD Post-Placement Quality
Inspection",
JOURNAL = SMC-B,
VOLUME = "34",
YEAR = "2004",
NUMBER = "1",
MONTH = "February",
PAGES = "440-453",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204559"}
@inproceedings{bb209461,
AUTHOR = "Goumas, S.K. and Rovithakis, G.A. and Zervakis, M.E.",
TITLE = "A Bayesian image analysis framework for post-placement quality
inspection of components",
BOOKTITLE = ICIP02,
YEAR = "2002",
PAGES = "II: 549-552",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204560"}
@article{bb209462,
AUTHOR = "Kubota, T. and Talekar, P. and Ma, X.Y. and Sudarshan, T.S.",
TITLE = "A nondestructive automated defect detection system for silicon carbide
wafers",
JOURNAL = MVA,
VOLUME = "16",
YEAR = "2005",
NUMBER = "3",
MONTH = "May",
PAGES = "170-176",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204561"}
@article{bb209463,
AUTHOR = "di Palma, F. and de Nicolao, G. and Miraglia, G. and Pasquinetti, E. and Piccinini, F.",
TITLE = "Unsupervised spatial pattern classification of electrical-wafer-sorting
maps in semiconductor manufacturing",
JOURNAL = PRL,
VOLUME = "26",
YEAR = "2005",
NUMBER = "12",
MONTH = "September",
PAGES = "1857-1865",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204562"}
@article{bb209464,
AUTHOR = "Shankar, N.G. and Zhong, Z.W.",
TITLE = "Improved segmentation of semiconductor defects using area sieves",
JOURNAL = MVA,
VOLUME = "17",
YEAR = "2006",
NUMBER = "1",
MONTH = "April",
PAGES = "1-7",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204563"}
@article{bb209465,
AUTHOR = "Lin, H.D.",
TITLE = "Tiny surface defect inspection of electronic passive components using
discrete cosine transform decomposition and cumulative sum techniques",
JOURNAL = IVC,
VOLUME = "26",
YEAR = "2008",
NUMBER = "5",
MONTH = "May",
PAGES = "603-621",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204564"}
@article{bb209466,
AUTHOR = "Watanabe, T. and Kusano, A. and Fujiwara, T. and Koshimizu, H.",
TITLE = "3D Precise Inspection of Terminal Lead for Electronic Devices by Single
Camera Stereo Vision",
JOURNAL = IEICE,
VOLUME = "E91-D",
YEAR = "2008",
NUMBER = "7",
MONTH = "July",
PAGES = "1885-1892",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204565"}
@inproceedings{bb209467,
AUTHOR = "Kusano, A. and Watanabe, T. and Funahashi, T. and Koshimizu, H.",
TITLE = "Defect detection of terminal lead by single stereo vision",
BOOKTITLE = FCV13,
YEAR = "2013",
PAGES = "237-241",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204566"}
@article{bb209468,
AUTHOR = "Last, M. and Kandel, A.",
TITLE = "Perception-based Analysis Of Engineering Experiments In The
Semiconductor Industry",
JOURNAL = IJIG,
VOLUME = "2",
YEAR = "2002",
NUMBER = "1",
MONTH = "January",
PAGES = "107-126",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204567"}
@article{bb209469,
AUTHOR = "Ng, A.N.Y. and Lam, E.Y. and Chung, R. and Fung, K.S.M. and Leung, W.H.",
TITLE = "Reference-free Machine Vision Inspection Of Semiconductor Die Images",
JOURNAL = IJIG,
VOLUME = "9",
YEAR = "2009",
NUMBER = "1",
MONTH = "January",
PAGES = "133-152",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204568"}
@article{bb209470,
AUTHOR = "Chen, C.S. and Yeh, C.W. and Yin, P.Y.",
TITLE = "A novel Fourier descriptor based image alignment algorithm for
automatic optical inspection",
JOURNAL = JVCIR,
VOLUME = "20",
YEAR = "2009",
NUMBER = "3",
MONTH = "April",
PAGES = "178-189",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204569"}
@article{bb209471,
AUTHOR = "Chang, C.Y. and Li, C.H. and Lin, S.Y. and Jeng, M.",
TITLE = "Application of Two Hopfield Neural Networks for Automatic Four-Element
LED Inspection",
JOURNAL = SMC-C,
VOLUME = "39",
YEAR = "2009",
NUMBER = "3",
MONTH = "May",
PAGES = "352-365",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204570"}
@article{bb209472,
AUTHOR = "Tsai, D.M. and Chang, C.C. and Chao, S.M.",
TITLE = "Micro-crack inspection in heterogeneously textured solar wafers using
anisotropic diffusion",
JOURNAL = IVC,
VOLUME = "28",
YEAR = "2010",
NUMBER = "3",
MONTH = "March",
PAGES = "491-501",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204571"}
@article{bb209473,
AUTHOR = "Zontak, M. and Cohen, I.",
TITLE = "Defect detection in patterned wafers using anisotropic kernels",
JOURNAL = MVA,
VOLUME = "21",
YEAR = "2010",
NUMBER = "2",
MONTH = "February",
PAGES = "xx-yy",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204572"}
@article{bb209474,
AUTHOR = "Sun, T.H. and Tseng, C.C. and Chen, M.S.",
TITLE = "Electric contacts inspection using machine vision",
JOURNAL = IVC,
VOLUME = "28",
YEAR = "2010",
NUMBER = "6",
MONTH = "June",
PAGES = "890-901",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204573"}
@article{bb209475,
AUTHOR = "Fan, S.K.S. and Chuang, Y.C.A.",
TITLE = "Automatic detection of Mura defect in TFT-LCD based on regression
diagnostics",
JOURNAL = PRL,
VOLUME = "31",
YEAR = "2010",
NUMBER = "15",
MONTH = "November",
PAGES = "2397-2404",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204574"}
@article{bb209476,
AUTHOR = "Zhang, J. and Kim, Y. and Yang, S.H. and Milster, T.D.",
TITLE = "Illumination artifacts in hyper-NA vector imaging",
JOURNAL = JOSA-A,
VOLUME = "27",
YEAR = "2010",
NUMBER = "10",
MONTH = "October",
PAGES = "2272-2284",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204575"}
@article{bb209477,
AUTHOR = "He, X.F. and Fang, F.",
TITLE = "Flat-Panel Color Filter Inspection",
JOURNAL = VisSys,
VOLUME = "16",
YEAR = "2011",
NUMBER = "5",
MONTH = "May",
PAGES = "xx-yy",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204576"}
@article{bb209478,
AUTHOR = "Benedek, C.",
TITLE = "Detection of soldering defects in Printed Circuit Boards with
Hierarchical Marked Point Processes",
JOURNAL = PRL,
VOLUME = "32",
YEAR = "2011",
NUMBER = "13",
MONTH = "October",
PAGES = "1535-1543",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204577"}
@article{bb209479,
AUTHOR = "Peng, Y. and Zhang, J.Y. and Wang, Y. and Yu, Z.P.",
TITLE = "Gradient-Based Source and Mask Optimization in Optical Lithography",
JOURNAL = IP,
VOLUME = "20",
YEAR = "2011",
NUMBER = "10",
MONTH = "October",
PAGES = "2856-2864",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204578"}
@article{bb209480,
AUTHOR = "Long, T. and Wang, H. and Long, B.",
TITLE = "Test generation algorithm for analog systems based on support vector
machine",
JOURNAL = SIViP,
VOLUME = "5",
YEAR = "2011",
NUMBER = "4",
MONTH = "November",
PAGES = "527-533",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204579"}
@article{bb209481,
AUTHOR = "Ibrahim, A. and Tominaga, S. and Horiuchi, T.",
TITLE = "Invariant representation for spectral reflectance images and its
application",
JOURNAL = JIVP,
VOLUME = "2011",
YEAR = "2011",
NUMBER = "1 2011",
PAGES = "xx-yy",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204580"}
@inproceedings{bb209482,
AUTHOR = "Ibrahim, A. and Tominaga, S. and Horiuchi, T.",
TITLE = "Spectral Invariant Representation for Spectral Reflectance Image",
BOOKTITLE = ICPR10,
YEAR = "2010",
PAGES = "2776-2779",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204581"}
@inproceedings{bb209483,
AUTHOR = "Ibrahim, A. and Tominaga, S. and Horiuchi, T.",
TITLE = "Material Classification for Printed Circuit Boards by Spectral Imaging
System",
BOOKTITLE = CCIW09,
YEAR = "2009",
PAGES = "216-225",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204582"}
@inproceedings{bb209484,
AUTHOR = "Horiuchi, T. and Ibrahim, A. and Kadoi, H. and Tominaga, S.",
TITLE = "An Effective Method for Illumination-Invariant Representation of Color
Images",
BOOKTITLE = Color12,
YEAR = "2012",
PAGES = "II: 401-410",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204583"}
@inproceedings{bb209485,
AUTHOR = "Ibrahim, A. and Horiuchi, T. and Tominaga, S.",
TITLE = "Illumination-invariant representation for natural color images and its
application",
BOOKTITLE = Southwest12,
YEAR = "2012",
PAGES = "157-160",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204584"}
@inproceedings{bb209486,
AUTHOR = "Tominaga, S. and Okamoto, S.",
TITLE = "Reflectance-based material classification for printed circuit boards",
BOOKTITLE = CIAP03,
YEAR = "2003",
PAGES = "238-243",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204585"}
@inproceedings{bb209487,
AUTHOR = "Horiuchi, T. and Suzuki, Y. and Tominaga, S.",
TITLE = "Material Classification for Printed Circuit Boards by Kernel Fisher
Discriminant Analysis",
BOOKTITLE = CCIW11,
YEAR = "2011",
PAGES = "152-164",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204586"}
@article{bb209488,
AUTHOR = "Choy, S.K. and Jia, N.N. and Tong, C.S. and Tang, M.L. and Lam, E.Y.",
TITLE = "A Robust Computational Algorithm for Inverse Photomask Synthesis in
Optical Projection Lithography",
JOURNAL = SIIMS,
VOLUME = "5",
YEAR = "2012",
NUMBER = "1 2012",
PAGES = "625-651",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204587"}
@inproceedings{bb209489,
AUTHOR = "Jia, N.N. and Lam, E.Y.",
TITLE = "Stochastic gradient descent for robust inverse photomask synthesis in
optical lithography",
BOOKTITLE = ICIP10,
YEAR = "2010",
PAGES = "4173-4176",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204588"}
@article{bb209490,
AUTHOR = "Yu, J.C. and Yu, P. and Chao, H.Y.",
TITLE = "Library-Based Illumination Synthesis for Critical CMOS Patterning",
JOURNAL = IP,
VOLUME = "22",
YEAR = "2013",
NUMBER = "7",
PAGES = "2811-2821",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204589"}
@article{bb209491,
AUTHOR = "Xu, S. and Cheng, Z. and Gao, Y. and Pan, Q.",
TITLE = "Visual wafer dies counting using geometrical characteristics",
JOURNAL = IET-IPR,
VOLUME = "8",
YEAR = "2014",
NUMBER = "5",
MONTH = "May",
PAGES = "280-288",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204590"}
@article{bb209492,
AUTHOR = "Duan, G.F. and Wang, H.C. and Liu, Z.Y. and Tan, J.R. and Chen, Y.W.",
TITLE = "Automatic optical phase identification of micro-drill bits based on
improved ASM and bag of shape segment in PCB production",
JOURNAL = MVA,
VOLUME = "25",
YEAR = "2014",
NUMBER = "6",
PAGES = "1411-1422",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204591"}
@article{bb209493,
AUTHOR = "Leibovici, M.C.R. and Gaylord, T.K.",
TITLE = "Custom-modified three-dimensional periodic microstructures by
pattern-integrated interference lithography",
JOURNAL = JOSA-A,
VOLUME = "31",
YEAR = "2014",
NUMBER = "7",
MONTH = "July",
PAGES = "1515-1519",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204592"}
@article{bb209494,
AUTHOR = "Estellers, V. and Thiran, J.P. and Gabrani, M.",
TITLE = "Surface Reconstruction From Microscopic Images in Optical Lithography",
JOURNAL = IP,
VOLUME = "23",
YEAR = "2014",
NUMBER = "8",
MONTH = "August",
PAGES = "3560-3573",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204593"}
@article{bb209495,
AUTHOR = "Bernal, F. and Acebron, J.A. and Anjam, I.",
TITLE = "A Stochastic Algorithm Based on Fast Marching for Automatic
Capacitance Extraction in Non-Manhattan Geometries",
JOURNAL = SIIMS,
VOLUME = "7",
YEAR = "2014",
NUMBER = "4",
PAGES = "2657-2674",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204594"}
@article{bb209496,
AUTHOR = "Lakhssassi, A. and Palenychka, R. and Savaria, Y. and Sayde, M. and Zaremba, M.",
TITLE = "Monitoring Thermal Stress in Wafer-Scale Integrated Circuits by the
Attentive Vision Method Using an Infrared Camera",
JOURNAL = CirSysVideo,
VOLUME = "26",
YEAR = "2016",
NUMBER = "2",
MONTH = "February",
PAGES = "412-424",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204595"}
@article{bb209497,
AUTHOR = "Chebolu, A. and Nagahanumaiah",
TITLE = "Contact angle measurement techniques on micro-patterned surfaces:
A comparative analysis",
JOURNAL = IJCVR,
VOLUME = "7",
YEAR = "2017",
NUMBER = "1/2",
PAGES = "148-159",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204596"}
@article{bb209498,
AUTHOR = "Sindagi, V.A. and Srivastava, S.",
TITLE = "Domain Adaptation for Automatic OLED Panel Defect Detection Using
Adaptive Support Vector Data Description",
JOURNAL = IJCV,
VOLUME = "122",
YEAR = "2017",
NUMBER = "2",
MONTH = "April",
PAGES = "193-211",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204597"}
@article{bb209499,
AUTHOR = "Qiao, K. and Zeng, L. and Chen, J. and Hai, J.J. and Yan, B.",
TITLE = "Wire segmentation for printed circuit board using deep convolutional
neural network and graph cut model",
JOURNAL = IET-IPR,
VOLUME = "12",
YEAR = "2018",
NUMBER = "5",
MONTH = "May",
PAGES = "793-800",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204598"}
Last update: