@article{bb209600,
AUTHOR = "Guan, S.U. and Xie, P. and Li, H.",
TITLE = "A golden-block-based self-refining scheme for repetitive patterned
wafer inspections",
JOURNAL = MVA,
VOLUME = "13",
YEAR = "2003",
NUMBER = "5-6",
PAGES = "314-321",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204699"}
@inproceedings{bb209601,
AUTHOR = "Guan, S.U. and Xie, P.",
TITLE = "A golden block self-generating scheme for continuous patterned wafer
inspections",
BOOKTITLE = CIAP99,
YEAR = "1999",
PAGES = "436-441",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204700"}
@article{bb209602,
AUTHOR = "Zoroofi, R.A. and Taketani, H. and Tamura, S. and Sato, Y. and Sekiya, K.",
TITLE = "Automated inspection of IC wafer contamination",
JOURNAL = PR,
VOLUME = "34",
YEAR = "2001",
NUMBER = "6",
MONTH = "June",
PAGES = "1307-1317",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204701"}
@article{bb209603,
AUTHOR = "van Dop, E.R. and Regtien, P.P.L.",
TITLE = "Multi-sensor recognition of electronic components",
JOURNAL = MVA,
VOLUME = "12",
YEAR = "2001",
NUMBER = "5",
PAGES = "213-222",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204702"}
@article{bb209604,
AUTHOR = "Ye, Q.Z. and Ong, S.H. and Han, X.",
TITLE = "A stereo vision system for the inspection of IC bonding wires",
JOURNAL = IJIST,
VOLUME = "11",
YEAR = "2001",
NUMBER = "4",
PAGES = "254-262",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204703"}
@article{bb209605,
AUTHOR = "Brehelin, L. and Gascuel, O. and Caraux, G.",
TITLE = "Hidden Markov Models with Patterns to Learn Boolean Vector Sequences
and Application to the Built-In Self-Test for Integrated Circuits",
JOURNAL = PAMI,
VOLUME = "23",
YEAR = "2001",
NUMBER = "9",
MONTH = "September",
PAGES = "997-1008",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204704"}
@article{bb209606,
AUTHOR = "Qu, G.Y. and Wood, S.L. and Teh, C.",
TITLE = "Wafer Defect Detection Using Directional Morphological Gradient
Techniques",
JOURNAL = JASP,
VOLUME = "2002",
YEAR = "2002",
NUMBER = "7",
MONTH = "July",
PAGES = "686-703",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204705"}
@article{bb209607,
AUTHOR = "Tobin, K.W. and Karnowski, T.P. and Arrowood, L.F. and Ferrell, R.K. and Goddard, J.S. and Lakhani, F.",
TITLE = "Content-Based Image Retrieval for Semiconductor Process
Characterization",
JOURNAL = JASP,
VOLUME = "2002",
YEAR = "2002",
NUMBER = "7",
MONTH = "July",
PAGES = "704-713",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204706"}
@article{bb209608,
AUTHOR = "Tsai, D.M. and Chou, C.C.",
TITLE = "A fast focus measure for video display inspection",
JOURNAL = MVA,
VOLUME = "14",
YEAR = "2003",
NUMBER = "3",
MONTH = "July",
PAGES = "192-196",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204707"}
@article{bb209609,
AUTHOR = "Roh, Y.J. and Park, W.S. and Cho, H.S.",
TITLE = "Correcting image distortion in the X-ray digital tomosynthesis system
for PCB solder joint inspection",
JOURNAL = IVC,
VOLUME = "21",
YEAR = "2003",
NUMBER = "12",
MONTH = "November",
PAGES = "1063-1075",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204708"}
@article{bb209610,
AUTHOR = "Baidyk, T. and Kussul, E. and Makeyev, O. and Caballero, A. and Ruiz, L. and Carrera, G. and Velasco, G.",
TITLE = "Flat image recognition in the process of microdevice assembly",
JOURNAL = PRL,
VOLUME = "25",
YEAR = "2004",
NUMBER = "1",
MONTH = "January",
PAGES = "107-118",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204709"}
@article{bb209611,
AUTHOR = "Toledo, G.K. and Kussul, E. and Baidyk, T.",
TITLE = "Neural classifier for micro work piece recognition",
JOURNAL = IVC,
VOLUME = "24",
YEAR = "2006",
NUMBER = "8",
MONTH = "August",
PAGES = "827-836",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204710"}
@article{bb209612,
AUTHOR = "Toledo, G.K. and Kussul, E. and Baidyk, T.",
TITLE = "Work piece recognition based on the permutation neural classifier
technique",
JOURNAL = MVA,
VOLUME = "22",
YEAR = "2011",
NUMBER = "3",
MONTH = "May",
PAGES = "495-504",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204711"}
@article{bb209613,
AUTHOR = "Fang, T. and Jafari, M.A. and Danforth, S.C. and Safari, A.",
TITLE = "Signature analysis and defect detection in layered manufacturing of
ceramic sensors and actuators",
JOURNAL = MVA,
VOLUME = "15",
YEAR = "2003",
NUMBER = "2",
MONTH = "December",
PAGES = "63-75",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204712"}
@article{bb209614,
AUTHOR = "Zervakis, M.E. and Goumas, S.K. and Rovithakis, G.A.",
TITLE = "A Bayesian Framework for Multilead SMD Post-Placement Quality
Inspection",
JOURNAL = SMC-B,
VOLUME = "34",
YEAR = "2004",
NUMBER = "1",
MONTH = "February",
PAGES = "440-453",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204713"}
@inproceedings{bb209615,
AUTHOR = "Goumas, S.K. and Rovithakis, G.A. and Zervakis, M.E.",
TITLE = "A Bayesian image analysis framework for post-placement quality
inspection of components",
BOOKTITLE = ICIP02,
YEAR = "2002",
PAGES = "II: 549-552",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204714"}
@article{bb209616,
AUTHOR = "Kubota, T. and Talekar, P. and Ma, X.Y. and Sudarshan, T.S.",
TITLE = "A nondestructive automated defect detection system for silicon carbide
wafers",
JOURNAL = MVA,
VOLUME = "16",
YEAR = "2005",
NUMBER = "3",
MONTH = "May",
PAGES = "170-176",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204715"}
@article{bb209617,
AUTHOR = "di Palma, F. and de Nicolao, G. and Miraglia, G. and Pasquinetti, E. and Piccinini, F.",
TITLE = "Unsupervised spatial pattern classification of electrical-wafer-sorting
maps in semiconductor manufacturing",
JOURNAL = PRL,
VOLUME = "26",
YEAR = "2005",
NUMBER = "12",
MONTH = "September",
PAGES = "1857-1865",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204716"}
@article{bb209618,
AUTHOR = "Shankar, N.G. and Zhong, Z.W.",
TITLE = "Improved segmentation of semiconductor defects using area sieves",
JOURNAL = MVA,
VOLUME = "17",
YEAR = "2006",
NUMBER = "1",
MONTH = "April",
PAGES = "1-7",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204717"}
@article{bb209619,
AUTHOR = "Lin, H.D.",
TITLE = "Tiny surface defect inspection of electronic passive components using
discrete cosine transform decomposition and cumulative sum techniques",
JOURNAL = IVC,
VOLUME = "26",
YEAR = "2008",
NUMBER = "5",
MONTH = "May",
PAGES = "603-621",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204718"}
@article{bb209620,
AUTHOR = "Watanabe, T. and Kusano, A. and Fujiwara, T. and Koshimizu, H.",
TITLE = "3D Precise Inspection of Terminal Lead for Electronic Devices by Single
Camera Stereo Vision",
JOURNAL = IEICE,
VOLUME = "E91-D",
YEAR = "2008",
NUMBER = "7",
MONTH = "July",
PAGES = "1885-1892",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204719"}
@inproceedings{bb209621,
AUTHOR = "Kusano, A. and Watanabe, T. and Funahashi, T. and Koshimizu, H.",
TITLE = "Defect detection of terminal lead by single stereo vision",
BOOKTITLE = FCV13,
YEAR = "2013",
PAGES = "237-241",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204720"}
@article{bb209622,
AUTHOR = "Last, M. and Kandel, A.",
TITLE = "Perception-based Analysis Of Engineering Experiments In The
Semiconductor Industry",
JOURNAL = IJIG,
VOLUME = "2",
YEAR = "2002",
NUMBER = "1",
MONTH = "January",
PAGES = "107-126",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204721"}
@article{bb209623,
AUTHOR = "Ng, A.N.Y. and Lam, E.Y. and Chung, R. and Fung, K.S.M. and Leung, W.H.",
TITLE = "Reference-free Machine Vision Inspection Of Semiconductor Die Images",
JOURNAL = IJIG,
VOLUME = "9",
YEAR = "2009",
NUMBER = "1",
MONTH = "January",
PAGES = "133-152",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204722"}
@article{bb209624,
AUTHOR = "Chen, C.S. and Yeh, C.W. and Yin, P.Y.",
TITLE = "A novel Fourier descriptor based image alignment algorithm for
automatic optical inspection",
JOURNAL = JVCIR,
VOLUME = "20",
YEAR = "2009",
NUMBER = "3",
MONTH = "April",
PAGES = "178-189",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204723"}
@article{bb209625,
AUTHOR = "Chang, C.Y. and Li, C.H. and Lin, S.Y. and Jeng, M.",
TITLE = "Application of Two Hopfield Neural Networks for Automatic Four-Element
LED Inspection",
JOURNAL = SMC-C,
VOLUME = "39",
YEAR = "2009",
NUMBER = "3",
MONTH = "May",
PAGES = "352-365",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204724"}
@article{bb209626,
AUTHOR = "Tsai, D.M. and Chang, C.C. and Chao, S.M.",
TITLE = "Micro-crack inspection in heterogeneously textured solar wafers using
anisotropic diffusion",
JOURNAL = IVC,
VOLUME = "28",
YEAR = "2010",
NUMBER = "3",
MONTH = "March",
PAGES = "491-501",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204725"}
@article{bb209627,
AUTHOR = "Zontak, M. and Cohen, I.",
TITLE = "Defect detection in patterned wafers using anisotropic kernels",
JOURNAL = MVA,
VOLUME = "21",
YEAR = "2010",
NUMBER = "2",
MONTH = "February",
PAGES = "xx-yy",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204726"}
@article{bb209628,
AUTHOR = "Sun, T.H. and Tseng, C.C. and Chen, M.S.",
TITLE = "Electric contacts inspection using machine vision",
JOURNAL = IVC,
VOLUME = "28",
YEAR = "2010",
NUMBER = "6",
MONTH = "June",
PAGES = "890-901",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204727"}
@article{bb209629,
AUTHOR = "Fan, S.K.S. and Chuang, Y.C.A.",
TITLE = "Automatic detection of Mura defect in TFT-LCD based on regression
diagnostics",
JOURNAL = PRL,
VOLUME = "31",
YEAR = "2010",
NUMBER = "15",
MONTH = "November",
PAGES = "2397-2404",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204728"}
@article{bb209630,
AUTHOR = "Zhang, J. and Kim, Y. and Yang, S.H. and Milster, T.D.",
TITLE = "Illumination artifacts in hyper-NA vector imaging",
JOURNAL = JOSA-A,
VOLUME = "27",
YEAR = "2010",
NUMBER = "10",
MONTH = "October",
PAGES = "2272-2284",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204729"}
@article{bb209631,
AUTHOR = "He, X.F. and Fang, F.",
TITLE = "Flat-Panel Color Filter Inspection",
JOURNAL = VisSys,
VOLUME = "16",
YEAR = "2011",
NUMBER = "5",
MONTH = "May",
PAGES = "xx-yy",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204730"}
@article{bb209632,
AUTHOR = "Benedek, C.",
TITLE = "Detection of soldering defects in Printed Circuit Boards with
Hierarchical Marked Point Processes",
JOURNAL = PRL,
VOLUME = "32",
YEAR = "2011",
NUMBER = "13",
MONTH = "October",
PAGES = "1535-1543",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204731"}
@article{bb209633,
AUTHOR = "Peng, Y. and Zhang, J.Y. and Wang, Y. and Yu, Z.P.",
TITLE = "Gradient-Based Source and Mask Optimization in Optical Lithography",
JOURNAL = IP,
VOLUME = "20",
YEAR = "2011",
NUMBER = "10",
MONTH = "October",
PAGES = "2856-2864",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204732"}
@article{bb209634,
AUTHOR = "Long, T. and Wang, H. and Long, B.",
TITLE = "Test generation algorithm for analog systems based on support vector
machine",
JOURNAL = SIViP,
VOLUME = "5",
YEAR = "2011",
NUMBER = "4",
MONTH = "November",
PAGES = "527-533",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204733"}
@article{bb209635,
AUTHOR = "Ibrahim, A. and Tominaga, S. and Horiuchi, T.",
TITLE = "Invariant representation for spectral reflectance images and its
application",
JOURNAL = JIVP,
VOLUME = "2011",
YEAR = "2011",
NUMBER = "1 2011",
PAGES = "xx-yy",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204734"}
@inproceedings{bb209636,
AUTHOR = "Ibrahim, A. and Tominaga, S. and Horiuchi, T.",
TITLE = "Spectral Invariant Representation for Spectral Reflectance Image",
BOOKTITLE = ICPR10,
YEAR = "2010",
PAGES = "2776-2779",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204735"}
@inproceedings{bb209637,
AUTHOR = "Ibrahim, A. and Tominaga, S. and Horiuchi, T.",
TITLE = "Material Classification for Printed Circuit Boards by Spectral Imaging
System",
BOOKTITLE = CCIW09,
YEAR = "2009",
PAGES = "216-225",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204736"}
@inproceedings{bb209638,
AUTHOR = "Horiuchi, T. and Ibrahim, A. and Kadoi, H. and Tominaga, S.",
TITLE = "An Effective Method for Illumination-Invariant Representation of Color
Images",
BOOKTITLE = Color12,
YEAR = "2012",
PAGES = "II: 401-410",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204737"}
@inproceedings{bb209639,
AUTHOR = "Ibrahim, A. and Horiuchi, T. and Tominaga, S.",
TITLE = "Illumination-invariant representation for natural color images and its
application",
BOOKTITLE = Southwest12,
YEAR = "2012",
PAGES = "157-160",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204738"}
@inproceedings{bb209640,
AUTHOR = "Tominaga, S. and Okamoto, S.",
TITLE = "Reflectance-based material classification for printed circuit boards",
BOOKTITLE = CIAP03,
YEAR = "2003",
PAGES = "238-243",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204739"}
@inproceedings{bb209641,
AUTHOR = "Horiuchi, T. and Suzuki, Y. and Tominaga, S.",
TITLE = "Material Classification for Printed Circuit Boards by Kernel Fisher
Discriminant Analysis",
BOOKTITLE = CCIW11,
YEAR = "2011",
PAGES = "152-164",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204740"}
@article{bb209642,
AUTHOR = "Choy, S.K. and Jia, N.N. and Tong, C.S. and Tang, M.L. and Lam, E.Y.",
TITLE = "A Robust Computational Algorithm for Inverse Photomask Synthesis in
Optical Projection Lithography",
JOURNAL = SIIMS,
VOLUME = "5",
YEAR = "2012",
NUMBER = "1 2012",
PAGES = "625-651",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204741"}
@inproceedings{bb209643,
AUTHOR = "Jia, N.N. and Lam, E.Y.",
TITLE = "Stochastic gradient descent for robust inverse photomask synthesis in
optical lithography",
BOOKTITLE = ICIP10,
YEAR = "2010",
PAGES = "4173-4176",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204742"}
@article{bb209644,
AUTHOR = "Yu, J.C. and Yu, P. and Chao, H.Y.",
TITLE = "Library-Based Illumination Synthesis for Critical CMOS Patterning",
JOURNAL = IP,
VOLUME = "22",
YEAR = "2013",
NUMBER = "7",
PAGES = "2811-2821",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204743"}
@article{bb209645,
AUTHOR = "Xu, S. and Cheng, Z. and Gao, Y. and Pan, Q.",
TITLE = "Visual wafer dies counting using geometrical characteristics",
JOURNAL = IET-IPR,
VOLUME = "8",
YEAR = "2014",
NUMBER = "5",
MONTH = "May",
PAGES = "280-288",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204744"}
@article{bb209646,
AUTHOR = "Duan, G.F. and Wang, H.C. and Liu, Z.Y. and Tan, J.R. and Chen, Y.W.",
TITLE = "Automatic optical phase identification of micro-drill bits based on
improved ASM and bag of shape segment in PCB production",
JOURNAL = MVA,
VOLUME = "25",
YEAR = "2014",
NUMBER = "6",
PAGES = "1411-1422",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204745"}
@article{bb209647,
AUTHOR = "Leibovici, M.C.R. and Gaylord, T.K.",
TITLE = "Custom-modified three-dimensional periodic microstructures by
pattern-integrated interference lithography",
JOURNAL = JOSA-A,
VOLUME = "31",
YEAR = "2014",
NUMBER = "7",
MONTH = "July",
PAGES = "1515-1519",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204746"}
@article{bb209648,
AUTHOR = "Estellers, V. and Thiran, J.P. and Gabrani, M.",
TITLE = "Surface Reconstruction From Microscopic Images in Optical Lithography",
JOURNAL = IP,
VOLUME = "23",
YEAR = "2014",
NUMBER = "8",
MONTH = "August",
PAGES = "3560-3573",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204747"}
@article{bb209649,
AUTHOR = "Bernal, F. and Acebron, J.A. and Anjam, I.",
TITLE = "A Stochastic Algorithm Based on Fast Marching for Automatic
Capacitance Extraction in Non-Manhattan Geometries",
JOURNAL = SIIMS,
VOLUME = "7",
YEAR = "2014",
NUMBER = "4",
PAGES = "2657-2674",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204748"}
@article{bb209650,
AUTHOR = "Lakhssassi, A. and Palenychka, R. and Savaria, Y. and Sayde, M. and Zaremba, M.",
TITLE = "Monitoring Thermal Stress in Wafer-Scale Integrated Circuits by the
Attentive Vision Method Using an Infrared Camera",
JOURNAL = CirSysVideo,
VOLUME = "26",
YEAR = "2016",
NUMBER = "2",
MONTH = "February",
PAGES = "412-424",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204749"}
@article{bb209651,
AUTHOR = "Chebolu, A. and Nagahanumaiah",
TITLE = "Contact angle measurement techniques on micro-patterned surfaces:
A comparative analysis",
JOURNAL = IJCVR,
VOLUME = "7",
YEAR = "2017",
NUMBER = "1/2",
PAGES = "148-159",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204750"}
@article{bb209652,
AUTHOR = "Sindagi, V.A. and Srivastava, S.",
TITLE = "Domain Adaptation for Automatic OLED Panel Defect Detection Using
Adaptive Support Vector Data Description",
JOURNAL = IJCV,
VOLUME = "122",
YEAR = "2017",
NUMBER = "2",
MONTH = "April",
PAGES = "193-211",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204751"}
@article{bb209653,
AUTHOR = "Qiao, K. and Zeng, L. and Chen, J. and Hai, J.J. and Yan, B.",
TITLE = "Wire segmentation for printed circuit board using deep convolutional
neural network and graph cut model",
JOURNAL = IET-IPR,
VOLUME = "12",
YEAR = "2018",
NUMBER = "5",
MONTH = "May",
PAGES = "793-800",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204752"}
@article{bb209654,
AUTHOR = "Boscaro, A. and Jacquir, S. and Chef, S. and Sanchez, K. and Perdu, P. and Binczak, S.",
TITLE = "Automatic localization of signal sources in photon emission images for
integrated circuit analysis",
JOURNAL = SIViP,
VOLUME = "12",
YEAR = "2018",
NUMBER = "4",
MONTH = "May",
PAGES = "775-782",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204753"}
@article{bb209655,
AUTHOR = "Kaur, B. and Kaur, G. and Kaur, A.",
TITLE = "Detection of defective printed circuit boards using image processing",
JOURNAL = IJCVR,
VOLUME = "8",
YEAR = "2018",
NUMBER = "4",
PAGES = "418-434",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204754"}
@article{bb209656,
AUTHOR = "Ashikin, F. and Hashizume, M. and Yotsuyanagi, H. and Lu, S.K. and Roth, Z.",
TITLE = "A Design for Testability of Open Defects at Interconnects in 3D Stacked
ICs",
JOURNAL = IEICE,
VOLUME = "E101-D",
YEAR = "2018",
NUMBER = "8",
MONTH = "August",
PAGES = "2053-2063",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204755"}
@article{bb209657,
AUTHOR = "Cheng, D. and Shi, Y.Q. and Gwee, B.H. and Toh, K.A. and Lin, T.",
TITLE = "A Hierarchical Multiclassifier System for Automated Analysis of
Delayered IC Images",
JOURNAL = IEEE_Int_Sys,
VOLUME = "34",
YEAR = "2019",
NUMBER = "2",
MONTH = "March",
PAGES = "36-43",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204756"}
@article{bb209658,
AUTHOR = "Han, H. and Gao, C.Q. and Zhao, Y. and Liao, S.S. and Tang, L. and Li, X.D.",
TITLE = "Polycrystalline silicon wafer defect segmentation based on deep
convolutional neural networks",
JOURNAL = PRL,
VOLUME = "130",
YEAR = "2020",
PAGES = "234-241",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204757"}
@article{bb209659,
AUTHOR = "Shen, J.Q. and Liu, N.Z. and Sun, H.",
TITLE = "Defect detection of printed circuit board based on lightweight deep
convolution network",
JOURNAL = IET-IPR,
VOLUME = "14",
YEAR = "2020",
NUMBER = "15",
MONTH = "December",
PAGES = "3932-3940",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204758"}
@article{bb209660,
AUTHOR = "Mitic, V. and Serpa, C. and Ilic, I. and Mohr, M. and Fecht, H.J.",
TITLE = "Fractal Nature of Advanced Ni-Based Superalloys Solidified on Board
the International Space Station",
JOURNAL = RS,
VOLUME = "13",
YEAR = "2021",
NUMBER = "9",
PAGES = "xx-yy",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204759"}
@article{bb209661,
AUTHOR = "Frittoli, L. and Carrera, D. and Rossi, B. and Fragneto, P. and Boracchi, G.",
TITLE = "Deep open-set recognition for silicon wafer production monitoring",
JOURNAL = PR,
VOLUME = "124",
YEAR = "2022",
PAGES = "108488",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204760"}
@article{bb209662,
AUTHOR = "Pan, J.W. and Zeng, D.Y. and Tan, Q. and Wu, Z.Z. and Ren, Z.G.",
TITLE = "EU-Net: A novel semantic segmentation architecture for surface defect
detection of mobile phone screens",
JOURNAL = IET-IPR,
VOLUME = "16",
YEAR = "2022",
NUMBER = "10",
PAGES = "2568-2576",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204761"}
@article{bb209663,
AUTHOR = "Lin, G. and Kong, L.F. and Liu, T. and Qiu, L. and Chen, X.",
TITLE = "An antagonistic training algorithm for TFT-LCD module mura defect
detection",
JOURNAL = SP:IC,
VOLUME = "107",
YEAR = "2022",
PAGES = "116791",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204762"}
@article{bb209664,
AUTHOR = "Liu, Q. and Wang, M. and Wang, H.X. and Hanajima, N.",
TITLE = "MPGI-Terminal defect detection based on M-FRCNN",
JOURNAL = IET-IPR,
VOLUME = "17",
YEAR = "2023",
NUMBER = "2",
PAGES = "428-438",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204763"}
@article{bb209665,
AUTHOR = "Kim, B.J. and Choi, H. and Jang, H. and Lee, D.G. and Jeong, W. and Kim, S.W.",
TITLE = "Dead pixel test using effective receptive field",
JOURNAL = PRL,
VOLUME = "167",
YEAR = "2023",
PAGES = "149-156",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204764"}
@article{bb209666,
AUTHOR = "Wang, Y.T. and Wang, J.G. and Cao, Y.S. and Li, S.X. and Kwan, O.",
TITLE = "Integrated Inspection on PCB Manufacturing in Cyber-Physical-Social
Systems",
JOURNAL = SMCS,
VOLUME = "53",
YEAR = "2023",
NUMBER = "4",
MONTH = "April",
PAGES = "2098-2106",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204765"}
@article{bb209667,
AUTHOR = "Zhao, J. and Zhu, B. and Peng, M. and Li, L.L.",
TITLE = "Mobile phone screen surface scratch detection based on optimized
YOLOv5 model (OYm)",
JOURNAL = IET-IPR,
VOLUME = "17",
YEAR = "2023",
NUMBER = "5",
PAGES = "1364-1374",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204766"}
@inproceedings{bb209668,
AUTHOR = "Xu, C. and Famouri, M. and Bathla, G. and Nair, S. and Shafiee, M.J. and Wong, A.",
TITLE = "CellDefectNet: A Machine-designed Attention Condenser Network for
Electroluminescence-based Photovoltaic Cell Defect Inspection",
BOOKTITLE = CRV22,
YEAR = "2022",
PAGES = "219-223",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204767"}
@inproceedings{bb209669,
AUTHOR = "Cai, L. and Pahwa, R.S. and Xu, X. and Wang, J. and Chang, R. and Zhang, L. and Foo, C.S.",
TITLE = "Exploring Active Learning for Semiconductor Defect Segmentation",
BOOKTITLE = ICIP22,
YEAR = "2022",
PAGES = "1796-1800",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204768"}
@inproceedings{bb209670,
AUTHOR = "Yang, Y.F. and Sun, M.",
TITLE = "Semiconductor Defect Detection by Hybrid Classical-Quantum Deep
Learning",
BOOKTITLE = CVPR22,
YEAR = "2022",
PAGES = "2313-2322",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204769"}
@inproceedings{bb209671,
AUTHOR = "Barone, M.",
TITLE = "Robust Image Wafer Inspection",
BOOKTITLE = IPTA20,
YEAR = "2020",
PAGES = "1-6",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204770"}
@inproceedings{bb209672,
AUTHOR = "Bette, A.C. and Brus, P. and Balazs, G. and Ludwig, M. and Knoll, A.",
TITLE = "Automated Defect Inspection in Reverse Engineering of Integrated
Circuits",
BOOKTITLE = WACV22,
YEAR = "2022",
PAGES = "1809-1818",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204771"}
@inproceedings{bb209673,
AUTHOR = "Li, F. and Hu, G. and Zhu, S.",
TITLE = "Weakly-Supervised Defect Segmentation Within Visual Inspection Images
of Liquid Crystal Displays in Array Process",
BOOKTITLE = ICIP20,
YEAR = "2020",
PAGES = "743-747",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204772"}
@inproceedings{bb209674,
AUTHOR = "El Bakkali, M. and Elkhaldi, S. and Elftouh, H. and Touhami, N.A.",
TITLE = "Small-Signal Modeling of GaAs: pHEMT Using Direct Extraction Method",
BOOKTITLE = ISCV20,
YEAR = "2020",
PAGES = "1-5",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204773"}
@inproceedings{bb209675,
AUTHOR = "Mahalingam, G. and Gay, K.M. and Ricanek, K.",
TITLE = "PCB-METAL: A PCB Image Dataset for Advanced Computer Vision Machine
Learning Component Analysis",
BOOKTITLE = MVA19,
YEAR = "2019",
PAGES = "1-5",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204774"}
@inproceedings{bb209676,
AUTHOR = "di Bella, R. and Carrera, D. and Rossi, B. and Fragneto, P. and Boracchi, G.",
TITLE = "Wafer Defect Map Classification Using Sparse Convolutional Networks",
BOOKTITLE = CIAP19,
YEAR = "2019",
PAGES = "II:125-136",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204775"}
@inproceedings{bb209677,
AUTHOR = "Kuo, C. and Ashmore, J. and Huggins, D. and Kira, Z.",
TITLE = "Data-Efficient Graph Embedding Learning for PCB Component Detection",
BOOKTITLE = WACV19,
YEAR = "2019",
PAGES = "551-560",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204776"}
@inproceedings{bb209678,
AUTHOR = "Alagic, D. and Bluder, O. and Pilz, J.",
TITLE = "Quantification and Prediction of Damage in SAM Images of Semiconductor
Devices",
BOOKTITLE = ICIAR18,
YEAR = "2018",
PAGES = "490-496",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204777"}
@inproceedings{bb209679,
AUTHOR = "Schrunner, S. and Bluder, O. and Zernig, A. and Kaestner, A. and Kern, R.",
TITLE = "Markov random fields for pattern extraction in analog wafer test data",
BOOKTITLE = IPTA17,
YEAR = "2017",
PAGES = "1-6",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204778"}
@inproceedings{bb209680,
AUTHOR = "Park, Y. and Kang, K. and Kim, S.",
TITLE = "A Visual Inspection Method Based on Periodic Feature for Wheel Mark
Defect on Wafer Backside",
BOOKTITLE = CAIP17,
YEAR = "2017",
PAGES = "I: 219-227",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204779"}
@inproceedings{bb209681,
AUTHOR = "Wang, W. and Lei, X. and Ding, S.T. and He, X.F. and Li, H.R.",
TITLE = "Optimal layout algorithm for reusing solar cell fragments",
BOOKTITLE = ICIVC17,
YEAR = "2017",
PAGES = "277-280",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204780"}
@inproceedings{bb209682,
AUTHOR = "Pramerdorfer, C. and Kampel, M.",
TITLE = "A dataset for computer-vision-based PCB analysis",
BOOKTITLE = MVA15,
YEAR = "2015",
PAGES = "378-381",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204781"}
@inproceedings{bb209683,
AUTHOR = "Sindagi, V.A. and Srivastava, S.",
TITLE = "OLED panel defect detection using local inlier-outlier ratios and
modified LBP",
BOOKTITLE = MVA15,
YEAR = "2015",
PAGES = "214-217",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204782"}
@inproceedings{bb209684,
AUTHOR = "Fuksis, R. and Pudzs, M. and Kravtsov, A. and Kravtsov, A.",
TITLE = "Measuring the Radius of Meniscus Ring During the Growth of Silicon Rods",
BOOKTITLE = SCIA15,
YEAR = "2015",
PAGES = "462-471",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204783"}
@inproceedings{bb209685,
AUTHOR = "Matlin, E. and Troy, N. and Stoker, D.",
TITLE = "Imaging activity in integrated circuits",
BOOKTITLE = ICIP14,
YEAR = "2014",
PAGES = "5821-5825",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204784"}
@inproceedings{bb209686,
AUTHOR = "Xie, F. and Dau, A.H. and Uitdenbogerd, A.L. and Song, A.",
TITLE = "Evolving PCB visual inspection programs using genetic programming",
BOOKTITLE = IVCNZ13,
YEAR = "2013",
PAGES = "406-411",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204785"}
@inproceedings{bb209687,
AUTHOR = "Schwarzbauer, T. and Welk, M. and Mayrhofer, C. and Schubert, R.",
TITLE = "Automated Quality Inspection of Microfluidic Chips Using Morphologic
Techniques",
BOOKTITLE = ISMM13,
YEAR = "2013",
PAGES = "508-519",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204786"}
@inproceedings{bb209688,
AUTHOR = "Kimura, Y. and Takauji, H. and Kaneko, S. and Domae, Y. and Okuda, H.",
TITLE = "Shape recognition of flexible cables by Outer Edge FCM clustering",
BOOKTITLE = FCV11,
YEAR = "2011",
PAGES = "1-5",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204787"}
@inproceedings{bb209689,
AUTHOR = "Takagi, Y.J. and Asano, T. and Liu, W. and Yao, J.",
TITLE = "Color uniformity evaluation of electronic displays based on visual
sensitivity",
BOOKTITLE = FCV11,
YEAR = "2011",
PAGES = "1-5",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204788"}
@inproceedings{bb209690,
AUTHOR = "Buddhachan, V. and KaewTrakulPong, P.",
TITLE = "Machine Vision for Excess Gluing Inspection in Spindle Motor Assembly",
BOOKTITLE = MVA09,
YEAR = "2009",
PAGES = "304-",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204789"}
@inproceedings{bb209691,
AUTHOR = "Ibrahim, A. and Tominaga, S. and Horiuchi, T.",
TITLE = "Unsupervised Material Classification of Printed Circuit Boards Using
Dimension-Reduced Spectral Information",
BOOKTITLE = MVA09,
YEAR = "2009",
PAGES = "435-",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204790"}
@inproceedings{bb209692,
AUTHOR = "Kryszczuk, K. and Hurley, P. and Sayah, R.",
TITLE = "Direct Printability Prediction in VLSI Using Features from Orthogonal
Transforms",
BOOKTITLE = ICPR10,
YEAR = "2010",
PAGES = "2764-2767",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204791"}
@inproceedings{bb209693,
AUTHOR = "Lichtenauer, M.S. and Avelar, S. and Toporek, G.",
TITLE = "Segmentation of Images of Lead Free Solder",
BOOKTITLE = ICISP10,
YEAR = "2010",
PAGES = "165-172",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204792"}
@inproceedings{bb209694,
AUTHOR = "Duan, G.F. and Chen, Y.W.",
TITLE = "Improved Active Shape Model for automatic optical phase identification
of microdrill bits in Printed Circuit Board production",
BOOKTITLE = ICIP09,
YEAR = "2009",
PAGES = "425-428",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204793"}
@inproceedings{bb209695,
AUTHOR = "Li, T.Z. and Wen, F. and Lu, H.W. and Ma, L.X.",
TITLE = "Study on the Treatment Technology and Application of Charge Coupled
Device",
BOOKTITLE = CISP09,
YEAR = "2009",
PAGES = "1-5",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204794"}
@inproceedings{bb209696,
AUTHOR = "Pieters, R. and Jonker, P.P. and Nijmeijer, H.",
TITLE = "Real-Time Center Detection of an OLED Structure",
BOOKTITLE = ACIVS09,
YEAR = "2009",
PAGES = "400-409",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204795"}
@inproceedings{bb209697,
AUTHOR = "Liu, X. and Yang, L.X.",
TITLE = "Study on virtual simulation of chip during manufacturing",
BOOKTITLE = IASP09,
YEAR = "2009",
PAGES = "346-350",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204796"}
@inproceedings{bb209698,
AUTHOR = "Nedzved, A. and Ablameyko, S. and Belotserkovsky, A. and Maziewski, A. and Dobrogowski, W.",
TITLE = "The structure analysis of ultra thin magnetic film images",
BOOKTITLE = ICPR08,
YEAR = "2008",
PAGES = "1-4",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204797"}
@inproceedings{bb209699,
AUTHOR = "Huttunen, H. and Ruusuvuori, P. and Manninen, T. and Rutanen, K. and Ronkka, R. and Visa, A.",
TITLE = "Object detection for dynamic adaptation of interconnections in inkjet
printed electronics",
BOOKTITLE = ICIP08,
YEAR = "2008",
PAGES = "2364-2367",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT204798"}
Last update:Jun 1, 2023 at 10:05:03