@inproceedings{bb222800, AUTHOR = "Sablatnig, R.", TITLE = "Flexible Automatic Visual Inspection Based on the Separation of Detection And Analysis", BOOKTITLE = ICPR96, YEAR = "1996", PAGES = "III: 944-948", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT217803"} @inproceedings{bb222801, AUTHOR = "Pascoletti, A. and Trucco, E.", TITLE = "On Uncalibrated Motion-Based Inspection for Conveyor-Belt Systems", BOOKTITLE = BMVC96, YEAR = "1996", PAGES = "Poster Session 2", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT217804"} @article{bb222802, AUTHOR = "Boukouvalas, C. and Kittler, J.V. and Marik, R. and Petrou, M.", TITLE = "Automatic Grading of Textured Ceramic Tiles", JOURNAL = SPIE, VOLUME = "2425", YEAR = "1995", MONTH = "February", PAGES = "248-256", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT217805"} @inproceedings{bb222803, AUTHOR = "Anzalone, A. and Machi, A.", TITLE = "Real-Time Visual Inspection of Moulded Plastics Drippers", BOOKTITLE = CAMP95, YEAR = "1995", PAGES = "xx", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT217806"} @inproceedings{bb222804, AUTHOR = "Bartels, K.A. and Fisher, J.L.", TITLE = "Multifrequency eddy current image processing techniques for nondestructive evaluation", BOOKTITLE = ICIP95, YEAR = "1995", PAGES = "I: 486-489", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT217807"} @inproceedings{bb222805, AUTHOR = "Brzakovic, D. and Vujovic, N.", TITLE = "Development environment for designing and testing inspection systems", BOOKTITLE = ICPR94, YEAR = "1994", PAGES = "C:366-369", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT217808"} @inproceedings{bb222806, AUTHOR = "Hartley, R.I. and Noble, J.A. and Grande, J. and Liu, J.", TITLE = "Quantitative measurement of manufactured diamond shape", BOOKTITLE = ECCV94, YEAR = "1994", PAGES = "A:433-440", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT217809"} @inproceedings{bb222807, AUTHOR = "Jenkins, M.R.M. and Jepson, A.", TITLE = "Detecting Floor Anomalies", BOOKTITLE = BMVC94, YEAR = "1994", PAGES = "xx-yy", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT217810"} @inproceedings{bb222808, AUTHOR = "Koeinig, A. and Bulmahn, O. and Glesner, M.", TITLE = "Systematic Methods for Multivariate Data Visualization and Numerical Assessment of Class Separability and Overlap in Automated Visual Industrial Quality Control", BOOKTITLE = BMVC94, YEAR = "1994", PAGES = "xx-yy", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT217811"} @inproceedings{bb222809, AUTHOR = "Sobh, T.M. and Dekhil, M. and Jaynes, C. and Henderson, T.C.", TITLE = "A Perception Framework for Inspection and Reverse Engineering", BOOKTITLE = CVPR93, YEAR = "1993", PAGES = "609-610", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT217812"} @inproceedings{bb222810, AUTHOR = "Mundy, J.L. and Noble, J.A.", TITLE = "Toward Template-Based Tolerancing from a Bayesian Viewpoint", BOOKTITLE = CVPR93, YEAR = "1993", PAGES = "246-252", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT217813"} @inproceedings{bb222811, AUTHOR = "Noble, J.A. and Nguyen, V.D. and Marinos, C. and Tran, A.T. and Farley, J. and Hedengren, K.H. and Mundy, J.L.", TITLE = "Template Guided Visual Inspection", BOOKTITLE = ECCV92, YEAR = "1992", PAGES = "893-901", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT217814"} @inproceedings{bb222812, AUTHOR = "Mundy, J.L. and Noble, J.A. and Marinos, C. and Nguyen, V.D. and Heller, A.J. and Farley, J. and Tran, A.T.", TITLE = "An Object-Oriented Approach to Template Guided Inspection", BOOKTITLE = CVPR92, YEAR = "1992", PAGES = "386-392", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT217815"} @inproceedings{bb222813, AUTHOR = "Palenichka, R.M. and Mysak, R.T.", TITLE = "Model-based adaptive preprocessing of images in automatic visual inspection", BOOKTITLE = CAIP93, YEAR = "1993", PAGES = "732-737", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT217816"} @inproceedings{bb222814, AUTHOR = "Boccignone, G. and Esposito, L. and Marcelli, A.", TITLE = "An experimental vision tool for real time quality control", BOOKTITLE = CAIP93, YEAR = "1993", PAGES = "706-710", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT217817"} @inproceedings{bb222815, AUTHOR = "Modayur, B.R. and Shapiro, L.G.", TITLE = "Automated Inspection Of Machine Parts", BOOKTITLE = ICPR92, YEAR = "1992", PAGES = "I:57-60", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT217818"} @inproceedings{bb222816, AUTHOR = "Nayar, S.K.", TITLE = "Shape recovery methods for visual inspection", BOOKTITLE = WACV92, YEAR = "1992", PAGES = "136-145", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT217819"} @inproceedings{bb222817, AUTHOR = "Ip, H.H.S.", TITLE = "Visual Evidence Accumulation in Radiograph Inspection", BOOKTITLE = BMVC91, YEAR = "1991", PAGES = "xx-yy", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT217820"} @inproceedings{bb222818, AUTHOR = "Avnaim, F. and Boissonnat, J.D.", TITLE = "A geometric approach to inspection", BOOKTITLE = ICPR88, YEAR = "1988", PAGES = "II: 891-893", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT217821"} @inproceedings{bb222819, AUTHOR = "Firschein, O. and Fischler, M.A.", TITLE = "Perceptual Problems in Analyzing Industrial Radiographs", BOOKTITLE = IJCAI81, YEAR = "1981", PAGES = "740-745", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT217822"} @inproceedings{bb222820, AUTHOR = "Barnard, S.T.", TITLE = "Automated Inspection Using Gray-Scale Statistics", BOOKTITLE = AAAI-80, YEAR = "1980", PAGES = "49-52", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT217823"} @inproceedings{bb222821, AUTHOR = "Barnard, S.T.", TITLE = "Automated Inspection Using Gray-Scale Statistics", BOOKTITLE = ICPR80, YEAR = "1980", PAGES = "269-272", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT217823"} @inproceedings{bb222822, AUTHOR = "Peterson, C.", TITLE = "Automated Visual Inspection", BOOKTITLE = ICPR74, YEAR = "1974", PAGES = "", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat835.html#TT217824"} @article{bb222823, AUTHOR = "Chin, R.T.", TITLE = "Automated Visual Inspection Techniques and Applications: A Bibliography", JOURNAL = PR, VOLUME = "15", YEAR = "1982", NUMBER = "4", PAGES = "343-357", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT217825"} @article{bb222824, AUTHOR = "Chin, R.T.", TITLE = "Automated Visual Inspection: 1981 to 1987", JOURNAL = CVGIP, VOLUME = "41", YEAR = "1988", NUMBER = "3", MONTH = "March", PAGES = "346-381", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT217826"} @article{bb222825, AUTHOR = "Chin, R.T. and Harlow, C.A.", TITLE = "Automated Visual Inspection: A Survey", JOURNAL = PAMI, VOLUME = "4", YEAR = "1982", NUMBER = "6", MONTH = "November", PAGES = "557-573", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT217827"} @inproceedings{bb222826, AUTHOR = "Chin, R.T.", TITLE = "Algorithms and Techniques for Automated Visual Inspection", BOOKTITLE = HPRIP86, YEAR = "1986", PAGES = "587-612", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT217828"} @article{bb222827, AUTHOR = "Jarvis, J.F.", TITLE = "Visual Inspection Automation", JOURNAL = Computer, VOLUME = "13", YEAR = "1980", NUMBER = "5", MONTH = "May", PAGES = "32-38", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT217829"} @inproceedings{bb222828, AUTHOR = "Fu, K.S.", TITLE = "Pictorial Pattern Recognition for Industrial Inspection", BOOKTITLE = PDA83, YEAR = "1983", PAGES = "335-349", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT217830"} @article{bb222829, AUTHOR = "Porter, G.B. and Mundy, J.L.", TITLE = "Visual Inspection System Design", JOURNAL = Computer, VOLUME = "13", YEAR = "1980", NUMBER = "5", MONTH = "May", PAGES = "40-48", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT217831"} @article{bb222830, AUTHOR = "Meyers, W.", TITLE = "Industry Begins to Use Visual Pattern Recognition", JOURNAL = Computer, VOLUME = "13", YEAR = "1980", NUMBER = "5", MONTH = "May", PAGES = "21-31", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT217832"} @article{bb222831, AUTHOR = "Agin, G.J.", TITLE = "Computer Vision Systems for Industrial Inspection and Assembly", JOURNAL = Computer, VOLUME = "13", YEAR = "1980", NUMBER = "5", MONTH = "May", PAGES = "11-20", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT217833"} @article{bb222832, AUTHOR = "Yachida, M. and Tsuji, S.", TITLE = "Industrial Computer Vision in Japan", JOURNAL = Computer, VOLUME = "13", YEAR = "1980", NUMBER = "5", MONTH = "May", PAGES = "50-63", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT217834"} @article{bb222833, AUTHOR = "Newman, T.S. and Jain, A.K.", TITLE = "A Survey of Automated Visual Inspection", JOURNAL = CVIU, VOLUME = "61", YEAR = "1995", NUMBER = "2", MONTH = "March", PAGES = "231-262", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT217835"} @book{bb222834, AUTHOR = "Marshall, A.D. and Martin, R.R.", TITLE = "Computer Vision, Models and Inspection", PUBLISHER = "World Scientific", YEAR = "1992", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT217836"} @book{bb222835, AUTHOR = "Pau, L.F.", TITLE = "Computer Vision in Electronics Applications", PUBLISHER = "Plenum", YEAR = "1990", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT217837"} @book{bb222836, AUTHOR = "Pau, L.F.", TITLE = "Computer Vision in Electronics Applications", PUBLISHER = "Book", YEAR = "1990", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT217837"} @article{bb222837, AUTHOR = "Asundi, A.", TITLE = "Special Issue on Computer-Aided Measurement and Inspection", JOURNAL = OptLas, VOLUME = "22", YEAR = "1995", NUMBER = "3", PAGES = "159-160", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT217838"} @article{bb222838, AUTHOR = "Chen, Y.H.", TITLE = "Computer Vision for General-Purpose Visual Inspection: A Fuzzy-Logic Approach", JOURNAL = OptLas, VOLUME = "22", YEAR = "1995", NUMBER = "3", PAGES = "181-192", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT217839"} @article{bb222839, AUTHOR = "Sobh, T.M. and Owen, J. and Jaynes, C. and Dekhil, M. and Henderson, T.C.", TITLE = "Industrial Inspection and Reverse Engineering", JOURNAL = CVIU, VOLUME = "61", YEAR = "1995", NUMBER = "3", MONTH = "May", PAGES = "468-474", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT217840"} @article{bb222840, AUTHOR = "Chen, F.L. and Su, C.T.", TITLE = "Vision-Based Automated Inspection System in Computer-Integrated Manufacturing", JOURNAL = IJAMT, VOLUME = "11", YEAR = "1996", NUMBER = "3", PAGES = "206-213", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT217841"} @article{bb222841, AUTHOR = "Davies, E.R. and Ip, H.H.S.", TITLE = "Guest Editorial: Special Issue on Real-Time Visual Monitoring and Inspection", JOURNAL = RealTimeImg, VOLUME = "4", YEAR = "1998", NUMBER = "5", MONTH = "October", PAGES = "313-315", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT217842"} @inproceedings{bb222842, AUTHOR = "Davies, E.R.", TITLE = "Principles Emerging from the Design of Visual Search Algorithms for Practical Inspection Tasks", BOOKTITLE = IMVIP08, YEAR = "2008", PAGES = "3-20", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT217843"} @article{bb222843, AUTHOR = "Sablatnig, R.", TITLE = "Increasing flexibility for automatic visual inspection: the general analysis graph", JOURNAL = MVA, VOLUME = "12", YEAR = "2000", NUMBER = "4", PAGES = "158-169", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT217844"} @article{bb222844, AUTHOR = "da Fontoura Costa, L. and Meriaudeau, F.", TITLE = "Special Issue on Applied Visual Inspection", JOURNAL = JASP, VOLUME = "2002", YEAR = "2002", NUMBER = "7", MONTH = "July", PAGES = "647-648", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT217845"} @article{bb222845, AUTHOR = "Shirvaikar, M.V.", TITLE = "Trends in automated visual inspection", JOURNAL = RealTimeIP, VOLUME = "1", YEAR = "2006", NUMBER = "1", MONTH = "October", PAGES = "41-43", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT217846"} @inproceedings{bb222846, AUTHOR = "Sannen, D. and van Brussel, H. and Nuttin, M.", TITLE = "Learning Visual Quality Inspection from Multiple Humans Using Ensembles of Classifiers", BOOKTITLE = CVS08, YEAR = "2008", PAGES = "xx-yy", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT217847"} @inproceedings{bb222847, AUTHOR = "Hata, S.", TITLE = "Practical Visual Inspection Techniques: Optics, Micro-electronics and Advanced Software Technology", BOOKTITLE = ICPR00, YEAR = "2000", PAGES = "Vol IV: 114-117", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT217848"} @inproceedings{bb222848, AUTHOR = "Flinchbaugh, B.E.", TITLE = "Industry Needs for Computer Vision and Pattern Recognition: Panel", BOOKTITLE = CVPR96, YEAR = "1996", PAGES = "Panel", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT217849"} @inproceedings{bb222849, AUTHOR = "Petkovic, D.", TITLE = "Human Assisted Computer Vision and Artificial Intelligence -- Why Not?", BOOKTITLE = CVPR96, YEAR = "1996", PAGES = "Invited Talk", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT217850"} @inproceedings{bb222850, AUTHOR = "Noble, J.A. and Mundy, J.L.", TITLE = "Constraint Processing Applied to Industrial Inspection and Continuous Product Improvement", BOOKTITLE = DARPA93, YEAR = "1993", PAGES = "801-809", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT217851"} @inproceedings{bb222851, AUTHOR = "Shapiro, L.G. and Haralick, R.M. and Pong, T.C.", TITLE = "The Visual Components of an Automated Inspection Task", BOOKTITLE = CAIA84, YEAR = "1984", PAGES = "207-210", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat836.html#TT217852"} @article{bb222852, AUTHOR = "Watkins, L.S.", TITLE = "Inspection of IC Photomasks with Intensity Spatial Filters", JOURNAL = PIEEE, VOLUME = "57", YEAR = "1969", PAGES = "1634-1639", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217855"} @article{bb222853, AUTHOR = "Axelrod, N.N.", TITLE = "Intensity Spatial Filtering Applied to Defect Detection in Integrated Circuit Photomasks", JOURNAL = PIEEE, VOLUME = "60", YEAR = "1972", PAGES = "447-448", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217856"} @inproceedings{bb222854, AUTHOR = "Bourdelais, R.J. and Colangelo, D. and McFadyen, R.J. and Elliott, J.F.", TITLE = "Instrument for Automatically Inspecting Integrated Circuit Masks for Pinholes and Spots", BOOKTITLE = US_Patent, YEAR = "1974", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217857"} @article{bb222855, AUTHOR = "Horn, B.K.P.", TITLE = "A Problem in Computer Vision: Orienting Silicon Integrated Circuit Chips for Lead Bonding", JOURNAL = CGIP, VOLUME = "4", YEAR = "1975", NUMBER = "3", MONTH = "September", PAGES = "294-303", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217858"} @inproceedings{bb222856, AUTHOR = "Horn, B.K.P.", TITLE = "Orienting Silicon Integrated Circuit Chips for Lead Bonding", BOOKTITLE = "MIT AI Memo", YEAR = "1975", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217859"} @article{bb222857, AUTHOR = "Harlow, C.A. and Henderson, S.E. and Rayfield, D.A. and Johnson, R.J. and Dwyer, S.J.", TITLE = "Automated Inspection of Electronic Assemblies", JOURNAL = Computer, VOLUME = "8", YEAR = "1975", NUMBER = "4", MONTH = "April", PAGES = "36-45", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217860"} @inproceedings{bb222858, AUTHOR = "Olsen, O.A.", TITLE = "Visual Method of Locating Faults in Printed Circuit Boards", BOOKTITLE = US_Patent, YEAR = "1976", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217861"} @inproceedings{bb222859, AUTHOR = "Baxter, D.W. and Shipway, R.E.", TITLE = "Defect Inspection of Objects Such as Electronic Circuits", BOOKTITLE = US_Patent, YEAR = "1977", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217862"} @article{bb222860, AUTHOR = "McVey, E.S. and van Tol, A.", TITLE = "An experimental printed circuit board drilling system automated by pattern recognition", JOURNAL = PR, VOLUME = "11", YEAR = "1979", NUMBER = "4", PAGES = "271-276", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217863"} @article{bb222861, AUTHOR = "Hsieh, Y.Y. and Fu, K.S.", TITLE = "An Automatic Visual Inspection System for Integrated Circuit Chips", JOURNAL = CGIP, VOLUME = "14", YEAR = "1980", NUMBER = "4", MONTH = "December", PAGES = "293-343", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217864"} @article{bb222862, AUTHOR = "Jarvis, J.F.", TITLE = "A Method for Automating the Visual Inspection of Printed Wiring Boards", JOURNAL = PAMI, VOLUME = "2", YEAR = "1980", NUMBER = "1", MONTH = "January", PAGES = "77-83", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217865"} @article{bb222863, AUTHOR = "Goto, N. and Kondo, T.", TITLE = "An Automatic Inspection System for Printed Wiring Board Masks", JOURNAL = PR, VOLUME = "12", YEAR = "1980", NUMBER = "6", PAGES = "443-455", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217866"} @article{bb222864, AUTHOR = "Pau, L.F.", TITLE = "Integrated Testing and Algorithms for Visual Inspection of Integrated Circuits", JOURNAL = PAMI, VOLUME = "5", YEAR = "1983", NUMBER = "6", MONTH = "November", PAGES = "602-608", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217867"} @inproceedings{bb222865, AUTHOR = "Pau, L.F.", TITLE = "Semiconductio IC's: Integrated Testing and Algorithms for Visual Inspection", BOOKTITLE = ICPR80, YEAR = "1980", PAGES = "238-240", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217868"} @article{bb222866, AUTHOR = "Baird, M.L.", TITLE = "SIGHT-I: A Computer Vision System for Automated IC Chip Manufacture", JOURNAL = SMC, VOLUME = "8", YEAR = "1978", NUMBER = "2", MONTH = "February", PAGES = "133-139", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217869"} @inproceedings{bb222867, AUTHOR = "Baird, M.L.", TITLE = "An Application ov Computer Vision to Automatic IC Chip Manufacture", BOOKTITLE = ICPR76, YEAR = "1976", PAGES = "3-7", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217870"} @article{bb222868, AUTHOR = "West, M.A. and de Foster, S. and Baldwin, E.C. and Zeigler, R.A.", TITLE = "Computer Controlled Optical Testing of High-Density Printed-Circuit Boards", JOURNAL = IBMRD, VOLUME = "27", YEAR = "1983", NUMBER = "1", PAGES = "50-58", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217871"} @inproceedings{bb222869, AUTHOR = "Crabb, R.M. and de Foster, S.M. and Rittenhouse, N.E. and West, M.A. and Ziegler, R.A.", TITLE = "System for measuring and detecting printed circuit wiring defects", BOOKTITLE = US_Patent, YEAR = "1987", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217872"} @article{bb222870, AUTHOR = "Wahl, F. and So, S. and Wong, K.", TITLE = "A Hybrid Optical-Digital Image Processing Method for Surface Inspection", JOURNAL = IBMRD, VOLUME = "27", YEAR = "1983", NUMBER = "4", MONTH = "July", PAGES = "376-385", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217873"} @article{bb222871, AUTHOR = "Rubat du Merac, C. and Jutier, P. and Laurent, J. and Courtois, B.", TITLE = "A New Domain for Image Analysis: VLSI Circuit Testing, with ROMULAD, Specialized in Parallel Image Processing", JOURNAL = PRL, VOLUME = "1", YEAR = "1983", PAGES = "347-357", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217874"} @article{bb222872, AUTHOR = "Zeller, H. and Doemens, G.", TITLE = "Applications of Pattern Recognition in Semiconductor and Printer Board Production", JOURNAL = SP, VOLUME = "5", YEAR = "1983", PAGES = "399-412", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217875"} @article{bb222873, AUTHOR = "Wilder, J.", TITLE = "Machine Vision for Inspection of Keyboards", JOURNAL = SP, VOLUME = "5", YEAR = "1983", PAGES = "413-421", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217876"} @article{bb222874, AUTHOR = "West, G.A.W.", TITLE = "A System for the Automatic Visual Inspection of Bare-Printed Circuit Boards", JOURNAL = SMC, VOLUME = "14", YEAR = "1984", PAGES = "767-773", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217877"} @inproceedings{bb222875, AUTHOR = "Nakashima, M. and Koezuka, T. and Inagaki, T.", TITLE = "Recognition method and apparatus", BOOKTITLE = US_Patent, YEAR = "1984", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217878"} @article{bb222876, AUTHOR = "Mandeville, J.R.", TITLE = "Novel Method for Analysis of Printed Circuit Images", JOURNAL = IBMRD, VOLUME = "29", YEAR = "1985", NUMBER = "1", MONTH = "January", PAGES = "73-86", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217879"} @article{bb222877, AUTHOR = "Bixler, J.P. and Sanford, J.P.", TITLE = "A Technique for Encoding Lines and Regions in Engineering Drawings", JOURNAL = PR, VOLUME = "18", YEAR = "1985", NUMBER = "5", PAGES = "367-377", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217880"} @article{bb222878, AUTHOR = "Yoda, H. and Ohuchi, Y. and Taniguchi, Y. and Ejiri, M.", TITLE = "An Automatic Wafer Inspection System Using Pipelined Image Processing Techniques", JOURNAL = PAMI, VOLUME = "10", YEAR = "1988", NUMBER = "1", MONTH = "January", PAGES = "4-16", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217881"} @article{bb222879, AUTHOR = "Hara, Y. and Doi, H. and Karasaki, K. and Iida, T.", TITLE = "A System for PCB Automated Inspection Using Fluorescent Light", JOURNAL = PAMI, VOLUME = "10", YEAR = "1988", NUMBER = "1", MONTH = "January", PAGES = "69-78", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217882"} @article{bb222880, AUTHOR = "Shu, D.B. and Li, C.C. and Mancuso, J.F. and Sun, Y.N.", TITLE = "A Line Extraction Method for Automated SEM Inspection of VLSI Resist", JOURNAL = PAMI, VOLUME = "10", YEAR = "1988", NUMBER = "1", MONTH = "January", PAGES = "117-120", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217883"} @article{bb222881, AUTHOR = "Ando, M. and Inagaki, T.", TITLE = "Automatic Optical Inspection of Plated Through-Holes for Ultrahigh Density Printed Wiring Boards", JOURNAL = MVA, VOLUME = "1", YEAR = "1988", PAGES = "175-181", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217884"} @article{bb222882, AUTHOR = "Dom, B.E. and Brecher, V.H. and Bonner, R. and Batchelder, J.S. and Jaffe, R.S.", TITLE = "The P300: A System for Automatic Pattern Wafer Inspection", JOURNAL = MVA, VOLUME = "1", YEAR = "1988", PAGES = "205-221", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217885"} @article{bb222883, AUTHOR = "Hara, Y. and Akiyama, N. and Karasaki, K.", TITLE = "Automatic Inspection System for Printed Circuit Boards", JOURNAL = PAMI, VOLUME = "5", YEAR = "1983", NUMBER = "6", MONTH = "November", PAGES = "623-630", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217886"} @inproceedings{bb222884, AUTHOR = "Hara, Y. and Okamoto, K. and Hamada, T. and Akiyama, N. and Nakagawa, K. and Torisawa, S. and Nakashima, S.", TITLE = "Automatic Visual Inspection of LSI Photomasks", BOOKTITLE = ICPR80, YEAR = "1980", PAGES = "273-279", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217887"} @article{bb222885, AUTHOR = "Sanz, J.L.C. and Petkovic, D.", TITLE = "Machine Vision Algorithms for Automated Inspection of Thin-Film Disk Heads", JOURNAL = PAMI, VOLUME = "10", YEAR = "1988", NUMBER = "6", MONTH = "November", PAGES = "830-848", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217888"} @article{bb222886, AUTHOR = "Sanz, J.L.C. and Dinstein, I. and Petkovic, D.", TITLE = "Computing Multi-Colored Polygonal Masks in Pipeline Architectures and Its Application to Automated Visual Inspection", JOURNAL = CACM, VOLUME = "30", YEAR = "1987", NUMBER = "4", MONTH = "April", PAGES = "318-329", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217889"} @article{bb222887, AUTHOR = "Petkovic, D. and Hinkle, E.B.", TITLE = "A Rule-Based System for Verifying Engineering Specifications in Industrial Visual Inspection Applications", JOURNAL = PAMI, VOLUME = "9", YEAR = "1987", NUMBER = "2", MONTH = "March", PAGES = "306-311", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217890"} @inproceedings{bb222888, AUTHOR = "Dom, B. and Steele, D. and Petkovic, D. and Kuhlmann, L.", TITLE = "Algorithms for automatic disk head/slider inspection", BOOKTITLE = ICPR94, YEAR = "1994", PAGES = "A:295-300", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217891"} @inproceedings{bb222889, AUTHOR = "Petkovic, D. and Sanz, J.L.C. and Mohiuddin, K.M.A. and Hinkle, E.B. and Flickner, M.D. and Cox, C. and Wong, K.", TITLE = "An Experimental System for Disk Head Inspection", BOOKTITLE = ICPR86, YEAR = "1986", PAGES = "9-13", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217892"} @article{bb222890, AUTHOR = "Sprague, A.P. and Donahue, M.J. and Rokhlin, S.I.", TITLE = "A Method for Automatic Inspection of Printed Circuit Boards", JOURNAL = CVGIP, VOLUME = "54", YEAR = "1991", NUMBER = "3", MONTH = "November", PAGES = "401-415", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217893"} @article{bb222891, AUTHOR = "Wojcik, Z.M.", TITLE = "An Approach to the Recognition of Contours and Line-Shaped Objects", JOURNAL = CVGIP, VOLUME = "25", YEAR = "1984", NUMBER = "2", MONTH = "February", PAGES = "184-204", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217894"} @article{bb222892, AUTHOR = "Ellison, T.P. and Taylor, C.J.", TITLE = "Calculating the surface topography of integrated circuit wafers from SEM images", JOURNAL = IVC, VOLUME = "9", YEAR = "1991", NUMBER = "1", MONTH = "February", PAGES = "3-9", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217895"} @inproceedings{bb222893, AUTHOR = "Taylor, C.J. and Ellison, T.P.", TITLE = "Calculating the surface topography of integrated circuit wafers from SEM images", BOOKTITLE = BMVC90, YEAR = "1990", PAGES = "xx-yy", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217895"} @inproceedings{bb222894, AUTHOR = "Yu, K.K. and Berglund, C.N.", TITLE = "Automated system for extracting design and layout information from an integrated circuit", BOOKTITLE = US_Patent, YEAR = "1992", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217896"} @inproceedings{bb222895, AUTHOR = "Lebeau, C.J.", TITLE = "Method for automatic semiconductor wafer inspection", BOOKTITLE = US_Patent, YEAR = "1992", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217897"} @inproceedings{bb222896, AUTHOR = "Bushroe, M.W.", TITLE = "Solder joint locator", BOOKTITLE = US_Patent, YEAR = "1992", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217898"} @article{bb222897, AUTHOR = "Dom, B.E. and Brecher, V.", TITLE = "Recent Advances in the Automatic Inspection of Integrated-Circuits for Pattern Defects", JOURNAL = MVA, VOLUME = "8", YEAR = "1995", NUMBER = "1", PAGES = "5-19", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217899"} @article{bb222898, AUTHOR = "Khalaj, B.H. and Aghajan, H.K. and Kailath, T.", TITLE = "Patterned Wafer Inspection By High-Resolution Spectral Estimation Techniques", JOURNAL = MVA, VOLUME = "7", YEAR = "1994", NUMBER = "3", PAGES = "178-185", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217900"} @article{bb222899, AUTHOR = "Teoh, E.K. and Mital, D.P.", TITLE = "A Transputer-Based Automated Visual Inspection System for Electronic Devices and PCBs", JOURNAL = OptLas, VOLUME = "22", YEAR = "1995", NUMBER = "3", PAGES = "161-180", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT217901"}