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        TITLE = "The Devil is in the Crack Orientation: A New Perspective for Crack
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@inproceedings{bb225757,
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@inproceedings{bb225758,
        AUTHOR = "Lei, J.R. and Hu, X.B. and Wang, Y. and Liu, D.",
        TITLE = "PyramidFlow: High-Resolution Defect Contrastive Localization Using
Pyramid Normalizing Flow",
        BOOKTITLE = CVPR23,
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        PAGES = "14143-14152",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT220754"}

@inproceedings{bb225759,
        AUTHOR = "Wang, Y. and Peng, J.L. and Zhang, J.N. and Yi, R. and Wang, Y. and Wang, C.J.",
        TITLE = "Multimodal Industrial Anomaly Detection via Hybrid Fusion",
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        PAGES = "8032-8041",
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@inproceedings{bb225760,
        AUTHOR = "Lee, X.Y. and Vidyaratne, L. and Alam, M. and Farahat, A. and Ghosh, D. and Diaz, T.G. and Gupta, C.",
        TITLE = "XDNet: A Few-Shot Meta-Learning Approach for Cross-Domain Visual
Inspection",
        BOOKTITLE = VISION23,
        YEAR = "2023",
        PAGES = "4375-4384",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT220756"}

@inproceedings{bb225761,
        AUTHOR = "Liu, W.Z. and Liu, C. and Liu, Q. and Yu, D.",
        TITLE = "Assigned MURA Defect Generation Based on Diffusion Model",
        BOOKTITLE = VISION23,
        YEAR = "2023",
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        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT220757"}

@inproceedings{bb225762,
        AUTHOR = "Jang, J.K. and Hwang, E. and Park, S.H.",
        TITLE = "N-pad : Neighboring Pixel-based Industrial Anomaly Detection",
        BOOKTITLE = VISION23,
        YEAR = "2023",
        PAGES = "4365-4374",
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@inproceedings{bb225763,
        AUTHOR = "Xu, L. and Zou, H. and Okatani, T.",
        TITLE = "How Do Label Errors Affect Thin Crack Detection by DNNs",
        BOOKTITLE = VISION23,
        YEAR = "2023",
        PAGES = "4414-4423",
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@inproceedings{bb225764,
        AUTHOR = "Long, J. and Yang, Y.X. and Hua, L. and Ou, Y.Q.",
        TITLE = "Self-supervised Augmented Patches Segmentation for Anomaly Detection",
        BOOKTITLE = ACCV22,
        YEAR = "2022",
        PAGES = "II:93-107",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT220760"}

@inproceedings{bb225765,
        AUTHOR = "Kulkarni, S. and Singh, S. and Balakrishnan, D. and Sharma, S. and Devunuri, S. and Korlapati, S.C.R.",
        TITLE = "Crackseg9k: A Collection and Benchmark for Crack Segmentation Datasets
and Frameworks",
        BOOKTITLE = CVCivil22,
        YEAR = "2022",
        PAGES = "179-195",
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@inproceedings{bb225766,
        AUTHOR = "Zhang, X. and Huang, H.F.",
        TITLE = "LightAUNet: A Lightweight Fusing Attention Based UNet for Crack
Detection",
        BOOKTITLE = ICIVC22,
        YEAR = "2022",
        PAGES = "178-182",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT220762"}

@inproceedings{bb225767,
        AUTHOR = "Orti, J. and Moreno Noguer, F. and Puig, V.",
        TITLE = "Guided-Crop Image Augmentation for Small Defect Classification",
        BOOKTITLE = "ICPR22",
        YEAR = "2022",
        PAGES = "104-110",
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@inproceedings{bb225768,
        AUTHOR = "Fang, F. and Xu, Q.L. and Lim, J.H.",
        TITLE = "Hierarchical Defect Detection Based On Reinforcement Learning",
        BOOKTITLE = ICIP22,
        YEAR = "2022",
        PAGES = "791-795",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT220764"}

@inproceedings{bb225769,
        AUTHOR = "Wang, B. and Zhou, H. and Luo, W.R. and Li, C.Y. and Li, Z.B. and Tian, Z.Q.",
        TITLE = "psi-Net is an Efficient Tiny Defect Detector",
        BOOKTITLE = ICIP22,
        YEAR = "2022",
        PAGES = "796-800",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT220765"}

@inproceedings{bb225770,
        AUTHOR = "Ofir, N. and Yacobi, R. and Granoviter, O. and Levant, B. and Shtalrid, O.",
        TITLE = "Automatic Defect Segmentation by Unsupervised Anomaly Learning",
        BOOKTITLE = ICIP22,
        YEAR = "2022",
        PAGES = "306-310",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT220766"}

@inproceedings{bb225771,
        AUTHOR = "Tian, H. and Li, X. and Yang, L.F. and Li, J. and Yang, J. and Du, W.D.",
        TITLE = "PPT: Anomaly Detection Dataset of Printed Products with Templates",
        BOOKTITLE = ICIP22,
        YEAR = "2022",
        PAGES = "506-510",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT220767"}

@inproceedings{bb225772,
        AUTHOR = "Chen, Z.Z. and Zhang, J. and Lai, Z. and Chen, J. and Liu, Z. and Li, J.Q.",
        TITLE = "Geometry-Aware Guided Loss for Deep Crack Recognition",
        BOOKTITLE = CVPR22,
        YEAR = "2022",
        PAGES = "4693-4702",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT220768"}

@inproceedings{bb225773,
        AUTHOR = "Liu, H.J. and Miao, X.Y. and Mertz, C. and Xu, C.Z. and Kong, H.",
        TITLE = "CrackFormer: Transformer Network for Fine-Grained Crack Detection",
        BOOKTITLE = ICCV21,
        YEAR = "2021",
        PAGES = "3763-3772",
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@inproceedings{bb225774,
        AUTHOR = "Rudolph, M. and Wehrbein, T. and Rosenhahn, B. and Wandt, B.",
        TITLE = "Fully Convolutional Cross-Scale-Flows for Image-based Defect
Detection",
        BOOKTITLE = WACV22,
        YEAR = "2022",
        PAGES = "1829-1838",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT220770"}

@inproceedings{bb225775,
        AUTHOR = "Park, J.H. and Chen, Y.C. and Li, Y.J. and Kitani, K.",
        TITLE = "Crack Detection and Refinement Via Deep Reinforcement Learning",
        BOOKTITLE = ICIP21,
        YEAR = "2021",
        PAGES = "529-533",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT220771"}

@inproceedings{bb225776,
        AUTHOR = "Padalkar, M.G. and Beltran Gonzalez, C. and del Bue, A.",
        TITLE = "Multi-Illumination Fusion With Crack Enhancement Using
Cycle-Consistent Losses",
        BOOKTITLE = ICIP21,
        YEAR = "2021",
        PAGES = "2898-2902",
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@inproceedings{bb225777,
        AUTHOR = "Sindel, A. and Maier, A. and Christlein, V.",
        TITLE = "Craquelurenet: Matching the Crack Structure In Historical Paintings
for Multi-Modal Image Registration",
        BOOKTITLE = ICIP21,
        YEAR = "2021",
        PAGES = "994-998",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT220773"}

@inproceedings{bb225778,
        AUTHOR = "Guan, Z.H. and Guo, Z.D. and Lyu, J. and Yuan, Z.",
        TITLE = "Defect Inspection using Gravitation Loss and Soft Labels",
        BOOKTITLE = ICIP21,
        YEAR = "2021",
        PAGES = "1184-1188",
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@inproceedings{bb225779,
        AUTHOR = "Lin, D.Y. and Li, Y.Q. and Prasad, S. and Nwe, T.L. and Dong, S. and Oo, Z.M.",
        TITLE = "Cam-Guided U-Net With Adversarial Regularization for Defect
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        YEAR = "2021",
        PAGES = "1054-1058",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT220775"}

@inproceedings{bb225780,
        AUTHOR = "Kobayashi, H. and Miyoshi, R. and Hashimoto, M.",
        TITLE = "Normal Image Generation-Based Defect Detection by Generative
Adversarial Network with Chaotic Random Images",
        BOOKTITLE = ISVC21,
        YEAR = "2021",
        PAGES = "I:353-365",
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@inproceedings{bb225781,
        AUTHOR = "Benz, C. and Rodehorst, V.",
        TITLE = "Model-based Crack Width Estimation using Rectangle Transform",
        BOOKTITLE = MVA21,
        YEAR = "2021",
        PAGES = "1-5",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT220777"}

@inproceedings{bb225782,
        AUTHOR = "Kondo, Y. and Ukita, N.",
        TITLE = "Crack Segmentation for Low-Resolution Images using Joint Learning
with Super- Resolution",
        BOOKTITLE = MVA21,
        YEAR = "2021",
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@inproceedings{bb225783,
        AUTHOR = "Tan, D.S. and Chen, Y.C. and Chen, T.P.C. and Chen, W.C.",
        TITLE = "TrustMAE: A Noise-Resilient Defect Classification Framework using
Memory-Augmented Auto-Encoders with Trust Regions",
        BOOKTITLE = WACV21,
        YEAR = "2021",
        PAGES = "276-285",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT220779"}

@inproceedings{bb225784,
        AUTHOR = "Zhang, G.J. and Cui, K.W. and Hung, T.Y. and Lu, S.J.",
        TITLE = "Defect-GAN: High-Fidelity Defect Synthesis for Automated Defect
Inspection",
        BOOKTITLE = WACV21,
        YEAR = "2021",
        PAGES = "2523-2533",
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@inproceedings{bb225785,
        AUTHOR = "Padalkar, M.G. and Beltran Gonzalez, C. and Bustreo, M. and del Bue, A. and Murino, V.",
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Ensemble and Controlled Illumination",
        BOOKTITLE = ICPR21,
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@inproceedings{bb225786,
        AUTHOR = "Guo, T.Y. and Zhang, L.L. and Ding, R. and Yang, G.",
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        BOOKTITLE = ICPR21,
        YEAR = "2021",
        PAGES = "8899-8905",
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@inproceedings{bb225787,
        AUTHOR = "Bozic, J. and Tabernik, D. and Skocaj, D.",
        TITLE = "End-to-end training of a two-stage neural network for defect
detection",
        BOOKTITLE = ICPR21,
        YEAR = "2021",
        PAGES = "5619-5626",
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@inproceedings{bb225788,
        AUTHOR = "Nava, R. and Fehr, D. and Petry, F. and Tamisier, T.",
        TITLE = "Tire Surface Segmentation in Infrared Imaging with Convolutional Neural
Networks",
        BOOKTITLE = IMTA20,
        YEAR = "2020",
        PAGES = "51-62",
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@inproceedings{bb225789,
        AUTHOR = "Luan, C. and Cui, R. and Sun, L. and Lin, Z.",
        TITLE = "A Siamese Network Utilizing Image Structural Differences For
Cross-Category Defect Detection",
        BOOKTITLE = ICIP20,
        YEAR = "2020",
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@inproceedings{bb225790,
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@inproceedings{bb225791,
        AUTHOR = "Boyadjian, Q. and Vanderesse, N. and Toews, M. and Bocher, P.",
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@inproceedings{bb225792,
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@inproceedings{bb225793,
        AUTHOR = "Sidorov, O. and Hardeberg, J.Y.",
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        BOOKTITLE = eHeritage19,
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@inproceedings{bb225794,
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@inproceedings{bb225795,
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        BOOKTITLE = ICIP19,
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@inproceedings{bb225796,
        AUTHOR = "Mayr, M. and Hoffmann, M. and Maier, A. and Christlein, V.",
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@inproceedings{bb225798,
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@inproceedings{bb225799,
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