@inproceedings{bb226900,
        AUTHOR = "Park, J.H. and Chen, Y.C. and Li, Y.J. and Kitani, K.",
        TITLE = "Crack Detection and Refinement Via Deep Reinforcement Learning",
        BOOKTITLE = ICIP21,
        YEAR = "2021",
        PAGES = "529-533",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT221886"}

@inproceedings{bb226901,
        AUTHOR = "Padalkar, M.G. and Beltran Gonzalez, C. and del Bue, A.",
        TITLE = "Multi-Illumination Fusion With Crack Enhancement Using
Cycle-Consistent Losses",
        BOOKTITLE = ICIP21,
        YEAR = "2021",
        PAGES = "2898-2902",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT221887"}

@inproceedings{bb226902,
        AUTHOR = "Sindel, A. and Maier, A. and Christlein, V.",
        TITLE = "Craquelurenet: Matching the Crack Structure In Historical Paintings
for Multi-Modal Image Registration",
        BOOKTITLE = ICIP21,
        YEAR = "2021",
        PAGES = "994-998",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT221888"}

@inproceedings{bb226903,
        AUTHOR = "Guan, Z.H. and Guo, Z.D. and Lyu, J. and Yuan, Z.",
        TITLE = "Defect Inspection using Gravitation Loss and Soft Labels",
        BOOKTITLE = ICIP21,
        YEAR = "2021",
        PAGES = "1184-1188",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT221889"}

@inproceedings{bb226904,
        AUTHOR = "Lin, D.Y. and Li, Y.Q. and Prasad, S. and Nwe, T.L. and Dong, S. and Oo, Z.M.",
        TITLE = "Cam-Guided U-Net With Adversarial Regularization for Defect
Segmentation",
        BOOKTITLE = ICIP21,
        YEAR = "2021",
        PAGES = "1054-1058",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT221890"}

@inproceedings{bb226905,
        AUTHOR = "Kobayashi, H. and Miyoshi, R. and Hashimoto, M.",
        TITLE = "Normal Image Generation-Based Defect Detection by Generative
Adversarial Network with Chaotic Random Images",
        BOOKTITLE = ISVC21,
        YEAR = "2021",
        PAGES = "I:353-365",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT221891"}

@inproceedings{bb226906,
        AUTHOR = "Benz, C. and Rodehorst, V.",
        TITLE = "Model-based Crack Width Estimation using Rectangle Transform",
        BOOKTITLE = MVA21,
        YEAR = "2021",
        PAGES = "1-5",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT221892"}

@inproceedings{bb226907,
        AUTHOR = "Kondo, Y. and Ukita, N.",
        TITLE = "Crack Segmentation for Low-Resolution Images using Joint Learning
with Super- Resolution",
        BOOKTITLE = MVA21,
        YEAR = "2021",
        PAGES = "1-6",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT221893"}

@inproceedings{bb226908,
        AUTHOR = "Tan, D.S. and Chen, Y.C. and Chen, T.P.C. and Chen, W.C.",
        TITLE = "TrustMAE: A Noise-Resilient Defect Classification Framework using
Memory-Augmented Auto-Encoders with Trust Regions",
        BOOKTITLE = WACV21,
        YEAR = "2021",
        PAGES = "276-285",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT221894"}

@inproceedings{bb226909,
        AUTHOR = "Zhang, G.J. and Cui, K.W. and Hung, T.Y. and Lu, S.J.",
        TITLE = "Defect-GAN: High-Fidelity Defect Synthesis for Automated Defect
Inspection",
        BOOKTITLE = WACV21,
        YEAR = "2021",
        PAGES = "2523-2533",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT221895"}

@inproceedings{bb226910,
        AUTHOR = "Padalkar, M.G. and Beltran Gonzalez, C. and Bustreo, M. and del Bue, A. and Murino, V.",
        TITLE = "A Versatile Crack Inspection Portable System based on Classifier
Ensemble and Controlled Illumination",
        BOOKTITLE = ICPR21,
        YEAR = "2021",
        PAGES = "4009-4016",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT221896"}

@inproceedings{bb226911,
        AUTHOR = "Guo, T.Y. and Zhang, L.L. and Ding, R. and Yang, G.",
        TITLE = "EDD-Net: An Efficient Defect Detection Network",
        BOOKTITLE = ICPR21,
        YEAR = "2021",
        PAGES = "8899-8905",
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@inproceedings{bb226912,
        AUTHOR = "Bozic, J. and Tabernik, D. and Skocaj, D.",
        TITLE = "End-to-end training of a two-stage neural network for defect
detection",
        BOOKTITLE = ICPR21,
        YEAR = "2021",
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@inproceedings{bb226913,
        AUTHOR = "Nava, R. and Fehr, D. and Petry, F. and Tamisier, T.",
        TITLE = "Tire Surface Segmentation in Infrared Imaging with Convolutional Neural
Networks",
        BOOKTITLE = IMTA20,
        YEAR = "2020",
        PAGES = "51-62",
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@inproceedings{bb226914,
        AUTHOR = "Luan, C. and Cui, R. and Sun, L. and Lin, Z.",
        TITLE = "A Siamese Network Utilizing Image Structural Differences For
Cross-Category Defect Detection",
        BOOKTITLE = ICIP20,
        YEAR = "2020",
        PAGES = "778-782",
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@inproceedings{bb226915,
        AUTHOR = "Lin, D. and Li, Y. and Prasad, S. and Nwe, T.L. and Dong, S. and Oo, Z.M.",
        TITLE = "CAM-UNET: Class Activation MAP Guided UNET with Feedback Refinement
for Defect Segmentation",
        BOOKTITLE = ICIP20,
        YEAR = "2020",
        PAGES = "2131-2135",
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@inproceedings{bb226916,
        AUTHOR = "Boyadjian, Q. and Vanderesse, N. and Toews, M. and Bocher, P.",
        TITLE = "Detecting Defects in Materials Using Deep Convolutional Neural Networks",
        BOOKTITLE = ICIAR20,
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        PAGES = "I:293-306",
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@inproceedings{bb226917,
        AUTHOR = "Xie, Y. and Zhu, F. and Fu, Y.",
        TITLE = "Main-Secondary Network for Defect Segmentation of Textured Surface
Images",
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@inproceedings{bb226918,
        AUTHOR = "Sidorov, O. and Hardeberg, J.Y.",
        TITLE = "Craquelure as a Graph: Application of Image Processing and Graph
Neural Networks to the Description of Fracture Patterns",
        BOOKTITLE = eHeritage19,
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        PAGES = "1429-1436",
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@inproceedings{bb226919,
        AUTHOR = "Ting, Y.C. and Lin, D.T. and Chen, C.F. and Tsai, B.C.",
        TITLE = "Automatic Optical Inspection for Millimeter Scale Probe Surface
Stripping Defects Using Convolutional Neural Network",
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        YEAR = "2020",
        PAGES = "360-369",
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@inproceedings{bb226920,
        AUTHOR = "Fang, F. and Li, L. and Rice, M. and Lim, J.",
        TITLE = "Towards Real-Time Crack Detection Using a Deep Neural Network With a
Bayesian Fusion Algorithm",
        BOOKTITLE = ICIP19,
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        PAGES = "2976-2980",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT221906"}

@inproceedings{bb226921,
        AUTHOR = "Mayr, M. and Hoffmann, M. and Maier, A. and Christlein, V.",
        TITLE = "Weakly Supervised Segmentation of Cracks on Solar Cells Using
Normalized Lp Norm",
        BOOKTITLE = ICIP19,
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@inproceedings{bb226922,
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        TITLE = "A Defect Inspection Method for Machine Vision Using Defect Probability
Image with Deep Convolutional Neural Network",
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        TITLE = "Spiral-Net with F1-Based Optimization for Image-Based Crack Detection",
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@inproceedings{bb226924,
        AUTHOR = "Dong, X.H. and Taylor, C.J. and Cootes, T.F.",
        TITLE = "Small Defect Detection Using Convolutional Neural Network Features and
Random Forests",
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@inproceedings{bb226925,
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Lesions in Architectural Diagnosis",
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@inproceedings{bb226926,
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        TITLE = "Deployment Conscious Automatic Surface Crack Detection",
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@inproceedings{bb226927,
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Defect Detection on 3D Textured Low-Contrast Surfaces",
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@inproceedings{bb226928,
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        TITLE = "A Methodology for the Inspection and Monitoring of the Roof Tiles and
Concrete Components of the Sydney Opera House",
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@inproceedings{bb226930,
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@inproceedings{bb226931,
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@inproceedings{bb226932,
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        AUTHOR = "Filisbino, T.A. and Giraldi, G.A. and Simao, L. and Thomaz, C.E.",
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Granite Tiles Classification",
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@inproceedings{bb226934,
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@inproceedings{bb226935,
        AUTHOR = "Yu, Z.Y. and Wu, X.J. and Gu, X.D.",
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@inproceedings{bb226936,
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@inproceedings{bb226938,
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        TITLE = "Crack's Detection, Measuring and Counting for Resistance's Tests Using
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@inproceedings{bb226961,
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@inproceedings{bb226962,
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        TITLE = "Unsupervised detection of surface defects: A two-step approach",
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@inproceedings{bb226963,
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        TITLE = "Surface Quality Inspection of Deformable Parts with Variable B-spline
Surfaces",
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@inproceedings{bb226964,
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        TITLE = "Laser speckle photography for surface tampering detection",
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@inproceedings{bb226965,
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Segmentation of 3D Industrial CT Images",
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@inproceedings{bb226966,
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@inproceedings{bb226967,
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@inproceedings{bb226968,
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        TITLE = "Crack Detection In Load Tests For Civil Engineering Material Testing By
Digital Closed Range Photogrammetry: Algorithms And Applications",
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@inproceedings{bb226969,
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        TITLE = "Industrial Inspection And Checking Of Marble Tiles",
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@inproceedings{bb226970,
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        TITLE = "The phase only transform for unsupervised surface defect detection",
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@inproceedings{bb226971,
        AUTHOR = "Cheng, J.Z. and Li, D.J. and Wei, Z.G. and Chu, M.J. and Zhang, D.J.",
        TITLE = "Application of Fuzzy Pattern Recognition in Ultrasonic Transverse Wave
Detection of Wheel Flaws",
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@inproceedings{bb226972,
        AUTHOR = "Nakazawa, M. and Aoki, Y. and Kobayashi, M. and Toda, H.",
        TITLE = "3D image analysis for evaluating internal deformation/fracture
characteristics of materials",
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@inproceedings{bb226973,
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        TITLE = "A Memetic Differential Evolution in Filter Design for Defect Detection
in Paper Production",
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@inproceedings{bb226974,
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@inproceedings{bb226975,
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        TITLE = "The ASDMCon Project:
The Challenge of Detecting Defects on Construction Sites",
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@inproceedings{bb226976,
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        TITLE = "Hairline Fracture Detection using MRF and Gibbs Sampling",
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@inproceedings{bb226977,
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@inproceedings{bb226980,
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        TITLE = "Ant Based Fuzzy Modeling Applied to Marble Classification",
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@inproceedings{bb226981,
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@inproceedings{bb226982,
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@inproceedings{bb226983,
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@inproceedings{bb226984,
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Classification",
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@inproceedings{bb226985,
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@inproceedings{bb226986,
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