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        AUTHOR = "Liang, X. and Sun, J. and Wang, X. and Li, J. and Zhang, L.P. and Guo, J.B.",
        TITLE = "Surface weak scratch detection for optical elements based on a
multimodal imaging system and a deep encoder-decoder network",
        JOURNAL = JOSA-A,
        VOLUME = "40",
        YEAR = "2023",
        NUMBER = "6",
        MONTH = "June",
        PAGES = "1237-1248",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT239302"}

@article{bb244401,
        AUTHOR = "Yin, L. and Cheng, M.Y. and Su, S. and Zhong, R.Y. and Zhao, S.",
        TITLE = "An explainable super-resolution visual method for micro-crack image
detection",
        JOURNAL = PRL,
        VOLUME = "189",
        YEAR = "2025",
        PAGES = "157-165",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT239303"}

@inproceedings{bb244402,
        AUTHOR = "Meng, Y. and Wu, H.T. and Niu, B.Q.",
        TITLE = "Research on intelligent recognition method of tunnel lining cracks
based on small objective recognition algorithm",
        BOOKTITLE = ICIVC24,
        YEAR = "2024",
        PAGES = "105-110",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT239304"}

@article{bb244403,
        AUTHOR = "Zhao, Y. and Sun, J. and Zhang, L. and Lu, H.C.",
        TITLE = "FocusCLIP: Focusing on Anomaly Regions by Visual-Text Discrepancies",
        JOURNAL = CirSysVideo,
        VOLUME = "35",
        YEAR = "2025",
        NUMBER = "5",
        MONTH = "May",
        PAGES = "4883-4895",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT239305"}

@article{bb244404,
        AUTHOR = "Zhang, J.M. and Zhang, S. and Li, D. and Wang, J.X. and Wang, J.",
        TITLE = "Crack segmentation network via difference convolution-based encoder
and hybrid CNN-Mamba multi-scale attention",
        JOURNAL = PR,
        VOLUME = "167",
        YEAR = "2025",
        PAGES = "111723",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT239306"}

@inproceedings{bb244405,
        AUTHOR = "Benz, C. and Rodehorst, V.",
        TITLE = "Crackstructures and Crackensembles: The Power of Multi-View for 2.5D
Crack Detection",
        BOOKTITLE = WACV25,
        YEAR = "2025",
        PAGES = "5990-5999",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT239307"}

@inproceedings{bb244406,
        AUTHOR = "Zim, A.H. and Iqbal, A. and Al Huda, Z. and Malik, A. and Kuribayashi, M.",
        TITLE = "EfficientCrackNet: A Lightweight Model for Crack Segmentation",
        BOOKTITLE = WACV25,
        YEAR = "2025",
        PAGES = "6279-6289",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT239308"}

@inproceedings{bb244407,
        AUTHOR = "Chen, X.R. and Li, S. and Yang, W.",
        TITLE = "L-RTDETR: A Lightweight Real-Time Object Detection Algorithm for
Defect Detection",
        BOOKTITLE = ICIVC24,
        YEAR = "2024",
        PAGES = "141-146",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT239309"}

@inproceedings{bb244408,
        AUTHOR = "Yang, S. and Chen, Z.F. and Chen, P.G. and Fang, X. and Liang, Y.X. and Liu, S. and Chen, Y.C.",
        TITLE = "Defect Spectrum: A Granular Look of Large-scale Defect Datasets with
Rich Semantics",
        BOOKTITLE = ECCV24,
        YEAR = "2024",
        PAGES = "VII: 187-203",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT239310"}

@inproceedings{bb244409,
        AUTHOR = "Shi, Q.F. and Wei, J. and Shen, F. and Zhang, Z.T.",
        TITLE = "Few-shot Defect Image Generation Based on Consistency Modeling",
        BOOKTITLE = ECCV24,
        YEAR = "2024",
        PAGES = "LXXVI: 360-376",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT239311"}

@inproceedings{bb244410,
        AUTHOR = "Tang, J.Q. and Lu, H. and Xu, X.G. and Wu, R.Z. and Hu, S. and Zhang, T. and Cheng, T.W. and Ge, M. and Chen, Y.C. and Tsung, F.",
        TITLE = "An Incremental Unified Framework for Small Defect Inspection",
        BOOKTITLE = ECCV24,
        YEAR = "2024",
        PAGES = "XXXI: 307-324",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT239312"}

@inproceedings{bb244411,
        AUTHOR = "Cogranne, R.",
        TITLE = "Detectability of Defects in the Presence of Linear Nuisance
Parameters and Images Signal-Dependent Noise",
        BOOKTITLE = ICIP24,
        YEAR = "2024",
        PAGES = "1357-1363",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT239313"}

@inproceedings{bb244412,
        AUTHOR = "Benz, C. and Rodehorst, V.",
        TITLE = "MVCrackViT: Robust Multi-View Crack Detection For Point Cloud
Segmentation Using View Attention",
        BOOKTITLE = ICIP24,
        YEAR = "2024",
        PAGES = "3443-3449",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT239314"}

@inproceedings{bb244413,
        AUTHOR = "Banerjee, P. and Saxena, P. and Kalimullah, N.M.M. and Shelke, A. and Habib, A.",
        TITLE = "Damage Detection and Localization by Learning Deep Features of
Elastic Waves in Piezoelectric Ceramic Using Point Contact Method",
        BOOKTITLE = Materials24,
        YEAR = "2024",
        PAGES = "63-70",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT239315"}

@inproceedings{bb244414,
        AUTHOR = "Benz, C. and Rodehorst, V.",
        TITLE = "Omni-Crack30k: A Benchmark for Crack Segmentation and the Reasonable
Effectiveness of Transfer Learning",
        BOOKTITLE = VAND24,
        YEAR = "2024",
        PAGES = "3876-3886",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT239316"}

@inproceedings{bb244415,
        AUTHOR = "Chen, Z.Z. and Lai, Z. and Chen, J. and Li, J.Q.",
        TITLE = "Mind marginal non-crack regions: Clustering-inspired representation
learning for crack segmentation",
        BOOKTITLE = CVPR24,
        YEAR = "2024",
        PAGES = "12698-12708",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT239317"}

@inproceedings{bb244416,
        AUTHOR = "Chen, Z.Z. and Zhang, J. and Lai, Z.N. and Zhu, G.M. and Liu, Z. and Chen, J. and Li, J.Q.",
        TITLE = "The Devil is in the Crack Orientation: A New Perspective for Crack
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        BOOKTITLE = ICCV23,
        YEAR = "2023",
        PAGES = "6630-6640",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT239318"}

@inproceedings{bb244417,
        AUTHOR = "Tao, H.Q. and Liu, B.X. and Cui, J.Q. and Zhang, H.",
        TITLE = "A Convolutional-Transformer Network for Crack Segmentation with
Boundary Awareness",
        BOOKTITLE = ICIP23,
        YEAR = "2023",
        PAGES = "86-90",
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@inproceedings{bb244418,
        AUTHOR = "Lei, J.R. and Hu, X.B. and Wang, Y. and Liu, D.",
        TITLE = "PyramidFlow: High-Resolution Defect Contrastive Localization Using
Pyramid Normalizing Flow",
        BOOKTITLE = CVPR23,
        YEAR = "2023",
        PAGES = "14143-14152",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT239320"}

@inproceedings{bb244419,
        AUTHOR = "Lee, X.Y. and Vidyaratne, L. and Alam, M. and Farahat, A. and Ghosh, D. and Diaz, T.G. and Gupta, C.",
        TITLE = "XDNet: A Few-Shot Meta-Learning Approach for Cross-Domain Visual
Inspection",
        BOOKTITLE = VISION23,
        YEAR = "2023",
        PAGES = "4375-4384",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT239321"}

@inproceedings{bb244420,
        AUTHOR = "Liu, W.Z. and Liu, C. and Liu, Q. and Yu, D.",
        TITLE = "Assigned MURA Defect Generation Based on Diffusion Model",
        BOOKTITLE = VISION23,
        YEAR = "2023",
        PAGES = "4395-4402",
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@inproceedings{bb244421,
        AUTHOR = "Xu, L. and Zou, H. and Okatani, T.",
        TITLE = "How Do Label Errors Affect Thin Crack Detection by DNNs",
        BOOKTITLE = VISION23,
        YEAR = "2023",
        PAGES = "4414-4423",
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@inproceedings{bb244422,
        AUTHOR = "Kulkarni, S. and Singh, S. and Balakrishnan, D. and Sharma, S. and Devunuri, S. and Korlapati, S.C.R.",
        TITLE = "Crackseg9k: A Collection and Benchmark for Crack Segmentation Datasets
and Frameworks",
        BOOKTITLE = CVCivil22,
        YEAR = "2022",
        PAGES = "179-195",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT239324"}

@inproceedings{bb244423,
        AUTHOR = "Zhang, X. and Huang, H.F.",
        TITLE = "LightAUNet: A Lightweight Fusing Attention Based UNet for Crack
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        BOOKTITLE = ICIVC22,
        YEAR = "2022",
        PAGES = "178-182",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT239325"}

@inproceedings{bb244424,
        AUTHOR = "Orti, J. and Moreno Noguer, F. and Puig, V.",
        TITLE = "Guided-Crop Image Augmentation for Small Defect Classification",
        BOOKTITLE = "ICPR22",
        YEAR = "2022",
        PAGES = "104-110",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT239326"}

@inproceedings{bb244425,
        AUTHOR = "Fang, F. and Xu, Q.L. and Lim, J.H.",
        TITLE = "Hierarchical Defect Detection Based On Reinforcement Learning",
        BOOKTITLE = ICIP22,
        YEAR = "2022",
        PAGES = "791-795",
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@inproceedings{bb244426,
        AUTHOR = "Wang, B. and Zhou, H. and Luo, W.R. and Li, C.Y. and Li, Z.B. and Tian, Z.Q.",
        TITLE = "psi-Net is an Efficient Tiny Defect Detector",
        BOOKTITLE = ICIP22,
        YEAR = "2022",
        PAGES = "796-800",
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@inproceedings{bb244427,
        AUTHOR = "Chen, Z.Z. and Zhang, J. and Lai, Z. and Chen, J. and Liu, Z. and Li, J.Q.",
        TITLE = "Geometry-Aware Guided Loss for Deep Crack Recognition",
        BOOKTITLE = CVPR22,
        YEAR = "2022",
        PAGES = "4693-4702",
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        AUTHOR = "Liu, H.J. and Miao, X.Y. and Mertz, C. and Xu, C.Z. and Kong, H.",
        TITLE = "CrackFormer: Transformer Network for Fine-Grained Crack Detection",
        BOOKTITLE = ICCV21,
        YEAR = "2021",
        PAGES = "3763-3772",
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@inproceedings{bb244429,
        AUTHOR = "Rudolph, M. and Wehrbein, T. and Rosenhahn, B. and Wandt, B.",
        TITLE = "Fully Convolutional Cross-Scale-Flows for Image-based Defect
Detection",
        BOOKTITLE = WACV22,
        YEAR = "2022",
        PAGES = "1829-1838",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT239331"}

@inproceedings{bb244430,
        AUTHOR = "Park, J.H. and Chen, Y.C. and Li, Y.J. and Kitani, K.",
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        BOOKTITLE = ICIP21,
        YEAR = "2021",
        PAGES = "529-533",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT239332"}

@inproceedings{bb244431,
        AUTHOR = "Padalkar, M.G. and Beltran Gonzalez, C. and del Bue, A.",
        TITLE = "Multi-Illumination Fusion With Crack Enhancement Using
Cycle-Consistent Losses",
        BOOKTITLE = ICIP21,
        YEAR = "2021",
        PAGES = "2898-2902",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT239333"}

@inproceedings{bb244432,
        AUTHOR = "Sindel, A. and Maier, A. and Christlein, V.",
        TITLE = "Craquelurenet: Matching the Crack Structure In Historical Paintings
for Multi-Modal Image Registration",
        BOOKTITLE = ICIP21,
        YEAR = "2021",
        PAGES = "994-998",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT239334"}

@inproceedings{bb244433,
        AUTHOR = "Guan, Z.H. and Guo, Z.D. and Lyu, J. and Yuan, Z.",
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@inproceedings{bb244434,
        AUTHOR = "Lin, D.Y. and Li, Y.Q. and Prasad, S. and Nwe, T.L. and Dong, S. and Oo, Z.M.",
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@inproceedings{bb244435,
        AUTHOR = "Kobayashi, H. and Miyoshi, R. and Hashimoto, M.",
        TITLE = "Normal Image Generation-Based Defect Detection by Generative
Adversarial Network with Chaotic Random Images",
        BOOKTITLE = ISVC21,
        YEAR = "2021",
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@inproceedings{bb244436,
        AUTHOR = "Benz, C. and Rodehorst, V.",
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        BOOKTITLE = MVA21,
        YEAR = "2021",
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@inproceedings{bb244437,
        AUTHOR = "Kondo, Y. and Ukita, N.",
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        AUTHOR = "Zhang, G.J. and Cui, K.W. and Hung, T.Y. and Lu, S.J.",
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@inproceedings{bb244439,
        AUTHOR = "Padalkar, M.G. and Beltran Gonzalez, C. and Bustreo, M. and del Bue, A. and Murino, V.",
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        AUTHOR = "Nava, R. and Fehr, D. and Petry, F. and Tamisier, T.",
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        AUTHOR = "Boyadjian, Q. and Vanderesse, N. and Toews, M. and Bocher, P.",
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@inproceedings{bb244446,
        AUTHOR = "Xie, Y. and Zhu, F. and Fu, Y.",
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        AUTHOR = "Sidorov, O. and Hardeberg, J.Y.",
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        BOOKTITLE = eHeritage19,
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@inproceedings{bb244450,
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@inproceedings{bb244453,
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@inproceedings{bb244454,
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@inproceedings{bb244455,
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@inproceedings{bb244456,
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@inproceedings{bb244457,
        AUTHOR = "Ranzi, G. and Vallati, O. and Cashen, I.",
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@inproceedings{bb244458,
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@inproceedings{bb244459,
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@inproceedings{bb244464,
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A Case Study on Crack Delineation",
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@inproceedings{bb244468,
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@inproceedings{bb244471,
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@inproceedings{bb244472,
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@inproceedings{bb244473,
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@inproceedings{bb244474,
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Application to Defect Detection in Automated Visual Inspection Systems",
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        TITLE = "Detection of cracks in nuclear power plant using spatial-temporal
grouping of local patches",
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