Index for sayd

Sayd, P.[Patrick] Co Author Listing * 3D Shape Descriptor for Human Pose Recovery, A
* Audio-video surveillance system for public transportation
* Background subtraction adapted to PTZ cameras by keypoint density estimation
* Background Subtraction for PTZ Cameras Performing a Guard Tour and Application to Cameras with Very Low Frame Rate
* Bundle Adjustment: A Fast Method with Weak Initialisation
* Camera-to-Camera Mapping for Hybrid Pan-Tilt-Zoom Sensors Calibration
* Coarse-to-fine low-rank structure-from-motion
* Depth Correction for Depth Camera From Planarity
* Direct Estimation of Nonrigid Registrations with Image-Based Self-Occlusion Reasoning
* Error Decreasing of Background Subtraction Process by Modeling the Foreground
* Generic and Real-Time Structure from Motion
* Generic and Real-Time Structure from Motion Using Local Bundle Adjustment
* Image Registration by Combining Thin-Plate Splines with a 3D Morphable Model
* MCMC Supervision for People Re-identification in Nonoverlapping Cameras
* Mixed-State Particle Filtering for Simultaneous Tracking and Re-identification in Non-overlapping Camera Networks
* Monocular Vision Based SLAM for Mobile Robots
* Noise Modelling and Uncertainty Propagation for TOF Sensors
* Noise modelling in time-of-flight sensors with application to depth noise removal and uncertainty estimation in three-dimensional measurement
* Non-parametric depth calibration of a TOF camera
* Non-Uniform Circular Generalized Cylinders Reconstruction From Multiple Perspective Views
* Real Time Localization and 3D Reconstruction
* Real-time human detection in urban scenes: Local descriptors and classifiers selection with AdaBoost-like algorithms
* Real-Time Humans Detection in Urban Scenes
* Real-Time Posture Analysis in a Crowd using Thermal Imaging
* Recovering Generalized Cylinders By Monocular Vision
* regression-based approach to recover human pose from voxel data, A
Includes: Sayd, P.[Patrick] Sayd, P.
26 for Sayd, P.

Sayde, M. Co Author Listing * Monitoring Thermal Stress in Wafer-Scale Integrated Circuits by the Attentive Vision Method Using an Infrared Camera

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