Menq, C.H.
* 1992: Automated Precision Measurement of Surface Profile in CAD-Directed Inspection
* 2008: Three-Dimensional particle tracking with subnanometer resolution using off-focus images
* 2009: Best linear unbiased axial localization in three-dimensional fluorescent bead tracking with subnanometer resolution using off-focus images
* 2013: Real-Time Continuous Image Registration Enabling Ultraprecise 2-D Motion Tracking
Includes: Menq, C.H. Menq, C.H.[Chia-Hsiang]