19.6.3 Inspection Systems and Techniques

Chapter Contents (Back)
Real Time Vision. Application, Inspection. Inspection.

KLA Tencor,
2007.
WWW Link. Vendor, Inspection. Semiconductor wafer inspection systems. Other industrial systems.

National Instruments,
2007.
WWW Link. Vendor, Inspection. Industrial inspection systems.

Vitronic,
1984
WWW Link. Vendor, Inspection. Vendor, 3-D Modeling. Industrial inspection systems, 3d Models, OCR, etc.

Basler Vision Technologies,
1988
WWW Link. Vendor, Inspection. Industrial inspection systems.

NeuroCheck GmbH,
1993
WWW Link. Vendor, Inspection. Industrial inspection systems.

Soliton,
1998.
WWW Link. Vendor, Inspection. Inspection systems.

Visionx Inc.,
2010.
WWW Link. Vendor, Inspection. Inspection systems.

Qioptiq Photonics for Innovation,
2010.
WWW Link. Vendor, Inspection. Inspection systems, but mostly photonics, lasers, etc.

Acsis, Inc.,
2007.
WWW Link. Vendor, Inspection. Inspection is only a part of it. Monitoring.

Uno, T., Ejiri, M., Tokunaga, T.,
A method of real-time recognition of moving objects and its application,
PR(8), No. 4, October 1976, pp. 201-208.
WWW Link. 0309
An object moving in the horizontal scan direction. applied as an electronic eye to a bolting robot. BibRef

Kittler, J.V., Pau, L.F.,
Automatic inspection by lots in the presence of classification errors,
PR(12), No. 4, 1980, pp. 237-241.
WWW Link. 0309
BibRef

Woods, P.W.,
The Use of Geometric and Grey-Level Models for Industrial Inspection,
PRL(5), 1987, pp. 11-17. BibRef 8700

Trivedi, M.M., Chen, C.X., and Marapane, S.B.,
A Vision System for Robotic Inspection and Manipulation,
Computer(22), No. 6, June 1989, pp. 91-97. BibRef 8906
Earlier:
ROBOSIGHT: Robotic Vision System for Inspection and Manipulation,
SPIE(1008), Expert Robots for Industrial Use, Cambridge, MA, November 1988. See also Region-Based Stereo Analysis for Robotic Applications. BibRef

Chen, C., Trivedi, M.M., and Bidlack, C.R.,
Design and Implementation of an Autonomous Spill Cleaning Robotic System,
SPIE(1293), Applications of Artificial Intelligence VIII, Orlando, FL, April 1990, pp. 691-703. BibRef 9004

Perkins, W.A.,
Using Circular Symmetry and Intensity Profiles for Computer Vision Inspection,
CGIP(17), No. 2, October 1981, pp. 161-172.
WWW Link. BibRef 8110

Perkins, W.A.,
INSPECTOR: A Computer Vision System That Learns to Inspect Parts,
PAMI(5), No. 6, November 1983, pp. 584-592. Model of part - inspection regions and tests. Transform the images, search for the best match (transformation). Then look for differences in the intensity or edginess. See also Model-Based Vision System for Industrial Parts, A. BibRef 8311

Baird, M.L.,
GAGESIGHT: A Computer Vision System for Automatic Inspection of Instrument Gauges,
PAMI(5), No. 6, November 1983, pp. 618-621. Gauge inspection, integrated into production. A model for each gauge, a "GM" style research and development project. BibRef 8311

Baird, M.L.,
Image Segmentation Technique for Locating Automotive Parts on Belt Conveyors,
IJCAI77(694-695). BibRef 7700

Dyer, C.R.,
Gauge Inspection Using Hough Transforms,
PAMI(5), No. 6, November 1983, pp. 621-623. Hough. Gauge inspection using Hough techniques - for checking accuracy of the gauge readings. BibRef 8311

Darwish, A.M., and Jain, A.K.,
A Rule Based Approach for Visual Pattern Inspection,
PAMI(10), No. 1, January 1988, pp. 56-68.
IEEE DOI BibRef 8801

Malloch, C.B., Kwak, W.I., Gerhardt, L.A.,
A Class of Adaptive Model- and Object-Driven Nonuniform Sampling Methods for 3-D Inspection,
MVA(1), 1988, pp. 97-114. BibRef 8800

Azegami, O.[Osamu], Miyake, T.[Toshifumi],
Method and apparatus for sorting articles,
US_Patent4,693,378, Sep 15, 1987
WWW Link. By size BibRef 8709

Hoki, T.[Tetsuo], Sano, T.[Tetsuo], Kitakado, R.[Ryuji], Sezaki, Y.[Yoshinori], Hotta, T.[Tomiji], Yano, H.[Hironobu],
Pattern masking method and an apparatus therefor,
US_Patent4,797,939, Jan 10, 1989
WWW Link. BibRef 8901

Mirmehdi, M.,
Product Label Inspection Using Transputers,
CPE(3), No. 4, 1991, pp. 265-273. Hough, Parallel.
WWW Link. BibRef 9100

Abidi, M.A.[Mongi A.], Eason, R.O.[Richard O.], Gonzalez, R.C.[Rafael C.],
Autonomous Robotic Inspection and Manipulation Using Multisensor Feedback,
Computer(24), No. 3, March 1991, pp. 14-21. Vision, touch, etc. BibRef 9103

Mecocci, A.[Allessandro],
PC-based system for transparent fluid film monitoring,
IVC(9), No. 2, April 1991, pp. 100-106.
WWW Link. 0401
mpurities in transparent fluid films. BibRef

Aoyama, Y.[Yoshiyuki], Nakano, T.[Takahiro], Kanasashi, O.[Osamu],
Method and apparatus for checking pattern,
US_Patent5,048,094, Sep 10, 1991
WWW Link. BibRef 9109

Sun, Y.N.[Yung-Nien], Tsai, C.T.[Ching-Tsorng],
A New Model-Based Approach for Industrial Visual Inspection,
PR(25), No. 11, November 1992, pp. 1327-1336.
WWW Link. BibRef 9211

Sin, S.K., Chen, C.H.,
A comparison of deconvolution techniques for the ultrasonic nondestructive evaluation of materials,
IP(1), No. 1, January 1992, pp. 3-10.
IEEE DOI 0402
BibRef

Litt, M.[Maria], Cobb, W.N.[Wesley N.], Bond, D.C.[David C.], Chung, J.C.[Jack C.], Leininger, G.G.[Gary G.],
Method and apparatus for inspecting surfaces for contrast variations,
US_Patent5,091,963, Feb 25, 1992
WWW Link. BibRef 9202

Smyth, P.[Padhraic],
Hidden Markov models for fault detection in dynamic systems,
PR(27), No. 1, January 1994, pp. 149-164.
WWW Link. 0401
BibRef

Vannelli, A.[Anthony], Madsen, T.C.[Thomas C.],
Product inspection method and apparatus,
US_Patent5,335,293, Aug 2, 1994
WWW Link. BibRef 9408

Asundi, A., Sajan, M.R.,
Peripheral Inspection of Objects,
OptLas(22), No. 3, 1995, pp. 227-240. BibRef 9500

Tarbox, G.H., Gottschlich, S.N.,
IVIS: An Integrated Volumetric Inspection System,
CVIU(61), No. 3, May 1995, pp. 430-444.
DOI Link BibRef 9505

Tretter, D., Bouman, C.A., Khawaja, K.W., Maciejewski, A.A.,
A multiscale stochastic image model for automated inspection,
IP(4), No. 12, December 1995, pp. 1641-1654.
IEEE DOI 0402
BibRef

Sobh, T., Owen, J.,
A Sensing Strategy for the Reverse Engineering of Machined Parts,
JIRS(14), No. 3, November 1995, pp. 323-340. BibRef 9511

Savary, G.[Gilles], Cans, M.[Michel], Bastian, F.L.[Fernando Luíz],
Characterization of Optical, Electronic and Topographic Images in Fatigue Research,
IVC(13), No. 8, October 1995, pp. 609-622.
WWW Link. BibRef 9510

Hunter, J.J.[J. Jeffrey], Graham, J.[Jim], Taylor, C.J.[Chris. J.],
User Programmable Visual Inspection,
IVC(13), No. 8, October 1995, pp. 623-628.
WWW Link. BibRef 9510
Earlier: BMVC94(xx-yy).
PDF File. 9409
BibRef

di Mauro, E.C., Cootes, T.F., Page, G.J., Jackson, C.B.,
Check: A Generic and Specific Industrial Inspection Tool,
VISP(143), No. 4, August 1996, pp. 241-249. 9611
BibRef

Mukherjee, D.P.[Dipti Prasad], Pal, A.[Amita], Sarma, S.E.[S. Eswara], Majumder, D.D.[D. Dutta],
Water quality analysis: A pattern recognition approach,
PR(28), No. 2, February 1995, pp. 269-281.
WWW Link. 0401
BibRef

Ouslim, M., Curtis, K.M.,
Automatic Visual Inspection Based upon a Variant of the N-Tuple Technique,
VISP(143), No. 5, October 1996, pp. 301-309. 9701
BibRef

Valle, M., Raffo, L., Caviglia, D.D., Bisio, G.M.,
A VLSI Image-Processing Architecture Dedicated to Real-Time Quality-Control Analysis in an Industrial-Plant,
RealTimeImg(2), No. 6, December 1996, pp. 361-371. 9702
BibRef

Simon, S., Rogala, J.P.,
Model-Based Prediction-Verification Scheme for Real-Time Inspection,
PRL(7), 1988, pp. 305-311. BibRef 8800

Griffin, P.M., Villalobos, J.R.,
Process Capability of Automated Visual Inspection Systems,
SMC(22), 1992, pp. 441-448. BibRef 9200

Skinner, D.R., Benke, K.K., Chung, M.J.,
Application of Adaptive Convolution Masking to the Automation of Visual Inspection,
RA(6), 1990, pp. 123-127. BibRef 9000

Menq, C.H., Yau, H.T., Lai, G.Y.,
Automated Precision Measurement of Surface Profile in CAD-Directed Inspection,
RA(8), 1992, pp. 268-278. BibRef 9200

Magee, M.[Michael], Weniger, R.[Richard], Wenzel, D.[Dennis],
Multidimensional pattern classification of bottles using diffuse and specular illumination,
PR(26), No. 11, November 1993, pp. 1639-1654.
WWW Link. 0401
BibRef

Tascini, G., Zingaretti, P., Conte, G.,
Real-Time Inspection by Submarine Images,
JEI(5), No. 4, October 1996, pp. 432-442. 9709
BibRef

Hou, T.H., Kuo, W.L.,
A New Edge-Detection Method for Automatic Visual Inspection,
IJAMT(13), No. 6, 1997, pp. 407-412. 9708
BibRef

Marokkey, S.R., Tay, C.J., Shang, H.M., Asundi, A.K.,
Time-Delay and Integration Imaging for Inspection and Profilometry of Moving-Objects,
OptEng(36), No. 9, September 1997, pp. 2573-2578. 9710
BibRef

Ringlien, J.A.[James A.],
Optical inspection of container finish dimensional parameters,
US_Patent5,610,391, Mar 11, 1997
WWW Link. BibRef 9703

Noble, J.A., Gupta, R., Mundy, J.L., Schmitz, A., Hartley, R.I.,
High-Precision X-Ray Stereo for Automated 3-D Cad-Based Inspection,
RA(14), No. 2, April 1998, pp. 292-302. 9804
BibRef
Earlier: A2, A1, A5, A3, A4:
Camera calibration for 2.5-D X-ray metrology,
ICIP95(III: 37-40).
IEEE DOI 9510
BibRef

McAulay, A.D., Wang, J.Q.,
Optical Diffraction Inspection of Periodic Structures Using Neural Networks,
OptEng(37), No. 3, March 1998, pp. 884-888. 9804
BibRef

Hamad, D., Betrouni, M., Biela, P., Postaire, J.G.,
Neural Networks Inspection System for Glass Bottles Production: A Comparative-Study,
PRAI(12), No. 4, June 1998, pp. 505-516. 9808
BibRef

Lai, S.H.[Shang-Hong], Fang, M.[Ming],
An Accurate and Fast Pattern Localization Algorithm for Automated Visual Inspection,
RealTimeImg(5), No. 1, February 1999, pp. 3-14. BibRef 9902

Lai, S.H.[Shang-Hong], Fang, M.[Ming],
A Hybrid Image Alignment System for Fast and Precise Pattern Localization,
RealTimeImg(8), No. 1, February 2002, pp. 23-33.
DOI Link 0204
BibRef

Drisko, R.[Robert], Bachelder, I.A.[Ivan A.],
Image processing system and method using subsampling with constraints such as time and uncertainty constraints,
US_Patent5,995,648, Nov 30, 1999
WWW Link. BibRef 9911
And: US_Patent6,157,732, Dec 5, 2000
WWW Link. BibRef
And: US_Patent6,278,796, Aug 21, 2001
WWW Link. BibRef

Rudt, R.J.[Robert J.], Fiore, L.F.[Leonard F.], Grapes, K.D.[Kenneth D.],
System for monitoring a continuous manufacturing process,
US_Patent5,821,990, Oct 13, 1998
WWW Link. BibRef 9810

Sezgin, M.[Mehmet], Taaltín, R.[Ramazan],
A new dichotomization technique to multilevel thresholding devoted to inspection applications,
PRL(21), No. 2, February 2000, pp. 151-161. 0003
BibRef

Bergasa, L.M., Duffy, N., Lacey, G., Mazo, M.,
Industrial inspection using Gaussian functions in a colour space,
IVC(18), No. 12, September 2000, pp. 951-957.
WWW Link. 0008
BibRef

Paping, M.[Martin], Oskar, M.[Meier],
Device for examining securities,
US_Patent6,257,389, July 10, 2001.
WWW Link. BibRef 0107

Sari-Sarraf, H.[Hamed], Goddard Jr., J.S.[James S.], Abidi, B.R.[Besma R.], Hunt, M.A.[Martin A.],
Vision system for on-line characterization of paper slurry,
IJIST(11), No. 4, 2001, pp. 231-242.
WWW Link. 0105
BibRef

Norgard, J.[John], Will, J.[John], Stubenrauch, C.[Carl],
Quantitative images of antenna patterns using infrared thermography and microwave holography,
IJIST(11), No. 4, 2001, pp. 210-218.
WWW Link. 0105
BibRef

Ryan, C.G.,
Quantitative trace element imaging using PIXE and the nuclear microprobe,
IJIST(11), No. 4, 2001, pp. 219-230.
WWW Link. 0105
BibRef

Daut, D.G., Zhao, D.M.[Dong-Ming],
A flaw detection method based on morphological image processing,
CirSysVideo(3), No. 6, December 1993, pp. 389-398.
IEEE Top Reference. 0206
BibRef

Scola, J.R.[Joseph R.], Ruzhitsky, V.N.[Vladimir N.], Jacobson, L.D.[Lowell D.],
Machine vision system for object feature analysis and validation based on multiple object images,
US_Patent6,175,644, Jan 16, 2001
WWW Link. BibRef 0101

Doignon, C.[Christophe], Knittel, D.[Dominique],
Detection of Noncircularity and Eccentricity of a Rolling Winder by Artificial Vision,
JASP(2002), No. 7, July 2002, pp. 714-727. 0208
BibRef

Rostami, F.[Fariborz], Dampier, T.O.[Todd O.], Mangalindan, E.C.[Edwin C.],
System and method for counting parts in multiple fields of view using machine vision,
US_Patent6,483,935, Nov 19, 2002
WWW Link. BibRef 0211

Koren, Y.[Yoram], Katz, R.[Reuven],
Reconfigurable apparatus and method for inspection during a manufacturing process,
US_Patent6,567,162, May 20, 2003
WWW Link. BibRef 0305

Pingel, U.[Ulrich], Niepel, C.[Christian],
Method for detecting optical errors in large surface panels,
US_Patent6,509,967, Jan 21, 2003
WWW Link. BibRef 0301

Prieto, F.[Flavio], Lepage, R.[Richard], Boulanger, P.[Pierre], Redarce, T.[Tanneguy],
A CAD-based 3D data acquisition strategy for inspection,
MVA(15), No. 2, December 2003, pp. 76-91.
Springer DOI 0401
BibRef
Earlier: A1, A4, A3, A2:
CAD-based range sensor placement for optimum 3D data acquisition,
3DIM99(128-137).
IEEE DOI 9910
BibRef

Prieto, F., Redarce, T., Boulanger, P., Lepage, R.,
Tolerance control with high resolution 3D measurements,
3DIM01(339-346).
IEEE DOI 0106
BibRef

Hernández, J.[Jorge], Prieto, F.[Flavio],
3D and Texture Modelling of Precolombian Objects,
ISVC06(I: 822-830).
Springer DOI 0611
BibRef

Guo, H.[Hong], Jack, L.B., Nandi, A.K.,
Feature generation using genetic programming with application to fault classification,
SMC-B(35), No. 1, February 2005, pp. 89-99.
IEEE Abstract. 0501
BibRef

Elbehiery, H.M.[Hussam M.], Hefnawy, A.A.[Alaa A.], Elewa, M.T.[Muhammad T.],
Visual Inspection for Fired Ceramic Tile's Surface Defects Using Wavelet Analysis,
GVIP(05), No. V2, January 2005, pp. 1-8
HTML Version. BibRef 0501

Evans, J.P.O., Liu, Y., Chan, J.W., Downes, D.,
View synthesis for depth from motion 3D X-ray imaging,
PRL(27), No. 15, November 2006, pp. 1863-1873.
WWW Link. 0609
Security X-ray; Image synthesis; KDE; Kinetic depth; Stereoscopic; Correspondence problem; Multiple view BibRef

Grafulla-González, B.[Beatriz], Lebart, K.[Katia], Harvey, A.R.[Andrew R.],
Physical optics modelling of millimetre-wave personnel scanners,
PRL(27), No. 15, November 2006, pp. 1852-1862.
WWW Link. 0609
Millimetre-wave; Image formation; Image simulation; Kolmogorov-Smirnov test; Material classification BibRef

Vitri, J., Bressan, M., Radeva, P.I.,
Bayesian Classification of Cork Stoppers Using Class-Conditional Independent Component Analysis,
SMC-C(37), No. 1, January 2007, pp. 32-38.
IEEE DOI 0701
BibRef

Nakamae, K.[Koji], Chikahisa, M.[Masaki], Fujioka, H.[Hiromu],
Estimation of electron probe profile from SEM image through wavelet multiresolution analysis for inline SEM inspection,
IVC(25), No. 7, 1 July 2007, pp. 1117-1123.
WWW Link. 0705
Wavelet multiresolution analysis; SEM image; Probe profile estimation; Electron probe; Inline SEM inspection BibRef

Iravani-Tabrizipour, M.[Mehrdad], Toyserkani, E.[Ehsan],
An image-based feature tracking algorithm for real-time measurement of clad height,
MVA(18), No. 6, December 2007, pp. 343-354.
Springer DOI 0711
In manufacturing process. Trinocular system. BibRef

Okuda, H.[Haruhisa], Hashimoto, M.[Manabu], Hirooka, M.[Miwako], Sumi, K.[Kazuhiko],
A Visual Inspection System Based on Trinarized Broad-Edge and Gray-Scale Hybrid Matching,
IEICE(E89-D), No. 7, July 2006, pp. 2068-2075.
DOI Link 0607
BibRef

Alexandropoulos, T., Boutas, S., Loumos, V., Kayafas, E.,
Template-guided inspection of arbitrarily oriented targets,
IET-CV(2), No. 3, September 2008, pp. 150-163.
DOI Link 0905
BibRef

Greenwood, D.P., Jeys, T.H., Johnson, B., Richardson, J.M., Shatz, M.P.,
Optical Techniques for Detecting and Identifying Biological-Warfare Agents,
PIEEE(97), No. 6, June 2009, pp. 971-989.
IEEE DOI 0905
BibRef

Shi, Q.[Quan], Xi, N.[Ning],
Develop a Non-contact Automated Dimensional Inspection System for Automotive Manufacturing Industry,
RPCS(1), No. 2, June 2008, pp. 76-83.
WWW Link. 1001
Survey, Inspection. BibRef

Grosso, E.[Enrico], Lagorio, A.[Andrea], Tistarelli, M.[Massimo],
Automated quality control of printed flasks and bottles,
MVA(22), No. 2, March 2011, pp. 269-281.
WWW Link. 1103
BibRef

Kamath, C.[Chandrika], Hurricane, O.A.[Omar A.],
Robust Extraction of Statistics from Images of Material Fragmentation,
IJIG(11), No. 1, January 2011, pp. 377-401.
DOI Link 1108
BibRef

Ren, Z.G.[Zhi-Guo], Liao, J.R.[Jia-Rui], Cai, L.L.[Li-Long],
An algorithm to estimate the crown patterns of diamonds based on machine vision,
MVA(23), No. 2, March 2012, pp. 197-215.
WWW Link. 1202
BibRef
Earlier:
Diamond color grading based on machine vision,
CRICV09(1970-1976).
IEEE DOI 0910
BibRef

Demant, C.[Christian], Streicher-Abel, B.[Bernd], Garnica, C.[Carsten],
Industrial Image Processing: Visual Quality Control in Manufacturing,

Springer2013. ISBN 978-3-642-33904-2.
WWW Link. 1404
BibRef

Fontgalland, G., Pedro, H.J.G.,
Normality and Correlation Coefficient in Estimation of Insulators' Spectral Signature,
SPLetters(22), No. 8, August 2015, pp. 1175-1179.
IEEE DOI 1502
glass BibRef

Zhang, Y.[Yunzhou], Yang, S.[Shanbao], Su, X.L.[Xiao-Lin], Shi, E.[Enyi], Zhang, H.[Handuo],
Automatic reading of domestic electric meter: an intelligent device based on image processing and ZigBee/Ethernet communication,
RealTimeIP(12), No. 1, June 2016, pp. 133-143.
Springer DOI 1606
BibRef

Birdal, T., Bala, E., Eren, T., Ilic, S.,
Online inspection of 3D parts via a locally overlapping camera network,
WACV16(1-10)
IEEE DOI 1606
Calibration BibRef

Biagio, M.S.[Marco San], Beltrán-González, C.[Carlos], Giunta, S.[Salvatore], Del Bue, A.[Alessio], Murino, V.[Vittorio],
Automatic inspection of aeronautic components,
MVA(28), No. 5-6, August 2017, pp. 591-605.
Springer DOI 1708
BibRef


Hosoya, N., Miyamoto, A., Naganuma, J.,
Real-time image improvement system for visual testing of nuclear reactors,
MVA17(1-4)
DOI Link 1708
Image color analysis, Inspection, Noise reduction, Real-time systems, Streaming media, Testing BibRef

Nordeng, I.E.[Ian E.], Hasan, A.[Ahmad], Olsen, D.[Doug], Neubert, J.[Jeremiah],
DEBC Detection with Deep Learning,
SCIA17(I: 248-259).
Springer DOI 1706
dead end body component. Inspection and maintenance of electrical grid. BibRef

Hannemose, M.[Morten], Nielsen, J.B.[Jannik Boll], Zsíros, L.[László], Aanæs, H.[Henrik],
An Image-Based Method for Objectively Assessing Injection Moulded Plastic Quality,
SCIA17(II: 426-437).
Springer DOI 1706
BibRef

Mohammadikaji, M., Bergmann, S., Irgenfried, S., Beyerer, J.[Jürgen], Dachsbacher, C., Wörn, H.,
Probabilistic Surface Inference for Industrial Inspection Planning,
WACV17(1008-1016)
IEEE DOI 1609
Inspection, Measurement uncertainty, Sensors, Surface treatment, Three-dimensional displays, Uncertainty BibRef

Meyer, J.[Johannes], Längle, T.[Thomas], Beyerer, J.[Jürgen],
General Cramér-von Mises, a Helpful Ally for Transparent Object Inspection Using Deflection Maps?,
SCIA17(I: 526-537).
Springer DOI 1706
BibRef

Richter, M.[Matthias], Längle, T.[Thomas], Beyerer, J.[Jürgen],
Gaussian Mixture Trees for One Class Classification in Automated Visual Inspection,
ICIAR17(341-351).
Springer DOI 1706
BibRef

Toyoda, K.[Kenta], Hotta, K.[Kazuhiro],
Abnormal Detection by Iterative Reconstruction,
ISVC16(II: 443-453).
Springer DOI 1701
Visual inspection. BibRef

Mohd, M., Zainon, O., Rasib, A.W., Majid, Z.,
The Study on the Durability of Submerged Structure Displacement Due to Concrete Failure,
GGT16(345-350).
DOI Link 1612
BibRef

Kampouris, C.[Christos], Zafeiriou, S.[Stefanos], Ghosh, A.[Abhijeet], Malassiotis, S.[Sotiris],
Fine-Grained Material Classification Using Micro-geometry and Reflectance,
ECCV16(V: 778-792).
Springer DOI 1611
BibRef

Zhang, L.[Liang], Wen, J.[Jing], Xu, S.Z.[Sheng-Zhou], Xing, H.Y.[Hao-Yang], Zhu, Y.[Yu], Chen, H.X.[Heng-Xin],
A glass image classification method based on multi-feature fusion,
ICWAPR16(7-11)
IEEE DOI 1611
Glass BibRef

Lim, S.N., Soares, J., Zhou, N.,
Tooth guard: A vision system for detecting missing tooth in rope mine shovel,
WACV16(1-7)
IEEE DOI 1606
Cameras BibRef

Bian, X., Lim, S.N., Zhou, N.,
Multiscale fully convolutional network with application to industrial inspection,
WACV16(1-8)
IEEE DOI 1606
Aircraft propulsion BibRef

Cortea, I., Ghervase, L., Dumbravicean, M.,
Combined spectroscopic analysis for identification of mural paintings materials,
WSSIP15(329-332)
IEEE DOI 1603
Fourier transform infrared spectroscopy BibRef

Dondi, P.[Piercarlo], Lombardi, L.[Luca], Malagodi, M.[Marco], Licchelli, M.[Maurizio], Rovetta, T.[Tommaso], Invernizzi, C.[Claudia],
An Interactive Tool for Speed up the Analysis of UV Images of Stradivari Violins,
CMTR15(103-110).
Springer DOI 1511
BibRef

Loesdau, M.[Martin], Chabrier, S.[Sébastien], Gabillon, A.[Alban],
Automatic Nacre Thickness Measurement of Tahitian Pearls,
ICIAR15(446-455).
Springer DOI 1507
BibRef

Wang, C.C.[Chien-Chih], Chen, S.H.[Ssu-Han],
A lens collar auto-inspection system,
MVA15(182-185)
IEEE DOI 1507
Charge coupled devices BibRef

Takahashi, F.[Fumiyuki], Abe, H.[Hideki], Koeduka, T.[Tetsuo], Haga, S.[Susumu],
Development of design and operation supporting techniques for product inspection devices using virtual devices,
MVA15(271-274)
IEEE DOI 1507
Calibration; Cameras; Inspection; Lighting; Optical imaging; Reflection BibRef

Waibel, P.[Patrick], Matthes, J.[Jorg], Groll, L.[Lutz], Keller, H.B.[Hubert B.],
A Structure from Motion Approach for the Analysis of Adhesions in Rotating Vessels,
3DV14(210-216)
IEEE DOI 1503
Adhesives BibRef

Aoki, K.[Kimiya], Funahashi, T.[Takuma], Koshimizu, H.[Hiroyasu], Miwata, Y.[Yasuhiko],
KIZUKI Processing for Visual Inspection: A Smart Pattern Pop-Out Algorithm Based on Human Visual Architecture,
ICPR14(2317-2322)
IEEE DOI 1412
Arrays BibRef

Yu, J.[Jiye], Chen, Z.[Zhiyuan], Kamata, S.I.[Sei-Ichiro],
Pill Recognition Using Imprint Information by Two-Step Sampling Distance Sets,
ICPR14(3156-3161)
IEEE DOI 1412
Educational institutions BibRef

Richter, M.[Matthias], Längle, T.[Thomas], Beyerer, J.[Jurgen],
Knowing when you don't: Bag of visual words with reject option for automatic visual inspection of bulk materials,
ICPR16(3079-3084)
IEEE DOI 1705
BibRef
Earlier:
Visual words for automated visual inspection of bulk materials,
MVA15(210-213)
IEEE DOI 1507
Feature extraction, Image color analysis, Inspection, Sorting, Training, Visualization, Vocabulary BibRef

Richter, M.[Matthias], Beyerer, J.[Juurgen],
Optical filter selection for automatic visual inspection,
WACV14(123-128)
IEEE DOI 1406
Band-pass filters BibRef

Zulkifley, M.A.[Mohd Asyraf], Mustafa, M.M.[Mohd.Marzuki], Hussain, A.[Aini],
Probabilistic white strip approach to plastic bottle sorting system,
ICIP13(3162-3166)
IEEE DOI 1412
Likelihood test BibRef

Zhao, S.[Shi], Lu, T.F.[Tien-Fu], Koch, B., Hurdsman, A.,
Stockpile modelling using mobile laser scanner for quality grade control in stockpile management,
ICARCV12(811-816).
IEEE DOI 1304
BibRef

Tobitani, K.[Kensuke], Ishida, A.[Atsushi], Okada, A.[Akihiro], Park, L.[Lisa], Nishiyama, K.[Kumiko], Nagata, N.[Noriko],
A simulation of multilayer thin-film interference for pearl material preproduction,
FCV13(107-112).
IEEE DOI 1304
BibRef

Juan, D.[Du], Zheng, Z.[Zhou],
Monitoring the water quality of Liangzi Lake based on HJ-1 data,
IASP11(513-518).
IEEE DOI 1112
BibRef

Westell, J., Saeedi, P.,
3D object recognition via multi-view inspection in unknown environments,
ICARCV10(2088-2095).
IEEE DOI 1109
BibRef

Camarda, M., Guarnieri, A., Milan, N., Vettore, A.,
Health Monitoring of Complex Structure Using TLS and Photogrammetry,
CloseRange10(xx-yy).
PDF File. 1006
BibRef

Wang, C., Mills, J.P., Gosling, P.D., Bridgens, B., Grisdale, R.J.,
Monitoring the Testing, Construction and as-Built Condition of Membrane Structures by Close Range Photogrammetry,
CloseRange10(xx-yy).
PDF File. 1006
BibRef

Hajian, M., Honarvar, F., Abrishami Moghaddam, H.,
Reflectivity Estimation Using Expectation Maximization Algorithm in Ultrasonic Nondestructive Evaluation,
WSSIP09(1-4).
IEEE DOI 0906
BibRef

Kim, H.C.[Hyun-Cheol], Kim, W.Y.[Whoi-Yul],
Automated thickness measuring system for brake shoe of rolling stock,
WACV09(1-6).
IEEE DOI 0912
BibRef

Jia, J.C.[Jian-Cheng],
A Machine Vision Application for Industrial Assembly Inspection,
ICMV09(172-176).
IEEE DOI 0912
BibRef

Wang, S.[Shun], Zhang, Y.X.[Yi-Xin],
A Robust Alignment Algorithm for Microprocessor Based Fiber Fusion Splicer,
CISP09(1-4).
IEEE DOI 0910
For optical fiber. BibRef

Long, Z., Li, H.F., Yang, X., Liang, H.N.,
Study on Preparation and Characterization of Magnetic Paper with Bleached Chemical Pulp,
CISP09(1-4).
IEEE DOI 0910
BibRef

Khan, U.S., Iqbal, J., Khan, M.A.,
Automatic inspection system using machine vision,
AIPR05(210-217).
IEEE DOI 0510
BibRef

Sun, J.[Jun], Sun, Q.[Qiao],
A Support Vector Machine Based Online Learning Approach for Automated Visual Inspection,
CRV09(192-199).
IEEE DOI 0905
BibRef

Bohlool, M.[Mehdy], Taghanaki, S.R.[Soroosh Rahimi],
Cost-efficient Automated Visual Inspection system for small manufacturing industries based on SIFT,
IVCNZ08(1-6).
IEEE DOI 0811
BibRef

Flores-Guzman, N.[Norberto], Sossa-Azuela, J.H.[J. Humberto], Bizuet-Garcia, R.[Rocky],
A Decision and Communication Management Methodology for embedded Multi-smart Camera systems, applied to real-time inspection in lamps production,
ICDSC08(1-10).
IEEE DOI 0809
BibRef

Sebastián, J.M., García, D., Traslosheros, A., Sánchez, F.M., Domínguez, S.,
A New Automatic Planning of Inspection of 3D Industrial Parts by Means of Visual System,
ICIAR07(1148-1159).
Springer DOI 0708
BibRef

Sebastián, J.M., García, D., Traslosheros, A., Sánchez, F.M., Domínguez, S., Pari, L.,
A New Approach to the Automatic Planning of Inspection of 3D Industrial Parts,
ACIVS07(25-36).
Springer DOI 0708
BibRef

Carrasco, M.[Miguel], Mery, D.[Domingo],
Automatic Multiple Visual Inspection on Non-calibrated Image Sequence with Intermediate Classifier Block,
PSIVT07(371-384).
Springer DOI 0712
BibRef
Earlier: A2, A1:
Advances on Automated Multiple View Inspection,
PSIVT06(513-522).
Springer DOI 0612
BibRef
Earlier: A2, A1:
Automated Multiple View Inspection Based on Uncalibrated Image Sequences,
SCIA05(1238-1247).
Springer DOI 0506
BibRef

Bazin, A.I., Cole, T., Kett, B., Nixon, M.S.,
An Automated System for Contact Lens Inspection,
ISVC06(I: 141-150).
Springer DOI 0611
BibRef

Stößel, D.[Dirk], Sagerer, G.[Gerhard],
Kernel Particle Filter for Visual Quality Inspection from Monocular Intensity Images,
DAGM06(597-606).
Springer DOI 0610
BibRef

Zhang, J.[Jian], Yang, R.[Ruqing],
Insulators Recognition for 220kv/330kv High-voltage Live-line Cleaning Robot,
ICPR06(IV: 630-633).
IEEE DOI 0609
BibRef

Fu, Z.Y.[Zhou-Yu], Robles-Kelly, A.[Antonio],
Learning Object Material Categories via Pairwise Discriminant Analysis,
OTCBVS07(1-7).
IEEE DOI 0706
BibRef

Fu, Z.Y.[Zhou-Yu], Robles-Kelly, A.[Antonio], Tan, R.T.[Robby T.], Caelli, T.M.[Terry M.],
Invariant Object Material Identification via Discriminant Learning on Absorption Features,
OTCBVS06(140).
IEEE DOI 0609
BibRef

Moalla, I., Alimi, A.M., Le Bourgeois, F., Emptoz, H.,
Image Analysis for Palaeography Inspection,
DIAL06(303-311).
IEEE DOI 0604
BibRef

Ghosh, D., Wei, D.C.T.[David C. Tou],
Material Classification Using Morphological Pattern Spectrum for Extracting Textural Features from Material Micrographs,
ACCV06(II:623-632).
Springer DOI 0601
BibRef

Li, X., Fang, Z.P., Ng, F.L., Zhao, L.P., Zhao, L.,
Inspection and Image Analysis of Nickel Sulphide Inclusions in Toughened Glass Panels,
ICARCV06(1-6).
IEEE DOI 0612
BibRef

Lins, R.D.[Rafael Dueire], Oliveira, D.M.[Daniel Marques],
Automatically Detecting Symmetries in Decorative Tiles,
ICIAR05(310-319).
Springer DOI 0509
BibRef

Lins, R.D.[Rafael Dueire],
A New File Format for Decorative Tiles,
ICIAR04(II: 175-182).
Springer DOI 0409
BibRef

Xie, J.[Jin], Kaya, A., Bain, J.A., Vijaya Kumar, B.V.K.,
Shallow Arc Detection in Disk Surface Images for Disk Forensics,
ICIP05(III: 81-84).
IEEE DOI 0512
BibRef

Cuenca, S.A.[Sergio A.], Cámara, A.[Antonio], Suardíaz, J.[Juan], Toledo, A.[Ana],
Domain-Specific Codesign for Automated Visual Inspection Systems,
IbPRIA05(I:683).
Springer DOI 0509
BibRef

Mery, D.[Domingo], Medina, O.[Olaya],
Automated Visual Inspection of Glass Bottles Using Adapted Median Filtering,
ICIAR04(II: 818-825).
Springer DOI 0409
BibRef

Liu, H.J.[Huan-Jun], Wang, Y.N.[Yao-Nan],
Development of glass bottle inspector based on machine vision,
ICARCV08(785-790).
IEEE DOI 1109
BibRef

Duan, F.[Feng], Wang, Y.N.[Yao-Nan], Liu, H.J.[Huan-Jun],
A real-time machine vision system for bottle finish inspection,
ICARCV04(II: 842-846).
IEEE DOI 0412
BibRef

Martín-Herrero, J., Ferreiro-Armán, M., Alba-Castro, J.L.,
Grading Textured Surfaces with Automated Soft Clustering in a Supervised SOM,
ICIAR04(II: 323-330).
Springer DOI 0409
BibRef
And:
A SOFM improves a real time quality assurance machine vision system,
ICPR04(IV: 301-304).
IEEE DOI 0409
BibRef

Behnke, S.,
A two-stage system for meter value recognition,
ICIP03(I: 549-552).
IEEE DOI 0312
BibRef

von Bank, C.[Clemens], Gavrila, D.M.[Dariu M.], Wöhler, C.[Christian],
A Visual Quality Inspection System Based on a Hierarchical 3D Pose Estimation Algorithm,
DAGM03(179-186).
Springer DOI 0310
BibRef

Ding, Y.H.[Yu-Hua], Vachtsevanos, G.J.[George J.], Yezzi, A.J.[Anthony J.], Daley, W.[Wayne], Heck-Ferri, B.S.[Bonnie S.],
A Real-Time Multisensory Image Segmentation Algorithm with an Application to Visual and X-Ray Inspection,
CVS03(192 ff).
Springer DOI 0306
BibRef

Zitova, B., Flusser, J., Sroubek, F.,
Application of image processing for the conservation of the medieval mosaic,
ICIP02(III: 993-996).
IEEE DOI 0210
BibRef

Toth, D., Aach, T.,
Improved minimum distance classification with Gaussian outlier detection for industrial inspection,
CIAP01(584-588).
WWW Link. 0210
BibRef

Samek, O.[Ota], Krzysánek, V.[Vladislav], Beddows, D.C.S.[David C.S.], Telle, H.H.[Helmut H.], Kaiser, J.[Josef], Lika, M.[Miroslav],
Material Identification Using Laser Spectroscopy and Pattern Recognition Algorithms,
CAIP01(443 ff.).
Springer DOI 0210
BibRef

Hutterer, A., Menzel, T., Otto, A., Müller, G.,
Feature Extraction for Advanced Control of Flexible Forming Processes,
VMV01(xx-yy).
PDF File. 0209
BibRef

Köppen, M., Soria-Frisch, A., Sy, T.,
Binary Pattern Processing Framework for Perceptual Fault detection,
SCIA01(P-W4B). 0206
BibRef

Chen, C., Qiu, G.,
Detection Algorithm of Particle Contamination in Reticle Images with Continuous Wavelet Transform,
BMVC01(Poster Session 2. and Demonstrations).
HTML Version. The University of Nottingham 0110
BibRef

Honda, T.[Toshifumi], Nayar, S.K.[Shree K.],
Finding 'Anomalies' in an Arbitrary Image,
ICCV01(II: 516-523).
IEEE DOI 0106
Structural Texture. I.e. where the texture is interrupted (e.g. generic inspection). BibRef

Shu, C., Xi, F.,
Model-based scanning path generation for inspection,
3DIM99(118-124).
IEEE DOI 9910
BibRef

Sablatnig, R., Kropatsch, W.G.,
Application constraints in the design of an automatic reading device for analog display instruments,
WACV94(205-212).
IEEE Abstract. 0403
BibRef
Earlier:
Automatic reading of analog display instruments,
ICPR94(A:794-797).
IEEE DOI 9410
BibRef

Chou, P.C., Bennamoun, M.,
Accurate Localization of Edges in Noisy Volume Images,
ICPR00(Vol IV: 760-763).
IEEE DOI 0009
Inspection. BibRef

Abegg, F., Engel, D., Wörn, H.,
A Robust Algorithm for Segmenting Deformable Linear Objects from Video Image Sequences,
ICPR00(Vol IV: 756-759).
IEEE DOI 0009
BibRef

Abegg, F., Wörn, H.,
Robust Algorithms for Recognizing Shape Changes of Deformable Linear Objects in Video Image Sequences,
ICIP00(Vol I: 335-338).
IEEE DOI 0008
BibRef

Kita, N.,
Visual Attention Control for Nuclear Power Plant Inspection,
ICPR00(Vol IV: 118-123).
IEEE DOI 0009
BibRef

Kauppinen, H., Silvén, O., Piirainen, T.,
Self-Organizing Map Based User Interface for Visual Surface Inspection,
SCIA99(Industrial Applications). BibRef 9900

Ramos, V., Pina, P., Muge, F.,
From Feature Extraction to Classification: A Multidisciplinary Approach Applied to Portuguese Granites,
SCIA99(Industrial Applications). BibRef 9900

Krcmar, M., Kodl, P.,
Model Management in the System Generating Vision Inspections,
MVA98(xx-yy). BibRef 9800

Ji, Q.A.[Qi-Ang], Haralick, R.M.[Robert M.],
A Statistical Framework for Geometric Tolerancing Manufactured Parts,
ICPR98(Vol II: 1728-1730).
IEEE DOI 9808
BibRef

Kadyrov, A., Petrou, M.[Maria],
Linear Transformation Parameter Estimation for Fault Detection,
ICPR98(Vol I: 550-552).
IEEE DOI 9808
BibRef

Nguyen, V.D.[Van-Duc], Noble, J.A.[J. Alison], Mundy, J.L.[Joseph L.], Janning, J.[John], Ross, J.[Joseph],
Exhaustive Detection of Manufacturing Flaws as Abnormalities,
CVPR98(945-952).
IEEE DOI BibRef 9800

Nagata, N.[Noriko], Dobashi, T.[Toshimasa], Manabe, Y.[Yoshitsugu], Usami, T.[Teruo], and Inokuchi, S.[Seiji],
Modelling and Visualization for Pearl Quality Evaluation Simulator,
SCIA97(xx-yy)
HTML Version. 9705
BibRef

Wiklund, J., Granlund, G.H.,
Autonomous Inspection System for Nuclear Power Plants,
SSAB97(Autonomous Systems) 9703
BibRef

Nagata, N.[Noriko], Dobashi, T.[Toshimasa], Manabe, Y.[Yoshitsugu], Usami, T.[Teruo], Inokuchi, S.[Seiji],
Image analysis and synthesis using physics-based-modeling for pearl quality evaluation system,
CIAP97(II: 697-704).
Springer DOI 9709
BibRef

Boddeke, F., Schenkeveld, E., van Geest, L., Young, I.,
Fluorescence Lifetime Determination for Application in Microscopy,
ICPR96(III: 854-858).
IEEE DOI 9608
(Delft Univ. of Technology, NL) BibRef

Aas, K., Eikvil, L., Milvang, O.,
Automatic Can Separation,
ICPR96(III: 954-958).
IEEE DOI 9608
(Norwegian Computing Center, N) BibRef

Sablatnig, R.,
Flexible Automatic Visual Inspection Based on the Separation of Detection And Analysis,
ICPR96(III: 944-948).
IEEE DOI 9608
(Technical Univ. Vienna, A) BibRef

Pascoletti, A., and Trucco, E.,
On Uncalibrated Motion-Based Inspection for Conveyor-Belt Systems,
BMVC96(Poster Session 2). 9608
Universita di Udine and Heriot-Watt University BibRef

Boukouvalas, C., Kittler, J.V., Marik, R., Petrou, M.,
Automatic Grading of Textured Ceramic Tiles,
SPIE(2425), 3rd Machine Vision Applications in Industrial Inspection, February 1995, San Jose, pp. 248-256. BibRef 9502

Anzalone, A., Machi, A.,
Real-Time Visual Inspection of Moulded Plastics Drippers,
CAMP95(xx). BibRef 9500

Bartels, K.A., Fisher, J.L.,
Multifrequency eddy current image processing techniques for nondestructive evaluation,
ICIP95(I: 486-489).
IEEE DOI 9510
BibRef

Brzakovic, D., Vujovic, N.,
Development environment for designing and testing inspection systems,
ICPR94(C:366-369).
IEEE DOI 9410
BibRef

Hartley, R.I.[Richard I.], Noble, J.A.[J. Alison], Grande, J.[James], Liu, J.[Jane],
Quantitative measurement of manufactured diamond shape,
ECCV94(A:433-440).
Springer DOI 9405
BibRef

Jenkins, M.R.M.[Michael R. M.], Jepson, A.[Allan],
Detecting Floor Anomalies,
BMVC94(xx-yy).
PDF File. 9409
BibRef

Koeinig, A.[Andreas], Bulmahn, O.[Olaf], Glesner, M.[Manfred],
Systematic Methods for Multivariate Data Visualization and Numerical Assessment of Class Separability and Overlap in Automated Visual Industrial Quality Control,
BMVC94(xx-yy).
PDF File. 9409
BibRef

Sobh, T.M., Dekhil, M., Jaynes, C., and Henderson, T.C.,
A Perception Framework for Inspection and Reverse Engineering,
CVPR93(609-610).
IEEE DOI BibRef 9300

Mundy, J.L., and Noble, J.A.,
Toward Template-Based Tolerancing from a Bayesian Viewpoint,
CVPR93(246-252).
IEEE DOI Inspection based on templates. BibRef 9300

Noble, J.A., Nguyen, V.D., Marinos, C., Tran, A.T., Farley, J., Hedengren, K.H., and Mundy, J.L.,
Template Guided Visual Inspection,
ECCV92(893-901).
Springer DOI BibRef 9200

Mundy, J.L., Noble, J.A., Marinos, C., Nguyen, V.D., Heller, A.J., Farley, J., and Tran, A.T.,
An Object-Oriented Approach to Template Guided Inspection,
CVPR92(386-392).
IEEE DOI Systems design issues for inspection techniques. BibRef 9200

Palenichka, R.M.[Roman M.], Mysak, R.T.[Roman T.],
Model-based adaptive preprocessing of images in automatic visual inspection,
CAIP93(732-737).
Springer DOI 9309
BibRef

Boccignone, G., Esposito, L., Marcelli, A.,
An experimental vision tool for real time quality control,
CAIP93(706-710).
Springer DOI 9309
BibRef

Modayur, B.R., Shapiro, L.G.,
Automated Inspection Of Machine Parts,
ICPR92(I:57-60).
IEEE DOI BibRef 9200

Nayar, S.K.,
Shape recovery methods for visual inspection,
WACV92(136-145).
WWW Link. 0403
BibRef

Ip, H.H.S.[Horace H.S.],
Visual Evidence Accumulation in Radiograph Inspection,
BMVC91(xx-yy).
PDF File. 9109
BibRef

Avnaim, F., Boissonnat, J.D.,
A geometric approach to inspection,
ICPR88(II: 891-893).
IEEE DOI 8811
BibRef

Brun-Buisson, A., Lattuati, V., Lemoine, D.,
Selective Sorting of Glass Bottles by Artificial Vision,
ICPR86(759-761). BibRef 8600

Firschein, O., Fischler, M.A.,
Perceptual Problems in Analyzing Industrial Radiographs,
IJCAI81(740-745). BibRef 8100

Barnard, S.T.[Stephen T.],
Automated Inspection Using Gray-Scale Statistics,
AAAI-80(49-52). BibRef 8000
And: ICPR80(269-272). BibRef

Peterson, C.,
Automated Visual Inspection,
ICPR74(). BibRef 7400

Chapter on Implementations and Applications, Databases, QBIC, Video Analysis, Hardware and Software, Inspection continues in
Inspection Systems -- General, Survey, Review .


Last update:Nov 18, 2017 at 20:56:18