20.7.3 Inspection Systems and Techniques

KLA Tencor,
2007.
WWW Link. Vendor, Inspection. Semiconductor wafer inspection systems. Other industrial systems.

National Instruments,
2007.
WWW Link. Vendor, Inspection. Industrial inspection systems.

Vitronic,
1984
WWW Link. Vendor, Inspection. Vendor, 3-D Modeling. Industrial inspection systems, 3d Models, OCR, etc.

Basler Vision Technologies,
1988
WWW Link. Vendor, Inspection. Industrial inspection systems.

NeuroCheck GmbH,
1993
WWW Link. Vendor, Inspection. Industrial inspection systems.

Soliton,
1998.
WWW Link. Vendor, Inspection. Inspection systems.

Visionx Inc.,
2010.
WWW Link. Vendor, Inspection. Inspection systems.

Qioptiq Photonics for Innovation,
2010.
WWW Link. Vendor, Inspection. Inspection systems, but mostly photonics, lasers, etc.

Acsis, Inc.,
2007.
WWW Link. Vendor, Inspection. Inspection is only a part of it. Monitoring.

Uno, T., Ejiri, M., Tokunaga, T.,
A method of real-time recognition of moving objects and its application,
PR(8), No. 4, October 1976, pp. 201-208.
Elsevier DOI 0309
An object moving in the horizontal scan direction. applied as an electronic eye to a bolting robot. BibRef

Kittler, J.V., Pau, L.F.,
Automatic inspection by lots in the presence of classification errors,
PR(12), No. 4, 1980, pp. 237-241.
Elsevier DOI 0309
BibRef

Woods, P.W.,
The Use of Geometric and Grey-Level Models for Industrial Inspection,
PRL(5), 1987, pp. 11-17. BibRef 8700

Trivedi, M.M., Chen, C.X., and Marapane, S.B.,
A Vision System for Robotic Inspection and Manipulation,
Computer(22), No. 6, June 1989, pp. 91-97. BibRef 8906
Earlier:
ROBOSIGHT: Robotic Vision System for Inspection and Manipulation,
SPIE(1008), Expert Robots for Industrial Use, Cambridge, MA, November 1988.
See also Region-Based Stereo Analysis for Robotic Applications. BibRef

Chen, C., Trivedi, M.M., and Bidlack, C.R.,
Design and Implementation of an Autonomous Spill Cleaning Robotic System,
SPIE(1293), Applications of Artificial Intelligence VIII, Orlando, FL, April 1990, pp. 691-703. BibRef 9004

Perkins, W.A.,
Using Circular Symmetry and Intensity Profiles for Computer Vision Inspection,
CGIP(17), No. 2, October 1981, pp. 161-172.
Elsevier DOI BibRef 8110

Perkins, W.A.,
INSPECTOR: A Computer Vision System That Learns to Inspect Parts,
PAMI(5), No. 6, November 1983, pp. 584-592. Model of part - inspection regions and tests. Transform the images, search for the best match (transformation). Then look for differences in the intensity or edginess.
See also Model-Based Vision System for Industrial Parts, A. BibRef 8311

Baird, M.L.,
GAGESIGHT: A Computer Vision System for Automatic Inspection of Instrument Gauges,
PAMI(5), No. 6, November 1983, pp. 618-621. Gauge inspection, integrated into production. A model for each gauge, a "GM" style research and development project. BibRef 8311

Baird, M.L.,
Image Segmentation Technique for Locating Automotive Parts on Belt Conveyors,
IJCAI77(694-695). BibRef 7700

Dyer, C.R.,
Gauge Inspection Using Hough Transforms,
PAMI(5), No. 6, November 1983, pp. 621-623. Hough. Gauge inspection using Hough techniques - for checking accuracy of the gauge readings. BibRef 8311

Darwish, A.M., and Jain, A.K.,
A Rule Based Approach for Visual Pattern Inspection,
PAMI(10), No. 1, January 1988, pp. 56-68.
IEEE DOI BibRef 8801

Malloch, C.B., Kwak, W.I., Gerhardt, L.A.,
A Class of Adaptive Model- and Object-Driven Nonuniform Sampling Methods for 3-D Inspection,
MVA(1), 1988, pp. 97-114. BibRef 8800

Azegami, O.[Osamu], Miyake, T.[Toshifumi],
Method and apparatus for sorting articles,
US_Patent4,693,378, Sep 15, 1987
WWW Link. By size BibRef 8709

Hoki, T.[Tetsuo], Sano, T.[Tetsuo], Kitakado, R.[Ryuji], Sezaki, Y.[Yoshinori], Hotta, T.[Tomiji], Yano, H.[Hironobu],
Pattern masking method and an apparatus therefor,
US_Patent4,797,939, Jan 10, 1989
WWW Link. BibRef 8901

Mirmehdi, M.,
Product Label Inspection Using Transputers,
CPE(3), No. 4, 1991, pp. 265-273. Hough, Parallel.
WWW Link. BibRef 9100

Abidi, M.A.[Mongi A.], Eason, R.O.[Richard O.], Gonzalez, R.C.[Rafael C.],
Autonomous Robotic Inspection and Manipulation Using Multisensor Feedback,
Computer(24), No. 3, March 1991, pp. 14-21. Vision, touch, etc. BibRef 9103

Mecocci, A.[Allessandro],
PC-based system for transparent fluid film monitoring,
IVC(9), No. 2, April 1991, pp. 100-106.
Elsevier DOI 0401
mpurities in transparent fluid films. BibRef

Aoyama, Y.[Yoshiyuki], Nakano, T.[Takahiro], Kanasashi, O.[Osamu],
Method and apparatus for checking pattern,
US_Patent5,048,094, Sep 10, 1991
WWW Link. BibRef 9109

Sun, Y.N.[Yung-Nien], Tsai, C.T.[Ching-Tsorng],
A New Model-Based Approach for Industrial Visual Inspection,
PR(25), No. 11, November 1992, pp. 1327-1336.
Elsevier DOI BibRef 9211

Sin, S.K., Chen, C.H.,
A comparison of deconvolution techniques for the ultrasonic nondestructive evaluation of materials,
IP(1), No. 1, January 1992, pp. 3-10.
IEEE DOI 0402
BibRef

Litt, M.[Maria], Cobb, W.N.[Wesley N.], Bond, D.C.[David C.], Chung, J.C.[Jack C.], Leininger, G.G.[Gary G.],
Method and apparatus for inspecting surfaces for contrast variations,
US_Patent5,091,963, Feb 25, 1992
WWW Link. BibRef 9202

Smyth, P.[Padhraic],
Hidden Markov models for fault detection in dynamic systems,
PR(27), No. 1, January 1994, pp. 149-164.
Elsevier DOI 0401
BibRef

Vannelli, A.[Anthony], Madsen, T.C.[Thomas C.],
Product inspection method and apparatus,
US_Patent5,335,293, Aug 2, 1994
WWW Link. BibRef 9408

Asundi, A., Sajan, M.R.,
Peripheral Inspection of Objects,
OptLas(22), No. 3, 1995, pp. 227-240. BibRef 9500

Tarbox, G.H., Gottschlich, S.N.,
IVIS: An Integrated Volumetric Inspection System,
CVIU(61), No. 3, May 1995, pp. 430-444.
DOI Link BibRef 9505

Tretter, D., Bouman, C.A., Khawaja, K.W., Maciejewski, A.A.,
A multiscale stochastic image model for automated inspection,
IP(4), No. 12, December 1995, pp. 1641-1654.
IEEE DOI 0402
BibRef

Sobh, T., Owen, J.,
A Sensing Strategy for the Reverse Engineering of Machined Parts,
JIRS(14), No. 3, November 1995, pp. 323-340. BibRef 9511

Savary, G.[Gilles], Cans, M.[Michel], Bastian, F.L.[Fernando Luíz],
Characterization of Optical, Electronic and Topographic Images in Fatigue Research,
IVC(13), No. 8, October 1995, pp. 609-622.
Elsevier DOI BibRef 9510

Hunter, J.J.[J. Jeffrey], Graham, J.[Jim], Taylor, C.J.[Chris. J.],
User Programmable Visual Inspection,
IVC(13), No. 8, October 1995, pp. 623-628.
Elsevier DOI BibRef 9510
Earlier: BMVC94(xx-yy).
PDF File. 9409
BibRef

di Mauro, E.C., Cootes, T.F., Page, G.J., Jackson, C.B.,
Check: A Generic and Specific Industrial Inspection Tool,
VISP(143), No. 4, August 1996, pp. 241-249. 9611
BibRef

Mukherjee, D.P.[Dipti Prasad], Pal, A.[Amita], Sarma, S.E.[S. Eswara], Majumder, D.D.[D. Dutta],
Water quality analysis: A pattern recognition approach,
PR(28), No. 2, February 1995, pp. 269-281.
Elsevier DOI 0401
BibRef

Ouslim, M., Curtis, K.M.,
Automatic Visual Inspection Based upon a Variant of the N-Tuple Technique,
VISP(143), No. 5, October 1996, pp. 301-309. 9701
BibRef

Valle, M., Raffo, L., Caviglia, D.D., Bisio, G.M.,
A VLSI Image-Processing Architecture Dedicated to Real-Time Quality-Control Analysis in an Industrial-Plant,
RealTimeImg(2), No. 6, December 1996, pp. 361-371. 9702
BibRef

Simon, S., Rogala, J.P.,
Model-Based Prediction-Verification Scheme for Real-Time Inspection,
PRL(7), 1988, pp. 305-311. BibRef 8800

Griffin, P.M., Villalobos, J.R.,
Process Capability of Automated Visual Inspection Systems,
SMC(22), 1992, pp. 441-448. BibRef 9200

Skinner, D.R., Benke, K.K., Chung, M.J.,
Application of Adaptive Convolution Masking to the Automation of Visual Inspection,
RA(6), 1990, pp. 123-127. BibRef 9000

Menq, C.H., Yau, H.T., Lai, G.Y.,
Automated Precision Measurement of Surface Profile in CAD-Directed Inspection,
RA(8), 1992, pp. 268-278. BibRef 9200

Magee, M.[Michael], Weniger, R.[Richard], Wenzel, D.[Dennis],
Multidimensional pattern classification of bottles using diffuse and specular illumination,
PR(26), No. 11, November 1993, pp. 1639-1654.
Elsevier DOI 0401
BibRef

Tascini, G., Zingaretti, P., Conte, G.,
Real-Time Inspection by Submarine Images,
JEI(5), No. 4, October 1996, pp. 432-442. 9709
BibRef

Hou, T.H., Kuo, W.L.,
A New Edge-Detection Method for Automatic Visual Inspection,
IJAMT(13), No. 6, 1997, pp. 407-412. 9708
BibRef

Marokkey, S.R., Tay, C.J., Shang, H.M., Asundi, A.K.,
Time-Delay and Integration Imaging for Inspection and Profilometry of Moving-Objects,
OptEng(36), No. 9, September 1997, pp. 2573-2578. 9710
BibRef

Ringlien, J.A.[James A.],
Optical inspection of container finish dimensional parameters,
US_Patent5,610,391, Mar 11, 1997
WWW Link. BibRef 9703

Noble, J.A., Gupta, R., Mundy, J.L., Schmitz, A., Hartley, R.I.,
High-Precision X-Ray Stereo for Automated 3-D Cad-Based Inspection,
RA(14), No. 2, April 1998, pp. 292-302. 9804
BibRef
Earlier: A2, A1, A5, A3, A4:
Camera calibration for 2.5-D X-ray metrology,
ICIP95(III: 37-40).
IEEE DOI 9510
BibRef

McAulay, A.D., Wang, J.Q.,
Optical Diffraction Inspection of Periodic Structures Using Neural Networks,
OptEng(37), No. 3, March 1998, pp. 884-888. 9804
BibRef

Lai, S.H.[Shang-Hong], Fang, M.[Ming],
An Accurate and Fast Pattern Localization Algorithm for Automated Visual Inspection,
RealTimeImg(5), No. 1, February 1999, pp. 3-14. BibRef 9902

Lai, S.H.[Shang-Hong], Fang, M.[Ming],
A Hybrid Image Alignment System for Fast and Precise Pattern Localization,
RealTimeImg(8), No. 1, February 2002, pp. 23-33.
DOI Link 0204
BibRef

Drisko, R.[Robert], Bachelder, I.A.[Ivan A.],
Image processing system and method using subsampling with constraints such as time and uncertainty constraints,
US_Patent5,995,648, Nov 30, 1999
WWW Link. BibRef 9911
And: US_Patent6,157,732, Dec 5, 2000
WWW Link. BibRef
And: US_Patent6,278,796, Aug 21, 2001
WWW Link. BibRef

Rudt, R.J.[Robert J.], Fiore, L.F.[Leonard F.], Grapes, K.D.[Kenneth D.],
System for monitoring a continuous manufacturing process,
US_Patent5,821,990, Oct 13, 1998
WWW Link. BibRef 9810

Sezgin, M.[Mehmet], Taaltín, R.[Ramazan],
A new dichotomization technique to multilevel thresholding devoted to inspection applications,
PRL(21), No. 2, February 2000, pp. 151-161. 0003
BibRef

Bergasa, L.M., Duffy, N., Lacey, G., Mazo, M.,
Industrial inspection using Gaussian functions in a colour space,
IVC(18), No. 12, September 2000, pp. 951-957.
Elsevier DOI 0008
BibRef

Paping, M.[Martin], Oskar, M.[Meier],
Device for examining securities,
US_Patent6,257,389, July 10, 2001.
WWW Link. BibRef 0107

Sari-Sarraf, H.[Hamed], Goddard Jr., J.S.[James S.], Abidi, B.R.[Besma R.], Hunt, M.A.[Martin A.],
Vision system for on-line characterization of paper slurry,
IJIST(11), No. 4, 2001, pp. 231-242.
WWW Link. 0105
BibRef

Norgard, J.[John], Will, J.[John], Stubenrauch, C.[Carl],
Quantitative images of antenna patterns using infrared thermography and microwave holography,
IJIST(11), No. 4, 2001, pp. 210-218.
WWW Link. 0105
BibRef

Ryan, C.G.,
Quantitative trace element imaging using PIXE and the nuclear microprobe,
IJIST(11), No. 4, 2001, pp. 219-230.
WWW Link. 0105
BibRef

Daut, D.G., Zhao, D.M.[Dong-Ming],
A flaw detection method based on morphological image processing,
CirSysVideo(3), No. 6, December 1993, pp. 389-398.
IEEE Top Reference. 0206
BibRef

Scola, J.R.[Joseph R.], Ruzhitsky, V.N.[Vladimir N.], Jacobson, L.D.[Lowell D.],
Machine vision system for object feature analysis and validation based on multiple object images,
US_Patent6,175,644, Jan 16, 2001
WWW Link. BibRef 0101

Doignon, C.[Christophe], Knittel, D.[Dominique],
Detection of Noncircularity and Eccentricity of a Rolling Winder by Artificial Vision,
JASP(2002), No. 7, July 2002, pp. 714-727. 0208
BibRef

Rostami, F.[Fariborz], Dampier, T.O.[Todd O.], Mangalindan, E.C.[Edwin C.],
System and method for counting parts in multiple fields of view using machine vision,
US_Patent6,483,935, Nov 19, 2002
WWW Link. BibRef 0211

Koren, Y.[Yoram], Katz, R.[Reuven],
Reconfigurable apparatus and method for inspection during a manufacturing process,
US_Patent6,567,162, May 20, 2003
WWW Link. BibRef 0305

Pingel, U.[Ulrich], Niepel, C.[Christian],
Method for detecting optical errors in large surface panels,
US_Patent6,509,967, Jan 21, 2003
WWW Link. BibRef 0301

Prieto, F.[Flavio], Lepage, R.[Richard], Boulanger, P.[Pierre], Redarce, T.[Tanneguy],
A CAD-based 3D data acquisition strategy for inspection,
MVA(15), No. 2, December 2003, pp. 76-91.
Springer DOI 0401
BibRef
Earlier: A1, A4, A3, A2:
CAD-based range sensor placement for optimum 3D data acquisition,
3DIM99(128-137).
IEEE DOI 9910
BibRef

Prieto, F., Redarce, T., Boulanger, P., Lepage, R.,
Tolerance control with high resolution 3D measurements,
3DIM01(339-346).
IEEE DOI 0106
BibRef

Hernández, J.[Jorge], Prieto, F.[Flavio],
3D and Texture Modelling of Precolombian Objects,
ISVC06(I: 822-830).
Springer DOI 0611
BibRef

Guo, H.[Hong], Jack, L.B., Nandi, A.K.,
Feature generation using genetic programming with application to fault classification,
SMC-B(35), No. 1, February 2005, pp. 89-99.
IEEE Abstract. 0501
BibRef

Elbehiery, H.M.[Hussam M.], Hefnawy, A.A.[Alaa A.], Elewa, M.T.[Muhammad T.],
Visual Inspection for Fired Ceramic Tile's Surface Defects Using Wavelet Analysis,
GVIP(05), No. V2, January 2005, pp. 1-8
HTML Version. BibRef 0501

Evans, J.P.O., Liu, Y., Chan, J.W., Downes, D.,
View synthesis for depth from motion 3D X-ray imaging,
PRL(27), No. 15, November 2006, pp. 1863-1873.
Elsevier DOI 0609
Security X-ray; Image synthesis; KDE; Kinetic depth; Stereoscopic; Correspondence problem; Multiple view BibRef

Grafulla-González, B.[Beatriz], Lebart, K.[Katia], Harvey, A.R.[Andrew R.],
Physical optics modelling of millimetre-wave personnel scanners,
PRL(27), No. 15, November 2006, pp. 1852-1862.
Elsevier DOI 0609
Millimetre-wave; Image formation; Image simulation; Kolmogorov-Smirnov test; Material classification BibRef

Vitri, J., Bressan, M., Radeva, P.I.,
Bayesian Classification of Cork Stoppers Using Class-Conditional Independent Component Analysis,
SMC-C(37), No. 1, January 2007, pp. 32-38.
IEEE DOI 0701
BibRef

Nakamae, K.[Koji], Chikahisa, M.[Masaki], Fujioka, H.[Hiromu],
Estimation of electron probe profile from SEM image through wavelet multiresolution analysis for inline SEM inspection,
IVC(25), No. 7, 1 July 2007, pp. 1117-1123.
Elsevier DOI 0705
Wavelet multiresolution analysis; SEM image; Probe profile estimation; Electron probe; Inline SEM inspection BibRef

Iravani-Tabrizipour, M.[Mehrdad], Toyserkani, E.[Ehsan],
An image-based feature tracking algorithm for real-time measurement of clad height,
MVA(18), No. 6, December 2007, pp. 343-354.
Springer DOI 0711
In manufacturing process. Trinocular system. BibRef

Okuda, H.[Haruhisa], Hashimoto, M.[Manabu], Hirooka, M.[Miwako], Sumi, K.[Kazuhiko],
A Visual Inspection System Based on Trinarized Broad-Edge and Gray-Scale Hybrid Matching,
IEICE(E89-D), No. 7, July 2006, pp. 2068-2075.
DOI Link 0607
BibRef

Alexandropoulos, T., Boutas, S., Loumos, V., Kayafas, E.,
Template-guided inspection of arbitrarily oriented targets,
IET-CV(2), No. 3, September 2008, pp. 150-163.
DOI Link 0905
BibRef

Greenwood, D.P., Jeys, T.H., Johnson, B., Richardson, J.M., Shatz, M.P.,
Optical Techniques for Detecting and Identifying Biological-Warfare Agents,
PIEEE(97), No. 6, June 2009, pp. 971-989.
IEEE DOI 0905
BibRef

Shi, Q.[Quan], Xi, N.[Ning],
Develop a Non-contact Automated Dimensional Inspection System for Automotive Manufacturing Industry,
RPCS(1), No. 2, June 2008, pp. 76-83.
WWW Link. 1001
Survey, Inspection. BibRef

Grosso, E.[Enrico], Lagorio, A.[Andrea], Tistarelli, M.[Massimo],
Automated quality control of printed flasks and bottles,
MVA(22), No. 2, March 2011, pp. 269-281.
WWW Link. 1103
BibRef

Kamath, C.[Chandrika], Hurricane, O.A.[Omar A.],
Robust Extraction of Statistics from Images of Material Fragmentation,
IJIG(11), No. 1, January 2011, pp. 377-401.
DOI Link 1108
BibRef

Ren, Z.G.[Zhi-Guo], Liao, J.R.[Jia-Rui], Cai, L.L.[Li-Long],
An algorithm to estimate the crown patterns of diamonds based on machine vision,
MVA(23), No. 2, March 2012, pp. 197-215.
WWW Link. 1202
BibRef
Earlier:
Diamond color grading based on machine vision,
CRICV09(1970-1976).
IEEE DOI 0910
BibRef

Demant, C.[Christian], Streicher-Abel, B.[Bernd], Garnica, C.[Carsten],
Industrial Image Processing: Visual Quality Control in Manufacturing,

Zhang, Y.Z.[Yun-Zhou], Yang, S.B.[Shan-Bao], Su, X.L.[Xiao-Lin], Shi, E.[Enyi], Zhang, H.[Handuo],
Automatic reading of domestic electric meter: an intelligent device based on image processing and ZigBee/Ethernet communication,
RealTimeIP(12), No. 1, June 2016, pp. 133-143.
Springer DOI 1606
BibRef

Birdal, T., Bala, E., Eren, T., Ilic, S.,
Online inspection of 3D parts via a locally overlapping camera network,
WACV16(1-10)
IEEE DOI 1606
Calibration BibRef

Biagio, M.S.[Marco San], Beltrán-González, C.[Carlos], Giunta, S.[Salvatore], del Bue, A.[Alessio], Murino, V.[Vittorio],
Automatic inspection of aeronautic components,
MVA(28), No. 5-6, August 2017, pp. 591-605.
Springer DOI 1708
BibRef

Hosoya, N.[Naoki], Miyamoto, A.[Atsushi], Naganuma, J.[Junichiro],
Real-Time Color Image Improvement System for Visual Testing of Nuclear Reactors,
IEICE(E101-D), No. 5, May 2018, pp. 1243-1250.
WWW Link. 1805
BibRef
Earlier:
Real-time image improvement system for visual testing of nuclear reactors,
MVA17(1-4)
DOI Link 1708
Image color analysis, Inspection, Noise reduction, Real-time systems, Streaming media, Testing BibRef

Zhao, H.[Hong], Dai, R.[Rong], Xiao, C.Y.[Chang-Yan],
A Machine Vision System for Stacked Substrates Counting With a Robust Stripe Detection Algorithm,
SMCS(49), No. 11, November 2019, pp. 2352-2361.
IEEE DOI 1910
Sheet like material inspection. Substrates, Cameras, Machine vision, Pollution measurement, Algorithm design and analysis, Robustness, Comb filter, substrate counting BibRef

Rodríguez-Martín, M.[Manuel], Rodríguez-Gonzálvez, P.[Pablo], Ruiz de Oña Crespo, E.[Esteban], González-Aguilera, D.[Diego],
Validation of Portable Mobile Mapping System for Inspection Tasks in Thermal and Fluid-Mechanical Facilities,
RS(11), No. 19, 2019, pp. xx-yy.
DOI Link 1910
BibRef

Wang, H.[Hua], Li, C.[Cong],
Quality guided image recognition towards industrial materials diffusion,
JVCIR(64), 2019, pp. 102608.
Elsevier DOI 1911
Image recognition, Image quality BibRef

Liu, D.N.[Dun Nan], Hou, R.[Rui], Wu, W.Z.[Wen Zhuo], Hua, J.W.[Jing Wen], Wang, X.Y.[Xuan Yuan], Pang, B.[Bo],
Research on infrared image enhancement and segmentation of power equipment based on partial differential equation,
JVCIR(64), 2019, pp. 102610.
Elsevier DOI 1911
Partial differential equation, Power equipment, Infrared image, Quality model BibRef

Arnold, D.C.M.[Daiana Cristina Metz], de Oliveira, V.C.[Valéria Costa], de Souza Kazmierczak, C.[Claudio], Tonietto, L.[Leandro], Menegotto, C.W.[Camila Werner], Gonzaga, L.[Luiz], André da Costa, C.[Cristiano], Veronez, M.R.[Maurício Roberto],
A Critical Analysis of Red Ceramic Blocks Roughness Estimation by 2D and 3D Methods,
RS(13), No. 4, 2021, pp. xx-yy.
DOI Link 2103
BibRef

Park, H.M.[Ho-Min], Kang, B.[Byungkon], van Messem, A.[Arnout], de Neve, W.[Wesley],
3-D Deep Learning-based Item Classification for Belt Conveyors Targeting Packaging and Logistics,
IML20(578-591).
Springer DOI 2103
BibRef

Yang, Y.H.[Yi-Hui], Balangé, L.[Laura], Gericke, O.[Oliver], Schmeer, D.[Daniel], Zhang, L.[Li], Sobek, W.[Werner], Schwieger, V.[Volker],
Monitoring of the Production Process of Graded Concrete Component Using Terrestrial Laser Scanning,
RS(13), No. 9, 2021, pp. xx-yy.
DOI Link 2105
BibRef

Torres, B.M.[Benjamí Moreno], Völker, C.[Christoph], Nagel, S.M.[Sarah Mandy], Hanke, T.[Thomas], Kruschwitz, S.[Sabine],
An Ontology-Based Approach to Enable Data-Driven Research in the Field of NDT in Civil Engineering,
RS(13), No. 12, 2021, pp. xx-yy.
DOI Link 2106
BibRef

Maniak, T.[Tomasz], Iqbal, R.[Rahat], Doctor, F.[Faiyaz],
Hierarchical Spatial-Temporal State Machine for Vehicle Instrument Cluster Manufacturing,
ITS(22), No. 7, July 2021, pp. 4131-4140.
IEEE DOI 2107
Manufacturing, Redundancy, Fault detection, Mathematical model, Hardware, Production, Computational modeling, data analysis BibRef

Zhang, J.B.[Jia-Bin], Zhang, Z.T.[Zheng-Tao], Su, H.[Hu], Zou, W.[Wei], Gong, X.Y.[Xin-Yi], Zhang, F.[Feng],
Quality Inspection Based on Quadrangular Object Detection for Deep Aperture Component,
SMCS(51), No. 10, October 2021, pp. 5938-5948.
IEEE DOI 2109
Spring wire socket. Inspection, Object detection, Proposals, Feature extraction, Wires, Apertures, Task analysis, Convolutional neural network BibRef

Rezaei, A.[Alireza], Le Hégarat-Mascle, S.[Sylvie], Aldea, E.[Emanuel], Dondi, P.[Piercarlo], Malagodi, M.[Marco],
A-contrario framework for detection of alterations in varnished surfaces,
JVCIR(83), 2022, pp. 103357.
Elsevier DOI 2202
A-contrario framework, Defect detection, Preventive conservation, Historical violins BibRef

Diers, J.[Jan], Pigorsch, C.[Christian],
A Survey of Methods for Automated Quality Control Based on Images,
IJCV(131), No. 10, October 2023, pp. 2553-2581.
Springer DOI 2309
Survey, Quality Control. BibRef

An, K.[Kang], Sun, X.Q.[Xiao-Qing], Song, Y.Q.[Ya-Qing], Lu, Y.B.[Ye-Bin], Shangguan, Q.Q.[Qian-Qian],
A DenseNet-based feature weighting convolutional network recognition model and its application in industrial part classification,
IET-IPR(18), No. 3, 2024, pp. 589-601.
DOI Link 2402
character recognition, convolutional neural nets, edge detection, learning (artificial intelligence) BibRef

Wu, Y.Y.[Ying-Ying], Liu, J.C.[Jin-Chao], Wang, Y.[Yan], Gibson, S.[Stuart], Osadchy, M.[Margarita], Fang, Y.C.[Yong-Chun],
Reconstructing Randomly Masked Spectra Helps DNNs Identify Discriminant Wavenumbers,
PAMI(46), No. 5, May 2024, pp. 3845-3861.
IEEE DOI 2404
vibrational spectroscopy. Training, Task analysis, Image reconstruction, Spectroscopy, Data augmentation, Training data, Minerals, Masked CNN. BibRef

Guo, H.R.[Hao-Rui], Bao, Y.C.[Yi-Cheng], Hu, S.Y.[Song-Yu], Luan, C.C.[Cong-Cong], Fu, J.Z.[Jian-Zhong], Li, L.[Li], Zhang, Y.L.[Ying-Lin], Sun, Y.L.[Yong-Le], Nie, Z.J.[Zong-Jun],
AFCN: An attention-directed feature-fusion ConvNeXt network for low-voltage apparatus assembly quality inspection,
IET-IPR(18), No. 8, 2024, pp. 2093-2104.
DOI Link 2406
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A Single-Frame Deflectometry Method for Online Inspection of Light-Transmitting Components,
IP(33), 2024, pp. 3871-3879.
IEEE DOI 2407
Optical variables measurement, Surface treatment, Accuracy, Reflection, Cameras, Shape measurement, Phase measurement, transparent surface BibRef

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CNN-Based Camera Pose Estimation and Localization of Scan Images for Aircraft Visual Inspection,
ITS(25), No. 8, August 2024, pp. 8629-8640.
IEEE DOI 2408
Aircraft, Cameras, Inspection, Pose estimation, Atmospheric modeling, Airports, Localisation, inspection, aircraft maintenance BibRef

Rádli, R.[Richárd], Vörösházi, Z.[Zsolt], Czúni, L.[László],
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image processing, neural net architecture, object recognition BibRef

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Optical Frequency Sweeping Nonlinearity Measurement Based on a Calibration-free MZI,
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Frequency-Modulated Continuous Wave (FMCW) Light Detection and Ranging (LIDAR)/ Fiber optic. BibRef

Li, Z.Y.[Zi-Yang], Yu, Y.[Yang], Yin, C.[Chongbo], Shi, Y.[Yan],
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Spectral information, Convolutional neural networks, Competitive learning, Self-attention mask, Feature selection BibRef

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It's About Time: Analog Clock Reading in the Wild,
CVPR22(2498-2507)
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Training, Annotations, Training data, Benchmark testing, Transformers, Data models, Reliability, Self- semi- meta- unsupervised learning BibRef

Gu, L.Y.[Ling-Yun], Zhang, L.[Lin], Wang, Z.[Zhaokui],
A One-Shot Texture-Perceiving Generative Adversarial Network for Unsupervised Surface Inspection,
ICIP21(1519-1523)
IEEE DOI 2201
Training, Visualization, Technological innovation, Image processing, Manuals, Inspection, generative adversarial network BibRef

Preston, Z.[Zachary], Green, R.[Richard],
The Levelshred Method: A Solution to Fluid Level Detection in Partially-Obstructed Containers,
IVCNZ21(1-6)
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ISVC21(I:278-290).
Springer DOI 2112
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Real-time analogue gauge transcription on mobile phone,
MAI21(2369-2377)
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Meters, Training, Service robots, Cameras, Mobile handsets, Real-time systems, Convolutional neural networks BibRef

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Complex-Object Visual Inspection: Empirical Studies on A Multiple Lighting Solution,
ICPR21(2430-2437)
IEEE DOI 2105
Training, Visualization, System performance, Lighting, Inspection, Boosting, Hardware BibRef

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Luo, X., Jia, K., Liu, P., Xiong, D., Tian, X.,
Real-Time Measurement of Thread Number of Rail Fastener,
ICIVC20(312-316)
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CVPR20(4685-4694)
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Image reconstruction, Cost function, Elasticity, Shape, Computational modeling BibRef

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ICIP19(919-923)
IEEE DOI 1910
Deterioration of transmission towers. Neural network, ordinal scale, canonical correlation, deterioration level estimation BibRef

Lanza, N.[Nicolò], Romeo, A.[Alessandro], Cristani, M.[Marco], Setti, F.[Francesco],
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WACV16(1-8)
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WSSIP15(329-332)
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MVA15(271-274)
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IEEE DOI Systems design issues for inspection techniques. BibRef 9200

Palenichka, R.M.[Roman M.], Mysak, R.T.[Roman T.],
Model-based adaptive preprocessing of images in automatic visual inspection,
CAIP93(732-737).
Springer DOI 9309
BibRef

Boccignone, G., Esposito, L., Marcelli, A.,
An experimental vision tool for real time quality control,
CAIP93(706-710).
Springer DOI 9309
BibRef

Modayur, B.R., Shapiro, L.G.,
Automated Inspection Of Machine Parts,
ICPR92(I:57-60).
IEEE DOI BibRef 9200

Nayar, S.K.,
Shape recovery methods for visual inspection,
WACV92(136-145).
IEEE DOI 0403
BibRef

Ip, H.H.S.[Horace H.S.],
Visual Evidence Accumulation in Radiograph Inspection,
BMVC91(xx-yy).
PDF File. 9109
BibRef

Avnaim, F., Boissonnat, J.D.,
A geometric approach to inspection,
ICPR88(II: 891-893).
IEEE DOI 8811
BibRef

Firschein, O., Fischler, M.A.,
Perceptual Problems in Analyzing Industrial Radiographs,
IJCAI81(740-745). BibRef 8100

Barnard, S.T.[Stephen T.],
Automated Inspection Using Gray-Scale Statistics,
AAAI-80(49-52). BibRef 8000
And: ICPR80(269-272). BibRef

Peterson, C.,
Automated Visual Inspection,
ICPR74(). BibRef 7400

Chapter on Implementations and Applications, Databases, QBIC, Video Analysis, Hardware and Software, Inspection continues in
Inspection Systems -- General, Survey, Review .