Pribanic, T.[Tomislav],
Mrvos, S.[Sasa],
Salvi, J.[Joaquim],
Efficient multiple phase shift patterns for dense 3D acquisition in
structured light scanning,
IVC(28), No. 8, August 2010, pp. 1255-1266.
Elsevier DOI
1006
3D acquisition; Structured light; Pattern projection; Multiple phase
shifting; Phase unwrapping
BibRef
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Salvi, J.[Joaquim],
A novel Structured Light method for one-shot dense reconstruction,
ICIP12(9-12).
IEEE DOI
1302
BibRef
Fernandez, S.[Sergio],
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Pribanic, T.[Tomislav],
Absolute phase mapping for one-shot dense pattern projection,
PROCAMS10(64-71).
IEEE DOI
1006
BibRef
Wang, Y.C.[Yong-Chang],
Liu, K.[Kai],
Lau, D.L.[Daniel L.],
Hao, Q.[Qi],
Hassebrook, L.G.[Laurence G.],
Maximum SNR pattern strategy for phase shifting methods in structured
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JOSA-A(27), No. 9, September 2010, pp. 1962-1971.
WWW Link.
1003
BibRef
Wang, Y.C.[Yong-Chang],
Liu, K.[Kai],
Hao, Q.[Qi],
Lau, D.L.[Daniel L.],
Hassebrook, L.G.[Laurence G.],
Period Coded Phase Shifting Strategy for Real-time 3-D Structured Light
Illumination,
IP(20), No. 11, November 2011, pp. 3001-3013.
IEEE DOI
1110
BibRef
Torsello, A.[Andrea],
Albarelli, A.[Andrea],
Rodolà, E.[Emanuele],
Stable and fast techniques for unambiguous compound phase coding,
IVC(31), No. 4, April 2013, pp. 341-356.
Elsevier DOI
1304
Structured light; 3D reconstruction; Phase shift
BibRef
Albarelli, A.[Andrea],
Rodola, E.[Emanuele],
Rota Bulo, S.[Samuel],
Torsello, A.[Andrea],
Fast 3D surface reconstruction by unambiguous compound phase coding,
3DIM09(1670-1677).
IEEE DOI
0910
Phase shift for photometric reconstruction.
See also graph-based technique for semi-supervised segmentation of 3D surfaces, A.
BibRef
Rodolà, E.[Emanuele],
Albarelli, A.[Andrea],
Cremers, D.[Daniel],
Torsello, A.[Andrea],
A simple and effective relevance-based point sampling for 3D shapes,
PRL(59), No. 1, 2015, pp. 41-47.
Elsevier DOI
1505
3D point sampling
BibRef
Petkovic, T.[Tomislav],
Pribanic, T.[Tomislav],
Ðonlic, M.[Matea],
Single-Shot Dense 3D Reconstruction Using Self-Equalizing De Bruijn
Sequence,
IP(25), No. 11, November 2016, pp. 5131-5144.
IEEE DOI
1610
BibRef
Earlier: A3, A1, A2:
3D Surface Profilometry Using Phase Shifting of De Bruijn Pattern,
ICCV15(963-971)
IEEE DOI
1602
Calibration
BibRef
And: A1, A2, A3:
The Self-Equalizing De Bruijn Sequence for 3D Profilometry,
BMVC15(xx-yy).
DOI Link
1601
Hilbert transforms.
multi-channel structured light.
BibRef
Pribanic, T.[Tomislav],
Petkovic, T.[Tomislav],
Ðonlic, M.[Matea],
Angladon, V.[Vincent],
Gasparini, S.[Simone],
3D Structured Light Scanner on the Smartphone,
ICIAR16(443-450).
Springer DOI
1608
BibRef
Gao, H.[Han],
Han, Y.H.[Yan-Hua],
Li, Y.[Yan],
Zhu, D.Z.[De-Zhi],
Sun, M.J.[Ming-Jian],
Yu, S.Y.[Si-Yuan],
Topological charge measurement of concentric OAM states using the
phase-shift method,
JOSA-A(35), No. 1, January 2018, pp. A40-A44.
DOI Link
1801
orbital angular momentum.
Phase shift, Multiple imaging, Optical vortices , Spatial light modulators
BibRef
Tadano, R.,
Pediredla, A.K.,
Mitra, K.,
Veeraraghavan, A.,
Spatial Phase-Sweep: Increasing temporal resolution of transient
imaging using a light source array,
ICIP16(1564-1568)
IEEE DOI
1610
Cameras
BibRef
Zhang, Y.J.[Yu-Jia],
Yilmaz, A.[Alper],
Structured Light Based 3d Scanning For Specular Surface By The
Combination Of Gray Code And Phase Shifting,
ISPRS16(B3: 137-142).
DOI Link
1610
BibRef
Moreno, D.[Daniel],
Son, K.[Kilho],
Taubin, G.[Gabriel],
Embedded phase shifting: Robust phase shifting with embedded signals,
CVPR15(2301-2309)
IEEE DOI
1510
BibRef
Cong, P.Y.[Peng-Yu],
Zhang, Y.Y.[Yue-Yi],
Xiong, Z.W.[Zhi-Wei],
Zhao, S.H.[Sheng-Hui],
Wu, F.[Feng],
Accurate 3D reconstruction of dynamic scenes with Fourier transform
assisted phase shifting,
VCIP13(1-6)
IEEE DOI
1402
Fourier transforms
BibRef
Gupta, M.[Mohit],
Nayar, S.K.[Shree K.],
Micro Phase Shifting,
CVPR12(813-820).
IEEE DOI
1208
Shape revocery with illumination variations.
BibRef
Liu, K.[Kai],
Wang, Y.C.[Yong-Chang],
Phase channel multiplexing pattern strategy for active stereo vision,
IC3D12(1-8)
IEEE DOI
1503
BibRef
Li, Q.A.[Qi-Ang],
Biswas, M.[Moyuresh],
Pickering, M.R.[Mark R.],
Frater, M.R.[Michael R.],
Accurate depth estimation using structured light and passive stereo
disparity estimation,
ICIP11(969-972).
IEEE DOI
1201
BibRef
And:
Dense depth estimation using adaptive structured light and cooperative
algorithm,
PROCAMS11(21-28).
IEEE DOI
1106
BibRef
And: A1, A2, A4, A3:
Phase Based Disparity Estimation Using Adaptive Structured Light and
Dual-Tree Complex Wavelet,
DICTA11(78-83).
IEEE DOI
1205
BibRef
Schroeder, P.,
Roux, R.,
Favreau, J.M.,
Perriollat, M.,
Bartoli, A.E.,
Industrial Phase-Shifting Profilometry in Motion,
SCIA13(579-590).
Springer DOI
1311
Phase-Shift Profilometry provides a means for dense high-quality
surface scanning.
BibRef
Wissmann, P.,
Schmitt, R.,
Forster, F.,
Fast and Accurate 3D Scanning Using Coded Phase Shifting and High Speed
Pattern Projection,
3DIMPVT11(108-115).
IEEE DOI
1109
BibRef
Chen, T.B.[Tong-Bo],
Seidel, H.P.[Hans-Peter],
Lensch, H.P.A.[Hendrik P. A.],
Modulated phase-shifting for 3D scanning,
CVPR08(1-8).
IEEE DOI
0806
To separate surface reflections and illuminations.
BibRef
Lu, C.W.[Cun-Wei],
Cho, G.[Genki],
Practical 3-D Shape Measurement Using Optimal Intensity-Modulated
Projection and Intensity-Phase Analysis Techniques,
ICPR06(IV: 870-873).
IEEE DOI
0609
BibRef
Saldner, H.O.,
Huntle, J.M.,
Shape Measurement of Discontinuous Objects Using Projected Fringes and
Temporal Phase Warping,
3DIM97(2 - Sensors)
9702
BibRef
Chapter on 3-D Shape from X -- Shading, Textures, Lasers, Structured Light, Focus, Line Drawings continues in
Shape and Stereo from Panoramic Views, Stereo from Omnidirectional Images, Plenoptic .