14.1.8.3 Test Time Domain Adaptation

Yang, H.Z.[Hong-Zheng], Chen, C.[Cheng], Jiang, M.[Meirui], Liu, Q.[Quande], Cao, J.F.[Jian-Feng], Heng, P.A.[Pheng Ann], Dou, Q.[Qi],
DLTTA: Dynamic Learning Rate for Test-Time Adaptation on Cross-Domain Medical Images,
MedImg(41), No. 12, December 2022, pp. 3575-3586.
IEEE DOI 2212
Adaptation models, Data models, Training, Predictive models, Training data, Computational modeling, Task analysis, dynamic learning rate BibRef

Zeng, L.B.[Long-Bin], Han, J.Y.[Jia-Yi], Du, L.[Liang], Ding, W.Y.[Wei-Yang],
Rethinking precision of pseudo label: Test-time adaptation via complementary learning,
PRL(177), 2024, pp. 96-102.
Elsevier DOI 2401
Test-time adaptation, Complementary label, Unsupervised learning BibRef

Su, Y.Y.[Yong-Yi], Xu, X.[Xun], Li, T.R.[Tian-Rui], Jia, K.[Kui],
Revisiting Realistic Test-Time Training: Sequential Inference and Adaptation by Anchored Clustering Regularized Self-Training,
PAMI(46), No. 8, August 2024, pp. 5524-5540.
IEEE DOI 2407
Training, Adaptation models, Protocols, Data models, Predictive models, Training data, Streaming media, self-training BibRef

Liang, J.[Jian], He, R.[Ran], Tan, T.N.[Tie-Niu],
A Comprehensive Survey on Test-Time Adaptation Under Distribution Shifts,
IJCV(133), No. 1, January 2025, pp. 31-64.
Springer DOI 2501
Survey, Adaption. BibRef

Oh, Y.[Yeongtak], Lee, J.H.[Jong-Hyun], Choi, J.Y.[Joo-Young], Jung, D.[Dahuin], Hwang, U.[Uiwon], Yoon, S.[Sungroh],
Efficient Diffusion-driven Corruption Editor for Test-time Adaptation,
ECCV24(LII: 184-201).
Springer DOI 2412
BibRef

Zhu, Z.L.[Zhi-Lin], Hong, X.P.[Xiao-Peng], Ma, Z.H.[Zhi-Heng], Zhuang, W.J.[Wei-Jun], Ma, Y.[Yaohui], Wang, Y.D.Y.[Yong Dai& Yaowei],
Reshaping the Online Data Buffering and Organizing Mechanism for Continual Test-Time Adaptation,
ECCV24(LXXXII: 415-433).
Springer DOI 2412
BibRef

Yu, Y.C.[Yong-Can], Sheng, L.J.[Li-Jun], He, R.[Ran], Liang, J.[Jian],
STAMP: Outlier-aware Test-time Adaptation with Stable Memory Replay,
ECCV24(LXXXI: 375-392).
Springer DOI 2412
BibRef

Park, H.[Hyejin], Hwang, J.Y.[Jeong-Yeon], Mun, S.[Sunung], Park, S.[Sangdon], Ok, J.[Jungseul],
MedBN: Robust Test-Time Adaptation against Malicious Test Samples,
CVPR24(5997-6007)
IEEE DOI Code:
WWW Link. 2410
Training, Estimation, Benchmark testing, Robustness, Inference algorithms, Data models, Test-Time Adaptation, Robustness BibRef

Liu, J.M.[Jia-Ming], Xu, R.[Ran], Yang, S.[Senqiao], Zhang, R.R.[Ren-Rui], Zhang, Q.Z.[Qi-Zhe], Chen, Z.[Zehui], Guo, Y.D.[Yan-Dong], Zhang, S.H.[Shang-Hang],
Continual-MAE: Adaptive Distribution Masked Autoencoders for Continual Test-Time Adaptation,
CVPR24(28653-28663)
IEEE DOI 2410
Adaptation models, Histograms, Dams, Prevention and mitigation, Self-supervised learning, Minimization, Entropy, Continual Test-Time Adaptation BibRef

Chihaoui, H.[Hamadi], Favaro, P.[Paolo],
When Self-Supervised Pre-Training Meets Single Image Denoising,
ICIP24(1417-1423)
IEEE DOI Code:
WWW Link. 2411
Training, Adaptation models, Adaptive systems, Noise, Noise reduction, Transfer learning, Self-supervised learning, test-time training BibRef

Wang, Z.Q.[Zi-Qiang], Chi, Z.X.[Zhi-Xiang], Wu, Y.[Yanan], Gu, L.[Li], Liu, Z.[Zhi], Plataniotis, K.[Konstantinos], Wang, Y.[Yang],
Distribution Alignment for Fully Test-Time Adaptation with Dynamic Online Data Streams,
ECCV24(XXIV: 332-349).
Springer DOI 2412
BibRef

Tang, Y.S.[Yu-Shun], Chen, S.S.[Shuo-Shuo], Lu, Z.[Zhihe], Wang, X.C.[Xin-Chao], He, Z.H.[Zhi-Hai],
Dual-path Adversarial Lifting for Domain Shift Correction in Online Test-time Adaptation,
ECCV24(LXVII: 342-359).
Springer DOI 2412
BibRef

Xiong, B.C.[Bao-Chen], Yang, X.S.[Xiao-Shan], Song, Y.G.[Ya-Guang], Wang, Y.W.[Yao-Wei], Xu, C.S.[Chang Sheng],
Modality-Collaborative Test-Time Adaptation for Action Recognition,
CVPR24(26722-26731)
IEEE DOI 2410
Adaptation models, Data privacy, Prototypes, Image reconstruction, Multi-modal learning BibRef

Yuan, Y.[Yige], Xu, B.B.[Bing-Bing], Hou, L.[Liang], Sun, F.[Fei], Shen, H.[Huawei], Cheng, X.Q.[Xue-Qi],
TEA: Test-Time Energy Adaptation,
CVPR24(23901-23911)
IEEE DOI Code:
WWW Link. 2410
Training, Adaptation models, Analytical models, Training data, Computer architecture, Transforms, Benchmark testing, Generalization BibRef

Wang, Y.[Yanshuo], Cheraghian, A.[Ali], Hayder, Z.[Zeeshan], Hong, J.[Jie], Ramasinghe, S.[Sameera], Rahman, S.[Shafin], Ahmedt-Aristizabal, D.[David], Li, X.S.[Xue-Song], Petersson, L.[Lars], Harandi, M.[Mehrtash],
Backpropagation-free Network for 3D Test-time Adaptation,
CVPR24(23231-23241)
IEEE DOI Code:
WWW Link. 2410
Training, Adaptation models, Solid modeling, Computer architecture, Predictive models, Test-Time Adaptation, 3D Test-Time Adaptation, Backpropagation-free Method BibRef

Leroux, S.[Sam], Katare, D.[Dewant], Ding, A.Y.[Aaron Yi], Simoens, P.[Pieter],
Test-time Specialization of Dynamic Neural Networks,
MAT24(1048-1056)
IEEE DOI 2410
Adaptation models, Computational modeling, Image edge detection, Neural networks, Benchmark testing, Test time adaptation, Edge AI BibRef

Yang, X.[Xu], Chen, X.[Xuan], Li, M.[Moqi], Wei, K.[Kun], Deng, C.[Cheng],
A Versatile Framework for Continual Test-Time Domain Adaptation: Balancing Discriminability and Generalizability,
CVPR24(23731-23740)
IEEE DOI 2410
Adaptation models, Costs, Data acquisition, Benchmark testing, Predictive models, Reliability engineering BibRef

Yu, Y.[Yeonguk], Shin, S.[Sungho], Back, S.[Seunghyeok], Ko, M.W.[Minh-Wan], Noh, S.[Sangjun], Lee, K.[Kyoobin],
Domain-Specific Block Selection and Paired-View Pseudo-Labeling for Online Test-Time Adaptation,
CVPR24(22723-22732)
IEEE DOI Code:
WWW Link. 2410
Training, Codes, Predictive models, Benchmark testing, Minimization, Feature extraction, Domain Adaptation, Test-Time Adaptation, Online Learning BibRef

Osowiechi, D.[David], Hakim, G.A.V.[Gustavo A. Vargas], Noori, M.[Mehrdad], Cheraghalikhani, M.[Milad], Bahri, A.[Ali], Yazdanpanah, M.[Moslem], Ben Ayed, I.[Ismail], Desrosiers, C.[Christian],
NC-TTT: A Noise Constrastive Approach for Test-Time Training,
CVPR24(6078-6086)
IEEE DOI Code:
WWW Link. 2410
Training, Adaptation models, Visualization, Noise, Predictive models, Feature extraction, Robustness, Test-Time Training, Domain Adaptation BibRef

Mounsaveng, S.[Saypraseuth], Chiaroni, F.[Florent], Boudiaf, M.[Malik], Pedersoli, M.[Marco], Ayed, I.B.[Ismail Ben],
Bag of Tricks for Fully Test-Time Adaptation,
WACV24(1925-1934)
IEEE DOI 2404
Knowledge engineering, Adaptation models, Computational modeling, Computer network reliability, Data models, Reliability, Algorithms, Image recognition and understanding BibRef

Seto, S.[Skyler], Theobald, B.J.[Barry-John], Danieli, F.[Federico], Jaitly, N.[Navdeep], Busbridge, D.[Dan],
REALM: Robust Entropy Adaptive Loss Minimization for Improved Single-Sample Test-Time Adaptation,
WACV24(2051-2060)
IEEE DOI 2404
Training, Adaptation models, Limiting, Training data, Minimization, Entropy, Algorithms, Machine learning architectures, formulations, Image recognition and understanding BibRef

Marsden, R.A.[Robert A.], Döbler, M.[Mario], Yang, B.[Bin],
Universal Test-time Adaptation through Weight Ensembling, Diversity Weighting, and Prior Correction,
WACV24(2543-2553)
IEEE DOI Code:
WWW Link. 2404
Degradation, Adaptation models, Correlation, Stability criteria, Predictive models, Minimization, Algorithms BibRef

Sreenivas, M.[Manogna], Chakrabarty, G.[Goirik], Biswas, S.[Soma],
pSTarC: Pseudo Source Guided Target Clustering for Fully Test-Time Adaptation,
WACV24(2690-2698)
IEEE DOI 2404
Training, Adaptation models, Protocols, Machine learning, Artificial neural networks, Data models, Algorithms, Image recognition and understanding BibRef

Park, J.[Junyoung], Kim, J.[Jin], Kwon, H.[Hyeongjun], Yoon, I.[Ilhoon], Sohn, K.H.[Kwang-Hoon],
Layer-wise Auto-Weighting for Non-Stationary Test-Time Adaptation,
WACV24(1403-1412)
IEEE DOI 2404
Adaptation models, Computational modeling, Load modeling, Algorithms, Image recognition and understanding, Algorithms BibRef

Wang, Y.[Yanshuo], Hong, J.[Jie], Cheraghian, A.[Ali], Rahman, S.[Shafin], Ahmedt-Aristizabal, D.[David], Petersson, L.[Lars], Harandi, M.[Mehrtash],
Continual Test-time Domain Adaptation via Dynamic Sample Selection,
WACV24(1690-1699)
IEEE DOI 2404
Point cloud compression, Training, Adaptation models, Data models, Noise measurement, Algorithms, Machine learning architectures, Image recognition and understanding BibRef

Jung, S.[Sanghun], Lee, J.[Jungsoo], Kim, N.[Nanhee], Shaban, A.[Amirreza], Boots, B.[Byron], Choo, J.[Jaegul],
CAFA: Class-Aware Feature Alignment for Test-Time Adaptation,
ICCV23(19014-19025)
IEEE DOI 2401
BibRef

Park, S.[Sunghyun], Yang, S.[Seunghan], Choo, J.[Jaegul], Yun, S.[Sungrack],
Label Shift Adapter for Test-Time Adaptation under Covariate and Label Shifts,
ICCV23(16375-16385)
IEEE DOI 2401
BibRef

Zhang, J.[Jian], Qi, L.[Lei], Shi, Y.[Yinghuan], Gao, Y.[Yang],
DomainAdaptor: A Novel Approach to Test-time Adaptation,
ICCV23(18925-18935)
IEEE DOI Code:
WWW Link. 2401
BibRef

Brahma, D.[Dhanajit], Rai, P.[Piyush],
A Probabilistic Framework for Lifelong Test-Time Adaptation,
CVPR23(3582-3591)
IEEE DOI 2309
BibRef

Choi, S.[Sungha], Yang, S.[Seunghan], Choi, S.[Seokeon], Yun, S.[Sungrack],
Improving Test-Time Adaptation Via Shift-Agnostic Weight Regularization and Nearest Source Prototypes,
ECCV22(XXXIII:440-458).
Springer DOI 2211
BibRef

Boudiaf, M.[Malik], Mueller, R.[Romain], Ben Ayed, I.[Ismail], Bertinetto, L.[Luca],
Parameter-free Online Test-time Adaptation,
CVPR22(8334-8343)
IEEE DOI 2210

WWW Link. Training, Adaptation models, Maximum likelihood estimation, Laplace equations, Uncertainty, Protocols, Memory management, Transfer/low-shot/long-tail learning BibRef

Mirza, M.J.[M. Jehanzeb], Soneira, P.J.[Pol Jané], Lin, W.[Wei], Kozinski, M.[Mateusz], Possegger, H.[Horst], Bischof, H.[Horst],
ActMAD: Activation Matching to Align Distributions for Test-Time-Training,
CVPR23(24152-24161)
IEEE DOI 2309
BibRef

Lee, T.[Taeckyung], Chottananurak, S.[Sorn], Gong, T.[Taesik], Lee, S.J.[Sung-Ju],
AETTA: Label-Free Accuracy Estimation for Test-Time Adaptation,
CVPR24(28643-28652)
IEEE DOI Code:
WWW Link. 2410
Adaptation models, Accuracy, Source coding, Heuristic algorithms, Estimation, Predictive models, Prediction algorithms, performance estimation BibRef

Wang, Q.[Qin], Fink, O.[Olga], Van Gool, L.J.[Luc J.], Dai, D.X.[Deng-Xin],
Continual Test-Time Domain Adaptation,
CVPR22(7191-7201)
IEEE DOI 2210
Adaptation models, Codes, Computational modeling, Neurons, Data models, Entropy, Transfer/low-shot/long-tail learning, Self- semi- meta- unsupervised learning BibRef

Yamashita, K.[Kota], Hotta, K.[Kazuhiro],
MixStyle-Based Contrastive Test-Time Adaptation: Pathway to Domain Generalization,
MAT24(1029-1037)
IEEE DOI 2410
Training, Adaptation models, Accuracy, Computational modeling, Contrastive learning, Benchmark testing, Feature extraction, domain generalization BibRef

Chen, L.[Liang], Zhang, Y.[Yong], Song, Y.B.[Yi-Bing], Shan, Y.[Ying], Liu, L.Q.[Ling-Qiao],
Improved Test-Time Adaptation for Domain Generalization,
CVPR23(24172-24182)
IEEE DOI 2309
BibRef

Jiang, Y.X.[Yu-Xuan], Wang, Y.F.[Yan-Feng], Zhang, R.P.[Rui-Peng], Xu, Q.[Qinwei], Zhang, Y.[Ya], Chen, X.[Xin], Tian, Q.[Qi],
Domain-conditioned Normalization for Test-time Domain Generalization,
OutDistri22(291-307).
Springer DOI 2304
BibRef

Azimi, F.[Fatemeh], Palacio, S.[Sebastian], Raue, F.[Federico], Hees, J.[Jörn], Bertinetto, L.[Luca], Dengel, A.[Andreas],
Self-Supervised Test-Time Adaptation on Video Data,
WACV22(2603-2612)
IEEE DOI 2202
Adapt due to changes in video. Training, Adaptation models, Target tracking, Computational modeling, Video sequences, Training data, Vision Systems and Applications BibRef

Feng, C.M.[Chun-Mei], Yu, K.[Kai], Liu, Y.[Yong], Khan, S.[Salman], Zuo, W.M.[Wang-Meng],
Diverse Data Augmentation with Diffusions for Effective Test-time Prompt Tuning,
ICCV23(2704-2714)
IEEE DOI 2401
TPT: test-time prompt tuning BibRef

Yeo, T.[Teresa], Kar, O.F.[Oguzhan Fatih], Sodagar, Z.[Zahra], Zamir, A.[Amir],
Rapid Network Adaptation: Learning to Adapt Neural Networks Using Test-Time Feedback,
ICCV23(4651-4664)
IEEE DOI 2401
BibRef

Li, Y.S.[Yu-Shu], Xu, X.[Xun], Su, Y.Y.[Yong-Yi], Jia, K.[Kui],
On the Robustness of Open-World Test-Time Training: Self-Training with Dynamic Prototype Expansion,
ICCV23(11802-11812)
IEEE DOI Code:
WWW Link. 2401
BibRef

Hakim, G.A.V.[Gustavo A. Vargas], Osowiechi, D.[David], Noori, M.[Mehrdad], Cheraghalikhani, M.[Milad], Bahri, A.[Ali], Ben Ayed, I.[Ismail], Desrosiers, C.[Christian],
ClusT3: Information Invariant Test-Time Training,
ICCV23(6113-6112)
IEEE DOI Code:
WWW Link. 2401
BibRef

Mutlu, O.C.[Onur Cezmi], Honarmand, M.[Mohammadmahdi], Surabhi, S.[Saimourya], Wall, D.P.[Dennis P.],
TempT: Temporal consistency for Test-time adaptation,
ABAW23(5917-5923)
IEEE DOI 2309
BibRef

Zancato, L.[Luca], Achille, A.[Alessandro], Liu, T.Y.[Tian Yu], Trager, M.[Matthew], Perera, P.[Pramuditha], Soatto, S.[Stefano],
Train/Test-Time Adaptation with Retrieval,
CVPR23(15911-15921)
IEEE DOI 2309
BibRef

Yuan, L.[Longhui], Xie, B.[Binhui], Li, S.[Shuang],
Robust Test-Time Adaptation in Dynamic Scenarios,
CVPR23(15922-15932)
IEEE DOI 2309
BibRef

Tang, Y.S.[Yu-Shun], Zhang, C.[Ce], Xu, H.[Heng], Chen, S.S.[Shuo-Shuo], Cheng, J.[Jie], Leng, L.[Luziwei], Guo, Q.H.[Qing-Hai], He, Z.H.[Zhi-Hai],
Neuro-Modulated Hebbian Learning for Fully Test-Time Adaptation,
CVPR23(3728-3738)
IEEE DOI 2309
BibRef

Osowiechi, D.[David], Hakim, G.A.V.[Gustavo A. Vargas], Noori, M.[Mehrdad], Cheraghalikhani, M.[Milad], Ben Ayed, I.[Ismail], Desrosiers, C.[Christian],
TTTFlow: Unsupervised Test-Time Training with Normalizing Flow,
WACV23(2125-2126)
IEEE DOI 2302
Training, Adaptation models, Head, Sensitivity, Computational modeling, Predictive models, visual reasoning BibRef

Tian, J.X.[Jia-Xu], Lyu, F.[Fan],
Parameter-selective Continual Test-time Adaptation,
ACCV24(VIII: 315-331).
Springer DOI 2412
BibRef

Sójka, D.[Damian], Cygert, S.[Sebastian], Twardowski, B.[Bartlomiej], Trzcinski, T.[Tomasz],
AR-TTA: A Simple Method for Real-World Continual Test-Time Adaptation,
VCL23(3483-3487)
IEEE DOI 2401
BibRef

Döbler, M.[Mario], Marsden, R.A.[Robert A.], Yang, B.[Bin],
Robust Mean Teacher for Continual and Gradual Test-Time Adaptation,
CVPR23(7704-7714)
IEEE DOI 2309
BibRef

Song, J.[Junha], Lee, J.[Jungsoo], Kweon, I.S.[In So], Choi, S.[Sungha],
EcoTTA: Memory-Efficient Continual Test-Time Adaptation via Self-Distilled Regularization,
CVPR23(11920-11929)
IEEE DOI 2309
BibRef

Gao, Z.Q.[Zheng-Qing], Zhang, X.Y.[Xu-Yao], Liu, C.L.[Cheng-Lin],
Unified Entropy Optimization for Open-Set Test-Time Adaptation,
CVPR24(23975-23984)
IEEE DOI Code:
WWW Link. 2410
Degradation, Adaptation models, Noise, Semantics, Estimation, Minimization, Entropy, Test-Time Adaptation BibRef

Chen, D.[Dian], Wang, D.[Dequan], Darrell, T.J.[Trevor J.], Ebrahimi, S.[Sayna],
Contrastive Test-Time Adaptation,
CVPR22(295-305)
IEEE DOI 2210
Representation learning, Adaptation models, Memory management, Benchmark testing, Data models, Calibration, Self- semi- meta- unsupervised learning BibRef

Adachi, K.[Kazuki], Yamaguchi, S.[Shin'Ya], Kumagai, A.[Atsutoshi],
Covariance-Aware Feature Alignment with Pre-Computed Source Statistics for Test-Time Adaptation to Multiple Image Corruptions,
ICIP23(800-804)
IEEE DOI 2312
BibRef

Tsai, Y.Y.[Yun-Yun], Chen, F.C.[Fu-Chen], Chen, A.Y.C.[Albert Y. C.], Yang, J.F.[Jun-Feng], Su, C.C.[Che-Chun], Sun, M.[Min], Kuo, C.H.[Cheng-Hao],
GDA: Generalized Diffusion for Robust Test-Time Adaptation,
CVPR24(23242-23251)
IEEE DOI 2410
Adaptation models, Accuracy, Semantics, Object detection, Benchmark testing, Diffusion models, Robustness, Out-of-Distribution Data BibRef

Sinha, S.[Samarth], Gehler, P.[Peter], Locatello, F.[Francesco], Schiele, B.[Bernt],
TeST: Test-time Self-Training under Distribution Shift,
WACV23(2758-2768)
IEEE DOI 2302
Training, Adaptation models, Image segmentation, Neural networks, Object detection, Predictive models, Prediction algorithms, visual reasoning BibRef

Kim, J.[Jaekyeom], Kim, H.[Hyoungseok], Kim, G.[Gunhee],
Model-Agnostic Boundary-Adversarial Sampling for Test-Time Generalization in Few-Shot Learning,
ECCV20(I:599-617).
Springer DOI 2011
BibRef

Kingetsu, H.[Hiroaki], Kobayashi, K.[Kenichi], Okawa, Y.[Yoshihiro], Yokota, Y.[Yasuto], Nakazawa, K.[Katsuhito],
Multi-Step Test-Time Adaptation with Entropy Minimization and Pseudo-Labeling,
ICIP22(4153-4157)
IEEE DOI 2211
Training, Adaptation models, Neural networks, Training data, Semisupervised learning, Predictive models, Test-Time Adaptation, Robustness BibRef

Chapter on Pattern Recognition, Clustering, Statistics, Grammars, Learning, Neural Nets, Genetic Algorithms continues in
Multi-Source Domain Adaptation .