7.10.13 Texture for Defect Detection

Chapter Contents (Back)
Inspection. Defect Detection. Texture Analysis. See also Inspection -- Chips, Wafers, PCB, PWB, VLSI, IC, Disks, etc..

Cohen, F.S., Fan, Z., Attali, S.,
Automated Inspection of Textile Fabrics Using Textural Models,
PAMI(13), No. 8, August 1991, pp. 803-808.
IEEE DOI Use Gaussian Markov Random Fields. BibRef 9108

Brzakovic, D., Beck, H., Sufi, N.,
An Approach to Defect Detection in Materials Characterized by Complex Textures,
PR(23), No. 1-2, 1990, pp. 99-107.
Elsevier DOI BibRef 9000

Weszka, J.S.[Joan S.], Rosenfeld, A.[Azriel],
An Application of Texture Analysis to Materials Inspection,
PR(8), No. 4, October 1976, pp. 195-200.
Elsevier DOI BibRef 7610
And: UMD-CS-TR-365, March 1975. Gray-level co-occurrence: ASM, entropy, contrast correlation; Fourier ring/radial; range of entropy; max correlation; no conclusions. BibRef

Song, K.Y., Petrou, M., Kittler, J.V.,
Texture Crack Detection,
MVA(8), No. 1, 1995, pp. 63-75.
Springer DOI BibRef 9500

Mirmehdi, M., Marik, R., Petrou, M., Kittler, J.V.,
Iterative Morphology for Fault Detection in Stochastic Textures,
Electronic Letters(32), 5 1996, pp. 443-444. BibRef 9600

Latif-Amet, A., Ertüzün, A., Erçil, A.,
An Efficient Method for Texture Defect Detection: Sub-Band Domain Co-Occurrence Matrices,
IVC(18), No. 6-7, 1 May 2000, pp. 543-553.
Elsevier DOI 0003
BibRef

Baykut, A.[Alper], Atalay, A.[Alper], Erçil, A.[Aytül], Güler, M.[Mustafa],
Real-time Defect Inspection of Textured Surfaces,
RealTimeImg(6), No. 1, February 2000, pp. 17-27. 0003
BibRef

Plantier, J.[Justin], Boutté, L.[Laurent], Lelandais, S.[Sylvie],
Defect Detection on Inclined Textured Planes Using the Shape from Texture Method and the Delaunay Triangulation,
JASP(2002), No. 7, July 2002, pp. 659-666. 0208
BibRef

Kumar, A., Pang, G.K.H.,
Defect detection in textured materials using optimized filters,
SMC-B(32), No. 5, October 2002, pp. 553-570.
IEEE Top Reference. 0210
BibRef

Tsai, D.M.[Du-Ming], Tsai, Y.H.[Ya-Hui],
Defect detection in textured surfaces using color ring-projection correlation,
MVA(13), No. 4, 2003, pp. 194-200.
WWW Link. 0304
BibRef

Tsai, D.M.[Du-Ming], Lin, C.T.[Chien-Ta],
Fast normalized cross correlation for defect detection,
PRL(24), No. 15, November 2003, pp. 2625-2631.
Elsevier DOI 0308
BibRef

Tsai, D.M.[Du-Ming], Lin, C.T.[Chien-Ta], Chen, J.F.[Jeng-Fung],
The evaluation of normalized cross correlations for defect detection,
PRL(24), No. 15, November 2003, pp. 2525-2535.
Elsevier DOI 0308
BibRef

Tsai, D.M.[Du-Ming], Kuo, C.C.[Chih-Chia],
Defect Detection in Inhomogeneously Textured Sputtered Surfaces Using 3D Fourier Image Reconstruction,
MVA(18), No. 6, December 2007, pp. 383-400.
Springer DOI 0711
BibRef

Tsai, D.M.[Du-Ming], Chao, S.M.[Shin-Min],
An anisotropic diffusion-based defect detection for sputtered surfaces with inhomogeneous textures,
IVC(23), No. 3, 1 March 2005, pp. 325-338.
Elsevier DOI 0501
BibRef

Li, W.C.[Wei-Chen], Tsai, D.M.[Du-Ming],
Wavelet-based defect detection in solar wafer images with inhomogeneous texture,
PR(45), No. 2, February 2012, pp. 742-756.
Elsevier DOI 1110
Surface inspection; Defect detection; inhomogeneous texture; Solar wafer; Wavelet transform BibRef

Baykal, I.C.[Ibrahim Cem], Jullien, G.A.[Graham A.],
On the Use of Hash Functions as Preprocessing Algorithms to Detect Defects on Repeating Definite Textures,
MVA(17), No. 3, August 2006, pp. 185-195.
Springer DOI 0606
BibRef

Sezer, O.G., Ercil, A., Ertuzun, A.,
Using perceptual relation of regularity and anisotropy in the texture with independent component model for defect detection,
PR(40), No. 1, January 2007, pp. 121-133.
Elsevier DOI 0611
Human vision; Texture defect detection; Independent component analysis; Receptive fields BibRef

Xie, X.H.[Xiang-Hua], Mirmehdi, M.[Majid],
TEXEMS: Texture Exemplars for Defect Detection on Random Textured Surfaces,
PAMI(29), No. 8, August 2007, pp. 1454-1464.
IEEE DOI 0707
BibRef
And:
Colour Image Segmentation Using Texems,
BMVA(2007), No. 6, 2007, pp. 1-10.
PDF File. 1209
BibRef
Earlier:
Localising Surface Defects in Random Colour Textures Using Multiscale Texem Analysis in Image Eigenchannels,
ICIP05(III: 1124-1127).
IEEE DOI 0512
Based on a few examples. Compare to Gabor filters. BibRef

Xie, X.H.[Xiang-Hua],
A Review of Recent Advances in Surface Defect Detection using Texture analysis Techniques,
ELCVIA(7), No. 3, 2008, pp. 1-22.
DOI Link 0711
Survey, Defect Detection. BibRef

Hadizadeh, H.[Hadi], and Baradaran Shokouhi, S.[Shahriar],
Random Texture Defect Detection Using 1-D Hidden Markov Models Based on Local Binary Patterns,
IEICE(E91-D), No. 7, July 2008, pp. 1937-1945.
DOI Link BibRef 0807


Stübl, G.[Gernot], Bouchot, J.L.[Jean-Luc], Haslinger, P.[Peter], Moser, B.[Bernhard],
Discrepancy Norm as Fitness Function for Defect Detection on Regularly Textured Surfaces,
DAGM12(428-437).
Springer DOI 1209
BibRef

Chuang, H.C.A.[Hsiao-Chi-Ang], Comer, M.L.[Mary L.],
Objective evaluation for segmentation of microscope images of materials,
Southwest10(137-140).
IEEE DOI 1005
BibRef

Chuang, H.C.A.[Hsiao-Chi-Ang], Comer, M.L.[Mary L.], Simmons, J.P.[Jeff P.],
Texture Classification in Microstructure Images of Advanced Materials,
Southwest08(1-4).
IEEE DOI 0803
BibRef

Haindl, M.[Michal], Grim, J.[Jirí], Mikeš, S.[Stanislav],
Texture Defect Detection,
CAIP07(987-994).
Springer DOI 0708
BibRef

Sobral, J.L.,
Optimised Filters for Texture Defect Detection,
ICIP05(III: 565-568).
IEEE DOI 0512
BibRef

Monadjemi, A., Mirmehdi, M., Thomas, B.T.,
Restructured Eigenfilter Matching for Novelty Detection in Random Textures,
BMVC04(xx-yy).
HTML Version. 0508
BibRef

Hou, Z.[Zhen], Parker, J.M.[Johné M.],
Texture Defect Detection Using Support Vector Machines with Adaptive Gabor Wavelet Features,
WACV05(I: 275-280).
IEEE DOI 0502
BibRef

Kumar, A., Shen, H.C.,
Texture inspection for defects using neural networks and support vector machines,
ICIP02(III: 353-356).
IEEE DOI 0210
BibRef

Salgado, L., Menéndez, J., Rendón, E., Narciso, G., Ruiz, V.,
Automatic Antibiograms Inhibition Halo Determination Through Texture and Directional Filtering Analysis,
ICIP01(II: 629-632).
IEEE DOI 0108
BibRef

Meylani, R., Ercil, A., Ertuzun, A.[Aysin],
Texture Defect Detection Using the Adaptive Two-Dimensional Lattice Filter,
ICIP96(III: 165-168).
IEEE DOI BibRef 9600

Dewaele, P., Van Gool, L.J., Wambacq, P., Oosterlinck, A.,
Texture Inspection with Self-Adaptive Convolution Filters,
ICPR88(I: 56-60).
IEEE DOI BibRef 8800

Chetverikov, D.,
Detecting Defects in Texture,
ICPR88(I: 61-63).
IEEE DOI BibRef 8800

Chetverikov, D.[Dmitry], Verestoy, J.[Judit],
Detecting Shape Defects in Ferrite Cores,
SCIA97(xx-yy)
HTML Version. 9705
BibRef

Chetverikov, D.[Dmitry], Gede, K.[Krisztián],
Textures and structural defects,
CAIP97(167-174).
Springer DOI 9709
BibRef

Mari, M.[Massimo], Dambra, C.[Carlo], Chetverikov, D.[Dmitry], Verestoy, J.[Judit], Jozwik, A.[Adam], Nieniewski, M.[Mariusz], Chmielewski, L.[Leszek], Sklodowski, M.[Marek], Cudny, W.[Waldemar], Lugg, M.[Martin],
The CRASH project: Defect detection and classification in ferrite cores,
CIAP97(II: 781-787).
Springer DOI 9709
BibRef

Nieniewski, M.[Mariusz],
Morphological Method of Detection of Defects on the Surface of Ferrite Cores,
SCIA97(xx-yy)
HTML Version. 9705
BibRef

Amelung, J.[Jorg], Vogel, K.[Kai],
Automated window size determination for texture defect detection,
BMVC94(xx-yy).
PDF File. 9409
BibRef

Hepplewhite, L.[Lee], Stonham, T.J.[T. John],
Surface inspection using texture recognition,
ICPR94(A:589-591).
IEEE DOI 9410
BibRef

Ojala, T., Pietikainen, M., Silven, O.,
Edge-based texture measures for surface inspection,
ICPR92(II:594-598).
IEEE DOI 9208
BibRef

Chapter on 2-D Feature Analysis, Extraction and Representations, Shape, Skeletons, Texture continues in
Transforms for Texture -- Fourier .


Last update:Jun 14, 2018 at 16:13:32