Horn, B.K.P.,
A Problem in Computer Vision:
Orienting Silicon Integrated Circuit Chips for Lead Bonding,
CGIP(4), No. 3, September 1975, pp. 294-303.
WWW Version.
BibRef
7509
Earlier:
Orienting Silicon Integrated Circuit Chips for Lead Bonding,
MIT AI Memo-323, January 1975.
BibRef
Kashioka, S.,
Ejiri, M., and
Sakamoto, Y.,
A Transistor Wire Bonding System Utilizing Multiple Local Pattern
Matching Techniques,
SMC(6), August 1976, pp. 562-569.
BibRef
7608
Caponetti, L.,
Distante, A.,
Ancona, N.,
Mugnuolo, R.,
3D Object Recognition Based On A Viewpoint Analysis,
IVC(10), No. 8, October 1992, pp. 549-556.
WWW Version.
BibRef
9210
Caponetti, L.,
Chiaradia, M.T.,
Distante, A.,
Pasquariello, G.,
Serafini, A.,
Stella, E.,
Ancona, N., and
Attolico, G.,
A Three-Dimensional Vision System for Bin-Picking,
CVPR86(407-411).
Extended Gaussian Image.
Application, Bin-picking. Matching based on the EGI.
BibRef
8600
Porrill, J.,
Pollard, S.B.,
Pridmore, T.P.,
Bowen, J.B.,
Mayhew, J.E.W.,
Frisby, J.P.,
Tina: A 3D Vision System for Pick and Place,
IVC(6), No. 2, May 1988, pp. 91-99.
WWW Version.
BibRef
8805
Laurendeau, D.,
Trottier, Y.,
Poussart, D., and
Lessard, J.,
The Application of Computer Vision to the Removal of
Tie-Wires in a Live-Line Maintenance Robotics Manipulation,
MVA(4), No. 1, 1991.
BibRef
9100
Niemann, H.,
Brunig, H.,
Salzbrunn, R.,
Schroder, S.,
A Knowledge-Based Vision System for Industrial Applications,
MVA(3), No. 4, 1990, pp. xx-yy.
BibRef
9000
Pietikainen, M., and
Pau, L.F., (eds.),
Machine Vision for Advanced Production: Part 1,
PRAI(10), No. 1, February 1996, pp. 1-95.
BibRef
9602
And:
Part 2,
PRAI(10), No. 2, March 1996, pp. 97-182.
Special Issue.
BibRef
Pong, T.C.,
Haralick, R.M.,
Craig, J.R.,
Yoon, R.H.,
Choi, W.Z.,
The Application of Image Analysis Techniques to Mineral Processing,
PRL(2), 1983, pp. 117-123.
BibRef
8300
Trdic, F.,
Sirok, B.,
Bullen, P.R.,
Philpott, D.R.,
Monitoring Mineral Wool Production Using Real-Time Machine Vision,
RealTimeImg(5), No. 2, April 1999, pp. 125-140.
BibRef
9904
Georgis, N.,
Petrou, M.,
Kittler, J.V.,
On the generalised stock-cutting problem,
MVA(11), No. 5, 2000, pp. 231-241.
HTML Version.
0004
BibRef
Ross, B.J.,
Fueten, F.,
Yashkir, D.Y.,
Automatic mineral identification using genetic programming,
MVA(13), No. 2 2001, pp. 61-69.
HTML Version.
0201
BibRef
Cabello, E.[Enrique],
Sánchez, M.A.[M. Araceli],
Delgado, J.[Javier],
A New Approach to Identify Big Rocks with Applications to the Mining
Industry,
RealTimeImg(8), No. 1, February 2002, pp. 1-9.
WWW Version.
0204
BibRef
Ortiz, A.[Alberto],
Simó, M.[Miquel],
Oliver, G.[Gabriel],
A vision system for an underwater cable tracker,
MVA(13), No. 3, 2002, pp. 129-140.
HTML Version.
0208
BibRef
Salinas, R.A.,
Raff, U.,
Farfan, C.,
Automated estimation of rock fragment distributions using computer
vision and its application in mining,
VISP(152), No. 1, February 2005, pp. 1-8.
IEEE Abstract. IEEE Top Reference.
0501
BibRef
Murtagh, F.[Fionn],
Qiao, X.[Xiaoyu],
Crookes, D.[Danny],
Walsh, P.[Paul],
Basheer, P.A.M.[P. A. Muhammed],
Long, A.[Adrian],
Starck, J.L.[Jean-Luc],
A machine vision approach to the grading of crushed aggregate,
MVA(16), No. 4, September 2005, pp. 229-235.
WWW Version.
0512
BibRef
Thurley, M.J.[Matthew J.],
Ng, K.C.[Kim C.],
Identification and sizing of the entirely visible rocks from a 3D
surface data segmentation of laboratory rock piles,
CVIU(111), No. 2, August 2008, pp. 170-178.
WWW Version.
0808Image segmentation; 3D profile; Classification; Boundary-following;
Rock sizing; Region visibility
BibRef
Wang, W.X.[Wei-Xing],
Li, L.[Lei],
Pattern Recognition and Computer vision for Mineral Froth,
ICPR06(IV: 622-625).
WWW Version.
0609
BibRef
Kirkegaard, J.,
Moeslund, T.B.,
Bin-Picking based on Harmonic Shape Contexts and Graph-Based Matching,
ICPR06(II: 581-584).
WWW Version.
0609
BibRef
Biegelbauer, G.[Georg],
Vincze, M.[Markus],
3D Vision-Guided Bore Inspection System,
CVS06(22).
IEEE DOI may work or IEEE-CS DOI may work.
0602
BibRef
Earlier:
Fast and robust bore detection in range image data for industrial
automation,
3DPVT04(526-533).
IEEE Abstract. IEEE Top Reference.
0412
BibRef
Wirjadi, O.[Oliver],
Jablonski, A.[Andreas],
Schladitz, K.[Katja],
Nöthe, M.[Michael],
Volumetric Analysis of a Sinter Process in Time,
DAGM05(409).
WWW Version.
0509Copper processing.
BibRef
Zhang, H.[Hong],
Machine sensing for mining optimization,
CRV04(74-74).
IEEE Abstract. IEEE Top Reference.
0408
BibRef
Olmos, A.,
Trucco, E.,
Detecting man-made objects in unconstrained subsea videos,
BMVC02(Poster Session).
0208
BibRef
Stojanovic, R.,
Papadopoulos, G.,
Mitropulos, P.,
Georgoudakis, M.,
Alcock, R.,
Djurovic, I.,
An Approach for Automated Inspection of Wood Boards,
ICIP01(I: 798-801).
IEEE Abstract. IEEE Top Reference.
0108
BibRef
Baldini, G.,
Campadelli, P.,
Lanzarotti, R.,
Piccoli, P.,
Automatic Monitoring of Waste-water in Industrial Plants Basins,
ICIP01(I: 297-300).
IEEE Abstract. IEEE Top Reference.
0108
BibRef
Draper, B.A.,
Ahlrichs, U.,
Paulus, D.,
Adapting Object Recognition Across Domains: A Demonstration,
CVS01(256-267).
HTML Version.
0106
BibRef
Wang, W.X.,
Stephansson, O.,
Wang, S.C.,
On-line System Setup in a Cellar of a Flotation Plant,
ICPR00(Vol IV: 791-794).
IEEE DOI may work or IEEE-CS DOI may work.
HTML Version.
0009mineral processing
BibRef
Ikonen, L.[Leena],
Kalviainen, H.[Heikki], and
Oinonen, O.[Olli],
A Computer Vision Approach for Robotized Handling of Sheets in a
Manufacturing Cell,
SCIA97(xx-yy)
9705
HTML Version.
BibRef
Crida, X.,
Stoddart, A.,
Illingworth, J.,
Using PCA to Model Shape for Process Control,
3DIM97(12 - Applications)
9702
BibRef
Jorgensen, T.M.[Thomas Martini],
Andersen, A.W.[Allan Weimar],
Christensen, S.S.[Steen Sloth],
Shape Recognition System for Automatic Disassembly of TV-Sets,
ICIP96(II: 653-656).
IEEE DOI may work or IEEE-CS DOI may work.
BibRef
9600
Langinmaa, A.,
An Image Analysis Based Method To Evaluate Gravure Paper Quality,
ICPR92(I:777-780).
IEEE DOI may work or IEEE-CS DOI may work.
BibRef
9200
Jonker, P.P.[Peter P.],
Gerbrands, J.J.,
Image processing hardware for counting massive object streams,
ICPR92(IV:31-33).
IEEE DOI may work or IEEE-CS DOI may work.
9208
BibRef
Grebner, K.,
Model Based Analysis of Industrial Scenes,
CVPR86(28-33).
Uses models of the objects as their holes, etc. Straightforward.
BibRef
8600
Heikkila, T.,
Karkkainen, P.,
Pieska, S.,
Monitoring An Assembly Task By Perception Requests,
SPMSF87(381-389).
BibRef
8700
Boissonnat, J.D.,
Germain, F.,
A New Approach to the Problem of Acquiring Randomly Oriented
Workpieces out of a Bin,
IJCAI81(796-802).
BibRef
8100
Chapter on Implementations and Applications, Databases, QBIC, Video Analysis, Hardware and Software, Inspection continues in
Inspection Systems and Techniques .