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Interval Error Estimators in Class Probability Trees,
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9607
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Menenti, M.,
Performance Indicators for the Statistical Evaluation of
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9605
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Biswas, J.,
Cluster Validation Using Graph-Theoretic Concepts,
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Vanboxtel, A.,
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9803
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Improved Hoeffding-style performance guarantees for accurate
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IEEE Abstract. IEEE Top Reference.
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A Methodology for Deriving Probabilistic Correctness Measures
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CVPR98(930-935).
IEEE Abstract. IEEE Top Reference. Derive a probability of correctness that can be compared across all
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BibRef
Tulyakov, S.,
Govindaraju, V.,
Combining matching scores in identification model,
ICDAR05(II: 1151-1155).
IEEE DOI may work or IEEE-CS DOI may work.
0508Combining scores. Best score not always best, depending on number of options.
BibRef
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0202
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Earlier:
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IEEE DOI may work or IEEE-CS DOI may work.
HTML Version.
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0210
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Clarkson, E.[Eric],
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WWW Version.
0801
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Berikov, V.B.[Vladimir B.],
Litvinenko, A.[Alexander],
The influence of prior knowledge on the expected performance of a
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0405
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Bolstered error estimation,
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WWW Version.
0405For further info:
WWW Version.
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Exact performance of error estimators for discrete classifiers,
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0509
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Brun, M.[Marcel],
Sima, C.[Chao],
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0611Clustering algorithms; Clustering errors; Validation indices
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0407
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0601
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Optimization of Restricted ROC Surfaces in Three-Class Classification
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0711
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He, X.,
Metz, C.E.,
Tsui, B.M.W.,
Links, J.M.,
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0605
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He, X.,
Frey, E.C.,
Three-Class ROC Analysis: The Equal Error Utility Assumption and the
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0608
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0711
BibRef
He, X.,
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0701
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Baraldi, A.,
Bruzzone, L.,
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0509Two-class hypothesis testing.
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Khurd, P.,
Gindi, G.,
Decision strategies that maximize the area under the LROC curve,
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IEEE DOI may work or IEEE-CS DOI may work.
0601
BibRef
Ahlqvist, O.[Ola],
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PhEngRS(71), No. 12, December 2005, pp. 1365-1374.
WWW Version.
0602A method that predicts land-cover classification errors by using
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BibRef
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Tax, D.M.J.[David M.J.],
Paclík, P.[Pavel],
Duin, R.P.W.[Robert P.W.],
The interaction between classification and reject performance for
distance-based reject-option classifiers,
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WWW Version. Unseen classes; Reject-option; Model selection
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Matei, B.C.[Bogdan C.],
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Estimation of Nonlinear Errors-in-Variables Models for Computer Vision
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IEEE DOI may work or IEEE-CS DOI may work.
0609
BibRef
Earlier:
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IEEE Abstract. IEEE Top Reference.
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0005All measurements are noisy.
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0709ROC analysis; Multiclass ROC; Cost sensitive; Threshold optimisation
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Ericsson, A.[Anders],
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WWW Version.
0709
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Earlier: A2, A1:
A Ground Truth Correspondence Measure for Benchmarking,
ICPR06(III: 568-573).
WWW Version.
0609
BibRef
And: A1, A2:
Benchmarking of algorithms for automatic correspondence localisation,
BMVC06(II:759).
PDF Version.
0609
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Waegeman, W.[Willem],
De Baets, B.[Bernard],
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WWW Version.
0711ROC analysis; Ranking; Ordinal regression; Unbalanced learning problems;
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Gallas, B.D.[Brandon D.],
Pennello, G.A.[Gene A.],
Myers, K.J.[Kyle J.],
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WWW Version.
0801Analyzing ROC (receiver operating characteristic) curve data.
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Duin, R.P.W.,
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WWW Version.
0802Two-class problems; ROC curve; Ranking; AUC
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El Ayadi, M.M.H.[Moataz M.H.],
Kamel, M.S.[Mohamed S.],
Karray, F.[Fakhri],
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PR(41), No. 6, June 2008, pp. 2120-2132.
WWW Version.
0802Binary classification; Bayesian decision rule; Decision boundary; Error probability; Monte-Carlo simulations; Multivariate normal distribution; Quadratic surfaces
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Fisher, R.B.,
An Empirical Model for Saturation and Capacity in Classifier Spaces,
ICPR06(IV: 189-193).
WWW Version.
0609Determine the achievable classification rate for a database given
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Maloof, M.A.,
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ICPR02(II: 204-207).
IEEE DOI may work or IEEE-CS DOI may work.
0211
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IEEE DOI may work or IEEE-CS DOI may work.
0211
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Rees, G.S.,
Wright, W.A.,
Greenway, P.,
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BMVC02(Poster Session).
0208
BibRef
Ménard, M.,
Doget, T.,
Shahin, A.,
Ambiguity Concept and Switching Regression Models,
SCIA99(Pattern Recognition).
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9900
Raudys, S.J.,
Diciunas, V.,
Expected Error of Minimum Empirical Error and
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ICPR96(II: 875-879).
IEEE DOI may work or IEEE-CS DOI may work.
9608(Institute of Mathematics and Informatics, LIT)
BibRef
Kanungo, T.,
Gay, D.M.,
Haralick, R.M.,
Constrained monotone regression of ROC curves and histograms using
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ICIP95(II: 292-295).
IEEE DOI may work or IEEE-CS DOI may work.
9510
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Grossman, T.,
Lapedes, A.,
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ICPR94(B:213-218).
IEEE DOI may work or IEEE-CS DOI may work.
9410
BibRef
Chapter on Pattern Recognition, Clustering, Statistics, Grammars, Learning, Neural Nets, Genetic Algorithms continues in
Multiple Classifiers, Combining Classifiers, Combinations .