Hermary Opto Electronics,
1990
WWW Version.
Vendor, Inspection. Industrial inspection systems for sawmills.
LMI Technologies,
1976
WWW Version.
Vendor, Inspection. Industrial inspection systems for sawmills.
DynaVision.
Sobey, P.J.,
Semple, E.C.,
Detection and sizing visual features in wood using tonal measures and a
classification algorithm,
PR(22), No. 4, 1989, pp. 367-380.
WWW Version.
0309
BibRef
Bhandarkar, S.M.[Suchendra M.],
Faust, T.D.[Timothy D.],
Tang, M.[Mengjin],
CATALOG: a system for detection and rendering of internal log defects
using computer tomography,
MVA(11), No. 4, 1999, pp. 171-190.
HTML Version.
0001
BibRef
Bhandarkar, S.M.,
Faust, T.D.,
Tang, M.,
A Computer Vision System for Lumber Production Planning,
WACV98(134-139).
IEEE Abstract. IEEE Top Reference.
9809
BibRef
Bhandarkar, S.M.,
Faust, T.D., and
Tang, M.,
A System for Detection of Internal Log Defects by Computer Analysis of
Axial CT Images,
WACV96(258-263).
IEEE Abstract. IEEE Top Reference.
9609
BibRef
Zhu, D.P.,
Conners, R.W.,
Schmoldt, D.L.,
Araman, P.A.,
A Prototype Vision System for Analyzing CT Imagery of Hardwood Logs,
SMC-B(26), No. 4, August 1996, pp. 522-532.
IEEE Top Reference.
9608
BibRef
Conners, R.W.,
Kline, D.E.,
Araman, P.A.,
Drayer, T.H.,
Machine Vision Technology for the Forest Products Industry,
Computer(30), No. 7, July 1997, pp. 43-48.
9708
BibRef
Lu, Q.,
Conners, R.W.,
Kline, D.E., and
Araman, P.A.,
A Real-Time Algorithm for Color Sorting Edge-Glued Panel Parts,
ICIP97(I: 822-825).
WWW Version.
BibRef
9700
Lee, S.C.,
Qian, G.S., and
Hay, D.A.,
Determining a Maximum Value Yield of a Log Using an Optical Log Scanner,
CVPR91(747-748).
IEEE Abstract. IEEE Top Reference.
Application, Lumber Mill.
BibRef
9100
Funt, B.V.[Brian V.], and
Bryant, E.C.[Edwin C.],
A Computer Vision System That Analyses CT-Scans of Sawlogs,
CVPR85(175-177). (Simon Fraser Univ.)
Application, Lumber Mill. Interesting application of basic techniques. Impractical because of
the need for ct data.
BibRef
8500
Conners, R.W.,
McMillin, C.W.,
Lin, K., and
Vasquez-Espinosa, R.E.,
Identifying and Location Surface Defects in Wood:
Part of an Automated Lumber Processing System,
PAMI(5), No. 6, November 1983, pp. 573-583.
A related paper with some author overlap is in:
BibRef
8311
ICPR90(I: 726-728).
WWW Version.
Application, Lumber Mill. Simple scanner, find defects and control a laser cutter. Much
of the savings was in the laser cutting process.
BibRef
Kim, C.W.,
Koivo, A.J.,
Hierarchical Classification of Surface-Defects on Dusty Wood Boards,
PRL(15), No. 7, July 1994, pp. 713-721.
BibRef
9407
Earlier:
ICPR90(I: 775-779).
WWW Version.
9006
BibRef
Bhandarkar, S.M.[Suchendra M.],
Faust, T.D.[Timothy D.],
Tang, M.[Mengjin],
Design and prototype development of a computer vision-based lumber
production planning system,
IVC(20), No. 3, March 2002, pp. 167-189.
WWW Version.
0202
BibRef
Silvén, O.[Olli],
Niskanen, M.[Matti],
Kauppinen, H.[Hannu],
Wood inspection with non-supervised clustering,
MVA(13), No. 5-6, 2003, pp. 275-285.
HTML Version.
0304
BibRef
Earlier: A2, A1, A3:
Color and Texture Based Wood Inspection with Non-supervised Clustering,
SCIA01(O-Tu3B).
0206
BibRef
Kauppinen, H.,
A Two Stage Defect Recognition Method for Parquet Slab Grading,
ICPR00(Vol IV: 803-806).
WWW Version.
HTML Version.
0009
BibRef
Kauppinen, H.,
Silven, O.,
The Effect of Illumination Variations on Color-Based
Wood Defect Classification,
ICPR96(III: 828-832).
WWW Version.
9608(Univ. of Oulu, SF)
BibRef
Bhandarkar, S.M.[Suchendra M.],
Luo, X.[Xingzhi],
Daniels, R.[Richard],
Tollner, E.W.[E. William],
Detection of cracks in computer tomography images of logs,
PRL(26), No. 14, 15 October 2005, pp. 2282-2294.
WWW Version.
0510
BibRef
Patricio, M.A.,
Maravall, D.,
A novel generalization of the gray-scale histogram and its application
to the automated visual measurement and inspection of wooden Pallets,
IVC(25), No. 6, 1 June 2007, pp. 805-816.
WWW Version.
0704Generalized gray-level histogram; Automatic visual inspection;
Image segmentation; Defect detection; Texture recognition; Wood inspection
BibRef
López, M.[Marcos],
Matías, J.M.[José M.],
Vilán, J.A.[José A.],
Taboada, J.[Javier],
Functional Pattern Recognition of 3D Laser Scanned Images of Wood-Pulp
Chips,
IbPRIA07(I: 298-305).
WWW Version.
0706
BibRef
Dahl, A.B.[Anders Bjorholm],
Aanaes, H.[Henrik],
Effective image database search via dimensionality reduction,
InterNet08(1-6).
WWW Version.
0806
BibRef
Dahl, A.B.[Anders Bjorholm],
Aanæs, H.[Henrik],
Larsen, R.[Rasmus],
Ersbøll, B.K.[Bjarne K.],
Classification of Biological Objects Using Active Appearance Modelling
and Color Cooccurrence Matrices,
SCIA07(938-947).
WWW Version.
0706
Active Appearance Models. AAM for logs and vegetables.
BibRef
Padfield, D.,
Brooksby, G.,
Kaucic, R.,
Automatic Deformation Detection for Visual Post Inspection,
WACV07(57-57).
WWW Version.
0702
BibRef
Piuri, V.,
Scotti, F.,
Roveri, M.,
Visual Inspection of Particle Boards for Quality Assessment,
ICIP05(III: 521-524).
WWW Version.
0512
BibRef
Thomas, L.,
Mili, L.,
Shaffer, C.A.,
Thomas, E.,
Defect detection on hardwood logs using high resolution three
dimensional laser scan data,
ICIP04(I: 243-246).
WWW Version.
0505
BibRef
Andreu, J.P.[Jean-Philippe],
Rinnhofer, A.[Alfred],
Modeling Knot Geometry in Norway Spruce from Industrial CT Images,
SCIA03(786-791).
WWW Version.
0310
BibRef
Andreu, J.P.,
Rinnhofer, A.,
Enhancement of annual rings on industrial CT images of logs,
ICPR02(III: 261-264).
WWW Version.
0211
BibRef
Laitinen, J.,
A Method for Determination of Bark on Wood Chips,
SCIA99(Industrial Applications).
BibRef
9900
Alapuranen, P.,
Westman, T.,
Automatic Visual Inspection of Wood Surfaces,
ICPR92(I:371-374).
WWW Version.
BibRef
9200
Rinnhofer, A.[Alfred], and
Deutschl, E.[Edwin],
An X-Ray Real Time System for Timber Automatic Grading,
SCIA97(xx-yy)
9705
HTML Version.
BibRef
Tsui, K.K.,
Using geometric processing in the visualization of ring features in
tomographic images of wood,
ICIP96(III: 547-550).
WWW Version.
9610
BibRef
Abbott, A.L., and
Zhao, Y.,
Adaptive Quantization of Color Space for Recognition of
Finished Wooden Components,
WACV96(252-257).
IEEE Abstract. IEEE Top Reference.
9609
BibRef
Abbott, A.L.,
Yuan, B.[Bin],
Automatic classification of wooden cabinet doors,
WACV94(18-25).
IEEE Abstract. IEEE Top Reference.
0403
BibRef
Astrand, E.,
Astrom, A.,
A single chip multi-function sensor system for wood inspection,
ICPR94(C:300-304).
WWW Version.
9410
BibRef
Silven, O.,
Kauppinen, H.,
Color vision based methodology for grading lumber,
ICPR94(A:787-790).
WWW Version.
9410
BibRef
Chapter on Implementations and Applications, Databases, QBIC, Video Analysis, Hardware and Software, Inspection continues in
Inspection -- Defect Detection, Crack Detection .