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Tsai, D.M.[Du-Ming],
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WWW Version.
1003
Defect detection; Surface inspection; Anisotropic diffusion; Entropy
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Chao, S.M.[Shin-Min],
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IVC(26), No. 2, 1 February 2008, pp. 187-200.
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0711
Defect detection; Surface inspection; Anisotropic diffusion;
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Defect detection in low-contrast glass substrates using anisotropic
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Kalliomäki, I.[Ilkka],
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Lampinen, J.[Jouko],
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MVA(16), No. 3, May 2005, pp. 197-201.
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0505
BibRef
Ribeiro, B.,
Support vector machines for quality monitoring in a plastic injection
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SMC-C(35), No. 3, August 2005, pp. 401-410.
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0508
BibRef
Sakata, Y.[Yukinobu],
Kaneko, S.[Shuni'chi],
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PR(38), No. 11, November 2005, pp. 1847-1856.
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Tanaka, T.,
Successive pattern learning based on test feature classifier and its
application to dynamic recognition problems,
IEVM06(xx-yy).
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0609
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Tsai, D.M.[Du-Ming],
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0510
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Liu, J.J.[J. Jay],
MacGregor, J.F.[John F.],
Estimation and monitoring of product aesthetics:
Application to manufacturing of 'engineered stone' countertops,
MVA(16), No. 6, 2006, pp. 374-383.
Springer DOI Link
0603
BibRef
Taniguchi, K.[Kazutaka],
Ueta, K.[Kunio],
Tatsumi, S.[Shoji],
A mura detection method,
PR(39), No. 6, June 2006, pp. 1044-1052.
WWW Version.
0604
Mura (irregular lightness variation on a manufactured surface);
Defect; Detection; Vision; Spatial frequency; Contrast enhancement
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Tsai, D.M.[Du-Ming],
Lin, P.C.[Ping-Chieh],
Lu, C.J.[Chi-Jie],
An independent component analysis-based filter design for defect
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PR(39), No. 9, September 2006, pp. 1679-1694.
WWW Version.
0606
Surface inspection; Independent component analysis; Convolution filter;
Particle swarm optimization
BibRef
Tsai, D.M.[Du-Ming],
Tseng, Y.H.[Yan-Hsin],
Chao, S.M.[Shin-Min],
Yen, C.H.[Chao-Hsuan],
Independent component analysis based filter design for defect detection
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ICPR06(II: 231-234).
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0609
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Lu, C.J.[Chi-Jie],
Tsai, D.M.[Du-Ming],
Independent component analysis-based defect detection in patterned
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IVC(26), No. 7, 2 July 2008, pp. 955-970.
WWW Version.
0804
Defect detection; Surface inspection; TFT-LCD panels;
Independent component analysis
BibRef
Tsai, D.M.[Du-Ming],
Lai, S.C.[Shia-Chih],
Defect detection in periodically patterned surfaces using independent
component analysis,
PR(41), No. 9, September 2008, pp. 2812-2832.
WWW Version.
0806
Defect detection; Patterned surface; Independent component analysis;
Particle swarm optimization; Liquid crystal display
BibRef
Tsai, D.M.[Du-Ming],
Chuang, S.T.[Su-Ta],
1D-based defect detection in patterned TFT-LCD panels using
characteristic fractal dimension and correlations,
MVA(20), No. 6, October 2009, pp. xx-yy.
Springer DOI Link
0910
BibRef
Baykal, I.C.[Ibrahim Cem],
Jullien, G.A.[Graham A.],
On the Use of Hash Functions as
Preprocessing Algorithms to Detect Defects on Repeating Definite
Textures,
MVA(17), No. 3, August 2006, pp. 185-195.
Springer DOI Link
0606
BibRef
Ng, H.F.[Hui-Fuang],
Automatic thresholding for defect detection,
PRL(27), No. 14, 15 October 2006, pp. 1644-1649.
WWW Version.
0609
Automatic thresholding; Defect detection
BibRef
Sezer, O.G.,
Ercil, A.,
Ertuzun, A.,
Using perceptual relation of regularity and anisotropy in the texture
with independent component model for defect detection,
PR(40), No. 1, January 2007, pp. 121-133.
WWW Version.
0611
Human vision; Texture defect detection; Independent component analysis;
Receptive fields
BibRef
Tsap, L.V.[Leonid V.],
Duchaineau, M.[Mark],
Goldgof, D.B.[Dmitry B.],
Shin, M.C.[Min C.],
Data-driven feature modeling, recognition and analysis in a discovery
of supersonic cracks in multimillion-atom simulations,
PR(40), No. 9, September 2007, pp. 2400-2407.
WWW Version.
0705
Data-driven; Feature modeling (analysis, extraction, recognition);
Image motion analysis; Physics-based; Supersonic cracks; Molecular dynamics;
Atomic simulation; Nanoscale analysis
BibRef
Caleb-Solly, P.,
Smith, J.E.,
Adaptive surface inspection via interactive evolution,
IVC(25), No. 7, 1 July 2007, pp. 1058-1072.
WWW Version.
0705
Machine vision; Configuration; Interative; Evolution
User knowledge to get description for defects.
BibRef
Xie, X.H.[Xiang-Hua],
Mirmehdi, M.[Majid],
TEXEMS: Texture Exemplars for Defect Detection on Random Textured
Surfaces,
PAMI(29), No. 8, August 2007, pp. 1454-1464.
IEEE DOI Link
0707
BibRef
Earlier:
Localising Surface Defects in Random Colour Textures Using Multiscale
Texem Analysis in Image Eigenchannels,
ICIP05(III: 1124-1127).
IEEE DOI Link
0512
Based on a few examples.
Compare to Gabor filters.
BibRef
Xie, X.H.[Xiang-Hua],
A Review of Recent Advances in Surface Defect Detection using Texture
analysis Techniques,
ELCVIA(7), No. 3, 2008, pp. 1-22.
WWW Version.
0711
Survey, Defect Detection.
BibRef
Groby, J.P.[Jean-Philippe],
Lesselier, D.[Dominique],
Localization and characterization of simple defects in finite-sized
photonic crystals,
JOSA-A(25), No. 1, January 2008, pp. 146-152.
WWW Version.
0801
BibRef
Lim, M.S.[Mee-Seub],
Lim, J.H.[Joon-Hong],
Visual measurement of pile movements for the foundation work using a
high-speed line-scan camera,
PR(41), No. 6, June 2008, pp. 2025-2033.
WWW Version.
0802
Line-scan image; Visual measurement; Pile movement
BibRef
Hadizadeh, H.[Hadi], and
Baradaran Shokouhi, S.[Shahriar],
Random Texture Defect Detection Using 1-D Hidden Markov Models
Based on Local Binary Patterns,
IEICE(E91-D), No. 7, July 2008, pp. 1937-1945.
WWW Version.
BibRef
0807
Choi, K.N.[Kyu Nam],
Park, N.K.[No Kap],
Yoo, S.I.[Suk In],
Image Restoration for Quantifying TFT-LCD Defect Levels,
IEICE(E91-D), No. 2, February 2008, pp. 322-329.
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0802
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Liew, C.K.[Chin Kian],
Veidt, M.[Martin],
Pattern recognition of guided waves for damage evaluation in bars,
PRL(30), No. 3, 1 February 2009, pp. 321-330.
Elsevier DOI Link
WWW Version.
0804
Ultrasonics; Quantitative nondestructive evaluation; Structural health
monitoring; Multi-layer perceptron; Ensemble networks; Modular
networks
BibRef
Suganthan, S.,
MacDonald, L.W.,
Correcting image defects of stained glass windows,
IJIST(18), No. 5-6, 2008, pp. 296-306.
WWW Version.
0804
BibRef
Gnanaprakasam, P.[Pradeep],
Parker, J.M.[Johne M.],
Ganapathiraman, S.[Subburengan],
Hou, Z.[Zhen],
Efficient 3D characterization of raised topological defects in smooth
specular coatings,
IVC(27), No. 4, 3 March 2009, pp. 319-330.
Elsevier DOI Link
WWW Version.
0804
Surface reflectance model; Surface quality of specular coatings;
Defect characterization; Camera calibration
BibRef
Kim, H.I.,
Lee, S.H.,
Cho, N.I.,
Automatic Defect Classification Using Frequency and Spatial Features in
a Boosting Scheme,
SPLetters(16), No. 5, May 2009, pp. 374-377.
IEEE DOI Link
0903
Uses histogram of spatial orientation and frequency.
BibRef
Hampel, U.,
Maas, H.G.,
Cascaded image analysis for dynamic crack detection in material testing,
PandRS(64), No. 4, July 2009, pp. 345-350.
Elsevier DOI Link
WWW Version.
0907
Image matching; Image analysis; Deformation measurement
BibRef
Tsneg, Y.H.[Yan-Hsin],
Tsai, D.M.[Du-Ming],
Defect detection of uneven brightness in low-contrast images using
basis image representation,
PR(43), No. 3, March 2010, pp. 1129-1141.
Elsevier DOI Link
WWW Version.
1001
Defect detection; Surface inspection; Basis image representation;
Independent component analysis; Particle swarm optimization
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Kherroubi, J.[Josselin],
Automatic extraction of natural fracture traces from borehole images,
ICPR08(1-4).
IEEE DOI Link
0812
BibRef
Nakazawa, M.[Mitsuru],
Aoki, Y.[Yoshimitsu],
Kobayashi, M.[Masakazu],
Toda, H.[Hiroyuki],
3D image analysis for evaluating internal deformation/fracture
characteristics of materials,
ICPR08(1-4).
IEEE DOI Link
0812
BibRef
Yamaguchi, T.[Tomoyuki],
Hashimoto, S.[Shuji],
Improved percolation-based method for crack detection in concrete
surface images,
ICPR08(1-4).
IEEE DOI Link
0812
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Chuang, H.C.A.[Hsiao-Chi-Ang],
Comer, M.L.[Mary L.],
Simmons, J.P.[Jeff P.],
Texture Classification in Microstructure Images of Advanced Materials,
Southwest08(1-4).
IEEE DOI Link
0803
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Tirronen, V.[Ville],
Neri, F.[Ferrante],
Karkkainen, T.[Tommi],
Majava, K.[Kirsi],
Rossi, T.[Tuomo],
A Memetic Differential Evolution in Filter Design for Defect Detection
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EvoIASP07(320-329).
Springer DOI Link
0704
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Haindl, M.[Michal],
Grim, J.[Jirí],
Mike, S.[Stanislav],
Texture Defect Detection,
CAIP07(987-994).
Springer DOI Link
0708
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d'Orazio, T.,
Leo, M.,
Guaragnella, C.,
Distante, A.,
Analysis of Image Sequences for Defect Detection in Composite Materials,
ACIVS07(855-864).
Springer DOI Link
0708
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Yue, K.[Kui],
Huber, D.[Daniel],
Akinci, B.[Burcu],
Krishnamurti, R.[Ramesh],
The ASDMCon Project:
The Challenge of Detecting Defects on Construction Sites,
3DPVT06(1048-1055).
IEEE DOI Link
0606
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Chowdhury, A.S.,
Bhattacharya, A.,
Bhandarkar, S.M.,
Datta, G.S.,
Yu, J.C.,
Figueroa, R.,
Hairline Fracture Detection using MRF and Gibbs Sampling,
WACV07(56-56).
IEEE DOI Link
0702
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Subirats, P.,
Dumoulin, J.,
Legeay, V.,
Barba, D.,
Automation of Pavement Surface Crack Detection using the Continuous
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ICIP06(3037-3040).
0610
IEEE DOI Link
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Urano, T.,
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PDF Version.
0609
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Ersbřll, B.K.[Bjarne K.],
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Estimation of Critical Parameters in Concrete Production Using
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SCIA05(1228-1237).
Springer DOI Link
0506
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Frau, D.C.[David Cuesta],
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Tormos, P.M.[Pau Micó],
Linares-Pellicer, J.[Jordi],
Segmentation of Nanocolumnar Crystals from Microscopic Images,
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0509
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Limas Serafim, A.F.,
Segmentation of natural images based on multiresolution pyramids
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9208
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Vieira, S.M.[Susana M.],
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ICIAR06(II: 90-101).
Springer DOI Link
0610
See also Intelligent Real-Time Fabric Defect Detection.
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Sousa, J.M.C.[Joăo M.C.],
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0409
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A Method for Crack Detection on a Concrete Structure,
ICPR06(III: 901-904).
WWW Version.
0609
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Amano, T.[Toshiyuki],
Correlation Based Image Defect Detection,
ICPR06(I: 163-166).
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0609
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Optimised Filters for Texture Defect Detection,
ICIP05(III: 565-568).
IEEE DOI Link
0512
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Laurenge, P.[Pascal],
Quantitative Identification of Marbles Aesthetical Features,
IbPRIA05(II:674).
Springer DOI Link
0509
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Monadjemi, A.,
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WACV05(I: 275-280).
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Viana, R.[Roberto],
Rodrigues, R.B.[Ricardo B.],
Alvarez, M.A.[Marco A.],
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SVM with Stochastic Parameter Selection for Bovine Leather Defect
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PSIVT07(600-612).
Springer DOI Link
0712
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Zhang, T.[Tong],
Nagy, G.,
Surface tortuosity and its application to analyzing cracks in concrete,
ICPR04(II: 851-854).
IEEE DOI Link
0409
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Ai, J.[Jiaoyan],
Di, L.[Liu],
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Combination of wavelet analysis and color applied to automatic color
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ICPR04(III: 235-238).
IEEE DOI Link
0409
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Jia, H.B.[Hong-Bin],
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Chang, T.S.[Tzyy-Shuh],
An intelligent real-time vision system for surface defect detection,
ICPR04(III: 239-242).
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0409
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Eisele, H.,
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A New Approach for Defect Detection in X-ray CT Images,
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0303
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Aach, T.[Til],
A two-stage-classifier for defect classification in optical media
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ICPR02(IV: 373-376).
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0211
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Gupta, P.,
Doermann, D.,
DeMenthon, D.F.,
Beam search for feature selection in automatic SVM defect
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ICPR02(II: 212-215).
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0211
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Maalmi, K.,
El-Ouaazizi, A.,
Benslimane, R.,
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Voon, Y.[Yan],
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Crack defect detection and localization using genetic-based inverse
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Martínez-Cabeza-de-Vaca-Alajarín, J.[Juan],
Tomás-Balibrea, L.M.[Luis-Manuel],
Automatic Classification System of Marble Slabs in Production Line
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CAIP99(167-174).
WWW Version.
9909
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Chetverikov, D.[Dmitry],
Khenokh, Y.[Yuri],
Matching for Shape Defect Detection,
CAIP99(367-374).
WWW Version.
9909
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Kobayashi, H.H.,
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Doi, H.,
Takai, K.,
Sumiya, A.,
Hybrid Defect Detection Method Based on Shape Measurement and
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MVA98(xx-yy).
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9800
Cho, S.H.,
Hisatomi, K.,
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Cracks and Displacement Feature Extraction of the
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MVA98(xx-yy).
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9800
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A Crack Detection Method in Road Surface Images Using Morphology,
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Chetverikov, D.[Dmitry],
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Textures and structural defects,
CAIP97(167-174).
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9709
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Sklodowski, M.[Marek],
Cudny, W.[Waldemar],
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CIAP97(II: 781-787).
WWW Version.
9709
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Nieniewski, M.[Mariusz],
Morphological Method of Detection of Defects on the
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SCIA97(xx-yy)
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Pakkanen, J.[Jussi],
Ilvesmäki, A.[Antti],
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Defect Image Classification and Retrieval with MPEG-7 Descriptors,
SCIA03(349-355).
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0310
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Visa, A.[Ari],
Iivarinen, J.[Jukka],
An Adaptive Texture and Shape Based Defect Classification,
ICPR98(Vol I: 117-122).
IEEE DOI Link
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Iivarinen, J.[Jukka],
Rauhamaa, J.[Juhani], and
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An Adaptive Two-Stage Approach to Classification of Surface Defects,
SCIA97(xx-yy)
9705
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Delagnes, P.,
Barba, D.,
A Markov random field for rectilinear structure extraction in pavement
distress image analysis,
ICIP95(I: 446-449).
IEEE DOI Link
9510
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Anzalone, A.,
Machí, A.,
Visual detection of defects in moulded plastic drippers,
CAIP95(802-807).
Springer DOI Link
9509
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Bruzzone, L.,
Roli, F.,
Serpico, S.B.,
Crack detection by a measure of texture anisotropy,
CIAP95(743-747).
Springer DOI Link
9509
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Azencott, R.,
Yao, J.,
Automated detection of cowhide defects using Markov random field
techniques,
ICPR94(A:791-793).
IEEE DOI Link
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Hepplewhite, L.[Lee],
Stonham, T.J.[T. John],
Surface inspection using texture recognition,
ICPR94(A:589-591).
IEEE DOI Link
9410
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Ojala, T.,
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Silven, O.,
Edge-based texture measures for surface inspection,
ICPR92(II:594-598).
IEEE DOI Link
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Sokolov, S.M.,
Treskunov, A.S.,
Automatic vision system for final test of liquid crystal display,
CRA92(1578-1582).
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9200
Silven, O.,
Westman, T.,
Huotari, S.,
Hakalahti, H.,
A Defect Analysis Method for Visual Inspection,
ICPR86(868-870).
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8600
Chapter on Implementations and Applications, Databases, QBIC, Video Analysis, Hardware and Software, Inspection continues in
Inspection -- Paint and Printing Quality, Print Analysis .