19.6.3.8 Inspection -- Defect Detection, Crack Detection

Chapter Contents (Back)
Real Time Vision. Crack Detection. Application, Inspection. Inspection, Defects. Defect Detection. General Defects. Crack -- not the drug but cracks in surfaces, etc. Pavement specific: See also Inspection -- Pavement, Road Surface, Asphalt, Concrete.

Avalon Vision Solutions,
1991.
WWW Link. Vendor, Inspection. Industrial inspection systems.

Ejiri, M., Uno, T., Mese, M., Ikeda, T.,
A Process for Detecting Defects in Complicated Patterns,
CGIP(2), 1973, pp. 326-339. BibRef 7300

Maitre, H.[Henri],
Defect recognition in numerical images by spectrum zero detection,
CGIP(5), No. 2, June 1976, pp. 238-244.
Elsevier DOI 0501
BibRef

Woods, P.W.[Peter W.], Allen, P.D.,
A cue generator for crack detection,
IVC(7), No. 4, November 1989, pp. 268-273.
Elsevier DOI 0401
BibRef

Gmytrasiewicz, P., Hassberger, J.A., Lee, J.C.,
Fault tree based diagnostics using fuzzy logic,
PAMI(12), No. 11, November 1990, pp. 1115-1119.
IEEE DOI 0401
BibRef

Leu, J.G.[Jia-Guu], Yau, H.L.[Hok-Lai],
Detecting the dislocations in metal crystals from microscopic images,
PR(24), No. 1, 1991, pp. 41-56.
Elsevier DOI 0401
BibRef

Perner, P.[Petra],
A Knowledge-Based Image-Inspection System for Automatic Defect Recognition, Classification, and Process Diagnosis,
MVA(7), No. 3, 1994, pp. 135-147. BibRef 9400
Earlier:
Application of knowledge-based image inspection system for diagnosis of misprints in offsetprinting,
CAIP93(738-749).
Springer DOI 9309
See also Case-Based Object Recognition with Application to Biological Images. BibRef

Bryson, N., Dixon, R.N., Hunter, J.J., Taylor, C.J.,
Contextual Classification of Cracks,
IVC(12), No. 3, April 1994, pp. 149-154.
Elsevier DOI BibRef 9404
Earlier: BMVC93(xx).
PDF File. BibRef

Azencott, R., Chalmond, B., Coldefy, F.,
Markov Fusion of a Pair of Noisy Images to Detect Intensity Valleys,
IJCV(16), No. 2, October 1995, pp. 135-145.
Springer DOI Cracks. Task is to detect defects using pairs of radiographic images. Defects are identified as intensity valleys. BibRef 9510

Kona, S.R.[Sudheer R.], Foster, J.W.[Joseph W.], Varughese, J.V.[Joseph V.],
A robust algorithm for detecting pinholes in transparent plastic films,
PR(26), No. 8, August 1993, pp. 1215-1227.
Elsevier DOI 0401
BibRef

Asaeda, T.[Teruo], Nousou, K.[Kazunori], Imanisi, M.[Masanori], Suzuki, Y.[Yutaka], Katabami, S.[Sachiyo],
Inspection system and process,
US_Patent5,734,742, Mar 31, 1998
WWW Link. BibRef 9803

Nesi, P.[Paolo], Trucco, E.[Emanuel],
Guest Editorial: Special Issue on Real-Time Defect Detection,
RealTimeImg(5), No. 1, February 1999, pp. 1-2. BibRef 9902

Latif-Amet, A., Ertüzün, A., Erçil, A.,
An Efficient Method for Texture Defect Detection: Sub-Band Domain Co-Occurrence Matrices,
IVC(18), No. 6-7, 1 May 2000, pp. 543-553.
Elsevier DOI 0003
BibRef

Baykut, A.[Alper], Atalay, A.[Alper], Erçil, A.[Aytül], Güler, M.[Mustafa],
Real-time Defect Inspection of Textured Surfaces,
RealTimeImg(6), No. 1, February 2000, pp. 17-27. 0003
BibRef

Zabih, R.[Ramin], Halviatti, R.[Ramin],
Method and apparatus for analyzing computer screens,
US_Patent6,226,407, May 1, 2001
WWW Link. BibRef 0105

Kazantsev, I.G., Lemahieu, I., Salov, G.I., Denys, R.,
Statistical detection of defects in radiographic images in nondestructive testing,
SP(82), No. 5, May 2002, pp. 791-801.
HTML Version. 0206
BibRef

Plantier, J.[Justin], Boutté, L.[Laurent], Lelandais, S.[Sylvie],
Defect Detection on Inclined Textured Planes Using the Shape from Texture Method and the Delaunay Triangulation,
JASP(2002), No. 7, July 2002, pp. 659-666. 0208
BibRef

Kumar, A., Pang, G.K.H.,
Defect detection in textured materials using optimized filters,
SMC-B(32), No. 5, October 2002, pp. 553-570.
IEEE Top Reference. 0210
BibRef

Tsai, D.M.[Du-Ming], Tsai, Y.H.[Ya-Hui],
Defect detection in textured surfaces using color ring-projection correlation,
MVA(13), No. 4, 2003, pp. 194-200.
HTML Version. 0304
BibRef

Tsai, D.M.[Du-Ming], Lin, C.T.[Chien-Ta],
Fast normalized cross correlation for defect detection,
PRL(24), No. 15, November 2003, pp. 2625-2631.
WWW Link. 0308
BibRef

Tsai, D.M.[Du-Ming], Lin, C.T.[Chien-Ta], Chen, J.F.[Jeng-Fung],
The evaluation of normalized cross correlations for defect detection,
PRL(24), No. 15, November 2003, pp. 2525-2535.
WWW Link. 0308
BibRef

Tsai, D.M.[Du-Ming], Kuo, C.C.[Chih-Chia],
Defect Detection in Inhomogeneously Textured Sputtered Surfaces Using 3D Fourier Image Reconstruction,
MVA(18), No. 6, December 2007, pp. 383-400.
Springer DOI 0711
BibRef

Vachtesvanos, G.J.[George J.], Dorrity, L.J.[Lewis J.], Wang, P.[Peng], Echauz, J.[Javier], Mufti, M.[Muid],
Method and apparatus for analyzing an image to detect and identify patterns,
US_Patent6,650,779, Nov 18, 2003
WWW Link. BibRef 0311

Lam, E.Y.[Edmund Y.],
Robust minimization of lighting variation for real-time defect detection,
RealTimeImg(10), No. 6, December 2004, pp. 365-370.
WWW Link. 0501
BibRef

Tsai, D.M.[Du-Ming], Chao, S.M.[Shin-Min],
An anisotropic diffusion-based defect detection for sputtered surfaces with inhomogeneous textures,
IVC(23), No. 3, 1 March 2005, pp. 325-338.
WWW Link. 0501
BibRef

Akgul, Y.[Yusuf], Bachelder, I.A.[Ivan A.], Wagman, A.[Adam], Davis, J.[Jason], Koljonen, J.[Juha], Morje, P.[Prabhav],
Methods and apparatuses for detecting classifying and measuring spot defects in an image of an object,
US_Patent7,162,073, Jan 9, 2007
WWW Link. BibRef 0701

Li, W.C.[Wei-Chen], Tsai, D.M.[Du-Ming],
Wavelet-based defect detection in solar wafer images with inhomogeneous texture,
PR(45), No. 2, February 2012, pp. 742-756.
Elsevier DOI 1110
Surface inspection; Defect detection; inhomogeneous texture; Solar wafer; Wavelet transform BibRef

Chao, S.M.[Shin-Min], Tsai, D.M.[Du-Ming],
An improved anisotropic diffusion model for detail- and edge-preserving smoothing,
PRL(31), No. 13, 1 October 2010, pp. 2012-2023.
Elsevier DOI 1003
Edge-preserving smoothing; Image restoration; Image denoising; Anisotropic diffusion BibRef

Chao, S.M.[Shin-Min], Tsai, D.M.[Du-Ming],
Anisotropic diffusion with generalized diffusion coefficient function for defect detection in low-contrast surface images,
PR(43), No. 5, May 2010, pp. 1917-1931.
Elsevier DOI 1003
Defect detection; Surface inspection; Anisotropic diffusion; Entropy criterion; Particle swarm optimization BibRef

Tsai, D.M.[Du-Ming], Tseng, Y.H.[Yan-Hsin], Chiu, W.Y.[Wei-Yao],
Surface defect detection in low-contrast images using basis image representation,
MVA15(186-189)
IEEE DOI 1507
Conferences BibRef

Tsai, D.M.[Du-Ming], Tseng, Y.H.[Yan-Hsin], Chao, S.M.[Shin-Min], Yen, C.H.[Chao-Hsuan],
Independent component analysis based filter design for defect detection in low-contrast textured images,
ICPR06(II: 231-234).
IEEE DOI 0609
BibRef

Chao, S.M.[Shin-Min], Tsai, D.M.[Du-Ming], Chiu, W.Y.[Wei-Yao], Li, W.C.[Wei-Chen],
Anisotropic diffusion-based detail-preserving smoothing for image restoration,
ICIP10(4145-4148).
IEEE DOI 1009
BibRef
And: A1, A2, A4, A3:
A Generalized Anisotropic Diffusion for Defect Detection in Low-Contrast Surfaces,
ICPR10(4408-4411).
IEEE DOI 1008
BibRef

Chao, S.M.[Shin-Min], Tsai, D.M.[Du-Ming],
An anisotropic diffusion-based defect detection for low-contrast glass substrates,
IVC(26), No. 2, 1 February 2008, pp. 187-200.
WWW Link. 0711
Defect detection; Surface inspection; Anisotropic diffusion; Low-contrast images; Glass substrates BibRef

Chao, S.M.[Shin-Min], Tsai, D.M.[Du-Ming], Tseng, Y.H.[Yan-Hsin], Jhang, Y.R.[Yuan-Ruei],
Defect detection in low-contrast glass substrates using anisotropic diffusion,
ICPR06(I: 654-657).
IEEE DOI 0609
BibRef

Kalliomäki, I.[Ilkka], Vehtari, A.[Aki], Lampinen, J.[Jouko],
Shape analysis of concrete aggregates for statistical quality modeling,
MVA(16), No. 3, May 2005, pp. 197-201.
Springer DOI 0505
BibRef

Ribeiro, B.,
Support vector machines for quality monitoring in a plastic injection molding process,
SMC-C(35), No. 3, August 2005, pp. 401-410.
IEEE DOI 0508
BibRef

Sakata, Y.[Yukinobu], Kaneko, S.[Shuni'chi], Takagi, Y.[Yuji], Okuda, H.[Hirohito],
Successive pattern classification based on test feature classifier and its application to defect image classification,
PR(38), No. 11, November 2005, pp. 1847-1856.
WWW Link. 0509
BibRef

Sakata, Y.[Yukinobu], Kaneko, S.[Shuni'chi], Tanaka, T.,
Successive pattern learning based on test feature classifier and its application to dynamic recognition problems,
IEVM06(xx-yy).
PDF File. 0609
BibRef

Tsai, D.M.[Du-Ming], Yang, C.H.[Cheng-Hsiang],
A quantile-quantile plot based pattern matching for defect detection,
PRL(26), No. 13, 1 October 2005, pp. 1948-1962.
WWW Link. 0509
BibRef

Tsai, D.M.[Du-Ming], Yang, R.H.[Ron-Hwa],
An eigenvalue-based similarity measure and its application in defect detection,
IVC(23), No. 12, 1 November 2005, pp. 1094-1101.
WWW Link. 0510
BibRef

Liu, J.J.[J. Jay], MacGregor, J.F.[John F.],
Estimation and monitoring of product aesthetics: Application to manufacturing of 'engineered stone' countertops,
MVA(16), No. 6, 2006, pp. 374-383.
Springer DOI 0603
BibRef

Taniguchi, K.[Kazutaka], Ueta, K.[Kunio], Tatsumi, S.[Shoji],
A mura detection method,
PR(39), No. 6, June 2006, pp. 1044-1052.
WWW Link. 0604
Mura (irregular lightness variation on a manufactured surface); Defect; Detection; Vision; Spatial frequency; Contrast enhancement BibRef

Tsai, D.M.[Du-Ming], Lin, P.C.[Ping-Chieh], Lu, C.J.[Chi-Jie],
An independent component analysis-based filter design for defect detection in low-contrast surface images,
PR(39), No. 9, September 2006, pp. 1679-1694.
WWW Link. 0606
Surface inspection; Independent component analysis; Convolution filter; Particle swarm optimization BibRef

Lu, C.J.[Chi-Jie], Tsai, D.M.[Du-Ming],
Independent component analysis-based defect detection in patterned liquid crystal display surfaces,
IVC(26), No. 7, 2 July 2008, pp. 955-970.
WWW Link. 0804
Defect detection; Surface inspection; TFT-LCD panels; Independent component analysis BibRef

Tsai, D.M.[Du-Ming], Lai, S.C.[Shia-Chih],
Defect detection in periodically patterned surfaces using independent component analysis,
PR(41), No. 9, September 2008, pp. 2812-2832.
WWW Link. 0806
Defect detection; Patterned surface; Independent component analysis; Particle swarm optimization; Liquid crystal display BibRef

Tsai, D.M.[Du-Ming], Chuang, S.T.[Su-Ta],
1D-based defect detection in patterned TFT-LCD panels using characteristic fractal dimension and correlations,
MVA(20), No. 6, October 2009, pp. xx-yy.
Springer DOI 0910
BibRef

Baykal, I.C.[Ibrahim Cem], Jullien, G.A.[Graham A.],
On the Use of Hash Functions as Preprocessing Algorithms to Detect Defects on Repeating Definite Textures,
MVA(17), No. 3, August 2006, pp. 185-195.
Springer DOI 0606
BibRef

Ng, H.F.[Hui-Fuang],
Automatic thresholding for defect detection,
PRL(27), No. 14, 15 October 2006, pp. 1644-1649.
WWW Link. 0609
Automatic thresholding; Defect detection BibRef

Sezer, O.G., Ercil, A., Ertuzun, A.,
Using perceptual relation of regularity and anisotropy in the texture with independent component model for defect detection,
PR(40), No. 1, January 2007, pp. 121-133.
WWW Link. 0611
Human vision; Texture defect detection; Independent component analysis; Receptive fields BibRef

Tsap, L.V.[Leonid V.], Duchaineau, M.[Mark], Goldgof, D.B.[Dmitry B.], Shin, M.C.[Min C.],
Data-driven feature modeling, recognition and analysis in a discovery of supersonic cracks in multimillion-atom simulations,
PR(40), No. 9, September 2007, pp. 2400-2407.
WWW Link. 0705
Data-driven; Feature modeling (analysis, extraction, recognition); Image motion analysis; Physics-based; Supersonic cracks; Molecular dynamics; Atomic simulation; Nanoscale analysis BibRef

Caleb-Solly, P., Smith, J.E.,
Adaptive surface inspection via interactive evolution,
IVC(25), No. 7, 1 July 2007, pp. 1058-1072.
WWW Link. 0705
Machine vision; Configuration; Interative; Evolution User knowledge to get description for defects. BibRef

Xie, X.H.[Xiang-Hua], Mirmehdi, M.[Majid],
TEXEMS: Texture Exemplars for Defect Detection on Random Textured Surfaces,
PAMI(29), No. 8, August 2007, pp. 1454-1464.
IEEE DOI 0707
BibRef
And:
Colour Image Segmentation Using Texems,
BMVA(2007), No. 6, 2007, pp. 1-10.
PDF File. 1209
BibRef
Earlier:
Localising Surface Defects in Random Colour Textures Using Multiscale Texem Analysis in Image Eigenchannels,
ICIP05(III: 1124-1127).
IEEE DOI 0512
Based on a few examples. Compare to Gabor filters. BibRef

Xie, X.H.[Xiang-Hua],
A Review of Recent Advances in Surface Defect Detection using Texture analysis Techniques,
ELCVIA(7), No. 3, 2008, pp. 1-22.
WWW Link. 0711
Survey, Defect Detection. BibRef

Groby, J.P.[Jean-Philippe], Lesselier, D.[Dominique],
Localization and characterization of simple defects in finite-sized photonic crystals,
JOSA-A(25), No. 1, January 2008, pp. 146-152.
WWW Link. 0801
BibRef

Lim, M.S.[Mee-Seub], Lim, J.H.[Joon-Hong],
Visual measurement of pile movements for the foundation work using a high-speed line-scan camera,
PR(41), No. 6, June 2008, pp. 2025-2033.
WWW Link. 0802
Line-scan image; Visual measurement; Pile movement BibRef

Hadizadeh, H.[Hadi], and Baradaran Shokouhi, S.[Shahriar],
Random Texture Defect Detection Using 1-D Hidden Markov Models Based on Local Binary Patterns,
IEICE(E91-D), No. 7, July 2008, pp. 1937-1945.
DOI Link BibRef 0807

Choi, K.N.[Kyu Nam], Park, N.K.[No Kap], Yoo, S.I.[Suk In],
Image Restoration for Quantifying TFT-LCD Defect Levels,
IEICE(E91-D), No. 2, February 2008, pp. 322-329.
DOI Link 0802
BibRef

Liew, C.K.[Chin Kian], Veidt, M.[Martin],
Pattern recognition of guided waves for damage evaluation in bars,
PRL(30), No. 3, 1 February 2009, pp. 321-330.
Elsevier DOI 0804
Ultrasonics; Quantitative nondestructive evaluation; Structural health monitoring; Multi-layer perceptron; Ensemble networks; Modular networks BibRef

Gnanaprakasam, P.[Pradeep], Parker, J.M.[Johne M.], Ganapathiraman, S.[Subburengan], Hou, Z.[Zhen],
Efficient 3D characterization of raised topological defects in smooth specular coatings,
IVC(27), No. 4, 3 March 2009, pp. 319-330.
Elsevier DOI 0804
Surface reflectance model; Surface quality of specular coatings; Defect characterization; Camera calibration BibRef

Kim, H.I., Lee, S.H., Cho, N.I.,
Automatic Defect Classification Using Frequency and Spatial Features in a Boosting Scheme,
SPLetters(16), No. 5, May 2009, pp. 374-377.
IEEE DOI 0903
Uses histogram of spatial orientation and frequency. BibRef

Hampel, U., Maas, H.G.,
Cascaded image analysis for dynamic crack detection in material testing,
PandRS(64), No. 4, July 2009, pp. 345-350.
Elsevier DOI 0907
Image matching; Image analysis; Deformation measurement BibRef

Tsneg, Y.H.[Yan-Hsin], Tsai, D.M.[Du-Ming],
Defect detection of uneven brightness in low-contrast images using basis image representation,
PR(43), No. 3, March 2010, pp. 1129-1141.
Elsevier DOI 1001
Defect detection; Surface inspection; Basis image representation; Independent component analysis; Particle swarm optimization BibRef

Yamaguchi, T.[Tomoyuki], Hashimoto, S.[Shuji],
Fast crack detection method for large-size concrete surface images using percolation-based image processing,
MVA(21), No. 5, August 2010, pp. 797-809.
WWW Link. 1011
BibRef
Earlier:
Improved percolation-based method for crack detection in concrete surface images,
ICPR08(1-4).
IEEE DOI 0812
BibRef

Clemmensen, L.H.[Line H.], Hansen, M.E.[Michael E.], Ersbřll, B.K.[Bjarne K.],
A comparison of dimension reduction methods with application to multi-spectral images of sand used in concrete,
MVA(21), No. 6, October 2010, pp. 959-968.
WWW Link. 1011
BibRef

Fujita, Y.[Yusuke], Hamamoto, Y.[Yoshihiko],
A robust automatic crack detection method from noisy concrete surfaces,
MVA(22), No. 2, March 2011, pp. 245-254.
WWW Link. 1103
BibRef

Tsai, D.M.[Du-Ming], Tsai, H.Y.[Hsin-Yang],
Low-contrast surface inspection of mura defects in liquid crystal displays using optical flow-based motion analysis,
MVA(22), No. 4, July 2011, pp. 629-649.
WWW Link. 1107
BibRef

Elunai, R., Chandran, V., Gallagher, E.,
Asphalt Concrete Surfaces Macrotexture Determination From Still Images,
ITS(12), No. 3, September 2011, pp. 857-869.
IEEE DOI 1109
BibRef

Burgess, G., Shortis, M.R., Scott, P.,
Photographic assessment of retroreflective film properties,
PandRS(66), No. 5, September 2011, pp. 743-750.
Elsevier DOI 1110
Retroreflective film; Retroreflectance; Luminance factor; Standards; Performance BibRef

Zou, Q.[Qin], Cao, Y.[Yu], Li, Q.Q.[Qing-Quan], Mao, Q.Z.[Qing-Zhou], Wang, S.[Song],
Automatic inpainting by removing fence-like structures in RGBD images,
MVA(25), No. 7, October 2014, pp. 1841-1858.
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Satorres Martínez, S., Gómez Ortega, J., Gámez García, J., Sánchez García, A.,
A machine vision system for defect characterization on transparent parts with non-plane surfaces,
MVA(23), No. 1, January 2012, pp. 1-13.
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Gunkel, C.[Christina], Stepper, A.[Alexander], Müller, A.C.[Arne C.], Müller, C.H.[Christine H.],
Micro crack detection with Dijkstra's shortest path algorithm,
MVA(23), No. 3, May 2012, pp. 589-601.
WWW Link. 1204
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Tolba, A.S.[Ahmad Said],
A novel multiscale-multidirectional autocorrelation approach for defect detection in homogeneous flat surfaces,
MVA(23), No. 4, July 2012, pp. 739-750.
WWW Link. 1206
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Wang, X.S.[Xiao-Song], Mirmehdi, M.[Majid],
Archive Film Defect Detection and Removal: An Automatic Restoration Framework,
IP(21), No. 8, August 2012, pp. 3757-3769.
IEEE DOI 1208
BibRef
Earlier:
Archive Film Restoration Based on Spatiotemporal Random Walks,
ECCV10(V: 478-491).
Springer DOI 1009
BibRef
Earlier:
HMM based Archive Film Defect Detection with Spatial and Temporal Constraints,
BMVC09(xx-yy).
PDF File. 0909
BibRef

Tsai, D.M.[Du-Ming], Chen, M.C.[Ming-Chun], Li, W.C.[Wei-Chen], Chiu, W.Y.[Wei-Yao],
A fast regularity measure for surface defect detection,
MVA(23), No. 5, September 2012, pp. 869-886.
WWW Link. 1208
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Jahanshahi, M.R.[Mohammad R.], Masri, S.F.[Sami F.], Padgett, C.W.[Curtis W.], Sukhatme, G.S.[Gaurav S.],
An innovative methodology for detection and quantification of cracks through incorporation of depth perception,
MVA(24), No. 2, February 2013, pp. 227-241.
WWW Link. 1302
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Tsai, Z.D.[Zong-Da], Perng, M.H.[Ming-Hwei],
Defect detection in periodic patterns using a multi-band-pass filter,
MVA(24), No. 3, April 2013, pp. 551-565.
WWW Link. 1303
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Li, G.H.[Guo-Hui], Shi, J.F.[Jin-Fang], Luo, H.S.[Hong-Sen], Tang, M.G.[Mian-Gang],
A computational model of vision attention for inspection of surface quality in production line,
MVA(24), No. 4, May 2013, pp. 835-844.
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Lu, H.T.[Hong-Tao], Huang, W.[Wei],
Automatic Defect Classification of TFT-LCD Panels with Shape, Histogram and Color Features,
IJIG(13), No. 03, 2013, pp. 1350011.
DOI Link 1309
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Dumoulin, J.[Jean], Averty, R.[Rodolphe],
Infrared imaging system monitors transportation structures in real time,
SPIE(Newsroom), January 23, 2014
DOI Link 1412
A thermal measurement system architecture designed for real-time, long-term monitoring of transportation infrastructures was evaluated on a bridge in Switzerland. BibRef

Anwar, S.[Said], Abdullah, M.[Mohd],
Micro-crack detection of multicrystalline solar cells featuring an improved anisotropic diffusion filter and image segmentation technique,
JIVP(2014), No. 1, 2014, pp. 15.
DOI Link 1404
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Haddad, B.[Bashar], Jarrah, A.[Amin],
Semi-Automatic Cracks Correction Based on Seam Processing, Stochastic Analysis and Learning Process,
IJIG(13), No. 04, 2013, pp. 1350020.
DOI Link 1404
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Zhao, G.T.[Guo-Teng], Wang, T.Q.[Tong-Qing], Ye, J.Y.[Jun-Yong],
Anisotropic clustering on surfaces for crack extraction,
MVA(26), No. 5, July 2015, pp. 675-688.
WWW Link. 1506
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Hung, M.H.[Mao-Hsiung], Hsieh, C.H.[Chaur-Heh],
A novel algorithm for defect inspection of touch panels,
IVC(41), No. 1, 2015, pp. 11-25.
Elsevier DOI 1508
Automatic optical inspection BibRef

Bhattacharjee, S.[Sudipta], Deb, D.[Debasis],
Development of a crack growth predictor for geomaterials using detrended fluctuation analysis and optical flow method,
SIViP(10), No. 1, January 2016, pp. 121-128.
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Liebold, F., Maas, H.G.,
Advanced spatio-temporal filtering techniques for photogrammetric image sequence analysis in civil engineering material testing,
PandRS(111), No. 1, 2016, pp. 13-21.
Elsevier DOI 1601
Material testing BibRef

Weigl, E.[Eva], Heidl, W.[Wolfgang], Lughofer, E.[Edwin], Radauer, T.[Thomas], Eitzinger, C.[Christian],
On improving performance of surface inspection systems by online active learning and flexible classifier updates,
MVA(27), No. 1, January 2016, pp. 103-127.
Springer DOI 1601
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Chen, S.H.,
Inspecting lens collars for defects using discrete cosine transformation based on an image restoration scheme,
IET-IPR(10), No. 6, 2016, pp. 474-482.
DOI Link 1606
curve fitting BibRef

Ortner, T.[Thomas], Sorger, J.[Johannes], Piringer, H.[Harald], Hesina, G.[Gerd], Gröller, E.[Eduard],
Visual analytics and rendering for tunnel crack analysis,
VC(32), No. 6-8, June 2016, pp. 859-869.
Springer DOI 1608
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Dobson, J., Cawley, P.,
Independent Component Analysis for Improved Defect Detection in Guided Wave Monitoring,
PIEEE(104), No. 8, August 2016, pp. 1620-1631.
IEEE DOI 1608
Corrosion BibRef

Wang, H.C.[Hong-Cheng], Xiong, Z.Y.[Zi-You], Finn, A.M.[Alan M.], Chaudhry, Z.[Zaffir],
A context-driven approach to image-based crack detection,
MVA(27), No. 7, October 2016, pp. 1103-1114.
Springer DOI 1610
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Salucci, M.[Marco], Anselmi, N.[Nicola], Oliveri, G.[Giacomo], Calmon, P.[Pierre], Miorelli, R.[Roberto], Reboud, C.[Christophe], Massa, A.[Andrea],
Real-Time NDT-NDE Through an Innovative Adaptive Partial Least Squares SVR Inversion Approach,
GeoRS(54), No. 11, November 2016, pp. 6818-6832.
IEEE DOI 1610
NDT: Nondestructive testing. Current measurement BibRef

Krishnamoorthy, R.[Ramasamy], Ganesh, M.[Mani],
A simple computational framework for defect detection system with orthogonal polynomials transcoded coefficients,
JVCIR(41), No. 1, 2016, pp. 31-46.
Elsevier DOI 1612
Block classification BibRef

Hanzaei, S.H.[Saeed Hosseinzadeh], Afshar, A.[Ahmad], Barazandeh, F.[Farshad],
Automatic detection and classification of the ceramic tiles' surface defects,
PR(66), No. 1, 2017, pp. 174-189.
Elsevier DOI 1704
Ceramic tile BibRef


Veitch-Michaelis, J., Tao, Y., Walton, D., Muller, J.P., Crutchley, B., Storey, J., Paterson, C., Chown, A.,
Crack Detection in 'As-Cast' Steel Using Laser Triangulation and Machine Learning,
CRV16(342-349)
IEEE DOI 1612
3D reconstruction BibRef

Kubatur, S.S., Comer, M.L.,
Rare event simulation for Markov random fields with application to grain growth in crystals,
ICIP16(3748-3752)
IEEE DOI 1610
Computational modeling BibRef

Chen, P.H., Ho, S.S.,
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ICIP16(749-753)
IEEE DOI 1610
Feature extraction BibRef

Martínez-Sánchez, J., Puente, I., GonzálezJorge, H., Riveiro, B., Arias, P.,
Automatic Thickness And Volume Estimation Of Sprayed Concrete On Anchored Retaining Walls From Terrestrial Lidar Data,
ISPRS16(B5: 521-526).
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Loyola-González, O.[Octavio], Martínez-Trinidad, J.F.[José F.], Carrasco-Ochoa, J.A.[Jesús A.], Hernández-Tamayo, D.[Dayton], García-Borroto, M.[Milton],
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MCPR16(293-302).
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López-Leyva, R.[Rafael], Rojas-Domínguez, A.[Alfonso], Flores-Mendozaa, J.P.[Juan Pablo], Casillas-Araiza, M.Á.[Miguel Ángel], Santiago-Montero, R.[Raúl],
Comparing Threshold-Selection Methods for Image Segmentation: Application to Defect Detection in Automated Visual Inspection Systems,
MCPR16(33-43).
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Schmugge, S.J., Rice, L., Nguyen, N.R., Lindberg, J., Grizzi, R., Joffe, C., Shin, M.C.,
Detection of cracks in nuclear power plant using spatial-temporal grouping of local patches,
WACV16(1-7)
IEEE DOI 1606
Imaging BibRef

Chmielewski, L.J.[Leszek J.], Orlowski, A.[Arkadiusz], Smietanska, K.[Katarzyna], Górski, J.[Jaroslaw], Krajewski, K.[Krzysztof], Janowicz, M.[Maciej], Wilkowski, J.[Jacek], Kietlinska, K.[Krystyna],
Detection of Surface Defects of Type 'orange skin' in Furniture Elements with Conventional Image Processing Methods,
GPID15(26-37).
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Enhancing Automated Defect Detection in Collagen Based Manufacturing by Employing a Smart Machine Vision Technique,
RV15(155-166).
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Stent, S.[Simon], Gherardi, R.[Riccardo], Stenger, B.[Björn], Cipolla, R.[Roberto],
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Cheng, J.R.[Jie-Rong], Xiong, W.[Wei], Wang, Y.[Yue], Chia, S.C.[Shue Ching], Chen, W.Y.[Wen-Yu], Du, J.[Jia], Gu, Y.[Ying], Kow, V.T.S.[Victor Ter Shen],
CHORD: Cascaded and a contrario method for hole crack detection,
ICIP15(3300-3304)
IEEE DOI 1512
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Lagache, T.[Thibault], Marcou, Q.[Quentin], Bardonnet, A.[Antoine], Rotureau, B.[Brice], Bastin, P.[Philippe], Olivo-Marin, J.C.[Jean-Christophe],
Using steerable wavelets and minimal paths to reconstruct automatically filaments in fluorescence imaging,
ICIP15(706-709)
IEEE DOI 1512
Filament detection BibRef

Funahashi, T., Taki, K., Koshimizu, H., Kaneko, A.,
Fast and robust visual inspection system for tire surface thin defect,
FCV15(1-6)
IEEE DOI 1506
inspection BibRef

Drogoul, A.[Audric], Aubert, G.[Gilles], Auroux, D.[Didier],
Topological gradient for a fourth order PDE and application to the detection of fine structures in 2D and 3D images,
ICIP14(1703-1707)
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e.g. filaments. BibRef

Tsai, Y.C.J.[Yi-Chang James], Jiang, C.L.[Cheng-Long], Wang, Z.H.[Zhao-Hua],
Implementation of automatic crack evaluation using Crack Fundamental Element,
ICIP14(773-777)
IEEE DOI 1502
Accuracy BibRef

von Enzberg, S.[Sebastian], Al-Hamadi, A.[Ayoub],
A Defect Recognition System for Automated Inspection of Non-rigid Surfaces,
ICPR14(1812-1816)
IEEE DOI 1412
Inspection BibRef

Ma, L.[Ling], Liu, W.[Wei], Liu, Y.M.[Yu-Min], Jiang, H.Q.[Hui-Qin],
An Automatic Detection Algorithm for Surface Defects in TFT-LCD,
ACPR13(847-851)
IEEE DOI 1408
cost reduction BibRef

Landstrom, A., Thurley, M.J., Jonsson, H.,
Sub-Millimeter Crack Detection in Casted Steel Using Color Photometric Stereo,
DICTA13(1-7)
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cracks BibRef

Delis, S.[Sotirios], Nikolaidis, N.[Nikos], Pitas, I.[Ioannis],
Automatic 3D defects identification in stereoscopic videos,
ICIP13(2227-2231)
IEEE DOI 1412
3D quality; disparity; stereo video BibRef

Briceńo, C.[Carlos], Rivera-Rovelo, J.[Jorge], Acuńa, N.[Narciso],
Crack's Detection, Measuring and Counting for Resistance's Tests Using Images,
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Springer DOI 1311
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Defect Classification on Specular Surfaces Using Wavelets,
SSVM13(501-512).
Springer DOI 1305
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Choi, J.[Jiwon], Kim, C.[Changick],
Unsupervised detection of surface defects: A two-step approach,
ICIP12(1037-1040).
IEEE DOI 1302
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von Enzberg, S.[Sebastian], Michaelis, B.[Bernd],
Surface Quality Inspection of Deformable Parts with Variable B-spline Surfaces,
DAGM12(175-184).
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Stübl, G.[Gernot], Bouchot, J.L.[Jean-Luc], Haslinger, P.[Peter], Moser, B.[Bernhard],
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DAGM12(428-437).
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Shih, Y.C.[Yi Chang], Davis, A.[Abe], Hasinoff, S.W.[Samuel W.], Durand, F.[Fredo], Freeman, W.T.[William T.],
Laser speckle photography for surface tampering detection,
CVPR12(33-40).
IEEE DOI 1208
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Tong, X.H.[Xu-Hang], Guo, J.[Jie], Ling, Y.[Yun], Yin, Z.P.[Zhou-Ping],
A new image-based method for concrete bridge bottom crack detection,
IASP11(568-571).
IEEE DOI 1112
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Zhao, J.[Jie], Kong, Q.J.[Qing-Jie], Zhao, X.[Xu], Liu, J.P.[Jia-Peng], Liu, Y.C.[Yun-Cai],
A Method for Detection and Classification of Glass Defects in Low Resolution Images,
ICIG11(642-647).
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Liu, L.H.[Ling-Hui], Zeng, L.[Li], Bi, B.[Bi],
A Unified Method Based on Wavelet Transform and C-V Model for Crack Segmentation of 3D Industrial CT Images,
ICIG11(12-16).
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Detchev, I.[Ivan], Habib, A.[Ayman], El-Badry, M.[Mamdouh],
Estimation Of Vertical Deflections In Concrete Beams Through Digital Close Range Photogrammetry,
Laser11(xx-yy).
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Hu, H.[Han], Gu, Q.Q.[Quan-Quan], Zhou, J.[Jie],
HTF: a novel feature for general crack detection,
ICIP10(1633-1636).
IEEE DOI 1009
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Oliveira, H.[Henrique], Correia, P.L.[Paulo Lobato],
CrackIT: An image processing toolbox for crack detection and characterization,
ICIP14(798-802)
IEEE DOI 1502
Classification algorithms BibRef

Hampel, U.,
Crack Detection In Load Tests For Civil Engineering Material Testing By Digital Closed Range Photogrammetry: Algorithms And Applications,
CloseRange10(xx-yy).
PDF File. 1006
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Skarlatos, D., Bakolias, C.,
Industrial Inspection And Checking Of Marble Tiles,
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Aiger, D.[Dror], Talbot, H.[Hugues],
The phase only transform for unsupervised surface defect detection,
CVPR10(295-302).
IEEE DOI 1006
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Nakazawa, M.[Mitsuru], Aoki, Y.[Yoshimitsu], Kobayashi, M.[Masakazu], Toda, H.[Hiroyuki],
3D image analysis for evaluating internal deformation/fracture characteristics of materials,
ICPR08(1-4).
IEEE DOI 0812
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Chuang, H.C.A.[Hsiao-Chi-Ang], Comer, M.L.[Mary L.],
Objective evaluation for segmentation of microscope images of materials,
Southwest10(137-140).
IEEE DOI 1005
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Chuang, H.C.A.[Hsiao-Chi-Ang], Comer, M.L.[Mary L.], Simmons, J.P.[Jeff P.],
Texture Classification in Microstructure Images of Advanced Materials,
Southwest08(1-4).
IEEE DOI 0803
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Tirronen, V.[Ville], Neri, F.[Ferrante], Karkkainen, T.[Tommi], Majava, K.[Kirsi], Rossi, T.[Tuomo],
A Memetic Differential Evolution in Filter Design for Defect Detection in Paper Production,
EvoIASP07(320-329).
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Haindl, M.[Michal], Grim, J.[Jirí], Mikeš, S.[Stanislav],
Texture Defect Detection,
CAIP07(987-994).
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d'Orazio, T., Leo, M., Guaragnella, C., Distante, A.,
Analysis of Image Sequences for Defect Detection in Composite Materials,
ACIVS07(855-864).
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Yue, K.[Kui], Huber, D.F.[Daniel F.], Akinci, B.[Burcu], Krishnamurti, R.[Ramesh],
The ASDMCon Project: The Challenge of Detecting Defects on Construction Sites,
3DPVT06(1048-1055).
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Chowdhury, A.S., Bhattacharya, A., Bhandarkar, S.M., Datta, G.S., Yu, J.C., Figueroa, R.,
Hairline Fracture Detection using MRF and Gibbs Sampling,
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Urano, T., Kaneko, S., Tanaka, T.,
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SCIA05(1228-1237).
Springer DOI 0506
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Frau, D.C.[David Cuesta], Hernández-Fenollosa, M.Á.[María Ángeles], Tormos, P.M.[Pau Micó], Linares-Pellicer, J.[Jordi],
Segmentation of Nanocolumnar Crystals from Microscopic Images,
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Limas Serafim, A.F.,
Segmentation of natural images based on multiresolution pyramids linking of the parameters of an autoregressive rotation invariant model. Application to leather defects detection,
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Vieira, S.M.[Susana M.], Sousa, J.M.C.[Joăo M. C.], Pinto, J.R.C.[Joăo R. Caldas],
Ant Based Fuzzy Modeling Applied to Marble Classification,
ICIAR06(II: 90-101).
Springer DOI 0610
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Sousa, J.M.C.[Joăo M.C.], Pinto, J.R.C.[Joăo R. Caldas],
Comparison of Intelligent Classification Techniques Applied to Marble Classification,
ICIAR04(II: 802-809).
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Fujita, Y.[Yusuke], Mitani, Y.[Yoshihiro], Hamamoto, Y.[Yoshihiko],
A Method for Crack Detection on a Concrete Structure,
ICPR06(III: 901-904).
IEEE DOI 0609
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Amano, T.[Toshiyuki],
Correlation Based Image Defect Detection,
ICPR06(I: 163-166).
IEEE DOI 0609
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Sobral, J.L.,
Optimised Filters for Texture Defect Detection,
ICIP05(III: 565-568).
IEEE DOI 0512
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Bruno, R.[Roberto], Cuoghi, L.[Lorenza], Laurenge, P.[Pascal],
Quantitative Identification of Marbles Aesthetical Features,
IbPRIA05(II:674).
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Monadjemi, A., Mirmehdi, M., Thomas, B.T.,
Restructured Eigenfilter Matching for Novelty Detection in Random Textures,
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Hou, Z.[Zhen], Parker, J.M.[Johné M.],
Texture Defect Detection Using Support Vector Machines with Adaptive Gabor Wavelet Features,
WACV05(I: 275-280).
IEEE DOI 0502
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Viana, R.[Roberto], Rodrigues, R.B.[Ricardo B.], Alvarez, M.A.[Marco A.], Pistori, H.[Hemerson],
SVM with Stochastic Parameter Selection for Bovine Leather Defect Classification,
PSIVT07(600-612).
Springer DOI 0712
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Zhang, T.[Tong], Nagy, G.,
Surface tortuosity and its application to analyzing cracks in concrete,
ICPR04(II: 851-854).
IEEE DOI 0409
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Ai, J.Y.[Jiao-Yan], Di, L.[Liu], Zhu, X.F.[Xue-Feng],
Combination of wavelet analysis and color applied to automatic color grading of ceramic tiles,
ICPR04(III: 235-238).
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Jia, H.B.[Hong-Bin], Murphey, Y.L.[Yi Lu], Shi, J.J.[Jian-Jun], Chang, T.S.[Tzyy-Shuh],
An intelligent real-time vision system for surface defect detection,
ICPR04(III: 239-242).
IEEE DOI 0409
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Eisele, H., Hamprecht, F.A.,
A New Approach for Defect Detection in X-ray CT Images,
DAGM02(345 ff.).
Springer DOI 0303
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Toth, D., Condurache, A.P.[Alexandru Paul], Aach, T.[Til],
A two-stage-classifier for defect classification in optical media inspection,
ICPR02(IV: 373-376).
IEEE DOI 0211
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Gupta, P., Doermann, D., DeMenthon, D.F.,
Beam search for feature selection in automatic SVM defect classification,
ICPR02(II: 212-215).
IEEE DOI 0211
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Maalmi, K., El-Ouaazizi, A., Benslimane, R., Lew, L.F.C., Voon, Y.[Yan], Diou, A., Gorria, P.,
Crack defect detection and localization using genetic-based inverse voting Hough transform,
ICPR02(III: 257-260).
IEEE DOI 0211
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Kumar, A., Shen, H.C.,
Texture inspection for defects using neural networks and support vector machines,
ICIP02(III: 353-356).
IEEE DOI 0210
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Nagy, G.[George], Zhang, T.[Tong], Franklin, W.R., Landis, E.[Eric], Nagy, E.[Edwin], Keane, D.T.[Denis T.],
Volume and Surface Area Distributions of Cracks in Concrete,
VF01(759 ff.).
Springer DOI 0209
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Martínez-Cabeza-de-Vaca-Alajarín, J.[Juan], Tomás-Balibrea, L.M.[Luis-Manuel],
Automatic Classification System of Marble Slabs in Production Line According to Texture and Color Using Artificial Neural Networks,
CAIP99(167-174).
Springer DOI 9909
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Chetverikov, D.[Dmitry], Khenokh, Y.[Yuri],
Matching for Shape Defect Detection,
CAIP99(367-374).
Springer DOI 9909
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Kobayashi, H.H., Hara, Y., Doi, H., Takai, K., Sumiya, A.,
Hybrid Defect Detection Method Based on Shape Measurement and Feature Extraction for Complex Patterns,
MVA98(xx-yy). BibRef 9800

Cho, S.H., Hisatomi, K., Hashimoto, S.,
Cracks and Displacement Feature Extraction of the Concrete Block Surface,
MVA98(xx-yy). BibRef 9800

Chetverikov, D.[Dmitry], Gede, K.[Krisztián],
Textures and structural defects,
CAIP97(167-174).
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Mari, M.[Massimo], Dambra, C.[Carlo], Chetverikov, D.[Dmitry], Verestoy, J.[Judit], Jozwik, A.[Adam], Nieniewski, M.[Mariusz], Chmielewski, L.[Leszek], Sklodowski, M.[Marek], Cudny, W.[Waldemar], Lugg, M.[Martin],
The CRASH project: Defect detection and classification in ferrite cores,
CIAP97(II: 781-787).
Springer DOI 9709
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Nieniewski, M.[Mariusz],
Morphological Method of Detection of Defects on the Surface of Ferrite Cores,
SCIA97(xx-yy)
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Pakkanen, J.[Jussi], Ilvesmäki, A.[Antti], Iivarinen, J.[Jukka],
Defect Image Classification and Retrieval with MPEG-7 Descriptors,
SCIA03(349-355).
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Visa, A.[Ari], Iivarinen, J.[Jukka],
An Adaptive Texture and Shape Based Defect Classification,
ICPR98(Vol I: 117-122).
IEEE DOI 9808
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Iivarinen, J.[Jukka], Rauhamaa, J.[Juhani], and Visa, A.[Ari],
An Adaptive Two-Stage Approach to Classification of Surface Defects,
SCIA97(xx-yy)
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Anzalone, A., Machí, A.,
Visual detection of defects in moulded plastic drippers,
CAIP95(802-807).
Springer DOI 9509
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Bruzzone, L., Roli, F., Serpico, S.B.,
Crack detection by a measure of texture anisotropy,
CIAP95(743-747).
Springer DOI 9509
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Azencott, R., Yao, J.,
Automated detection of cowhide defects using Markov random field techniques,
ICPR94(A:791-793).
IEEE DOI 9410
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Hepplewhite, L.[Lee], Stonham, T.J.[T. John],
Surface inspection using texture recognition,
ICPR94(A:589-591).
IEEE DOI 9410
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Ojala, T., Pietikainen, M., Silven, O.,
Edge-based texture measures for surface inspection,
ICPR92(II:594-598).
IEEE DOI 9208
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Sokolov, S.M., Treskunov, A.S.,
Automatic vision system for final test of liquid crystal display,
CRA92(1578-1582).
WWW Link. BibRef 9200

Silven, O., Westman, T., Huotari, S., Hakalahti, H.,
A Defect Analysis Method for Visual Inspection,
ICPR86(868-870). BibRef 8600

Chapter on Implementations and Applications, Databases, QBIC, Video Analysis, Hardware and Software, Inspection continues in
Inspection -- Pavement, Road Surface, Asphalt, Concrete .


Last update:May 25, 2017 at 22:18:08