19.6.4 Automated Measurement Systems, Close Range Photogrammetry

Chapter Contents (Back)
Measurement. Mensuration. Metrology. Close Range Photogrammetry.

Flamholz, A.L., and Froot, H.A.,
Dimensional Measurement and Defect Detection Using Spatial Filtering,
IBMRD(17), No. 6, November 1973, pp. 509-518. BibRef 7311

Porter, III, G.B.,
An application of grey level image processing to an industrial dimensional inspection problem,
PR(14), No. 1-6, 1981, pp. 405-410.
WWW Link. 0309
BibRef

Groen, F.C.A., Verbeek, P.W., de Jong, N., Klumper, J.W.,
The smallest box around a package,
PR(14), No. 1-6, 1981, pp. 173-178.
WWW Link. 0309
Measures height and smallest rectangular hull of the vertical projection for parcels or suitcases on a conveyor belt. BibRef

Hall, E.L., Tio, J.B.K., McPherson, C.A., and Sadjadi, F.A.,
Measuring Curved Surfaces for Robot Vision,
Computer(15), No. 12, December 1982, pp. 42-54. BibRef 8212

Tio, J.B.K., McPherson, C.A., and Hall, E.L.,
Curved Surface Measurement for Robot Vision,
PRIP82(370-378). BibRef 8200

Haralick, R.M.[Robert M.],
Machine Vision Mensuration,
CVGIP(40), No. 3, December 1987, pp. 271-272.
WWW Link. Introduction to the special issue. BibRef 8712

Nishihara, H.K., and Crossley, P.A.,
Measuring Photolithographic Overlay Accuracy and Critical Dimensions by Correlating Binarized Laplacian of Gaussian Convolutions,
PAMI(10), No. 1, January 1988, pp. 17-30.
IEEE DOI BibRef 8801

Gordon, S.J.[Steven J.], Seering, W.P.[Warren P.],
Real-Time Part Position Sensing,
PAMI(10), No. 3, May 1988, pp. 374-386.
IEEE DOI BibRef 8805
And: MIT AI Memo-1032, May 1988. BibRef

Morris, D.T., Narendra-Nathan, A.,
A rule-based system for dimensional analysis of glass containers,
IVC(7), No. 4, November 1989, pp. 274-280.
WWW Link. 0401
BibRef

Wang, C.C.,
A Low-Cost Calibration Method for Automated Optical Mensuration Using A Video Camera,
MVA(7), No. 4, 1994, pp. 259-266. BibRef 9400

Clarke, T.A.,
An Analysis of the Prospects for Digital Close-Range Photogrammetry,
PandRS(50), No. 3, June 1995, pp. 4-7. BibRef 9506

Hsu, J.P., Fuh, C.S.,
Image Segmentation To Inspect 3-D Object Sizes,
OptEng(35), No. 1, January 1996, pp. 262-271. BibRef 9601

Beyer, H.A.,
Automated Dimensional Inspection With Real-time Photogrammetry,
PandRS(50), No. 3, June 1995, pp. 20-26. BibRef 9506

Axelsson, P.,
ISPRS Commission-III Symposium: Spatial Information from Digital Photogrammetry and Computer Vision,
PandRS(50), No. 2, April 1995, pp. 45-46. Meeting of September 5-9, 1994, Munich, Germany. BibRef 9504

Salvi, J., Batlle, J., Mouaddib, E.,
A Robust-Coded Pattern Projection for Dynamic 3D Scene Measurement,
PRL(19), No. 11, September 1998, pp. 1055-1065. 9811
BibRef

Edmundson, K.L.[Kenneth L.], Fraser, C.S.[Clive S.],
A practical evaluation of sequential estimation for vision metrology,
PandRS(53), No. 5, October 1998, pp. 272-285. BibRef 9810

Fraser, C.S.[Clive S.], Edmundson, K.L.[Kenneth L.],
Design and implementation of a computational processing system for off-line digital close-range photogrammetry,
PandRS(55), No. 2, June 2000, pp. 94-104. 0008
BibRef

Lin, C.F.[Chi-Fang], Lin, C.Y.[Chih-Yang],
A new approach to high precision 3-D measuring system,
IVC(17), No. 11, September 1999, pp. 805-814.
WWW Link. BibRef 9909

Tillett, R.[Robin], McFarlane, N.[Nigel], Lines, J.[Jeff],
Estimating Dimensions of Free-Swimming Fish Using 3D Point Distribution Models,
CVIU(79), No. 1, July 2000, pp. 123-141.
DOI Link 0006
BibRef

Criminisi, A., Reid, I.D., Zisserman, A.,
Single View Metrology,
IJCV(40), No. 2, November 2000, pp. 123-148.
DOI Link 0101
BibRef
Earlier: ICCV99(434-441).
IEEE DOI BibRef

Criminisi, A.,
Single-View Metrology: Algorithms and Applications,
DAGM02(224 ff.).
Springer DOI 0303
BibRef

Coakley, K.J.[Kevin J.], Levenson, M.S.[Mark S.],
Guest editorial: Advances in quantitative image analysis,
IJIST(11), No. 4, 2001, pp. 209. 0105
BibRef

Hattori, S.[Susumu], Akimoto, K.[Keiichi], Fraser, C.S.[Clive S.], Imoto, H.[Harutaka],
Automated Procedures with Coded Targets in Industrial Vision Metrology,
PhEngRS(68), No. 5, May 2002, pp. 441-446. Automated processing to reduce data processing time by as much as 93 percent.
WWW Link. 0206
BibRef

Rivero, D., Paindavoine, M., Petit, S.,
Real-time Sub-pixel Cross Bar Position Metrology,
RealTimeImg(8), No. 2, April 2002, pp. 105-113.
DOI Link 0208
Measure cross-bar positions. BibRef

Montillo, A.A.[Albert A.], Bachelder, I.A.[Ivan A.], Marrion, Jr., C.C.[Cyril C.],
Methods and apparatuses for measuring an extent of a group of objects within an image,
US_Patent6,571,006, May 27, 2003
WWW Link. BibRef 0305

Malassiotis, S.[Sotiris], Strintzis, M.G.[Michael G.],
Stereo vision system for precision dimensional inspection of 3D holes,
MVA(15), No. 2, December 2003, pp. 101-113.
Springer DOI 0401
BibRef

Chang, C.I., Ren, H., Chang, C.C., d'Amico, F., Jensen, J.O.,
Estimation of Subpixel Target Size for Remotely Sensed Imagery,
GeoRS(42), No. 6, June 2004, pp. 1309-1320.
IEEE Abstract. 0407
BibRef

Salas, J.[Joaquín], Avalos, W.[Wendy], Castañeda, R.[Rafael], Maya, M.[Mario],
A machine-vision system to measure the parameters describing the performance of a Foucault pendulum,
MVA(17), No. 2, May 2006, pp. 133-138.
Springer DOI 0605
BibRef

Bigand, A., Evrard, L., Dubus, J.P.,
A new perceptual organization approach to 3D measuring system based on the fuzzy integral,
IVC(24), No. 4, 1 April 2006, pp. 381-393.
WWW Link. Computer vision; Perceptual organization; Fuzzy integral 0606
BibRef

Chen, Z.Z.[Ze-Zhi], Pears, N.E.[Nick E.], Liang, B.J.[Bo-Jian],
A method of visual metrology from uncalibrated images,
PRL(27), No. 13, 1 October 2006, pp. 1447-1456.
WWW Link. 0606
BibRef
Earlier: A3, A1, A2:
Uncalibrated two-view metrology,
ICPR04(I: 96-99).
IEEE DOI 0409
Reciprocal-polar (RP) transform; Homography matrix; Fundamental matrix; Metrology; Focus of expansion (FOE); Uncalibrated image BibRef

Zeng, H.[Hui], Deng, X.M.[Xiao-Ming], Hu, Z.Y.[Zhan-Yi],
A new normalized method on line-based homography estimation,
PRL(29), No. 9, 1 July 2008, pp. 1236-1244.
WWW Link. 0711
Point-based homography estimation; Line-based homography estimation; Visual metrology; Data normalization BibRef

Luhmann, T.[Thomas],
Close range photogrammetry for industrial applications,
PandRS(65), No. 6, November 2010, pp. 558-569.
Elsevier DOI 1101
Close range; Metrology; Sensors; Accuracy BibRef

Srihari, S.N.,
Computing the scene of a crime,
Spectrum(47), No. 12, December 2010, pp. 38-43.
IEEE DOI 1101
BibRef

Kim, J., Han, Y., Hahn, H.,
Embedded implementation of image-based water-level measurement system,
IET-CV(5), No. 2, 2011, pp. 125-133.
DOI Link 1103
BibRef

Boehm, J.[Jan],
Accuracy Investigation for Structured-light Based Consumer 3D Sensors,
PFG(2014), No. 2, April 2014, pp. 117-127.
DOI Link 1405
BibRef
Earlier:
Natural User Interface Sensors for Human Body Measurement,
ISPRS12(XXXIX-B3:531-536).
DOI Link 1209
BibRef

Crosetto, M.[Michele], Monserrat, O.[Oriol], Cuevas-González, M.[María], Devanthéry, N.[Núria], Luzi, G.[Guido], Crippa, B.[Bruno],
Measuring thermal expansion using X-band persistent scatterer interferometry,
PandRS(100), No. 1, 2015, pp. 84-91.
Elsevier DOI 1502
Thermal expansion BibRef

Li, W.M.[Wei-Min], Li, Y.[Yan],
Portable monocular light pen vision measurement system,
JOSA-A(32), No. 2, February 2015, pp. 238-247.
DOI Link 1502
Instrumentation, measurement, and metrology BibRef

Wang, Q.[Qian], Sohn, H.[Hoon], Cheng, J.C.P.[Jack C.P.],
Development of a mixed pixel filter for improved dimension estimation using AMCW laser scanner,
PandRS(119), No. 1, 2016, pp. 246-258.
Elsevier DOI 1610
Mixed pixel filter. Depth estimation. BibRef

Carpio, A., Dimiduk, T.G., Rapún, M.L., Selgas, V.,
Noninvasive Imaging of Three-Dimensional Micro and Nanostructures by Topological Methods,
SIIMS(9), No. 3, 2016, pp. 1324-1354.
DOI Link 1610
one beam of visible light of a single wavelength. 10nm objects. BibRef


Sun, Z.H.[Zhi-Hai],
Experiment design of machine vision measurement based on set algebra theory for discrete mathematics course,
ICIVC17(688-692)
IEEE DOI 1708
MATLAB, Set theory, discrete mathematics, experimental design, machine vision, matlab, set, algebra BibRef

Ding, S.W.[Shao-Wen], Zhang, X.H.[Xiao-Hu], Chen, H.[Hao], Wang, J.[Jie],
Large scale object's measurement method research based on multi-view Reconstruction,
ICIVC17(555-558)
IEEE DOI 1708
Calibration, Cameras, Image reconstruction, Optical variables measurement, Shape measurement, Size measurement, Three-dimensional displays, large scale object measurement, multi-view reconstruction, point, cloud BibRef

Raaj, Y.[Yaadhav], Nair, S.[Suraj], Knoll, A.[Alois],
Precise Measurement of Cargo Boxes for Gantry Robot Palletization in Large Scale Workspaces Using Low-Cost RGB-D Sensors,
ACCV16(IV: 472-486).
Springer DOI 1704
BibRef

Roberts, A., Browne, W.N., Hollitt, C.,
Accurate marker based distance measurement with single camera,
ICVNZ15(1-6)
IEEE DOI 1701
cameras BibRef

Thomaz, L.A., da Silva, A.F., da Silva, E.A.B., Netto, S.L., Castro, A.M., Pereira, J.O., Secchi, A.R.,
A morphological approach to the automatic detection of dark fringes applied to birefringence images,
ICIP16(739-743)
IEEE DOI 1610
Image segmentation BibRef

Guo, X., Chen, Y., Wang, C., Cheng, M., Wen, C., Yu, J.,
Automatic Shape-based Target Extraction For Close-range Photogrammetry,
ISPRS16(B1: 583-587).
DOI Link 1610
BibRef

Nocerino, E., Menna, F., Remondino, F., Beraldin, J.A., Cournoyer, L., Reain, G.,
Experiments On Calibrating Tilt-shift Lenses For Close-range Photogrammetry,
ISPRS16(B5: 99-105).
DOI Link 1610
BibRef

Reznicek, J., Luhmann, T., Jepping, C.,
Influence Of Raw Image Preprocessing And Other Selected Processes On Accuracy Of Close-range Photogrammetric Systems According To Vdi 2634,
ISPRS16(B5: 107-113).
DOI Link 1610
BibRef

Bösemann, W.[Werner],
Industrial Photogrammetry: Accepted Metrology Tool Or Exotic Niche,
ISPRS16(B5: 15-24).
DOI Link 1610
BibRef

Corcoran, H.C., Brown, S.B., Robson, S., Speller, R.D., McCarthy, M.B.,
Observations On The Performance Of X-ray Computed Tomography For Dimensional Metrology,
ISPRS16(B5: 25-31).
DOI Link 1610
BibRef

Savicheva, S.V.,
Recognition of Single and Overlay of Objects on a Conveyor Belt,
PTVSBB15(95-99).
DOI Link 1508
BibRef

Miglani, A., Roy, S.D., Chaudhury, S., Srivastava, J.B.,
Complete visual metrology using relative affine structure,
NCVPRIPG13(1-4)
IEEE DOI 1408
computer vision BibRef

Lloyd, R.[Ryan], McCloskey, S.[Scott],
Recognition of 3D package shapes for single camera metrology,
WACV14(99-106)
IEEE DOI 1406
Accuracy BibRef

Wang, C.H., Mills, J.P., Miller, P.E.,
Automated Low-cost Photogrammetry for Flexible Structure Monitoring,
ISPRS12(XXXIX-B5:393-398).
DOI Link 1209
Structure deformation. BibRef

Molnár, B., Toth, C.K., Detrekoi, A.,
Accuracy Test of Microsoft Kinect for Human Morphologic Measurements,
ISPRS12(XXXIX-B3:543-547).
DOI Link 1209
BibRef

Stamatopoulos, C., Fraser, C.S., Cronk, S.,
Accuracy Aspects of Utilizing Raw Imagery In Photogrammetric Measurement,
ISPRS12(XXXIX-B5:387-392).
DOI Link 1209
BibRef

Mata, E., Hernandez, M.A., Cardenal, J., Perez, J.L.,
Assisted Control Point Measurement for Close Range Photogrammetry.,
ISPRS12(XXXIX-B5:369-373).
DOI Link 1209
BibRef

Mostofi, N., Samadzadegan, F., Roohy, S., Nozari, M.,
Using Vision Metrology System for Quality Control In Automotive Industries,
ISPRS12(XXXIX-B5:33-37).
DOI Link 1209
BibRef

Acar, U., Bayram, B., Cetin, H.I., Sanli, F.B.,
Determining The Technical Standards of Ping Pong Table By Using Close Range Photogrammetry,
ISPRS12(XXXIX-B5:1-4).
DOI Link 1209
BibRef

Detchev, I., Habib, A., El-Badry, M.,
Image-based Deformation Monitoring Of Statically And Dynamically Loaded Beams,
ISPRS12(XXXIX-B1:103-108).
DOI Link 1209
Detailed visual measurements. BibRef

Hu, W.C.[Wen-Chuan], Qiu, Z.R.[Zu-Rong], Zhang, G.X.[Guo-Xiong],
Application of particle filter in high accuracy geometry measurement,
IASP11(561-567).
IEEE DOI 1112
BibRef

Ruther, M.[Matthias], Lenz, M.[Martin], Bischof, H.[Horst],
mu-Nect: On using a gaming RGBD camera in micro-metrology applications,
PROCAMS11(52-59).
IEEE DOI 1106
Award, PROCAMS, HM. See also Microscopic shape from focus with optimal illumination. BibRef

Scoleri, T.[Tony],
Video Metrology without the Image-to-Ground Homography,
DICTA10(335-342).
IEEE DOI 1012
BibRef

Amini, A.S.[Amir Shahrokh], Seresht, M.S.[Mohammad Saadat], Varshosaz, M.[Masood],
Optimum selection of images in industrial photogrammetry using fuzzy computation,
PCVIA10(B:110).
PDF File. 1009
BibRef

Peng, K.[Kun], Hou, L.[Lulu], Ren, R.[Ren], Ying, X.H.[Xiang-Hua], Zha, H.B.[Hong-Bin],
Single View Metrology Along Orthogonal Directions,
ICPR10(1658-1661).
IEEE DOI 1008
BibRef

Martín-Rodríguez, F.[Fernando], Vázquez-Fernández, E.[Esteban], Dacal-Nieto, Á.[Ángel], Formella, A.[Arno], Álvarez-Valado, V.[Víctor], González-Jorge, H.[Higinio],
Digital Instrumentation Calibration Using Computer Vision,
ICIAR10(II: 335-344).
Springer DOI 1006
BibRef

Lu, J.X.[Jian-Xia], Zhao, Q.J.[Qi-Jie],
Image Processing-Based Crystal Diameter Detection for Czochralski Method,
CISP09(1-4).
IEEE DOI 0910
BibRef

Wang, X.Z.[Xuan-Ze], Cao, H.D.[Hong-Duan], Zhai, Z.S.[Zhong-Sheng],
Measurement of Two-Dimensional Small Angles Based on Interference Fringes,
CISP09(1-5).
IEEE DOI 0910
BibRef

Xu, F.L.[Feng-Liang], Chen, K.[Keshan],
Measurement System of the Simulated Missile-Target Encounter Based on CCD Imaging,
CISP09(1-5).
IEEE DOI 0910
BibRef

Zhang, H.[Hong], Wang, L.[Lei], Jia, R.M.[Rui-Ming], Li, J.W.[Jun-Wei],
A Distance Measuring Method Using Visual Image Processing,
CISP09(1-5).
IEEE DOI 0910
BibRef

d'Amelio, S., Lo Brutto, M.,
Close range photogrammetry for measurement of the paintings surface deformations,
3DARCH09(xx-yy).
PDF File. 0902
BibRef

Deng, X.M.[Xiao-Ming], Wu, F.C.[Fu-Chao], Wu, Y.H.[Yi-Hong], Duan, F.Q.[Fu-Qing],
Visual metrology with uncalibrated radial distorted images,
ICPR08(1-4).
IEEE DOI 0812
BibRef

Duran, Z., Aydar, U.,
Measurement and 3D Modelling of an Ancient Measuring Device: Nippur Cubit Rod,
ISPRS08(B5: 265 ff).
PDF File. 0807
BibRef

Yanagi, H.[Hideharu], Chikatsu, H.[Hirofumi],
Performance Evaluation Of 3d Modeling Software For UAV Photogrammetry,
ISPRS16(B5: 147-152).
DOI Link 1610
BibRef
Earlier:
3d Modeling Of Small Objects Using Macro Lens In Digital Very Close Range Photogrammetry,
CloseRange10(xx-yy).
PDF File. 1006
BibRef

Yanagi, H.[Hideharu], Honma, Y.[Yuichi], Chikatsu, H.[Hirofumi],
Performance Evaluations of Macro Lens for Digital Documentation of Small Objects,
ISPRS08(B5: 159 ff).
PDF File. 0807
BibRef

Ji, Z.[Zheng], Wu, Y.[Yuan], Sheng, Q.[QingHong],
Automatic Reconstruction for Small Archeology Based on Close-Range Photogrammetry,
ISPRS08(B5: 165 ff).
PDF File. 0807
BibRef

Yu, Q.F.[Qi-Feng], Jiang, G.W.[Guang-Wen], Fu, S.H.[Si-Hua], Shang, Y.[Yang], Liang, Y.H.[Yong-Hui], Li, L.C.[Li-Chun],
Broken-Ray Videometric Method and System for Measuring the Three-Dimensional Position and Pose of the Non-Intervisible Object,
ISPRS08(B5: 145 ff).
PDF File. 0807
BibRef

Zheng, S.Y.[Shun-Yi], Wang, R.R.[Rui-Rui], Chen, C.J.[Chang-Jun], Zhang, Z.X.[Zu-Xun],
3D Measurement and Modeling Based on Stereo-Camera,
ISPRS08(B5: 57 ff).
PDF File. 0807
BibRef

Zheng, L.[Li], Zhang, J.Q.[Jiang-Qing], Luo, Y.J.[Yue-Jun],
Acquiring Initial Value of Multi-View Metrical Data Integration,
ISPRS08(B3b: 741 ff).
PDF File. 0807
BibRef

Mendonca, P.R.S.[Paulo R. S.], Kaucic, R.[Robert],
Single View Metrology: A Practical Example,
WACV08(1-8).
IEEE DOI 0801
BibRef

Ravindran, P., Ferrier, N.J., Park, S.M., Nealey, P.F.,
Image Based Metrology for Quantitative Analysis of Local Structural Similarity of Nanostructures,
ICIP07(IV: 329-332).
IEEE DOI 0709
BibRef

Jiang, Z.D.[Zhong-Ding], Jiang, N.[Nan], Wang, Y.J.[Yi-Jie], Zang, B.Y.[Bin-Yu],
Distance Measurement in Panorama,
ICIP07(VI: 393-396).
IEEE DOI 0709
BibRef

Biskup, K., Arias, P., Lorenzo, H., Armesto, J.,
Application of Terrestrial Laser Scanning for Shipbuilding,
Laser07(56).
PDF File. 0709
BibRef

Fernandes, L.A.F.[Leandro A.F.], Oliveira, M.M.[Manuel M.],
A scanner for computing box dimensions in real time,
SigGraph06(Article 128).
WWW Link. From perspective projection. BibRef 0600

Koh, T.K.[Tze Ki], Miles, N.[Nicholas], Morgan, S.[Steve], Hayes-Gill, B.[Barrie],
Image Segmentation of Overlapping Particles in Automatic Size Analysis Using Multi-Flash Imaging,
WACV07(47-47).
IEEE DOI 0702
BibRef

Cheng, S., Luo, X., Bhandarkar, S.M., Fan, J., Zhao, Y.,
Video-based Metrology of Water Droplet Spreading on Nanostructured Surfaces,
WACV07(16-16).
IEEE DOI 0702
BibRef

Reiterer, A.,
A semi-automatic image-based measurement system,
IEVM06(xx-yy).
PDF File. 0609
BibRef

Wang, W.X.[Wei-Xing],
Online Aggregate Particle Size Measurement on A Conveyor Belt,
ICPR06(III: 1032-1035).
IEEE DOI 0609
BibRef

Yachide, Y., Oike, Y., Ikeda, M., Asada, K.,
Real-Time 3-D Measurement System Based on Light-Section Method Using Smart Image Sensor,
ICIP05(III: 1008-1011).
IEEE DOI 0512
BibRef

Cao, X., Foroosh, H.,
Metrology from Vertical Objects,
BMVC04(xx-yy).
HTML Version. 0508
BibRef

Tsui, P.T.[Ping Tim], Tsui, H.T.[Hung Tung], Cham, W.K.[Wai Kuen],
Metric measurement on arbitrary planes in 2 images using the conformal point,
ICPR04(I: 108-111).
IEEE DOI 0409
BibRef

Wang, G.H.[Guang-Hui], Wu, Y.H.[Yi-Hong], Hu, Z.Y.[Zhan-Yi],
A novel approach for single view based plane metrology,
ICPR02(II: 556-559).
IEEE DOI 0211
BibRef

Hoffman, D.D.[Donald D.],
Mereology of Visual Form,
VF01(40 ff.).
Springer DOI 0209
BibRef

Shiranita, K., Hayashi, K., Otsubo, A., Takiyama, R.,
Shape Measurement and Sketching Systems for Porcelain Using Image Technology,
ICPR00(Vol IV: 795-798).
IEEE DOI 0009
BibRef

Brenner, C.[Claus], Boehm, J.[Jan], Goehring, J.[Jens],
An Experimentical Measurement System for Industrial Inspection of 3D Parts,
SPIE(3521), 1998, pp. 237-247. industrial inspection, range images, object recognition, CAD. BibRef 9800

Saitoh, N.[Naoki], Kurosawa, K.[Kenji], Kuroki, K.[Kenro],
A Study on Height Measurement from a Single View,
ICIP99(III:523-526).
IEEE DOI BibRef 9900

Gajdamowicz, K.,
Determination of the Accuracy of Automated Measurements Performed on Georeferenced Images Acquired by Mobile Mapping System,
ISPRSGIS99(35-40). BibRef 9900

Lilienblum, T., Albrecht, P., Michaelis, B.,
3D-Measurement of Geometrical Shapes by Photogrammetry and Neural Networks,
ICPR96(IV: 330-334).
IEEE DOI 9608
(Otto-von-Guericke Univ., D) BibRef

Pandit, S.M., Guo, R.,
Shape mensuration and recognition by DDS approach,
ICIP95(III: 49-52).
IEEE DOI 9510
BibRef

Modayur, B.R., Shapiro, L.G., and Haralick, R.M.,
Visual Inspection of Machined Parts,
CVPR92(393-398).
IEEE DOI Inspection by measurement. BibRef 9200

Robinson, M.J., Oakley, J.P.,
Measuring Geometrical Parameters of Involute Spur Gears to Sub-pixel Resolution,
BMVC92(xx-yy).
PDF File. 9209
BibRef

Chapter on Implementations and Applications, Databases, QBIC, Video Analysis, Hardware and Software, Inspection continues in
Recognition Systems Applied to Specific Applications .


Last update:Nov 18, 2017 at 20:56:18