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1901
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1809
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Microscopic image enhancement of Chinese Herbal Medicine based on
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1708
Electron microscopy, Feature extraction, Finite element analysis,
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1701
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Automatic Detection and Segmentation of Exosomes in Transmission
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1611
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Learning-based approach to boost detection rate and localisation
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ICIP16(3184-3188)
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1610
Diffraction
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ICIP16(3161-3165)
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1610
Biological system modeling
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Retrieving the parameters of cryo Electron Microscopy dataset in the
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1402
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cryo electron microscopy
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1507
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Egelman, E.H.[Edward H.],
New advances in imaging polymers at near-atomic resolution,
ICIP14(2071-2074)
IEEE DOI
1502
Detectors
BibRef
Wang, Y.F.[Yun-Feng],
Kilpatrick, J.I.[Jason I.],
Jarvis, S.P.[Suzanne P.],
Boland, F.[Frank],
Kokaram, A.[Anil],
Corrigan, D.[David],
Automated registration of low and high resolution atomic force
microscopy images using scale invariant features,
ICIP14(5866-5870)
IEEE DOI
1502
Atomic force microscopy
BibRef
Le Guen, V.[Vincent],
Paul, N.[Nicolas],
A Scanning Electron Microscope image segmentation method for steam
generator fouling rate estimation,
ICIP14(4447-4451)
IEEE DOI
1502
Clustering algorithms
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Thierry, R.[Raphael],
Kirschmann, M.[Moritz],
Hummel, E.[Eric],
Hawes, C.[Chris],
Genoud, C.[Christel],
Demon registration for 3D images obtained by serial block face
scanning electron microscopy,
ICIP14(3587-3591)
IEEE DOI
1502
Algorithm design and analysis
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Nam, D.[David],
Mantell, J.[Judith],
Hodgson, L.[Lorna],
Bull, D.R.[David R.],
Verkade, P.[Paul],
Achim, A.[Alin],
Feature-based registration for correlative light and electron
microscopy images,
ICIP14(3567-3571)
IEEE DOI
1502
Image registration
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Sorzano, C.O.S.,
Vargas, J.,
Oton, J.,
Abrishami, V.,
de la Rosa-Trevin, J.M.,
del Riego, S.,
Fernandez-Alderete, A.,
Martinez-Rey, C.,
Marabini, R.,
Carazo, J.M.,
An image processing approach to the simulation of electron microscopy
volumes of atomic structures,
ICIP14(2095-2099)
IEEE DOI
1502
Atomic clocks
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Jin, Q.[Qiyu],
Sorzano, C.O.S.[Carlos Oscar Sanchez],
Callebaut, I.[Isabelle],
Tama, F.[Florence],
Jonic, S.[Slavica],
Elastic image registration to fully explore macromolecular dynamics
by electron microscopy,
ICIP14(2075-2079)
IEEE DOI
1502
Assembly
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Tafti, A.P.[A. Pahlavan],
Kirkpatrick, A.B.,
Owen, H.A.,
Yu, Z.,
3D Microscopy Vision Using Multiple View Geometry and Differential
Evolutionary Approaches,
ISVC14(II: 141-152).
Springer DOI
1501
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Roels, J.[Joris],
Aelterman, J.[Jan],
de Vylder, J.[Jonas],
Luong, H.[Hiep],
Saeys, Y.[Yvan],
Lippens, S.[Saskia],
Philips, W.[Wilfried],
Noise Analysis and Removal in 3D Electron Microscopy,
ISVC14(I: 31-40).
Springer DOI
1501
BibRef
Iwahori, Y.[Yuji],
Funahashi, K.[Kenji],
Woodham, R.J.[Robert J.],
Bhuyan, M.K.,
Neural Network Based Image Modification for Shape from Observed SEM
Images,
ICPR14(2131-2136)
IEEE DOI
1412
Scanning Electron Microscope.
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Azadi, S.[Samaneh],
Maitin-Shepard, J.[Jeremy],
Abbeel, P.[Pieter],
Optimization-Based Artifact Correction for Electron Microscopy Image
Stacks,
ECCV14(II: 219-235).
Springer DOI
1408
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Lee, H.G.[Hyun-Gyu],
Choi, M.K.[Min-Kook],
Lee, S.C.[Sang-Chul],
Grain-oriented segmentation of scanning electron microscope images,
ICIP13(4029-4033)
IEEE DOI
1402
Nanostructures;Ti foil;anodization;grain structure;image segmentation
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Yang, H.F.[Huei-Fang],
Choe, Y.[Yoonsuck],
An Interactive Editing Framework for Electron Microscopy Image
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ISVC11(I: 400-409).
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1109
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Papa, J.P.[João P.],
Pereira, C.R.[Clayton R.],
de Albuquerque, V.H.C.[Victor H.C.],
Silva, C.C.[Cleiton C.],
Falcão, A.X.[Alexandre X.],
Tavares, J.M.R.S.[João Manuel R.S.],
Precipitates Segmentation from Scanning Electron Microscope Images
through Machine Learning Techniques,
IWCIA11(456-468).
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1105
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Veeraraghavan, A.[Ashok],
Genkin, Alex.V.,
Vitaladevuni, S.[Shiv],
Scheffer, L.[Lou],
Xu, S.[Shan],
Hess, H.[Harald],
Fetter, R.[Richard],
Cantoni, M.[Marco],
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CVPR10(1767-1774).
IEEE DOI Video of talk:
WWW Link.
1006
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Kim, D.S.[Dong Sik],
Intensity compensation of the mitochondria tilted image sequence
obtained from the transmission electron microscopy,
ICIP09(1777-1780).
IEEE DOI
0911
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Mendizibal, A.,
Cabrera, J.,
Salgado, L.,
Garcia, N.,
Gonzalez, J.C.,
Unsupervised segmentation algorithm of HRTEM images,
ICIP04(IV: 2757-2760).
IEEE DOI
0505
high resolution transmission electron microscopy.
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Bilbao-Castro, J.R.,
Carazo, J.M.,
Garcia, L.,
Fernandez, J.J.,
Parallel iterative reconstruction methods for structure determination
of biological specimens by electron microscopy,
ICIP03(I: 565-568).
IEEE DOI
0312
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Barcucci, E.,
Del Lungol, A.,
Nivat, M.,
Pinzani, R.,
Zurli, A.,
Reconstructing digital sets from X-rays,
CIAP97(I: 166-173).
Springer DOI
9709
tomography, 3D chrystals from 2D electron microscope images.
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Skoglund, U.,
Ofverstedt, L.G.,
Image 3-D Reconstruction from Electron Micrographs,
SSAB97(Medical)
9703
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Saad, A.,
Chiu, W.,
Thuman-Commike, P.A.,
Multiresolution approach to automatic detection of spherical particles
from electron cryomicroscopy images,
ICIP98(III: 846-850).
IEEE DOI
9810
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van Dyck, D.,
Op de Beeck, M.,
How image processing can push electron microscopy to its limits,
ICIP95(III: 41-44).
IEEE DOI
9510
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van Dyck, D.,
Op de Beeck, M.,
Tang, D.,
Jansen, J.,
Zandbergen, H.W.,
A global entropy criterion for focus tuning in exit wavefunction
reconstruction in high resolution electron microscopy,
ICIP96(I: 737-740).
IEEE DOI
9610
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van Dyck, D.,
Op de Beeck, M.,
Coene, W.,
Object wavefunction reconstruction in high resolution electron
microscopy,
ICIP94(III: 295-298).
IEEE DOI
9411
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Cop, M.,
Dengler, J.,
A multiresolution approach to the 3D reconstruction of a 50S ribosome
from an EM-tilt series solving the alignment problem without gold
particles,
ICPR90(I: 733-737).
IEEE DOI
9006
electron microscopy
BibRef
Chapter on Computational Vision, Regularization, Connectionist, Morphology, Scale-Space, Perceptual Grouping, Wavelets, Color, Sensors, Optical, Laser, Radar continues in
Phase Unwrapping, Stereo Depth unwrapping .