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Scanning electron microscopy, Optical imaging, Strain,
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Feature extraction, Synapses, Task analysis, Logic gates,
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2201
Materials science and technology, Image analysis, Data analysis,
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2202
Proteins, Training, Image segmentation,
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2205
Signal to noise ratio, Noise measurement, Autocorrelation,
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Unsupervised Domain Alignment Based Open Set Structural Recognition
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2201
Deep learning, Image recognition, Systematics, Image analysis,
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IEEE DOI
2201
Image registration, Scanning electron microscopy, Neurites,
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Fan, Y.F.[Yi-Feng],
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Cryo-Electron Microscopy Image Denoising Using Multi-Frequency Vector
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ICIP21(3463-3467)
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2201
Interpolation, Noise reduction, Signal processing algorithms,
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Peng, M.[Minxu],
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Robustness of Time-Resolved Measurement to Unknown and Variable Beam
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IEEE DOI
2201
Scanning electron microscopy, Particle beams, Correlation,
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Friedrich, T.[Thomas],
Yu, C.P.[Chu-Ping],
Verbeek, J.[Johan],
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Phase Retrieval from 4-Dimensional Electron Diffraction Datasets,
ICIP21(3453-3457)
IEEE DOI
2201
Training, Electric potential, Sensitivity,
Convolutional neural networks, Electron microscopy, CBED
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Iyer, A.[Abhiram],
Donegan, S.[Sean],
de Graef, M.[Marc],
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Plug-And-Play Image Reconstruction Meets Stochastic Variance-Reduced
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ICIP21(2868-2872)
IEEE DOI
2201
Gradient methods, Image coding, Runtime, Superresolution,
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Nashed, Y.S.G.[Youssef S. G.],
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CryoPoseNet: End-to-End Simultaneous Learning of Single-particle
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LCI21(4049-4059)
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2112
Solid modeling, Image resolution,
Pose estimation, Pipelines, Computer architecture, Decoding
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Total Deep Variation for Noisy Exit Wave Reconstruction in Transmission
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2106
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Khadangi, A.[Afshin],
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ICPR21(31-38)
IEEE DOI
2105
Deep learning, Measurement, Training, Image segmentation,
Scanning electron microscopy,
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Singla, A.[Aayush],
Lippmann, B.[Bernhard],
Graeb, H.[Helmut],
Recovery of 2D and 3D Layout Information through an Advanced Image
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ICPR21(3860-3867)
IEEE DOI
2105
Scanning electron microscopy,
Semiconductor devices, Layout, Software algorithms,
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Sinha, A.[Ashish],
Suresh, K.S.,
Deep Learning Based Dimple Segmentation for Quantitative Fractography,
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2103
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Ghosh, A.,
Chaudhry, R.,
Rajwade, A.,
AB Initio Tomography With Object Heterogeneity and Unknown Viewing
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ICIP19(1257-1261)
IEEE DOI
1910
Cryo-electron microscopy, Heterogeneity, Tomography, Ab initio reconstruction
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Quan, T.M.,
Hildebrand, D.G.C.,
Lee, K.,
Thomas, L.A.,
Kuan, A.T.,
Lee, W.A.,
Jeong, W.,
Removing Imaging Artifacts in Electron Microscopy using an
Asymmetrically Cyclic Adversarial Network without Paired Training
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CLI19(3804-3813)
IEEE DOI
2004
electron microscopy, image denoising,
learning (artificial intelligence), medical image processing, GAN
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Min, S.B.[Shao-Bo],
Chen, X.J.[Xue-Jin],
Xie, H.T.[Hong-Tao],
Zha, Z.J.[Zheng-Jun],
Bi, G.Q.[Guo-Qiang],
Wu, F.[Feng],
Zhang, Y.D.[Yong-Dong],
Accurate Segmentation of Synaptic Cleft with Contour Growing
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ICIP19(1420-1424)
IEEE DOI
1910
Analyze the macromolecular complexes related to neurotransmitter transmission.
High noise. Electron micrographs.
Synaptic cleft, fully convolutional networks, active contours,
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Sgallari, F.[Fiorella],
A Non-convex Nonseparable Approach to Single-Molecule Localization
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Springer DOI
1909
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Frangakis, A.S.[Achilleas S.],
Hough Based Evolutions for Enhancing Structures in 3D Electron
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CAIP19(I:102-112).
Springer DOI
1909
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Molina-Abril, H.[Helena],
Diaz del Rio, F.[Fernando],
Guerrero-Lebrero, M.P.[Maria P.],
Real, P.[Pedro],
Barcena, G.[Guillermo],
Braza, V.[Veronica],
Guerrero, E.[Elisa],
Gonzalez, D.[David],
Galindo, P.L.[Pedro L.],
Topological Homogeneity for Electron Microscopy Images,
CTIC19(166-178).
Springer DOI
1901
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Michels, Y.,
Baudrier, E.,
Mazo, L.,
Radial Function Based Ab-Initio Tomographic Reconstruction for Cryo
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ICIP18(1178-1182)
IEEE DOI
1809
Image reconstruction, Signal to noise ratio,
Reconstruction algorithms,
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Anoshina, N.A.,
Krylov, A.S.,
Sorokin, D.V.,
Correlation-based 2D registration method for single particle cryo-EM
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IPTA17(1-6)
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1804
electron microscopy, image reconstruction, image registration,
image resolution, iterative methods, 2D registration method, EMDB,
cryo-electron microscopy
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Pape, C.[Constantin],
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Chapter on Computational Vision, Regularization, Connectionist, Morphology, Scale-Space, Perceptual Grouping, Wavelets, Color, Sensors, Optical, Laser, Radar continues in
Phase Unwrapping, Stereo Depth unwrapping .