Matson, W.L.[William L.],
McKinstry, H.A.,
Johnson, Jr., G.G.,
White, E.W.,
McMillan, R.E.,
Computer processing of SEM images by contour analyses,
PR(2), No. 4, December 1970, pp. 303-306.
Elsevier DOI
0309
scanning electron microscope images.
BibRef
Sandler, S.S.[Sheldon S.],
Direct three-dimensional analysis of electron micrograph pictures,
PR(4), No. 4, December 1972, pp. 353-359.
Elsevier DOI
0309
The method consists of presenting a unique relation between the
projection pictures and the original densities.
BibRef
Kriete, A.,
Haucke, M.,
Gerlach, B.,
Harms, H.,
Aus, H.M.,
A Preprocessing Method for the Contrast Enhancement of
TV-Scanned Electron Microscopic Images,
PR(17), No. 3, 1984, pp. 305-311.
Elsevier DOI
BibRef
8400
White, E.W.,
Mayberry, K.,
Johnson, Jr., G.G.,
Computer analysis of multi-channel SEM and X-ray images from fine
particles,
PR(4), No. 2, May 1972, pp. 173-192.
Elsevier DOI
0309
Scanning electron microscope
BibRef
Favre, A.,
Keller, H.,
Local image transformation: An application in biological electron
microscopy,
PR(13), No. 2, 1981, pp. 177-187.
Elsevier DOI
0309
BibRef
Phillips, T.Y.[Tsai-Yun],
Davis, L.S.[Larry S.],
Rosenfeld, A.[Azriel],
Automatic Segmentation of Electron Micrographs of Berea Sandstone
Cross-Sections,
PR(16), No. 4, 1983, pp. 385-400.
Elsevier DOI
0309
BibRef
Kriete, A.,
Aus, H.M.,
On-Line Processing of Transmission Electron Microscopic Images,
PRL(4), 1986, pp. 285-292.
BibRef
8600
Selfridge, P.G.[Peter G.],
Locating Neuron Boundaries in Electron
Micrograph Images Using 'Primal Sketch' Primitives,
CVGIP(34), No. 2, May 1986, pp. 156-165.
Elsevier DOI
BibRef
8605
And:
Tracing Neurons Through Serial Sections: Using Knowledge of Shape
to Improve Performance,
CVPR86(418-420).
Shows that iso-intensity contours do not work, but does not mention
other edge techniques. Use edges, search techniques, and prediction
of position.
BibRef
Zapata, E.L.,
Benavides, I.,
Rivera, F.F.,
Bruguera, J.D.,
Pena, T.F.,
Carazo, J.M.,
Image reconstruction on hypercube computers:
Application to electron microscopy,
SP(27), No. 1, 1992, pp. 51-64.
BibRef
9200
Ong, S.H.,
Giam, S.T.,
Jayasooriah,
Sinniah, R.,
Adaptive window-based tracking for the detection of membrane structures
in kidney electron micrographs,
MVA(6), No. 4, 1993, pp. 215-223.
BibRef
9300
Vrhel, M.J.,
Unser, M.,
Multichannel Restoration with Limited A Priori Information,
IP(8), No. 4, April 1999, pp. 527-536.
IEEE DOI electron microscopy of biological macromolecules
BibRef
9904
Vrhel, M.J.,
Trus, B.L.,
Multi-channel restoration of electron micrographs,
ICIP95(II: 516-519).
IEEE DOI
9510
BibRef
Kayaalp, A.,
Rao, A.R.[A. Ravishankar],
Jain, R.,
Scanning Electron Microscope-Based Stereo Analysis,
MVA(3), No. 4, 1990, pp. 231-246.
BibRef
9000
Earlier:
CVPR89(429-434).
IEEE DOI
BibRef
Herman, G.T.[Gabor T.],
Marabini, R.[Roberto],
Carazo, J.M.[José-María],
Garduño, E.[Edgar],
Lewitt, R.M.[Robert M.],
Matej, S.[Samuel],
Image processing approaches to biological three-dimensional electron
microscopy,
IJIST(11), No. 1, 2000, pp. 12-29.
0005
BibRef
Marabini, R.,
Sorzano, C.O.S.,
Matej, S.,
Fernandez, J.J.,
Carazo, J.M.,
Herman, G.T.,
3-D Reconstruction of 2-D Crystals in Real Space,
IP(13), No. 4, April 2004, pp. 549-561.
IEEE DOI
0404
BibRef
And:
Corrections:
IP(13), No. 8, August 2004, pp. 1157-1157.
IEEE DOI
BibRef
Ruiz, V.G.,
Fernández, J.J.,
López, M.F.,
García, I.,
Progressive Image Transmission in Telemicroscopy: A Quantitative
Approach for Electron Microscopy Images of Biological Specimens,
RealTimeImg(8), No. 6, December 2002, pp. 519-544.
DOI Link
0304
BibRef
Pattichis, M.S.,
Pattichis, C.S.,
Avraam, M.,
Bovik, A.C.,
Kyriacou, K.,
AM-FM texture segmentation in electron microscopic muscle imaging,
MedImg(19), No. 12, December 2000, pp. 1253-1257.
IEEE Top Reference.
0110
BibRef
Sorzano, C.O.S.,
Marabini, R.,
Herman, G.T.,
Carazo, J.M.,
Multiobjective algorithm parameter optimization using multivariate
statistics in three-dimensional electron microscopy reconstruction,
PR(38), No. 12, December 2005, pp. 2587-2601.
Elsevier DOI
0510
BibRef
Salzenstein, F.[Fabien],
Montgomery, P.C.[Paul C.],
Montaner, D.[Denis],
Boudraa, A.O.[Abdel-Ouahab],
Teager-Kaiser Energy and Higher-Order Operators in White-Light
Interference Microscopy for Surface Shape Measurement,
JASP(2005), No. 17, 2005, pp. 2804-2815.
WWW Link.
0603
BibRef
Sorzano, C.O.S.[Carlos O. S.],
Velazquez-Muriel, J.A.,
Marabini, R.,
Herman, G.T.,
Carazo, J.M.[José María],
Volumetric restrictions in single particle 3DEM reconstruction,
PR(41), No. 2, February 2008, pp. 616-626.
Elsevier DOI
0711
Tomography, Constrained reconstruction, Electron microscopy, Single particles
BibRef
Lee, S.H.[Seung-Hee],
Doerschuk, P.C.,
Johnson, J.E.,
Multiclass Maximum-Likelihood Symmetry Determination and Motif
Reconstruction of 3-D Helical Objects From Projection Images for
Electron Microscopy,
IP(20), No. 7, July 2011, pp. 1962-1976.
IEEE DOI
1107
BibRef
Prust, C.J.,
Doerschuk, P.C.,
Johnson, J.E.,
3-D Reconstructions of Tailed Bacteriophages from CYRO Electron
Microscopy Images,
ICIP06(917-920).
IEEE DOI
0610
BibRef
Hermann, G.[Gilles],
Coudray, N.[Nicolas],
Buessler, J.L.[Jean-Luc],
Caujolle-Bert, D.[Daniel],
Rémigy, H.W.[Hervé-William],
Urban, J.P.[Jean-Philippe],
ANIMATED-TEM: a toolbox for electron microscope automation based on
image analysis,
MVA(23), No. 4, July 2012, pp. 691-711.
WWW Link.
1206
BibRef
Venkatakrishnan, S.V.,
Drummy, L.F.,
Jackson, M.A.,
de Graef, M.,
Simmons, J.,
Bouman, C.A.,
A Model Based Iterative Reconstruction Algorithm For High Angle
Annular Dark Field-Scanning Transmission Electron Microscope
(HAADF-STEM) Tomography,
IP(22), No. 11, 2013, pp. 4532-4544.
IEEE DOI
1310
biology computing
BibRef
Hu, T.,
Nunez-Iglesias, J.,
Vitaladevuni, S.,
Scheffer, L.,
Xu, S.,
Bolorizadeh, M.,
Hess, H.,
Fetter, R.,
Chklovskii, D.B.,
Electron Microscopy Reconstruction of Brain Structure Using Sparse
Representations Over Learned Dictionaries,
MedImg(32), No. 12, 2013, pp. 2179-2188.
IEEE DOI
1312
Brain
BibRef
Ito, K.[Koichi],
Suzuki, A.[Ayako],
Aoki, T.[Takafumi],
Tsuneta, R.[Ruriko],
Image-based magnification calibration for electron microscope,
MVA(25), No. 1, January 2014, pp. 185-197.
WWW Link.
1402
BibRef
Ober, R.J.,
Tahmasbi, A.,
Ram, S.,
Lin, Z.P.[Zhi-Ping],
Ward, E.S.,
Quantitative Aspects of Single-Molecule Microscopy:
Information-theoretic analysis of single-molecule data,
SPMag(32), No. 1, January 2015, pp. 58-69.
IEEE DOI
1502
image processing
BibRef
Chen, Y.H.[Yu-Hui],
Wei, D.,
Newstadt, G.,
de Graef, M.,
Simmons, J.,
Hero, A.,
Parameter Estimation in Spherical Symmetry Groups,
SPLetters(22), No. 8, August 2015, pp. 1152-1155.
IEEE DOI
1502
crystal orientation
BibRef
Jensen, K.H.,
Sigworth, F.J.,
Brandt, S.S.,
Removal of Vesicle Structures From Transmission Electron Microscope
Images,
IP(25), No. 2, February 2016, pp. 540-552.
IEEE DOI
1601
Adaptation models
BibRef
Gaddam, C.K.[Chethan K.],
Huang, C.H.[Chung-Hsuan],
Wal, R.L.V.[Randy L. Vander],
Quantification of nano-scale carbon structure by HRTEM and lattice
fringe analysis,
PRL(76), No. 1, 2016, pp. 90-97.
Elsevier DOI
1605
Lattice fringe analysis
BibRef
Chao, J.[Jerry],
Ward, E.S.[E. Sally],
Ober, R.J.[Raimund J.],
Fisher information theory for parameter estimation in single molecule
microscopy: tutorial,
JOSA-A(33), No. 7, July 2016, pp. B36-B57.
DOI Link
1608
Probability theory, stochastic processes, and statistics
BibRef
Ashok, A.[Amit],
Piestun, R.[Rafael],
Stallinga, S.[Sjoerd],
Single molecule image formation, reconstruction and processing:
introduction,
JOSA-A(33), No. 7, July 2016, pp. SMI1-SMI2.
DOI Link
1608
General, General physics
BibRef
Sheppard, C.J.R.[Colin J. R.],
Castello, M.[Marco],
Tortarolo, G.[Giorgio],
Vicidomini, G.[Giuseppe],
Diaspro, A.[Alberto],
Image formation in image scanning microscopy, including the case of
two-photon excitation,
JOSA-A(34), No. 8, August 2017, pp. 1339-1350.
DOI Link
1708
Optical transfer functions, Confocal microscopy,
Fluorescence microscopy, Scanning microscopy, Multiphoton, processes
BibRef
He, Y.C.[Yu-Chen],
Kang, S.H.[Sung Ha],
Lattice Identification and Separation: Theory and Algorithm,
SIIMS(12), No. 4, 2019, pp. 2063-2096.
DOI Link
1912
BibRef
Earlier:
Lattice Metric Space Application to Grain Defect Detection,
SSVM19(381-392).
Springer DOI
1909
Atomic scale. Not food.
BibRef
Bermúdez-Chacón, R.,
Altingövde, O.,
Becker, C.,
Salzmann, M.,
Fua, P.,
Visual Correspondences for Unsupervised Domain Adaptation on Electron
Microscopy Images,
MedImg(39), No. 4, April 2020, pp. 1256-1267.
IEEE DOI
2004
Image segmentation, Adaptation models, Visualization, Training,
Electron microscopy, Machine learning, Electron microscopy,
domain adaptation
BibRef
Qian, Y.,
Xu, J.,
Drummy, L.F.,
Ding, Y.,
Effective Super-Resolution Methods for Paired Electron Microscopic
Images,
IP(29), 2020, pp. 7317-7330.
IEEE DOI
2007
Optical imaging, Training, Electron optics, Deep learning,
Electron microscopic image, deep learning,
paired-image super-resolution
BibRef
Xie, H.,
Liang, J.,
Wang, Z.,
Liao, M.,
Li, X.,
Scanning Imaging Restoration of Moving or Dynamically Deforming
Objects,
IP(29), 2020, pp. 7290-7305.
IEEE DOI
2007
Scanning electron microscopy, Optical imaging, Strain,
Optical distortion, Image restoration, Numerical analysis,
Non-uniform blur
BibRef
Cao, Y.[Yue],
Liu, S.G.[Shi-Gang],
Peng, Y.[Yali],
Li, J.[Jun],
DenseUNet: densely connected UNet for electron microscopy image
segmentation,
IET-IPR(14), No. 12, October 2020, pp. 2682-2689.
DOI Link
2010
BibRef
Andén, J.[Joakim],
Romero, J.L.[José Luis],
Multitaper Estimation on Arbitrary Domains,
SIIMS(13), No. 3, 2020, pp. 1565-1594.
DOI Link
2010
estimating spectral densities, Electron microscope.
BibRef
Liu, Y.[Yi],
Ji, S.W.[Shui-Wang],
CleftNet: Augmented Deep Learning for Synaptic Cleft Detection From
Brain Electron Microscopy,
MedImg(40), No. 12, December 2021, pp. 3507-3518.
IEEE DOI
2112
Feature extraction, Synapses, Task analysis, Logic gates,
Deep learning, Shape, Electron microscopy,
label augmentation
BibRef
Wang, J.[Jia],
Lan, C.[Chuwen],
Wang, C.Y.[Cai-Yong],
Gao, Z.[Zehua],
Deep learning super-resolution electron microscopy based on deep
residual attention network,
IJIST(31), No. 4, 2021, pp. 2158-2169.
DOI Link
2112
attention mechanism, deep learning, electron microscope,
residual learning, super-resolution
BibRef
Kacher, J.[Josh],
Xie, Y.[Yao],
Voigt, S.P.[Sven P.],
Zhu, S.X.[Shi-Xiang],
Yuchi, H.[Henry],
Key, J.[Jordan],
Kalidindi, S.R.[Surya R.],
In Situ Transmission Electron Microscopy: Signal processing
challenges and examples,
SPMag(39), No. 1, January 2022, pp. 89-103.
IEEE DOI
2201
Materials science and technology, Image analysis, Data analysis,
Transmission electron microscopy, Statistical analysis,
Data collection
BibRef
d'Avigneau, A.M.[A. Marie],
Singh, S.S.[Sumeetpal S.],
Ober, R.J.[Raimund J.],
Limits of Accuracy for Parameter Estimation and Localization in
Single-Molecule Microscopy via Sequential Monte Carlo Methods,
SIIMS(15), No. 1, 2022, pp. 139-171.
DOI Link
2204
BibRef
Bendory, T.[Tamir],
Hadi, I.[Ido],
Sharon, N.[Nir],
Compactification of the Rigid Motions Group in Image Processing,
SIIMS(15), No. 3, 2022, pp. 1041-1078.
DOI Link
2208
BibRef
Deng, S.Y.[Shi-Yu],
Huang, W.[Wei],
Chen, C.[Chang],
Fu, X.[Xueyang],
Xiong, Z.W.[Zhi-Wei],
A Unified Deep Learning Framework for ssTEM Image Restoration,
MedImg(41), No. 12, December 2022, pp. 3734-3746.
IEEE DOI
2212
Serial section transmission electron microscopy.
Image restoration, Optical imaging, Adaptive optics,
Optical attenuators, Deep learning, Strain, Neurons, deep learning
BibRef
Bendory, T.[Tamir],
Boumal, N.[Nicolas],
Leeb, W.[William],
Levin, E.[Eitan],
Singer, A.[Amit],
Toward Single Particle Reconstruction without Particle Picking:
Breaking the Detection Limit,
SIIMS(16), No. 2, 2023, pp. 886-910.
DOI Link
2306
BibRef
Diepeveen, W.[Willem],
Lellmann, J.[Jan],
Oktem, O.[Ozan],
Schonlieb, C.B.[Carola-Bibiane],
Regularizing Orientation Estimation in Cryogenic Electron Microscopy
Three-Dimensional Map Refinement through Measure-Based Lifting over
Riemannian Manifolds,
SIIMS(16), No. 3, 2023, pp. 1440-1490.
DOI Link
2309
BibRef
Somani, A.[Ayush],
Banerjee, P.[Pragyan],
Agarwal, K.[Krishna],
Rastogi, M.[Manu],
Prasad, D.K.[Dilip K.],
Habib, A.[Anowarul],
Image Inpainting with Hypergraphs for Resolution Improvement in
Scanning Acoustic Microscopy,
DL-UIA23(3113-3122)
IEEE DOI
2309
BibRef
Panahi, F.H.[Farzad H.],
Panahi, F.H.[Fereidoun H.],
Energy-Efficient Data Collection in Molecular Nanonetworks:
An Optimization Framework,
SPLetters(31), 2024, pp. 1194-1198.
IEEE DOI
2405
Optimization, Energy efficiency, Symbols, Nanobioscience,
Resource management, Transmitters, Receivers, Data collection,
optimization problem
BibRef
Deng, S.Y.[Shi-Yu],
Chen, Y.[Yinda],
Huang, W.[Wei],
Zhang, R.B.[Ruo-Bing],
Xiong, Z.W.[Zhi-Wei],
Unsupervised Domain Adaptation for EM Image Denoising With Invertible
Networks,
MedImg(44), No. 1, January 2025, pp. 92-105.
IEEE DOI Code:
WWW Link.
2501
Noise reduction, Noise measurement, Noise, Image denoising, Training,
Image reconstruction, Biomedical imaging,
electron microscopy
BibRef
Zhang, Q.[Qi],
Bao, C.L.[Cheng-Long],
Lin, H.[Hai],
Hu, M.X.[Ming-Xu],
Averaging Orientations with Molecular Symmetry in Cryo-EM,
SIIMS(17), No. 4, 2024, pp. 2174-2195.
DOI Link
2501
BibRef
Zhou, Y.F.[Yan-Feng],
Li, L.R.[Ling-Rui],
Wang, C.L.[Chen-Long],
Song, L.[Le],
Yang, G.[Ge],
GobletNet: Wavelet-Based High-Frequency Fusion Network for Semantic
Segmentation of Electron Microscopy Images,
MedImg(44), No. 2, February 2025, pp. 1058-1069.
IEEE DOI Code:
WWW Link.
2502
Wavelet transforms, Heating systems, Hafnium,
Semantic segmentation, Biomedical imaging, Convolution, prior knowledge
BibRef
Xu, Y.C.[Yu-Chen],
Thomas, A.M.[Andrew M.],
Crozier, P.A.[Peter A.],
Matteson, D.S.[David S.],
Dynamic Atomic Column Detection in Transmission Electron Microscopy
Videos via Ridge Estimation,
IP(34), 2025, pp. 1588-1601.
IEEE DOI
2503
Transmission electron microscopy, Videos, Feature extraction,
Signal to noise ratio, Electrons, Heuristic algorithms, Atoms,
transmission electron microscopy (TEM)
BibRef
Guo, J.Y.[Jin-Yue],
Wang, Z.[Zejin],
Zhai, H.[Hao],
Zhang, Y.C.[Yan-Chao],
Liu, J.[Jing],
Han, H.[Hua],
Re-Isotropic Segmentation for Subcellular Ultrastructure in
Anisotropic EM Images,
MedImg(44), No. 4, April 2025, pp. 1624-1635.
IEEE DOI
2504
Anisotropic, Decoding, Anisotropic magnetoresistance, Convolution,
Image resolution, Transformers, Optimization, Image restoration,
volume segmentation
BibRef
Repka, S.[Samuel],
Reich, B.[Borek],
Zolotarev, F.[Fedor],
Eerola, T.[Tuomas],
Zemcík, P.[Pavel],
Mineral segmentation using electron microscope images and spectral
sampling through multimodal graph neural networks,
PRL(193), 2025, pp. 79-85.
Elsevier DOI
2505
Graph neural networks, Data fusion, Mineral segmentation,
Scanning electron microscope
BibRef
Hu, Z.X.[Zi-Xi],
Pande, K.[Kanupriya],
End-to-End Training of Latent Space Diffusion Models for
Conformational Heterogeneity in Cryo-EM Reconstruction,
IVCNZ24(1-6)
IEEE DOI
2503
Training, Manifolds, Solid modeling, Statistical analysis,
Computational modeling, Molecular biophysics, Diffusion models,
diffusion models
BibRef
Kazimi, B.[Bashir],
Ruzaeva, K.[Karina],
Sandfeld, S.[Stefan],
Self-Supervised Learning with Generative Adversarial Networks for
Electron Microscopy,
Materials24(71-81)
IEEE DOI
2410
Training, Superresolution, Noise reduction, Noise,
Self-supervised learning, Predictive models, Deep Learning, Superresolution
BibRef
Chen, M.H.[Ming-Hao],
Renuka, M.B.[Mukesh Bangalore],
Mi, L.[Lu],
Lichtman, J.[Jeff],
Shavit, N.[Nir],
Meirovitch, Y.[Yaron],
Learning to Correct Sloppy Annotations in Electron Microscopy Volumes,
CVMI23(4273-4284)
IEEE DOI
2309
BibRef
Nguyen, N.P.[Nguyen P.],
Surya, R.[Ramakrishna],
Maschmann, M.[Matthew],
Calyam, P.[Prasad],
Palaniappan, K.[Kannappan],
Bunyak, F.[Filiz],
Self-supervised Orientation-guided Deep Network for Segmentation of
Carbon Nanotubes in SEM Imagery,
Scarce22(412-428).
Springer DOI
2304
BibRef
Yu, Z.[Zifan],
Trindade, B.M.[Bruno Machado],
Green, M.[Michael],
Zhang, Z.K.[Zhi-Kang],
Sneha, P.[Pullela],
Tavakoli, E.B.[Erfan Bank],
Pawlowicz, C.[Christopher],
Ren, F.[Fengbo],
A Data-Driven Approach for Automated Integrated Circuit Segmentation
of Scan Electron Microscopy Images,
ICIP22(2851-2855)
IEEE DOI
2211
Integrated circuits, Image segmentation,
Scanning electron microscopy, Wires, Industry applications,
integrated circuit segmentation
BibRef
Han, H.Q.[Hong-Qing],
Dmitrieva, M.[Mariia],
Sauer, A.[Alexander],
Tam, K.H.[Ka Ho],
Rittscher, J.[Jens],
Self-Supervised Voxel-Level Representation Rediscovers Subcellular
Structures in Volume Electron Microscopy,
CVMI22(1873-1882)
IEEE DOI
2210
Representation learning, Measurement, Solid modeling,
Image segmentation, Biological system modeling
BibRef
Kniesel, H.[Hannah],
Ropinski, T.[Timo],
Bergner, T.[Tim],
Devan, K.S.[Kavitha Shaga],
Read, C.[Clarissa],
Walther, P.[Paul],
Ritschel, T.[Tobias],
Hermosilla, P.[Pedro],
Clean Implicit 3D Structure from Noisy 2D STEM Images,
CVPR22(20730-20740)
IEEE DOI
2210
Training, Solid modeling, Transmission electron microscopy,
Microscopy, Data models, Noise measurement, Medical,
Self- semi- meta- unsupervised learning
BibRef
He, B.[Bintao],
Zhang, F.[Fa],
Zhang, H.[Huanshui],
Han, R.[Renmin],
A Hybrid Frequency-Spatial Domain Model for Sparse Image
Reconstruction in Scanning Transmission Electron Microscopy,
ICCV21(2662-2671)
IEEE DOI
2203
Scanning electron microscopy, Transmission electron microscopy,
Frequency-domain analysis, Microscopy, Computational modeling,
Optimization and learning methods
BibRef
Xin, T.[Tong],
Chen, B.[Bohao],
Chen, X.[Xi],
Han, H.[Hua],
UTR: Unsupervised Learning of Thickness-Insensitive Representations
for Electron Microscope Image,
ICIP21(155-159)
IEEE DOI
2201
Image registration, Scanning electron microscopy, Neurites,
Neural circuits, Morphology, Feature extraction,
FIB-SEM
BibRef
Watkins, L.[Luisa],
Seidel, S.W.[Sheila W.],
Peng, M.[Minxu],
Agarwal, A.[Akshay],
Yu, C.C.[Christopher C.],
Goyal, V.K.[Vivek K],
Robustness of Time-Resolved Measurement to Unknown and Variable Beam
Current in Particle Beam Microscopy,
ICIP21(3487-3491)
IEEE DOI
2201
Scanning electron microscopy, Particle beams, Correlation,
Particle beam measurements, Atmospheric measurements,
scanning electron microscopy
BibRef
Friedrich, T.[Thomas],
Yu, C.P.[Chu-Ping],
Verbeek, J.[Johan],
Pennycook, T.[Timothy],
van Aert, S.[Sandra],
Phase Retrieval from 4-Dimensional Electron Diffraction Datasets,
ICIP21(3453-3457)
IEEE DOI
2201
Training, Electric potential, Sensitivity,
Convolutional neural networks, Electron microscopy, CBED
BibRef
Monardo, V.[Vincent],
Iyer, A.[Abhiram],
Donegan, S.[Sean],
de Graef, M.[Marc],
Chi, Y.[Yuejie],
Plug-And-Play Image Reconstruction Meets Stochastic Variance-Reduced
Gradient Methods,
ICIP21(2868-2872)
IEEE DOI
2201
Gradient methods, Image coding, Runtime, Superresolution,
Stochastic processes, Electron microscopy, plug-and-play, image reconstruction
BibRef
Pinetz, T.[Thomas],
Kobler, E.[Erich],
Doberstein, C.[Christian],
Berkels, B.[Benjamin],
Effland, A.[Alexander],
Total Deep Variation for Noisy Exit Wave Reconstruction in Transmission
Electron Microscopy,
SSVM21(491-502).
Springer DOI
2106
BibRef
Khadangi, A.[Afshin],
Boudier, T.[Thomas],
Rajagopal, V.[Vijay],
EM-net: Deep learning for electron microscopy image segmentation,
ICPR21(31-38)
IEEE DOI
2105
Deep learning, Measurement, Training, Image segmentation,
Scanning electron microscopy,
cell architecture
BibRef
Singla, A.[Aayush],
Lippmann, B.[Bernhard],
Graeb, H.[Helmut],
Recovery of 2D and 3D Layout Information through an Advanced Image
Stitching Algorithm using Scanning Electron Microscope Images,
ICPR21(3860-3867)
IEEE DOI
2105
Scanning electron microscopy,
Semiconductor devices, Layout, Software algorithms,
Software
BibRef
Sinha, A.[Ashish],
Suresh, K.S.,
Deep Learning Based Dimple Segmentation for Quantitative Fractography,
IML20(463-474).
Springer DOI
2103
BibRef
Quan, T.M.,
Hildebrand, D.G.C.,
Lee, K.,
Thomas, L.A.,
Kuan, A.T.,
Lee, W.A.,
Jeong, W.,
Removing Imaging Artifacts in Electron Microscopy using an
Asymmetrically Cyclic Adversarial Network without Paired Training
Data,
CLI19(3804-3813)
IEEE DOI
2004
electron microscopy, image denoising,
learning (artificial intelligence), medical image processing, GAN
BibRef
Min, S.B.[Shao-Bo],
Chen, X.J.[Xue-Jin],
Xie, H.T.[Hong-Tao],
Zha, Z.J.[Zheng-Jun],
Bi, G.Q.[Guo-Qiang],
Wu, F.[Feng],
Zhang, Y.D.[Yong-Dong],
Accurate Segmentation of Synaptic Cleft with Contour Growing
Concatenated with a Convnet,
ICIP19(1420-1424)
IEEE DOI
1910
Analyze the macromolecular complexes related to neurotransmitter transmission.
High noise. Electron micrographs.
Synaptic cleft, fully convolutional networks, active contours,
contour growing, segmentation
BibRef
Chan, R.H.[Raymond H.],
Lazzaro, D.[Damiana],
Morigi, S.[Serena],
Sgallari, F.[Fiorella],
A Non-convex Nonseparable Approach to Single-Molecule Localization
Microscopy,
SSVM19(498-509).
Springer DOI
1909
BibRef
Bodduna, K.[Kireeti],
Weickert, J.[Joachim],
Frangakis, A.S.[Achilleas S.],
Hough Based Evolutions for Enhancing Structures in 3D Electron
Microscopy,
CAIP19(I:102-112).
Springer DOI
1909
BibRef
Molina-Abril, H.[Helena],
Diaz del Rio, F.[Fernando],
Guerrero-Lebrero, M.P.[Maria P.],
Real, P.[Pedro],
Barcena, G.[Guillermo],
Braza, V.[Veronica],
Guerrero, E.[Elisa],
Gonzalez, D.[David],
Galindo, P.L.[Pedro L.],
Topological Homogeneity for Electron Microscopy Images,
CTIC19(166-178).
Springer DOI
1901
BibRef
Michels, Y.,
Baudrier, E.,
Mazo, L.,
Radial Function Based Ab-Initio Tomographic Reconstruction for Cryo
Electron Microscopy,
ICIP18(1178-1182)
IEEE DOI
1809
Image reconstruction, Signal to noise ratio,
Reconstruction algorithms,
unknown directions
BibRef
Pape, C.[Constantin],
Beier, T.[Thorsten],
Li, P.[Peter],
Jain, V.[Viren],
Bock, D.D.[Davi D.],
Kreshuk, A.[Anna],
Solving Large Multicut Problems for Connectomics via Domain
Decomposition,
BioIm17(1-10)
IEEE DOI
1802
Electron microscopy volumes.
Approximation algorithms, Image reconstruction,
Image segmentation, Merging, Neurons, Partitioning algorithms, Pipelines
BibRef
Sreehari, S.,
Venkatakrishnan, S.V.,
Bouman, K.L.,
Simmons, J.P.,
Drummy, L.F.,
Bouman, C.A.,
Multi-Resolution Data Fusion for Super-Resolution Electron Microscopy,
NTIRE17(1084-1092)
IEEE DOI
1709
Image resolution, Interpolation, Libraries, Noise reduction,
Transmission, electron, microscopy
BibRef
Liu, Q.[Qing],
Yang, X.P.[Xiao-Ping],
Zhao, X.L.[Xiao-Long],
Ling, W.J.[Wei-Jun],
Lu, F.P.[Fei-Ping],
Zhao, Y.X.[Yu-Xiang],
Microscopic image enhancement of Chinese Herbal Medicine based on
fuzzy set,
ICIVC17(299-302)
IEEE DOI
1708
Electron microscopy, Feature extraction, Finite element analysis,
Fuzzy sets, Image enhancement, Laplace equations,
Chinese herbal medicine, fuzzy set, image enhancement, microscopic, image
BibRef
Arnal, R.D.,
Wojtas, D.H.,
Millane, R.P.,
Progress towards imaging biological filaments using X-ray
free-electron lasers,
IVCNZ20(1-6)
IEEE DOI
2012
BibRef
Earlier: A3, A2, A1:
Extreme imaging:
Macromolecular imaging using x-ray free-electron lasers,
ICVNZ16(1-6)
IEEE DOI
1701
Free electron lasers, Imaging,
X-ray lasers, X-ray diffraction, Biology, X-ray imaging,
structural biology.
Crystallography
BibRef
Štepka, K.[Karel],
Maška, M.[Martin],
Pálenik, J.J.[Jakub Jozef],
Pospíchalová, V.[Vendula],
Kotrbová, A.[Anna],
Ilkovics, L.[Ladislav],
Klemová, D.[Dobromila],
Hampl, A.[Aleš],
Bryja, V.[Vítezslav],
Matula, P.[Pavel],
Automatic Detection and Segmentation of Exosomes in Transmission
Electron Microscopy,
BioImage16(I: 318-325).
Springer DOI
1611
BibRef
Colabrese, S.,
Castello, M.,
Vicidomini, G.,
del Bue, A.,
Learning-based approach to boost detection rate and localisation
accuracy in single molecule localisation microscopy,
ICIP16(3184-3188)
IEEE DOI
1610
Diffraction
BibRef
Gong, Y.,
Doerschuk, P.C.,
3-D understanding of electron microscopy images of nano bio objects
by computing generative mechanical models,
ICIP16(3161-3165)
IEEE DOI
1610
Biological system modeling
BibRef
Michels, Y.,
Baudrier, É.,
Retrieving the parameters of cryo Electron Microscopy dataset in the
heterogeneous ab-initio case,
ICIP16(3189-3193)
IEEE DOI
1610
Estimation
BibRef
Lin, Y.Z.[You-Zuo],
Kandel, Y.[Yudhishthir],
Zotta, M.[Matthew],
Lifshin, E.[Eric],
SEM resolution improvement using semi-blind restoration with hybrid
L1-L2 regularization,
Southwest16(33-36)
IEEE DOI
1605
Scanning electron microscopy.
Image resolution
BibRef
Liu, T.[Ting],
Zhang, M.M.[Miao-Miao],
Javanmardi, M.[Mehran],
Ramesh, N.[Nisha],
Tasdizen, T.[Tolga],
SSHMT: Semi-supervised Hierarchical Merge Tree for Electron Microscopy
Image Segmentation,
ECCV16(I: 144-159).
Springer DOI
1611
BibRef
Liu, T.[Ting],
Seyedhosseini, M.[Mojtaba],
Ellisman, M.[Mark],
Tasdizen, T.[Tolga],
Watershed merge forest classification for electron microscopy image
stack segmentation,
ICIP13(4069-4073)
IEEE DOI
1402
Machine learning
BibRef
Liu, T.[Ting],
Jurrus, E.[Elizabeth],
Seyedhosseini, M.[Mojtaba],
Ellisman, M.[Mark],
Tasdizen, T.[Tolga],
Watershed merge tree classification for electron microscopy image
segmentation,
ICPR12(133-137).
WWW Link.
1302
BibRef
Parag, T.,
Ciresan, D.C.,
Giusti, A.,
Efficient Classifier Training to Minimize False Merges in Electron
Microscopy Segmentation,
ICCV15(657-665)
IEEE DOI
1602
Algorithm design and analysis
BibRef
Wang, Q.[Qiu],
Doerschuk, P.C.[Peter C.],
3-D image reconstruction for bio nanomachines with helical symmetry:
Image formation theory,
ICIP15(892-896)
IEEE DOI
1512
cryo electron microscopy
BibRef
Gong, Y.[Yunye],
Doerschuk, P.C.[Peter C.],
Determining fluctuation in bio-nanomachines from electron microscopy
images,
ICIP15(262-265)
IEEE DOI
1512
cryo electron microscopy
BibRef
Shenoy, R.[Renuka],
Shih, M.C.[Min-Chi],
Rose, K.[Kenneth],
Segmentation of cells in electron microscopy images through
multimodal label transfer,
ICIP15(103-107)
IEEE DOI
1512
Electron Microscopy, Multimodal, Segmentation
BibRef
Xu, X.P.[Xiao-Ping],
Page, C.[Christopher],
Volkmann, N.[Niels],
Efficient Extraction of Macromolecular Complexes from Electron
Tomograms Based on Reduced Representation Templates,
CAIP15(I:423-431).
Springer DOI
1512
BibRef
Sousa, R.G.[Ricardo Gamelas],
Esteves, T.[Tiago],
Rocha, S.[Sara],
Figueiredo, F.[Francisco],
Quelhas, P.[Pedro],
Silva, L.M.[Luís M.],
Automatic Detection of Immunogold Particles from Electron Microscopy
Images,
ICIAR15(377-384).
Springer DOI
1507
BibRef
Bhadouria, V.S.[Vivek Singh],
Ghoshal, D.[Dibyendu],
Edge detection in electron microscopy biological images using
statistical dispersion,
IMVIP12(96-100).
IEEE DOI
1302
BibRef
Habibullah,
Ur Rehman, O.[Obaid],
Pota, H.R.,
Petersen, I.R.,
Internal reference model based optimal LQG controller for atomic force
microscope,
ICARCV12(294-299).
IEEE DOI
1304
BibRef
Lind, J.[Jonathan],
Rollett, A.D.[Anthony D.],
Pokharel, R.[Reeju],
Hefferan, C.[Christopher],
Li, S.F.[Shiu-Fai],
Lienert, U.[Ulrich],
Suter, R.[Robert],
Image processing in experiments on, and simulations of plastic
deformation of polycrystals,
ICIP14(4877-4881)
IEEE DOI
1502
Diffraction
BibRef
Egelman, E.H.[Edward H.],
New advances in imaging polymers at near-atomic resolution,
ICIP14(2071-2074)
IEEE DOI
1502
Detectors
BibRef
Wang, Y.F.[Yun-Feng],
Kilpatrick, J.I.[Jason I.],
Jarvis, S.P.[Suzanne P.],
Boland, F.[Frank],
Kokaram, A.[Anil],
Corrigan, D.[David],
Automated registration of low and high resolution atomic force
microscopy images using scale invariant features,
ICIP14(5866-5870)
IEEE DOI
1502
Atomic force microscopy
BibRef
Le Guen, V.[Vincent],
Paul, N.[Nicolas],
A Scanning Electron Microscope image segmentation method for steam
generator fouling rate estimation,
ICIP14(4447-4451)
IEEE DOI
1502
Clustering algorithms
BibRef
Thierry, R.[Raphael],
Kirschmann, M.[Moritz],
Hummel, E.[Eric],
Hawes, C.[Chris],
Genoud, C.[Christel],
Demon registration for 3D images obtained by serial block face
scanning electron microscopy,
ICIP14(3587-3591)
IEEE DOI
1502
Algorithm design and analysis
BibRef
Nam, D.[David],
Mantell, J.[Judith],
Hodgson, L.[Lorna],
Bull, D.R.[David R.],
Verkade, P.[Paul],
Achim, A.[Alin],
Feature-based registration for correlative light and electron
microscopy images,
ICIP14(3567-3571)
IEEE DOI
1502
Image registration
BibRef
Sorzano, C.O.S.,
Vargas, J.,
Oton, J.,
Abrishami, V.,
de la Rosa-Trevin, J.M.,
del Riego, S.,
Fernandez-Alderete, A.,
Martinez-Rey, C.,
Marabini, R.,
Carazo, J.M.,
An image processing approach to the simulation of electron microscopy
volumes of atomic structures,
ICIP14(2095-2099)
IEEE DOI
1502
Atomic clocks
BibRef
Jin, Q.Y.[Qi-Yu],
Sorzano, C.O.S.[Carlos Oscar Sanchez],
Callebaut, I.[Isabelle],
Tama, F.[Florence],
Jonic, S.[Slavica],
Elastic image registration to fully explore macromolecular dynamics
by electron microscopy,
ICIP14(2075-2079)
IEEE DOI
1502
Assembly
BibRef
Tafti, A.P.[A. Pahlavan],
Kirkpatrick, A.B.,
Owen, H.A.,
Yu, Z.,
3D Microscopy Vision Using Multiple View Geometry and Differential
Evolutionary Approaches,
ISVC14(II: 141-152).
Springer DOI
1501
BibRef
Roels, J.[Joris],
Aelterman, J.[Jan],
de Vylder, J.[Jonas],
Luong, H.[Hiep],
Saeys, Y.[Yvan],
Lippens, S.[Saskia],
Philips, W.[Wilfried],
Noise Analysis and Removal in 3D Electron Microscopy,
ISVC14(I: 31-40).
Springer DOI
1501
BibRef
Iwahori, Y.J.[Yu-Ji],
Funahashi, K.[Kenji],
Woodham, R.J.[Robert J.],
Bhuyan, M.K.,
Neural Network Based Image Modification for Shape from Observed SEM
Images,
ICPR14(2131-2136)
IEEE DOI
1412
Scanning Electron Microscope.
BibRef
Azadi, S.[Samaneh],
Maitin-Shepard, J.[Jeremy],
Abbeel, P.[Pieter],
Optimization-Based Artifact Correction for Electron Microscopy Image
Stacks,
ECCV14(II: 219-235).
Springer DOI
1408
BibRef
Lee, H.G.[Hyun-Gyu],
Choi, M.K.[Min-Kook],
Lee, S.C.[Sang-Chul],
Grain-oriented segmentation of scanning electron microscope images,
ICIP13(4029-4033)
IEEE DOI
1402
Nanostructures;Ti foil;anodization;grain structure;image segmentation
BibRef
Yang, H.F.[Huei-Fang],
Choe, Y.[Yoonsuck],
An Interactive Editing Framework for Electron Microscopy Image
Segmentation,
ISVC11(I: 400-409).
Springer DOI
1109
BibRef
Papa, J.P.[João P.],
Pereira, C.R.[Clayton R.],
de Albuquerque, V.H.C.[Victor H.C.],
Silva, C.C.[Cleiton C.],
Falcão, A.X.[Alexandre X.],
Tavares, J.M.R.S.[João Manuel R.S.],
Precipitates Segmentation from Scanning Electron Microscope Images
through Machine Learning Techniques,
IWCIA11(456-468).
Springer DOI
1105
BibRef
Veeraraghavan, A.[Ashok],
Genkin, Alex.V.,
Vitaladevuni, S.[Shiv],
Scheffer, L.[Lou],
Xu, S.[Shan],
Hess, H.[Harald],
Fetter, R.[Richard],
Cantoni, M.[Marco],
Knott, G.[Graham],
Chklovskii, D.[Dmitri],
Increasing depth resolution of electron microscopy of neural circuits
using sparse tomographic reconstruction,
CVPR10(1767-1774).
IEEE DOI Video of talk:
WWW Link.
1006
BibRef
Kim, D.S.[Dong Sik],
Intensity compensation of the mitochondria tilted image sequence
obtained from the transmission electron microscopy,
ICIP09(1777-1780).
IEEE DOI
0911
BibRef
Mendizibal, A.,
Cabrera, J.,
Salgado, L.,
Garcia, N.,
Gonzalez, J.C.,
Unsupervised segmentation algorithm of HRTEM images,
ICIP04(IV: 2757-2760).
IEEE DOI
0505
high resolution transmission electron microscopy.
BibRef
Bilbao-Castro, J.R.,
Carazo, J.M.,
Garcia, L.,
Fernandez, J.J.,
Parallel iterative reconstruction methods for structure determination
of biological specimens by electron microscopy,
ICIP03(I: 565-568).
IEEE DOI
0312
BibRef
Barcucci, E.,
del Lungol, A.,
Nivat, M.,
Pinzani, R.,
Zurli, A.,
Reconstructing digital sets from X-rays,
CIAP97(I: 166-173).
Springer DOI
9709
tomography, 3D chrystals from 2D electron microscope images.
BibRef
Skoglund, U.,
Ofverstedt, L.G.,
Image 3-D Reconstruction from Electron Micrographs,
SSAB97(Medical)
9703
BibRef
Saad, A.,
Chiu, W.,
Thuman-Commike, P.A.,
Multiresolution approach to automatic detection of spherical particles
from electron cryomicroscopy images,
ICIP98(III: 846-850).
IEEE DOI
9810
BibRef
van Dyck, D.,
Op de Beeck, M.,
How image processing can push electron microscopy to its limits,
ICIP95(III: 41-44).
IEEE DOI
9510
BibRef
van Dyck, D.,
Op de Beeck, M.,
Tang, D.,
Jansen, J.,
Zandbergen, H.W.,
A global entropy criterion for focus tuning in exit wavefunction
reconstruction in high resolution electron microscopy,
ICIP96(I: 737-740).
IEEE DOI
9610
BibRef
van Dyck, D.,
Op de Beeck, M.,
Coene, W.,
Object wavefunction reconstruction in high resolution electron
microscopy,
ICIP94(III: 295-298).
IEEE DOI
9411
BibRef
Cop, M.,
Dengler, J.,
A multiresolution approach to the 3D reconstruction of a 50S ribosome
from an EM-tilt series solving the alignment problem without gold
particles,
ICPR90(I: 733-737).
IEEE DOI
9006
electron microscopy
BibRef
Chapter on Computational Vision, Regularization, Connectionist, Morphology, Scale-Space, Perceptual Grouping, Wavelets, Color, Sensors, Optical, Laser, Radar continues in
Cryo-Electron Microscopy .