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Scanning electron microscopy, Optical imaging, Strain,
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2112
Feature extraction, Synapses, Task analysis, Logic gates,
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2112
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2201
Materials science and technology, Image analysis, Data analysis,
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Weakly Supervised Learning for Joint Image Denoising and Protein
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WACV22(3260-3269)
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2202
Proteins, Training, Image segmentation,
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2205
Signal to noise ratio, Noise measurement, Autocorrelation,
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2212
Serial section transmission electron microscopy.
Image restoration, Optical imaging, Adaptive optics,
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Huang, Q.[Qinwen],
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2211
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Levy, A.[Axel],
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CryoAI: Amortized Inference of Poses for Ab Initio Reconstruction of 3D
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2211
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Wang, T.Y.[Tian-Yang],
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Zeng, X.R.[Xiang-Rui],
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Xu, M.[Min],
Deep Active Learning for Cryo-Electron Tomography Classification,
ICIP22(1611-1615)
IEEE DOI
2211
Training, Uniform resource locators, Solid modeling, Uncertainty,
Tomography, Rendering (computer graphics), Deep active learning,
Classification
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Yu, Z.[Zifan],
Trindade, B.M.[Bruno Machado],
Green, M.[Michael],
Zhang, Z.[Zhikang],
Sneha, P.[Pullela],
Tavakoli, E.B.[Erfan Bank],
Pawlowicz, C.[Christopher],
Ren, F.[Fengbo],
A Data-Driven Approach for Automated Integrated Circuit Segmentation
of Scan Electron Microscopy Images,
ICIP22(2851-2855)
IEEE DOI
2211
Integrated circuits, Image segmentation,
Scanning electron microscopy, Wires, Industry applications,
integrated circuit segmentation
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Han, H.Q.[Hong-Qing],
Dmitrieva, M.[Mariia],
Sauer, A.[Alexander],
Tam, K.H.[Ka Ho],
Rittscher, J.[Jens],
Self-Supervised Voxel-Level Representation Rediscovers Subcellular
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CVMI22(1873-1882)
IEEE DOI
2210
Representation learning, Measurement, Solid modeling,
Image segmentation, Biological system modeling
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Kniesel, H.[Hannah],
Ropinski, T.[Timo],
Bergner, T.[Tim],
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Ritschel, T.[Tobias],
Hermosilla, P.[Pedro],
Clean Implicit 3D Structure from Noisy 2D STEM Images,
CVPR22(20730-20740)
IEEE DOI
2210
Training, Solid modeling, Transmission electron microscopy,
Microscopy, Data models, Noise measurement, Medical,
Self- semi- meta- unsupervised learning
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He, B.[Bintao],
Zhang, F.[Fa],
Zhang, H.[Huanshui],
Han, R.[Renmin],
A Hybrid Frequency-Spatial Domain Model for Sparse Image
Reconstruction in Scanning Transmission Electron Microscopy,
ICCV21(2662-2671)
IEEE DOI
2203
Scanning electron microscopy, Transmission electron microscopy,
Frequency-domain analysis, Microscopy, Computational modeling,
Optimization and learning methods
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Zeng, Y.C.[Yu-Chen],
Howe, G.[Gregory],
Yi, K.[Kai],
Zeng, X.[Xiangrui],
Zhang, J.[Jing],
Chang, Y.W.[Yi-Wei],
Xu, M.[Min],
Unsupervised Domain Alignment Based Open Set Structural Recognition
of Macromolecules Captured By Cryo-Electron Tomography,
ICIP21(106-110)
IEEE DOI
2201
Deep learning, Image recognition, Systematics, Image analysis,
Training data, Tomography, Cryo-Electron Tomography, Open-set learning
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Xin, T.[Tong],
Chen, B.[Bohao],
Chen, X.[Xi],
Han, H.[Hua],
UTR: Unsupervised Learning of Thickness-Insensitive Representations
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ICIP21(155-159)
IEEE DOI
2201
Image registration, Scanning electron microscopy, Neurites,
Neural circuits, Morphology, Feature extraction,
FIB-SEM
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Fan, Y.F.[Yi-Feng],
Zhao, Z.Z.[Zhi-Zhen],
Cryo-Electron Microscopy Image Denoising Using Multi-Frequency Vector
Diffusion Maps,
ICIP21(3463-3467)
IEEE DOI
2201
Interpolation, Noise reduction, Signal processing algorithms,
Signal processing, Image reconstruction, Image denoising,
image denoising
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Watkins, L.[Luisa],
Seidel, S.W.[Sheila W.],
Peng, M.[Minxu],
Agarwal, A.[Akshay],
Yu, C.C.[Christopher C.],
Goyal, V.K.[Vivek K],
Robustness of Time-Resolved Measurement to Unknown and Variable Beam
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ICIP21(3487-3491)
IEEE DOI
2201
Scanning electron microscopy, Particle beams, Correlation,
Particle beam measurements, Atmospheric measurements,
scanning electron microscopy
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Friedrich, T.[Thomas],
Yu, C.P.[Chu-Ping],
Verbeek, J.[Johan],
Pennycook, T.[Timothy],
van Aert, S.[Sandra],
Phase Retrieval from 4-Dimensional Electron Diffraction Datasets,
ICIP21(3453-3457)
IEEE DOI
2201
Training, Electric potential, Sensitivity,
Convolutional neural networks, Electron microscopy, CBED
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Monardo, V.[Vincent],
Iyer, A.[Abhiram],
Donegan, S.[Sean],
de Graef, M.[Marc],
Chi, Y.[Yuejie],
Plug-And-Play Image Reconstruction Meets Stochastic Variance-Reduced
Gradient Methods,
ICIP21(2868-2872)
IEEE DOI
2201
Gradient methods, Image coding, Runtime, Superresolution,
Stochastic processes, Electron microscopy, plug-and-play, image reconstruction
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Nashed, Y.S.G.[Youssef S. G.],
Poitevin, F.[Frédéric],
Gupta, H.[Harshit],
Woollard, G.[Geoffrey],
Kagan, M.[Michael],
Yoon, C.H.[Chun Hong],
Ratner, D.[Daniel],
CryoPoseNet: End-to-End Simultaneous Learning of Single-particle
Orientation and 3D Map Reconstruction from Cryo-electron Microscopy
Data,
LCI21(4049-4059)
IEEE DOI
2112
Solid modeling, Image resolution,
Pose estimation, Pipelines, Decoding
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Pinetz, T.[Thomas],
Kobler, E.[Erich],
Doberstein, C.[Christian],
Berkels, B.[Benjamin],
Effland, A.[Alexander],
Total Deep Variation for Noisy Exit Wave Reconstruction in Transmission
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SSVM21(491-502).
Springer DOI
2106
BibRef
Khadangi, A.[Afshin],
Boudier, T.[Thomas],
Rajagopal, V.[Vijay],
EM-net: Deep learning for electron microscopy image segmentation,
ICPR21(31-38)
IEEE DOI
2105
Deep learning, Measurement, Training, Image segmentation,
Scanning electron microscopy,
cell architecture
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Chapter on Computational Vision, Regularization, Connectionist, Morphology, Scale-Space, Perceptual Grouping, Wavelets, Color, Sensors, Optical, Laser, Radar continues in
Phase Unwrapping, Stereo Depth unwrapping .