4.9.8 Electron Microscope Images and Sensors

Chapter Contents (Back)
Electron Microscope. See also Medical Applications, Microscope Image Analysis.

Matson, W.L.[William L.], McKinstry, H.A., Johnson, Jr., G.G., White, E.W., McMillan, R.E.,
Computer processing of SEM images by contour analyses,
PR(2), No. 4, December 1970, pp. 303-306.
WWW Link. 0309
scanning electron microscope images. BibRef

Sandler, S.S.[Sheldon S.],
Direct three-dimensional analysis of electron micrograph pictures,
PR(4), No. 4, December 1972, pp. 353-359.
WWW Link. 0309
The method consists of presenting a unique relation between the projection pictures and the original densities. BibRef

Kriete, A., Haucke, M., Gerlach, B., Harms, H., Aus, H.M.,
A Preprocessing Method for the Contrast Enhancement of TV-Scanned Electron Microscopic Images,
PR(17), No. 3, 1984, pp. 305-311.
WWW Link. BibRef 8400

White, E.W., Mayberry, K., Johnson, Jr., G.G.,
Computer analysis of multi-channel SEM and X-ray images from fine particles,
PR(4), No. 2, May 1972, pp. 173-192.
WWW Link. 0309
Scanning electron microscope BibRef

Favre, A., Keller, H.,
Local image transformation: An application in biological electron microscopy,
PR(13), No. 2, 1981, pp. 177-187.
WWW Link. 0309
BibRef

Phillips, T.Y.[Tsai-Yun], Davis, L.S.[Larry S.], Rosenfeld, A.[Azriel],
Automatic Segmentation of Electron Micrographs of Berea Sandstone Cross-Sections,
PR(16), No. 4, 1983, pp. 385-400.
WWW Link. 0309
BibRef

Kriete, A., Aus, H.M.,
On-Line Processing of Transmission Electron Microscopic Images,
PRL(4), 1986, pp. 285-292. BibRef 8600

Selfridge, P.G.,
Locating Neuron Boundaries in Electron Micrograph Images Using 'Primal Sketch' Primitives,
CVGIP(34), No. 2, May 1986, pp. 156-165.
WWW Link. BibRef 8605
And:
Tracing Neurons Through Serial Sections: Using Knowledge of Shape to Improve Performance,
CVPR86(418-420). Shows that iso-intensity contours do not work, but does not mention other edge techniques. Use edges, search techniques, and prediction of position. BibRef

Zapata, E.L., Benavides, I., Rivera, F.F., Bruguera, J.D., Pena, T.F., Carazo, J.M.,
Image reconstruction on hypercube computers: Application to electron microscopy,
SP(27), No. 1, 1992, pp. 51-64. BibRef 9200

Ong, S.H., Giam, S.T., Jayasooriah, Sinniah, R.,
Adaptive window-based tracking for the detection of membrane structures in kidney electron micrographs,
MVA(6), No. 4, 1993, pp. 215-223. BibRef 9300

Vrhel, M.J., Unser, M.,
Multichannel Restoration with Limited A Priori Information,
IP(8), No. 4, April 1999, pp. 527-536.
IEEE DOI electron microscopy of biological macromolecules BibRef 9904

Vrhel, M.J., Trus, B.L.,
Multi-channel restoration of electron micrographs,
ICIP95(II: 516-519).
IEEE DOI 9510
BibRef

Kayaalp, A., Rao, A.R.[A. Ravishankar], Jain, R.,
Scanning Electron Microscope-Based Stereo Analysis,
MVA(3), No. 4, 1990, pp. 231-246. BibRef 9000
Earlier: CVPR89(429-434).
IEEE DOI BibRef

Herman, G.T.[Gabor T.], Marabini, R.[Roberto], Carazo, J.M.[José-María], Garduńo, E.[Edgar], Lewitt, R.M.[Robert M.], Matej, S.[Samuel],
Image processing approaches to biological three-dimensional electron microscopy,
IJIST(11), No. 1, 2000, pp. 12-29. 0005
BibRef

Marabini, R., Sorzano, C.O.S., Matej, S., Fernandez, J.J., Carazo, J.M., Herman, G.T.,
3-D Reconstruction of 2-D Crystals in Real Space,
IP(13), No. 4, April 2004, pp. 549-561.
IEEE DOI 0404
BibRef
And: Corrections: IP(13), No. 8, August 2004, pp. 1157-1157.
IEEE DOI BibRef

Ruiz, V.G., Fernández, J.J., López, M.F., García, I.,
Progressive Image Transmission in Telemicroscopy: A Quantitative Approach for Electron Microscopy Images of Biological Specimens,
RealTimeImg(8), No. 6, December 2002, pp. 519-544.
WWW Link. 0304
BibRef

Pattichis, M.S., Pattichis, C.S., Avraam, M., Bovik, A.C., Kyriacou, K.,
AM-FM texture segmentation in electron microscopic muscle imaging,
MedImg(19), No. 12, December 2000, pp. 1253-1257.
IEEE Top Reference. 0110
BibRef

Sorzano, C.O.S., Marabini, R., Herman, G.T., Carazo, J.M.,
Multiobjective algorithm parameter optimization using multivariate statistics in three-dimensional electron microscopy reconstruction,
PR(38), No. 12, December 2005, pp. 2587-2601.
WWW Link. 0510
BibRef

Salzenstein, F.[Fabien], Montgomery, P.C.[Paul C.], Montaner, D.[Denis], Boudraa, A.O.[Abdel-Ouahab],
Teager-Kaiser Energy and Higher-Order Operators in White-Light Interference Microscopy for Surface Shape Measurement,
JASP(2005), No. 17, 2005, pp. 2804-2815.
WWW Link. 0603
BibRef

Hu, T., Nunez-Iglesias, J., Vitaladevuni, S., Scheffer, L., Xu, S., Bolorizadeh, M., Hess, H., Fetter, R., Chklovskii, D.B.,
Electron Microscopy Reconstruction of Brain Structure Using Sparse Representations Over Learned Dictionaries,
MedImg(32), No. 12, 2013, pp. 2179-2188.
IEEE DOI 1312
Brain BibRef

Ito, K.[Koichi], Suzuki, A.[Ayako], Aoki, T.[Takafumi], Tsuneta, R.[Ruriko],
Image-based magnification calibration for electron microscope,
MVA(25), No. 1, January 2014, pp. 185-197.
WWW Link. 1402
BibRef

Wang, L., Singer, A., Wen, Z.,
Orientation Determination of Cryo-EM Images Using Least Unsquared Deviations,
SIIMS(6), No. 4, 2013, pp. 2450-2483.
DOI Link 1402
cryo-electron microscopy BibRef

Ober, R.J., Tahmasbi, A., Ram, S., Lin, Z.[Zhiping], Ward, E.S.,
Quantitative Aspects of Single-Molecule Microscopy: Information-theoretic analysis of single-molecule data,
SPMag(32), No. 1, January 2015, pp. 58-69.
IEEE DOI 1502
image processing BibRef

Chen, Y.H.[Yu-Hui], Wei, D., Newstadt, G., De Graef, M., Simmons, J., Hero, A.,
Parameter Estimation in Spherical Symmetry Groups,
SPLetters(22), No. 8, August 2015, pp. 1152-1155.
IEEE DOI 1502
crystal orientation BibRef

Katsevich, E., Katsevich, A., Singer, A.,
Covariance Matrix Estimation for the Cryo-EM Heterogeneity Problem,
SIIMS(8), No. 1, 2015, pp. 126-185.
DOI Link 1503
cryo-electron microscopy. BibRef

Jensen, K.H., Sigworth, F.J., Brandt, S.S.,
Removal of Vesicle Structures From Transmission Electron Microscope Images,
IP(25), No. 2, February 2016, pp. 540-552.
IEEE DOI 1601
Adaptation models BibRef

Huang, C., Tagare, H.D.,
Robust w-Estimators for Cryo-EM Class Means,
IP(25), No. 2, February 2016, pp. 893-906.
IEEE DOI 1601
Correlation BibRef

Gaddam, C.K.[Chethan K.], Huang, C.H.[Chung-Hsuan], Wal, R.L.V.[Randy L. Vander],
Quantification of nano-scale carbon structure by HRTEM and lattice fringe analysis,
PRL(76), No. 1, 2016, pp. 90-97.
Elsevier DOI 1605
Lattice fringe analysis BibRef

Chao, J.[Jerry], Ward, E.S.[E. Sally], Ober, R.J.[Raimund J.],
Fisher information theory for parameter estimation in single molecule microscopy: tutorial,
JOSA-A(33), No. 7, July 2016, pp. B36-B57.
DOI Link 1608
Probability theory, stochastic processes, and statistics BibRef

Ashok, A.[Amit], Piestun, R.[Rafael], Stallinga, S.[Sjoerd],
Single molecule image formation, reconstruction and processing: introduction,
JOSA-A(33), No. 7, July 2016, pp. SMI1-SMI2.
DOI Link 1608
General; General physics BibRef

Sheppard, C.J.R.[Colin J. R.], Castello, M.[Marco], Tortarolo, G.[Giorgio], Vicidomini, G.[Giuseppe], Diaspro, A.[Alberto],
Image formation in image scanning microscopy, including the case of two-photon excitation,
JOSA-A(34), No. 8, August 2017, pp. 1339-1350.
DOI Link 1708
Optical transfer functions, Confocal microscopy, Fluorescence microscopy, Scanning microscopy, Multiphoton, processes BibRef


Sreehari, S., Venkatakrishnan, S.V., Bouman, K.L., Simmons, J.P., Drummy, L.F., Bouman, C.A.,
Multi-Resolution Data Fusion for Super-Resolution Electron Microscopy,
NTIRE17(1084-1092)
IEEE DOI 1709
Image resolution, Interpolation, Libraries, Noise reduction, Transmission, electron, microscopy BibRef

Liu, Q.[Qing], Yang, X.P.[Xiao-Ping], Zhao, X.L.[Xiao-Long], Ling, W.J.[Wei-Jun], Lu, F.P.[Fei-Ping], Zhao, Y.X.[Yu-Xiang],
Microscopic image enhancement of Chinese Herbal Medicine based on fuzzy set,
ICIVC17(299-302)
IEEE DOI 1708
Electron microscopy, Feature extraction, Finite element analysis, Fuzzy sets, Image enhancement, Laplace equations, Chinese herbal medicine, fuzzy set, image enhancement, microscopic, image BibRef

Abdollahzadeh, A.[Ali], Acar, E.[Erman], Peltonen, S.[Sari], Ruotsalainen, U.[Ulla],
Local Adaptive Wiener Filtering for Class Averaging in Single Particle Reconstruction,
SCIA17(II: 233-244).
Springer DOI 1706
cryo-electron microscopy. BibRef

Millane, R.P., Wojtas, D.H., Arnal, R.D.,
Extreme imaging: Macromolecular imaging using x-ray free-electron lasers,
ICVNZ16(1-6)
IEEE DOI 1701
Crystallography BibRef

Štepka, K.[Karel], Maška, M.[Martin], Pálenik, J.J.[Jakub Jozef], Pospíchalová, V.[Vendula], Kotrbová, A.[Anna], Ilkovics, L.[Ladislav], Klemová, D.[Dobromila], Hampl, A.[Aleš], Bryja, V.[Vítezslav], Matula, P.[Pavel],
Automatic Detection and Segmentation of Exosomes in Transmission Electron Microscopy,
BioImage16(I: 318-325).
Springer DOI 1611
BibRef

Colabrese, S., Castello, M., Vicidomini, G., Del Bue, A.,
Learning-based approach to boost detection rate and localisation accuracy in single molecule localisation microscopy,
ICIP16(3184-3188)
IEEE DOI 1610
Diffraction BibRef

Gong, Y., Doerschuk, P.C.,
3-D understanding of electron microscopy images of nano bio objects by computing generative mechanical models,
ICIP16(3161-3165)
IEEE DOI 1610
Biological system modeling BibRef

Michels, Y., Baudrier, É.,
Retrieving the parameters of cryo Electron Microscopy dataset in the heterogeneous ab-initio case,
ICIP16(3189-3193)
IEEE DOI 1610
Estimation BibRef

Lin, Y.Z.[You-Zuo], Kandel, Y.[Yudhishthir], Zotta, M.[Matthew], Lifshin, E.[Eric],
SEM resolution improvement using semi-blind restoration with hybrid L1-L2 regularization,
Southwest16(33-36)
IEEE DOI 1605
Scanning electron microscopy. Image resolution BibRef

Parag, T., Ciresan, D.C., Giusti, A.,
Efficient Classifier Training to Minimize False Merges in Electron Microscopy Segmentation,
ICCV15(657-665)
IEEE DOI 1602
Algorithm design and analysis BibRef

Wang, Q.[Qiu], Doerschuk, P.C.[Peter C.],
3-D image reconstruction for bio nanomachines with helical symmetry: Image formation theory,
ICIP15(892-896)
IEEE DOI 1512
cryo electron microscopy BibRef

Gong, Y.[Yunye], Doerschuk, P.C.[Peter C.],
Determining fluctuation in bio-nanomachines from electron microscopy images,
ICIP15(262-265)
IEEE DOI 1512
cryo electron microscopy BibRef

Shenoy, R.[Renuka], Shih, M.C.[Min-Chi], Rose, K.[Kenneth],
Segmentation of cells in electron microscopy images through multimodal label transfer,
ICIP15(103-107)
IEEE DOI 1512
Electron Microscopy; Multimodal; Segmentation BibRef

Xu, X.P.[Xiao-Ping], Page, C.[Christopher], Volkmann, N.[Niels],
Efficient Extraction of Macromolecular Complexes from Electron Tomograms Based on Reduced Representation Templates,
CAIP15(I:423-431).
Springer DOI 1512
BibRef

Sousa, R.G.[Ricardo Gamelas], Esteves, T.[Tiago], Rocha, S.[Sara], Figueiredo, F.[Francisco], Quelhas, P.[Pedro], Silva, L.M.[Luís M.],
Automatic Detection of Immunogold Particles from Electron Microscopy Images,
ICIAR15(377-384).
Springer DOI 1507
BibRef

Habibullah, Rehman, O.U.[Obaid Ur], Pota, H.R., Petersen, I.R.,
Internal reference model based optimal LQG controller for atomic force microscope,
ICARCV12(294-299).
IEEE DOI 1304
BibRef

Lind, J.[Jonathan], Rollett, A.D.[Anthony D.], Pokharel, R.[Reeju], Hefferan, C.[Christopher], Li, S.F.[Shiu-Fai], Lienert, U.[Ulrich], Suter, R.[Robert],
Image processing in experiments on, and simulations of plastic deformation of polycrystals,
ICIP14(4877-4881)
IEEE DOI 1502
Diffraction BibRef

Egelman, E.H.[Edward H.],
New advances in imaging polymers at near-atomic resolution,
ICIP14(2071-2074)
IEEE DOI 1502
Detectors BibRef

Wang, Y.F.[Yun-Feng], Kilpatrick, J.I.[Jason I.], Jarvis, S.P.[Suzanne P.], Boland, F.[Frank], Kokaram, A.[Anil], Corrigan, D.[David],
Automated registration of low and high resolution atomic force microscopy images using scale invariant features,
ICIP14(5866-5870)
IEEE DOI 1502
Atomic force microscopy BibRef

Le Guen, V.[Vincent], Paul, N.[Nicolas],
A Scanning Electron Microscope image segmentation method for steam generator fouling rate estimation,
ICIP14(4447-4451)
IEEE DOI 1502
Clustering algorithms BibRef

Thierry, R.[Raphael], Kirschmann, M.[Moritz], Hummel, E.[Eric], Hawes, C.[Chris], Genoud, C.[Christel],
Demon registration for 3D images obtained by serial block face scanning electron microscopy,
ICIP14(3587-3591)
IEEE DOI 1502
Algorithm design and analysis BibRef

Nam, D.[David], Mantell, J.[Judith], Hodgson, L.[Lorna], Bull, D.[David], Verkade, P.[Paul], Achim, A.[Alin],
Feature-based registration for correlative light and electron microscopy images,
ICIP14(3567-3571)
IEEE DOI 1502
Image registration BibRef

Sorzano, C.O.S., Vargas, J., Oton, J., Abrishami, V., de la Rosa-Trevin, J.M., del Riego, S., Fernandez-Alderete, A., Martinez-Rey, C., Marabini, R., Carazo, J.M.,
An image processing approach to the simulation of electron microscopy volumes of atomic structures,
ICIP14(2095-2099)
IEEE DOI 1502
Atomic clocks BibRef

Jin, Q.[Qiyu], Sorzano, C.O.S.[Carlos Oscar Sanchez], Callebaut, I.[Isabelle], Tama, F.[Florence], Jonic, S.[Slavica],
Elastic image registration to fully explore macromolecular dynamics by electron microscopy,
ICIP14(2075-2079)
IEEE DOI 1502
Assembly BibRef

Tafti, A.P.[A. Pahlavan], Kirkpatrick, A.B., Owen, H.A., Yu, Z.,
3D Microscopy Vision Using Multiple View Geometry and Differential Evolutionary Approaches,
ISVC14(II: 141-152).
Springer DOI 1501
BibRef

Roels, J.[Joris], Aelterman, J.[Jan], De Vylder, J.[Jonas], Luong, H.[Hiep], Saeys, Y.[Yvan], Lippens, S.[Saskia], Philips, W.[Wilfried],
Noise Analysis and Removal in 3D Electron Microscopy,
ISVC14(I: 31-40).
Springer DOI 1501
BibRef

Iwahori, Y.[Yuji], Funahashi, K.[Kenji], Woodham, R.J.[Robert J.], Bhuyan, M.K.,
Neural Network Based Image Modification for Shape from Observed SEM Images,
ICPR14(2131-2136)
IEEE DOI 1412
Scanning Electron Microscope. BibRef

Azadi, S.[Samaneh], Maitin-Shepard, J.[Jeremy], Abbeel, P.[Pieter],
Optimization-Based Artifact Correction for Electron Microscopy Image Stacks,
ECCV14(II: 219-235).
Springer DOI 1408
BibRef

Veeraraghavan, A.[Ashok], Genkin, Alex.V., Vitaladevuni, S.[Shiv], Scheffer, L.[Lou], Xu, S.[Shan], Hess, H.[Harald], Fetter, R.[Richard], Cantoni, M.[Marco], Knott, G.[Graham], Chklovskii, D.[Dmitri],
Increasing depth resolution of electron microscopy of neural circuits using sparse tomographic reconstruction,
CVPR10(1767-1774).
IEEE DOI Video of talk:
WWW Link. 1006
BibRef

Kim, D.S.[Dong Sik],
Intensity compensation of the mitochondria tilted image sequence obtained from the transmission electron microscopy,
ICIP09(1777-1780).
IEEE DOI 0911
BibRef

Mendizibal, A., Cabrera, J., Salgado, L., Garcia, N., Gonzalez, J.C.,
Unsupervised segmentation algorithm of HRTEM images,
ICIP04(IV: 2757-2760).
IEEE DOI 0505
high resolution transmission electron microscopy. BibRef

Bilbao-Castro, J.R., Carazo, J.M., Garcia, L., Fernandez, J.J.,
Parallel iterative reconstruction methods for structure determination of biological specimens by electron microscopy,
ICIP03(I: 565-568).
IEEE DOI 0312
BibRef

Zheng, Y., Yin, Z.[Zbye], Doerscbuk, P.C.,
3-d maximum likelihood reconstructions of viruses from cryo electron microscope images and parallel computation,
ICIP02(II: 617-620).
IEEE DOI 0210
BibRef

Matuszewski, B.J., Shark, L.K.,
Hierarchical Iterative Bayesian Approach to Automatic Recognition of Biological Viruses in Electron Microscope Images,
ICIP01(II: 347-350).
IEEE DOI 0108
BibRef

Skoglund, U., Ofverstedt, L.G.,
Image 3-D Reconstruction from Electron Micrographs,
SSAB97(Medical) 9703
BibRef

Saad, A., Chiu, W., Thuman-Commike, P.A.,
Multiresolution approach to automatic detection of spherical particles from electron cryomicroscopy images,
ICIP98(III: 846-850).
IEEE DOI 9810
BibRef

Thuman-Commike, P., and Chiu, W.,
Three-Dimensional Reconstruction of Noisy Electron Microscopy Virus Particle Images,
ICIP97(I: 173-176).
IEEE DOI BibRef 9700
Earlier:
Detection of virus particles in noisy spot-scan electron cryomicroscopy images,
ICIP95(III: 168-171).
IEEE DOI 9510
BibRef

Van Dyck, D., Op de Beeck, M.,
How image processing can push electron microscopy to its limits,
ICIP95(III: 41-44).
IEEE DOI 9510
BibRef

Van Dyck, D., Op de Beeck, M., Tang, D., Jansen, J., Zandbergen, H.W.,
A global entropy criterion for focus tuning in exit wavefunction reconstruction in high resolution electron microscopy,
ICIP96(I: 737-740).
IEEE DOI 9610
BibRef

Van Dyck, D., Op de Beeck, M., Coene, W.,
Object wavefunction reconstruction in high resolution electron microscopy,
ICIP94(III: 295-298).
IEEE DOI 9411
BibRef

Cop, M., Dengler, J.,
A multiresolution approach to the 3D reconstruction of a 50S ribosome from an EM-tilt series solving the alignment problem without gold particles,
ICPR90(I: 733-737).
IEEE DOI 9006
electron microscopy BibRef

Chapter on Computational Vision, Regularization, Connectionist, Morphology, Scale-Space, Perceptual Grouping, Wavelets, Color, Sensors, Optical, Laser, Radar continues in
Phase Unwrapping, Stereo Depth unwrapping .


Last update:Sep 18, 2017 at 11:34:11