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Optical imaging, Training, Electron optics, Deep learning,
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Scanning electron microscopy, Optical imaging, Strain,
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CleftNet: Augmented Deep Learning for Synaptic Cleft Detection From
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2112
Feature extraction, Synapses, Task analysis, Logic gates,
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2201
Materials science and technology, Image analysis, Data analysis,
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Weakly Supervised Learning for Joint Image Denoising and Protein
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2202
Proteins, Training, Image segmentation,
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2205
Signal to noise ratio, Noise measurement, Autocorrelation,
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Compactification of the Rigid Motions Group in Image Processing,
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2212
Serial section transmission electron microscopy.
Image restoration, Optical imaging, Adaptive optics,
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Regularizing Orientation Estimation in Cryogenic Electron Microscopy
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Joint Motion-Correction and Reconstruction in Cryo-Em Tomography,
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IEEE DOI
2211
Image resolution, Limiting, Tomography, Fiducial markers,
Iterative methods, Image reconstruction,
Computational Imaging
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Huang, Q.[Qinwen],
Zhou, Y.[Ye],
Liu, H.F.[Hsuan-Fu],
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Accurate Detection of Proteins in Cryo-Electron Tomograms from Sparse
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ECCV22(XXI:644-660).
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2211
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Levy, A.[Axel],
Poitevin, F.[Frédéric],
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Nashed, Y.[Youssef],
Peck, A.[Ariana],
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Dunne, M.[Mike],
Wetzstein, G.[Gordon],
CryoAI: Amortized Inference of Poses for Ab Initio Reconstruction of 3D
Molecular Volumes from Real Cryo-EM Images,
ECCV22(XXI:540-557).
Springer DOI
2211
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Wang, T.Y.[Tian-Yang],
Li, B.[Bo],
Zhang, J.[Jing],
Zeng, X.R.[Xiang-Rui],
Uddin, M.R.[Mostofa Rafid],
Wu, W.[Wei],
Xu, M.[Min],
Deep Active Learning for Cryo-Electron Tomography Classification,
ICIP22(1611-1615)
IEEE DOI
2211
Training, Uniform resource locators, Solid modeling, Uncertainty,
Tomography, Rendering (computer graphics), Deep active learning,
Classification
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Yu, Z.[Zifan],
Trindade, B.M.[Bruno Machado],
Green, M.[Michael],
Zhang, Z.[Zhikang],
Sneha, P.[Pullela],
Tavakoli, E.B.[Erfan Bank],
Pawlowicz, C.[Christopher],
Ren, F.[Fengbo],
A Data-Driven Approach for Automated Integrated Circuit Segmentation
of Scan Electron Microscopy Images,
ICIP22(2851-2855)
IEEE DOI
2211
Integrated circuits, Image segmentation,
Scanning electron microscopy, Wires, Industry applications,
integrated circuit segmentation
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Han, H.Q.[Hong-Qing],
Dmitrieva, M.[Mariia],
Sauer, A.[Alexander],
Tam, K.H.[Ka Ho],
Rittscher, J.[Jens],
Self-Supervised Voxel-Level Representation Rediscovers Subcellular
Structures in Volume Electron Microscopy,
CVMI22(1873-1882)
IEEE DOI
2210
Representation learning, Measurement, Solid modeling,
Image segmentation, Biological system modeling
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Kniesel, H.[Hannah],
Ropinski, T.[Timo],
Bergner, T.[Tim],
Devan, K.S.[Kavitha Shaga],
Read, C.[Clarissa],
Walther, P.[Paul],
Ritschel, T.[Tobias],
Hermosilla, P.[Pedro],
Clean Implicit 3D Structure from Noisy 2D STEM Images,
CVPR22(20730-20740)
IEEE DOI
2210
Training, Solid modeling, Transmission electron microscopy,
Microscopy, Data models, Noise measurement, Medical,
Self- semi- meta- unsupervised learning
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He, B.[Bintao],
Zhang, F.[Fa],
Zhang, H.[Huanshui],
Han, R.[Renmin],
A Hybrid Frequency-Spatial Domain Model for Sparse Image
Reconstruction in Scanning Transmission Electron Microscopy,
ICCV21(2662-2671)
IEEE DOI
2203
Scanning electron microscopy, Transmission electron microscopy,
Frequency-domain analysis, Microscopy, Computational modeling,
Optimization and learning methods
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Zeng, Y.C.[Yu-Chen],
Howe, G.[Gregory],
Yi, K.[Kai],
Zeng, X.[Xiangrui],
Zhang, J.[Jing],
Chang, Y.W.[Yi-Wei],
Xu, M.[Min],
Unsupervised Domain Alignment Based Open Set Structural Recognition
of Macromolecules Captured By Cryo-Electron Tomography,
ICIP21(106-110)
IEEE DOI
2201
Deep learning, Image recognition, Systematics, Image analysis,
Training data, Tomography, Cryo-Electron Tomography, Open-set learning
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Xin, T.[Tong],
Chen, B.[Bohao],
Chen, X.[Xi],
Han, H.[Hua],
UTR: Unsupervised Learning of Thickness-Insensitive Representations
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ICIP21(155-159)
IEEE DOI
2201
Image registration, Scanning electron microscopy, Neurites,
Neural circuits, Morphology, Feature extraction,
FIB-SEM
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Fan, Y.F.[Yi-Feng],
Zhao, Z.Z.[Zhi-Zhen],
Cryo-Electron Microscopy Image Denoising Using Multi-Frequency Vector
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ICIP21(3463-3467)
IEEE DOI
2201
Interpolation, Noise reduction, Signal processing algorithms,
Signal processing, Image reconstruction, Image denoising,
image denoising
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Watkins, L.[Luisa],
Seidel, S.W.[Sheila W.],
Peng, M.[Minxu],
Agarwal, A.[Akshay],
Yu, C.C.[Christopher C.],
Goyal, V.K.[Vivek K],
Robustness of Time-Resolved Measurement to Unknown and Variable Beam
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ICIP21(3487-3491)
IEEE DOI
2201
Scanning electron microscopy, Particle beams, Correlation,
Particle beam measurements, Atmospheric measurements,
scanning electron microscopy
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Friedrich, T.[Thomas],
Yu, C.P.[Chu-Ping],
Verbeek, J.[Johan],
Pennycook, T.[Timothy],
van Aert, S.[Sandra],
Phase Retrieval from 4-Dimensional Electron Diffraction Datasets,
ICIP21(3453-3457)
IEEE DOI
2201
Training, Electric potential, Sensitivity,
Convolutional neural networks, Electron microscopy, CBED
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Monardo, V.[Vincent],
Iyer, A.[Abhiram],
Donegan, S.[Sean],
de Graef, M.[Marc],
Chi, Y.[Yuejie],
Plug-And-Play Image Reconstruction Meets Stochastic Variance-Reduced
Gradient Methods,
ICIP21(2868-2872)
IEEE DOI
2201
Gradient methods, Image coding, Runtime, Superresolution,
Stochastic processes, Electron microscopy, plug-and-play, image reconstruction
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Scanning electron microscopy,
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Accurate Segmentation of Synaptic Cleft with Contour Growing
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ICIP19(1420-1424)
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NTIRE17(1084-1092)
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cryo electron microscopy
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Chapter on Computational Vision, Regularization, Connectionist, Morphology, Scale-Space, Perceptual Grouping, Wavelets, Color, Sensors, Optical, Laser, Radar continues in
Phase Unwrapping, Stereo Depth unwrapping .