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0610
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Park, B.G.[Bo Gun],
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0609
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0512
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CVPR05(I: 1063-1070).
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Chen, H.T.[Hwann-Tzong],
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0510
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Horiuchi, T.,
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0409
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Leow, A.,
Chiang, M.C.[Ming-Chang],
Protas, H.,
Thompson, P.,
Vese, L.,
Huang, H.S.C.,
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ICPR04(III: 710-713).
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0409Matching points, curves, surfaces.
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0307
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Minimum risk distance measure for object recognition,
ICCV03(242-248).
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0311
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Herbin, S.,
Similarity measures between feature maps:
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Texture02(67-72).
0207
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Niblack, C.W.,
Yin, J.,
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ICIP95(III: 352-355).
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9510
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Tanaka, E.[Eiichi],
Awano, H.[Hiroaki],
Masuda, S.[Sumio],
A proximity measure of line drawings for comparison of chemical
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CAIP93(291-298).
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9309
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Washio, N.[Nobuyuki],
Tanaka, E.[Eiichi],
Masuda, S.[Sumio],
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CAIP93(322-326).
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9309
BibRef
Ambroszkiewicz, S.[Stanislaw],
Primitive and compound patterns,
CAIP93(317-321).
WWW Version.
9309
BibRef
Chapter on 2-D Feature Analysis, Extraction and Representations, Shape, Skeletons, Texture continues in
Closest Point Algorithms, ICP, Iterative Closest Point .