6.4.4.5 Ellipse Detection, Ellipse Fitting, Elliptical Shapes

Chapter Contents (Back)
Ellipse.

Nakagawa, Y., and Rosenfeld, A.,
A Note on Polygonal and Elliptical Approximation of Mechanical Parts,
PR(11), No. 2, 1979, pp. 133-142.
WWW Version. BibRef 7900

Schatzki, T.F., Grossman, A., and Young, R.,
Recognition of Agricultural Objects by Shape,
PAMI(5), No. 6, November 1983, pp. 645-653. Look for elliptical objects -- luggage Xray images. BibRef 8311

Porrill, J.,
Fitting Ellipses and Predicting Confidence Envelopes Using a Bias Corrected Kalman Filter,
IVC(8), No. 1, February 1990, pp. 37-41.
WWW Version. BibRef 9002

Pollard, S., Porrill, J.,
Robust Recovery of 3D Ellipse Data,
BMVC92(xx-yy).
PDF Version. 9209 BibRef

Van-Ban, L., and Lee, D.T.,
Out-of-Roundness Problem Revisited,
PAMI(13), No. 3, March 1991, pp. 217-223.
IEEE Abstract. IEEE Top Reference.
WWW Version. Voronoi. BibRef 9103

Chaudhuri, B.B., Samanta, G.P.,
Elliptic Fit of Objects in Two and Three Dimensions by Moment of Inertia Optimization,
PRL(12), 1991, pp. 1-7. BibRef 9100

Ellis, T.[Tim], Abbood, A.[Ahmed], Brillault, B.[Beatrice],
Ellipse Detection and Matching with Uncertainty,
IVC(10), No. 5, June 1992, pp. 271-276.
WWW Version. BibRef 9206
Earlier: BMVC91(xx-yy).
PDF Version. 9109 BibRef

Rosin, P.L.,
Ellipse Fitting by Accumulating Five-Point Fits,
PRL(14), 1993, pp. 661-669. BibRef 9300

Rosin, P.L.[Paul L.],
Further Five-Point Fit Ellipse Fitting,
GMIP(61), No. 5, September 1999, pp. 245-259. BibRef 9909
Earlier: BMVC97(xx-yy).
HTML Version.
PDF Version. BibRef

Rosin, P.L.,
A Note on the Least Squares Fitting of Ellipses,
PRL(14), 1993, pp. 799-808. BibRef 9300

Rosin, P.L.,
Analyzing Error of Fit Functions for Ellipses,
PRL(17), No. 14, December 30 1996, pp. 1461-1470. 9702 BibRef
Earlier: (British spelling, with "S") BMVC96(Poster Session 2). 9608
PDF Version. Brunel University BibRef

Rosin, P.L.,
Assessing Error of Fit Functions for Ellipses,
GMIP(58), No. 5, September 1996, pp. 494-502. 9611 BibRef

Rosin, P.L.[Paul L.],
Ellipse Fitting Using Orthogonal Hyperbolae and Stirling's Oval,
GMIP(60), No. 3, May 1998, pp. p209-213. BibRef 9805

Rosin, P.L.[Paul L.],
Fitting Superellipses,
PAMI(22), No. 7, July 2000, pp. 726-732.
IEEE Abstract. IEEE Top Reference.
WWW Version. 0008 BibRef

Yoo, J.H., Sethi, I.K.,
An Ellipse Detection Method from the Polar and Pole Definition of Conics,
PR(26), No. 2, February 1993, pp. 307-315.
WWW Version. BibRef 9302

Wu, W.Y., Wang, M.J.J.,
Elliptical Object Detection by Using Its Geometric Properties,
PR(26), No. 10, October 1993, pp. 1499-1509.
WWW Version. BibRef 9310

Aguado, A.S., Montiel, M.E., Nixon, M.S.,
On Using Directional Information for Parameter Space Decomposition in Ellipse Detection,
PR(29), No. 3, March 1996, pp. 369-381.
WWW Version. BibRef 9603

Ho, C.T., Chen, L.H.,
A High-Speed Algorithm for Elliptic Object Detection,
IP(5), No. 3, March 1996, pp. 547-550.
IEEE DOI may work or IEEE-CS DOI may work. BibRef 9603

Cui, Y.T., Weng, J., Reynolds, H.,
Estimation of Ellipse Parameters Using Optimal Minimum-Variance Estimator,
PRL(17), No. 3, March 6 1996, pp. 309-316. BibRef 9603

Cabrera, J., Meer, P.,
Unbiased Estimation of Ellipses by Bootstrapping,
PAMI(18), No. 7, July 1996, pp. 752-756.
IEEE Abstract. IEEE Top Reference.
WWW Version. 9608 BibRef

Safaee-Rad, R., Smith, K.C., Benhabib, B., Tchoukanov, I.,
Application of Moment and Fourier Descriptors to the Accurate Estimation of Elliptical-Shape Parameters,
PRL(13), 1992, pp. 497-508. BibRef 9200

Lee, R., Lu, P.C., Tsai, W.H.,
Moment Preserving Detection of Elliptical Shapes in Gray-Scale Images,
PRL(11), 1990, pp. 405-414. BibRef 9000

Sheu, H.T., Chen, H.Y., Hu, W.C.,
Consistent Symmetrical Axis Method for Robust Detection of Ellipses,
VISP(144), No. 6, December 1997, pp. 332-338. 9806 BibRef

Lei, Y.[Yiwu], Wong, K.C.[Kok Cheong],
Ellipse detection based on symmetry,
PRL(20), No. 1, January 1999, pp. 41-47. BibRef 9901

Daul, C., Graebling, P., Hirsch, E.,
From the Hough Transform to a New Approach for the Detection and Approximation of Elliptical Arcs,
CVIU(72), No. 3, December 1998, pp. 215-236.
WWW Version. BibRef 9812

Fitzgibbon, A.W., Pilu, M., Fisher, R.B.,
Direct Least Square Fitting of Ellipses,
PAMI(21), No. 5, May 1999, pp. 476-480.
IEEE Abstract. IEEE Top Reference.
WWW Version. BibRef 9905 Edinburgh BibRef
Earlier:
Direct Least Squares Fitting of Ellipses,
ICPR96(I: 253-257).
IEEE DOI may work or IEEE-CS DOI may work. 9608 BibRef
And: DAIResearch Paper No. 794, January 1996.
HTML Version. 9605(Univ. of Edinburgh, UK) BibRef

Pilu, M.[Maurizio], Fitzgibbon, A.W., Fisher, R.B.,
Ellipse-Specific Direct Least-Square Fitting,
ICIP96(III: 599-602).
IEEE DOI may work or IEEE-CS DOI may work. BibRef 9600
And: DAINo. 806, May 1996. BibRef EdinburghDirectly solved by a generalized eigen-system. Includes Matlab code. Code, Ellipse Fitting. BibRef

Fitzgibbon, A.W., Fisher, R.B.,
A Buyer's Guide to Conic Fitting,
DAINo. 810, May 1996. BibRef 9605
And: BMVC95(xx).
PDF Version. BibRef EdinburghEvaluation of several different methods for conic fitting. See also Buyer's Guide to Euclidean Elliptical Cylindrical and Conical Surface Fitting, A. BibRef

Carvalho, P., Costa, N., Ribeiro, B., Dourado, A.,
On the Use of Neural Networks and Geometrical Criteria for Localisation of Highly Irregular Elliptical Shapes,
PAA(2), No. 4, 1999, pp. 321-342. 9911 BibRef

Žunic, J.[Joviša], Sladoje, N.[Nataša],
Efficiency of Characterizing Ellipses and Ellipsoids by Discrete Moments,
PAMI(22), No. 4, April 2000, pp. 407-414.
IEEE Abstract. IEEE Top Reference.
WWW Version. 0006 BibRef
Earlier:
A characterization of digital disks by discrete moments,
CAIP97(582-589).
WWW Version. 9709 BibRef

Sewisy, A.A.[Adel A.], Leberl, F.W.[Franz W.],
Detection ellipses by finding lines of symmetry in the images via an hough transform applied to straight lines,
IVC(19), No. 12, October 2001, pp. 857-866.
WWW Version. 0110 BibRef

Zhu, C.R.[Chang-Ren], Wang, R.S.[Run-Sheng],
A fast automatic extraction algorithm of elliptic object groups from remote sensing images,
PRL(25), No. 13, 1 October 2004, pp. 1471-1478.
WWW Version. 0410 BibRef

Zhang, S.C.[Si-Cheng], Liu, Z.Q.A.[Zhi-Qi-Ang],
A robust, real-time ellipse detector,
PR(38), No. 2, February 2005, pp. 273-287.
WWW Version. 0411 BibRef

Harker, M.J.[Matthew J.], O'Leary, P.L.[Paul L.], Zsombor-Murray, P.[Paul],
Direct type-specific conic fitting and eigenvalue bias correction,
IVC(26), No. 3, 3 March 2008, pp. 372-381.
WWW Version. 0801Curve fitting; Conics; Constrained least squares BibRef

Harker, M.J.[Matthew J.], O'Leary, P.L.[Paul L.],
Least squares surface reconstruction from measured gradient fields,
CVPR08(1-7).
IEEE DOI may work or IEEE-CS DOI may work. 0806 BibRef

O'Leary, P.L., Harker, M.J., Zsombor-Murray, P.,
Direct and least square fitting of coupled geometric objects for metric vision,
VISP(152), No. 6, December 2005, pp. 687-694.
WWW Version. 0512 BibRef
Earlier: A2, A1, A3:
Direct and Specific Fitting of Conics to Scattered Data,
BMVC04(xx-yy).
HTML Version. 0508 BibRef

Liu, Z.Y.[Zhi-Yong], Qiao, H.[Hong], Xu, L.[Lei],
Multisets mixture learning-based ellipse detection,
PR(39), No. 4, April 2006, pp. 731-735.
WWW Version. 0604Ellipse detection; Multisets mixture learning; Hough transform BibRef

Kanatani, K.[Kenichi],
Ellipse Fitting with Hyperaccuracy,
IEICE(E89-D), No. 10, October 2006, pp. 2653-2660.
WWW Version. 0610 BibRef
Earlier: ECCV06(I: 484-495).
WWW Version. 0608 BibRef

Maybank, S.J.[Stephen J.],
Application of the Fisher-Rao Metric to Ellipse Detection,
IJCV(72), No. 3, May 2007, pp. 287-307.
WWW Version. 0702 See also Application of the Fisher-Rao Metric to Structure Detection. BibRef

Qiao, Y.[Yu], Ong, S.H.,
Arc-based evaluation and detection of ellipses,
PR(40), No. 7, July 2007, pp. 1990-2003.
WWW Version. 0704Ellipse verification; Ellipse detection; Elliptic arc; Model-based distance; Connectivity; Angular connectivity See also Connectivity-based multiple-circle fitting. BibRef

Rosin, P.L.[Paul L.],
Evaluating Harker and O'Leary's distance approximation for ellipse fitting,
PRL(28), No. 13, 1 October 2007, pp. 1804-1807.
WWW Version. 0709Distance approximation; Ellipse fitting; Evaluation See also Direct and least square fitting of coupled geometric objects for metric vision. BibRef

Lu, W.[Wei], Tan, J.[Jinglu],
Detection of incomplete ellipse in images with strong noise by iterative randomized Hough transform (IRHT),
PR(41), No. 4, April 2008, pp. 1268-1279.
WWW Version. 0801Curve detection; Randomized Hough transform; Hough transform; Image processing; Ellipse; Ultrasound; Fetal head BibRef

Mai, F., Hung, Y.S., Zhong, H., Sze, W.F.,
A Hierarchical Approach for Fast and Robust Ellipse Extraction,
PR(41), No. 8, August 2008, pp. 2512-2524.
WWW Version. 0805 BibRef
Earlier: ICIP07(V: 345-348).
IEEE DOI may work or IEEE-CS DOI may work. 0709Ellipse extraction; Elliptic arcs; Arc segments; RANSAC BibRef

Hahn, K.S.[Kwang-Soo], Jung, S.C.[Sung-Cheol], Han, Y.J.[Young-Joon], Hahn, H.S.[Hern-Soo],
A new algorithm for ellipse detection by curve segments,
PRL(29), No. 13, 1 October 2008, pp. 1836-1841.
WWW Version. 0804Ellipse fitting; Curve segments; Occluded object BibRef


Libuda, L.[Lars], Grothues, I.[Ingo], Kraiss, K.F.[Karl-Friedrich],
Ellipse Detection in Digital Image Data Using Geometric Features,
VISAPP06(229-239).
WWW Version. 0711 BibRef

Marquez, J., Ramirez, W., Boyer, L., Delmas, P.,
Robust Ellipsoidal Model Fitting of Human Heads,
RobVis08(381-390).
WWW Version. 0802 BibRef

Stojmenovic, M.[Milos], Nayak, A.[Amiya],
Direct Ellipse Fitting and Measuring Based on Shape Boundaries,
PSIVT07(221-235).
WWW Version. 0712 See also Measuring Elongation from Shape Boundary. BibRef

de la Fraga, L.G.[Luis Gerardo], Silva, I.V.[Israel Vite], Cruz-Cortés, N.[Nareli],
Euclidean Distance Fit of Ellipses with a Genetic Algorithm,
EvoIASP07(359-366).
WWW Version. 0704 BibRef

Chia, A.Y.S.[Alex Yong Sang], Leung, M.K.H.[Maylor K. H.], Eng, H.L.[How-Lung], Rahardja, S.[Susanto],
Ellipse Detection with Hough Transform in One Dimensional Parametric Space,
ICIP07(V: 333-336).
IEEE DOI may work or IEEE-CS DOI may work. 0709 BibRef

Abou-Moustafa, K.T.[Karim T.], Ferrie, F.P.[Frank P.],
The Minimum Volume Ellipsoid Metric,
DAGM07(335-344).
WWW Version. 0709 BibRef

Wang, C.L.[Cui-Lan], Newman, T.S.[Timothy S.], Cao, C.G.[Chun-Guang],
New Hypothesis Distinctiveness Measure for Better Ellipse Extraction,
ICIAR07(176-186).
WWW Version. 0708 BibRef

Jiang, X.Y.[Xiao-Yi], Cheng, D.C.[Da-Chuan],
Fitting of 3D circles and ellipses using a parameter decomposition approach,
3DIM05(103-109).
IEEE DOI may work or IEEE-CS DOI may work. 0508 BibRef

Song, G.[Ge], Wang, H.[Hong],
A Fast and Robust Ellipse Detection Algorithm Based on Pseudo-random Sample Consensus,
CAIP07(669-676).
WWW Version. 0708 BibRef

Ouellet, J.N.[Jean-Nicolas], Hebert, P.[Patrick],
A Simple Operator for Very Precise Estimation of Ellipses,
CRV07(21-28).
IEEE DOI may work or IEEE-CS DOI may work. 0705 BibRef

Wong, S.T.S.[Sam Tak-Sum], Leung, H., Ip, H.H.S.[Horace Ho-Shing],
Fitting Ellipses to a Region with Application in Calligraphic Stroke Reconstruction,
ICIP06(397-400). 0610
IEEE DOI may work or IEEE-CS DOI may work. BibRef

Cao, C.G.[Chun-Guang], Newman, T.S.[Timothy S.],
New RHT-Based Ellipsoid Recovery Method,
ICPR06(I: 622-625).
WWW Version. 0609 BibRef

Yao, J.[Jie], Kharma, N., Grogono, P.,
Fast robust GA-based ellipse detection,
ICPR04(II: 859-862).
IEEE DOI may work or IEEE-CS DOI may work. 0409 BibRef

Xie, Y.[Yonghong], Ji, Q.A.[Qi-Ang],
A new efficient ellipse detection method,
ICPR02(II: 957-960).
IEEE DOI may work or IEEE-CS DOI may work. 0211 BibRef

Ciobanu, A.[Adrian], Shahbazkia, H.[Hamid], du Buf, H.[Hans],
Contour Profiling by Dynamic Ellipse Fitting,
ICPR00(Vol III: 750-753).
IEEE DOI may work or IEEE-CS DOI may work.
HTML Version. 0009 BibRef

Matei, B.[Bogdan], Meer, P.[Peter],
Reduction of Bias in Maximum Likelihood Ellipse Fitting,
ICPR00(Vol III: 794-798).
IEEE DOI may work or IEEE-CS DOI may work.
HTML Version. 0009 BibRef

Vincze, M., Ayromlou, M., Zillich, M.,
Fast Tracking of Ellipses Using Edge-projected Integration of Cues,
ICPR00(Vol IV: 72-75).
IEEE DOI may work or IEEE-CS DOI may work.
HTML Version. 0009 BibRef

Scaggiante, A., Frezza, R., Zampato, M.,
Identifying and tracking ellipses: a technique based on elliptical deformable templates,
CIAP99(582-587).
IEEE DOI may work or IEEE-CS DOI may work. 9909 BibRef

Ji, Q.A.[Qi-Ang], Haralick, R.M.[Robert M.],
A Statistically Efficient Method for Ellipse Detection,
ICIP99(II:730-734).
IEEE Abstract. IEEE Top Reference. BibRef 9900

Heikkila, J.[Janne],
Moment and Curvature Preserving Technique for Accurate Ellipse Boundary Detection,
ICPR98(Vol I: 734-737).
IEEE DOI may work or IEEE-CS DOI may work. 9808 BibRef

Kawaguchi, T.[Tsuyoshi], Nagata, R.I.[Ryo-Ich],
Ellipse detection using a genetic algorithm,
ICPR98(Vol I: 141-145).
IEEE DOI may work or IEEE-CS DOI may work. 0403 BibRef
And:
Ellipse detection using grouping of edgels into line-support regions,
ICIP98(III: 70-74).
IEEE DOI may work or IEEE-CS DOI may work. 9810 BibRef

Weiss, I.[Isaac], Rosenfeld, A.[Azriel],
A Simple Method of Ellipse Detection,
UMDTR3717, December 1996.
WWW Version.
WWW Version. Midpoints of pairs of opposite facing edges on each row of the image and Hough to detect collinear sets of these midpoints. BibRef 9612

Werghi, N.[Naoufel], Doignon, C., Abba, G.,
Ellipse Fitting and Three-Dimensional Localization of Objects Based on Elliptic Features,
ICIP96(II: 57-60 vol1).
IEEE DOI may work or IEEE-CS DOI may work. BibRef 9600 ICIP96(I: 57-60). 9610 BibRef

Cui, Y.T.[Yun-Tao], Weng, J.[John], Reynolds, H.[Herbert],
Optimal parameter estimation of ellipses,
CIAP95(471-476).
WWW Version. 9509 BibRef

Wen, W.[Wei], Yuan, B.Z.[Bao-Zong],
Detection of Partial Ellipses Using Seperate Parameters Estimation Techniques,
BMVC94(xx-yy).
PDF Version. 9409 BibRef

Masciangelo, S.,
3-D cues from a single view: detection of elliptical arcs and model-based perspective backprojection,
BMVC90(xx-yy).
PDF Version. 9009 BibRef

Wang, R., Hanson, A.R., Riseman, E.M.,
Fast Extraction of Ellipses,
ICPR88(I: 508-510).
IEEE DOI may work or IEEE-CS DOI may work.
IEEE Top Reference. BibRef 8800

Cyganski, D., Orr, J.A.,
Parameterization of Planar Contours for Elliptic Decomposition and Determination of Affine Transforms,
CAIA84(161-166). BibRef 8400

Tsukune, H., and Goto, K.,
Extraction Elliptical Figures for an Edge Vector Field,
CVPR83(138-141). BibRef 8300

Agin, G.J.,
Fitting Ellipses and General Second-Order Curves,
CMU-RI-TR-81-5, 1981. BibRef 8100

Chapter on Edge Detection and Analysis, Lines, Segments, Curves, Corners, Hough Transform continues in
Curvature, Corners, Dominant Points, Salient Points, Junctions .


Last update:Oct 1, 2008 at 09:28:47