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Earlier:
(British spelling, with "S")
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Edinburgh
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ICPR96(I: 253-257).
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DAIResearch Paper No. 794, January 1996.
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DAINo. 806, May 1996.
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9911
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A characterization of digital disks by discrete moments,
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Liu, Z.Y.[Zhi-Yong],
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Cao, C.G.[Chun-Guang],
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Earlier:
Touching Cells Splitting by Using Concave Points and Ellipse Fitting,
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Libuda, L.[Lars],
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Stojmenovic, M.[Milos],
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See also Measuring Elongation from Shape Boundary.
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Chia, A.Y.S.[Alex Yong Sang],
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Abou-Moustafa, K.T.[Karim T.],
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DAGM07(335-344).
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Wang, C.L.[Cui-Lan],
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Jiang, X.Y.[Xiao-Yi],
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Song, G.[Ge],
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Wong, S.T.S.[Sam Tak-Sum],
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0610
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ICPR06(I: 622-625).
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0609
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Yao, J.[Jie],
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ICPR04(II: 859-862).
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0409
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Xie, Y.H.[Yong-Hong],
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0211
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Ciobanu, A.[Adrian],
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Matei, B.[Bogdan],
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Vincze, M.,
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Scaggiante, A.,
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Identifying and tracking ellipses: a technique based on elliptical
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CIAP99(582-587).
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9909
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Heikkila, J.[Janne],
Moment and Curvature Preserving Technique for
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Kawaguchi, T.[Tsuyoshi],
Nagata, R.I.[Ryo-Ich],
Ellipse detection using a genetic algorithm,
ICPR98(Vol I: 141-145).
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0403
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And:
Ellipse detection using grouping of edgels into line-support regions,
ICIP98(III: 70-74).
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9810
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Weiss, I.[Isaac],
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Werghi, N.[Naoufel],
Doignon, C.,
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Ellipse Fitting and Three-Dimensional Localization of
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ICIP96(I: 57-60).
9610
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Cui, Y.T.[Yun-Tao],
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Optimal parameter estimation of ellipses,
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Wen, W.[Wei],
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Detection of Partial Ellipses Using Seperate Parameters Estimation
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9409
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Masciangelo, S.,
3-D cues from a single view: detection of elliptical arcs and
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Wang, R.,
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Fast Extraction of Ellipses,
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Cyganski, D.,
Orr, J.A.,
Parameterization of Planar Contours for Elliptic Decomposition and
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8400
Tsukune, H., and
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Extraction Elliptical Figures for an Edge Vector Field,
CVPR83(138-141).
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Agin, G.J.,
Fitting Ellipses and General Second-Order Curves,
CMU-RI-TR-81-5, 1981.
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Chapter on Edge Detection and Analysis, Lines, Segments, Curves, Corners, Hough Transform continues in
Curvature, Corners, Dominant Points, Salient Points, Junctions .