6.4.4.6 Ellipse Detection, Ellipse Fitting, Elliptical Shapes

Chapter Contents (Back)
Ellipse Fitting. Ellipse Detection.

Nakagawa, Y., and Rosenfeld, A.,
A Note on Polygonal and Elliptical Approximation of Mechanical Parts,
PR(11), No. 2, 1979, pp. 133-142.
WWW Link. BibRef 7900

Schatzki, T.F., Grossman, A., and Young, R.,
Recognition of Agricultural Objects by Shape,
PAMI(5), No. 6, November 1983, pp. 645-653. Look for elliptical objects -- luggage Xray images. BibRef 8311

Porrill, J.,
Fitting Ellipses and Predicting Confidence Envelopes Using a Bias Corrected Kalman Filter,
IVC(8), No. 1, February 1990, pp. 37-41.
WWW Link. BibRef 9002

Pollard, S., Porrill, J.,
Robust Recovery of 3D Ellipse Data,
BMVC92(xx-yy).
PDF File. 9209
BibRef

Van-Ban, L., and Lee, D.T.,
Out-of-Roundness Problem Revisited,
PAMI(13), No. 3, March 1991, pp. 217-223.
IEEE DOI Voronoi. BibRef 9103

Chaudhuri, B.B., Samanta, G.P.,
Elliptic Fit of Objects in Two and Three Dimensions by Moment of Inertia Optimization,
PRL(12), 1991, pp. 1-7. BibRef 9100

Ellis, T.[Tim], Abbood, A.[Ahmed], Brillault, B.[Beatrice],
Ellipse Detection and Matching with Uncertainty,
IVC(10), No. 5, June 1992, pp. 271-276.
WWW Link. BibRef 9206
Earlier: BMVC91(xx-yy).
PDF File. 9109
BibRef

Rosin, P.L.,
Ellipse Fitting by Accumulating Five-Point Fits,
PRL(14), 1993, pp. 661-669. BibRef 9300

Rosin, P.L.[Paul L.],
Further Five-Point Fit Ellipse Fitting,
GMIP(61), No. 5, September 1999, pp. 245-259. BibRef 9909
Earlier: BMVC97(xx-yy).
HTML Version.
PDF File. BibRef

Rosin, P.L.,
A Note on the Least Squares Fitting of Ellipses,
PRL(14), 1993, pp. 799-808. BibRef 9300

Rosin, P.L.,
Analyzing Error of Fit Functions for Ellipses,
PRL(17), No. 14, December 30 1996, pp. 1461-1470. 9702
BibRef
Earlier: (British spelling, with "S") BMVC96(Poster Session 2). 9608

PDF File. Brunel University BibRef

Rosin, P.L.,
Assessing Error of Fit Functions for Ellipses,
GMIP(58), No. 5, September 1996, pp. 494-502. 9611
BibRef

Rosin, P.L.[Paul L.],
Ellipse Fitting Using Orthogonal Hyperbolae and Stirling's Oval,
GMIP(60), No. 3, May 1998, pp. p209-213. BibRef 9805

Rosin, P.L.[Paul L.],
Fitting Superellipses,
PAMI(22), No. 7, July 2000, pp. 726-732.
IEEE DOI 0008
BibRef

Yoo, J.H., Sethi, I.K.,
An Ellipse Detection Method from the Polar and Pole Definition of Conics,
PR(26), No. 2, February 1993, pp. 307-315.
WWW Link. BibRef 9302

Wu, W.Y., Wang, M.J.J.,
Elliptical Object Detection by Using Its Geometric Properties,
PR(26), No. 10, October 1993, pp. 1499-1509.
WWW Link. BibRef 9310

Aguado, A.S., Montiel, M.E., Nixon, M.S.,
On Using Directional Information for Parameter Space Decomposition in Ellipse Detection,
PR(29), No. 3, March 1996, pp. 369-381.
WWW Link. BibRef 9603

Ho, C.T., Chen, L.H.,
A High-Speed Algorithm for Elliptic Object Detection,
IP(5), No. 3, March 1996, pp. 547-550.
IEEE DOI BibRef 9603

Cui, Y.T., Weng, J., Reynolds, H.,
Estimation of Ellipse Parameters Using Optimal Minimum-Variance Estimator,
PRL(17), No. 3, March 6 1996, pp. 309-316. BibRef 9603

Cabrera, J., Meer, P.,
Unbiased Estimation of Ellipses by Bootstrapping,
PAMI(18), No. 7, July 1996, pp. 752-756.
IEEE DOI 9608
BibRef

Safaee-Rad, R., Smith, K.C., Benhabib, B., Tchoukanov, I.,
Application of Moment and Fourier Descriptors to the Accurate Estimation of Elliptical-Shape Parameters,
PRL(13), 1992, pp. 497-508. BibRef 9200

Lee, R., Lu, P.C., Tsai, W.H.,
Moment Preserving Detection of Elliptical Shapes in Gray-Scale Images,
PRL(11), 1990, pp. 405-414. BibRef 9000

Sheu, H.T., Chen, H.Y., Hu, W.C.,
Consistent Symmetrical Axis Method for Robust Detection of Ellipses,
VISP(144), No. 6, December 1997, pp. 332-338. 9806
BibRef

Lei, Y.[Yiwu], Wong, K.C.[Kok Cheong],
Ellipse detection based on symmetry,
PRL(20), No. 1, January 1999, pp. 41-47. BibRef 9901

Daul, C., Graebling, P., Hirsch, E.,
From the Hough Transform to a New Approach for the Detection and Approximation of Elliptical Arcs,
CVIU(72), No. 3, December 1998, pp. 215-236.
DOI Link BibRef 9812

Fitzgibbon, A.W., Pilu, M., Fisher, R.B.,
Direct Least Square Fitting of Ellipses,
PAMI(21), No. 5, May 1999, pp. 476-480.
IEEE DOI BibRef 9905 Edinburgh BibRef
Earlier:
Direct Least Squares Fitting of Ellipses,
ICPR96(I: 253-257).
IEEE DOI 9608
BibRef
And: DAIResearch Paper No. 794, January 1996.
HTML Version. 9605
(Univ. of Edinburgh, UK) BibRef

Pilu, M.[Maurizio], Fitzgibbon, A.W., Fisher, R.B.,
Ellipse-Specific Direct Least-Square Fitting,
ICIP96(III: 599-602).
IEEE DOI BibRef 9600
And: DAINo. 806, May 1996. BibRef EdinburghDirectly solved by a generalized eigen-system. Includes Matlab code. Code, Ellipse Fitting. BibRef

Fitzgibbon, A.W., Fisher, R.B.,
A Buyer's Guide to Conic Fitting,
DAINo. 810, May 1996. BibRef 9605
And: BMVC95(xx).
PDF File. BibRef EdinburghEvaluation of several different methods for conic fitting. See also Buyer's Guide to Euclidean Elliptical Cylindrical and Conical Surface Fitting, A. BibRef

Carvalho, P.C.P., Costa, N., Ribeiro, B., Dourado, A.,
On the Use of Neural Networks and Geometrical Criteria for Localisation of Highly Irregular Elliptical Shapes,
PAA(2), No. 4, 1999, pp. 321-342. 9911
BibRef

Žunic, J.[Joviša], Sladoje, N.[Nataša],
Efficiency of Characterizing Ellipses and Ellipsoids by Discrete Moments,
PAMI(22), No. 4, April 2000, pp. 407-414.
IEEE DOI 0006
BibRef
Earlier:
A characterization of digital disks by discrete moments,
CAIP97(582-589).
Springer DOI 9709
BibRef

Aktas, M.A.[Mehmet Ali], Žunic, J.[Joviša],
A Family of Shape Ellipticity Measures for Galaxy Classification,
SIIMS(6), No. 2, 2013, pp. 765-781.
DOI Link 1307
BibRef
Earlier:
Sensitivity/robustness Flexible Ellipticity Measures,
DAGM12(307-316).
Springer DOI 1209
BibRef
Earlier:
Measuring Shape Ellipticity,
CAIP11(I: 170-177).
Springer DOI 1109
BibRef

Sewisy, A.A.[Adel A.], Leberl, F.W.[Franz W.],
Detection ellipses by finding lines of symmetry in the images via an hough transform applied to straight lines,
IVC(19), No. 12, October 2001, pp. 857-866.
WWW Link. 0110
BibRef

Zhu, C.R.[Chang-Ren], Wang, R.S.[Run-Sheng],
A fast automatic extraction algorithm of elliptic object groups from remote sensing images,
PRL(25), No. 13, 1 October 2004, pp. 1471-1478.
WWW Link. 0410
BibRef

Zhang, S.C.[Si-Cheng], Liu, Z.Q.A.[Zhi-Qi-Ang],
A robust, real-time ellipse detector,
PR(38), No. 2, February 2005, pp. 273-287.
WWW Link. 0411
For comments: See also Discussion on paper 'A Robust Real-Time Ellipse Detector' by Zhang and Liu. BibRef

Harker, M.J.[Matthew J.], O'Leary, P.L.[Paul L.], Zsombor-Murray, P.[Paul],
Direct type-specific conic fitting and eigenvalue bias correction,
IVC(26), No. 3, 3 March 2008, pp. 372-381.
WWW Link. 0801
Curve fitting; Conics; Constrained least squares BibRef

O'Leary, P.L.[Paul L.], Harker, M.J.[Matther J.],
An Algebraic Framework for Discrete Basis Functions in Computer Vision,
ICCVGIP08(150-157).
IEEE DOI 0812
BibRef

Harker, M.J.[Matthew J.], O'Leary, P.L.[Paul L.],
Regularized Reconstruction of a Surface from its Measured Gradient Field,
JMIV(51), No. 1, January 2015, pp. 46-70.
Springer DOI 1503
BibRef
Earlier:
Least squares surface reconstruction from gradients: Direct algebraic methods with spectral, Tikhonov, and constrained regularization,
CVPR11(2529-2536).
IEEE DOI 1106
BibRef
Earlier:
Least squares surface reconstruction from measured gradient fields,
CVPR08(1-7).
IEEE DOI 0806
BibRef

O'Leary, P.L., Harker, M.J., Zsombor-Murray, P.,
Direct and least square fitting of coupled geometric objects for metric vision,
VISP(152), No. 6, December 2005, pp. 687-694.
DOI Link 0512
BibRef
Earlier: A2, A1, A3:
Direct and Specific Fitting of Conics to Scattered Data,
BMVC04(xx-yy).
HTML Version. 0508
BibRef

Liu, Z.Y.[Zhi-Yong], Qiao, H.[Hong], Xu, L.[Lei],
Multisets mixture learning-based ellipse detection,
PR(39), No. 4, April 2006, pp. 731-735.
WWW Link. 0604
Ellipse detection; Multisets mixture learning; Hough transform BibRef

Kanatani, K.[Kenichi],
Ellipse Fitting with Hyperaccuracy,
IEICE(E89-D), No. 10, October 2006, pp. 2653-2660.
DOI Link 0610
BibRef
Earlier: ECCV06(I: 484-495).
Springer DOI 0608
BibRef

Maybank, S.J.[Stephen J.],
Application of the Fisher-Rao Metric to Ellipse Detection,
IJCV(72), No. 3, May 2007, pp. 287-307.
Springer DOI
WWW Link. 0702
See also Application of the Fisher-Rao Metric to Structure Detection. BibRef

Qiao, Y.[Yu], Ong, S.H.,
Arc-based evaluation and detection of ellipses,
PR(40), No. 7, July 2007, pp. 1990-2003.
WWW Link. 0704
Ellipse verification; Ellipse detection; Elliptic arc; Model-based distance; Connectivity; Angular connectivity See also Connectivity-based multiple-circle fitting. BibRef

Rosin, P.L.[Paul L.],
Evaluating Harker and O'Leary's distance approximation for ellipse fitting,
PRL(28), No. 13, 1 October 2007, pp. 1804-1807.
WWW Link. 0709
Distance approximation; Ellipse fitting; Evaluation See also Direct and least square fitting of coupled geometric objects for metric vision. BibRef

Lu, W.[Wei], Tan, J.[Jinglu],
Detection of incomplete ellipse in images with strong noise by iterative randomized Hough transform (IRHT),
PR(41), No. 4, April 2008, pp. 1268-1279.
WWW Link. 0801
Curve detection; Randomized Hough transform; Hough transform; Image processing; Ellipse; Ultrasound; Fetal head BibRef

Mai, F., Hung, Y.S., Zhong, H., Sze, W.F.,
A Hierarchical Approach for Fast and Robust Ellipse Extraction,
PR(41), No. 8, August 2008, pp. 2512-2524.
WWW Link. 0805
BibRef
Earlier: ICIP07(V: 345-348).
IEEE DOI 0709
Ellipse extraction; Elliptic arcs; Arc segments; RANSAC BibRef

Hahn, K.S.[Kwang-Soo], Jung, S.C.[Sung-Cheol], Han, Y.J.[Young-Joon], Hahn, H.S.[Hern-Soo],
A new algorithm for ellipse detection by curve segments,
PRL(29), No. 13, 1 October 2008, pp. 1836-1841.
WWW Link. 0804
Ellipse fitting; Curve segments; Occluded object BibRef

Cao, C.G.[Chun-Guang], Newman, T.S.[Timothy S.], Germany, G.A.[Glynn A.],
New shape-based auroral oval segmentation driven by LLS-RHT,
PR(42), No. 5, May 2009, pp. 607-618.
Elsevier DOI 0902
Hough transform; Ellipse detection; Segmentation; Aurora; Satellite image BibRef

Kharma, N., Moghnieh, H., Yao, J., Guo, Y.P., Abu-Baker, A., Laganiere, J., Rouleau, G., Cheriet, M.,
Automatic segmentation of cells from microscopic imagery using ellipse detection,
IET-IPR(1), No. 1, March 2007, pp. 39-47.
DOI Link 0905
BibRef

Liu, Z.Y.[Zhi-Yong], Qiao, H.[Hong],
Multiple ellipses detection in noisy environments: A hierarchical approach,
PR(42), No. 11, November 2009, pp. 2421-2433.
Elsevier DOI 0907
Shape detection; Ellipse detection; Noisy environment BibRef

Bai, X.Z.[Xiang-Zhi], Sun, C.M.[Chang-Ming], Zhou, F.G.[Fu-Gen],
Splitting touching cells based on concave points and ellipse fitting,
PR(42), No. 11, November 2009, pp. 2434-2446.
Elsevier DOI 0907
BibRef
Earlier:
Touching Cells Splitting by Using Concave Points and Ellipse Fitting,
DICTA08(271-278).
IEEE DOI 0812
Touching cells splitting; Ellipse fitting; Concave point; Contour BibRef

Ouellet, J.N.[Jean-Nicolas], Hébert, P.[Patrick],
Precise ellipse estimation without contour point extraction,
MVA(21), No. 1, November 2009, pp. xx-yy.
Springer DOI 0911
BibRef

Xie, Y.D.[Ying-Di], Ohya, J.[Jun],
Elliptical Object Detection by a Modified RANSAC with Sampling Constraint from Boundary Curves' Clustering,
IEICE(E93-D), No. 3, March 2010, pp. 611-623.
WWW Link. 1003
BibRef

Xu, R.Y.D.[R.Y. Da], Kemp, M.,
Fitting Multiple Connected Ellipses to an Image Silhouette Hierarchically,
IP(19), No. 7, July 2010, pp. 1673-1682.
IEEE DOI 1007
BibRef

Fernandes, A.M.[Armando Manuel],
Discussion on paper 'A Robust Real-Time Ellipse Detector' by Zhang and Liu,
PR(44), No. 2, February 2011, pp. 488-489.
Elsevier DOI 1011
Hough transform; Ellipse detection See also robust, real-time ellipse detector, A. BibRef

Chien, C.F.[Chung-Fang], Cheng, Y.C.[Yu-Che], Lin, T.T.[Ta-Te],
Robust ellipse detection based on hierarchical image pyramid and Hough transform,
JOSA-A(28), No. 4, April 2011, pp. 581-589.
WWW Link. 1104
BibRef

Chia, A.Y.S.[Alex Y.S.], Rahardja, S.[Susanto], Rajan, D.[Deepu], Leung, M.K.H.[Maylor K.H.],
A Split and Merge Based Ellipse Detector With Self-Correcting Capability,
IP(20), No. 7, July 2011, pp. 1991-2006.
IEEE DOI 1107
BibRef
Earlier: A1, A3, A4, A2:
A split and merge based ellipse detector,
ICIP08(3212-3215).
IEEE DOI 0810
BibRef

Yu, J.[Jieqi], Kulkarni, S.R.[Sanjeev R.], Poor, H.V.[H. Vincent],
Robust ellipse and spheroid fitting,
PRL(33), No. 5, 1 April 2012, pp. 492-499.
Elsevier DOI 1202
Curve fitting; Surface fitting; Parameter estimation BibRef

Prasad, D.K.[Dilip K.], Leung, M.K.H.[Maylor K.H.], Cho, S.Y.[Siu-Yeung],
Edge curvature and convexity based ellipse detection method,
PR(45), No. 9, September 2012, pp. 3204-3221.
Elsevier DOI 1206
Ellipse detection; Real images; Caltech 256 dataset; Hough transform; Overlapping ellipses; Occluded ellipses; Grouping; Saliency BibRef

Zhang, W.H.[Wen-Hui], Jiang, X.[Xiaoya], Liu, Y.M.[Yin-Mingzi],
A method for recognizing overlapping elliptical bubbles in bubble image,
PRL(33), No. 12, 1 September 2012, pp. 1543-1548.
Elsevier DOI 1208
Direct imaging; Bubble recognition; Overlapping; Bubble size distribution BibRef

Prasad, D.K.[Dilip K.], Leung, M.K.H.[Maylor K.H.], Quek, C.[Chai],
ElliFit: An unconstrained, non-iterative, least squares based geometric Ellipse Fitting method,
PR(46), No. 5, May 2013, pp. 1449-1465.
Elsevier DOI 1302
BibRef
Earlier: A1, A3, A2:
A Precise Ellipse Fitting Method for Noisy Data,
ICIAR12(I: 253-260).
Springer DOI 1206
BibRef
Earlier: A1, A2, Only:
Error Analysis of Geometric Ellipse Detection Methods Due to Quantization,
PSIVT10(58-63).
IEEE DOI 1011
Ellipse fitting; Shape analysis; Unconstrained optimization; Least squares method BibRef

Liu, H.M.[Hong-Min], Wang, Z.H.[Zhi-Heng],
Geometric property based ellipse detection method,
JVCIR(24), No. 7, 2013, pp. 1075-1086.
Elsevier DOI 1309
Ellipse detection BibRef

Muñoz-Pérez, J., de Cózar-Macías, O.D., Blázquez-Parra, E.B., Ladrón de Guevara-López, I.,
Multicriteria Robust Fitting of Elliptical Primitives,
JMIV(49), No. 2, June 2014, pp. 492-509.
Springer DOI 1405
See also Robust Fitting of Circle Arcs. BibRef

Szpak, Z.L.[Zygmunt L.], Chojnacki, W.[Wojciech], Eriksson, A.[Anders], van den Hengel, A.J.[Anton J.],
Sampson distance based joint estimation of multiple homographies with uncalibrated cameras,
CVIU(125), No. 1, 2014, pp. 200-213.
Elsevier DOI 1406
Multiple homographies BibRef

Szpak, Z.L.[Zygmunt L.], Chojnacki, W.[Wojciech], van den Hengel, A.[Anton],
Guaranteed Ellipse Fitting with a Confidence Region and an Uncertainty Measure for Centre, Axes, and Orientation,
JMIV(52), No. 2, June 2015, pp. 173-199.
Springer DOI 1505
BibRef
Earlier:
A Comparison of Ellipse Fitting Methods and Implications for Multiple-View Geometry Estimation,
DICTA12(1-8).
IEEE DOI 1303
BibRef
And:
Guaranteed Ellipse Fitting with the Sampson Distance,
ECCV12(V: 87-100).
Springer DOI 1210
BibRef

Tabor, J., Spurek, P.,
Cross-entropy clustering,
PR(47), No. 9, 2014, pp. 3046-3059.
Elsevier DOI 1406
Clustering BibRef

Tabor, J.[Jacek], Misztal, K.[Krzysztof],
Detection of Elliptical Shapes via Cross-Entropy Clustering,
IbPRIA13(656-663).
Springer DOI 1307
BibRef

Fornaciari, M.[Michele], Prati, A.[Andrea], Cucchiara, R.[Rita],
A fast and effective ellipse detector for embedded vision applications,
PR(47), No. 11, 2014, pp. 3693-3708.
Elsevier DOI 1407
Real time ellipse detection BibRef

Prasad, D.K.[Dilip K.], Leung, M.K.H.[Maylor K. H.], Quek, C., Brown, M.S.,
DEB: Definite Error Bounded Tangent Estimator for Digital Curves,
IP(23), No. 10, October 2014, pp. 4297-4310.
IEEE DOI 1410
computational complexity BibRef

Prasad, D.K.[Dilip K.], Gupta, R.K.[Raj Kumar], Leung, M.K.H.[Maylor K. H.],
An Error Bounded Tangent Estimator for Digitized Elliptic Curves,
DGCI11(272-283).
Springer DOI 1104
BibRef

Prasad, D.K.[Dilip K.], Leung, M.K.H.[Maylor K. H.],
An ellipse detection method for real images,
IVCNZ10(1-8).
IEEE DOI 1203
BibRef
And:
An error bounded tangent estimator for digital curves,
IVCNZ10(1-7).
IEEE DOI 1203
BibRef

Liu, C.[Chang], Hu, W.[Weiduo],
Ellipse fitting for imaged cross sections of a surface of revolution,
PR(48), No. 4, 2015, pp. 1440-1454.
Elsevier DOI 1502
Surface of revolution BibRef

Collett, M.J., Watkins, L.R.,
Ellipse fitting for interferometry. Part 3: dynamic method,
JOSA-A(32), No. 3, March 2015, pp. 491-496.
DOI Link 1503
Interferometry; Phase measurement; Polarimetry BibRef

Collett, M.J.,
A Bayesian method for type-specific quadric fitting,
ICVNZ16(1-5)
IEEE DOI 1701
Bayes methods BibRef

Company, P.[Pedro], Plumed, R.[Raquel], Varley, P.A.C.[Peter A.C.],
A fast approach for perceptually-based fitting strokes into elliptical arcs,
VC(31), No. 6-8, June 2015, pp. 775-785.
WWW Link. 1506
BibRef

Liang, J.L.[Jun-Li], Wang, Y.L.[Yun-Long], Zeng, X.[Xianju],
Robust Ellipse Fitting via Half-Quadratic and Semidefinite Relaxation Optimization,
IP(24), No. 11, November 2015, pp. 4276-4286.
IEEE DOI 1509
computer vision BibRef

Waibel, P.[Patrick], Matthes, J.[Jörg], Gröll, L.[Lutz],
Constrained Ellipse Fitting with Center on a Line,
JMIV(53), No. 3, November 2015, pp. 364-382.
WWW Link. 1511
BibRef

Zafari, S.[Sahar], Eerola, T.[Tuomas], Sampo, J.[Jouni], Kälviäinen, H.[Heikki], Haario, H.[Heikki],
Segmentation of Overlapping Elliptical Objects in Silhouette Images,
IP(24), No. 12, December 2015, pp. 5942-5952.
IEEE DOI 1512
computer vision BibRef

Zafari, S.[Sahar], Eerola, T.[Tuomas], Sampo, J.[Jouni], Kälviäinen, H.[Heikki], Haario, H.[Heikki],
Segmentation of Partially Overlapping Convex Objects Using Branch and Bound Algorithm,
MCBMIIA16(III: 76-90).
Springer DOI 1704
BibRef
Earlier:
Segmentation of Partially Overlapping Nanoparticles Using Concave Points,
ISVC15(I: 187-197).
Springer DOI 1601
BibRef

Lu, T.T.[Ting-Ting], Hu, W.[Weiduo], Liu, C.[Chang], Yang, D.[Daguang],
Effective ellipse detector with polygonal curve and likelihood ratio test,
IET-CV(9), No. 6, 2015, pp. 914-925.
DOI Link 1512
computational geometry BibRef

Panagiotakis, C.[Costas], Argyros, A.[Antonis],
Parameter-free modelling of 2D shapes with ellipses,
PR(53), No. 1, 2016, pp. 259-275.
Elsevier DOI 1602
Ellipses fitting BibRef

Kanatani, K.[Kenichi], Sugaya, Y.[Yasuyuki], Kanazawa, Y.[Yasushi],
Ellipse Fitting for Computer Vision: Implementation and Applications,
Morgan & ClaypoolPublishers, San Rafael, CA, U.S., April, 2016. ISBN: 9781627054584.
DOI Link 1605
Code, Ellipse Fitting.
WWW Link. Algebraic Fitting, Geometric Fitting, Robust Fitting, Ellipse-based 3-D Computation, Experiments and Examples, Extension and Generalization, Accuracy of Algebraic Fitting, Maximum Likelihood and Geometric Fitting, Theoretical Accuracy Limit BibRef

Arellano, C.[Claudia], Dahyot, R.[Rozenn],
Robust ellipse detection with Gaussian mixture models,
PR(58), No. 1, 2016, pp. 12-26.
Elsevier DOI 1606
Ellipse detection BibRef

Grbic, R.[Ratko], Grahovac, D.[Danijel], Scitovski, R.[Rudolf],
A method for solving the multiple ellipses detection problem,
PR(60), No. 1, 2016, pp. 824-834.
Elsevier DOI 1609
Multiple ellipses detection BibRef

Patraucean, V.[Viorica], Gurdjos, P.[Pierre], von Gioi, R.G.[Rafael Grompone],
Joint A Contrario Ellipse and Line Detection,
PAMI(39), No. 4, April 2017, pp. 788-802.
IEEE DOI 1703
BibRef
Earlier:
A Parameterless Line Segment and Elliptical Arc Detector with Enhanced Ellipse Fitting,
ECCV12(II: 572-585).
Springer DOI 1210
Adaptation models BibRef

Chen, S.L.[Song-Lin], Xia, R.[Renbo], Zhao, J.[Jibin], Chen, Y.L.[Yue-Ling], Hu, M.B.[Mao-Bang],
A hybrid method for ellipse detection in industrial images,
PR(68), No. 1, 2017, pp. 82-98.
Elsevier DOI 1704
Ellipse detection BibRef

Žunic, J.[Joviša], Kakarala, R.[Ramakrishna], Aktas, M.A.[Mehmet Ali],
Notes on shape based tools for treating the objects ellipticity issues,
PR(69), No. 1, 2017, pp. 141-149.
Elsevier DOI 1706
Shape BibRef

Jia, Q., Fan, X., Luo, Z., Song, L., Qiu, T.,
A Fast Ellipse Detector Using Projective Invariant Pruning,
IP(26), No. 8, August 2017, pp. 3665-3679.
IEEE DOI 1707
computational geometry, matrix algebra, object detection, collinear points, elliptical object detection, fast ellipse detector, fitting ellipse equations, industrial diagnosis, matrix determinant, planar curve intrinsic geometry, projective invariant pruning, robot navigation, Detectors, Fans, Geometry, Image edge detection, Mathematical model, Real-time systems, Transmission line matrix methods, Ellipse detection, projective invariant, real-time BibRef


De Langlard, M., Al Saddik, H., Lamadie, F., Charton, S., Debayle, J.,
A multiscale method for shape recognition of overlapping elliptical particles,
ICPR16(692-697)
IEEE DOI 1705
Clustering algorithms, Image color analysis, Image recognition, Image segmentation, Joining processes, Nickel, Shape BibRef

Cakir, H.I.[Halil Ibrahim], Topal, C.[Cihan], Akinlar, C.[Cuneyt],
An Occlusion-Resistant Ellipse Detection Method by Joining Coelliptic Arcs,
ECCV16(II: 492-507).
Springer DOI 1611
BibRef

Gabdulkhakova, A.[Aysylu], Kropatsch, W.G.[Walter G.],
Detecting Ellipses in Elongated Shapes Using the Thickness Profile,
SSSPR16(412-423).
Springer DOI 1611
BibRef

Figueroa, K.[Karina], Castro, A.[Ana], Camarena-Ibarrola, A.[Antonio], Tejeda, H.[Héctor],
Feature Extraction as Ellipse of Wild-Life Images,
MCPR16(23-32).
Springer DOI 1608
BibRef

Wang, Y.T.[Yong-Tao], He, Z.Q.[Zhe-Qi], Liu, X.C.[Xi-Cheng], Tang, Z.[Zhi], Li, L.Y.[Lu-Yuan],
A fast and robust ellipse detector based on top-down least-square fitting,
BMVC15(xx-yy).
DOI Link 1601
BibRef

Rong, J.P.[Jiang-Peng], Yang, S.[Sen], Mei, X.[Xiang], Ying, X.H.[Xiang-Hua], Huang, S.Y.[Shi-Yao], Zha, H.B.[Hong-Bin],
Ellipse-specific fitting by relaxing the 3L constraints with semidefinite programming,
ICIP15(710-714)
IEEE DOI 1512
3L algorithm BibRef

Shao, M.[Mang], Ijiri, Y.[Yoshihisa], Hattori, K.[Kosuke],
Grouped outlier removal for robust ellipse fitting,
MVA15(138-141)
IEEE DOI 1507
Algorithm design and analysis BibRef

Kwon, B.K.[Bae-Keun], Kang, D.J.[Dong-Joong],
Ellipse detection method based on the advanced three point algorithm,
FCV15(1-5)
IEEE DOI 1506
edge detection BibRef

Cicconet, M., Gunsalus, K., Geiger, D., Werman, M.,
Ellipses from triangles,
ICIP14(3626-3630)
IEEE DOI 1502
Databases BibRef

Matsuoka, R.,
Oscillation of the Measurement Accuracy of the Center Location of an Ellipse on a Digital Image,
PCV14(211-218).
DOI Link 1404
BibRef

Masuzaki, T.[Tomonari], Sugaya, Y.[Yasuyuki],
Connectivity-based error evaluation for ellipse fitting,
MVA15(118-121)
IEEE DOI 1507
Accuracy BibRef

Masuzaki, T.[Tomonari], Sugaya, Y.[Yasuyuki], Kanatani, K.[Kenichi],
High Accuracy Ellipse-Specific Fitting,
PSIVT13(314-324).
Springer DOI 1402
BibRef
Earlier: A3, A2, Only:
Compact algorithm for strictly ML ellipse fitting,
ICPR08(1-4).
IEEE DOI 0812
See also High Accuracy Fundamental Matrix Computation and Its Performance Evaluation. BibRef

Cai, P.K.J.[Pankaj Kumar Jinhai], Miklavcic, S.[Stan],
Improved ellipse fitting by considering the eccentricity of data point sets,
ICIP13(815-819)
IEEE DOI 1402
Cameras BibRef

Fornaciari, M.[Michele], Cucchiara, R.[Rita], Prati, A.[Andrea],
A Mobile Vision System for Fast and Accurate Ellipse Detection,
IWMV13(52-53)
IEEE DOI 1309
Hough transform;ellipse detection;mobile vision BibRef

Fujimoto, Y.[Yuuki], Hayashi, J.I.[Jun-Ichiro],
A method for bicycle detection using ellipse approximation,
FCV13(254-257).
IEEE DOI 1304
BibRef

Ying, X.H.[Xiang-Hua], Yang, L.[Li], Kong, J.[Jing], Hou, Y.B.[Yong-Bo], Guan, S.[Sheng], Zha, H.B.[Hong-Bin],
Direct least square fitting of ellipsoids,
ICPR12(3228-3231).
WWW Link. 1302
BibRef

Chum, O.[Ondrej], Matas, J.[Jiri],
Homography estimation from correspondences of local elliptical features,
ICPR12(3236-3239).
WWW Link. 1302
BibRef

Bergamasco, F.[Filippo], Cosmo, L.[Luca], Albarelli, A.[Andrea], Torsello, A.[Andrea],
A Robust Multi-camera 3D Ellipse Fitting for Contactless Measurements,
3DIMPVT12(168-175).
IEEE DOI 1212
BibRef

Tang, Y.[Yi], Srihari, S.N.[Sargur N.],
Ellipse detection using sampling constraints,
ICIP11(1045-1048).
IEEE DOI 1201
BibRef

Sergeev, N.[Nikolai], Tschechne, S.[Stephan],
Half Ellipse Detection,
CIAP11(I: 463-472).
Springer DOI 1109
BibRef

Nguyen, T.P.[Thanh Phuong], Kerautret, B.[Bertrand],
Ellipse Detection through Decomposition of Circular Arcs and Line Segments,
CIAP11(I: 554-564).
Springer DOI 1109
See also Arc Segmentation in Linear Time. BibRef

Sugaya, Y.,
Ellipse Detection by Combining Division and Model Selection Based Integration of Edge Points,
PSIVT10(64-69).
IEEE DOI 1011
BibRef

Zhang, C.[Chao], Sun, C.M.[Chang-Ming], Pham, T.D.[Tuan D.], Vallotton, P.[Pascal], Fenech, M.[Michael],
Detection of Nuclear Buds Based on Ellipse Fitting,
DICTA10(178-183).
IEEE DOI 1012
BibRef

Cooke, T.[Tristrom],
A Fast Automatic Ellipse Detector,
DICTA10(575-580).
IEEE DOI 1012
BibRef

Martelli, S.[Samuele], Marzotto, R.[Roberto], Colombari, A.[Andrea], Murino, V.[Vittorio],
FPGA-based robust ellipse estimation for circular road sign detection,
ECVW10(53-60).
IEEE DOI 1006
BibRef

Huang, F.S.[Feng-Shan], Qian, H.F.[Hui-Fen],
A Method for Elliptical Light Spot Image Recognization in Vision Coordinate Measuring System,
CISP09(1-5).
IEEE DOI 0910
BibRef

Veelaert, P.[Peter],
Ellipse Detection with Elemental Subsets,
DGCI09(144-155).
Springer DOI 0909
BibRef

Zheng, L.[Lin], Liu, Q.[Quan],
Detection of Overlapped Ellipses by Combining Region and Edge Data,
MIRAGE09(207-216).
Springer DOI 0905
BibRef

Lee, J.K.[Jong Kwan], Wood, B.A.[Brian A.], Newman, T.S.[Timothy S.],
Very fast ellipse detection using GPU-based RHT,
ICPR08(1-4).
IEEE DOI 0812
BibRef

Fernandes, A.M.[Armando Manuel],
Detection of a Large Number of Overlapping Ellipses Immersed in Noise,
ISVC08(I: 1-10).
Springer DOI 0812
BibRef

Yap, C.K.[Choon Kong], Lee, H.K.[Hwee Kuan],
Identification of Cell Nucleus Using a Mumford-Shah Ellipse Detector,
ISVC08(I: 582-593).
Springer DOI 0812
BibRef

Libuda, L.[Lars], Grothues, I.[Ingo], Kraiss, K.F.[Karl-Friedrich],
Ellipse Detection in Digital Image Data Using Geometric Features,
VISAPP06(229-239).
Springer DOI 0711
BibRef

Marquez, J., Ramirez, W., Boyer, L., Delmas, P.,
Robust Ellipsoidal Model Fitting of Human Heads,
RobVis08(381-390).
Springer DOI 0802
BibRef

Stojmenovic, M.[Milos], Nayak, A.[Amiya],
Measuring Conicity from Shape Boundaries,
MVA09(215-).
PDF File. 0905
BibRef

Stojmenovic, M.[Milos], Nayak, A.[Amiya],
Direct Ellipse Fitting and Measuring Based on Shape Boundaries,
PSIVT07(221-235).
Springer DOI 0712
See also Measuring Elongation from Shape Boundary. BibRef

de la Fraga, L.G.[Luis Gerardo], Silva, I.V.[Israel Vite], Cruz-Cortés, N.[Nareli],
Euclidean Distance Fit of Ellipses with a Genetic Algorithm,
EvoIASP07(359-366).
Springer DOI 0704
BibRef

Chia, A.Y.S.[Alex Yong Sang], Leung, M.K.H.[Maylor K. H.], Eng, H.L.[How-Lung], Rahardja, S.[Susanto],
Ellipse Detection with Hough Transform in One Dimensional Parametric Space,
ICIP07(V: 333-336).
IEEE DOI 0709
BibRef

Abou-Moustafa, K.T.[Karim T.], Ferrie, F.P.[Frank P.],
The Minimum Volume Ellipsoid Metric,
DAGM07(335-344).
Springer DOI 0709
BibRef

Wang, C.L.[Cui-Lan], Newman, T.S.[Timothy S.], Cao, C.G.[Chun-Guang],
New Hypothesis Distinctiveness Measure for Better Ellipse Extraction,
ICIAR07(176-186).
Springer DOI 0708
BibRef

Jiang, X.Y.[Xiao-Yi], Cheng, D.C.[Da-Chuan],
Fitting of 3D circles and ellipses using a parameter decomposition approach,
3DIM05(103-109).
IEEE DOI 0508
BibRef

Song, G.[Ge], Wang, H.[Hong],
A Fast and Robust Ellipse Detection Algorithm Based on Pseudo-random Sample Consensus,
CAIP07(669-676).
Springer DOI 0708
BibRef

Ouellet, J.N.[Jean-Nicolas], Hebert, P.[Patrick],
A Simple Operator for Very Precise Estimation of Ellipses,
CRV07(21-28).
IEEE DOI 0705
BibRef

Wong, S.T.S.[Sam Tak-Sum], Leung, H., Ip, H.H.S.[Horace Ho-Shing],
Fitting Ellipses to a Region with Application in Calligraphic Stroke Reconstruction,
ICIP06(397-400). 0610

IEEE DOI BibRef

Cao, C.G.[Chun-Guang], Newman, T.S.[Timothy S.],
New RHT-Based Ellipsoid Recovery Method,
ICPR06(I: 622-625).
IEEE DOI 0609
BibRef

Yao, J.[Jie], Kharma, N., Grogono, P.,
Fast robust GA-based ellipse detection,
ICPR04(II: 859-862).
IEEE DOI 0409
BibRef

Xie, Y.H.[Yong-Hong], Ji, Q.A.[Qi-Ang],
A new efficient ellipse detection method,
ICPR02(II: 957-960).
IEEE DOI 0211
BibRef

Ciobanu, A.[Adrian], Shahbazkia, H.[Hamid], du Buf, H.[Hans],
Contour Profiling by Dynamic Ellipse Fitting,
ICPR00(Vol III: 750-753).
IEEE DOI 0009
BibRef

Matei, B.[Bogdan], Meer, P.[Peter],
Reduction of Bias in Maximum Likelihood Ellipse Fitting,
ICPR00(Vol III: 794-798).
IEEE DOI 0009
BibRef

Vincze, M., Ayromlou, M., Zillich, M.,
Fast Tracking of Ellipses Using Edge-projected Integration of Cues,
ICPR00(Vol IV: 72-75).
IEEE DOI 0009
BibRef

Scaggiante, A., Frezza, R., Zampato, M.,
Identifying and tracking ellipses: a technique based on elliptical deformable templates,
CIAP99(582-587).
IEEE DOI 9909
BibRef

Ji, Q.A.[Qi-Ang], Haralick, R.M.[Robert M.],
A Statistically Efficient Method for Ellipse Detection,
ICIP99(II:730-734).
IEEE Abstract. BibRef 9900

Heikkila, J.[Janne],
Moment and Curvature Preserving Technique for Accurate Ellipse Boundary Detection,
ICPR98(Vol I: 734-737).
IEEE DOI 9808
BibRef

Kawaguchi, T.[Tsuyoshi], Nagata, R.I.[Ryo-Ich],
Ellipse detection using a genetic algorithm,
ICPR98(Vol I: 141-145).
IEEE DOI 0403
BibRef
And:
Ellipse detection using grouping of edgels into line-support regions,
ICIP98(III: 70-74).
IEEE DOI 9810
BibRef

Weiss, I.[Isaac], Rosenfeld, A.[Azriel],
A Simple Method of Ellipse Detection,
UMDTR3717, December 1996.
WWW Link. Midpoints of pairs of opposite facing edges on each row of the image and Hough to detect collinear sets of these midpoints. BibRef 9612

Werghi, N.[Naoufel], Doignon, C., Abba, G.,
Ellipse Fitting and Three-Dimensional Localization of Objects Based on Elliptic Features,
ICIP96(II: 57-60 vol1).
IEEE DOI BibRef 9600 ICIP96(I: 57-60). 9610
BibRef

Cui, Y.T.[Yun-Tao], Weng, J.[John], Reynolds, H.[Herbert],
Optimal parameter estimation of ellipses,
CIAP95(471-476).
Springer DOI 9509
BibRef

Wen, W.[Wei], Yuan, B.Z.[Bao-Zong],
Detection of Partial Ellipses Using Seperate Parameters Estimation Techniques,
BMVC94(xx-yy).
PDF File. 9409
BibRef

Masciangelo, S.,
3-D cues from a single view: detection of elliptical arcs and model-based perspective backprojection,
BMVC90(xx-yy).
PDF File. 9009
BibRef

Wang, R., Hanson, A.R., Riseman, E.M.,
Fast Extraction of Ellipses,
ICPR88(I: 508-510).
IEEE DOI BibRef 8800

Cyganski, D., Orr, J.A.,
Parameterization of Planar Contours for Elliptic Decomposition and Determination of Affine Transforms,
CAIA84(161-166). BibRef 8400

Tsukune, H., and Goto, K.,
Extraction Elliptical Figures for an Edge Vector Field,
CVPR83(138-141). BibRef 8300

Agin, G.J.,
Fitting Ellipses and General Second-Order Curves,
CMU-RI-TR-81-5, 1981. BibRef 8100

Chapter on Edge Detection and Analysis, Lines, Segments, Curves, Corners, Hough Transform continues in
Curvature, Corners, Dominant Points, Salient Points, Junctions .


Last update:Sep 25, 2017 at 16:36:46