9.1.3 Reflectance Computations, Albedo

Chapter Contents (Back)
Reflectance. Albedo. Spectral Reflectance. Color Constancy. See also Reflections and Color Models, Reflectance.

Ranson, K.J., Daughtry, C.S.T., Biehl, L.L., and Bauer, M.E.,
Sun-view angle effects on reflectance factor of corn canopies,
RSE(18), 1985, pp. 147-161. BibRef 8500

Greenberg, D.P., Cohen, M.F., Torrance, K.E.,
Radiosity: A Method for Computing Global Illumination,
VC(2), 1986, pp. 291-297. BibRef 8600

Rushmeier, H.E., Torrance, K.E.,
Extending the Radiosity Method to Include Specularly Reflecting and Translucent Materials,
TOG(9), 1990, pp. 1-27. BibRef 9000

Baum, D.R., Wallace, J.R., Cohen, M.F., Greenberg, D.P.,
The Back-Buffer Algorithm: An Extension of the Radiosity Method to Dynamic Environments,
VC(2), 1986, pp. 298-306. BibRef 8600

Cook, R.L., Torrance, K.E.,
A Reflectance Model For Computer Graphics,
IU87(1-19). BibRef 8700

Cohen, M.F.[Michael F.], Chen, S.E.[Shenchang Eric], Wallace, J.R.[Jonh R.], Greenberg, D.P.[Donald P.],
A Progressive Refinement Approach to Fast Radiosity Image Generation,
SIGGraph-88(75-84). August 1988. Iterative refinement of values. BibRef 8808

Fournier, A.[Alain], Gunawan, A.S.[Atjeng S.], Romanzin, C.[Chris],
Common Illumination Between Real and Computer Generated Scenes,
GI93(254-262). Render an image using 3D of a scene and a single image. Consider all as perfectly diffuse. BibRef 9300

Baribeau, R., Rioux, M., and Godin, G.,
Color Reflectance Modeling Using a Polychromatic Laser Range Sensor,
PAMI(14), No. 2, February 1992, pp. 263-269.
IEEE DOI See also Correction of Color Information of a 3D Model Using a Range Intensity Image. BibRef 9202

Kusanagi, M.[Masato], Terabayashi, K.[Kenji], Umeda, K.[Kazunori], Godin, G.[Guy], Rioux, M.[Marc],
Construction of a 3D Model of Real-world Object Using Range Intensity Images,
CRV10(317-323).
IEEE DOI 1005
See also Correction of Color Information of a 3D Model Using a Range Intensity Image. BibRef

Baribeau, R.,
Optimized spectral estimation methods for improved colorimetry with laser scanning systems,
3DPVT02(400-404).
IEEE DOI 0206
BibRef

Hall, D.E., Rushmeier, H.E.,
Improved Explicit Radiosity Method for Calculating Non-Lambertian Reflections,
VC(9), 1993, pp. 278-288. BibRef 9300

Tandri, S., Yang, Y.H.,
Comparison of Two Shape-from-Shading Algorithms,
PRL(11), 1990, pp. 637-642. BibRef 9000

Oren, M., Nayar, S.K.,
Generalization of the Lambertian Model and Implications for Machine Vision,
IJCV(14), No. 3, April 1995, pp. 227-251.
Springer DOI BibRef 9504
And:
Generalization of the Lambertian Model,
DARPA93(1037-1048). BibRef
And:
Seeing Beyond Lambert's Law,
ECCV94(B:269-280).
Springer DOI See also Visual Appearance of Matte Surfaces. BibRef

Nayar, S.K., Ikeuchi, K., and Kanade, T.,
Surface Reflection: Physical and Geometrical Perspectives,
PAMI(13), No. 7, July 1991, pp. 611-634.
IEEE DOI BibRef 9107
Earlier: DARPA90(185-212). An attempt to unify geometric and physical optical properties to explain surfaces and their appearance. Fairly complete. BibRef

Kanade, T.,
From a Real Chair to a Negative Chair,
AI(59), No. 1-2, January 1993, pp. 95-101.
WWW Link. BibRef 9301

Ikeuchi, K., and Sato, K.,
Determining Reflectance Properties of an Object Using Range and Brightness Images,
PAMI(13), No. 11, November 1991, pp. 1139-1153.
IEEE DOI BibRef 9111
Earlier:
Determining Reflectance Parameters Using Range and Brightness Images,
ICCV90(12-20).
IEEE DOI BibRef
And: CMU-CS-TR-90-106, February 1990. Shading from Shape. Almost the inverse of the standard problem. Recovery of reflectance from isolated object from a single image and 3D Geometry of the object. BibRef

Sato, Y., Ikeuchi, K.,
Reflectance Analysis for 3D Computer-Graphics Model Generation,
GMIP(58), No. 5, September 1996, pp. 437-451. 9611
BibRef
Earlier:
Reflectance Analysis for 3D Computer Graphics,
CMU-CS-TR-95-146, June 1995.
PS File. BibRef

Sato, Y.[Yoichi], Wheeler, M.D.[Mark D.], Ikeuchi, K.[Katsushi],
Object Shape and Reflectance Modeling from Observation,
SIGGraph-97(379-388). August 1997. BibRef 9708
And: MfR01(Chapter II-4). 120 color images and 12 range images to computer Torrance-Sparrow ( See also Polarization, Direction Distribution, and Off-Specular Peak Phenomena in Light Reflected from Roughened Surfaces. ) parameters. Recovered parameters for textured objects. BibRef

Sato, Y.[Yoichi], Sato, I.[Imari], Ikeuchi, K.[Katsushi],
3D Shape and Reflectance Morphing,
CMU-CS-TR-96-168, September 1996. BibRef 9609

Sato, I.[Imari], Sato, Y.[Yoichi], Ikeuchi, K.[Katsushi],
Illumination from shadows,
PAMI(25), No. 3, March 2003, pp. 290-300.
IEEE DOI 0301
BibRef
Earlier:
Illumination Distribution from Shadows,
CVPR99(I: 306-312).
IEEE DOI BibRef
And: MfR01(Chapter II-7). Illumination from radiance distribution in shadow cast by known object onto a known surface. BibRef

Sato, I., Sato, Y., Ikeuchi, K.,
Stability Issues in Recovering Illumination Distribution from Brightness in Shadows,
CVPR01(II:400-407).
IEEE DOI 0110
BibRef

Sato, I., Sato, Y., Ikeuchi, K.,
Illumination Distribution from Brightness in Shadows: Adaptive Estimation of Illumination Distribution with Unknown Reflectance Properties in Shadow Regions,
ICCV99(875-882).
IEEE DOI Recover the BDRF using shadows. Use omnidirectional image and 3D geometryu. BibRef 9900

Sato, Y., Ikeuchi, K.,
Reflectance Analysis Under Solar Illumination,
PBMCV95(SESSION 6) BibRef 9500
And: CMU-CS-TR-94-221, December 1994.
PS File. BibRef

Okabe, T., Sato, I., Sato, Y.,
Spherical harmonics vs. Haar wavelets: Basis for Recovering Illumination from Cast Shadows,
CVPR04(I: 50-57).
IEEE DOI 0408
See also Appearance Sampling of Real Objects for Variable Illumination. BibRef

Thomas, W.,
A 3-Dimensional Model for Calculating Reflection Functions of Inhomogeneous and Orographically Structured Natural Landscapes,
RSE(59), No. 1, January 1997, pp. 44-63. 9701
BibRef

Moreau, P., Ronse, C.,
Generation of Shading-off in Images by Extrapolation of Lipschitz Functions,
GMIP(58), No. 4, July 1996, pp. 314-333. 9609
For rendering of shading images in graphics, Use Lipschitz functions since they are defined in Euclidean and Digital spaces. Graphics. BibRef

Shekarforoush, H.[Hassan], Berthod, M.[Marc], Zerubia, J.B.[Josiane B.], Werman, M.[Michael],
Sub-pixel Bayesian-Estimation of Albedo and Height,
A IJCV(19), No. 3, August 1996, pp. 289-300.
Springer DOI BibRef 9608
Earlier: A1, A2, A3, Only:
Sub-pixel Reconstruction of a Variable Albedo Lambertian Surface,
BMVC95(xx-yy).
PDF File. 9509
Recover high resolution albedo given high resolution height (or vice versa). BibRef

Tominaga, S.,
Multichannel Vision System for Estimating Surface and Illumination Functions,
JOSA-A(13), No. 11, November 1996, pp. 2163-2173. 9611
BibRef

Qiu, J., Gao, W., Lesht, B.M.,
Inverting Optical Reflectance to Estimate Surface /Properties of Vegetation Canopies,
JRS(19), No. 4, March 10 1998, pp. 641-656. 9803
BibRef

Zaidi, Q.,
Identification of Illuminant and Object Colors: Heuristic Based Algorithms,
JOSA-A(15), No. 7, July 1998, pp. 1767-1776. 9807
BibRef

Dobson, S.J., Lu, K.C.,
Accurate Calculation of the Irradiance of Optical Images,
OptEng(37), No. 10, October 1998, pp. 2768-2771. 9810
BibRef

Wolff, L.B.[Lawrence B.], Nayar, S.K.[Shree K.], Oren, M.[Michael],
Improved Diffuse Reflection Models for Computer Vision,
IJCV(30), No. 1, October 1998, pp. 55-71.
DOI Link For shape from shading/reflectance. BibRef 9810

Koenderink, J.J.[Jan J.], van Doorn, A.J.[Andrea J.], Dana, K.J.[Kristin J.], Nayar, S.K.[Shree K.],
Bidirectional Reflection Distribution Function of Thoroughly Pitted Surfaces,
IJCV(31), No. 2/3, April 1999, pp. 129-144.
DOI Link See also 3D Texture Recognition Using Bidirectional Feature Histograms. BibRef 9904

Koenderink, J.J., van Doorn, A.J.,
Bidirectional Reflection Distribution Function Expressed in Terms of Surface Scattering Modes,
ECCV96(II:28-39).
Springer DOI Scattering characteristics of textured materials. BibRef 9600

Gong, P., Wang, D.X., Liang, S.,
Inverting a canopy reflectance model using a neural network,
JRS(20), No. 1, January 1999, pp. 111. BibRef 9901

Farid, H.[Hany], Adelson, E.H.[Edward H.],
Separating reflections from images by use of independent component analysis,
JOSA-A(16), No. 9, September 1999, pp. 2136-2145. BibRef 9909

Farid, H.[Hany], Adelson, E.H.[Edward H.],
Separating Reflections and Lighting Using Independent Components Analysis,
CVPR99(I: 262-267).
IEEE DOI BibRef 9900

Hu, B.X.[Bao-Xin], Lucht, W.[Wolfgang], Strahler, A.H.[Alan H.], Schaaf, C.B.[Crystal Barker], Smith, M.[Milton],
Surface Albedos and Angle-Corrected NDVI from AVHRR Observations of South America,
RSE(71), No. 2, 2000, pp. 119-132. 0002
BibRef

Lucht, W., Schaaf, C.B., Strahler, A.H.,
An Algorithm for the Retrieval of Albedo from Space Using Semiempirical BRDF Models,
GeoRS(38), No. 2, March 2000, pp. 977-998.
IEEE Top Reference. 0004
BibRef

Salomon, J.G., Schaaf, C.B.[Crystal Barker], Strahler, A.H.[Alan H.], Gao, F., Jin, Y.,
Validation of the MODIS Bidirectional Reflectance Distribution Function and Albedo Retrievals Using Combined Observations From the Aqua and Terra Platforms,
GeoRS(44), No. 6, June 2006, pp. 1555-1565.
IEEE DOI 0606
BibRef

Kim, T.E.[Tae-Eun], Hong, H.K.[Hyun-Ki], Choi, J.S.[Jong-Soo],
Estimation of hybrid reflectance properties and shape reconstruction using the LMS method,
PR(33), No. 1, January 2000, pp. 161-171.
WWW Link. 0005
BibRef

Kim, T.E., Lee, S.H., Ryu, S.H., and Choi, J.S.,
Shape Recovery of Hybrid Reflectance Surface Using Neural Network,
ICIP97(III: 416-419).
IEEE DOI BibRef 9700

Kim, T.E.[Tae-Eun], Choi, J.S.[Jong-Soo],
3-D shape recovery of hybrid reflectance surface using indirect diffuse illumination,
ICIP95(II: 354-357).
IEEE DOI 9510
BibRef

Ryu, S.H., Kim, T.E., Choi, J.S.[Jong-Soo],
Shape Reconstruction Using Estimated Surface Reflectance Properties,
ICIP96(I: 29-32).
IEEE DOI BibRef 9600

Marchant, J.A.[John A.], Onyango, C.M.[Christine M.],
Shadow-invariant classification for scenes illuminated by daylight,
JOSA-A(17), No. 11, November 2000, pp. 1952-1961. 0011
BibRef

Lyapustin, A.I.,
Three-dimensional effects in the remote sensing of surface albedo,
GeoRS(39), No. 2, February 2001, pp. 254-263.
IEEE Top Reference. 0104
BibRef

Edirisinghe, A., Chapman, G.E., Louis, J.P.,
A simplified method for retrieval of ground level reflectance of targets from airborne video imagery,
JRS(22), No. 5, March 2001, pp. 1127- 1141. 0105
BibRef

Luong, Q.T.[Q. Tuan], Fua, P.V.[Pascal V.], LeClerc, Y.G.[Yvan G.],
The Radiometry of Multiple Images,
PAMI(24), No. 1, January 2002, pp. 19-33. 0201
Simultaneous recovery of multiple illuminants and albedo given known geometry and cameras. Similar formulation to shape recovery from multiple images. BibRef

LeClerc, Y.G.[Yvan G.], Luong, Q.T.[Quang-Tuan], Fua, P.V.[Pascal V.],
Method and system for detecting changes in three dimensional shape,
US_Patent6,963,662, November 8, 2005.
WWW Link. BibRef 0511

Luong, Q.T.[Q. Tuan], Fua, P.V.[Pascal V.], LeClerc, Y.G.[Yvan G.],
Recovery of Reflectances and Varying Illuminants from Multiple Views,
ECCV02(III: 163 ff.).
Springer DOI 0205
BibRef

Combal, B., Isaka, H.,
The effect of small topographic variations on reflectance,
GeoRS(40), No. 3, March 2002, pp. 663-670.
IEEE Top Reference. 0206
BibRef

Pokrovsky, O.[Oleg], Roujean, J.L.[Jean-Louis],
Land surface albedo retrieval via kernel-based BRDF modeling: I. Statistical inversion method and model comparison,
RSE(84), No. 1, January 2003, pp. 100-119.
HTML Version. 0211
BibRef

Pokrovsky, O.[Oleg], Roujean, J.L.[Jean-Louis],
Land surface albedo retrieval via kernel-based BRDF modeling: II. An optimal design scheme for the angular sampling,
RSE(84), No. 1, January 2003, pp. 120-142.
HTML Version. 0211
BibRef

Basri, R.[Ronen], Jacobs, D.W.[David W.],
Lambertian Reflectance and Linear Subspaces,
PAMI(25), No. 2, February 2003, pp. 218-233.
IEEE DOI 0301
BibRef
Earlier: ICCV01(II: 383-390).
IEEE DOI 0106
See also What Is the Set of Images of an Object Under All Possible Illumination Conditions. Set of all Lambertian functions with distant light souces lies close to a 9D linear subspace. So it can be approximated by a low dimensional linear subspace. Face recognition applications. BibRef

Liang, S.L.[Shun-Lin],
A direct algorithm for estimating land surface broadband albedos from MODIS imagery,
GeoRS(41), No. 1, January 2003, pp. 136-145.
IEEE Top Reference. 0304
BibRef

Qu, Y.[Ying], Liu, Q.A.[Qi-Ang], Liang, S.L.[Shun-Lin], Wang, L.Z.[Li-Zhao], Liu, N.F.[Nan-Feng], Liu, S.[Suhong],
Direct-Estimation Algorithm for Mapping Daily Land-Surface Broadband Albedo From MODIS Data,
GeoRS(52), No. 2, February 2014, pp. 907-919.
IEEE DOI 1402
atmospheric radiation BibRef

He, T.[Tao], Liang, S.L.[Shun-Lin], Wang, D.D.[Dong-Dong], Chen, X.N.[Xiao-Na], Song, D.X.[Dan-Xia], Jiang, B.[Bo],
Land Surface Albedo Estimation from Chinese HJ Satellite Data Based on the Direct Estimation Approach,
RS(7), No. 5, 2015, pp. 5495-5510.
DOI Link 1506
BibRef

He, T.[Tao], Liang, S.L.[Shun-Lin], Wang, D.D.[Dong-Dong],
Direct Estimation of Land Surface Albedo From Simultaneous MISR Data,
GeoRS(55), No. 5, May 2017, pp. 2605-2617.
IEEE DOI 1609
albedo, atmospheric optics, radiometry, reflectivity, remote sensing, AmeriFlux site, MISR instrument, MISR product, aerosol estimation, albedo accuracy, albedo algorithm, cloud masking, direct land surface albedo estimation, gap-free clear-sky surface albedo estimation, multiangle imaging spectroradiometer, multiangular information, optical sensor, simultaneous MISR data, surface anisotropy characterization, surface reflectance, top-of-atmosphere reflectance, Atmospheric modeling, Broadband communication, Estimation, Land surface, MODIS, Satellites, Sea surface, Ameriflux, Moderate Resolution Imaging Spectroradiometer (MODIS), Multi-angle Imaging SpectroRadiometer (MISR), bidirectional reflectance distribution function (BRDF), direct estimation, multiangle data, surface, albedo See also Estimating Top-of-Atmosphere Daily Reflected Shortwave Radiation Flux Over Land From MODIS Data. BibRef

Latifovic, R., Cihlar, J., Chen, J.[Jing],
A comparison of BRDF models for the normalization of satellite optical data to a standard sun-target-sensor geometry,
GeoRS(41), No. 8, August 2003, pp. 1889-1898.
IEEE Abstract. 0308
BibRef

Liang, S.L.[Shun-Lin], Fang, H.L.[Hong-Liang], Kaul, M., van Niel, T.G., McVicar, T.R., Pearlman, J.S., Walthall, C.L., Daughtry, C.S.T., Huemmrich, K.F.,
Estimation and Validation of Land Surface Broadband Albedos and Leaf Area Index from EO-1 ALI Data,
GeoRS(41), No. 6, June 2003, pp. 1260-1267.
IEEE Abstract. 0308
BibRef

Moran, M.S., Bryant, R., Holifield, C.D., McElroy, S.,
Refined Empirical Line Approach for Retrieving Surface Reflectance from EO-1 ALI Images,
GeoRS(41), No. 6, June 2003, pp. 1411-1414.
IEEE Abstract. 0308
BibRef

Zhao, J.[Jiali], Su, Y.[Yong], Wang, D.J.[De-Jun], Luo, S.W.[Si-Wei],
Illumination Ratio Image: Synthesizing and Recognition with Varying Illuminations,
PRL(24), No. 15, November 2003, pp. 2703-2710.
WWW Link. 0308
BibRef

Viggh, H.E.M., Staelin, D.H.,
Spatial surface prior information reflectance estimation (SPIRE) algorithms,
GeoRS(41), No. 11, November 2003, pp. 2424-2435.
IEEE Abstract. 0311
BibRef

Bryant, R.[Ross], Qi, J.[Jiaguo], Moran, M.S.[M. Susan], Ni, W.M.[Wan-Mei],
Comparison of BRDF models with a fuzzy inference system for correction of bidirectional effects,
RSE(88), No. 3, December 2003, pp. 221-232.
WWW Link. 0401
Bidirectional Reflectance Distribution Function (BDRF). If a robust estimation is sought, the LMedS method can be adopted for the robust estimation of a BRDF model parameter. BibRef

di Girolamo, L.[Larry],
Generalizing the definition of the bi-directional reflectance distribution function,
RSE(88), No. 4, December 2003, pp. 479-482.
WWW Link. 0401
BibRef

Rautiainen, M.[Miina], Stenberg, P.[Pauline], Nilson, T.[Tiit], Kuusk, A.[Andres],
The effect of crown shape on the reflectance of coniferous stands,
RSE(89), No. 1, January 2004, pp. 41-52.
WWW Link. 0401
BibRef

Susaki, J.[Junichi], Hara, K.[Keitarou], Kajiwara, K.[Koji], Honda, Y.[Yoshiaki],
Robust estimation of BRDF model parameters,
RSE(89), No. 1, January 2004, pp. 63-71.
WWW Link. 0401
BibRef

Osadchy, M.[Margarita], Keren, D.[Daniel],
Efficient detection under varying illumination conditions and image plane rotations,
CVIU(93), No. 3, March 2004, pp. 245-259.
WWW Link. 0402
BibRef
Earlier:
Image Detection Under Varying Illumination and Pose,
ICCV01(II: 668-673).
IEEE DOI 0106
Detect Lambertian objects. Model illumination variations from a small set of training examples. BibRef

Pont, S.C.[Sylvia C.], Koenderink, J.J.[Jan J.],
Reflectance from locally glossy thoroughly pitted surfaces,
CVIU(98), No. 2, May 2005, pp. 211-222.
WWW Link. 0501
BibRef

Hara, K.[Kenji], Nishino, K.[Ko], Ikeuchi, K.[Katsushi],
Light Source Position and Reflectance Estimation from a Single View without the Distant Illumination Assumption,
PAMI(27), No. 4, April 2005, pp. 493-505.
IEEE Abstract. 0501
BibRef
Earlier:
Determining reflectance and light position from a single image without distant illumination assumption,
ICCV03(560-567).
IEEE DOI 0311
See also Mixture of Spherical Distributions for Single-View Relighting. BibRef

Lombardi, S.[Stephen], Nishino, K.[Ko],
Reflectance and Illumination Recovery in the Wild,
PAMI(38), No. 1, January 2016, pp. 129-141.
IEEE DOI 1601
BibRef
Earlier:
Reflectance and Natural Illumination from a Single Image,
ECCV12(VI: 582-595).
Springer DOI 1210
Analytical models BibRef

Hara, K.[Kenji], Nishino, K.[Ko], Ikeuchi, K.[Katsushi],
Mixture of Spherical Distributions for Single-View Relighting,
PAMI(30), No. 1, January 2008, pp. 25-35.
IEEE DOI 0711
See also Light Source Position and Reflectance Estimation from a Single View without the Distant Illumination Assumption. Estimating the illumination of a scene and the reflectance property of an object from single view images. BibRef

Hara, K.[Kenji], Nishino, K.[Ko],
Variational estimation of inhomogeneous specular reflectance and illumination from a single view,
JOSA-A(28), No. 2, February 2011, pp. 136-146.
WWW Link. 1102
BibRef
Earlier:
Illumination and spatially varying specular reflectance from a single view,
CVPR09(619-626).
IEEE DOI 0906
BibRef

Kawakami, R.[Rei], Tan, R.T.[Robby T.], Ikeuchi, K.[Katsushi],
Estimate surface color from changing illumination,
CREST05(100-106).
WWW Link. 0505
BibRef

Ragheb, H.[Hossein], Hancock, E.R.[Edwin R.],
Testing new variants of the Beckmann-Kirchhoff model against radiance data,
CVIU(102), No. 2, May 2006, pp. 145-168.
WWW Link. 0605
BibRef
Earlier:
Surface radiance: empirical data against model predictions,
ICIP04(IV: 2689-2692).
IEEE DOI 0505
Kirchhoff scattering theory; Rough surface reflectance; Beckmann model; BRDF data; Scattered radiance; Fresnel coefficient; Subsurface scattering BibRef

Ragheb, H., Robles-Kelly, A., Hancock, E.R.,
Testing reflectance models against radiance data,
3DPVT04(880-887).
IEEE DOI 0412
BibRef

Robles-Kelly, A., Hancock, E.R.,
Estimating the surface radiance function from single images,
3DPVT04(494-501).
IEEE DOI 0412
BibRef

Mercier, B.[Bruno], Meneveaux, D.[Daniel], Fournier, A.[Alain],
A Framework for Automatically Recovering Object Shape, Reflectance and Light Sources from Calibrated Images,
IJCV(73), No. 1, June 2007, pp. 77-93.
Springer DOI 0702
BibRef

Sato, I.[Imari], Okabe, T.[Takahiro], Sato, Y.[Yoichi],
Appearance Sampling of Real Objects for Variable Illumination,
IJCV(75), No. 1, October 2007, pp. 29-48.
Springer DOI 0709
See also Spherical harmonics vs. Haar wavelets: Basis for Recovering Illumination from Cast Shadows. See also Face Recognition Under Varying Illumination Based on MAP Estimation Incorporating Correlation Between Surface Points. BibRef

Sato, I.[Imari], Okabe, T.[Takahiro], Yu, Q.[Qiong], Sato, Y.[Yoichi],
Shape Reconstruction Based on Similarity in Radiance Changes under Varying Illumination,
ICCV07(1-8).
IEEE DOI 0710
BibRef

Sato, I.[Imari], Okabe, T.[Takahiro], Sato, Y.[Yoichi], Ikeuchi, K.[Katsushi],
Using Extended Light Sources for Modeling Object Appearance under Varying Illumination,
ICCV05(I: 325-332).
IEEE DOI 0510
Extended light source to model. BibRef

Maeda, K., Okabe, T.,
Acquiring multispectral light transport using multi-primary DLP projector,
IPTA16(1-6)
IEEE DOI 1703
image processing BibRef

Chandra, K.[Kartik], Healey, G.[Glenn],
Reflectance recovery for airborne sensor images of 3D scenes,
JOSA-A(24), No. 4, April 2007, pp. 957-966.
WWW Link. 0801
BibRef

Jin, H.L.[Hai-Lin], Cremers, D.[Daniel], Wang, D.J.[De-Jun], Prados, E.[Emmanuel], Yezzi, A.J.[Anthony J.], Soatto, S.[Stefano],
3-D Reconstruction of Shaded Objects from Multiple Images Under Unknown Illumination,
IJCV(76), No. 3, March 2008, pp. 245-256.
Springer DOI 0801
Shape, albedo, and light configuration from multiple images. See also Estimation of 3D surface shape and smooth radiance from 2D images: A Level Set Approach. BibRef

Xu, S., Wallace, A.M.,
Recovering surface reflectance and multiple light locations and intensities from image data,
PRL(29), No. 11, 1 August 2008, pp. 1639-1647.
WWW Link. 0804
Illuminant estimation; Surface reflectance recovery; Photorealistic rendering BibRef

Li, S.Y.[Shi-Ying], Manabe, Y.[Yoshitsugu], Chihara, K.[Kunihiro],
Accurately estimating reflectance parameters for color and gloss reproduction,
CVIU(113), No. 2, February 2009, pp. 308-316.
Elsevier DOI 0901
Diffuse reflectance; Specular reflectance; Color reproduction; Gloss reproduction; Surface roughness; High dynamic range; Spectral image BibRef

Abed, F.M.[Farhad Moghareh], Amirshahi, S.H.[Seyed Hossein], Abed, M.R.M.[Mohammad Reza Moghareh],
Reconstruction of reflectance data using an interpolation technique,
JOSA-A(26), No. 3, March 2009, pp. 613-624.
WWW Link. 0903
BibRef

Biswas, S.[Soma], Aggarwal, G.[Gaurav], Chellappa, R.[Rama],
Robust Estimation of Albedo for Illumination-invariant Matching and Shape Recovery,
PAMI(31), No. 5, May 2009, pp. 884-899.
IEEE DOI 0903
BibRef
Earlier: ICCV07(1-8).
IEEE DOI 0710
BibRef

Biswas, S.[Soma], Chellappa, R.[Rama],
Pose-robust albedo estimation from a single image,
CVPR10(2683-2690).
IEEE DOI 1006
BibRef

Stephen, H., Ahmad, S., Piechota, T.C.,
Land Surface Brightness Temperature Modeling Using Solar Insolation,
GeoRS(48), No. 1, January 2010, pp. 491-498.
IEEE DOI 1001
BibRef

Quaife, T., Lewis, P.,
Temporal Constraints on Linear BRDF Model Parameters,
GeoRS(48), No. 5, May 2010, pp. 2445-2450.
IEEE DOI 1006
Bidirectional Reflectance Distribution Function. BibRef

Ghosh, A.[Abhijeet], Heidrich, W.[Wolfgang], Achutha, S.[Shruthi], O'Toole, M.[Matthew],
A Basis Illumination Approach to BRDF Measurement,
IJCV(90), No. 2, November 2010, pp. 183-197.
WWW Link. 1011
BibRef
Earlier: A1, A3, A2, A4:
BRDF Acquisition with Basis Illumination,
ICCV07(1-8).
IEEE DOI 0710
Marr Prize, HM. bidirectional reflectance distribution functions. Surface reflectance estimation. BibRef

Kim, G.Y.[Gang Yeon], Lee, K.H.[Kwan H.],
A Reflectance Model for Metallic Paints Using a Two-Layer Structure Surface with Microfacet Distributions,
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IEEE DOI 1109
Controlling LED illumination. BibRef

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CVIU(115), No. 12, December 2011, pp. 1679-1688.
Elsevier DOI 1111
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Earlier:
Global optimization for estimating a BRDF with multiple specular lobes,
CVPR10(319-326).
IEEE DOI 1006
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And:
Photometric Stereo from Maximum Feasible Lambertian Reflections,
ECCV10(IV: 115-126).
Springer DOI 1009
BRDF; Analytical BRDF; Parameter estimation; Branch and bound; Global optimization BibRef

Kong, N., Tai, Y.W., Shin, S.Y.,
High-Quality Reflection Separation Using Polarized Images,
IP(20), No. 12, December 2011, pp. 3393-3405.
IEEE DOI 1112
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Chen, H., Cheng, K.,
A Conceptual Model of Surface Reflectance Estimation for Satellite Remote Sensing Images Using in situ Reference Data,
RS(4), No. 4, April 2012, pp. 934-949.
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Machizaud, J.[Jacques], Hébert, M.[Mathieu],
Spectral reflectance and transmittance prediction model for stacked transparency and paper both printed with halftone colors,
JOSA-A(29), No. 8, August 2012, pp. 1537-1548.
WWW Link. 1208
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Hébert, M.[Mathieu], Machizaud, J.[Jacques],
Spectral reflectance and transmittance of stacks of nonscattering films printed with halftone colors,
JOSA-A(29), No. 11, November 2012, pp. 2498-2508.
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Kim, B.G.[Bog G.], Han, J.W.[Jeong-Won], Park, S.B.[Soo-Been],
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JOSA-A(29), No. 12, December 2012, pp. 2612-2621.
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Flinkman, M.[Mika], Laamanen, H.[Hannu], Vahimaa, P.[Pasi], Hauta-Kasari, M.[Markku],
Number of colors generated by smooth nonfluorescent reflectance spectra,
JOSA-A(29), No. 12, December 2012, pp. 2566-2575.
WWW Link. 1211
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Flinkman, M.[Mika], Laamanen, H.[Hannu], Tuomela, J.[Jukka], Vahimaa, P.[Pasi], Hauta-Kasari, M.[Markku],
Eigenvectors of optimal color spectra,
JOSA-A(30), No. 9, September 2013, pp. 1806-1813.
WWW Link. 1309
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Chakraborty, B., Sinha, B.K.,
Estimation of Emissivity with the Help of an Infrared Camera,
Sensors(148), No. 1, January 2013, pp. 66-71.
HTML Version. 1302
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Shekhovtsov, A.[Alexander], Hlavác, V.[Václav],
A Distributed Mincut/Maxflow Algorithm Combining Path Augmentation and Push-Relabel,
IJCV(104), No. 3, September 2013, pp. 315-342.
WWW Link. 1308
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Earlier: EMMCVPR11(1-16).
Springer DOI 1107
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Earlier:
Joint Image GMM and Shading MAP Estimation,
ICPR10(1360-1363).
IEEE DOI 1008
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Rahman, S.[Sejuti], Robles-Kelly, A.[Antonio],
An optimisation approach to the recovery of reflection parameters from a single hyperspectral image,
CVIU(117), No. 12, 2013, pp. 1672-1688.
Elsevier DOI 1310
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And:
A method for estimating light direction, shape, and reflection parameters from a single image,
ICIP13(2034-2038)
IEEE DOI 1402
BibRef
Earlier:
On the Recovery of Shape and Reflectance from a Single Multispectral Image,
DICTA11(572-578).
IEEE DOI 1205
Light; reflection parameters; shape. Hyperspectral imaging BibRef

Heikkinen, V.[Ville], Mirhashemi, A.[Arash], Alho, J.[Juha],
Link functions and Matérn kernel in the estimation of reflectance spectra from RGB responses,
JOSA-A(30), No. 11, November 2013, pp. 2444-2454.
DOI Link 1311
Image reconstruction techniques BibRef

Liu, C.[Chao], Gu, J.W.[Jin-Wei],
Discriminative Illumination: Per-Pixel Classification of Raw Materials Based on Optimal Projections of Spectral BRDF,
PAMI(36), No. 1, 2014, pp. 86-98.
IEEE DOI 1312
BibRef
Earlier: A2, A1: CVPR12(797-804).
IEEE DOI 1208
Computational illumination;appearance modeling;material classification BibRef

Eckhard, T.[Timo], Valero, E.M.[Eva M.], Hernandez-Andres, J.[Javier], Heikkinen, V.[Ville],
Evaluating logarithmic kernel for spectral reflectance estimation: Effects on model parametrization, training set size, and number of sensor spectral channels,
JOSA-A(31), No. 3, March 2014, pp. 541-549.
DOI Link 1403
Image reconstruction techniques BibRef

Jimenez, S., Malo, J.,
The Role of Spatial Information in Disentangling the Irradiance-Reflectance-Transmittance Ambiguity,
GeoRS(52), No. 8, August 2014, pp. 4881-4894.
IEEE DOI 1403
Atmosphere BibRef

Koa, M.D.[Ming Di], Johan, H.[Henry],
ESLPV: enhanced subsurface light propagation volumes,
VC(30), No. 6-8, June 2014, pp. 821-831.
WWW Link. 1407
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Hagege, R.R.[Rami R.],
Scene appearance model based on spatial prediction,
MVA(25), No. 5, July 2014, pp. 1241-1256.
Springer DOI 1407
Varying illumination. BibRef

Peres, L.F., Libonati, R., DaCamara, C.C.,
Land-Surface Emissivity Retrieval in MSG-SEVIRI TIR Channels Using MODIS Data,
GeoRS(52), No. 9, September 2014, pp. 5587-5600.
IEEE DOI 1407
atmospheric boundary layer BibRef

Weyrich, T.[Tim], Lawrence, J.[Jason], Lensch, H.P.A.[Hendrik P. A.], Rusinkiewicz, S.[Szymon], Zickler, T.E.[Todd E.],
Principles of Appearance Acquisition and Representation,
FTCGV(4), Issue 2, 2008, pp. 75-191.
DOI Link 1410
Published August 2009. BibRef

Han, S.[Shuai], Sato, I.[Imari], Okabe, T.[Takahiro], Sato, Y.[Yoichi],
Fast Spectral Reflectance Recovery Using DLP Projector,
IJCV(110), No. 1, November 2014, pp. 172-184.
Springer DOI 1411
BibRef
Earlier: ACCV10(I: 323-335).
Springer DOI 1011
Award, ACCV Best Student Paper. BibRef

Roupioz, L.[Laure], Nerry, F.[Francoise], Jia, L.[Li], Menenti, M.[Massimo],
Improved Surface Reflectance from Remote Sensing Data with Sub-Pixel Topographic Information,
RS(6), No. 11, 2014, pp. 10356-10374.
DOI Link 1412
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Qu, Y.[Ying], Liang, S.L.[Shun-Lin], Liu, Q.A.[Qi-Ang], He, T.[Tao], Liu, S.[Suhong], Li, X.[Xiaowen],
Mapping Surface Broadband Albedo from Satellite Observations: A Review of Literatures on Algorithms and Products,
RS(7), No. 1, 2015, pp. 990-1020.
DOI Link 1502
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Luo, T., Shen, J., Li, X.,
Accurate Normal and Reflectance Recovery Using Energy Optimization,
CirSysVideo(25), No. 2, February 2015, pp. 212-224.
IEEE DOI 1502
Estimation BibRef

Nagol, J.R.[Jyoteshwar R.], Sexton, J.O.[Joseph O.], Kim, D.H.[Do-Hyung], Anand, A.[Anupam], Morton, D.[Douglas], Vermote, E.[Eric], Townshend, J.R.[John R.],
Bidirectional effects in Landsat reflectance estimates: Is there a problem to solve?,
PandRS(103), No. 1, 2015, pp. 129-135.
Elsevier DOI 1504
Landsat BibRef

Zhang, H.[Hu], Jiao, Z.[Ziti], Dong, Y.D.[Ya-Dong], Li, X.W.[Xiao-Wen],
Evaluation of BRDF Archetypes for Representing Surface Reflectance Anisotropy Using MODIS BRDF Data,
RS(7), No. 6, 2015, pp. 7826.
DOI Link 1507
Association of BRDF with surface reflectance. BibRef

Strothkamper, C.[Christian], Hauer, K.O.[Kai-Olaf], Hope, A.[Andreas],
How to efficiently characterize special effect coatings,
JOSA-A(33), No. 1, January 2016, pp. 1-8.
DOI Link 1601
Metrology BibRef

Hauagge, D.C.[Daniel C.], Wehrwein, S.[Scott], Bala, K.[Kavita], Snavely, N.[Noah],
Photometric Ambient Occlusion for Intrinsic Image Decomposition,
PAMI(38), No. 4, April 2016, pp. 639-651.
IEEE DOI 1603
BibRef
Earlier:
Photometric Ambient Occlusion,
CVPR13(2515-2522)
IEEE DOI 1309
Cameras. albedo; ; image stacks; intrinsic images. Stack of images from one viewpoint. ambient occlusion: how much light can reach a point in the scene. BibRef

Fu, Y.[Ying], Lam, A.[Antony], Sato, I.[Imari], Okabe, T.[Takahiro], Sato, Y.[Yoichi],
Separating Reflective and Fluorescent Components Using High Frequency Illumination in the Spectral Domain,
PAMI(38), No. 5, May 2016, pp. 965-978.
IEEE DOI 1604
BibRef
Earlier: ICCV13(457-464)
IEEE DOI 1403
fluorescence BibRef

Fu, Y.[Ying], Lam, A.[Antony], Sato, I.[Imari], Okabe, T.[Takahiro], Sato, Y.[Yoichi],
Reflectance and Fluorescence Spectral Recovery via Actively Lit RGB Images,
PAMI(38), No. 7, July 2016, pp. 1313-1326.
IEEE DOI 1606
Absorption BibRef

Fu, Y.[Ying], Lam, A.[Antony], Matsushita, Y.[Yasuyuki], Sato, I.[Imari], Sato, Y.[Yoichi],
Interreflection Removal Using Fluorescence,
ECCV14(V: 203-217).
Springer DOI 1408
BibRef

Fu, Y.[Ying], Lam, A.[Antony], Kobashi, Y.[Yasuyuki], Sato, I.[Imari], Okabe, T.[Takahiro], Sato, Y.[Yoichi],
Reflectance and Fluorescent Spectra Recovery Based on Fluorescent Chromaticity Invariance under Varying Illumination,
CVPR14(2171-2178)
IEEE DOI 1409
BibRef

Lam, A.[Antony], Subpa-Asa, A.[Art], Sato, I.[Imari], Okabe, T.[Takahiro], Sato, Y.[Yoichi],
Spectral Imaging Using Basis Lights,
BMVC13(xx-yy).
DOI Link 1402
BibRef

Ogawa, T.[Takahiro], Igarashi, Y.[Yuta], Haseyama, M.[Miki],
NMF-Based Spectral Reflectance Estimation From Image Pairs Including Near-Infrared Components,
CirSysVideo(26), No. 5, May 2016, pp. 855-867.
IEEE DOI 1605
BibRef
Earlier: A2, A1, A3:
Spectral reflectance estimation from visible light components and near-infrared components,
ICIP13(2388-2392)
IEEE DOI 1402
Approximation methods. Spectral reflectance estimation BibRef

Heikkinen, V.[Ville], Camara, C.[Clara], Hirvonen, T.[Tapani], Penttinen, N.[Niko],
Spectral imaging using consumer-level devices and kernel-based regression,
JOSA-A(33), No. 6, June 2016, pp. 1095-1110.
DOI Link 1606
Image reconstruction techniques. BibRef

Kamilov, U.S.[Ulugbek S.], Liu, D.H.[De-Hong], Mansour, H.[Hassan], Boufounos, P.T.[Petros T.],
A Recursive Born Approach to Nonlinear Inverse Scattering,
SPLetters(23), No. 8, August 2016, pp. 1052-1056.
IEEE DOI 1608
approximation theory BibRef

Dierl, M.[Marcel], Eckhard, T.[Timo], Frei, B.[Bernhard], Klammer, M.[Maximilian], Eichstadt, S.[Sascha], Elster, C.[Clemens],
Improved estimation of reflectance spectra by utilizing prior knowledge,
JOSA-A(33), No. 7, July 2016, pp. 1370-1376.
DOI Link 1608
Image reconstruction techniques BibRef

Mettes, P.[Pascal], Tan, R.T.[Robby T.], Veltkamp, R.C.[Remco C.],
Water detection through spatio-temporal invariant descriptors,
CVIU(154), No. 1, 2017, pp. 182-191.
Elsevier DOI 1612
Water detection in video. Reflections. BibRef

Dal Corso, A.[Alessandro], Frisvad, J.R.[Jeppe Revall], Mosegaard, J.[Jesper], Bærentzen, J.A.[J. Andreas],
Interactive directional subsurface scattering and transport of emergent light,
VC(33), No. 3, March 2017, pp. 371-383.
Springer DOI 1702
BibRef

Wen, J.G.[Jian-Guang], Dou, B.C.[Bao-Cheng], You, D.Q.[Dong-Qin], Tang, Y.[Yong], Xiao, Q.[Qing], Liu, Q.[Qiang], Qinhuo, L.[Liu],
Forward a Small-Timescale BRDF/Albedo by Multisensor Combined BRDF Inversion Model,
GeoRS(55), No. 2, February 2017, pp. 683-697.
IEEE DOI 1702
albedo From 4 sensors. BibRef

Wang, T.X.[Tian-Xing], Shi, J.C.[Jian-Cheng], Husi, L.[Letu], Zhao, T.J.[Tian-Jie], Ji, D.[Dabin], Xiong, C.[Chuan], Gao, B.[Bo],
Effect of Solar-Cloud-Satellite Geometry on Land Surface Shortwave Radiation Derived from Remotely Sensed Data,
RS(9), No. 7, 2017, pp. xx-yy.
DOI Link 1708
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Pitard, G.[Gilles], Le Goïc, G.[Gaëtan], Mansouri, A.[Alamin], Favrelière, H.[Hugues], Desage, S.F.[Simon-Frederic], Samper, S.[Serge], Pillet, M.[Maurice],
Discrete Modal Decomposition: a new approach for the reflectance modeling and rendering of real surfaces,
MVA(28), No. 5-6, August 2017, pp. 607-621.
Springer DOI 1708
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Gu, J.[Jian], Chen, H.M.[Hui-Min],
An algorithm of spectral reflectance function reconstruction without sample training can integrate prior information,
ICIVC17(541-544)
IEEE DOI 1708
Algorithm design and analysis, Cameras, Image color analysis, Image reconstruction, Ink, Reflectivity, Training, color detection, prior information, sample training, spectral reflectance reconstruction. BibRef

Khan, H.A.[Haris Ahmad], Thomas, J.B.[Jean Baptiste], Hardeberg, J.Y.[Jon Yngve],
Multispectral Constancy Based on Spectral Adaptation Transform,
SCIA17(II: 459-470).
Springer DOI 1706
BibRef

Le Moan, S.[Steven],
How to predict lightness variations from one illuminant to another?,
ICVNZ16(1-5)
IEEE DOI 1701
Correlation BibRef

Gkioulekas, I.[Ioannis], Levin, A.[Anat], Zickler, T.[Todd],
An Evaluation of Computational Imaging Techniques for Heterogeneous Inverse Scattering,
ECCV16(III: 685-701).
Springer DOI 1611
Internal scattering. BibRef

Asano, Y.[Yuta], Zheng, Y.Q.[Yin-Qiang], Nishino, K.[Ko], Sato, I.[Imari],
Shape from Water: Bispectral Light Absorption for Depth Recovery,
ECCV16(VI: 635-649).
Springer DOI 1611
BibRef

Zhang, H.[Hang], Dana, K.[Kristin], Nishino, K.[Ko],
Friction from Reflectance: Deep Reflectance Codes for Predicting Physical Surface Properties from One-Shot In-Field Reflectance,
ECCV16(IV: 808-824).
Springer DOI 1611
BibRef

Xie, D.H.[De-Hua], Liu, S.C.[Shuai-Cheng], Lin, K.[Kaimo], Zhu, S.Y.[Shu-Yuan], Zeng, B.[Bing],
Intrinsic decomposition for stereoscopic images,
ICIP16(1744-1748)
IEEE DOI 1610
Avalanche photodiodes. Reflectance and shading. BibRef

Laffont, P.Y., Bazin, J.C.,
Intrinsic Decomposition of Image Sequences from Local Temporal Variations,
ICCV15(433-441)
IEEE DOI 1602
Reflectance and shading. Geometry BibRef

Zhou, T., Krähenbühl, P.[Philipp], Efros, A.A.,
Learning Data-Driven Reflectance Priors for Intrinsic Image Decomposition,
ICCV15(3469-3477)
IEEE DOI 1602
Computer vision BibRef

Narihira, T., Maire, M., Yu, S.X.,
Direct Intrinsics: Learning Albedo-Shading Decomposition by Convolutional Regression,
ICCV15(2992-2992)
IEEE DOI 1602
Color BibRef

Georgoulis, S., Vanweddingen, V., Proesmans, M., van Gool, L.J.,
A Gaussian Process Latent Variable Model for BRDF Inference,
ICCV15(3559-3567)
IEEE DOI 1602
Cameras BibRef

Blasinski, H.[Henryk], Farrell, J.[Joyce], Wandell, B.[Brian],
An iterative algorithm for spectral estimation with spatial smoothing,
ICIP15(936-940)
IEEE DOI 1512
ADMM; Multispectral imaging; spectral reconstruction BibRef

Hui, Z.[Zhuo], Sankaranarayanan, A.C.,
A Dictionary-Based Approach for Estimating Shape and Spatially-Varying Reflectance,
ICCP15(1-9)
IEEE DOI 1511
photometry BibRef

Fyffe, G., Debevec, P.,
Single-Shot Reflectance Measurement from Polarized Color Gradient Illumination,
ICCP15(1-10)
IEEE DOI 1511
albedo BibRef

Riess, C.[Christian], Pfaller, S.[Sven], Angelopoulou, E.[Elli],
Reflectance Normalization in Illumination-Based Image Manipulation Detection,
BioFor15(3-10).
Springer DOI 1511
BibRef

Haindl, M.[Michal], Mikeš, S.[Stanislav], Kudo, M.[Mineichi],
Unsupervised Surface Reflectance Field Multi-Segmenter,
CAIP15(I:261-273).
Springer DOI 1511
BibRef

Filip, J.[Jirí], Somol, P.[Petr],
Materials Classification Using Sparse Gray-Scale Bidirectional Reflectance Measurements,
CAIP15(II:289-299).
Springer DOI 1511
BibRef

Weinmann, M.[Michael], Klein, R.[Reinhard],
Material Recognition for Efficient Acquisition of Geometry and Reflectance,
CVPV14(321-333).
Springer DOI 1504
BibRef

Miyashita, L.[Leo], Watanabe, Y.[Yoshihiro], Ishikawa, M.[Masatoshi],
Rapid SVBRDF Measurement by Algebraic Solution Based on Adaptive Illumination,
3DV14(232-239)
IEEE DOI 1503
Adaptive systems BibRef

Blasinski, H.[Henryk], Breneman, J.[John], Farrell, J.[Joyce],
A model for estimating spectral properties of water from RGB images,
ICIP14(610-614)
IEEE DOI 1502
Absorption BibRef

Khan, Z.[Zohaib], Shafait, F.[Faisal], Mian, A.[Ajmal],
Adaptive spectral reflectance recovery using spatio-spectral support from hyperspectral images,
ICIP14(664-668)
IEEE DOI 1502
Computer vision BibRef

Weinmann, M.[Michael], Gall, J.[Juergen], Klein, R.[Reinhard],
Material Classification Based on Training Data Synthesized Using a BTF Database,
ECCV14(III: 156-171).
Springer DOI 1408
Synthesize training data for materials under different light and viewing conditions. BibRef

Jeon, J.[Junho], Cho, S.H.[Sung-Hyun], Tong, X.[Xin], Lee, S.Y.[Seung-Yong],
Intrinsic Image Decomposition Using Structure-Texture Separation and Surface Normals,
ECCV14(VII: 218-233).
Springer DOI 1408
using RGB-D image. also use texture. BibRef

Nöll, T.[Tobias], Köhler, J.[Johannes], Stricker, D.[Didier],
Robust and Accurate Non-parametric Estimation of Reflectance Using Basis Decomposition and Correction Functions,
ECCV14(II: 376-391).
Springer DOI 1408
BibRef

Kong, N.[Naejin], Black, M.J.[Michael J.],
Intrinsic Depth: Improving Depth Transfer with Intrinsic Images,
ICCV15(3514-3522)
IEEE DOI 1602
Cameras BibRef

Kong, N.[Naejin], Gehler, P.V.[Peter V.], Black, M.J.[Michael J.],
Intrinsic Video,
ECCV14(II: 360-375).
Springer DOI 1408
extracting temporally coherent albedo and shading from video alone. BibRef

Zheng, Y.Q.[Yin-Qiang], Sato, I.[Imari], Sato, Y.[Yoichi],
Spectra Estimation of Fluorescent and Reflective Scenes by Using Ordinary Illuminants,
ECCV14(V: 188-202).
Springer DOI 1408
BibRef

Kobayashi, Y., Morimoto, T., Sato, I., Mukaigawa, Y., Ikeuchi, K.,
BRDF Estimation of Structural Color Object by Using Hyper Spectral Image,
CVPV13(915-922)
IEEE DOI 1403
image colour analysis BibRef

Yacoob, Y.[Yaser],
Matching Dry to Wet Materials,
ICCV13(2952-2959)
IEEE DOI 1403
Dry surfaces; Wet surfaces; spectral absorption BibRef

Achar, S.[Supreeth], Nuske, S.T.[Stephen T.], Narasimhan, S.G.[Srinivasa G.],
Compensating for Motion during Direct-Global Separation,
ICCV13(1481-1488)
IEEE DOI 1403
direct and global components of radiance. BibRef

Chen, Q.[Qifeng], Koltun, V.[Vladlen],
Fast MRF Optimization with Application to Depth Reconstruction,
CVPR14(3914-3921)
IEEE DOI 1409
BibRef
Earlier:
A Simple Model for Intrinsic Image Decomposition with Depth Cues,
ICCV13(241-248)
IEEE DOI 1403
Depth Reconstruction; MRF Optimization. RGB-D images. estimate albedo and shading fields. BibRef

Zhou, P.[Peng], Yu, L.[Li], Zhong, G.[Gang],
The non-Lambertian reflection in plenoptic sampling,
ICIP13(2154-2157)
IEEE DOI 1402
BRDF; Phong BRDF; Plenoptic sampling; non-Lambertian; spectrum analysis BibRef

Iiyama, M.[Masaaki], Miki, S.[Shohei], Funatomi, T.[Takuya], Minoh, M.[Michihiko],
3D Acquisition of Occluded Surfaces from Scattering in Participating Media,
ICPR14(2095-2100)
IEEE DOI 1412
Cameras BibRef

Evrenci, D., Iiyama, M., Funatomi, T., Minoh, M.,
Shape and Reflectance from Scattering in Participating Media,
3DV13(183-190)
IEEE DOI 1311
cameras BibRef

Filip, J.[Jiri], Vavra, R.[Radomir], Havlicek, M.[Michal],
Effective Acquisition of Dense Anisotropic BRDF,
ICPR14(2047-2052)
IEEE DOI 1412
Analytical models BibRef

Filip, J.[Jiri], Vavra, R.[Radomir], Haindl, M.[Michal], Id, P.[Pavel], Krupika, M.[Mikula], Havran, V.[Vlastimil],
BRDF Slices: Accurate Adaptive Anisotropic Appearance Acquisition,
CVPR13(1468-1473)
IEEE DOI 1309
Bidirectional Reflectance Distribution Function: BRDF; adaptive; measurement; sampling BibRef

Ali, M.A.[Muhammad Asad], Sato, I.[Imari], Okabe, T.[Takahiro], Sato, Y.[Yoichi],
Toward Efficient Acquisition of BRDFs with Fewer Samples,
ACCV12(IV:54-67).
Springer DOI 1304
Bidirectional Reflectance Distribution Function (BDRF). BibRef

Komatsu, H.[Hidehiko], Nishio, A.[Akiko], Okazawa, G.[Gouki], Goda, N.[Naokazu],
'Yellow' or 'Gold'?: Neural Processing of Gloss Information,
CCIW13(1-12).
Springer DOI 1304
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Abe, T.[Takashi], Okatani, T.[Takayuki], Deguchi, K.[Koichiro],
Recognizing surface qualities from natural images based on learning to rank,
ICPR12(3712-3715).
WWW Link. 1302
glossiness and transparency BibRef

Inoshita, C.[Chika], Mukaigawa, Y.[Yasuhiro], Matsushita, Y.[Yasuyuki], Yagi, Y.S.[Yasu-Shi],
Surface Normal Deconvolution: Photometric Stereo for Optically Thick Translucent Objects,
ECCV14(II: 346-359).
Springer DOI 1408
BibRef
Earlier:
Shape from Single Scattering for Translucent Objects,
ECCV12(II: 371-384).
Springer DOI 1210
BibRef

Nurzynska, K.[Karolina], Haraszczuk, R.[Ryszard],
Detection and Normalization of Blown-out Illumination Areas in Grey-scale Images,
ISVC12(I: 282-291).
Springer DOI 1209
BibRef

Schwartz, G., Nishino, K.,
Visual Material Traits: Recognizing Per-Pixel Material Context,
CVPV13(883-890)
IEEE DOI 1403
image segmentation BibRef

Lombardi, S.[Stephen], Nishino, K.[Ko],
Single image multimaterial estimation,
CVPR12(238-245).
IEEE DOI 1208
Reflectance and illumination from a single image. BibRef

Jiang, J.[Jun], Gu, J.W.[Jin-Wei],
Recovering spectral reflectance under commonly available lighting conditions,
CCD12(1-8).
IEEE DOI 1207
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Ihrke, I.[Ivo], Reshetouski, I.[Ilya], Manakov, A.[Alkhazur], Tevs, A.[Art], Wand, M.[Michael], Seidel, H.P.[Hans-Peter],
A kaleidoscopic approach to surround geometry and reflectance acquisition,
CCD12(29-36).
IEEE DOI 1207
BibRef

Tomaszewska, A.[Anna], Stefanowski, K.[Krzysztof],
Real-Time Spherical Harmonics Based Subsurface Scattering,
ICIAR12(I: 402-409).
Springer DOI 1206
BibRef

Xiong, Y.[Ying], Saenko, K.[Kate], Darrell, T.J.[Trevor J.], Zickler, T.E.[Todd E.],
From pixels to physics: Probabilistic color de-rendering,
CVPR12(358-365).
IEEE DOI 1208
BibRef

Owens, T.[Trevor], Saenko, K.[Kate], Chakrabarti, A.[Ayan], Xiong, Y.[Ying], Zickler, T.E.[Todd E.], Darrell, T.J.[Trevor J.],
Learning object color models from multi-view constraints,
CVPR11(169-176).
IEEE DOI 1106
BibRef

Jehle, M.[Markus], Sommer, C.[Christoph], Jähne, B.[Bernd],
Learning of Optimal Illumination for Material Classification,
DAGM10(563-572).
Springer DOI 1009
BibRef

Hirose, S.[Shun], Takemura, K.[Kentaro], Takamatsu, J.[Jun], Suenaga, T.[Tsuyoshi], Kawakami, R.[Rei], Ogasawara, T.[Tsukasa],
Surface color estimation based on inter- and intra-pixel relationships in outdoor scenes,
CVPR10(271-278).
IEEE DOI 1006
BibRef

Hsieh, S.H.[Sung-Hsien], Fang, C.W.[Chih-Wei], Wang, T.H.[Te-Hsun], Chu, C.H.[Chien-Hung], Lien, J.J.J.[Jenn-Jier James],
Weighted Map for Reflectance and Shading Separation Using a Single Image,
ACCV09(III: 85-95).
Springer DOI 0909
BibRef

Li, C.M.[Chun-Ming], Li, F.[Fang], Kao, C.Y.[Chiu-Yen], Xu, C.Y.[Chen-Yang],
Image segmentation with simultaneous illumination and reflectance estimation: An energy minimization approach,
ICCV09(702-708).
IEEE DOI 0909
BibRef

Kratz, L.[Louis], Nishino, K.[Ko],
Factorizing Scene Albedo and Depth from a Single Foggy Image,
ICCV09(1701-1708).
IEEE DOI 0909
BibRef

Nishino, K.[Ko],
Directional statistics BRDF model,
ICCV09(476-483).
IEEE DOI 0909
Bidirectional Reflectance Distribution Function BibRef

Toque, J.A.[Jay Arre], Sakatoku, Y.[Yuji], Ide-Ektessabi, A.[Ari],
Pigment identification by analytical imaging using multispectral images,
ICIP09(2861-2864).
IEEE DOI 0911
On paintings. Identify Japanese pigments. BibRef

Moriuchi, Y.[Yusuke], Tominaga, S.[Shoji], Horiuchi, T.[Takahiko],
Precise Analysis of Spectral Reflectance Properties of Cosmetic Foundation,
SCIA09(138-148).
Springer DOI 0906
BibRef

Le Moan, S.[Steven], Mansouri, A.[Alamin], Hardeberg, J.Y.[Jon Y.], Voisin, Y.[Yvon],
A class-separability-based method for multi/hyperspectral image color visualization,
ICIP10(1321-1324).
IEEE DOI 1009
BibRef

Mansouri, A.[Alamin], Sliwa, T.[Tadeusz], Hardeberg, J.Y.[Jon Yngve], Voisin, Y.[Yvon],
An adaptive-PCA algorithm for reflectance estimation from color images,
ICPR08(1-4).
IEEE DOI 0812
BibRef

Nillius, P.[Peter], Sullivan, J.[Josephine], Argyros, A.A.[Antonis A.],
Shading models for illumination and reflectance invariant shape detectors,
CVPR08(1-8).
IEEE DOI 0806
BibRef

Ben-Ezra, M.[Moshe], Wang, J.P.[Jia-Ping], Wilburn, B.[Bennett], Li, X.Y.[Xiao-Yang], Ma, L.[Le],
An LED-only BRDF measurement device,
CVPR08(1-8).
IEEE DOI 0806
Acquire Bidirectional Reflectance Distribution Function BibRef

Yin, X.[Xin], Cai, K.Y.[Kang-Ying], Takeda, Y.[Yuki], Akama, R.[Ryo], Tanaka, H.T.[Hiromi T.],
Measurement of Reflection Properties in Ancient Japanese Drawing Ukiyo-e,
ACCV07(I: 779-788).
Springer DOI 0711
Wood block prints. Surface structure of print and paper. BibRef

Ogier, A., Dorval, T., Genovesio, A.,
Biased Image Correction Based on Empirical Mode Decomposition,
ICIP07(I: 533-536).
IEEE DOI 0709
Correct for illumination effects. BibRef

Ortiz, F.[Francisco],
Real-Time Elimination of Brightness in Color Images by MS Diagram and Mathematical Morphology,
CAIP07(458-465).
Springer DOI 0708
BibRef

Chung, Y.C.[Yun-Chung], Chang, S.L.[Shyang-Lih], Wang, J.M.[Jung-Ming], Chen, S.W.[Sei-Wang],
Interference reflection separation from a single image,
WACV09(1-6).
IEEE DOI 0912
BibRef

Chung, Y.C.[Yun-Chung], Chang, S.L.[Shyang-Lih], Cherng, S.[Shen], Chen, S.W.[Sei-Wang],
Dichromatic Reflection Separation from a Single Image,
EMMCVPR07(225-241).
Springer DOI 0708
BibRef

Dickens, M.P.[Matthew P.], Hancock, E.R.[Edwin R.],
Estimating Reflectance Functions Using a Cyberware 3030 Scanner,
CAIP07(342-350).
Springer DOI 0708
BibRef

Mukaigawa, Y.[Yasuhiro], Sumino, K.[Kohei], Yagi, Y.S.[Yasu-Shi],
Multiplexed Illumination for Measuring BRDF Using an Ellipsoidal Mirror and a Projector,
ACCV07(II: 246-257).
Springer DOI 0711
BibRef
And:
High-Speed Measurement of BRDF using an Ellipsoidal Mirror and a Projector,
PROCAMS07(1-8).
IEEE DOI 0706
BibRef

Zeng, H.[Huiwen], Trussell, H.J.,
Image Analysis Under Varying Illumination,
ICIP06(921-924).
IEEE DOI 0610
BibRef

Agarwal, V., Gribok, A.V., Koschan, A.F., Abidi, M.A.,
Estimating Illumination Chromaticity via Kernel Regression,
ICIP06(981-984).
IEEE DOI 0610
BibRef

Bhalerao, A.H.,
Minimum Entropy Light and Shading Approximation,
BMVC06(I:317).
PDF File. 0609
BibRef

Shen, L.[Li], Takemura, H.[Haruo],
Spatial Reflectance Recovery under Complex Illumination from Sparse Images,
CVPR06(II: 1833-1838).
IEEE DOI 0606
BibRef

Zou, X.[Xuan], Kittler, J.V.[Josef V.], Messer, K.[Kieron],
Ambient Illumination Variation Removal by Active Near-IR Imaging,
ICB06(19-25).
Springer DOI 0601
BibRef

Diamantaras, K.I., Papadimitriou, T.,
Blind Separation of Reflections Using the Image Mixtures Ratio,
ICIP05(II: 1034-1037).
IEEE DOI 0512
BibRef

Miao, X.P.[Xiao-Ping], Sim, T.,
Ambient Image Recovery and Rendering from Flash Photographs,
ICIP05(II: 1038-1041).
IEEE DOI 0512
BibRef

Queiroz-Neto, J.P.[José P.], Carceroni, R.L.[Rodrigo L.], Coelho, L.C.R.[Lara C. R.],
Recovering Photometric Properties of Multiple Strongly-Reflective, Partially-Transparent Surfaces from a Single Image,
ICCV05(II: 1409-1416).
IEEE DOI 0510
BibRef

Toro, J., Ziou, D., Auclair-Fortier, M.F.,
Recovering the shading image under known illumination,
CRV04(92-96).
IEEE DOI 0408
BibRef

Magnor, M.,
Sensitivity of reflected radiance to surface normal orientation,
ICIP03(III: 717-720).
IEEE DOI 0312
BibRef

Nillius, P., Eklundh, J.O.,
Low-dimensional representations of shaded surfaces under varying illumination,
CVPR03(II: 185-192).
IEEE DOI 0307
How to best represent objects with varying light sources. Calculate the bases for all configurations of a point plus ambient light source and two point light sources, as well as from a database of captured real world illumination. See also Lambertian Reflectance and Linear Subspaces. BibRef

Nillius, P.[Peter], Eklundh, J.O.[Jan-Olof],
Classifying Materials from Their Reflectance Properties,
ECCV04(Vol IV: 366-376).
Springer DOI 0405
Model-based PCA. BibRef

Nillius, P., Eklundh, J.O.,
Phenomenological eigenfunctions for image irradiance,
ICCV03(568-575).
IEEE DOI 0311
BibRef

Park, J.I.[Jong-Il], Lee, M.H.[Moon-Hyun], Grossberg, M.D.[Michael D.], Nayar, S.K.[Shree K.],
Multispectral Imaging Using Multiplexed Illumination,
ICCV07(1-8).
IEEE DOI 0710
BibRef

Grossberg, M.D.[Michael D.], Nayar, S.K.[Shree K.],
What Can Be Known about the Radiometric Response from Images?,
ECCV02(IV: 189 ff.).
Springer DOI 0205
Analyze ambiguity in standard approach to determine radiometric response. Recover brightness transfer function for pair of images. BibRef

Nakashima, A.[Akiko], Maki, A.[Atsuto], Fukui, K.[Kazuhiro],
Constructing Illumination Image Basis from Object Motion,
ECCV02(III: 195 ff.).
Springer DOI 0205
Moving object. Static lighting. To use in generating new views. BibRef

Fleming, R.W.[Roland W.], Dror, R.O.[Ron O.], Adelson, E.H.[Edward H.],
How do Humans Determine Reflectance Properties under Unknown Illumination?,
MIT AIM-2001-032, October 2001.
WWW Link. 0205
BibRef

Dror, R.O.[Ron O.], Adelson, E.H.[Edward H.], Willsky, A.S.[Alan S.],
Recognition of Surface Reflectance Properties from a Single Image under Unknown Real-World Illumination,
MIT AIM-2001-033, November 2001.
WWW Link. 0205
BibRef

Dror, R.O.[Ron O.],
Surface Reflectance Recognition and Real-World Illumination Statistics,
MIT AI-TRITR-2002-009, October 2002.
WWW Link. 0306
BibRef

Dror, R.O.[Ron O.], Adelson, E.H.[Edward H.], Willsky, A.S.[Alan S.],
Surface Reflectance Estimation and Natural Illumination Statistics,
SCTV01(xx-yy). 0106
BibRef
And: MIT AIM-2001-023, September 2001.
WWW Link. 0205
BibRef

Dror, R.O.[Ron O.], Leung, T.K.[Thomas K.], Adelson, E.H.[Edward H.], and Willsky, A.S.[Alan S.],
Statistics of Real-World Illumination,
CVPR01(II:164-171).
IEEE DOI 0110
Real light sources are complex compared to the models. BibRef

Bell, M.[Matt], Freeman, W.T.[William T.],
Learning Local Evidence for Shading and Reflectance,
ICCV01(I: 670-677).
IEEE DOI 0106
BibRef

Tanaka, N.[Norihiro], Tominaga, S.[Shoji], Kawai, T.[Toshiyuki],
Estimation of the Torrance-Sparrow Reflection Model from a Single Multi-band Image,
ICPR00(Vol III: 596-599).
IEEE DOI 0009
BibRef

Chen, H.F.[Hansen F.], Belhumeur, P.N.[Peter N.], Jacobs, D.W.[David W.],
In Search of Illumination Invariants,
CVPR00(I: 254-261).
IEEE DOI 0005
Award, CVPR, HM. Applied to Faces BibRef

Pedersini, F.[Federico], Piccarreta, L.[Luca], Sarti, A.[Augusuto], Tubaro, S.[Stefano],
Estimation of Radiometric Parameters for A Realistic Rendering of 3D Models,
ICIP99(IV:376-380).
IEEE DOI BibRef 9900

Tominaga, S., Takahashi, E., Tanaka, N.,
Parameter Estimation of a Reflection Model from a Multi-Band Image,
PMCVG99(xx-yy). BibRef 9900

Sato, I., Sato, Y., Ikeuchi, K.,
Acquiring a Radiance Distribution to Superimpose Virtual Objects onto a Real Scene,
MVA98(xx-yy). BibRef 9800
And: MfR01(Chapter II-6). BibRef

Angelopoulou, E.[Elli], Williams, J.P., Wolff, L.B.,
A Curvature Based Descriptor Invariant to Pose and Albedo Derived from Photometric Data,
CVPR97(165-171).
IEEE DOI 9704
From 3 illumination conditions. BibRef

Manabe, Y.[Yoshitsugu], Zhen, X.[Xin], Inokuchi, S.[Seiji],
Estimation of Illuminant Spectral Distribution with Geometrical Information from Spectral Image,
ICPR98(Vol II: 1464-1466).
IEEE DOI 9808
BibRef

Cozman, F., Krotkov, E.,
Depth from Scattering,
CVPR97(801-806).
IEEE DOI 9704
Depth from effects of atmospheric scattering. BibRef

Love, R., Efford, N.D.,
Surface Reflectance Model Estimation from Daylight Illuminated Image Sequences,
BMVC95(xx-yy).
PDF File. 9509
BibRef

Caillas, C.,
A Physical Approach to Infrared Image Understanding,
BMVC94(xx-yy).
PDF File. 9409
Reflectivity, emissivity from images. BibRef

Chapter on 3-D Shape from X -- Shading, Textures, Lasers, Structured Light, Focus, Line Drawings continues in
Surface Roughness, Rough Surfaces .


Last update:Sep 18, 2017 at 11:34:11